Universal composite base of test fixture

Abstract

The utility model relates to the technical field of test fixtures, in particular to a universal composite base of a test fixture, which is characterized in that a guide plate is mounted on a wire coil bottom plate, a connecting seat is mounted at the bottom of the wire coil bottom plate, first probes arranged in an array are arranged in the guide plate in a penetrating manner, and a spring wire is arranged in the guide plate; the first probes are electrically connected with the connecting seat through the spring wires, and after the dial is detachably installed on the guide plate, the dial is in contact connection with the first probes at the corresponding positions, so that a circuit board can be placed on the dial for testing. Since the guide plate is provided with the first probes which are arranged in an array, different types of dial plates can be compatible, and when different types of circuit boards are tested, only the dial plates need to be replaced without replacing the wire coil, so that the compatibility is improved, the remodeling operation is simplified, and the cost of manufacturing the wire coil is reduced.

Description

Technical Field

[0001] This application relates to the field of test fixture technology, and in particular to a universal composite base for a test fixture. Background Technology

[0002] Currently, in the circuit board manufacturing process, tests such as open circuit, short circuit, and resistance are required. Existing technologies typically use wire needle fixtures mounted on testing machines for these tests. Current wire needle fixtures consist of a wire reel base and a needle tray connected to the base. The base is mounted on the machine, and the needle tray, equipped with probes, is placed on the tray during testing. Currently, the pin distribution on the base and tray requires matching design based on the test points on the circuit board. When testing different circuit boards, separate bases and trays need to be fabricated and replaced, resulting in high manufacturing costs and low compatibility. Utility Model Content

[0003] To address the aforementioned technical problems, this application provides a universal composite base for a test fixture, comprising a needle plate and a wire plate. The wire plate includes a wire plate base, several guide plates mounted on the wire plate base, and a connecting seat embedded in the guide plates. An array of first probes is inserted into the guide plates, and a spring wire is provided in the guide plates. The first probes are electrically connected to the connecting seat through the spring wire. The needle plate is detachably mounted on the top guide plate.

[0004] Preferably, the guide plate located in the middle layer has a through hole for accommodating the spring wire.

[0005] Preferably, the first probe is inserted through the top guide plate, the bottom end of the first probe is connected to one end of the spring wire, and the other end of the spring wire is connected to the connector.

[0006] Preferably, the bottom end of the spring wire is electrically connected to the connector via a connecting wire.

[0007] Preferably, a clearance groove is provided on the bottom plate of the coil, the clearance groove being used to accommodate the connecting wire.

[0008] Preferably, mounting holes are provided on both sides of the first probe on the top guide plate, and the needle plate is detachably connected to the mounting holes.

[0009] As can be seen from the above, the following beneficial effects can be obtained by applying the method provided in this application: A guide plate is installed on the base plate of the wire tray, a connecting seat is installed at the bottom of the base plate, an array of first probes are inserted within the guide plate, and a spring wire is provided within the guide plate. The first probes are electrically connected to the connecting seat via the spring wire. After the needle tray is detachably installed on the guide plate, the needle tray contacts and connects with the first probes at the corresponding positions, thereby allowing the circuit board to be placed on the needle tray for testing. Because the guide plate has an array of first probes, it is compatible with different types of needle trays. When testing different types of circuit boards, only the needle tray needs to be replaced, not the wire tray, thereby improving compatibility, simplifying changeover operations, and reducing the cost of manufacturing the wire tray. Attached Figure Description

[0010] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the accompanying drawings used in the description of the embodiments of this application or the prior art will be briefly introduced below. Obviously, the accompanying drawings described below are only a part of the embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0011] Figure 1 This is a schematic diagram of the universal composite base of the test fixture in an embodiment of this application;

[0012] Figure 2 This is a top view of the universal composite base of the test fixture in the embodiments of this application;

[0013] Figure 3 This is a side view of the universal composite base of the test fixture in an embodiment of this application. Detailed Implementation

[0014] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of this application, and not all of them. All other embodiments obtained by those skilled in the art based on the embodiments of this application without creative effort are within the scope of protection of this application.

[0015] Example

[0016] To address the aforementioned technical problems, this embodiment provides a universal composite base for a test fixture, such as... Figure 1-3As shown, the device includes a needle plate 50 and a wire reel. The wire reel includes a wire reel base plate 10, a guide plate 20 mounted on the wire reel base plate 10, and a connecting seat 30 embedded in the guide plate 20. An array of first probes 40 are arranged on the guide plate 20. A spring wire 60 is provided within the guide plate 20. The first probes 40 are electrically connected to the connecting seat 30 via the spring wire 60. After the needle plate 50 is detachably mounted on the guide plate 20, the needle plate 50 contacts and connects with the corresponding first probes 40, allowing the circuit board to be placed on the needle plate 50. The circuit board is then connected to the testing machine via the needle plate 50 and the first probes 40 on the wire reel to complete the test. Because the guide plate 20 has an array of first probes 40, it is compatible with different types of needle plates 50. When testing different types of circuit boards, only the needle plate 50 needs to be replaced, without replacing the wire reel, thereby improving compatibility, simplifying changeover operations, and reducing the cost of manufacturing the wire reel.

[0017] In the above scheme, the number of test points varies for different types of circuit boards. Therefore, in the prior art, it is necessary to design and manufacture the pin tray 50 according to the circuit board, and design a corresponding wire tray according to the pin tray 50. Then, the wire tray is installed on the testing machine, and the pin tray 50 is installed on the wire tray. In order to reduce the cost of manufacturing the wire tray, this scheme uses a guide plate 20 installed on the wire tray base plate 10. The first probes 40 are arranged in an array on the guide plate 20, so that there are a sufficient number of first probes 40 on the guide plate 20 to connect with the pin trays 50 with different numbers of test points. Structurally, the composite composition achieves the purpose of universality, improves compatibility, and adapts to different pin trays 50.

[0018] Specifically, the guide plate 20 is fixedly mounted on the wire reel base plate 10 with screws. The guide plate 20, located in the middle layer, has a through hole for accommodating the spring wire 60. The first probe 40 passes through the top surface of the guide plate 20, with its bottom end connected to one end of the spring wire 60, and the other end connected to the connecting seat 30. The spring wire 60 provides elasticity to the first probe 40, ensuring good contact between the first probe 40 and the probe reel 50, thus improving test accuracy. After the wire reel base plate 10 is installed on the testing machine, the connecting seat 30 at the bottom of the wire reel base plate 10 is electrically connected to the testing machine, thereby allowing the first probe 40 to be electrically connected to the testing machine through the connecting seat 30. After the needle plate 50 is installed on the guide plate 20, the needle plate 50 is in contact with the first probe 40. The needle plate 50 is also provided with probes for contacting the test points of the circuit board. The probes on the needle plate 50 are in contact with the first probe on the guide plate 20. Then, during the test, the circuit board is placed on the needle plate 50 and the circuit board is tested by the test machine.

[0019] Furthermore, the first probe 40 passes through the top surface of the guide plate 20, and its bottom end is connected to the top end of the spring wire 60. The bottom end of the spring wire 60 is electrically connected to the connecting seat 30 via a connecting wire 61. Specifically, a second probe 31 passes through the connecting seat 30, and the bottom end of the spring wire 60 is electrically connected to the second probe 31 on the connecting seat 30 via the connecting wire 61. Simultaneously, a clearance groove 11 is provided at the bottom of the wire reel base plate 10 to accommodate the connecting wire 61. After the wire reel base plate 10 is installed on the testing machine, it is electrically connected to the testing machine via the second probe 31 of the connecting seat 30, thereby electrically connecting the first probe 40 to the testing machine.

[0020] In the above scheme, mounting holes 21 are provided on both sides of the first probe 40 on the guide plate 20, so that the needle plate 50 is detachably connected to the mounting holes 21. For example, the needle plate 50 can be fixed on the mounting holes 21 by means of screw connection, so that the needle plate 50 can be easily installed or removed from the coil during changeover, thereby improving the work efficiency of changeover production.

[0021] In some implementations, the number of first probes 40 on the guide plate 20 corresponds to the number of second probes 31 on the connector 30, so that each first probe 40 can be connected to the testing machine through the connector 30. Different probe counts on the probe tray 50 can be connected to the testing machine through the first probes 40 on the guide plate 20, thus eliminating the need to replace the coil and reducing the cost of manufacturing the coil. In other implementations, when the number of first probes 40 is greater than the number of second probes 31, the first probes 40 on the guide plate 20 can be divided into four regions. One second probe 31 on the connector 30 is electrically connected to one first probe 40 in each region. For example, the first first probe 40 in each region is connected to the first second probe 31 on the connector 30 via a connecting wire 61, allowing for the selection of an appropriate connection method based on actual production needs.

[0022] In summary, this application's solution involves mounting a guide plate on a wire tray base plate, with a connector mounted at the bottom of the base plate. An array of first probes is inserted within the guide plate, and a spring wire is installed within the guide plate. The first probes are electrically connected to the connector via the spring wire. After the probe tray is detachably mounted on the guide plate, it contacts and connects with the corresponding first probe, allowing the circuit board to be placed on the probe tray for testing. Because the guide plate has an array of first probes, it is compatible with different types of probe trays. When testing different types of circuit boards, only the probe tray needs to be replaced, not the wire tray itself, thus improving compatibility, simplifying changeover operations, and reducing the cost of manufacturing the wire tray.

[0023] The embodiments described above do not constitute a limitation on the scope of protection of this technical solution. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of the above embodiments should be included within the scope of protection of this technical solution.

Claims

1. A universal composite base for a test fixture, characterized in that: The device includes a needle plate (50) and a thread plate. The thread plate includes a thread plate base plate (10), a guide plate (20) mounted on the thread plate base plate (10), and a connecting seat (30) mounted at the bottom of the thread plate base plate (10). An array of first probes (40) are inserted through the guide plate (20). A spring wire (60) is provided inside the guide plate (20). The first probes (40) are electrically connected to the connecting seat (30) through the spring wire (60). The needle plate (50) is detachably mounted on the guide plate (20).

2. The universal composite base of the test fixture according to claim 1, characterized in that: The guide plate (20) has a through hole for accommodating the spring wire (60), the bottom of the first probe (40) is inserted into the top of the spring wire (60), and the bottom of the spring wire (60) is connected to the connector (30).

3. The universal composite base of the test fixture according to claim 2, characterized in that: The connector (30) has a second probe (31) inserted through it, and the bottom end of the spring wire (60) is electrically connected to the second probe (31) on the connector (30) through the connecting wire (61).

4. The universal composite base of the test fixture according to claim 3, characterized in that: The first probe (40) on the guide plate (20) is divided into four regions, and a second probe (31) on the connector (30) is electrically connected to a first probe (40) in each region.

5. The universal composite base of the test fixture according to claim 3, characterized in that: An anti-cavity groove (11) is provided on the bottom plate (10) of the wire reel, and the anti-cavity groove (11) is used to accommodate the connecting wire (61).

6. The universal composite base of the test fixture according to claim 1, characterized in that: Mounting holes (21) are provided on both sides of the first probe (40) on the upper surface of the guide plate (20), and the needle plate (50) is detachably connected to the mounting holes (21).

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