Needle and wire testing jig for testing circuit board
By designing a limiting structure in the circuit board test fixture that combines a limiting groove with a locking block, the problem of probes falling off was solved, the test stability was improved and the maintenance frequency was reduced, thus achieving efficient circuit board testing.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- HUIZHOU QIJIA ELECTRONICS
- Filing Date
- 2025-03-13
- Publication Date
- 2026-04-24
AI Technical Summary
In existing circuit board test fixtures, probes are prone to loosening and falling off, resulting in low testing efficiency and high maintenance difficulty.
Design a needle and thread testing fixture, in which a probe penetrates a mounting plate, a first guide plate, and a second guide plate, and a locking block is formed on the outer circumference. The mounting plate is provided with a limiting groove, which cooperates with the locking block to limit the probe and prevent it from falling off.
This improves the stability of the test fixture, reduces maintenance frequency and costs, and ensures efficient testing.
Smart Images
Figure CN224163771U_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of test fixture technology, and in particular to a pin-wire test fixture for circuit board testing. Background Technology
[0002] Currently, in the circuit board manufacturing process, tests such as open circuit, short circuit, and resistance are required. These tests are typically performed using wire-mounted jigs, which consist of an upper and lower die, both with probes inserted. The circuit board is placed on the lower die, and the probes on the lower die contact the contacts on the bottom surface of the circuit board. The testing machine then drives the upper die to descend, causing its probes to contact the contacts on the top surface of the circuit board. However, after prolonged up-and-down movement, the probes inserted into the needle plate are prone to loosening and falling off the upper die. For dies with a large number and densely packed probes, this frequent occurrence leads to difficult repairs and low testing efficiency. Utility Model Content
[0003] To address the aforementioned technical problems, this application provides a pin-wire testing fixture for circuit board testing, comprising a probe, a mounting plate through which the probe passes and arranged sequentially from bottom to top, a plurality of first guide plates, and a plurality of second guide plates. The plurality of first guide plates are stacked on the mounting plate, and a support post passing through the first guide plate is provided on the mounting plate. The second guide plates are stacked on top of the support post. A locking block is formed on the outer peripheral surface of the probe, and a limiting groove for limiting the locking block is provided on the mounting plate.
[0004] Preferably, the card block is spherical, and the limiting groove has a bearing surface that matches the shape of the card block.
[0005] Preferably, a groove is formed on the surface of at least one of the second guide plates, and a filling layer is provided in the groove for the probe to pass through.
[0006] Preferably, a first guide post is inserted into the mounting plate, and the first guide post passes through a plurality of first guide plates and a plurality of second guide plates.
[0007] Preferably, a second guide post is provided on the mounting plate, and the second guide post passes through several first guide plates and at least two second guide plates.
[0008] Preferably, several second guide plates are fitted with locking members, which are fixedly connected to the ends of the support columns.
[0009] Preferably, the outer peripheral surface of the probe is covered with an insulating layer.
[0010] Preferably, the first guide plate and the second guide plate are spaced apart.
[0011] As can be seen from the above, the following beneficial effects can be obtained by applying the method provided in this application: The probe is disposed through a mounting plate, several first guide plates, and several second guide plates. The first guide plates are stacked on the mounting plate, and a support post is provided on the mounting plate through which the first guide plates pass. The second guide plates are stacked on top of the support post. A locking block is formed on the outer periphery of the probe, and a limiting groove is provided on the mounting plate for limiting the locking block. During operation, the needle-wire testing fixture is inverted and mounted on the testing machine. The testing machine drives the fixture to move downwards, causing the probe on the fixture to contact the contacts of the circuit board, thereby completing the circuit board test. Sufficient space is provided on the mounting plate to create the limiting groove, reducing processing difficulty. The limiting groove, in conjunction with the locking block on the probe, limits the probe, preventing it from falling off, improving the stability of the testing fixture during testing, and reducing the maintenance frequency and cost of the fixture. Attached Figure Description
[0012] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the accompanying drawings used in the description of the embodiments of this application or the prior art will be briefly introduced below. Obviously, the accompanying drawings described below are only a part of the embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.
[0013] Figure 1 This is a schematic diagram of the pin-wire testing fixture structure used for circuit board testing according to an embodiment of this application;
[0014] Figure 2 Examples of this application Figure 1 Enlarged view of part A;
[0015] Figure 3 This is a schematic diagram of the needle and thread testing fixture as the upper mold in the working state according to an embodiment of this application. Detailed Implementation
[0016] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of this application, and not all of them. All other embodiments obtained by those skilled in the art based on the embodiments of this application without creative effort are within the scope of protection of this application.
[0017] Example
[0018] To address the aforementioned technical problems, this embodiment provides a pin-wire testing fixture for circuit board testing, such as... Figure 1-2 As shown, Figure 1 This is a schematic diagram of the needle and thread testing fixture in its normal placement state. It includes a probe 50, a mounting plate 10 through which the probe 50 passes, arranged sequentially from bottom to top, several first guide plates 20, and several second guide plates 30. The first guide plates 20 are stacked on the mounting plate 10. Support posts 40, which pass through the first guide plates 20, are provided on the mounting plate 10. The second guide plates 30 are stacked on top of the support posts 40. A locking block 51 is formed on the outer peripheral surface of the probe 50. The mounting plate 10 has a limiting groove 11 for limiting the locking block 51. During operation, the needle and thread testing fixture is inverted and mounted on the testing machine. The testing machine drives the fixture to move downwards, causing the probe 50 on the fixture to contact the contacts on the circuit board, thereby completing the circuit board test. By opening a limiting groove 11 on the mounting plate 10, the limiting groove 11 cooperates with the locking block 51 on the probe 50 to limit the probe 50, prevent the probe 50 from falling, improve the stability of the test fixture during testing, and reduce the maintenance frequency and cost of the fixture.
[0019] Specifically, in this embodiment, because the number of probes 50 is large and dense, and the probes 50 are inclined, and the length of the mounting plate 10 is longer than the second guide plate 30, if the limiting groove 11 is formed on the second guide plate 30, there would be insufficient space for the groove, resulting in high processing difficulty. Therefore, the limiting groove 11 is formed on the mounting plate 10, which has more space to form the limiting groove 11, allowing the probes 50 to be limited and engaged by the locking block 51. Figure 3 The diagram shown is a schematic of the needle and thread testing fixture in the working state of the upper mold according to an embodiment of this application. When it moves up and down repeatedly during operation, the limiting groove 11 cooperates with the locking block 51 on the probe 50 to limit the probe 50 and prevent the probe 50 from falling.
[0020] Furthermore, the locking block 51 is spherical, and a bearing surface matching the shape of the locking block 51 is formed on the limiting groove 11. In one embodiment, the locking block 51 and the probe 50 can be integrally formed, or the locking block 51 can be fixed to the probe 50 by welding. The locking block 51 and the limiting groove 11 engage in a limiting fit to prevent the probe 50 from falling off. Alternatively, in other embodiments, the locking block 51 can be designed as a trapezoid, ellipse, or any other arbitrary shape, and the limiting groove 11 can be designed as a corresponding shape, as long as it can engage the locking block 51. This embodiment does not specifically limit the shape of the locking block 51 and the limiting groove 11.
[0021] Furthermore, a groove 31 is formed on the surface of at least one of the second guide plates 30, and a filling layer for the probe to pass through is disposed in the groove 31. For example, the filling layer can be a stacked sponge layer and a Lycra cloth layer. The filling layer can prevent the probe from falling out, and the filling layer is composed of a sponge layer and a Lycra cloth layer. While holding the probe in place, it will not cause wear to the probe, solving the problem that the probe is easy to fall out of the through hole of the fixture after long-term use, and improving the stability of the fixture during use.
[0022] Furthermore, the second guide plate 30 is supported by the support column 40, ensuring that the first guide plate 20 and the second guide plate 30 are spaced apart, thus ensuring that the overall height of the fixture meets the requirements. A first guide column 60 is inserted into the mounting plate 10, passing through several first guide plates 20 and several second guide plates 30. A second guide column 70 is provided on the mounting plate 10, passing through several first guide plates 20 and at least two second guide plates 30. The first guide column 60 and the second guide column 70 serve to position the first guide plate 20 and the second guide plate 30 during installation. Then, the first guide plate 20 is accurately stacked on the mounting plate 10 through the first guide post 60. After the support post 40 is inserted on the mounting plate 10, the second guide plate 30 is stacked on the support post 40 and positioned by the first guide post 60 and the second guide post 70. Several second guide plates 30 are fitted with locking parts 80, which are fixedly connected to the ends of the support posts 40. Several first guide plates 20 are fixedly connected to the mounting plate 10 by screws. The above installation structure facilitates the installation and disassembly of each plate layer, and makes assembly and maintenance convenient.
[0023] Because the probes 50 are numerous and densely packed, an insulating layer is provided on the outer peripheral surface of each probe 50 to prevent them from contacting each other. For example, the insulating layer can be an insulating film. After the insulating film is applied to the outer peripheral surface of the probes 50, adjacent probes 50 can be insulated from each other, preventing short circuits caused by contact between adjacent probes during testing, thus avoiding inaccurate test results and improving test accuracy.
[0024] In summary, this application's solution involves embedding probes through a mounting plate, several first guide plates, and several second guide plates. The first guide plates are stacked on the mounting plate, and support pillars that pass through the first guide plates are provided on the mounting plate. The second guide plates are stacked on top of the support pillars. A locking block is formed on the outer periphery of the probe, and the mounting plate has a limiting groove for limiting the locking block. During operation, the needle-wire testing fixture is inverted and mounted on the testing machine. The testing machine drives the fixture to move downwards, causing the probes on the fixture to contact the contacts on the circuit board, thus completing the circuit board test. Sufficient space on the mounting plate allows for the creation of limiting grooves, reducing manufacturing difficulty. The limiting grooves, in conjunction with the locking blocks on the probes, limit the probes, preventing them from falling out, improving the stability of the testing fixture during operation, and reducing the frequency and cost of fixture maintenance.
[0025] The embodiments described above do not constitute a limitation on the scope of protection of this technical solution. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of the above embodiments should be included within the scope of protection of this technical solution.
Claims
1. A pin-wire testing fixture for circuit board testing, characterized in that: The device includes a probe (50), a mounting plate (10) through which the probe (50) passes and is arranged sequentially from bottom to top, a plurality of first guide plates (20) and a plurality of second guide plates (30). The plurality of first guide plates (20) are stacked on the mounting plate (10). A support column (40) is provided on the mounting plate (10) and passes through the first guide plates (20). The second guide plates (30) are stacked on top of the support column (40). A locking block (51) is formed on the outer peripheral surface of the probe (50). The mounting plate (10) has a limiting groove (11) for limiting the locking block (51).
2. The pin-wire testing fixture for circuit board testing according to claim 1, characterized in that: The card block (51) is spherical, and the limiting groove (11) has a bearing surface that matches the shape of the card block (51).
3. The pin-wire testing fixture for circuit board testing according to claim 1, characterized in that: A groove (31) is provided on the surface of at least one of the second guide plates (30), and a filling layer is provided in the groove (31) for the probe to pass through.
4. The pin-wire testing fixture for circuit board testing according to claim 1, characterized in that: A first guide post (60) is inserted into the mounting plate (10), and the first guide post (60) passes through a plurality of first guide plates (20) and a plurality of second guide plates (30).
5. The pin-wire testing fixture for circuit board testing according to claim 4, characterized in that: A second guide post (70) is provided on the mounting plate (10), and the second guide post (70) passes through several first guide plates (20) and at least two second guide plates (30).
6. The pin-wire testing fixture for circuit board testing according to claim 5, characterized in that: Several second guide plates (30) are fitted with locking members (80), which are fixedly connected to the ends of the support columns (40).
7. The pin-wire testing fixture for circuit board testing according to claim 1, characterized in that: An insulating layer (53) is fitted on the outer peripheral surface of the probe (50).
8. The pin-wire testing fixture for circuit board testing according to claim 1, characterized in that: The first guide plate (20) and the second guide plate (30) are spaced apart.