Linear differentiable transformer chip output DC bias voltage testing device
By integrating a power supply unit, main control unit, bias voltage acquisition unit, digital-to-analog converter unit, and analog voltage acquisition unit, and utilizing a microcontroller and a 12-bit digital-to-analog converter chip, the resource waste and delay problems of traditional testing methods are solved, and fast and accurate DC bias voltage testing is achieved.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- JINZHOU 777 MICROELECTRONICS
- Filing Date
- 2025-06-13
- Publication Date
- 2026-04-24
AI Technical Summary
Traditional methods for testing the DC bias voltage output of differential transformer chips require a variety of expensive instruments, resulting in wasted resources and delays. The tests cannot be completed within 30 seconds, affecting the accuracy and reliability of the tests.
By combining a power supply unit, a main control unit, a bias voltage acquisition unit, a digital-to-analog converter unit, and an analog voltage acquisition unit, and utilizing a microcontroller and a 12-bit digital-to-analog converter chip, a fast and accurate DC bias voltage test can be achieved.
It enables testing to be completed within 1-2 seconds, meeting the requirements for efficient and accurate testing, and avoiding problems such as resource waste and messy connection cables.
Smart Images
Figure CN224163777U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to a testing device, and more particularly to a testing device for the DC bias voltage output of a linear differential transformer chip. Background Technology
[0002] Currently, testing the DC bias voltage output of differential transformer chips requires specialized instruments such as power supplies, signal generators, programmable switches, digital benchtop multimeters, and oscilloscopes. Controlling these instruments requires dedicated VEE software, but each instrument requires a certain delay to stabilize its output. Due to the large number of instruments used, the total delay time is excessive. Furthermore, testing the DC bias voltage output of differential transformer chips requires removing the device under test (DUT) from its cryogenic environment to verify the compliance of various parameters under low-temperature conditions. Therefore, the test must be completed within 30 seconds to prevent inaccurate results due to temperature changes caused by prolonged testing. While VEE software can reduce the testing time to as little as one minute, it still cannot meet the requirements for high and low temperature testing.
[0003] Therefore, relying on various instruments to perform parameter testing of the DC bias voltage output of a differential transformer chip has the following problems:
[0004] 1. Due to the high price of various imported instruments and meters, traditional testing methods that rely on these instruments and meters consume too many resources, resulting in a certain waste of resources.
[0005] 2. Traditional testing methods use too many instruments, and the coordination between them requires a certain delay. Since the test must be completed within 30 seconds, this method cannot meet the testing requirements.
[0006] 3. Because military electronic products have strict reliability requirements, traditional methods of building test systems with instruments and meters are prone to messy wiring, which seriously reduces the reliability of the test. Utility Model Content
[0007] The technical problem to be solved by this utility model is to provide a test device for the DC bias voltage output of a linear differential transformer chip with fast testing speed and high testing accuracy.
[0008] To achieve the above objectives, the present invention adopts the following technical solution:
[0009] A test device for DC bias voltage output of a linear differential transformer chip includes a power supply unit, a main control unit, a bias voltage acquisition unit, a digital-to-analog conversion unit, and an analog voltage acquisition unit. The power output terminal of the power supply unit is electrically connected to the main control unit, the bias voltage acquisition unit, and the digital-to-analog conversion unit, respectively, to provide working power to each unit.
[0010] The bias voltage acquisition unit is an ICL7107 circuit module without the digital tube. Its input terminal is connected to the output terminal of the differential transformer chip, and its output terminal is connected to the signal input terminal of the main control unit. It is used to filter out the DC bias voltage in the AC component of the differential transformer chip, convert it into a digital signal, and transmit it to the main control unit.
[0011] The main control unit is a microcontroller, used to transmit the received digital signals to the digital-to-analog converter unit;
[0012] The input terminal of the digital-to-analog converter is connected to the signal output terminal of the main control unit, and is used to convert the input digital signal into an analog voltage and then transmit it to the analog voltage acquisition unit for DC bias voltage acquisition.
[0013] As a further preferred option, the microcontroller is an STC8H8K64U.
[0014] As a further preferred embodiment, the digital-to-analog conversion unit is a 12-bit digital-to-analog conversion chip TLV5618.
[0015] As a further preferred option, the analog voltage acquisition unit is a microFLEX Teradyne test device, which integrates a 16-bit AD voltage acquisition module for precise measurement of the DC voltage transmitted from the digital-to-analog converter unit, and finally saves the data in a text document.
[0016] The beneficial effects of this utility model are:
[0017] 1. Since the bias voltage acquisition unit is an ICL7107 circuit module without the digital tube, its input terminal is connected to the output terminal of the differential transformer chip, and its output terminal is connected to the signal input terminal of the main control unit; it is used to filter out the DC bias voltage in the AC component of the differential transformer chip, convert it into a digital signal and transmit it to the main control unit, thereby obtaining a pure DC voltage signal.
[0018] 2. Because the main control unit is controlled by a microcontroller, it can coordinate the collaborative work of the bias voltage acquisition unit and the digital-to-analog conversion unit. The microcontroller can transmit the received digital tube segment codes to the digital-to-analog conversion unit, convert them into DC voltage, and finally send them to the analog voltage acquisition unit to achieve DC bias voltage acquisition. The testing speed is fast and the testing accuracy is high; the test can be completed within 1-2 seconds, fully meeting the testing requirements. Attached Figure Description
[0019] Figure 1 This is the circuit block diagram of this utility model.
[0020] Figure 2 This is the circuit schematic diagram of this utility model.
[0021] In the diagram: power supply unit 1, main control unit 3, bias voltage acquisition unit 2, digital-to-analog conversion unit 4, analog voltage acquisition unit 5, differential transformer chip 6. Detailed Implementation
[0022] The embodiments of this patent are described in detail below. Examples of these embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain this patent, and should not be construed as limiting this patent.
[0023] like Figures 1-2 As shown, this utility model relates to a DC bias voltage testing device for a linear differential transformer chip output, comprising a power supply unit 1, a main control unit 3, a bias voltage acquisition unit 2, a digital-to-analog converter unit 4, and an analog voltage acquisition unit 5. The power supply unit 1 uses an LM7805 voltage regulator chip to convert the input +15V power supply to +5V power. The power output terminal of the power supply unit 1 is electrically connected to the main control unit 3, the bias voltage acquisition unit 2, and the digital-to-analog converter unit 4, respectively, to provide operating power to each unit.
[0024] The bias voltage acquisition unit 2 is an ICL7107 circuit module without the digital tube. Its input terminal is electrically connected to the output terminal of the differential transformer chip 6, and its output terminal is connected one-to-one with the signal input pins P0.0~0.7, P1.0~1.7, and P2.0~2.7 of the main control unit 3. It is used to filter out the DC bias voltage from the AC component of the received linear differential transformer chip 6, convert it into a digital signal, and transmit it to the main control unit 3. The digital signal is a 3-bit 8-segment segment code data, and the measurable DC voltage range is 999mV-1mV.
[0025] The linear differential transformer chip 6 is an AD698 chip, whose actual output DC bias voltage is 10mV-300mV. The main control unit 3 is a microcontroller using an STC8H8K64U high-speed 12-bit AD precision, which is responsible for coordinating the collaborative work of the bias voltage acquisition unit 2 and the digital-to-analog converter unit 4, and transmitting the received digital signal to the digital-to-analog converter unit 4.
[0026] The first set of signal input terminals of the microcontroller, namely P0.0 to P0.7, is connected to the first 8 segments of data of the bias voltage acquisition unit 2. The second set of signal input terminals, namely P1.0 to P1.7, is connected to the second 8 segments of data of the bias voltage acquisition unit 2. The third set of signal input terminals, namely P2.0 to P2.7, is connected to the third 8 segments of data of the bias voltage acquisition unit 2. The microcontroller obtains the measured DC voltage value through the data acquired from the three sets of signal input terminals, and then exchanges data with the digital-to-analog converter unit 4.
[0027] The digital-to-analog converter unit 4 is a 12-bit digital-to-analog converter chip TLV5618. The input terminal of the digital-to-analog converter unit 4 is connected one-to-one with the signal output terminals P3.2, P3.3, and P3.4 of the main control unit 3, and is used to convert the input digital signal into an analog voltage and then transmit it to the analog voltage acquisition unit 5 for DC bias voltage acquisition.
[0028] The analog voltage acquisition unit 5 is a microFLEX Teradyne test device, which integrates a 16-bit AD voltage acquisition module to precisely measure the DC voltage transmitted from the digital-to-analog converter unit 4 and finally save the data in a text document.
[0029] The testing process is as follows:
[0030] 1. After the linear differential transformer chip 6 is powered on and working normally, the output pin outputs a sine wave signal with DC bias voltage to the bias voltage acquisition unit 2. After being processed by its internal filtering circuit, the DC bias voltage is obtained. Then, the input voltage signal is converted into a digital tube segment code by its A / D processing circuit.
[0031] 2. After receiving the digital tube segment code data transmitted from the bias voltage acquisition unit 2 through the main control unit 3, the digital tube segment code data is converted into a digital signal by the microcontroller program and transmitted to the digital-to-analog converter unit 4. The digital-to-analog converter unit 4 converts the digital signal into an analog voltage through the internal digital-to-analog processing circuit and then transmits it to the analog voltage acquisition unit 5 for analog voltage measurement.
[0032] The above description is only a preferred embodiment of the present utility model, but the protection scope of the present utility model is not limited thereto. Any equivalent substitutions or changes made by those skilled in the art within the technical scope disclosed in the present utility model, based on the technical solution and the inventive concept of the present utility model, should be included within the protection scope of the present utility model.
Claims
1. A test device for DC bias voltage output of a linear differential transformer chip, comprising a power supply unit and a main control unit, characterized in that: It also includes a bias voltage acquisition unit, a digital-to-analog conversion unit, and an analog voltage acquisition unit. The power output terminal of the power supply unit is electrically connected to the main control unit, the bias voltage acquisition unit, and the digital-to-analog conversion unit, respectively, to provide working power to each unit. The bias voltage acquisition unit is an ICL7107 circuit module without the digital tube. Its input terminal is connected to the output terminal of the differential transformer chip, and its output terminal is connected to the signal input terminal of the main control unit. It is used to filter out the DC bias voltage in the AC component of the differential transformer chip, convert it into a digital signal, and transmit it to the main control unit. The main control unit is a microcontroller, used to transmit the received digital signals to the digital-to-analog converter unit; The input terminal of the digital-to-analog converter is connected to the signal output terminal of the main control unit, and is used to convert the input digital signal into an analog voltage and then transmit it to the analog voltage acquisition unit for DC bias voltage acquisition.
2. The linear differential transformer chip output DC bias voltage testing device according to claim 1, characterized in that: The microcontroller used is STC8H8K64U.
3. The linear differential transformer chip output DC bias voltage testing device according to claim 1, characterized in that: The digital-to-analog conversion unit is a 12-bit digital-to-analog conversion chip TLV5618.
4. The linear differential transformer chip output DC bias voltage testing device according to claim 1, characterized in that: The analog voltage acquisition unit is a microFLEX Teradyne test device, which integrates a 16-bit AD voltage acquisition module to precisely measure the DC voltage transmitted from the digital-to-analog converter and finally save the data in a text document.