Electrical testing jig for GIP circuit on display panel

Abstract

The utility model discloses an electrical testing jig for a GIP circuit on a display panel, which relates to the field of panel detection and comprises a base, a through groove is arranged in the base, a transparent substrate is mounted in the through groove and used for bearing a panel to be tested, a side frame is arranged on one side of the base, which is positioned on the through groove, and a push-pull type quick clamp is mounted on the side frame. The push-pull type rapid clamp is provided with a push end, the push end is fixedly connected with a lifting plate, the lifting plate is detachably connected with a wired probe plate, the wired probe plate is located above the transparent substrate, and the wired probe plate is connected with the rapid detection mainboard; according to the utility model, the electrical testing needle can be adjusted according to different display panel shapes or test points to achieve the purpose of general electrical testing, the structure is simple, the operation is convenient, the electrical testing efficiency is high, the cost of new circuit research and development is reduced, actual problems of products can be found in time, the product performance evaluation is more sufficient, and the product quality is improved. The development requirement can be met with high efficiency and low cost, the cost performance is high, and the product competitiveness is improved.

Description

Technical Field

[0001] This utility model relates to the field of panel testing technology, and in particular to an electrical testing fixture for GIP circuits on a display panel. Background Technology

[0002] Display screens have seen rapid development in recent years. Existing display devices are typically GIP (GATE IN PANEL), where the gate IC's functionality is integrated into the panel. GIP is commonly used in automotive projects. Currently, there are many risks associated with developing new or large-size products using LTPS or A-SI products. For example, can the GIP circuit handle large loads? Is the charging time sufficient? The conventional approach is to achieve this through circuit simulation or by developing a separate verification mask. However, simulation software cannot fully represent the actual problems encountered by our products in real-world scenarios, such as parasitic capacitance, telecommunications interference, and impure signal sources. Developing a separate verification mask is costly, time-consuming, and has low cost-effectiveness.

[0003] Patent application CN202123448198.4 discloses a versatile electrical testing tool for display panels, comprising a base, a support frame fixedly connected to one side of the upper surface of the base, a telescopic cylinder fixedly connected to the inner top of the support frame, a concave plate fixedly connected to the output end of the telescopic cylinder, a sliding groove formed on the inner sidewall of the concave plate, a fixing block fixedly connected to one side of the inner sidewall of the concave plate, a first electrical testing fixture fixedly connected to the side of the sliding groove away from the fixing block, a first sawtooth fixedly connected to one side of the first electrical testing fixture, a second electrical testing fixture slidably connected to the other side of the sliding groove, a second sawtooth fixedly connected to one side of the second electrical testing fixture, and an electrical testing fixture contact PIN movably connected to the surface of the second sawtooth. This technical solution, by adjusting the electrical testing fixture contact PIN placed between the first and second sawtooths, makes the position of the electrical testing fixture contact PIN correspond to the position of the screen contact PAD of the display panel to be tested, eliminating the need to replace the corresponding electrical testing fixture and effectively improving work efficiency. However, the electrical testing tool has a relatively complex structure and is cumbersome to operate, which affects the efficiency of electrical testing. Therefore, this utility model discloses an electrical testing fixture for GIP circuits on a display panel to solve the above problems. Utility Model Content

[0004] Based on this, it is necessary to provide an electrical testing fixture for GIP circuits on display panels to address the aforementioned technical problems. This fixture can adjust the electrical testing probes to achieve universal electrical testing for different display panel shapes or test points. It is simple in structure, easy to operate, and has high electrical testing efficiency. This helps reduce the cost of developing new circuits, allows for timely detection of actual problems in the product, and enables more comprehensive product performance evaluation. It can meet development needs efficiently and at low cost, offering high cost-effectiveness and thus improving product competitiveness.

[0005] To solve the above-mentioned technical problems, the present invention adopts the following technical solution:

[0006] An electrical testing fixture for GIP circuits on a display panel includes a base with a through slot. A transparent substrate is installed in the through slot to support the panel under test. A side frame is provided on one side of the base near the through slot, and a push-pull quick clamp is installed on the side frame. The push-pull quick clamp has a pushing end, which is fixedly connected to a lifting plate. A wire probe plate is detachably connected to the lifting plate. The wire probe plate is located above the transparent substrate and is connected to the quick test host board.

[0007] As a preferred embodiment of the electrical testing fixture for the GIP circuit on the display panel provided by this utility model, the bottom surface of the base is fixed with several anti-slip support feet.

[0008] In a preferred embodiment of the electrical testing fixture for the GIP circuit on the display panel provided by this utility model, the upper part of the through groove is a stepped groove, and the transparent substrate is supported in the stepped groove.

[0009] As a preferred embodiment of the electrical testing fixture for the GIP circuit on the display panel provided by this utility model, both the transparent substrate and the bottom wall of the stepped groove are provided with threaded holes, and the transparent substrate and the stepped groove are connected by bolts passing through the threaded holes.

[0010] As a preferred embodiment of the electrical testing fixture for the GIP circuit on the display panel provided by this utility model, the side frame and the base are both made of black bakelite, and the transparent substrate and the lifting plate are both transparent acrylic sheets.

[0011] As a preferred embodiment of the electrical testing fixture for the GIP circuit on the display panel provided by this utility model, guide sleeves are fixedly connected to both sides of the lifting plate, and a guide rod slides through the guide sleeve. The upper end of the guide rod is fixedly connected to the side frame through a connecting block, and the lower end of the guide rod is fixedly connected to the base.

[0012] As a preferred embodiment of the electrical testing fixture for the GIP circuit on the display panel provided by this utility model, the wire probe plate includes a base, a probe and a wire. The base is provided with a socket. One end of the probe is connected to the wire. The probe is inserted into the socket and the lower end of the probe extends out of the base. The other end of the wire is connected to the fast test host board.

[0013] As a preferred embodiment of the electrical testing fixture for the GIP circuit on the display panel provided by this utility model, the side frame is provided with an opening slot, and threaded holes are provided on both sides of the opening slot. The base is provided with extension ears on both sides, and holes are provided on the extension ears. The base and the side frame are connected by screws passing through the holes and threaded holes.

[0014] As a preferred embodiment of the electrical testing fixture for the GIP circuit on the display panel provided by this utility model, the upper surface of the transparent substrate is provided with a transparent anti-slip layer.

[0015] As a preferred embodiment of the electrical testing fixture for the GIP circuit on the display panel provided by this utility model, it further includes multiple limiting blocks. The bottom surface of the limiting blocks is provided with a repeating adhesive structure. The limiting blocks are fixedly connected to the transparent substrate through the repeating adhesive structure. The limiting blocks are located around the panel to be tested.

[0016] Compared with the prior art, the present invention has the following advantages: The electrical testing fixture for the GIP circuit on the display panel provided by the present invention can adjust the electrical testing probe for different display panel shapes or test points to achieve the purpose of universal electrical testing. It has a simple structure, is easy to operate, and has high electrical testing efficiency. It helps to reduce the cost of developing new circuits, can promptly identify actual problems in the product, and conduct more thorough product performance evaluation. It can meet development needs with high efficiency and low cost, has high cost performance, and thus improves product competitiveness. Attached Figure Description

[0017] To more clearly illustrate the solutions in this utility model, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are some embodiments of this utility model. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.

[0018] Figure 1 A three-dimensional schematic diagram of the overall structure of the electrical testing fixture for the GIP circuit on the display panel provided by this utility model;

[0019] Figure 2 An exploded view of the overall structure of the electrical testing fixture for the GIP circuit on the display panel provided by this utility model;

[0020] Figure 3A three-dimensional schematic diagram of the wire probe plate in the electrical testing fixture for the GIP circuit on the display panel provided by this utility model.

[0021] Figure 4 An exploded view of the wire probe plate in the electrical testing fixture for the GIP circuit on the display panel provided by this utility model.

[0022] Figure 5 A planar schematic diagram of the electrical testing fixture for the GIP circuit on the display panel provided by this utility model when testing the panel under test.

[0023] Figure 6 A side view of the electrical testing fixture for the GIP circuit on the display panel provided by this utility model when testing the panel under test.

[0024] Figure 7 A schematic diagram of the transparent substrate structure in the electrical testing fixture for the GIP circuit on the display panel provided by this utility model.

[0025] The markings in the diagram are explained as follows:

[0026] 1. Base; 2. Through slot; 3. Transparent substrate; 4. Panel to be tested; 5. Side frame; 6. Push-pull quick clamp; 7. Lifting plate; 8. Wire probe plate; 81. Base; 82. Probe; 83. Wire; 84. Socket; 85. Extension ear; 86. Hole; 9. Anti-slip support foot; 10. Step groove; 11. Threaded hole one; 12. Opening groove; 13. Threaded hole two; 14. Guide sleeve; 15. Guide rod; 16. Connecting block; 17. Transparent anti-slip layer; 18. Limiting block. Detailed Implementation

[0027] To enable those skilled in the art to better understand the present invention, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort should fall within the protection scope of the present invention.

[0028] As described in the background section, there are many risks when developing new or large-size LTPS or A-SI products. For example, whether the GIP circuit can handle large loads and whether the charging time is sufficient. The conventional approach is to achieve this through circuit simulation or by creating a separate verification mask. However, simulation software cannot fully represent the actual problems encountered by our products in actual operation, such as parasitic capacitance, telecommunications interference, and impure signal sources. Creating a separate verification mask is costly and time-consuming, with low cost-effectiveness. Existing electrical testing tools are relatively complex in structure and cumbersome to operate, which affects the efficiency of electrical testing.

[0029] To solve this technical problem, this utility model provides an electrical testing fixture for GIP circuits on display panels, which is applied in the field of panel testing.

[0030] For details, please refer to Figure 1-7 The electrical testing fixture for the GIP circuit on the display panel specifically includes a base 1, a through groove 2 in the base 1, a transparent substrate 3 installed in the through groove 2, the transparent substrate 3 for supporting the panel 4 to be tested, a side frame 5 on one side of the base 1 located in the through groove 2, a push-pull quick clamp 6 installed on the side frame 5, a pushing end on the push-pull quick clamp 6, a lifting plate 7 fixedly connected to the pushing end, a wire probe plate 8 detachably connected to the lifting plate 7, the wire probe plate 8 located above the transparent substrate 3, and the wire probe plate 8 connected to the quick test host board.

[0031] The electrical testing fixture for GIP circuits on display panels provided by this utility model can adjust the electrical testing probes to achieve universal electrical testing for different display panel shapes or test points. It has a simple structure, is easy to operate, and has high electrical testing efficiency. It helps reduce the cost of developing new circuits, can promptly identify actual problems in the product, and conduct more thorough product performance evaluation. It can meet development needs with high efficiency and low cost, has a high cost-performance ratio, and thus improves product competitiveness.

[0032] To enable those skilled in the art to better understand the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings.

[0033] It should be noted that, unless otherwise specified, the embodiments and features and technical solutions in the present invention can be combined with each other.

[0034] It should be noted that similar labels and letters in the following figures indicate similar items. Therefore, once an item is defined in one figure, it does not need to be further defined and explained in subsequent figures.

[0035] Example 1

[0036] Please refer to Figure 1-7 This invention provides an electrical testing fixture for GIP circuits on a display panel, comprising a base 1, which is a flat plate with a through groove 2. A transparent substrate 3 is mounted in the through groove 2, supporting a panel 4 to be tested. The panel 4 is a glass plate with GIP circuitry. A light source is introduced below the base 1, and the light source illuminates the transparent substrate 3 through the through groove 2 to test whether the circuitry of the panel 4 is normal. A side frame 5 is provided on one side of the base 1 near the through groove 2, and a push-pull quick clamp 6 is mounted on the side frame 5. The push-pull quick clamp 6 has a pushing end. The push-pull quick clamp 6 is a pre-purchased structure, and its specific structure is not detailed here. When the handle of the pull-type quick clamp 6 is pulled, the pushing end moves downward and vice versa. The pushing end is fixedly connected to the lifting plate 7. An elastic pad or rubber pad is set at the contact part between the pushing end and the lifting plate 7. This provides a certain elastic buffer when the lifting plate 7 is pushed downward to avoid damage to the probe 82 and also increases adaptability to achieve electrical testing of panels of different thicknesses. The lifting plate 7 is detachably connected to the wired probe plate 8. The wired probe plate 8 is located above the transparent substrate 3 and is connected to the fast test host board. The fast test host is connected to the pad on the panel under test 4 through the wired probe plate 8, so as to input test signals to the panel under test 4 using the fast test host.

[0037] Furthermore, several anti-slip support feet 9 are fixed on the bottom surface of the base 1. The anti-slip support feet 9 are metal pillars covered with a rubber layer, which are used to support the base 1 and play an anti-slip role.

[0038] The upper part of the through groove 2 is a stepped groove 10. The transparent substrate 3 is supported in the stepped groove 10. The transparent substrate 3 is supported by the stepped groove 10. Threaded holes 11 are provided on the bottom walls of both the transparent substrate 3 and the stepped groove 10. The transparent substrate 3 and the stepped groove 10 are connected by bolts passing through the threaded holes 11, thereby fixing the transparent substrate 3 in the through groove 2.

[0039] Both the side frame 5 and the base 1 are made of black bakelite, which is a synthetic phenolic resin that can provide insulation and light shielding. The transparent substrate 3 and the lifting plate 7 are both transparent acrylic sheets to ensure that light from the light source can pass through.

[0040] The probe board 8 includes a base 81, probes 82, and wires 83. The base 81 has a socket 84. One end of the probe 82 is connected to the wire 83. The probe 82 is inserted into the socket 84, and the lower end of the probe 82 extends out of the base 81. The other end of the wire 83 is connected to the fast test main board. The fast test main board is the main board inside the test equipment. It is an existing device and will not be described in detail here. The number of sockets 84 can be set to multiple according to the requirements. Generally, the distribution of pads on the panel is relatively regular and the interval is also fixed. Therefore, the arrangement of the sockets 84 also corresponds to the distribution and arrangement of the pads on the panel. For pads on different panels, probes 82 are inserted into different sockets 84, thereby achieving the purpose of electrical testing on different panels.

[0041] On the other hand, the side frame 5 is provided with an opening slot 12, and threaded holes 13 are provided on both sides of the opening slot 12. The base 81 is provided with extension ears 85 on both sides, and holes 86 are provided on the extension ears 85. The base 81 and the side frame 5 are connected by screws passing through the holes 86 and the threaded holes 13, so that the wire probe plate 8 and the side frame 5 can be detachably connected. When performing electrical tests on different panels, different wire probe plates 8 can be replaced, so that the wire probe plate 8 can be dedicated. When performing electrical tests on panels, only the corresponding wire probe plate 8 needs to be replaced, which is more efficient.

[0042] Example 2

[0043] The electrical testing fixture for the GIP circuit on the display panel provided in Embodiment 1 is further optimized, specifically, as follows: Figure 1-2 As shown, guide sleeves 14 are fixedly connected to both sides of the lifting plate 7. A guide rod 15 slides through the guide sleeve 14. The upper end of the guide rod 15 is fixedly connected to the side frame 5 through the connecting block 16, and the lower end of the guide rod 15 is fixedly connected to the base 1. The guide rod 15 and the guide sleeve 14 fit tightly together, ensuring that the lifting plate 7 is in a horizontal state during the lifting process, and avoiding the lifting plate 7 tilting and causing pressure damage to the panel 4 to be tested, which would affect the quality of the panel.

[0044] Example 3

[0045] The electrical testing fixture for the GIP circuit on the display panel provided in Embodiment 2 is further optimized, specifically, as follows: Figure 7As shown, a transparent anti-slip layer 17 is provided on the upper surface of the transparent substrate 3. The transparent anti-slip layer 17 is a transparent rubber layer. The transparent anti-slip layer 17 prevents the panel under test 4 from shifting laterally after placement, which would affect the electrical test. At the same time, after the panel under test 4 is placed on the transparent substrate 3, limiting blocks 18 are provided on all four sides of the panel under test 4. The limiting blocks 18 abut against the sides of the panel under test 4 to limit the panel under test 4. Specifically, the bottom surface of the limiting blocks 18 is provided with a repeating adhesive structure. 8. The device is fixedly connected to the transparent substrate 3 by a repeatable adhesive structure. The repeatable adhesive structure is a suction cup, which is embedded in the limiting block 18. It does not affect the adhesion between the limiting block 18 and the transparent substrate 3. Of course, the repeatable adhesive structure can also be a repeatable adhesive layer, such as silicone-based pressure-sensitive adhesive, polyurethane dynamic adhesive, microsphere acrylic adhesive, or biomimetic adhesive material. The adhesive layer is located on the bottom surface of the limiting block 18. The limiting block 18 is bonded to the transparent substrate 3 through the adhesive layer, which can achieve the goal of fixing the limiting block 18 and making it easy to disassemble.

[0046] The working principle of the electrical testing fixture for the GIP circuit on the display panel provided by this utility model:

[0047] Taking a smartphone panel as an example, the panel's circuit module includes a GIP circuit module, a GOUT output module, a signal input module, and a test module with several test point pads. The circuit module is designed with layered circuitry placed on glass to form the panel under test (DUT) 4. The GIP circuit module is connected to an RC load circuit through the GOUT output module, and a test signal is input to the GIP circuit module through the signal input module. During electrical testing, the DUT 4 is placed on a transparent substrate 3, and the test point pads on the panel correspond to the probes 82 on the wired probe board 8. A push-pull quick clamp 6 is used to lower the lifting plate 7, causing the probes 82 to contact the test point pads, thus connecting the signal input module and connecting the DUT 4 to the fast test host. The signal from the GOUT output module on the GIP is connected to the load. By testing the output state of the load and the state of each test point, the specific state of the product during operation can be actually tested. At the same time, the product's performance can be determined, and how to improve the circuit can be improved for better results. From the perspective of cost and timeliness, this approach offers extremely high cost-effectiveness in terms of economic benefits and development cycle.

[0048] It is worth noting that in this example, GIP is a technology that integrates the functions of GATE IC onto PANEL. The RC load circuit is a circuit composed of capacitors and resistors, used to simulate a state of operation inside the display screen.

[0049] In this utility model, unless otherwise explicitly specified and limited, the terms "installation," "connection," "joining," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection, an electrical connection, or a connection that allows communication between them; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components, unless otherwise explicitly limited. Those skilled in the art can understand the specific meaning of the above terms in this utility model according to the specific circumstances.

[0050] Obviously, the embodiments described above are only some embodiments of this utility model, not all embodiments. The accompanying drawings show preferred embodiments of this utility model, but do not limit the patent scope of this utility model. This utility model can be implemented in many different forms; rather, the purpose of providing these embodiments is to provide a more thorough and comprehensive understanding of the disclosure of this utility model. Although this utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions described in the foregoing specific embodiments, or make equivalent substitutions for some of the technical features. Any equivalent structures made using the content of this utility model specification and drawings, directly or indirectly applied to other related technical fields, are similarly within the patent protection scope of this utility model.

Claims

1. An electrical testing fixture for GIP circuitry on a display panel, comprising a base, characterized in that, The base has a through slot, and a transparent substrate is installed in the through slot. The transparent substrate is used to support the panel to be tested. A side frame is provided on one side of the base located in the through slot. A push-pull quick clamp is installed on the side frame. The push-pull quick clamp has a pushing end. The pushing end is fixedly connected to a lifting plate. A wire probe plate is detachably connected to the lifting plate. The wire probe plate is located above the transparent substrate and is connected to the rapid testing main board.

2. The electrical testing fixture for a GIP circuit on a display panel according to claim 1, characterized in that, The base has several anti-slip support feet fixed to its bottom surface.

3. The electrical testing fixture for a GIP circuit on a display panel according to claim 1, characterized in that, The upper part of the through groove is a stepped groove, and the transparent substrate is supported in the stepped groove.

4. The electrical testing fixture for a GIP circuit on a display panel according to claim 3, characterized in that, Both the transparent substrate and the bottom wall of the stepped groove are provided with threaded holes, and the transparent substrate and the stepped groove are connected by bolts passing through the threaded holes.

5. The electrical testing fixture for a GIP circuit on a display panel according to claim 1, characterized in that, The side frame and base are both made of black bakelite, and the transparent substrate and lifting plate are both made of transparent acrylic sheet.

6. The electrical testing fixture for a GIP circuit on a display panel according to claim 1, characterized in that, Guide sleeves are fixedly connected to both sides of the lifting plate. A guide rod slides through the guide sleeve. The upper end of the guide rod is fixedly connected to the side frame through a connecting block, and the lower end of the guide rod is fixedly connected to the base.

7. The electrical testing fixture for a GIP circuit on a display panel according to claim 1, characterized in that, The wire probe plate includes a base, a probe, and a wire. The base has a socket. One end of the probe is connected to the wire. The probe is inserted into the socket and the lower end of the probe extends out of the base. The other end of the wire is connected to the rapid testing host board.

8. The electrical testing fixture for a GIP circuit on a display panel according to claim 7, characterized in that, The side frame is provided with an opening slot, and threaded holes are provided on both sides of the opening slot. The base is provided with extension ears on both sides, and holes are provided on the extension ears. The base and the side frame are connected by screws passing through the holes and threaded holes.

9. The electrical testing fixture for a GIP circuit on a display panel according to claim 1, characterized in that, The upper surface of the transparent substrate is provided with a transparent anti-slip layer.

10. The electrical testing fixture for a GIP circuit on a display panel according to claim 1, characterized in that, It also includes multiple limiting blocks, the bottom surface of which is provided with a repeating adhesive structure. The limiting blocks are fixedly connected to the transparent substrate through the repeating adhesive structure, and the limiting blocks are located around the panel to be tested.

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