Circuit board detection device

Abstract

The utility model provides a circuit board detection device, which relates to the technical field of production of printed circuit boards and comprises a detection board and a plurality of lock catch structures arranged at the end parts of the detection board respectively. The middle part of the detection board is provided with a probe used for connecting a circuit board to be detected, and a support column used for limiting the distance between the detection board and the circuit board to be detected. The lock catch structure comprises a clamping groove part and a sliding buckle installed in the clamping groove part in a sliding mode. The bottom of the sliding buckle is provided with a hook body which is used for clamping the bottom of the to-be-tested circuit board and is matched with the supporting column to fix the to-be-tested circuit board. The circuit board detection device is simple in structure, easy to install, convenient to use, tight in connection, high in stability and capable of improving the detection efficiency.

Description

Technical Field

[0001] This utility model relates to the field of printed circuit board manufacturing technology, and in particular to a circuit board testing device. Background Technology

[0002] Circuit boards generally refer to printed circuit boards. When a circuit board is completed in production or is being repaired, functional tests need to be performed on its terminals and other components. In the current circuit board testing process, workers need to manually connect the terminals of the testing device to the terminals of the circuit board. This method is inefficient and the connection of the terminals is prone to loosening, causing test failure. Utility Model Content

[0003] The purpose of this invention is to provide a circuit board testing device that solves the problem of manual connection required for testing circuit boards in the prior art, thereby ensuring a stable terminal connection and improving testing efficiency and success rate.

[0004] To achieve the above objectives, this utility model provides a circuit board testing device, including a testing board and a plurality of locking structures respectively disposed at the ends of the testing board.

[0005] The test board has probes in the middle for connecting to the circuit board under test, as well as support columns to limit the distance between the test board and the circuit board under test.

[0006] The locking structure includes a slot component and a sliding buckle slidably installed in the slot component; the bottom of the sliding buckle is provided with a hook body, which is used to hold the bottom of the circuit board under test and cooperate with the support column to fix the circuit board under test.

[0007] Furthermore, the sliding buckle has a slider above the hook body, which is slidably installed in the groove of the slot component; a push rod is provided above the slider, which is used to push the slider to move in the slot component.

[0008] Furthermore, the bottom of the slot component is provided with a bottom hole to accommodate the hook body to pass through, the top of the slot component contacts and is fixed to the bottom surface of the detection plate, and the detection plate has a top surface opening at the corresponding position to accommodate the push rod to pass through.

[0009] Furthermore, an elastic baffle is provided on one side of the card slot component, and the elastic baffle extends into the slide groove with a protrusion. The slider is provided with several grooves to accommodate the protrusion, and the position of the grooves is used to determine the stop position of the sliding buckle.

[0010] Furthermore, the slider is flat and horizontally placed in the slot component, with a groove provided on the side of the slider; the slider is connected to the hook body through a vertical plate, which is located off-center from the center of the slider.

[0011] Furthermore, the contact surface between the hook and the circuit board under test is a wedge-shaped surface, and the height of the wedge-shaped surface decreases along the direction toward the circuit board under test.

[0012] Furthermore, the bottom surface of the support column is used to abut against the circuit board under test, and the bottom surface of the support column is flush with the lowest point of the wedge-shaped surface.

[0013] Furthermore, it also includes a support plate, which is fixedly installed at the bottom of the slot component and has a hook hole for accommodating the hook body, a probe hole for accommodating the probe, and a support post hole for accommodating the support post.

[0014] Furthermore, the probe includes a fixed part mounted on the detection plate and a telescopic part sleeved in the fixed part. A thrust spring is provided between the telescopic part and the fixed part to keep the telescopic part in an extended state; the fixed part is sleeved in the probe hole.

[0015] Furthermore, the sidewalls of the chute form a rectangular frame structure, and a positioning post is provided at each of the three adjacent apex corners of the side. The detection plate is provided with positioning holes at the positions corresponding to the positioning posts. Side ears extend from both ends of the slot component, and screw mounting holes are provided on the side ears.

[0016] When using the circuit board testing device provided by this utility model, first align the probe on the testing board with the interface on the circuit board to be tested, and bring the two boards close together until the support column contacts the upper surface of the circuit board to be tested. Then push the sliding buckle so that the hook hooks the bottom of the circuit board to be tested. The pushing force of the support column on the circuit board to be tested and the pulling force of the sliding buckle on the circuit board to be tested are balanced, so that the testing board and the circuit board to be tested are relatively fixed.

[0017] Compared with the prior art, the beneficial effects of this utility model are: the circuit board testing device provided by this application has a simple structure and is easy to use. Simply align the probes of the testing board with the interfaces on the circuit board to be tested, and then push the sliding latch to connect the terminals of the testing device to the terminals of the circuit board. The connection is tight and has high stability, thereby improving testing efficiency and success rate. The latch structure consists of only two parts, is simple in structure, easy to install, and can reduce manufacturing costs. Attached Figure Description

[0018] Figure 1 This is a schematic diagram of the circuit board testing device in an embodiment of the present invention;

[0019] Figure 2 This is a schematic diagram of the sliding buckle in an embodiment of the present invention;

[0020] Figure 3 This is a cross-sectional view of the circuit board detection device in an embodiment of this utility model;

[0021] Figure 4 This is a schematic diagram of the card slot component in an embodiment of the present utility model;

[0022] Figure 5 This is a bottom view of the sliding buckle in an embodiment of this utility model;

[0023] Figure 6 This is a schematic diagram of the installation of the support plate in an embodiment of this utility model.

[0024] Among them, 1: detection plate; 2: circuit board to be tested; 3: probe; 4: support column; 5: slot component; 6: sliding buckle; 7: support plate; 11: top opening; 31: fixing part; 32: telescopic part; 51: bottom hole; 52: elastic baffle; 53: protrusion; 54: positioning column; 55: side ear; 56: screw mounting hole; 61: hook body; 62: slider; 63: push rod; 64: groove; 65: vertical plate. Detailed Implementation

[0025] It should be understood that the specific embodiments described herein are merely illustrative of the present invention and are not intended to limit the present invention.

[0026] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0027] It should be noted that all directional indicators (such as up, down, left, right, front, back, etc.) in this utility model embodiment are only used to explain the relative positional relationship and movement of each component in a certain specific posture (as shown in the figure). If the specific posture changes, the directional indicator will also change accordingly. The connection can be a direct connection or an indirect connection.

[0028] Furthermore, in this utility model, descriptions involving "first," "second," etc., are for descriptive purposes only and should not be construed as indicating or implying their relative importance or implicitly specifying the number of technical features indicated. Therefore, a feature defined with "first" or "second" may explicitly or implicitly include at least one of that feature. Additionally, the technical solutions of the various embodiments can be combined with each other, but only on the basis of being achievable by those skilled in the art. When the combination of technical solutions is contradictory or impossible to implement, such a combination of technical solutions should be considered non-existent and not within the scope of protection claimed by this utility model.

[0029] like Figure 1The diagram shown is a schematic diagram of the circuit board testing device in one embodiment of this application. The circuit board testing device provided in this embodiment includes a testing board 1 and a plurality of locking structures respectively disposed at the ends of the testing board 1.

[0030] The testing board 1 is a plate-shaped testing device used to test the circuit board 2 under test. It can be an exposed circuit board, and power and communication interfaces can be provided on the testing board 1. The locking structure is used to temporarily fix the testing board 1 and the circuit board 2 under test together, allowing the probes 3 on the testing board 1 to connect with the corresponding interfaces on the circuit board 2 under test, and maintaining relative fixation during testing. The number of locking structures includes, but is not limited to, 2, 3, and 4. More locking structures can be used depending on the size and structure of the circuit board 2 under test, ensuring a more secure fixation between the testing board 1 and the circuit board 2. The locking structures are preferably evenly distributed at the ends of the testing board 1, and preferably symmetrically distributed at both ends or multiple endpoints of the testing board 1.

[0031] The middle part of the test board 1 is provided with a probe 3 for connecting the circuit board 2 under test, and a support column 4 for limiting the distance between the test board 1 and the circuit board 2 under test.

[0032] The detection board 1 can be designed according to the circuit board under test 2, and the number and position of the probes 3 can be designed according to the detection requirements. The probes 3 are made of conductive material and can realize the electrical connection between the detection board 1 and the circuit board under test 2. The number and position of the support columns 4 also need to be designed according to the circuit boards under test 2 at each stage. In use, the bottom surface of the support column 4 contacts the circuit board under test 2 and supports it. The support column 4 is used to make the detection board 1 parallel to the circuit board under test 2, and each probe 3 can be vertically connected to the circuit board under test 2 to prevent the probes 3 from being damaged.

[0033] The locking structure includes a slot component 5 and a sliding buckle 6 that is slidably installed in the slot component 5; the bottom of the sliding buckle 6 is provided with a hook 61, which is used to hold the bottom of the circuit board 2 under test and cooperate with the support column 4 to fix the circuit board 2 under test.

[0034] In this embodiment, the locking structure comprises only two components, which offers significant advantages in consistency and mass production, facilitating large-scale manufacturing and reducing manufacturing costs. The slot component 5 is provided with a groove to accommodate the movement of the sliding buckle 6, and it restricts the degree of freedom of the sliding buckle 6 to prevent it from falling off. Preferably, a baffle can be provided, or the opening of the slot component 5 can be sealed by a detection plate 1. In this embodiment, the support column 4 rests against the upper surface of the circuit board 2 under test, and the hook 61 of the sliding buckle 6 connects to the lower surface of the circuit board 2 under test. By setting the lengths of the support column 4 and the sliding buckle 6, the circuit board 2 under test can be precisely locked in place. Furthermore, the height of the support column 4 can be longer than the length of the sliding buckle 6, causing a certain deformation in the circuit board 2 under test. The elasticity generated by the circuit board 2 under test makes the locking structure more tightly and stably fixed.

[0035] like Figure 2 The diagram shown is a schematic diagram of the sliding buckle in this embodiment. In this embodiment, the sliding buckle 6 has a slider 62 above the hook body 61. The slider 62 is slidably installed in the groove of the slot component 5. A push rod 63 is provided above the slider 62. The push rod 63 is used to push the slider 62 to move in the slot component 5.

[0036] The sliding buckle 6 is preferably manufactured as a single piece, comprising a hook 61, a slider 62, and a push rod 63. The push rod 63 is positioned at the top, and pushing the push rod 63 causes the sliding buckle 6 to move as a whole. The push rod 63 is preferably flat, and its force-bearing surface can be perpendicular to the direction of movement of the sliding buckle 6, thereby improving the operating feel. The slot component 5 is provided with a sliding groove, which can determine the movement of the slider 62, thereby enabling the sliding buckle 6 to move back and forth in a directional manner, and causing the hook 61 to move closer to or away from the circuit board 2 under test, thus completing the engagement and disengagement of the circuit board 2 under test.

[0037] like Figure 3 The diagram shows a cross-sectional view of the circuit board testing device in this embodiment. The cross-section passes through the hook body and is parallel to the moving direction of the hook body. The bottom of the slot component 5 is provided with a bottom hole 51 to accommodate the hook body 61. The top of the slot component 5 contacts and is fixed to the bottom surface of the testing plate 1. The testing plate 1 has a top surface opening 11 at the corresponding position to accommodate the push rod 63.

[0038] The top of the slot component 5 has an opening for a sliding groove, allowing the top of the slot component 5 to be fixed to the bottom surface of the detection plate 1. The bottom surface of the detection plate 1 can cover the sliding groove, thereby limiting the vertical movement of the slider 62, reducing the number of parts used, improving installation efficiency, and lowering manufacturing costs. During installation, simply pass the hook 61 of the sliding buckle 6 through the bottom hole 51, allowing the slider 62 to be accommodated in the slot component 5. Then, pass the push rod 63 from below through the top opening 11 on the detection plate 1, and finally, fix the slot component 5 to the detection plate 1.

[0039] like Figure 2 and Figure 4 As shown, Figure 4 This is a schematic diagram of the slot component in this embodiment. One side of the slot component 5 is provided with an elastic baffle 52. The elastic baffle 52 extends into the slide groove with a protrusion 53. The slider 62 is provided with a plurality of grooves 64 to accommodate the protrusion 53. The position of the grooves 64 is used to determine the position of the sliding buckle 6.

[0040] The elastic baffle 52 is preferably integrally molded onto the slot component 5, which can limit the slider 62, thereby determining the position of the sliding buckle 6. Preferably, the position of the sliding buckle 6 can include two positions: an engagement position between the hook body 61 and the circuit board 2 under test, and a disengagement position, thereby improving the stability of the circuit board 2 under test when it is fixed, and ensuring that the probe 3 is not easily disengaged from the circuit board 2 under test during the testing process.

[0041] like Figure 4 As shown, in this embodiment, the sidewall of the slide is formed into a rectangular frame structure, and a positioning post 54 is provided at each of the three adjacent top corners of the top of the sidewall. The detection plate 1 is provided with positioning holes at the positions corresponding to the positioning posts 54. Side ears 55 extend from both ends of the slot component 5, and screw mounting holes 56 are provided on the side ears 55.

[0042] The three positioning posts 54 are respectively located at the three apex corners of the top side of the slide groove, which can play a role in preventing fooling, facilitating installation, and preventing the slot component 5 from shaking, thereby improving the positioning accuracy of the slot component 5. The side ears 55 extending from both ends of the slot component 5 can be integrally molded with the slot component 5.

[0043] like Figure 2 and Figure 5 As shown, Figure 5 In the bottom view of the sliding buckle in this embodiment, the slider 62 is flat and is placed horizontally in the slot component 5. The groove 64 is provided on the side of the slider 62. The slider 62 is connected to the hook body 61 through a vertical plate 65, which is located at a position off the center of the slider 62.

[0044] The flat slider 62 not only saves materials but is also easy to install and moves easily within the groove of the slot component 5. The vertical plate 65 is positioned off-center from the slider 62 and connected to the bottom of the slider 62, forming an asymmetrical structure. This design prevents mistaken installation, eliminating the need for workers to determine the installation direction and effectively improving installation accuracy and efficiency. The opening direction of the hook 61 is parallel to the moving direction of the slider 62.

[0045] In this embodiment, the contact surface between the hook 61 and the circuit board 2 under test is a wedge-shaped surface, and the height of the wedge-shaped surface decreases along the direction toward the circuit board 2 under test.

[0046] The contact surface between the hook 61 and the circuit board 2 under test is a wedge-shaped surface, which makes it easy to insert the hook 61 into the bottom surface of the circuit board 2 under test. During the movement of the hook 61 towards the circuit board 2 under test, the circuit board 2 under test can be further tightened, improving the stability of the fixation and preventing the circuit board 2 under test from shaking relative to the detection plate 1, thereby improving the reliability of the detection.

[0047] In this embodiment, the bottom surface of the support column 4 is used to abut against the circuit board 2 under test, and the bottom surface of the support column 4 is flush with the lowest point of the wedge-shaped surface.

[0048] The support column 4 not only positions the distance between the circuit board 2 under test and the detection plate 1, but also applies a certain pushing force to the circuit board 2 under test. This, combined with the pulling force applied to the circuit board 2 by the locking structure, fixes the circuit board 2 under test relative to the detection plate 1. The bottom surface of the support column 4 is flush with the lowest point of the wedge-shaped surface of the hook 61, facilitating the sliding of the hook 61 into the bottom of the circuit board 2 under test. Furthermore, once the hook 61 has fully slid into the bottom of the circuit board 2 under test, it causes a slight deformation, further stabilizing the fixing of the circuit board 2 by the locking structure. The support column 4 can be equipped with a snap-fit ​​structure, allowing it to snap onto the detection plate 1 for quick installation or replacement, thus improving the positioning accuracy of the support column 4.

[0049] like Figure 6 The diagram shown is a schematic of the installation of the support plate in this embodiment. In this embodiment, a support plate 7 is also included. The support plate 7 is fixedly installed at the bottom of the slot component 5 and has a hook hole for accommodating the hook 61, a probe hole for accommodating the probe 3, and a support column hole for accommodating the support column 4.

[0050] The support plate 7 provides support for the probe 3 and the support column 4, preventing them from tilting under external forces during use and improving positioning accuracy. Preferably, the support plate 7 can be fixed to the upper and lower ends of the slot component 5 with the detection plate 1 using the same fastener, reducing the number of parts used, facilitating installation, and lowering manufacturing costs.

[0051] In this embodiment, the probe 3 includes a fixed part 31 mounted on the detection plate 1 and a telescopic part 32 sleeved in the fixed part 31. A thrust spring is provided between the telescopic part 32 and the fixed part 31 to keep the telescopic part 32 in an extended state; the fixed part 31 is sleeved in the probe hole.

[0052] The probe 3 has a telescopic function, and a thrust spring keeps the telescopic part 32 extended. When the probe 3 contacts the circuit board 2 under test, it generates a certain compressive force, making the connection of the probe 3 more stable and preventing it from disengaging due to positioning errors or shaking, thus improving the reliability of the test. The fixing part 31 does not move, so it is better supported when fitted into the probe hole, improving the positioning accuracy and stability of the probe 3. Preferably, the fixing part 31 can be clearance-fitted with the probe hole.

[0053] The above description is only a preferred embodiment of the present utility model and does not limit the patent scope of the present utility model. Any equivalent structural or procedural transformations made based on the contents of the present utility model specification and drawings, or direct or indirect applications in other related technical fields, are similarly included within the patent protection scope of the present utility model.

Claims

1. A circuit board testing device, characterized in that, It includes a detection plate (1) and several locking structures respectively disposed at the ends of the detection plate (1); The detection plate (1) is provided with a probe (3) for connecting the circuit board (2) under test, and a support column (4) for limiting the distance between the detection plate (1) and the circuit board (2) under test. The locking structure includes a slot component (5) and a sliding buckle (6) slidably installed in the slot component (5); the bottom of the sliding buckle (6) is provided with a hook (61), which is used to hold the bottom of the circuit board (2) under test and cooperate with the support column (4) to fix the circuit board (2) under test.

2. The circuit board testing device according to claim 1, characterized in that, The sliding buckle (6) has a slider (62) above the hook body (61), and the slider (62) is slidably installed in the groove of the slot component (5); a push rod (63) is provided above the slider (62), and the push rod (63) is used to push the slider (62) to move in the slot component (5).

3. The circuit board testing device according to claim 2, characterized in that, The bottom of the slot component (5) is provided with a bottom hole (51) for accommodating the hook (61) to pass through. The top of the slot component (5) is in contact with and fixed to the bottom surface of the detection plate (1). The detection plate (1) has a top surface opening (11) at the corresponding position for accommodating the push rod (63) to pass through.

4. The circuit board testing device according to claim 3, characterized in that, One side of the slot component (5) is provided with an elastic baffle (52), the elastic baffle (52) extends into the groove with a protrusion (53), and the slider (62) is provided with a plurality of grooves (64) to accommodate the protrusion (53). The position of the grooves (64) is used to determine the position of the sliding buckle (6).

5. The circuit board testing device according to claim 3, characterized in that, The slider (62) is flat and is placed horizontally in the slot component (5). The groove (64) is provided on the side of the slider (62). The slider (62) is connected to the hook body (61) through a vertical plate (65). The vertical plate (65) is located at a position offset from the center of the slider (62).

6. The circuit board testing device according to claim 1, characterized in that, The contact surface between the hook (61) and the circuit board (2) under test is a wedge-shaped surface, and the height of the wedge-shaped surface decreases in the direction toward the circuit board (2) under test.

7. The circuit board testing device according to claim 6, characterized in that, The bottom surface of the support column (4) is used to abut against the circuit board (2) under test, and the bottom surface of the support column (4) is flush with the lowest point of the wedge-shaped surface.

8. The circuit board testing device according to claim 1, characterized in that, It also includes a support plate (7), which is fixedly installed at the bottom of the slot component (5) and has a hook hole for accommodating the hook (61) to pass through, a probe hole for accommodating the probe (3) to pass through, and a support column hole for accommodating the support column (4) to pass through.

9. The circuit board testing device according to claim 8, characterized in that, The probe (3) includes a fixed part (31) mounted on the detection plate (1) and a telescopic part (32) sleeved in the fixed part (31). A thrust spring is provided between the telescopic part (32) and the fixed part (31) to keep the telescopic part (32) in an extended state. The fixed part (31) is sleeved in the probe hole.

10. The circuit board testing device according to claim 2, characterized in that, The sidewalls of the chute form a rectangular frame structure, and a positioning post (54) is provided at each of the three adjacent top corners of the top of the sidewall. The detection plate (1) is provided with a positioning hole at the position corresponding to the positioning post (54). Side ears (55) extend from both ends of the slot component (5), and screw mounting holes (56) are provided on the side ears (55).

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