Detection equipment for SMD (Surface Mount Device) transformer

By designing the electrode structure of the junction box and test box, and using multifunctional testing instruments, the problem of low efficiency in manual testing was solved, enabling rapid and accurate testing of surface mount transformers and improving testing efficiency and accuracy.

CN224190147UActive Publication Date: 2026-05-01GUANGDONG RUIGE PRECISION TECHNOLOGY CO LTD
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
GUANGDONG RUIGE PRECISION TECHNOLOGY CO LTD
Filing Date
2025-05-12
Publication Date
2026-05-01

AI Technical Summary

Technical Problem

Current testing of surface mount transformers mainly relies on manual testing, which leads to problems of false positives and false negatives, and the lack of testing fixtures results in low testing efficiency.

Method used

A surface mount transformer testing device was designed, which adopts a terminal block and test box structure. The terminal block is equipped with electrodes corresponding to the pins of the product under test. The electrodes pass through the test slot and are connected to the test box. The device uses elastic pins and a conical structure to achieve rapid electrical connection. The device is combined with guide posts and spring structure to ensure smooth operation. It is equipped with withstand voltage, comprehensive and interlayer testers for multi-functional testing.

Benefits of technology

It enables rapid and accurate testing of patch transformers, reduces false and missed tests, improves testing efficiency and accuracy, and enhances the stability and practicality of the equipment.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model provides a detection device for a patch transformer, and the device comprises a wiring board which is provided with electrodes corresponding to pins of a to-be-detected product, and the electrodes are electrically connected to a test box disposed at the lower end of the wiring board; the test box provides test terminals arranged according to a preset sequence. A manual test mode is changed, and rapid connection and test are realized by using a specific structure. For example, due to the conical structure design of the electrode and the test hole, electric connection can be rapidly completed by pressing down the wiring board, smooth operation is ensured through the guide column and the spring structure, automatic reset can be achieved after the test is finished, operation time is saved, and efficient detection is facilitated.
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Description

Technical Field

[0001] This application relates to the field of electronic component testing equipment, and in particular to a testing device for surface mount transformers. Background Technology

[0002] Surface mount transformers are commonly used in many circuits. These components need to be tested at the factory to ensure product quality.

[0003] Current testing of surface mount transformers is primarily done manually. Due to the numerous leads on the product, manual testing is prone to errors such as misidentification leading to false positives and missed positives. Furthermore, the lack of testing fixtures hinders rapid and efficient testing. Therefore, this invention proposes a testing device for surface mount transformers to at least partially address the problems that may exist in the prior art. Utility Model Content

[0004] In view of the aforementioned problems, this application is made to provide a testing device for surface mount transformers that overcomes or at least partially solves the aforementioned problems, comprising:

[0005] A terminal block is provided with electrodes corresponding to the pins of the product under test, and the electrodes are electrically connected to a test box located at the lower end of the terminal block;

[0006] The test box provides test terminals arranged in a preset order.

[0007] Preferably, the terminal block is provided with a test slot for placing a surface mount transformer;

[0008] The electrodes are disposed vertically on both sides of the test slot.

[0009] Preferably, the electrode is an elastic needle structure with the head of the elastic needle facing upwards.

[0010] Preferably, the wiring board is movably connected to the upper end of the test box via a guide post;

[0011] The guide post is fitted with a spring;

[0012] The test box is provided with test holes corresponding to the electrodes;

[0013] The lower end of the electrode and the lower end of the test hole are both tapered structures;

[0014] The test hole is electrically connected to the test terminal.

[0015] Preferably, the test box is further provided with a test platform at the lower position, and the test terminals are disposed on the test platform.

[0016] Preferably, the test terminal is a screw terminal.

[0017] Preferably, it also includes a pressure tester, a comprehensive tester, and an interlayer tester;

[0018] The withstand voltage tester is electrically connected to test terminal A, the comprehensive tester is electrically connected to test terminal B, and the interlayer tester is electrically connected to test terminal C.

[0019] Test terminals A, B, and C are electrically connected to the test terminals.

[0020] This application has the following advantages:

[0021] In the embodiments of this application, a terminal block is provided with electrodes corresponding to the pins of the product under test. These electrodes are electrically connected to a test box located at the lower end of the terminal block. The test box provides test terminals arranged in a preset order. This changes the manual testing method, utilizing a specific structure to achieve rapid connection and testing. For example, the tapered design of the electrodes and test holes allows for rapid electrical connection by pressing down the terminal block, and the guide post and spring structure ensure smooth operation. Automatic reset after testing saves operation time and facilitates efficient testing. Attached Figure Description

[0022] To more clearly illustrate the technical solution of this application, the drawings used in the description of this application will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0023] Figure 1 This is a schematic diagram of the structure of a testing device for a chip transformer provided in one embodiment of this application;

[0024] Figure 2 This is a schematic diagram of the wiring board and test box structure of a testing device for a surface mount transformer provided in one embodiment of this application. Detailed Implementation

[0025] To make the objectives, features, and advantages of this application more apparent and understandable, the application will be further described in detail below with reference to the accompanying drawings and specific embodiments. Obviously, the described embodiments are only some, not all, of the embodiments of this application. All other embodiments obtained by those skilled in the art based on the embodiments of this application without inventive effort are within the scope of protection of this application.

[0026] Reference Figure 1This paper illustrates a testing device for a surface mount transformer according to an embodiment of this application. The device includes: a terminal block 101 with electrodes 102 corresponding to the pins of the product under test (DUT). The electrodes 102 are electrically connected to a test box 103 located at the lower end of the terminal block 101. The test box 103 provides test terminals 133 arranged in a preset order. During testing, the DUT is connected to the electrodes 102 of the terminal block 101. The test terminals provided in the lower test box 103 are used to electrically connect to testing instruments or equipment, achieving efficient testing. This solves the problem that current surface mount transformer testing requires manual testing, which is inefficient, prone to errors, and leads to inaccurate testing. By connecting the test equipment through the aforementioned test terminals, the stability of the electrical connection is ensured, improving test accuracy and speed.

[0027] In the embodiments of this application, such as Figure 2 As shown, the terminal block 101 is provided with a test slot 111 for placing a surface mount transformer; the electrode 102 is vertically disposed on both sides of the test slot 111. The test slot 111 is used to adapt to the surface mount transformer to be tested, preventing the surface mount transformer from shifting position, which would cause the leads to not maintain a good electrical connection with the electrode 102, thereby ensuring the accuracy of the test and improving the test efficiency; by setting electrodes corresponding to the pins of the product under test, precise docking can be achieved, reducing false tests and missed tests caused by human identification errors. The test slot can adapt to the surface mount transformer, preventing its position from shifting, ensuring a good electrical connection between the pins and the electrode, and further ensuring the accuracy of the test.

[0028] By setting up a test slot 111 and arranging elastic pin electrodes 102 on both sides of the slot, the physical dimensions of the surface mount transformer are directly adapted to ensure that the pin position is in close contact with the electrode. Through the structure of the test slot 111, poor contact caused by pin offset or flatness deviation is effectively prevented, thereby improving the reliability of electrical connection.

[0029] The following will further describe a testing device for a patch transformer according to various exemplary embodiments of this application.

[0030] In the embodiments of this application, the electrode 102 is an elastic needle structure, with its elastic head facing upwards and its lower end fixed and penetrating through the terminal block 101. Figure 2As shown, the terminal block 101 is movably connected to the upper end of the test box 103 via a guide post 112; a spring 113 is sleeved on the guide post 112; the test box 103 has a test hole 131 corresponding to the electrode 102; the lower end of the electrode 102 and the lower end of the test hole 131 are both tapered structures; the test hole 131 is electrically connected to the test terminal 133. Due to the tapered structure at the lower end of the electrode 102 and the test hole 131, during testing, pressing down on the terminal block 101 causes the lower end of the electrode 102 to be inserted into the test hole 131, allowing the electrode 102 to be electrically connected to the test terminal 133. The guide post 112 and spring 113 structure ensure that the electrode 102 can be accurately inserted into the test hole 131 during testing. After the test, the spring 113 automatically resets the terminal block 101.

[0031] The tapered structure design of electrode 102 and test hole 131 allows for quick electrical connection by pressing down the terminal block. The guide post 112 and spring 113 ensure smooth operation and automatic reset after testing, saving operation time and facilitating efficient testing. The terminal block 101 and test box 103 are movably connected via guide post 112 and spring 113, which not only facilitates operation but also ensures accurate insertion of electrode 102 into test hole 131, enhancing the stability and reliability of the equipment.

[0032] In an embodiment of this application, a test platform 132 is further provided at the lower position of the test box 103, and the test terminals 133 are disposed on the test platform 132. By setting the test platform 132 inside the test box 103, the test terminals are arranged in a reasonable manner, facilitating connection and operation. The test terminals 133 are screw terminals.

[0033] Furthermore, it also includes a withstand voltage tester 104, a comprehensive tester 105, and an interlayer tester 106; the withstand voltage tester 104 is electrically connected to test terminal A, the comprehensive tester 105 is electrically connected to test terminal B, and the interlayer tester 106 is electrically connected to test terminal C; test terminals A, B, and C are electrically connected to test terminal 133.

[0034] By connecting the withstand voltage tester 104, the comprehensive tester 105, and the interlayer tester 105 to the equipment, and connecting the test terminals 133 through different test terminals, multiple functional tests can be realized, meeting the needs of comprehensive testing of surface mount transformers and improving the practicality and functionality of the equipment.

[0035] Although preferred embodiments of the present application have been described, those skilled in the art, upon learning the basic inventive concept, can make other changes and modifications to these embodiments. Therefore, the appended claims are intended to be interpreted as including the preferred embodiments as well as all changes and modifications falling within the scope of the embodiments of the present application.

[0036] Finally, it should be noted that in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or terminal device that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or terminal device. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or terminal device that includes said element.

[0037] The above provides a detailed description of a testing device for a patch transformer provided in this application. Specific examples have been used to illustrate the principles and implementation methods of this application. The description of the above embodiments is only for the purpose of helping to understand the method and core ideas of this application. At the same time, for those skilled in the art, there will be changes in the specific implementation methods and application scope based on the ideas of this application. Therefore, the content of this specification should not be construed as a limitation of this application.

Claims

1. A device for detecting a chip transformer, characterized by, include: A terminal block (101) is provided with electrodes (102) corresponding to the pins of the product under test. The electrodes (102) are electrically connected to a test box (103) located at the lower end of the terminal block (101). The test box (103) provides test terminals (133) arranged in a preset order.

2. The testing equipment for surface mount transformers according to claim 1, characterized in that, The terminal block (101) is provided with a test slot (111) for placing a patch transformer. The electrode (102) is disposed vertically on both sides of the test groove (111).

3. The device for detecting a patch transformer according to claim 2, characterized in that, The electrode (102) is an elastic needle structure with the head of the elastic needle facing upwards.

4. The apparatus for detecting a patch transformer according to claim 2, wherein The wiring board (101) is movably connected to the upper end of the test box (103) via the guide post (112); The guide post (112) is fitted with a spring (113); The test box (103) is provided with test holes (131) corresponding to the electrodes (102). The lower end of the electrode (102) and the lower end of the test hole (131) are both tapered structures; The test hole (131) is electrically connected to the test terminal (133).

5. The device for detecting a patch transformer according to claim 1, characterized in that, The test box (103) is further provided with a test platform (132) located at the bottom, and the test terminals (133) are disposed on the test platform (132).

6. The device for detecting a patch transformer according to claim 1, characterized in that, The test terminal (133) is a screw terminal.

7. The device for detecting a patch transformer according to claim 1, characterized in that, It also includes a pressure tester (104), a comprehensive tester (105), and an interlayer tester (106). The withstand voltage tester (104) is electrically connected to test terminal A, the comprehensive tester (105) is electrically connected to test terminal B, and the interlayer tester (106) is electrically connected to test terminal C. Test terminals A, B, and C are electrically connected to the test terminal (133).