Heating element testing device

Abstract

The embodiment of the utility model provides a heating element testing device. The heating element testing device comprises a piece taking mechanism, a bearing mechanism and a detection mechanism. The piece taking mechanism comprises a piece taking head, and the piece taking head is used for taking a heating element to be tested; the bearing mechanism comprises a carrier, and the carrier is used for bearing the heating element taken by the material taking head; the detection mechanism comprises a test plate and a test coil, the test coil is arranged at one end, close to the carrier, of the test plate, at least part of the heating element enters the test coil, and the performance of the heating element arranged on the carrier is tested through the test coil and the test plate. According to the heating element testing device provided by the embodiment of the invention, the testing time can be shortened, the production efficiency can be improved, and the heating element can be prevented from being deformed in the testing process to influence the performance by utilizing a machine in a vacuum adsorption and flexibility mode.

Description

Technical Field

[0001] This application relates to the field of electronic atomization device technology, specifically to a heating element testing device. Background Technology

[0002] Heating elements (such as heating plates) are core components of product structures (such as electronic atomizing devices), and their performance needs to be tested (such as impedance testing) during product manufacturing to determine their qualification. Currently, testing is usually conducted by manually removing, placing, and fixing the heating elements.

[0003] However, performing the above operations manually is time-consuming and inefficient, resulting in low production capacity. In addition, because the heating element is small and thin, it is easy to deform during manual handling and testing, which affects its actual performance parameters and results in a low pass rate for the heating element. Utility Model Content

[0004] This application provides a heating element testing device, which includes a picking mechanism, a carrying mechanism, and a testing mechanism. The picking mechanism includes a picking head for picking up the heating element to be tested. The carrying mechanism includes a carrier for carrying the heating element picked up by the picking head. The testing mechanism includes a test plate and a test coil. The test coil is located at one end of the test plate near the carrier. At least a portion of the heating element enters the test coil, and the performance of the heating element placed on the carrier is tested through the test coil and the test plate.

[0005] The heating element testing device provided in this application adopts a machine loading and unloading method, which shortens the testing time of heating elements, thereby improving production efficiency and increasing production capacity. At the same time, by using vacuum adsorption and flexibility, the stress on the heating elements during the loading and unloading testing process is reduced, avoiding deformation of the heating elements during the loading and unloading testing process that would affect performance, and improving the pass rate of heating elements. Attached Figure Description

[0006] To more clearly illustrate the technical solutions in the embodiments of this application, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0007] Figure 1 This is a schematic diagram of the structure of the heating element testing device provided in some embodiments of this application;

[0008] Figure 2 yes Figure 1 A schematic diagram of the component-retrieving mechanism in the embodiment;

[0009] Figure 3 yes Figure 2 A schematic diagram of the cross-sectional structure of the part-retrieving mechanism along the XZ plane in the embodiment;

[0010] Figure 4 yes Figure 2 A schematic diagram of another cross-section of the picking mechanism along the XZ plane in the embodiment;

[0011] Figure 5 yes Figure 2 A schematic diagram of a partial cross-sectional structure of the part-retrieving mechanism along the YZ plane in the embodiment;

[0012] Figure 6 yes Figure 1 Schematic diagram of the supporting mechanism and mounting plate in the embodiment;

[0013] Figure 7 yes Figure 6 A schematic diagram of the structure of the carrier and component fixing parts in the embodiment;

[0014] Figure 8 yes Figure 6 A schematic diagram of a partial cross-sectional structure of the carrier and component fixing parts along the YZ plane in the embodiment;

[0015] Figure 9 yes Figure 6 A schematic diagram of the supporting mechanism in the embodiment;

[0016] Figure 10 yes Figure 1 A schematic diagram of the detection mechanism in the embodiment;

[0017] Figure 11 yes Figure 10 A schematic diagram of the driving component in the embodiment. Detailed Implementation

[0018] The present application will now be described in further detail with reference to the accompanying drawings and embodiments. It should be particularly noted that the following embodiments are for illustrative purposes only and do not limit the scope of the application. Similarly, the following embodiments are only some, not all, embodiments of the present application, and all other embodiments obtained by those skilled in the art without inventive effort are within the scope of protection of the present application.

[0019] In this document, the term "embodiment" means that a particular feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of this application. The appearance of this phrase in various places throughout the specification does not necessarily refer to the same embodiment, nor is it a separate or alternative embodiment mutually exclusive with other embodiments. It will be explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments.

[0020] Please see Figure 1 , Figure 1 This is a schematic diagram of the structure of a heating element testing device provided in some embodiments of this application. The heating element testing device includes a pick-up mechanism 10, a support mechanism 20, and a testing mechanism 30. The pick-up mechanism 10 is used to pick up the heating element to be tested and place it onto the support mechanism 20; the support mechanism 20 is used to support and fix the heating element picked up by the pick-up mechanism 10; the testing mechanism 30 is used to test the performance of the heating element placed on the support mechanism 20 to determine whether the heating element is qualified. By providing a pick-up mechanism to pick up the heating element onto the support mechanism, and a testing mechanism to test the heating element fixed on the support mechanism, the testing time is greatly shortened, thereby improving production efficiency.

[0021] The methods by which the picking mechanism picks up and places the heating element to be tested include, but are not limited to, the following: picking up and placing the heating element by vacuum airflow adsorption, picking up and placing the heating element by magnetic adsorption, picking up and placing the heating element by mechanical clamping, etc., or a combination of one or more of these methods.

[0022] Taking the vacuum airflow adsorption method for picking up and placing items as an example, please refer to [link / reference]. Figure 2 , Figure 2 yes Figure 1 The schematic diagram of the component retrieval mechanism in the embodiment shows that the component retrieval mechanism 10 includes a retrieval head 101 and a first air pipe connector 104. The end of the retrieval head 101 away from the support mechanism 20 is connected to the first air pipe connector 104, and the other end of the retrieval head 101 near the support mechanism 20 is used to pick up the heating element to be tested. The first air pipe connector 104 is used to connect the retrieval head 101 to an external vacuum source.

[0023] Further, please refer to Figure 4 and Figure 5 , Figure 4 yes Figure 2 A schematic diagram of another cross-section of the part-retrieving mechanism along the XZ plane in the embodiment. Figure 5 yes Figure 2A schematic diagram of a partial cross-sectional structure of the picking mechanism along the YZ plane in the embodiment. The picking head 101 is provided with a first air channel 1012 and an adsorption section 1013. The end of the adsorption section 1013, that is, the end that contacts the heating element, has a first through hole 1013a. The first through hole 1013a communicates with the first air channel 1012, and the first air channel 1012 communicates with the first air pipe connector 104. When the picking mechanism 10 is working, an external vacuum source introduces vacuum airflow into the adsorption section 1013 through the first air pipe connector 104, the first air channel 1012, and the first through hole 1013a, so that the adsorption section 1013 vacuum adsorbs the heating element to be tested, thereby reducing the force on the heating element during the picking and placing process and avoiding deformation of the heating element.

[0024] Please refer to it again. Figure 2 The picking mechanism 10 also includes a picking head fixing member 102 and a first elastic member 103. The picking head fixing member 102 is used to fix the picking head 101, and the first elastic member 103 is used to flexibly connect the picking head 101 and the picking head fixing member 102.

[0025] When the pick-up head 101 moves to the heating element carrier to pick up the heating element to be tested, the pick-up head 101 uses the vacuum airflow introduced by the external vacuum source through the first air pipe joint 104 to hold the heating element in place, so as to reduce the force on the heating element during the pick-up and placement process; at the same time, the first elastic member 103 can play a buffering role when the pick-up head 101 contacts the heating element carrier, further reducing the force on the heating element in the aforementioned process, thereby preventing the heating element from deforming during the pick-up and placement process.

[0026] Please see Figure 3 , Figure 3 yes Figure 2 The schematic diagram of the cross-sectional structure of the picking mechanism along the XZ plane in the embodiment shows that the picking head 101 has a first receiving cavity 1011 at one end near the picking head fixing member 102, and the picking head fixing member 102 has a second receiving cavity 1021 at one end near the picking head 101. In other words, the first receiving cavity 1011 and the second receiving cavity 1021 are arranged opposite each other at a distance, and the two ends of the first elastic member 103 are respectively received in the first receiving cavity 1011 and the second receiving cavity 1021, realizing the connection between the first elastic member 103 and the picking head 101 and the picking head fixing member 102. The first elastic member 103 can be one of spring, rubber, elastic sheet, and spring steel. For example, in the above embodiment of this application, the first elastic member 103 is a spring. The above embodiments of this application, by setting a spring to flexibly connect the picking head and the picking head fixing member, can generate elastic deformation when the picking head moves to the heating element carrier to pick up the heating element, so as to buffer the external force generated on the heating element by the contact between the picking head and the heating element carrier, and avoid the heating element from deforming.

[0027] It should be noted that the terms "first," "second," and "third" in this application are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Therefore, a feature defined with "first," "second," or "third" may explicitly or implicitly include at least one of those features.

[0028] Please see Figure 6 , Figure 6 yes Figure 1 The schematic diagram of the supporting mechanism and mounting plate in the embodiment shows that multiple sets of supporting mechanisms 20 are fixedly connected in parallel on the mounting plate 40. It should be understood that in the description of this application, "multiple sets" means at least two sets, unless otherwise explicitly specified.

[0029] The carrying mechanism 20 includes a carrier 201 and a component fixing member 202. The carrier 201 is used to carry the heating element to be tested picked up by the component picking mechanism 10, and the component fixing member 202 is used to fix the heating element to be tested on the carrier 201. The fixing method of the component fixing member for fixing the heating element includes, but is not limited to, the following fixing methods: vacuum adsorption fixing, mechanical clamping fixing, magnetic fixing, etc., or a combination of one or more fixing methods.

[0030] For example, regarding the fixation method of vacuum adsorption, please refer to [link / reference]. Figure 7 and Figure 8 , Figure 7 yes Figure 6 Schematic diagram of the carrier and component fixing parts in the embodiment. Figure 8 yes Figure 6 The embodiment shows a partial cross-sectional view of the carrier and component fixing member along the YZ plane. The component fixing member 202 is a second air pipe connector, used to introduce vacuum airflow into the carrier 201, and fix the heating element to be tested on the carrier 201 by vacuum adsorption. The carrier 201 is provided with a second air channel 2011 and a cavity 2012 adapted to the shape of the heating element to be tested. The end of the cavity 2012 that contacts the heating element has a second through hole 2012a, which is connected to the second air channel 2011, and the second air channel 2011 is connected to the air pipe connector. When the component picking mechanism 10 places the picked-up heating element to be tested on the carrier 201, the vacuum airflow will enter the cavity 2012 through the second air pipe connector, the second air channel 2011, and the second through hole 2012a, so that the heating element is fixed on the carrier 201.

[0031] Of course, the heating element to be tested can also be fixed on the carrier by magnetic attraction. For example, the element fixing part is a magnet and is set inside the carrier to fix the heating element by magnetic attraction. Alternatively, the heating element to be tested can also be fixed on the carrier by mechanical clamping. For example, the element fixing part is a robot arm with grooves between the robot arms that are adapted to the shape of the heating element to fix the heating element by clamping.

[0032] Please refer to it again. Figure 6 The supporting mechanism 20 also includes a connector 203 and a buffer assembly 204. The connector 203 is used to connect the carrier 201 and the buffer assembly 204. When the heating element testing device is working, the detection mechanism 30 will move toward the supporting mechanism 20 and come into contact with the supporting mechanism 20. At this time, the buffer assembly 204 is used to buffer the external force generated on the heating element fixed on the carrier 201 when the supporting mechanism 20 and the detection mechanism 30 come into contact, so as to prevent the heating element from deforming.

[0033] Further, please refer to Figure 9 , Figure 9 yes Figure 6 The schematic diagram of the supporting mechanism in the embodiment shows that the buffer assembly 204 includes a first slider 2041, a first guide rail 2042, and a buffer unit 2043. The first slider 2041 is connected to the first carrier 201 via a connector 203. The first slider 2041 is placed on the first guide rail 2042, and the first slider 2041 can drive the connector 203 to move on the first guide rail 2042; combined with Figure 1 The first slider 2041 can drive the connector 203 to move along the first guide rail 2042 in a direction toward or away from the detection mechanism 30, so that the carrier 201 moves in a direction toward or away from the detection mechanism 30. The buffer unit 2043 is connected to the connector 203 and is used to achieve the effects of buffering during testing and resetting after testing.

[0034] Furthermore, the buffer unit 2043 includes a limiting rod 2043a and a second elastic member 2043b. One end of the limiting rod 2043a is connected to the connector 203 and extends in a direction parallel to the first guide rail 2042, for limiting the movement direction of the connector 203; the second elastic member 2043b is arranged around the outer periphery of the limiting rod 2043a, for supporting the connector 203. When the heating element testing device starts testing, the detection mechanism 30 moves toward the support mechanism 20 and comes into contact with it. At this time, in order to reduce the external force generated on the heating element fixed on the carrier 201 when the support mechanism 20 comes into contact with the detection mechanism 30, the first slider 2041 will drive the connector 203 to move along the first guide rail 2042 in a direction away from the detection mechanism 30, so that the second elastic element 2043b used to support the connector 203 will undergo elastic deformation, thereby playing a buffering role. When the heating element testing device finishes testing, the detection mechanism 30 moves away from the support mechanism 20, and the pressure generated by the connector 203 on the second elastic element 2043b is released. Under the action of the second elastic element 2043b, the connector 203 is driven by the first slider 2041 to move in a direction toward the detection mechanism 30, thereby realizing the reset of the connector 203. The second elastic element 2043b can be one of spring, rubber, elastic sheet, and spring steel. For example, in the above embodiment of this application, the second elastic element 2043b is a spring.

[0035] Please refer to it again. Figure 6 The supporting mechanism 20 also includes a limiting component 205, which limits the maximum distance the connecting member 203 can move on the first guide rail 2042 in a direction toward or away from the detection mechanism 30. Further, please refer to... Figure 9 The limiting component 205 includes a limiting pin 2051 and a limiting plate 2052. The limiting pin 2051 is located at one end of the first guide rail 2042 near the detection mechanism 30, and the limiting plate 2052 is located at the other end of the first guide rail 2042 away from the detection mechanism 30. The limiting pin 2051 limits the maximum distance the connecting member 203 can move on the first guide rail 2042 in the direction toward the detection mechanism 30, and the limiting plate 2052 limits the maximum distance the connecting member 203 can move on the first guide rail in the direction away from the detection mechanism 30.

[0036] Please see Figure 10 , Figure 10 yes Figure 1The schematic diagram of the detection mechanism in this embodiment shows that the detection mechanism includes a test coil 301a and a test plate 301b. The test coil 301a is located at one end of the test plate 301b near the carrier 201 that carries the heating element to be tested. When the heating element testing device is working, the heating element enters the test coil 301a, thereby forming a complete test path with the test coil 301a and the test plate 301b to test the performance of the heating element. In the above embodiment of this application, the impedance of the heating element is tested by the test coil 301a and the test plate 301b to determine whether the manufactured heating element is qualified.

[0037] Furthermore, the testing mechanism 30 also includes a test carrier 301c, a drive assembly 302, and a support platform 303. The test carrier 301c is used to carry the test plate 301b and the test coil 301a; the drive assembly 302 is connected to the test carrier 301c and is used to drive the test carrier 301c to move; the support platform 303 is connected to the drive assembly 302 and is used to support the drive assembly 302 and the test carrier 301c. Specifically, when the test begins, the drive assembly 302 drives the test carrier 301c to move in the direction toward the support mechanism 20, so that the test coil 301a comes into contact with the heating element to be tested, that is, the heating element enters the test coil 301a and forms a complete test path with the test coil 301a and the test plate 301b; when the test ends, the drive assembly 302 drives the test carrier 301c to move in the direction away from the support mechanism 20, so that the test coil 301a moves away from the tested heating element, that is, the heating element detaches from the test coil 301a.

[0038] Furthermore, the number of test plates 301b and test coils 301a on the test carrier 301c corresponds to the number of bearing mechanisms 20 on the mounting plate 40, enabling the simultaneous testing of multiple heating elements, greatly improving testing efficiency and increasing production capacity. Moreover, different test plates and test coils can be replaced according to the specific performance testing needs of the heating element.

[0039] Further, please refer to Figure 11 , Figure 11 yes Figure 10The schematic diagram of the driving component in the embodiment shows that the driving component 302 includes a second slider 3021, a second guide rail 3022, and a single-axis robotic arm 3023. The second slider 3021 is connected to the test carrier 301c, driving the test carrier 301c to move on the second guide rail 3022; the single-axis robotic arm 3023 is connected to the test carrier 301c, driving the test carrier 301c to move in a direction toward or away from the support mechanism 20. Specifically, when the test starts, the single-axis robotic arm 3023 drives the test carrier 301c to move toward the support mechanism 20, so that the test coil 301a comes into contact with the heating element to be tested; when the test ends, the single-axis robotic arm 3023 drives the test carrier 301c to move away from the support mechanism 20, so that the test coil 301a moves away from the heating element.

[0040] Of course, in addition to the single-axis robotic arm drive provided in the above embodiments of this application, pneumatic or hydraulic drive can also be used to drive the test vehicle to move on the second guide rail in the direction toward or away from the bearing mechanism.

[0041] The heating element testing device provided in this application reduces the external force on the heating element during handling and testing by using vacuum adsorption and flexibility, thus avoiding deformation of the heating element during handling and testing that would affect its performance. At the same time, the use of machine loading and unloading shortens the testing time, improves production efficiency, and thus increases production capacity.

[0042] The above description is only a part of the embodiments of this application and does not limit the scope of protection of this application. Any equivalent device or equivalent process transformation made based on the content of this application specification and drawings, or direct or indirect application in other related technical fields, are similarly included in the patent protection scope of this application.

Claims

1. A heating element testing device, characterized in that, include: The component picking mechanism includes a picking head, which is used to pick up the heating element to be tested; A carrying mechanism includes a carrier for carrying a heating element taken from the receiving head; The testing mechanism includes a test plate and a test coil, wherein the test coil is located at one end of the test plate near the carrier; wherein at least a portion of the heating element enters the test coil, and the performance of the heating element placed on the carrier is tested through the test coil and the test plate.

2. The heating element testing device according to claim 1, characterized in that, The picking mechanism further includes a first elastic element and a picking head fixing element. The picking head fixing element is used to fix the picking head, and the first elastic element connects the picking head and the picking head fixing element.

3. The heating element testing device according to claim 2, characterized in that, The material taking head has a first receiving cavity at one end near the material taking head fixing member, and the material taking head fixing member has a second receiving cavity at one end near the material taking head. The two ends of the first elastic member are respectively received in the first receiving cavity and the second receiving cavity.

4. The heating element testing device according to claim 1, characterized in that, The part-retrieving mechanism further includes a first air pipe connector, which is connected to the end of the part-retrieving head away from the carrier, for connecting the part-retrieving head to an external vacuum source.

5. The heating element testing device according to claim 4, characterized in that, The material taking head is provided with an adsorption section and a first air channel. The end of the adsorption section that contacts the heating element has a first through hole. The first through hole is connected to the first air channel, and the first air channel is connected to the first air pipe connector. An external vacuum source introduces vacuum airflow into the adsorption section through the first air pipe connector, the first air channel, and the first through hole to enable the adsorption section to pick up the heating element to be tested.

6. The heating element testing device according to claim 1, characterized in that, The supporting mechanism also includes a component fixing member, which is used to fix the heating element placed on the carrier.

7. The heating element testing device according to claim 6, characterized in that, The element fixing component is a second air pipe connector. The carrier is provided with a second air channel and a cavity adapted to the shape of the heating element. A second through hole is opened at one end of the cavity that contacts the heating element. The second through hole communicates with the second air channel, and the second air channel communicates with the second air pipe connector. Vacuum airflow enters the cavity through the second air pipe connector, the second air channel, and the second through hole to fix the heating element on the carrier.

8. The heating element testing device according to claim 1, characterized in that, The bearing mechanism further includes a connector and a buffer assembly. The connector is used to connect the carrier and the buffer assembly, and the buffer assembly is used to buffer the external force generated on the heating element when the bearing mechanism comes into contact with the detection mechanism.

9. The heating element testing device according to claim 8, characterized in that, The buffer assembly includes a first slider, a first guide rail, and a buffer unit. The first slider is connected to the carrier through the connector. The first slider can drive the connector to move on the first guide rail in a direction toward or away from the detection mechanism. The buffer unit is used to reset the connector.

10. The heating element testing device according to claim 9, characterized in that, The buffer unit includes a limiting rod and a second elastic element. One end of the limiting rod is connected to the connecting member and is parallel to the first guide rail. The second elastic element is arranged around the outer periphery of the limiting rod and is used to support the connecting member.

11. The heating element testing device according to claim 9, characterized in that, The bearing mechanism further includes a limiting component, which is used to limit the maximum distance the connector can move on the first guide rail in a direction toward or away from the detection mechanism.

12. The heating element testing device according to claim 11, characterized in that, The limiting component includes a limiting pin and a limiting plate. The limiting pin is located at the end of the first guide rail near the detection mechanism, and the limiting plate is located at the end of the first guide rail away from the detection mechanism. The limiting pin is used to limit the maximum distance the connector can move on the first guide rail toward the detection mechanism, and the limiting plate is used to limit the maximum distance the connector can move on the first guide rail away from the detection mechanism.

13. The heating element testing device according to claim 1, characterized in that, The heating element testing device also includes a mounting plate, on which multiple sets of the bearing mechanisms are fixedly connected in parallel.

14. The heating element testing device according to claim 1, characterized in that, The testing mechanism further includes a test carrier, a drive assembly, and a support platform. The drive assembly is disposed on the support platform, and the test carrier is connected to the drive assembly. The test carrier is used to carry the test board and the test coil, and the drive assembly drives the test carrier to move in a direction toward or away from the support mechanism.

15. The heating element testing device according to claim 14, characterized in that, The driving assembly includes a second slider, a second guide rail, and a single-axis robotic arm. The second slider is connected to the test vehicle, and the single-axis robotic arm is used to drive the test vehicle to move on the second guide rail in a direction toward or away from the support mechanism.

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