Semiconductor test probe contact mechanism

Abstract

The utility model discloses a semiconductor test probe contact mechanism, which belongs to the semiconductor test field and comprises a mounting seat and two fixing seats, the two fixing seats are internally provided with mounting grooves, the mounting grooves are internally and fixedly connected with first springs, the end parts of the first springs are fixedly connected with limiting blocks, and the limiting blocks are arranged in the mounting grooves. According to the scheme, a second spring and a pressing rod with a chamfer are arranged, so that pressing operation is easy and smooth, an inclined block can be pushed by pressing the pressing rod downwards, the limiting block is driven to move, the clamping block is clamped to the upper portion of the clamping block, and the clamping block is clamped to one side of the limiting block; the clamping block is separated from the limiting block, the fixing base is convenient to disassemble and adjust, the second spring automatically resets after pressing, and manual operation is simplified; the handle below the clamping block further optimizes operation, the clamping block can slide conveniently, clamping connection and separation can be completed rapidly, and operation efficiency is improved.

Description

Technical Field

[0001] This utility model relates to the field of semiconductor testing, and more specifically, to a semiconductor test probe contact mechanism. Background Technology

[0002] In today's rapidly developing semiconductor industry, performance testing of semiconductor devices is of paramount importance. As a core component, the performance of the test probe contact mechanism directly affects the testing accuracy and efficiency.

[0003] In the prior art, such as Chinese patent "CN209231396U", a semiconductor test probe is proposed, including a housing. Two test probes are movably installed on the inner side of the housing. The upper ends of the two test probes are movably installed with mounting parts through threads. A first spring is fixedly set between the upper end of the mounting parts and the upper end of the inner side of the housing. A double-ended screw is movably installed in the middle of the housing. The two test probes are respectively movably connected to the double-ended screw through threads. Fixing parts are movably installed on both sides of the housing. The two fixing parts are movably connected to the double-ended screw through bearings. A turntable is fixedly set at one end of the double-ended screw. Limiting parts are movably installed at the lower ends of the two fixing parts through threads. A rubber pad is fixedly set at the end of the limiting part near the housing.

[0004] However, although the aforementioned patent uses a rotating turntable to drive the double-headed screw to rotate, thereby adjusting the distance between the two test probes as needed, the semiconductor probe is inconvenient to install and remove quickly during use, which causes inconvenience during replacement or maintenance and has certain limitations in use. Utility Model Content

[0005] 1. Technical problems to be solved

[0006] To address the problems existing in the prior art, the purpose of this utility model is to provide a semiconductor test probe contact mechanism that enables rapid assembly and disassembly of test probes.

[0007] 2. Technical Solution

[0008] To solve the above problems, the present invention adopts the following technical solution.

[0009] A semiconductor test probe contact mechanism includes a mounting base and two fixed bases. Each of the two fixed bases has a mounting groove inside. A first spring is fixedly connected inside the mounting groove. A limit block is fixedly connected to the end of the first spring and slidably connected inside the mounting groove. A locking block is slidably connected inside the fixed base, engaging with the limit block at its top. A connecting block is fixedly connected to one side of the limit block, and a wedge block is fixedly connected to one end of the connecting block. Both the connecting block and the wedge block are slidably connected inside the fixed base.

[0010] Furthermore, a second spring is fixedly connected above the fixed base, and a pressing rod is fixedly connected to the top of the second spring, with the bottom end of the pressing rod located above the inclined block.

[0011] Furthermore, a chamfer is provided on one side of the lower end of the pressing rod.

[0012] Furthermore, a No. 3 spring is fixedly connected to the lower part of the fixed base, and a test probe is fixedly connected to the bottom end of the No. 3 spring.

[0013] Furthermore, a handle is fixedly connected to the lower part of the card block, and the handle is located on one side of the third spring.

[0014] Furthermore, a bidirectional screw is rotatably connected to one side of the mounting base, a limit rod is fixedly connected to one side of the mounting base, one side of each of the two fixed seats is threadedly connected to one side of the outer wall of the bidirectional screw, and both fixed seats are slidably connected to the limit rod.

[0015] Furthermore, a knob is fixedly connected to one end of the bidirectional screw located outside the mounting base, and a hook is fixedly connected to the top of the mounting base.

[0016] 3. Beneficial effects

[0017] Compared with existing technologies, the advantages of this utility model are:

[0018] (1) In this solution, the No. 2 spring and the chamfered pressing rod make the pressing operation easy and smooth. Pressing down the pressing rod can push the inclined block and drive the limit block to move, so as to separate the card block from the limit block, which is convenient for disassembling and adjusting the fixed seat. After pressing, the No. 2 spring automatically resets, simplifying manual operation. The handle below the card block further optimizes the operation, making it convenient for the card block to slide, quickly complete the locking and separation, and improve the operation efficiency.

[0019] (2) In this solution, the distance between the two fixed seats can be easily adjusted by using the bidirectional screw and limit rod on the mounting base, along with the knob, to adapt to the testing of semiconductor devices of different specifications and improve the versatility of the mechanism. Attached Figure Description

[0020] Figure 1 This is a three-dimensional structural diagram of the present invention;

[0021] Figure 2 This is a schematic diagram showing the connection relationship between the fixed base and the locking block in this utility model;

[0022] Figure 3 This is a schematic diagram showing the positional relationship between the limiting block and the fixing seat in this utility model;

[0023] Figure 4This is a schematic diagram showing the positional relationship between the limiting block and the inclined block in this utility model.

[0024] Explanation of the labels in the diagram:

[0025] 1. Mounting base; 11. Hook; 12. Double-acting screw; 13. Knob; 14. Limiting rod; 15. Fixing base; 16. Mounting slot; 17. Spring No. 1; 18. Limiting block; 19. Connecting block; 2. Inclined block; 21. Spring No. 2; 22. Pressing rod; 23. Locking block; 24. Spring No. 3; 25. Test probe; 26. Handle. Detailed Implementation

[0026] The technical solution of this utility model will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this utility model, not all embodiments. All other embodiments obtained by those skilled in the art based on the embodiments of this utility model without creative effort are within the scope of protection of this utility model.

[0027] In the description of this utility model, it should be noted that the terms "upper," "lower," "inner," "outer," "top / bottom," etc., indicating the orientation or positional relationship are based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this utility model. Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance.

[0028] In the description of this utility model, it should be noted that, unless otherwise explicitly specified and limited, the terms "installed," "equipped with," "sleeved / connected," "connected," etc., should be interpreted broadly. For example, "connection" can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium; it can be a connection within two components. Those skilled in the art can understand the specific meaning of the above terms in this utility model according to the specific circumstances.

[0029] Example 1:

[0030] Please see Figure 1-4A semiconductor test probe contact mechanism includes a mounting base 1 and two fixed bases 15. Each fixed base 15 has a mounting groove 16 inside. A first spring 17 is fixedly connected inside the mounting groove 16. A limit block 18 is fixedly connected to the end of the first spring 17 and slidably connected inside the mounting groove 16. A locking block 23 is slidably connected inside the fixed base 15, engaging with the upper part of the locking block 23 and the limit block 18. A connecting block 19 is fixedly connected to one side of the limit block 18, and one end of the connecting block 19 is fixedly connected to... The inclined block 2, connecting block 19 and inclined block 2 are all slidably connected inside the fixed base 15. The second spring 21 is fixedly connected to the top of the fixed base 15. The top of the second spring 21 is fixedly connected to the pressing rod 22. The bottom end of the pressing rod 22 is located above the inclined block 2. A chamfer is opened on one side of the lower end of the pressing rod 22. The third spring 24 is fixedly connected to the bottom of the fixed base 15. The bottom end of the third spring 24 is fixedly connected to the test probe 25. The handle 26 is fixedly connected to the bottom of the locking block 23. The handle 26 is located on one side of the third spring 24.

[0031] In this embodiment, the limiting block 18 connected to the first spring 17 and the locking block 23 that engages with the limiting block 18 form a stable limiting structure. When the fixed seat 15 is installed in place, the engagement between the locking block 23 and the limiting block 18 can prevent the fixed seat 15 from shifting during the test, ensuring accurate contact between the test probe 25 and the semiconductor, and improving the stability and reliability of the test.

[0032] The pressing rod 22 connected to the second spring 21 and the chamfered design at the lower end of the pressing rod 22 make the pressing operation easier and smoother. When the pressing rod 22 is pressed down, it can push the inclined block 2, which in turn drives the limiting block 18 to move, realizing the separation of the locking block 23 and the limiting block 18, which facilitates the disassembly and adjustment of the fixed seat 15. At the same time, the setting of the second spring 21 can automatically reset after the pressing operation, reducing the complexity of manual operation and improving work efficiency. This design allows operators to quickly install and disassemble the fixed seat 15, improving work efficiency.

[0033] Spring 24 connects to test probe 25. During the test, spring 24 acts as a buffer to prevent test probe 25 from being damaged by excessive pressure. It also ensures good contact between test probe 25 and semiconductor surface, improving test accuracy. Even if an unexpected impact occurs during the test, spring 24 can effectively absorb it, protecting test probe 25 and semiconductor device.

[0034] The handle 26 below the locking block 23 facilitates the operation of the locking block 23, making the sliding of the locking block 23 more convenient and enabling the locking and separation of the locking block 23 and the limiting block 18 to be quickly realized, further improving the convenience and efficiency of operation. The position of the handle 26 is reasonably designed, and the operator can easily complete the operation without having to make significant adjustments to the hand posture.

[0035] Example 2:

[0036] Please see Figure 1-4 A semiconductor test probe contact mechanism is provided, wherein a bidirectional screw 12 is rotatably connected to one side of a mounting base 1, a limiting rod 14 is fixedly connected to one side of the mounting base 1, one side of two fixed seats 15 is threadedly connected to one side of the outer wall of the bidirectional screw 12, and both fixed seats 15 are slidably connected to the limiting rod 14. A knob 13 is fixedly connected to one end of the bidirectional screw 12 located outside the mounting base 1, and a hook 11 is fixedly connected to the top of the mounting base 1.

[0037] In this embodiment, a bidirectional screw 12 is rotatably connected to one side of the mounting base 1, and two fixed seats 15 are threadedly connected to the bidirectional screw 12. By rotating the bidirectional screw 12, the distance between the two fixed seats 15 can be easily adjusted. This design can adapt to the testing needs of semiconductor devices of different sizes and specifications, and improves the versatility and applicability of the test probe 25 contact mechanism. The hook 11 fixedly connected to the top of the mounting base 1 provides a convenient way to install and place the test probe 25 contact mechanism, and the entire mechanism can be suspended on the equipment or bracket.

[0038] Working principle: When it is necessary to install the semiconductor test probe 25 contact mechanism, it can be suspended in a suitable position by the hook 11 at the top of the mounting base 1, or the mounting base 1 can be fixed in other ways. Before testing semiconductors of different specifications, turn the knob 13 at the outer end of the bidirectional screw 12 located on the mounting base 1. When the bidirectional screw 12 rotates, since one side of each of the two fixed seats 15 is threaded to one side of the outer wall of the bidirectional screw 12 and is slidably connected to the limiting rod 14, when the bidirectional screw 12 rotates, the two fixed seats 15 will slide along the axial direction of the bidirectional screw 12 under the restriction of the limiting rod 14, thereby adjusting the distance between the two fixed seats 15 to adapt to the testing requirements of semiconductor devices of different sizes.

[0039] Once the mounting base 15 has slid to the appropriate position, the internal structure of the mounting base 15 begins to function. The limiting block 18 connected to the end of the first spring 17 in the mounting groove 16 inside the mounting base 15 can slide within the mounting groove 16. The locking block 23 slidably connected inside the mounting base 15 can engage with the limiting block 18. Through the engagement of the locking block 23 with the limiting block 18, the mounting base 15 is stably fixed in the current position, preventing displacement of the mounting base 15 during the test and ensuring accurate contact between the test probe 25 and the semiconductor.

[0040] When it is necessary to adjust the position of the test probe 25 or disassemble the fixing seat 15, press the pressing rod 22 above the fixing seat 15. The pressing rod 22 has a chamfer at the bottom to facilitate pressing down. The pressing rod 22 moves downward under the action of the second spring 21. The bottom end of the pressing rod 22 is connected to the inclined block 2. When the pressing rod 22 is pressed down, it will push the inclined block 2. The inclined block 2 is connected to the limiting block 18 through the connecting block 19, thereby driving the limiting block 18 to slide in the mounting groove 16, so that the limiting block 18 is separated from the locking block 23. At this time, the fixing seat 15 can be moved easily.

[0041] The bottom end of the No. 3 spring 24 below the fixed base 15 is connected to the test probe 25. During the test, when the test probe 25 contacts the semiconductor surface, the No. 3 spring 24 acts as a buffer to prevent the test probe 25 from being damaged due to excessive pressure. The elasticity of the No. 3 spring 24 can also ensure that the test probe 25 maintains good contact with the semiconductor surface, thereby ensuring the accuracy of the test.

[0042] The handle 26 fixedly connected to the bottom of the locking block 23 facilitates the operation of the locking block 23. When it is necessary to engage or disengage the locking block 23 from the limiting block 18, the locking block 23 can be slid more easily through the handle 26, which improves the convenience and efficiency of operation.

[0043] The above description is merely a preferred embodiment of this utility model; however, the protection scope of this utility model is not limited thereto. Any equivalent substitutions or modifications made by those skilled in the art within the technical scope disclosed in this utility model, based on the technical solution and its improved concept, should be included within the protection scope of this utility model.

Claims

1. A semiconductor test probe contact mechanism, comprising a mounting base (1) and two fixing bases (15), characterized in that: Both of the fixed seats (15) have an installation groove (16) inside. A first spring (17) is fixedly connected inside the installation groove (16). A limit block (18) is fixedly connected to the end of the first spring (17). The limit block (18) is slidably connected inside the installation groove (16). A locking block (23) is slidably connected inside the fixed seat (15). The upper part of the locking block (23) is engaged with the limit block (18). A connecting block (19) is fixedly connected to one side of the limit block (18). A wedge block (2) is fixedly connected to one end of the connecting block (19). Both the connecting block (19) and the wedge block (2) are slidably connected inside the fixed seat (15).

2. The semiconductor test probe contact mechanism according to claim 1, characterized in that: A second spring (21) is fixedly connected above the fixed base (15), and a pressing rod (22) is fixedly connected to the top of the second spring (21). The bottom end of the pressing rod (22) is located above the inclined block (2).

3. The semiconductor test probe contact mechanism according to claim 2, characterized in that: The lower end of the pressing rod (22) has a chamfer on one side.

4. The semiconductor test probe contact mechanism according to claim 3, characterized in that: A No. 3 spring (24) is fixedly connected to the bottom of the fixed base (15), and a test probe (25) is fixedly connected to the bottom end of the No. 3 spring (24).

5. A semiconductor test probe contact mechanism according to claim 4, characterized in that: A handle (26) is fixedly connected to the lower part of the card block (23), and the handle (26) is located on one side of the third spring (24).

6. A semiconductor test probe contact mechanism according to claim 1, characterized in that: One side of the mounting base (1) is rotatably connected to a bidirectional screw (12), and one side of the mounting base (1) is fixedly connected to a limiting rod (14). One side of each of the two fixed seats (15) is threadedly connected to one side of the outer wall of the bidirectional screw (12), and both fixed seats (15) are slidably connected to the limiting rod (14).

7. A semiconductor test probe contact mechanism according to claim 6, characterized in that: A knob (13) is fixedly connected to one end of the bidirectional screw (12) located outside the mounting base (1), and a hook (11) is fixedly connected to the top of the mounting base (1).

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