Multi-path voltage test fixture for PCB mainboard

Abstract

The utility model discloses a multipath voltage test fixture for a PCB mainboard, which comprises a workbench, a positioning plate, a side frame and a probe assembly, and is characterized in that the positioning plate is arranged on the surface of the workbench; the side frame is fixed to one side of the workbench, the two sides of the top of the side frame are each provided with a connecting base, each connecting base is provided with a guide column, the guide columns are vertically arranged, and the bottom ends of the guide columns are fixedly connected to the workbench. The two sides of the probe assembly are each provided with a linear bearing, the probe assembly is installed on the guide columns on the two sides in a sliding mode through the linear bearings on the two sides, the probe assembly is located over the positioning plate, a lifting handle is installed on the top of the side frame in a hinged mode, and the lifting handle is in transmission connection with the probe assembly so as to lift and drive the probe assembly. The contact accuracy of the probe head of the probe is improved, and the test success rate of equipment is improved.

Description

Technical Field

[0001] This utility model relates to the field of PCB motherboard testing equipment technology, and in particular to a multi-channel voltage testing fixture for PCB motherboards. Background Technology

[0002] During the manufacturing process, PCBs may encounter various problems, such as poor soldering, component damage, short circuits, and open circuits. If these defects are not detected, they can lead to final product failures, damage brand reputation, and even safety hazards. Therefore, a testing system is a crucial element in ensuring product quality.

[0003] In existing technologies, voltage testing of PCB motherboards is often performed manually using a multimeter, which is cumbersome and inefficient due to the need to locate contacts each time. Existing technologies also include multi-pin testing fixtures, such as the patent application number "CN202121276045.3" entitled "A Multi-channel Voltage Testing System for PCB Motherboards," which includes a base. A first mounting plate is mounted on the top of the base, and a PCB motherboard is placed on the top of the first mounting plate. A frame is fixedly connected to the top of the base, and a mounting frame is mounted on one side of the frame. A connecting rod is connected to the bottom of the mounting frame, and a pressing handle is mounted on the top of the connecting rod. A second mounting plate is connected to the bottom of the connecting rod, and a connecting plate is connected to the top of the second mounting plate. Probes are mounted on the bottom of the connecting plate, and connecting wires are connected to the top of the connecting plate.

[0004] However, the above-mentioned testing system still has shortcomings, such as: the lifting stroke is not adjustable, the applicable range is limited; the motion structure of the mounting plate and probe is unstable and prone to deviation, resulting in inaccurate contact with the target contact point. Therefore, it is necessary to improve it. Utility Model Content

[0005] In view of the shortcomings of the existing technology, the purpose of this utility model is to provide a multi-channel voltage test fixture for PCB motherboards, which improves the stability of the probe's motion structure, improves the accuracy of probe contact, and improves the testing efficiency.

[0006] To achieve the above objectives, the technical solution adopted by this utility model is as follows: a multi-channel voltage testing fixture for PCB motherboards, comprising a workbench, a positioning plate, a side frame, and a probe assembly. The positioning plate is mounted on the workbench surface; the side frame is fixed to one side of the workbench, and a receiving seat is provided on each of the two sides of the top of the side frame. A guide post is mounted on each receiving seat, and the guide post is vertically arranged with its bottom end fixed to the workbench; a linear bearing is provided on each side of the probe assembly, and the probe assembly is slidably mounted on the guide post on both sides through the linear bearings on both sides. The probe assembly is located directly above the positioning plate, and a lifting handle is hinged to the top of the side frame. The lifting handle is drivenly connected to the probe assembly to lift and drive the probe assembly.

[0007] In a further technical solution, a horizontal suspension assembly is provided on the side of the side frame facing the positioning plate. The horizontal suspension assembly extends horizontally, and an arched component is provided at the outer end of the horizontal suspension assembly. The top of the arched component has a lifting part, and the bottom has a guide sleeve. The lifting handle is L-shaped, and one end of the lifting handle is installed on the lifting part via a pivot. A support shaft is provided at the bend of the lifting handle. The support shaft extends to both sides of the lifting handle and is rotatably mounted on one side arm. The middle part of these two side arms is arched and protrudes to the left and right sides respectively, with clearance between the two side arms. A lifting rod is provided at the center of the top surface of the probe assembly. The lifting rod is movably inserted through the guide sleeve. The top of the lifting rod has another support shaft and is hinged to the bottom of the two side arms respectively.

[0008] In a further technical solution, a connector is provided at the center of the top surface of the probe assembly. This connector is shaped like a bench. The two sides of the connector are connected to the probe assembly by bolts. A through hole is opened in the middle of the connector. A buffer space is left at the bottom of the connector. A buffer latex is provided on the bottom surface of the buffer space. A limiting protrusion is provided at the lower end of the rod. The rod moves through the hole, and the limiting protrusion cooperates with the hole to block it. The lower end of the rod moves against the buffer latex to avoid damaging the motherboard under test.

[0009] In a further technical solution, a vertically extending U-shaped groove is provided on each side of the top of the side frame, and the horizontal suspension assembly is installed in these two U-shaped grooves by bolts to achieve the adjustment of the extreme height of the probe assembly.

[0010] In a further technical solution, the probe assembly includes a top plate and a bottom plate, which are spaced vertically apart. Each of the four corners is connected to a layered connecting rod. The bottom plate has multiple insertion holes, each into which a probe is inserted. The lower end of the probe extends below the bottom plate, forming a contact portion. A wiring portion is formed above the probe for connecting electrical wires.

[0011] Each probe has a test state and an idle state. When the probe is in the test state, there is a gap between the tip of the probe and the bottom surface of the top plate, and the probe tip is set to protrude downwards relative to the tips of other probes. When the probe is in the idle state, the tip of the probe touches the bottom surface of the top plate.

[0012] In a further technical solution, the probes are arranged in an array, with the distance between two adjacent probes not exceeding 1 cm.

[0013] In a further technical solution, the thickness of the base plate is 2cm-4cm to form a 2cm-4cm long insertion hole. The hole wall and the probe are fitted with a gap to secure and stabilize the vertical position of the probe.

[0014] In a further technical solution, the top surface of the positioning plate is formed with a contour positioning recess for the mounting and positioning of the motherboard under test. A clearance recess is provided on the left and right sides of the contour positioning recess for holding the motherboard under test. The clearance recess is connected to the contour positioning recess, and the depth of the clearance recess is greater than that of the contour positioning recess.

[0015] In a further technical solution, a handle is provided on each side of the workbench for manually moving and transferring the test fixture.

[0016] In a further technical solution, a test switch button is provided on one side of the top surface of the workbench.

[0017] The advantages of this invention compared to existing technologies after adopting the above structure are as follows: This invention provides a multi-channel voltage testing fixture for PCB motherboards, improving the stability of the probe unit's lifting trajectory and preventing deviation after multiple uses, which would affect the accuracy of the contact electrodes; it has a more labor-saving linkage structure to drive the probe assembly to rise and fall, reducing the operator's workload; a buffer structure is provided on the top of the probe assembly to prevent the operator from excessively pressing down and damaging the motherboard under test; the contour positioning recess on both sides of the positioning plate has avoidance recesses for easy part removal, further improving the ease of use of the equipment; the adjustable height of the probe assembly can be adjusted by mounting the horizontal suspension component in the U-shaped groove, further increasing the applicability of the equipment. Attached Figure Description

[0018] The present invention will be further described below with reference to the accompanying drawings and embodiments.

[0019] Figure 1 This is a schematic diagram of the structure of this utility model.

[0020] Figure 2 This is a structural schematic diagram from another perspective of this utility model.

[0021] Figure 3 This is a cross-sectional view of the present invention. Detailed Implementation

[0022] The following are merely preferred embodiments of the present invention and do not limit the scope of protection of the present invention.

[0023] To address the shortcomings of existing technologies and improve the contact stability of the probe unit in voltage testing fixtures, the inventors have proposed the following multi-channel voltage testing fixture.

[0024] like Figures 1 to 3As shown, a multi-channel voltage testing fixture for a PCB motherboard includes a workbench 1, a positioning plate 6, a side frame 2, and a probe assembly 5. The positioning plate 6 is mounted on the table surface of the workbench 1. The side frame 2 is fixed to one side of the workbench 1. A receiving seat 22 is provided on each of the two sides of the top of the side frame 2. A guide post 23 is mounted on the receiving seat 22. The guide post 23 is vertically arranged and its bottom end is fixed to the workbench 1. A linear bearing 512 is provided on each of the two sides of the probe assembly 5. The probe assembly 5 is slidably mounted on the guide post 23 on both sides through the linear bearings 512 on both sides. The probe assembly 5 is located directly above the positioning plate 6. A lifting handle 41 is hinged on the top of the side frame 2. The lifting handle 41 is connected to the probe assembly 5 to lift and drive the probe assembly 5.

[0025] By guiding the probe assembly 5 up and down through the guide posts 23 on both sides, the contact stability of each probe unit 54 can be improved, the positional offset of the probe unit 54 that leads to pole contact failure can be reduced, and the test success rate and accuracy of the whole machine can be improved.

[0026] Specifically, a horizontal suspension assembly 21 is provided on the side of the side frame 2 facing the positioning plate 6. The horizontal suspension assembly 21 extends horizontally, and an arc-shaped part 3 is provided at the outer end of the horizontal suspension assembly 21. The top of the arc-shaped part 3 is provided with a lifting part 31, and the bottom is provided with a guide sleeve 32. The lifting handle 41 is arranged in an "L" shape. One end of the lifting handle 41 is installed on the lifting part 31 through a pivot. A support shaft is provided at the bend of the lifting handle 41. The support shaft extends to both sides of the lifting handle and is rotatably installed on one side arm 42. The middle part of the two side arms 42 is arranged in an arch bridge shape and protrudes to the left and right sides respectively. There is a clearance space between the two side arms 42. A lifting rod 43 is provided at the center of the top surface of the probe assembly 5. The lifting rod 43 is movably inserted through the guide sleeve 32. The top of the lifting rod 43 is provided with another support shaft and is hinged to the bottom of the two side arms 42 respectively. A suspension rod 43 is installed at the center of the top plate 51 to prevent the probe assembly 5 from tilting due to uneven gravity distribution, thereby further improving the working stability of the probe unit 54.

[0027] Specifically, a connector 511 is provided at the center of the top surface of the probe assembly 5. This connector 511 is shaped like a bench. The two sides of the connector 511 are connected to the probe assembly 5 by bolts. A through hole is provided in the middle of the connector 511. A buffer space is provided at the bottom of the connector 511. A buffer latex 45 is provided on the bottom surface of the buffer space. A limiting protrusion ring 44 is provided at the lower end of the rod 43. The rod 43 is movably connected to the hole, and the limiting protrusion ring 44 is in blocking cooperation with the hole. The lower end of the rod 43 is movably pressed against the buffer latex 45 to avoid damaging the motherboard under test.

[0028] It features a more labor-saving linkage structure that drives the probe assembly 5 to rise and fall, reducing the operator's workload.

[0029] Specifically, the probe assembly 5 includes a top plate 51 and a bottom plate 52, which are spaced vertically apart. Each of the four corners is connected to a layered connecting rod 53. The bottom plate 52 has multiple insertion holes, each housing a probe unit 54. The lower end of the probe unit 54 extends below the bottom plate 52, forming a contact portion. A wiring portion is formed above the probe unit 54 for connecting electrical wires. Each probe unit 54 has a test state and an idle state. When the probe unit 54 is in the test state, a gap exists between the top of the probe unit 54 and the bottom surface of the top plate 51, and the probe tip of the probe unit 54 protrudes downwards relative to the probe tips of other probe units 54. When the probe unit 54 is in the idle state, the top of the probe unit 54 contacts the bottom surface of the top plate 51. The probe units 54 are arranged in an array, with the distance between two adjacent probe units 54 not exceeding 1 cm. The thickness of the base plate 52 is 2cm-4cm to form an insertion hole with a length of 2cm-4cm. The hole wall and the probe unit 54 are fitted with a clearance to secure and stabilize the vertical position of the probe unit 54. A gap d is left between the top of the probe unit 54 and the top plate, and the gap d is 3cm.

[0030] With a greater number of probe units 54, it is suitable for voltage testing of more types of motherboards.

[0031] Specifically, each side of the top of the side frame 2 has a vertically extending U-shaped groove. The horizontal suspension assembly 21 is bolted to these two U-shaped grooves to adjust the extreme height of the probe assembly 5. The adjustable height of the horizontal suspension assembly 21 installed in the U-shaped groove 20 allows for adjustment of the extreme height of the probe assembly, further increasing the applicability of the equipment.

[0032] Specifically, the top surface of the positioning plate 6 is formed with a contour positioning recess 60 for the mounting and positioning of the motherboard under test. A relief recess 61 is provided on the left and right sides of the contour positioning recess 60 for holding the motherboard under test. The relief recess 61 is connected to the contour positioning recess 60, and the depth of the relief recess 61 is greater than that of the contour positioning recess 60.

[0033] The positioning plate has avoidance recesses on both sides of the contour positioning recess to facilitate part removal, further improving the ease of use of the equipment;

[0034] Specifically, a grip 12 is provided on each side of the workbench 1 for manually moving and transferring the test fixture.

[0035] Specifically, a test switch button 11 is provided on one side of the top surface of the workbench 1.

[0036] The above description is only a preferred embodiment of this utility model. For those skilled in the art, there will be changes in the specific implementation method and application scope based on the idea of ​​this utility model. The content of this specification should not be construed as a limitation of this utility model.

Claims

1. A multi-channel voltage testing fixture for a PCB motherboard, comprising a workbench (1), a positioning plate (6), a side frame (2), and a probe assembly (5), wherein the positioning plate (6) is mounted on the table surface of the workbench (1); and the side frame (2) is fixed to one side of the workbench (1), characterized in that: A receiving seat (22) is provided on each of the two sides of the top of the side frame (2). A guide post (23) is installed on the receiving seat (22). The guide post (23) is vertically arranged and its bottom end is fixed to the worktable (1). A linear bearing (512) is provided on each side of the probe assembly (5). The probe assembly (5) is slidably installed on the guide post (23) on both sides through the linear bearing (512) on both sides. The probe assembly (5) is located directly above the positioning plate (6). A lifting handle (41) is mounted on the top hinge of the side frame (2). The lifting handle (41) is driven to the probe assembly (5) to lift the drive probe assembly (5).

2. The multi-channel voltage test fixture for a PCB motherboard according to claim 1, characterized in that: The side frame (2) is provided with a horizontal suspension assembly (21) on the side facing the positioning plate (6). The horizontal suspension assembly (21) extends horizontally. The outer end of the horizontal suspension assembly (21) is provided with an arc-shaped part (3). The top of the arc-shaped part (3) is provided with a lifting part (31) and the bottom is provided with a guide sleeve (32). The lifting handle (41) is L-shaped. One end of the lifting handle (41) is mounted on the lifting part (31) via a pivot. A support shaft is provided at the bend of the lifting handle (41). The support shaft extends to both sides of the lifting handle and is rotatably mounted with a side arm (42). The middle part of the two side arms (42) is arched and protrudes to the left and right sides respectively. There is clearance space between the two side arms (42). A lifting rod (43) is provided at the center of the top surface of the probe assembly (5). The lifting rod (43) is movably inserted through the guide sleeve (32). The top of the lifting rod (43) is provided with another support shaft and is hinged to the bottom of the side arms (42) on both sides respectively.

3. The multi-channel voltage test fixture for a PCB motherboard according to claim 2, characterized in that: The probe assembly (5) has a connector (511) at the center of its top surface. This connector (511) is shaped like a bench. Both sides of the connector (511) are connected to the probe assembly (5) by bolts. A through hole is provided in the middle of the connector (511). A buffer space is provided at the bottom of the connector (511), and a buffer latex (45) is provided on the bottom surface of the buffer space. The lower end of the rod (43) is provided with a limiting protrusion (44). The rod (43) is movably connected to the connection hole, and the limiting protrusion (44) is in blocking cooperation with the connection hole. The lower end face of the rod (43) is movably pressed against the buffer latex (45) to avoid damaging the motherboard under test.

4. The multi-channel voltage test fixture for a PCB motherboard according to claim 1, characterized in that: The probe assembly (5) includes a top plate (51) and a bottom plate (52), which are spaced vertically apart, and are connected to four corner sections by layered connecting rods (53). The base plate (52) has multiple sockets distributed throughout, each socket housing a probe unit (54). With the base plate (52) as the boundary, the lower end of the probe unit (54) extends below the base plate (52) and forms a contact portion; the upper part of the probe unit (54) forms a wiring portion for connecting wires. Each probe unit (54) has a test state and an idle state. When the probe unit (54) is in the test state, there is a gap between the top of the probe unit (54) and the bottom surface of the top plate (51). The needle of the probe unit (54) protrudes downward relative to the needles of other probe units (54). When the probe unit (54) is in the idle state, the top of the probe unit (54) touches the bottom surface of the top plate (51).

5. A multi-channel voltage test fixture for a PCB motherboard according to claim 4, characterized in that: The probe units (54) are arranged in an array, and the distance between two adjacent probe units (54) does not exceed 1 cm.

6. A multi-channel voltage test fixture for a PCB motherboard according to claim 5, characterized in that: The thickness of the base plate (52) is 2cm-4cm to form the insertion hole with a length of 2cm-4cm. The hole wall and the probe unit (54) are fitted with a clearance to secure and stabilize the vertical position of the probe unit (54).

7. A multi-channel voltage test fixture for a PCB motherboard according to claim 2, characterized in that: The top of the side frame (2) is provided with a vertically extending U-shaped groove (20) on both sides. The horizontal suspension assembly (21) is installed in the two U-shaped grooves (20) by bolts to realize the adjustment of the limit height of the probe assembly (5).

8. A multi-channel voltage test fixture for a PCB motherboard according to claim 1, characterized in that: The top surface of the positioning plate (6) is formed with a contour positioning recess (60) for the mounting and positioning of the motherboard to be tested. A clearance recess (61) is provided on the left and right sides of the contour positioning recess (60) for the hand to hold the motherboard to be tested. The clearance recess (61) is connected to the contour positioning recess (60), and the depth of the clearance recess (61) is greater than that of the contour positioning recess (60).

9. A multi-channel voltage test fixture for a PCB motherboard according to claim 1, characterized in that: The workbench (1) is provided with a grip (12) on each side for manually moving and transferring the test fixture.

10. A multi-channel voltage test fixture for a PCB motherboard according to claim 1, characterized in that: A test switch button (11) is provided on one side of the top surface of the workbench (1).

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