Test module for high-power tuning antenna switch
By designing a test module that combines high-performance mechanical and electronic switches, the problem that existing equipment cannot simultaneously meet the requirements of radio frequency and harmonic testing in high-power scenarios has been solved, realizing efficient and flexible frequency band switching and high-quality signal transmission in the test system.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- SHANGHAI XINYIHENG TECH CO LTD
- Filing Date
- 2025-04-11
- Publication Date
- 2026-05-19
AI Technical Summary
Existing testing equipment cannot simultaneously meet the high-power RF and harmonic testing requirements in high-power scenarios, and traditional equipment has a relatively small power level, resulting in low efficiency in chip mass production testing.
A test module including a transmit link and a receive link was designed. The link uses a combination of high-performance mechanical switches and electronic switches, integrates low-frequency and high-frequency filters, realizes the normalization of low-power signals and high-power signals, and monitors the status of the transmit link in real time through a coupling channel, and has the ability to test reflected signals.
It improves the testing efficiency and versatility of the testing equipment, enables rapid switching between high and low frequency bands, meets the testing requirements of high-power tuned switches, and achieves high-quality signal transmission and effective harmonic control.
Smart Images
Figure CN224264985U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of chip testing technology, and in particular to a test module for a high-power tuned antenna switch. Background Technology
[0002] In 5G smartphones, the number of antennas has increased to eight or more, while the space available for antenna arrangement has shrunk, leading to reduced antenna efficiency. Tuner switches and tuner assemblies are needed on individual antennas to optimize the overall performance of antennas across different frequency bands.
[0003] Traditional test equipment provides only a single transmit or receive channel, and the transmit channel has a low power level, capable of providing less than 0.1 watts of RF power output. In high-power scenarios, the signal harmonic power cannot meet the testing requirements. The receive channel is limited by internal electronic components, and can only receive less than 1 watt of RF power input; in harmonic testing, it cannot effectively isolate high-power main signals and low-power harmonic signals. This deficiency leads to the need to perform multiple tests in chip mass production testing, with the first station performing high-power testing and the second station performing low-power testing, which significantly impacts chip mass production efficiency. Therefore, a test device that can simultaneously perform high-power RF and harmonic testing as well as low-power RF testing is an essential requirement for mass production testing. Utility Model Content
[0004] This utility model specifically provides a test module for a high-power tuned antenna switch.
[0005] The test module for high-power tuned antenna switches provided by this utility model includes a transmit link (101) and a receive link (102); both the transmit link (101) and the receive link (102) have switch arrays.
[0006] Preferably, the transmit link (101) includes a first signal input port (SG) and a first coupler (OC1); the switch array includes a first electronic switch (SW6), a second electronic switch (SW7), a first mechanical switch (SW2), and a second mechanical switch (SW3); the first signal input port (SG), the first electronic switch (SW6), the second electronic switch (SW7), the first coupler (OC1), the first mechanical switch (SW2), and the second mechanical switch (SW3) are electrically connected in sequence.
[0007] Preferably, both the first mechanical switch (SW2) and the second mechanical switch (SW3) are high-performance mechanical four-to-one switches. Those skilled in the art will understand that the second mechanical switch (SW3) is a high-performance mechanical four-to-one switch, which extends the signal to four ports, allowing the signal to be output to the chip under test (DUT).
[0008] Preferably, the first coupler (OC1) is a 20dB bidirectional coupler.
[0009] Preferably, the receiving link (102) includes a first signal output port (1021) and a first attenuator (AT1); the switch array also includes a third electronic switch (SW8), a third mechanical switch (SW4), and a fourth mechanical switch (SW5); the third electronic switch (SW8) is a six-to-one switch; the third mechanical switch (SW4), the fourth mechanical switch (SW5), the first attenuator (AT1), the third electronic switch (SW8), and the signal output terminal are electrically connected in sequence; the other two sets of output pins of the first coupler (OC1) are respectively connected to two of the six sets of pins of the third electronic switch (SW8).
[0010] Preferably, the third mechanical switch (SW4) is a high-performance mechanical four-to-one switch.
[0011] Preferably, the first attenuator (AT1) is a 20dB attenuator.
[0012] Preferably, the transmit link (101) further includes a second signal output port (1011), a second signal input port (1012), an RF amplifier, a second coupler (OC2), a second attenuator (AT4), a first isolator (ISO1), a first filter (LPF1), a second isolator (ISO2), and a second filter (LFP2); the switch array further includes a two-to-one fifth mechanical switch (SW1); the first electronic switch (SW6), the second signal input port (1012), the RF amplifier, the second signal output port (1011), the second coupler (OC2), and the fifth mechanical switch (SW1) are electrically connected in sequence; the first isolator (ISO1) and the first filter (LPF1) are connected in series between the fifth mechanical switch (SW1) and the first mechanical switch (SW2); the second isolator (ISO2) and the second filter (LFP2) are connected in series between the fifth mechanical switch (SW1) and the first mechanical switch (SW2); the second attenuator (AT4) is connected in series between the second coupler (OC2) and one of the six pins of the third electronic switch (SW8).
[0013] Preferably, the second coupler (OC2) is a 20dB coupler; the second attenuator (AT4) is a 30dB attenuator; the first filter (LPF1) is a 900MHz low-pass filter; and the second filter (LFP2) is an 1800MHz low-pass filter.
[0014] Preferably, the receiving link (102) further includes a first duplexer (D1), a second duplexer (D2), a third attenuator (AT3), and a fourth attenuator (AT2); the third attenuator (AT3) and the first duplexer (D1) are connected in series between the third electronic switch (SW8) and the fourth mechanical switch (SW5); the fourth attenuator (AT2) and the second duplexer (D2) are connected in series between the third electronic switch (SW8) and the fourth mechanical switch (SW5).
[0015] Preferably, the first duplexer (D1) is a 900M / 1800MHz duplex filter, and the second duplexer (D2) is an 1800M / 3600MHz duplex filter.
[0016] The test module for high-power tuned antenna switches provided by this utility model has the following advantages compared with the prior art:
[0017] 1. By using the combination of the fifth mechanical switch (SW1), the first mechanical switch (SW2), the second mechanical switch (SW3), the first electronic switch (SW6), and the second electronic switch (SW7) in this module, the normalization of low-power signals and high-power signals is achieved, which can greatly improve the testing efficiency of the testing equipment;
[0018] 2. Through the graded channels of the fifth mechanical switch (SW1) and the first mechanical switch (SW2), two sets of filters, one for low frequency (900M) and one for high frequency (1800M), are integrated to control the harmonics of the main output signal of the equipment below -80dBc, which meets the testing requirements of high-power tuning switches and improves the versatility of the equipment. At the same time, the high and low frequency bands can be quickly switched by the switch to complete the frequency band switching of the test system, which greatly improves the versatility of the equipment.
[0019] 3. The fifth mechanical switch (SW1), the first mechanical switch (SW2), the second mechanical switch (SW3), the third mechanical switch (SW4), and the fourth mechanical switch (SW5) in the overall link adopt high-performance mechanical switches. While meeting the 100W power tolerance, they avoid harmonics generated by the equipment itself and complete the transmission of high-quality signals.
[0020] 4. Through the second mechanical switch (SW3) and the third mechanical switch (SW4), the entire module has four channels of high power and fast and flexible switching output, which meets the test requirements of single-pole four-throw tuned switch.
[0021] 5. The built-in coupling channel can monitor the working status of the transmission link in real time and has the ability to test reflected signals. Attached Figure Description
[0022] Figure 1This is a schematic diagram of the test module for a high-power tuned antenna switch provided by this utility model. Detailed Implementation
[0023] To make the objectives, technical solutions, and advantages of the embodiments of this utility model clearer, the technical solutions of the embodiments of this utility model will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this utility model, not all embodiments. Based on the embodiments of this utility model, all other embodiments obtained by those skilled in the art without creative effort are within the protection scope of this utility model.
[0024] like Figure 1 As shown, the test module for a high-power tuned antenna switch provided in this embodiment includes a transmit link (101) and a receive link (102); both the transmit link (101) and the receive link (102) have switch arrays. Those skilled in the art will understand that the test module for a high-power tuned antenna switch provided in this embodiment, through the switch array, achieves normalized testing of low-power and high-power signals, significantly improving the testing efficiency of the test equipment.
[0025] Furthermore, the transmission link (101) includes a first signal input port (SG) and a first coupler (OC1); the switch array includes a first electronic switch (SW6), a second electronic switch (SW7), a first mechanical switch (SW2), and a second mechanical switch (SW3); the first signal input port (SG), the first electronic switch (SW6), the second electronic switch (SW7), the first coupler (OC1), the first mechanical switch (SW2), and the second mechanical switch (SW3) are electrically connected in sequence. Those skilled in the art will understand that during small-signal testing, the signal is input from the first signal input port (SG), passes through the first electronic switch (SW6) and the second electronic switch (SW7), through the channel of SW2-3, enters the first mechanical switch (SW2), and is then output to the chip under test through the second mechanical switch (SW3). The built-in coupling channel allows for real-time monitoring of the transmission link (101)'s operating status and provides the capability to test reflected signals.
[0026] Furthermore, both the first mechanical switch (SW2) and the second mechanical switch (SW3) are high-performance mechanical four-to-one switches. Those skilled in the art will understand that the second mechanical switch (SW3) is a high-performance mechanical four-to-one switch, which extends the signal to four ports, allowing the signal to be output to the chip under test (DUT).
[0027] Furthermore, the first coupler (OC1) is a 20dB bidirectional coupler.
[0028] Furthermore, the receiving link (102) includes a first signal output port (1021) and a first attenuator (AT1); the switch array also includes a third electronic switch (SW8), a third mechanical switch (SW4), and a fourth mechanical switch (SW5); the third electronic switch (SW8) is a six-to-one switch; the third mechanical switch (SW4), the fourth mechanical switch (SW5), the first attenuator (AT1), and the third electronic switch (SW8) and the signal output terminal are sequentially electrically connected; the other two sets of output pins of the first coupler (OC1) are respectively connected to two of the six sets of pins of the third electronic switch (SW8). Those skilled in the art will understand that after the signal passes through the chip under test (DUT), it enters the module's input port, passes through the third mechanical switch (SW4) and the fourth mechanical switch (SW5), then follows a direct path, passes through the matched first attenuator (AT1), enters the third electronic switch (SW8), and then enters the first signal output port (1021) to complete signal analysis.
[0029] Furthermore, the third mechanical switch (SW4) is a high-performance mechanical four-to-one switch.
[0030] Furthermore, the first attenuator (AT1) is a 20dB attenuator.
[0031] Furthermore, the transmit link (101) also includes a second signal output port (1011), a second signal input port (1012), an RF amplifier (not shown in the figure), a second coupler (OC2), a second attenuator (AT4), a first isolator (ISO1), a first filter (LPF1), a second isolator (ISO2), and a second filter (LFP2); the switch array also includes a two-to-one fifth mechanical switch (SW1); the first electronic switch (SW6), the second signal input port (1012), the RF amplifier, and the second signal output port (1011) 1) The second coupler (OC2) and the fifth mechanical switch (SW1) are electrically connected in sequence; the first isolator (ISO1) and the first filter (LPF1) are connected in series between the fifth mechanical switch (SW1) and the first mechanical switch (SW2); the second isolator (ISO2) and the second filter (LFP2) are connected in series between the fifth mechanical switch (SW1) and the first mechanical switch (SW2); the second attenuator (AT4) is connected in series between the second coupler (OC2) and one of the six pins of the third electronic switch (SW8). Those skilled in the art will understand that during large-signal testing, the signal is input from the first signal input port (SG), passes through the first electronic switch (SW6) to the second signal input port (1012), and after passing through the RF amplifier, the high-power signal enters the second signal output port (1011). After passing through the second coupler (OC2), the signal coupled by the second attenuator (AT4) enters one of the ports of the third electronic switch (SW8) for real-time power monitoring. The high-power main signal passes through the high-performance two-to-one fifth mechanical switch (SW1) to select a low-frequency or high-frequency channel. The channel integrates an isolator for protection circuits and a low-pass filter for filtering out harmonic signals. Then, it passes through the high-performance four-to-one first mechanical switch (SW2) and is sent to the high-performance four-to-one mechanical switch (SW3), and is divided into four test channels to the chip under test (DUT).
[0032] Furthermore, the second coupler (OC2) is a 20dB coupler; the second attenuator (AT4) is a 30dB attenuator; the first filter (LPF1) is a 900MHz low-pass filter; and the second filter (LFP2) is an 1800MHz low-pass filter.
[0033] Furthermore, the receiving link (102) also includes a first duplexer (D1), a second duplexer (D2), a third attenuator (AT3), and a fourth attenuator (AT2); the third attenuator (AT3) and the first duplexer (D1) are connected in series between the third electronic switch (SW8) and the fourth mechanical switch (SW5); the fourth attenuator (AT2) and the second duplexer (D2) are connected in series between the third electronic switch (SW8) and the fourth mechanical switch (SW5). Those skilled in the art will understand that after the signal passes through the chip under test (DUT), it passes through the high-performance four-to-one third mechanical switch (SW4) and fourth mechanical switch (SW5). The high-frequency signal enters the second duplexer (D2), and the low-frequency signal enters the first duplexer (D1). After the harmonic signal and the main signal are separated, the harmonic signal enters the S4 and S5 ports of the third electronic switch (SW8), and the high-power main signal is output to the external 900M Pout and 1800M Pout ports. The harmonic signal can be switched to the first signal output port (1021) after passing through the third electronic switch (SW8) to complete the measurement. Through the hierarchical channels of the fifth mechanical switch (SW1) and the first mechanical switch (SW2), two sets of filters, one for low frequency (900M) and one for high frequency (1800M), are integrated to control the harmonics of the main signal output by the device below -80dBc, meeting the testing requirements of high-power tuning switches and improving the versatility of the device. At the same time, the high and low frequency bands can be quickly switched by the switch to complete the frequency band switching of the test system, which greatly improves the versatility of the device. The second mechanical switch (SW3) and the third mechanical switch (SW4) enable the entire module to have four channels of high-power, fast and flexible switching output, meeting the testing requirements of a single-pole four-throw tuned switch.
[0034] Furthermore, the first duplexer (D1) is a 900M / 1800MHz duplex filter, and the second duplexer (D2) is an 1800M / 3600MHz duplex filter.
[0035] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this utility model, and not to limit it. Although this utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of this utility model.
Claims
1. A test module for a high-power tuned antenna switch, characterized in that, It includes a transmit link (101) and a receive link (102); both the transmit link (101) and the receive link (102) have a switch array; the transmit link (101) includes a first signal input port (SG) and a first coupler (OC1); the switch array includes a first electronic switch (SW6), a second electronic switch (SW7), a first mechanical switch (SW2), and a second mechanical switch (SW3); the first signal input port (SG), the first electronic switch (SW6), the second electronic switch (SW7), the first coupler (OC1), the first mechanical switch (SW2), and the second mechanical switch (SW3) are electrically connected in sequence.
2. The test module for a high-power tuned antenna switch as described in claim 1, characterized in that, The first mechanical switch (SW2) and the second mechanical switch (SW3) are both high-performance mechanical four-to-one switches.
3. The test module for a high-power tuned antenna switch as described in claim 2, characterized in that, The first coupler (OC1) is a 20dB bidirectional coupler.
4. The test module for a high-power tuned antenna switch as described in claim 3, characterized in that, The receiving link (102) includes a first signal output port (1021) and a first attenuator (AT1); the switch array also includes a third electronic switch (SW8), a third mechanical switch (SW4), and a fourth mechanical switch (SW5); the third electronic switch (SW8) is a six-to-one switch; the third mechanical switch (SW4), the fourth mechanical switch (SW5), the first attenuator (AT1), the third electronic switch (SW8), and the signal output terminal are electrically connected in sequence; the other two sets of output pins of the first coupler (OC1) are respectively connected to two of the six sets of pins of the third electronic switch (SW8).
5. The test module for a high-power tuned antenna switch as described in claim 4, characterized in that, The third mechanical switch (SW4) is a high-performance mechanical four-to-one switch.
6. The test module for a high-power tuned antenna switch as described in claim 5, characterized in that, The first attenuator (AT1) is a 20dB attenuator.
7. The test module for a high-power tuned antenna switch as described in claim 6, characterized in that, The transmit link (101) further includes a second signal output port (1011), a second signal input port (1012), an RF amplifier, a second coupler (OC2), a second attenuator (AT4), a first isolator (ISO1), a first filter (LPF1), a second isolator (ISO2), and a second filter (LFP2); the switch array further includes a two-to-one fifth mechanical switch (SW1); the first electronic switch (SW6), the second signal input port (1012), the RF amplifier, the second signal output port (1011), the second coupler (OC2), and the fifth mechanical switch (SW1) are electrically connected in sequence; the first isolator (ISO1) and the first filter (LPF1) are connected in series between the fifth mechanical switch (SW1) and the first mechanical switch (SW2); the second isolator (ISO2) and the second filter (LFP2) are connected in series between the fifth mechanical switch (SW1) and the first mechanical switch (SW2); the second attenuator (AT4) is connected in series between the second coupler (OC2) and one of the six pins of the third electronic switch (SW8).
8. The test module for a high-power tuned antenna switch as described in claim 7, characterized in that, The second coupler (OC2) is a 20dB coupler; the second attenuator (AT4) is a 30dB attenuator; the first filter (LPF1) is a 900MHz low-pass filter; and the second filter (LFP2) is an 1800MHz low-pass filter.
9. The test module for a high-power tuned antenna switch as described in claim 8, characterized in that, The receiving link (102) further includes a first duplexer (D1), a second duplexer (D2), a third attenuator (AT3), and a fourth attenuator (AT2); the third attenuator (AT3) and the first duplexer (D1) are connected in series between the third electronic switch (SW8) and the fourth mechanical switch (SW5); the fourth attenuator (AT2) and the second duplexer (D2) are connected in series between the third electronic switch (SW8) and the fourth mechanical switch (SW5); the first duplexer (D1) is a 900M / 1800MHz duplex filter, and the second duplexer (D2) is an 1800M / 3600MHz duplex filter.