A temperature probe module and a chemical composition and capacity testing device

The integrated mounting components and protective design simplify the installation structure of the temperature probe assembly in the batching and capacity testing equipment, solving the problems of high manufacturing costs and low operating efficiency, and achieving cost reduction and improved monitoring stability and reliability.

CN224286131UActive Publication Date: 2026-05-26ZHUHAI TITANS NEW POWER ELECTRONICS CO LTD
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
ZHUHAI TITANS NEW POWER ELECTRONICS CO LTD
Filing Date
2025-05-26
Publication Date
2026-05-26

AI Technical Summary

Technical Problem

The temperature probe assembly in the formation and capacity testing equipment has many components and a complex structure, resulting in high manufacturing costs and low working efficiency.

Method used

The mounting component is an integrated piece, including a mounting part and a protective part, which simplifies the installation structure. The protective part is set in the direction of the probe to protect the probe and reduce the direct effect of external forces on the probe.

Benefits of technology

It reduced the manufacturing cost of the installation structure, improved work efficiency, extended the service life of the probe, and reduced monitoring errors and malfunctions.

✦ Generated by Eureka AI based on patent content.

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Abstract

This application discloses a temperature probe module and a formation and capacity testing device. The temperature probe module includes a probe assembly and a mounting component. The probe assembly includes a probe. The mounting component is a single piece and includes a mounting portion and a protective portion, wherein the protective portion is connected to the mounting portion, and the probe assembly is disposed at least on the mounting portion. In the direction surrounding the probe, the protective portion is disposed on at least one side of the probe to provide protection for the probe. This application can reduce manufacturing costs and improve work efficiency.
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Description

Technical Field

[0001] This application relates to the field of battery formation and capacity testing technology, and in particular to a temperature probe module and a formation and capacity testing device. Background Technology

[0002] In formation and capacity testing equipment, temperature probe components are typically mounted on one side of the battery probe components via an installation structure. The temperature probes in the temperature probe components are used to monitor the battery temperature in real time during the formation and capacity testing process, so as to feed the temperature information back to the equipment's control system and prevent the battery from overheating and causing safety accidents.

[0003] However, in related technologies, due to the large number of components and the complexity of the structure, the manufacturing cost of the installation structure is high, and the work efficiency is also low due to the troublesome assembly. Utility Model Content

[0004] In view of the above-mentioned shortcomings in the related technologies, this application provides a temperature probe module and a formation and capacity testing device to solve the problems of high manufacturing cost and low working efficiency in the related technologies.

[0005] To address the aforementioned technical problems, in a first aspect, this application provides a temperature probe module applied to a formation and capacity testing device, comprising:

[0006] The probe assembly includes a probe;

[0007] The mounting component is a single piece, and includes:

[0008] Installation Department;

[0009] A protective part is connected to the mounting part, and the probe assembly is disposed at least on the mounting part; in the direction surrounding the probe, the protective part is disposed on at least one side of the probe to provide protection for the probe.

[0010] In a possible implementation of the first aspect, the mounting part includes:

[0011] A support section, wherein the support section is disposed opposite to the protective part;

[0012] A connecting segment is provided, which connects the support segment and the protective part and is located on the same side of the support segment and the protective part. The probe assembly is disposed between the support segment and the protective part.

[0013] In one possible implementation of the first aspect, the mounting component is a one-piece bent component; or,

[0014] The mounting component is a one-piece powder metallurgy molded part.

[0015] In one possible implementation of the first aspect, the protective part is provided with weight-reducing holes.

[0016] In a possible implementation of the first aspect, the support segment has an overlapping edge, which is located on the side of the support segment away from the connecting segment; the inner wall of the weight-reducing hole has a bearing segment, which extends in the same direction as the overlapping edge;

[0017] The probe assembly also includes:

[0018] A first fixing member is connected to the probe and overlaps the overlapping edge and the bearing section.

[0019] In a possible implementation of the first aspect, the support segment has a first side surface disposed opposite to the protective part, and the protective part has a second side surface disposed opposite to the support segment;

[0020] The first fastener has a first stepped portion on one side near the supporting section. The first stepped portion includes a first overlapping surface and a first limiting surface. The first overlapping surface extends along the connecting direction of the connecting section and overlaps the overlapping edge. The first limiting surface faces the first side and is located between the protective part and the supporting section; and / or,

[0021] The first fastener has a second stepped portion on the side near the protective part. The second stepped portion includes a second overlapping surface and a second limiting surface connected together. The second overlapping surface extends along the connection direction of the connecting segment and overlaps the bearing segment. The second limiting surface faces the second side and is located between the protective part and the supporting segment.

[0022] In one possible implementation of the first aspect, the connecting segment is provided with a clearance hole through which the probe passes;

[0023] The probe assembly also includes:

[0024] A second fixing member is connected to the probe, and at least one of the second fixing member and the first fixing member is a movable fixing member, which is movably connected to the probe.

[0025] An elastic sub-assembly is disposed on the probe. The elastic sub-assembly is used to drive the movable fixing member to move by the elastic force generated by its own elastic deformation, so that the second fixing member and the first fixing member move closer to each other and are clamped on opposite sides of the mounting portion.

[0026] In a possible implementation of the first aspect, the mounting portion and / or the protective portion are provided with a first positioning groove, and the first fixing member is provided with a first positioning protrusion, the first positioning protrusion being used to insert into the first positioning groove; and / or,

[0027] The mounting part and / or the protective part are provided with a second positioning groove, and the second fixing member is provided with a second positioning protrusion, which is used to insert into the second positioning groove.

[0028] In a possible implementation of the first aspect, the first fixing member is the movable fixing member, and the first fixing member is provided with a handle structure for applying a pulling force, the pulling force being opposite in direction to the elastic force;

[0029] The first fixing member has different radial distances at different positions around the probe, and under the action of the tensile force, the first fixing member is rotatably arranged relative to the probe around the probe so that the first fixing member can rotate to a first preset position or a second preset position.

[0030] When the first fastener is located at the first preset position, the first fastener overlaps the overlapping edge and the bearing section; when the first fastener is located at the second preset position, the clearance hole allows the first fastener to pass through.

[0031] Secondly, this application also provides a chemical separation and compatibility device, which includes:

[0032] A battery fixing module, which is used to fix the battery;

[0033] The temperature probe module according to any one of the first aspects, wherein the probe in the temperature probe module is used to monitor the temperature of the battery.

[0034] Compared with related technologies, this application has at least the following beneficial effects:

[0035] In this application, since the mounting component includes a connected mounting part and a protective part, and since the probe assembly is at least disposed in the mounting part, the mounting component in this application can serve as a mounting structure for mounting the probe assembly. Compared with the mounting structure of related technologies, since the mounting component is an integral piece, this application can reduce the number of components in the mounting structure and simplify the specific structure of the mounting structure. This not only reduces the manufacturing cost of the mounting structure, but also improves work efficiency because the mounting component, being an integral piece, does not require the assembly of multiple parts.

[0036] Furthermore, since a protective portion is disposed on at least one side of the probe in the direction surrounding the probe, it is used to protect the probe. Therefore, through the protection of the protective portion, on the one hand, external forces can be prevented from acting directly on the probe, reducing the risk of the probe bending, breaking or being damaged due to external forces, thereby extending the service life of the probe and ensuring the stable and reliable function of the probe; on the other hand, it can also prevent the probe from interfering with other components, thereby ensuring the normal operation of the probe and reducing monitoring errors or malfunctions caused by interference. Attached Figure Description

[0037] To more clearly illustrate the technical solutions in the embodiments of this application, the drawings used in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0038] Figure 1 This is one of the structural schematic diagrams of the temperature probe module provided in the embodiments of this application;

[0039] Figure 2 This is a second schematic diagram of the structure of the temperature probe module provided in the embodiments of this application;

[0040] Figure 3 for Figure 1 Enlarged view of point A in the middle;

[0041] Figure 4 for Figure 2 Enlarged view of point B in the middle;

[0042] Figure 5 This is a schematic diagram of a portion of the structure of the chemical composition and capacity preparation device provided in an embodiment of this application.

[0043] Explanation of reference numerals in the attached figures:

[0044] 1-Probe assembly; 11-Probe; 12-First fixing member; 121-First stepped portion; 1211-First overlapping surface; 1212-First limiting surface; 122-Second stepped portion; 1221-Second overlapping surface; 1222-Second limiting surface; 123-Handle structure; 13-Second fixing member; 131-Second positioning protrusion; 14-Elastic sub-assembly; 141-First compression spring; 142-Second compression spring;

[0045] 2-Mounting component; 21-Mounting part; 211-Support section; 2111-Overlapping edge; 2112-First side surface; 212-Connecting section; 22-Protective part; 221-Protective section; 222-Weight reduction hole; 2221-Bearing section; 223-Second side surface; 23-Second positioning groove;

[0046] 100-Temperature probe module. Detailed Implementation

[0047] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0048] In this application, the terms "upper," "lower," "left," "right," "front," "rear," "top," "bottom," "inner," "outer," "vertical," "horizontal," "lateral," and "longitudinal" indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. These terms are primarily for the purpose of better describing this application and its embodiments, and are not intended to limit the indicated device, element, or component to having a specific orientation, or to be constructed and operated in a specific orientation.

[0049] Furthermore, in addition to indicating location or positional relationship, some of the aforementioned terms may also have other meanings. For example, the term "above" may also be used in some cases to indicate a certain dependency or connection relationship. Those skilled in the art can understand the specific meaning of these terms in this application based on the specific circumstances.

[0050] Furthermore, the terms "installation," "setup," "equipped with," "connection," and "linked" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral structure; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium, or an internal connection between two devices, components, or parts. Those skilled in the art can understand the specific meaning of these terms in this application based on the specific circumstances.

[0051] Furthermore, the terms "first," "second," etc., are primarily used to distinguish different devices, elements, or components (which may be the same or different in specific type and construction), and are not intended to indicate or imply the relative importance or quantity of the indicated devices, elements, or components. Unless otherwise stated, "a plurality of" means two or more.

[0052] As described in the background section of this application, in a formation and capacity testing device, a temperature probe assembly is typically mounted on one side of the battery probe assembly via a mounting structure. The temperature probes in the temperature probe assembly are used to monitor the battery temperature in real time during the formation and capacity testing process, so as to feed the temperature information back to the control system of the device and prevent the battery from overheating and causing a safety accident.

[0053] However, in related technologies, due to the large number of components and the complexity of the structure, the manufacturing cost of the installation structure is high, and the work efficiency is also low due to the troublesome assembly.

[0054] In view of the above-mentioned problems, this application provides a temperature probe module to solve the problems of high manufacturing cost and low working efficiency in related technologies.

[0055] The technical solution of this application will be further described below with reference to specific embodiments and accompanying drawings:

[0056] Temperature probe module 100 is used in formulation and capacity testing equipment, and such as Figure 1 and Figure 2 As shown, the temperature probe module 100 includes a probe assembly 1 and a mounting member 2, wherein the probe assembly 1 includes a probe 11. The mounting member 2 is a single piece and includes a mounting portion 21 and a protective portion 22, wherein the protective portion 22 is connected to the mounting portion 21, and the probe assembly 1 is at least disposed on the mounting portion 21. In the direction surrounding the probe 11, the protective portion 22 is disposed on at least one side of the probe 11 to provide protection for the probe 11.

[0057] In this application, since the mounting component 2 includes a connected mounting portion 21 and a protective portion 22, and since the probe assembly 1 is at least provided in the mounting portion 21, the mounting component 2 in this application can serve as a mounting structure for mounting the probe assembly 1. Compared with the mounting structure of related technologies, since the mounting component 2 is an integral piece, this application can reduce the number of components in the mounting structure and simplify the specific structure of the mounting structure. This not only reduces the manufacturing cost of the mounting structure, but also improves work efficiency because the mounting component 2, as an integral piece, does not require the assembly of multiple components.

[0058] Furthermore, since the protective part 22 is disposed on at least one side of the probe 11 in the direction surrounding the probe 11, it is used to protect the probe 11. Therefore, through the protection of the protective part 22, on the one hand, for external forces located on the side of the protective part 22 away from the probe 11, these external forces can act directly on the protective part 22, that is, the protective part 22 can prevent these external forces from acting directly on the probe 11, thereby reducing the risk of the probe 11 bending, breaking or being damaged due to external forces, and thus extending the service life of the probe 11 and ensuring the stable and reliable function of the probe 11; on the other hand, for other components located on the side of the protective part 22 away from the probe 11, these components can interfere with the protective part 22, that is, the protective part 22 can prevent the probe 11 from interfering with other components, thereby ensuring the normal operation of the probe 11 and reducing monitoring errors or malfunctions caused by interference.

[0059] Regarding the mounting section 21, further, in some alternative embodiments, such as Figure 1 and Figure 2 As shown, the mounting part 21 includes a support section 211 and a connecting section 212. The support section 211 is disposed opposite to the protective part 22. The connecting section 212 is connected between the support section 211 and the protective part 22 and is located on the same side of the support section 211 and the protective part 22. The probe assembly 1 is disposed between the support section 211 and the protective part 22.

[0060] This configuration allows the connecting section 212 to connect between the support section 211 and the protective section 22, forming an integral frame structure for the mounting component 2. This structural design improves the overall strength of the mounting component 2, enabling it to withstand certain external impacts and vibrations without deformation or damage during the operation of the chemical reaction and reaction equipment. This, in turn, enhances the stability and reliability of the probe assembly 1 mounted on the mounting component 2.

[0061] On the other hand, by positioning the probe assembly 1 between the support section 211 and the protective section 22, the support section 211 and the protective section 22 can protect the probe 11 located between them, thereby further preventing damage to the probe 11 and extending its service life. Simultaneously, in the relative arrangement direction of the protective section 22 and the support section 211, the support section 211 and the protective section 22 can also limit the probe assembly 1, ensuring that the probe assembly 1 is maintained in an accurate position in that direction. This ensures stable monitoring of the battery by the probe 11 and reduces monitoring errors caused by shaking or displacement.

[0062] In some alternative embodiments, the mounting portion 21 may consist only of the connecting segment 212, in which case the probe assembly 1 may be disposed on the connecting segment 212. This configuration simplifies the structure of the mounting portion 21 and facilitates its manufacturing.

[0063] In other embodiments, the mounting part 21 can also be any other structure. The structure of the mounting part 21 is flexible and can be set according to actual needs. This application embodiment does not make specific limitations in this regard.

[0064] Regarding the protective part 22, further, in some alternative embodiments, such as Figure 1 and Figure 2 As shown, the protective part 22 includes only one protective section 221, which is disposed opposite to the support section 211 and connected to the connecting section 212. This arrangement simplifies the structure of the protective part 22 and facilitates its processing and manufacturing.

[0065] In some alternative embodiments, the protective section 22 may include a first protective segment and a second protective segment connected together. The first protective segment is disposed opposite to the support segment 211 and connected to the connecting segment 212. The second protective segment is connected to the side of the first protective segment away from the connecting segment 212 and is disposed opposite to the connecting segment 212. A gap exists between the second protective segment and the support segment 211, forming a mounting opening through which the probe assembly 1 can be mounted between the support segment 211 and the first protective segment.

[0066] With this configuration, the first and second protective sections allow the protective section 22 to be positioned on both sides of the probe 11 in the direction surrounding the probe 11. This increases the protective range of the protective section 22 on the probe 11, thereby helping to further prevent damage to the probe 11 and extend its service life.

[0067] In other embodiments, the protective part 22 can also be any other structure. The structure of the protective part 22 is flexible and can be set according to actual needs. This application embodiment does not make specific limitations in this regard.

[0068] In some alternative embodiments, the mounting component 2 is an integrally bent component; or, the mounting component 2 is a powder metallurgy integrally formed component.

[0069] This setup has several advantages. Firstly, since the integral bending part can be formed by bending the sheet metal, and the powder metallurgy integral molding part can be formed in one step by using a mold, it helps to simplify the manufacturing process of the mounting part 2 and thus improves the production efficiency of the mounting part 2.

[0070] On the other hand, since the one-piece structure has no connecting gaps, the mounting component 2 has higher strength and can better withstand external forces such as vibration and impact during the operation of the chemical composition and capacity equipment, thereby further enhancing the stability and reliability of the probe assembly 1 installation.

[0071] In some alternative embodiments, such as Figure 1 and Figure 2 As shown, the protective part 22 is provided with a weight reduction hole 222.

[0072] This design, through the weight reduction hole 222, not only reduces the weight of the mounting part 2, which is conducive to the lightweight design of the mounting part 2, but also reduces the amount of material used in manufacturing the mounting part 2, which is conducive to reducing the manufacturing cost of the mounting part 2.

[0073] Furthermore, in some alternative embodiments, such as Figure 3 and Figure 4As shown, the support section 211 has an overlapping edge 2111, which is located on the side of the support section 211 away from the connecting section 212. The inner wall of the weight-reducing hole 222 has a bearing section 2221. The extending directions of the bearing section 2221 and the overlapping edge 2111 are as follows (e.g., Figure 3 (The X direction is the same).

[0074] like Figure 3 and Figure 4 As shown, the probe assembly 1 also includes a first fixing member 12, which is connected to the probe 11 and overlaps the overlapping edge 2111 and the bearing section 2221.

[0075] With this configuration, on the one hand, the first fixing member 12 overlaps with the overlapping edge 2111 and the bearing section 2221. This not only allows the probe assembly 1 to be positioned on the mounting part 21 and the protective part 22, ensuring the stability of the probe assembly 1 on the mounting part 2, but also makes it easier to install and remove the first fixing member 12 on the mounting part 2, thereby facilitating the installation and removal of the probe assembly 1 on the mounting part 2.

[0076] On the other hand, by attaching the first fastener 12 to the bearing section 2221 of the inner wall of the weight reduction hole 222, the first fastener 12 can be installed using the existing structure of the weight reduction hole 222 without the need to set up a separate structure for installing the first fastener 12. This simplifies the structure of the mounting part 2 and facilitates the processing and manufacturing of the mounting part 2.

[0077] In some alternative embodiments, the first fixing member 12 can be snapped onto the support section 211 and the protective part 22. Specifically, the support section 211 is provided with a first snap-fit ​​groove, the protective part 22 is provided with a second snap-fit ​​groove, and the first fixing member 12 is provided with a first elastic claw and a second elastic claw. The first elastic claw and the second elastic claw are respectively used to snap into the first snap-fit ​​groove and the second snap-fit ​​groove.

[0078] This configuration, through the engagement of the elastic claws and the locking groove, not only enhances the stability and reliability of the first fixing member 12 on the mounting member 2, but also facilitates the installation and removal of the first fixing member 12 on the mounting member 2 to a certain extent.

[0079] In some alternative embodiments, the probe assembly 1 may be disposed only on the mounting portion 21. For example, the first fixing member 12 may simply overlap the connecting section 212, or the first fixing member 12 may be fixed to the support section 211. With this arrangement, it is only necessary to overlap or fix the first fixing member 12 to the mounting portion 21, without having to consider the cooperation between the first fixing member 12 and the protective portion 22. This simplifies the installation of the first fixing member 12, reduces installation difficulty, and improves installation efficiency.

[0080] Furthermore, in some alternative embodiments, such as Figure 3 As shown, the support section 211 has a first side surface 2112 disposed opposite to the protective part 22, as... Figure 4 As shown, the protective part 22 has a second side 223 disposed opposite to the support section 211.

[0081] like Figure 3 As shown, a first stepped portion 121 is provided on the side of the first fixing member 12 near the supporting section 211. The first stepped portion 121 includes a first overlapping surface 1211 and a first limiting surface 1212 connected together. The first overlapping surface 1211 is along the connecting direction of the connecting section 212 (e.g., ...). Figure 3 Extending in the Y direction and overlapping at the overlapping edge 2111, the first limiting surface 1212 faces the first side 2112, and the first limiting surface 1212 is located between the protective part 22 and the supporting section 211; and / or, as Figure 4 As shown, a second stepped portion 122 is provided on the side of the first fastener 12 near the protective portion 22. The second stepped portion 122 includes a connected second overlapping surface 1221 and a second limiting surface 1222. The second overlapping surface 1221 is along the connection direction of the connecting section 212 (e.g., ...). Figure 4 The second limiting surface 1222 extends in the Y direction and overlaps with the bearing section 2221. The second limiting surface 1222 faces the second side 223 and is located between the protective part 22 and the support section 211.

[0082] This configuration not only ensures the overlapping fit between the first fixing member 12 and the overlapping edge 2111 and the bearing section 2221 through the overlapping surface of the stepped portion, but also, since the first limiting surface 1212 faces the first side 2112 and the second limiting surface 1222 faces the second side 223, the limiting fit between the limiting surface and the corresponding side can further limit the probe assembly 1 in the direction in which the support section 211 and the protective part 22 are arranged opposite to each other. This can further ensure that the probe assembly 1 is kept in an accurate position in this direction, further ensure that the probe 11 can stably monitor the battery, and further reduce the monitoring error caused by shaking or displacement.

[0083] Furthermore, in some alternative embodiments, such as Figure 3 and Figure 4 As shown, a first step 121 is provided on the side of the first fastener 12 near the support section 211, and a second step 122 is provided on the side of the first fastener 12 near the protective section 22.

[0084] With this configuration, in the direction in which the support section 211 and the protective section 22 are positioned opposite each other, the probe assembly 1 can be further limited by the limiting cooperation between the first limiting surface 1212 and the first side surface 2112, and the limiting cooperation between the second limiting surface 1222 and the second side surface 223. This can further ensure that the probe assembly 1 is kept in an accurate position in this direction, further ensure that the probe 11 can stably monitor the battery, and further reduce monitoring errors caused by shaking or displacement.

[0085] In some alternative embodiments, the connecting segment 212 is provided with a clearance hole (not shown) for the probe 11 to pass through.

[0086] like Figure 3 and Figure 4 As shown, the probe assembly 1 further includes a second fixing member 13 and an elastic sub-assembly 14. The second fixing member 13 is connected to the probe 11, and at least one of the second fixing member 13 and the first fixing member 12 is a movable fixing member, which is movably connected to the probe 11. The elastic sub-assembly 14 is disposed on the probe 11 and is used to drive the movable fixing member to move through the elastic force generated by its own elastic deformation, so that the second fixing member 13 and the first fixing member 12 move closer to each other and are clamped on opposite sides of the mounting portion 21.

[0087] With this configuration, on the one hand, the elastic force of the elastic sub-assembly 14 drives the second fixing member 13 and the first fixing member 12 to approach each other and clamp them on opposite sides of the mounting part 21, which can enhance the fixing effect and stability of the probe assembly 1 on the mounting part 2. It can effectively prevent the probe assembly 1 from being displaced or loosened due to vibration, shaking or other reasons during equipment operation, thereby improving the stability and reliability of monitoring.

[0088] On the other hand, when the equipment is subjected to vibration or impact, the elastic sub-assembly 14 can absorb energy through its own elastic deformation, thus playing a role in buffering and shock absorption. This reduces the impact force transmitted to the probe 11, thereby protecting the probe 11 from damage and further extending its service life.

[0089] Furthermore, in some alternative embodiments, such as Figure 3 and Figure 4As shown, the elastic sub-assembly 14 includes a first compression spring 141 and a second compression spring 142. The first compression spring 141 is disposed between the probe 11 and the first fixing member 12, and the second compression spring 142 is disposed between the probe 11 and the second fixing member 13. The elastic force generated by the compression of the first compression spring 141 and the second compression spring 142 can drive the second fixing member 13 and the first fixing member 12 to move closer to each other and clamp them on opposite sides of the mounting part 21. That is, both the second fixing member 13 and the first fixing member 12 are movable fixing members.

[0090] With this configuration, since the first compression spring 141 and the second compression spring 142 are respectively located between the probe 11 and the first fixing member 12, and between the probe 11 and the second fixing member 13, when the first compression spring 141 and the second compression spring 142 are compressed, they will apply uniform elastic force to the first fixing member 12 and the second fixing member 13 respectively. This design allows the first fixing member 12 and the second fixing member 13 to be clamped on opposite sides of the mounting part 21 with a relatively uniform force, which can avoid the probe 11 tilting or being not securely fixed due to uneven force on one side, thereby improving the stability and reliability of the probe assembly 1 installation.

[0091] In some alternative embodiments, the elastic sub-assembly 14 may also include a tension spring connected to the first fixing member 12 and the second fixing member 13. The elastic force generated by the stretched tension spring can drive the second fixing member 13 and the first fixing member 12 closer together and clamp them on opposite sides of the mounting portion 21, i.e., both the second fixing member 13 and the first fixing member 12 are movable fixing members. Of course, one end of the tension spring may also be connected only to the first fixing member 12 or the second fixing member 13, and the other end may be connected to the probe 11.

[0092] This design simplifies the structure of the elastic sub-assembly 14, which not only facilitates the installation and disassembly of the elastic sub-assembly 14, but also helps to reduce the manufacturing cost of the elastic sub-assembly 14.

[0093] Furthermore, in some optional embodiments, the mounting portion 21 and / or the protective portion 22 are provided with a first positioning groove, and the first fixing member 12 is provided with a first positioning protrusion, the first positioning protrusion being used to insert into the first positioning groove; and / or, such as Figure 3 and Figure 4 As shown, the mounting part 21 and / or the protective part 22 are provided with a second positioning groove 23, and the second fixing member 13 is provided with a second positioning protrusion 131, which is used to insert into the second positioning groove 23.

[0094] This configuration, with the positioning protrusion inserted into the positioning groove, accurately determines the installation position of the fixing component, thereby ensuring that the probe assembly 1 is installed in the correct position and improving the installation accuracy of the probe assembly 1. This allows the probe 11 to maintain a stable position during monitoring, thus ensuring the accuracy of the detection and reducing monitoring errors caused by installation deviations.

[0095] Furthermore, in some alternative embodiments, such as Figure 3 and Figure 4 As shown, both the mounting part 21 and the protective part 22 are provided with a second positioning groove 23, and the second fixing member 13 is provided with a second positioning protrusion 131. The second positioning protrusion 131 is used to insert into the second positioning groove 23.

[0096] This design, by eliminating the need for a first positioning groove and a first positioning protrusion, simplifies the structure of the mounting component 2 and the probe assembly 1 to a certain extent, thereby facilitating the processing of the mounting component 2 and the probe assembly 1.

[0097] In addition, a second positioning groove 23 is provided on both the mounting part 21 and the protective part 22, which can increase the area of ​​the second fixing member 13 and the mounting member 2 for limiting and cooperating, thereby helping to further improve the installation accuracy of the probe assembly 1.

[0098] Furthermore, in some optional embodiments, the first fixing member 12 is a movable fixing member, such as... Figure 3 and Figure 4 As shown, the first fixing member 12 is provided with a handle structure 123 for applying a pulling force, and the pulling force is opposite to the elastic force of the elastic sub-assembly 14.

[0099] The first fixing member 12 has different radial distances at different positions around the probe 11, and under the action of tension, the first fixing member 12 can be rotatably set relative to the probe 11 around the probe 11 so that the first fixing member 12 can rotate to a first preset position or a second preset position.

[0100] Among them, such as Figure 3 and Figure 4 As shown, when the first fastener 12 is in the first preset position, the first fastener 12 overlaps the overlapping edge 2111 and the bearing section 2221; when the first fastener 12 is in the second preset position, the aforementioned clearance hole on the connecting section 212 allows the first fastener 12 to pass through.

[0101] With this configuration, when the probe assembly 1 needs to be disassembled, a pulling force can be applied to the first fixing member 12 through the handle structure 123, so that the first fixing member 12 is disengaged from the overlap of the overlap edge 2111 and the bearing section 2221, and the first fixing member 12 can also be moved away from the second fixing member 13.

[0102] After disengagement, the first fixing member 12 can be driven to rotate relative to the probe 11, so that the first fixing member 12 rotates from a first preset position to a second preset position. The first fixing member 12, located in the second preset position, passes through the space between the support section 211 and the protective part 22, and then passes through the aforementioned clearance hole on the connecting section 212, thereby completing the disassembly of the probe assembly 1. The installation process of the probe assembly 1 is the reverse of the disassembly process and will not be described in detail here.

[0103] As can be seen from the above, the handle structure 123 facilitates the application of a pulling force opposite to the direction of the elastic force to the first fixing member 12, thereby facilitating the installation and disassembly of the probe assembly 1.

[0104] This application also provides a chemical separation and dispensing device, such as... Figure 5 As shown, the formation and capacity testing device includes a battery fixing module and a temperature probe module 100. The battery fixing module is used to fix the battery. The temperature probe module 100 has the same structure as any of the temperature probe modules 100 in the above embodiments and can bring the same or similar beneficial effects. For details, please refer to the description in the above embodiments. This embodiment will not repeat it here. The probe 11 in the temperature probe module 100 is used to monitor the temperature of the battery.

[0105] In this application, the mounting component 2 can serve as the mounting structure for the mounting probe assembly 1. Compared with the mounting structure of related technologies, since the mounting component 2 is an integral piece, this application can reduce the number of components in the mounting structure and simplify the specific structure of the mounting structure. This not only reduces the manufacturing cost of the mounting structure, but also improves work efficiency because the mounting component 2, being an integral piece, does not require the assembly of multiple components.

[0106] For the battery fixing module, in this embodiment, the battery fixing module may include a clamp for holding the battery. Alternatively, the battery fixing module may also include a tray with grooves or positioning holes for battery insertion. The structure of the battery fixing module is flexible and can be configured according to actual needs; this embodiment does not impose specific limitations on this.

[0107] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this application, and are not intended to limit them. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some or all of the technical features therein. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of this application.

Claims

1. A temperature probe module, said temperature probe module (100) being used in a formation and capacity testing device, characterized in that, The temperature probe module (100) includes: A probe assembly (1) comprising a probe (11); Mounting component (2), wherein the mounting component (2) is an integral part, and the mounting component (2) includes: Installation section (21); The protective part (22) is connected to the mounting part (21), and the probe assembly (1) is at least disposed on the mounting part (21); in the direction surrounding the probe (11), the protective part (22) is disposed on at least one side of the probe (11) to form protection for the probe (11).

2. The temperature probe module according to claim 1, characterized in that, The mounting part (21) includes: A support section (211) is disposed opposite to the protective part (22); A connecting segment (212) is connected between the support segment (211) and the protective part (22) and is located on the same side of the support segment (211) and the protective part (22). The probe assembly (1) is disposed between the support segment (211) and the protective part (22).

3. The temperature probe module according to claim 2, characterized in that, The mounting component (2) is an integral bent component; or, The mounting component (2) is a powder metallurgy integral molding component.

4. The temperature probe module according to claim 2 or 3, characterized in that, The protective part (22) is provided with a weight reduction hole (222).

5. The temperature probe module according to claim 4, characterized in that, The support section (211) has an overlapping edge (2111), which is located on the side of the support section (211) away from the connecting section (212); the inner wall of the weight-reducing hole (222) has a bearing section (2221), which extends in the same direction as the overlapping edge (2111); The probe assembly (1) further includes: The first fastener (12) is connected to the probe (11) and overlaps the overlap edge (2111) and the bearing section (2221).

6. The temperature probe module according to claim 5, characterized in that, The support section (211) has a first side surface (2112) disposed opposite to the protective part (22), and the protective part (22) has a second side surface (223) disposed opposite to the support section (211); The first fastener (12) has a first stepped portion (121) on one side near the support section (211). The first stepped portion (121) includes a first overlapping surface (1211) and a first limiting surface (1212) connected together. The first overlapping surface (1211) extends along the connection direction of the connecting section (212) and overlaps the overlapping edge (2111). The first limiting surface (1212) faces the first side surface (2112) and is located between the protective part (22) and the support section (211); and / or, A second step (122) is provided on the side of the first fastener (12) near the protective part (22). The second step (122) includes a second overlapping surface (1221) and a second limiting surface (1222) connected together. The second overlapping surface (1221) extends along the connection direction of the connecting section (212) and overlaps the bearing section (2221). The second limiting surface (1222) faces the second side (223) and is located between the protective part (22) and the supporting section (211).

7. The temperature probe module according to claim 5, characterized in that, The connecting section (212) is provided with a clearance hole for the probe (11) to pass through; The probe assembly (1) further includes: A second fixing member (13) is connected to the probe (11). At least one of the second fixing member (13) and the first fixing member (12) is a movable fixing member, which is movably connected to the probe (11). Elastic sub-assembly (14) is disposed on the probe (11). The elastic sub-assembly (14) is used to drive the movable fixing member to move by the elastic force generated by its own elastic deformation, so that the second fixing member (13) and the first fixing member (12) move closer to each other and are clamped on opposite sides of the mounting part (21).

8. The temperature probe module according to claim 7, characterized in that, The mounting portion (21) and / or the protective portion (22) are provided with a first positioning groove, and the first fixing member (12) is provided with a first positioning protrusion, the first positioning protrusion being used to insert into the first positioning groove; and / or, The mounting part (21) and / or the protective part (22) are provided with a second positioning groove (23), and the second fixing member (13) is provided with a second positioning protrusion (131), which is used to insert into the second positioning groove (23).

9. The temperature probe module according to claim 7, characterized in that, The first fixing member (12) is the movable fixing member, and the first fixing member (12) is provided with a handle structure (123) for applying a pulling force, the pulling force being opposite to the direction of the elastic force; The first fixing member (12) has different radial distances at different positions around the probe (11), and under the action of the tension, the first fixing member (12) is rotatably arranged relative to the probe (11) around the circumference of the probe (11) so that the first fixing member (12) rotates to a first preset position or a second preset position. When the first fastener (12) is located in the first preset position, the first fastener (12) overlaps the overlapping edge (2111) and the bearing section (2221); when the first fastener (12) is located in the second preset position, the clearance hole allows the first fastener (12) to pass through.

10. A chemical composition and capacity testing device, characterized in that, include: A battery fixing module, which is used to fix the battery; The temperature probe module (100) according to any one of claims 1-9, wherein the probe (11) in the temperature probe module (100) is used to monitor the temperature of the battery.