A shockproof and vibration-proof portable microscope base

Abstract

This utility model discloses a shockproof and vibration-damping portable microscope base, belonging to the field of metallographic testing technology. It includes: an xy-axis moving platform, multiple magnetic base-type magnetic switches, and multiple buffer and shock-absorbing components. When the magnetic base-type magnetic switches are fixedly connected to the xy-axis moving platform, the buffer and shock-absorbing components are installed on the magnetic base-type magnetic switches. Under the magnetic force of the magnetic base-type magnetic switches, only the lower end of the buffer and shock-absorbing components abuts against the surface of the object to be inspected, leaving a gap between the magnetic base-type magnetic switches and the surface of the object to be inspected. When the magnetic base-type magnetic switches are hinged to the xy-axis moving platform, the buffer and shock-absorbing components are installed at the lower end of the xy-axis moving platform, and the lower end of the buffer and shock-absorbing components abuts against the upper surface of the corresponding magnetic base-type magnetic switch. A rubber buffer pad is fixedly connected between the lower surface of the xy-axis moving platform and the upper surface of the magnetic base-type magnetic switches. This base can reduce the vibration transmitted to the microscope from the non-stop equipment, making the microscope images clearer.

Description

Technical Field

[0001] This utility model belongs to the technical field of microscope anti-shake equipment, specifically relating to a shockproof and anti-shake portable microscope base. Background Technology

[0002] With the advancement of science and technology, energy-saving, efficient, and non-destructive testing has become an important development direction for manufacturing enterprises. On-site metallographic testing, a new technology that allows observation of metallographic structures without shutting down the equipment, utilizes a microscope base equipped with a magnetic suction cup, allowing direct adhesion to the surface of the metal being tested. This technology eliminates the need for cutting and sampling, enabling grinding, polishing, and inspection operations to be performed directly on the equipment surface, effectively ensuring the integrity of the workpiece.

[0003] Compared to laboratory metallographic examination, on-site metallographic examination presents significant technical challenges: Firstly, in situations where the on-site examination location is high, wind disturbances can easily cause the microscope to shake; secondly, during continuous operation of the equipment, vibrations from the main body are transmitted to the microscope. Existing magnetic microscope bases lack sufficient shock and vibration resistance and are highly sensitive to vibration interference. Even minor vibrations from wind or equipment operation can cause the microscope lens to shake, resulting in blurred or distorted images observed on-site.

[0004] Based on the above situation, this solution proposes a shockproof and vibration-resistant portable microscope base, aiming to solve the technical pain point of traditional field microscopes in terms of shock resistance performance. Utility Model Content

[0005] To address the aforementioned problems, this invention proposes a shockproof and vibration-proof portable microscope base.

[0006] To achieve the above objectives, the present invention proposes the following technical solution:

[0007] A shockproof and vibration-resistant portable microscope base includes the following structure:

[0008] The xy-axis moving platform is used for mounting a microscope and observing the metallographic structure of the surface of the object to be examined. It can be manually driven to move the microscope along the X or Y direction.

[0009] Multiple magnetic base type magnetic switches are installed on the lower surface of the xy axis moving platform and can be magnetically attached to the surface of the object to be inspected; the installation methods include fixed connection and hinge connection.

[0010] Multiple damping components are used to reduce the vibration interference of the object under inspection on the microscope.

[0011] When the magnetic base type magnetic switch is fixedly connected to the xy axis moving platform, the buffer and shock absorption component is correspondingly installed on the magnetic base type magnetic switch. During operation, under the magnetic force of the magnetic base type magnetic switch, the entire base and microscope are adsorbed onto the surface of the object to be tested. At this time, only the lower end of the buffer and shock absorption component abuts against the surface of the object to be tested, and a gap is left between the magnetic base type magnetic switch and the surface of the object to be tested.

[0012] When the magnetic base type magnetic switch is hinged to the xy-axis moving platform, the buffer and shock absorption component is installed at the lower end of the xy-axis moving platform, and the lower end of the buffer and shock absorption component abuts against the upper surface of the corresponding magnetic base type magnetic switch. A rubber buffer pad is fixedly connected between the lower surface of the xy-axis moving platform and the upper surface of the magnetic base type magnetic switch. During operation, under the magnetic force of the magnetic base type magnetic switch, the entire base and microscope are adsorbed onto the surface of the object to be tested, and at this time the magnetic base type magnetic switch is in contact with the surface of the object to be tested.

[0013] Furthermore, the buffer and shock absorption assembly includes the following structure:

[0014] The shell is a sleeve structure with a cover on top and an open bottom.

[0015] The spring, located inside the cavity of the housing, is always under compression, and the direction of compression of the spring is parallel to the axis of the cavity of the housing.

[0016] A limiting plate is fixed in the housing cavity and located at the lower end of the housing cavity. A limiting slot is opened in the middle of the limiting plate. A ball is provided in the limiting slot. The ball abuts against the lower end of the spring. The elastic restoring force of the spring causes the ball to abut against the limiting slot. At this time, the lower end of the ball is exposed outside the housing.

[0017] When the magnetic switch of the magnetic base type is fixedly connected to the xy axis moving platform, the lower end of the ball rests against the surface of the object to be inspected.

[0018] When the magnetic base type magnetic switch is hinged to the xy axis moving platform, the lower end of the ball abuts against the upper surface of the magnetic base type magnetic switch.

[0019] In the two scenarios, the installation positions of the damping components differ. When the magnetic base type magnetic switches are hinged to the xy-axis moving platform, the lower surfaces of multiple magnetic base type magnetic switches can form a certain curvature, thus allowing them to stably adhere to the curved surface of the object to be inspected, such as the outer surface of a pipe. When the magnetic base type magnetic switches are fixedly connected to the xy-axis moving platform, the lower surfaces of multiple magnetic base type magnetic switches are on the same plane, and they can only be stably adhered to the flat surface of the object to be inspected. When using a design that hinges to the xy-axis moving platform, the additional use of rubber limiting blocks for damping further enhances the vibration reduction effect.

[0020] The described damping and shock absorption assembly includes triple damping: When the device under inspection vibrates due to not stopping, the vibration is first transmitted through the ball bearings. The ball bearings roll in contact with the spring, generating rolling friction and reducing high-frequency vibration energy; this is the first-level damping. The vibration also compresses the spring through the ball bearings. The spring is a non-ideal force transmission component, and its compression process generates heat and consumes energy; this is the second-level damping. The vibration further deforms the rubber pad through the spring. After deformation, the rubber pad wraps around the end of the spring, and the spring and rubber pad dissipate residual vibration energy through friction; this is the third-level damping. The three levels of damping work together to reduce the impact of the vibration of the object under inspection on the microscope, thus allowing the microscope to observe a clear image.

[0021] Furthermore, a rubber pad is provided at the upper end of the housing cavity, and the upper end of the spring abuts against the rubber pad.

[0022] Furthermore, the xy-axis moving platform includes the following configuration:

[0023] The microscope is mounted on the base plate.

[0024] The first connecting plate is located below the base plate; the base plate is movably engaged with the first connecting plate and can slide along the X direction.

[0025] The first mounting base is installed on the first connecting plate;

[0026] The first threaded rod has its non-threaded portion rotatably connected to the first mounting base, and its threaded portion threadedly connected to the base plate.

[0027] The second connecting plate is located below the first connecting plate; the first connecting plate is movably engaged with the second connecting plate and can slide along the Y direction. From a perspective perpendicular to the first connecting plate, the X and Y directions are perpendicular to each other.

[0028] The second mounting base is installed on the second connecting plate.

[0029] The second threaded rod has its non-threaded portion rotatably connected to the second mounting base, and its threaded portion threadedly connected to the first connecting plate.

[0030] Furthermore, the base plate, the first connecting plate, and the second connecting plate are all provided with microscope host connection holes, and the microscope lens can observe the metallographic structure of the object under test through the microscope host connection holes.

[0031] The beneficial effects that can be achieved by adopting the above-mentioned technology are:

[0032] 1. High stability: By designing shock-absorbing components, the impact of external vibrations on microscopic observation can be effectively reduced, providing a more stable observation environment, which is especially important for high-magnification microscopic observation.

[0033] 2. Equipment protection: The shockproof design can protect the microscope from physical damage caused by vibration or sudden movement, extending the service life of the equipment.

[0034] 3. Enhanced portability: The small size, lightweight design, and foldable or extendable shape of the base greatly improve the portability of the microscope base, making it convenient for researchers to carry it to different locations for on-site observation, such as field investigations.

[0035] 4. Wide range of applications: This base can be adapted to both fixed use in the laboratory and mobile use outdoors, increasing the application scenarios of microscopes.

[0036] 5. Easy to operate: The base with fixing devices and other functions allows users to quickly install and adjust the microscope, simplifying the operation process and saving time.

[0037] 6. Improved observation quality: By reducing unnecessary vibrations and shaking, clearer and more stable images can be obtained, which helps to conduct accurate research and analysis. Attached Figure Description

[0038] Figure 1 This is a perspective view of the microscope base in Example 1;

[0039] Figure 2 This is a plan view of the microscope base from the X-axis perspective;

[0040] Figure 3 This is a schematic diagram of the structure of the buffer and shock absorption assembly;

[0041] Figure 4 This is a schematic diagram of the structure of Example 2.

[0042] 1. Base plate; 2. First connecting plate; 3. Second connecting plate; 4. First mounting base; 5. First threaded rod; 6. Microscope main unit connection hole; 7. Magnetic base type magnetic switch; 8. Mounting groove; 9. Rubber pad; 10. Spring; 11. Limiting plate; 12. Limiting groove hole; 13. Second mounting base; 14. Second threaded rod; 15. Ball bearing; 16. Housing; 17. Buffer pad; 18. Damping hinge. Detailed Implementation

[0043] To make the objectives, technical solutions, and advantages of the embodiments of this utility model clearer, the technical solutions of this utility model will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this utility model, not all embodiments. Based on the embodiments of this utility model, all other embodiments obtained by those skilled in the art without creative effort are within the protection scope of this utility model.

[0044] Example 1: As Figure 1 and Figure 2 As shown, a shockproof and vibration-damping portable microscope base includes an xy-axis moving platform, multiple magnetic base-type magnetic switches 7, and multiple buffer and shock-absorbing components. The xy-axis moving platform is used to mount the microscope and can be manually driven to move the microscope along... Figure 1 The microscope can move in either the X or Y direction. Multiple magnetic switches 7 are mounted on the lower surface of the XY-axis moving platform, allowing them to adhere to the metal surface of the object under inspection, facilitating microscope observation. Multiple shock-absorbing components are mounted on the magnetic switches 7 to reduce vibration energy and ensure clear image observation under the microscope. The microscope base has a compact overall structure, making it easy to carry.

[0045] The xy-axis moving platform includes:

[0046] The upper surface of the base plate 1 is fixed to the microscope by bolts, and the lower surface is cut to form the first dovetail block.

[0047] The first connecting plate 2 is located below the base plate 1, and its upper surface is cut to form a first dovetail groove; the base plate 1 is movably engaged with the first dovetail groove of the first connecting plate 2 by a first dovetail block, and can slide along the first dovetail groove; the base plate 1 is set along... Figure 1 Slide in the X direction. The lower surface of the first connecting plate 2 is cut to form the second dovetail block.

[0048] The first driving structure is used to drive the base plate 1 along... Figure 1 Slide in the X direction.

[0049] The second connecting plate 3 is located below the first connecting plate 2; its upper surface is cut to form a second dovetail groove, and the first connecting plate 2 is movably engaged in the second dovetail groove of the second connecting plate 3 by means of a second dovetail block, and can slide along the second dovetail groove; the first connecting plate 2 is set to... Figure 1 Sliding in the Y direction. In this embodiment, a microscope host connection hole 6 is provided in the middle of the base plate 1, the first connecting plate 2, and the second connecting plate 3. The microscope lens is located in the microscope host connection hole of the above components and can observe the surface of the object to be inspected through the microscope host connection hole 6 on the above components. In the viewing angle along the axis of the microscope host connection hole 6 (perpendicular to the viewing angle of the first connecting plate), the X direction and the Y direction are perpendicular to each other.

[0050] The second driving structure is used to drive the first connecting plate 2 along... Figure 1 Slide in the Y direction.

[0051] The first and second drive structures described above have the same overall structure but differ in their connection positions. Both structures include a mounting base and a threaded rod. Specifically, the first mounting base 4 of the first drive structure is bolted to the first connecting plate 2, the non-threaded portion of the first threaded rod 5 of the first drive structure is rotatably connected to the first mounting base 4 via a bearing, and the threaded portion of the first threaded rod 5 is threadedly connected to the base plate 1.

[0052] The second mounting base 13 of the second drive structure is bolted to the second connecting plate 3. The non-threaded portion of the second threaded rod 14 of the second drive structure is rotatably connected to the second mounting base 13 via a bearing, and the threaded portion of the second threaded rod 14 is threadedly connected to the first connecting plate 2. The axis of the first threaded rod 5 of the first drive structure is parallel to the X direction, and the axis of the second threaded rod 14 of the second drive structure is parallel to the Y direction, used to realize the sliding of the base plate 1 and the first connecting plate 2 along the X and Y directions, respectively. The pitch of both threaded rods is 1-2mm, providing high adjustment precision and adapting to short-distance fine-tuning of the microscope's viewing angle. Neither threaded rod extends to the corresponding microscope host connection hole 6 on the base plate 1 and the first connecting plate 2, avoiding collision interference between the microscope lens and the inner wall of the microscope host connection hole. The maximum adjustment stroke is approximately 6-8mm.

[0053] Multiple magnetic base type magnetic switches 7 are bolted to the lower surface of the second connecting plate 3. These magnetic base type magnetic switches 7 are an existing structure, also known as base magnetic switches or powerful magnetic bases. After installation, the lower surfaces of the multiple magnetic base type magnetic switches 7 are on the same plane. Operation is achieved by manually rotating or toggling the switch, purely mechanically controlling the magnetic circuit switching. The base magnetic switches have "OFF" and "ON" positions. Toggling the switch to the "OFF" position causes the magnetic base type magnetic switch 7 to lose its magnetic force; conversely, toggling the switch to the "ON" position generates magnetic force. A single magnetic base type magnetic switch 7 can generate a magnetic attraction force greater than 20N. In this embodiment, four magnetic base type magnetic switches 7 are used, which meets the force requirements of the microscope, ensuring that the microscope can be stably positioned on the surface of the object being inspected, without the risk of falling due to insufficient attraction force.

[0054] like Figure 3 As shown, multiple damping and shock-absorbing components are installed on the magnetic base type magnetic switch 7. The specific structure of a single damping and shock-absorbing component is as follows:

[0055] The housing 16 is a sleeve structure with a cover plate on top; the cavity axis of the housing is arranged in the vertical direction; in this embodiment, a mounting groove 8 is formed by cutting upward on the lower surface of the magnetic base type magnetic switch 7, and the housing is embedded in the mounting groove 8 by interference fit. Alternatively, a mounting position can be provided on the side of the magnetic base type magnetic switch 7 for mounting the housing 16.

[0056] Rubber pad 9 is bonded and fixed to the upper end of the cavity of housing 16.

[0057] Spring 10, located within the cavity of housing 16, is always in a compressed state. The compression direction of spring 10 is parallel to the axial direction of housing 16, and its upper end abuts against rubber pad 9.

[0058] A limiting plate 11 is fixed to the inner wall of the cavity of the housing and located at the lower end of the cavity. A limiting slot 12 is formed in the middle of the limiting plate 11, and a spherical ball 15 is provided in the limiting slot 12. The ball 15 abuts against the lower end of the spring 10. The elastic restoring force of the spring 10 causes the ball 15 to abut against the limiting slot 12. The diameter of the ball 15 is larger than the diameter of the limiting slot 12. Therefore, under the elastic force of the spring 10, the ball 15 abuts against the limiting slot 12, limiting the maximum downward stroke of the ball 15. The ball 15 cannot disengage from the limiting slot 12 and remains in place without other external forces. Figure 3 In the intermediate state, the lower end of the ball bearing 15 is exposed outside the housing, and the spring 10 is compressed. When the magnetic switch 7 generates magnetic force and attracts the object to be inspected, the part of the ball bearing 15 exposed outside the housing comes into contact with the object. Under the action of this magnetic force, the ball bearing 15 moves towards the upper end of the housing cavity and compresses the spring. Because the elastic coefficient of the spring 10 is designed, the displacement of the ball bearing 15 towards the upper end of the housing cavity under this magnetic force is limited (about 2-4 mm). At this distance, the lower end of the magnetic switch 7 is insufficient to contact the surface of the object to be inspected; only the ball bearing 15 contacts the surface of the object, and the magnetic switch 7 does not contact the surface of the object, ensuring that the vibration force generated by the object to be inspected is transmitted only through the ball bearing 15.

[0059] The advantage of this design lies in its triple-layered damping system: When the equipment under inspection vibrates due to continuous operation, the vibration is first transmitted through the ball bearings. These bearings roll against the spring, generating rolling friction and reducing high-frequency vibration energy – this is the first-level damping. The vibration also compresses the spring through the ball bearings. Since the spring is a non-ideal force transmitter, its compression generates heat and dissipates energy – this is the second-level damping. The vibration further deforms the rubber pad through the spring. The deformed rubber pad wraps around the spring end, and the spring and rubber pad dissipate residual vibration energy through friction – this is the third-level damping. These three levels of damping work together to reduce the impact of the inspected object's vibration on the microscope, thus allowing for clear image observation.

[0060] Example 2: As Figure 4 As shown, a shockproof and vibration-resistant portable microscope base differs from Embodiment 1 in that:

[0061] 1. The base plate 1, the first connecting plate 2, and the second connecting plate 3 of the xy-axis moving platform no longer have microscope host connection holes. The microscope lens is no longer located in the microscope host connection hole, but is located at the side end of the xy-axis moving platform. Since the side end of the xy-axis moving platform has a large space, when adjusting the microscope position along the X or Y direction, there is no need to consider the problem of the microscope lens colliding with the inner wall of the microscope host connection hole and causing interference.

[0062] II. The connection between the magnetic base type magnetic switch 7 and the second connecting plate 3 is no longer fixed by bolts, but hinged, specifically including the following structure:

[0063] Two damping hinges 18 are arranged symmetrically along surface P, with the centerline of the second connecting plate 3 in the X direction denoted as line G and the vertical plane passing through line G denoted as surface P. Taking a single damping hinge as an example, one leaf of this hinge is fixed to the lower surface of the second connecting plate 3 by bolts, and the other leaf is fixed to the upper surface of the magnetic base type magnetic switch 7 by bolts. The axis of rotation of the damping hinge is parallel to the X direction. Therefore, the magnetic base type magnetic switch 7 can rotate relative to the second connecting plate 3 via the axis of rotation of the damping hinge.

[0064] Two buffer pads 17, symmetrically arranged along surface P, are made of rubber and located between the lower surface of the second connecting plate 3 and the upper surface of the corresponding magnetic base type magnetic switch 7. The upper surface of the buffer pad is integrally bonded to one of the leaf pieces of the damping hinge and the lower surface of the second connecting plate 3, while its lower surface is integrally bonded to the other leaf piece of the damping hinge and the upper surface of the magnetic base type magnetic switch 7. The thickness of the buffer pads is 5mm, thus each damping hinge can only produce a deformation of 2-3mm.

[0065] Third, the buffer and shock absorption assembly is no longer installed on the magnetic base type magnetic switch 7, but on the second connecting plate 3; in this embodiment, the housing of the buffer and shock absorption assembly is fixedly connected to the second connecting plate 3 by bolts, and the lower end of the ball of the buffer and shock absorption assembly abuts against the upper surface of the magnetic base type magnetic switch 7.

[0066] The advantages of this solution are as follows: Building upon the shock absorption and vibration reduction assembly of Example 1, the addition of a damping hinge 18 allows the magnetic switch 7 to rotate slightly relative to the second connecting plate 3 when the object under inspection vibrates. This causes the buffer pad 17 to deform by 2-3 mm, further absorbing energy and making the vibration of the object under inspection less likely to affect the microscope, resulting in clearer images. Furthermore, the lower surface of the magnetic switch 7 connected by the two damping hinges 18 can adhere to an object with a certain curvature, such as the outer wall of a pipe.

[0067] Example 3: A method for metallographic examination of an object based on a shock-resistant portable microscope, comprising the following steps:

[0068] S1: Grind and polish the area on the surface of the object to be inspected where metallographic testing is required to remove the oxide layer; clean the ground area to ensure that no grinding debris remains; finally, etch the area and wipe away any excess etching agent to ensure that the metallographic structure can be observed under the microscope.

[0069] S2: The operator mounts the microscope onto the base plate of the shockproof and vibration-proof portable microscope base, ensuring that the microscope lens is unobstructed and can observe the surface of the object to be inspected.

[0070] S3: Attach the magnetic base type magnetic switch to the surface of the object to be inspected, adjust the position of the anti-vibration and anti-shake portable microscope base to ensure that the microscope can be aligned with the position after grinding, polishing and etching in S2; then, let the anti-vibration and anti-shake portable microscope base and microscope as a whole be attached to the object to be inspected by the magnetic base type magnetic switch.

[0071] S4: The operator manually fine-tunes the threaded rod of the first drive structure and / or the second drive structure, so that the threaded rod rotates within a small range, driving the microscope to move in the X and / or Y directions, ensuring that the microscope lens is aligned with the grinding area in step S2.

[0072] S5: By adjusting the fine adjustment knob of the microscope, the metallographic structure at this location can be clearly observed, and the metallographic image is transmitted to the terminal device via wireless communication for the operator to view and save; this is for subsequent analysis of all metallographic images to assess the safety performance of the object being inspected.

[0073] Based on the above-described preferred embodiments of this utility model, and through the foregoing description, those skilled in the art can make various changes and modifications without departing from the technical concept of this utility model. The technical scope of this utility model is not limited to the contents of the specification, but must be determined according to the scope of the claims.

Claims

1. A shockproof and anti-vibration portable microscope base, characterized by, Includes the following structure: The xy-axis moving platform is used for mounting a microscope and observing the metallographic structure of the surface of the object to be examined. It can be manually driven to move the microscope along the X or Y direction. Multiple magnetic base type magnetic switches are installed on the lower surface of the xy axis moving platform and can be magnetically attached to the surface of the object to be inspected. Multiple buffer and shock absorption components are used to reduce the vibration interference of the object under inspection on the microscope; When the magnetic base type magnetic switch is fixedly connected to the xy axis moving platform, the buffer and shock absorption component is correspondingly installed on the magnetic base type magnetic switch; during operation, under the magnetic force of the magnetic base type magnetic switch, the entire base and microscope are adsorbed on the surface of the object to be tested. At this time, only the lower end of the buffer and shock absorption component abuts against the surface of the object to be tested, and there is a gap between the magnetic base type magnetic switch and the surface of the object to be tested. When the magnetic base type magnetic switch is hinged to the xy-axis moving platform, the buffer and shock absorption component is installed at the lower end of the xy-axis moving platform, and the lower end of the buffer and shock absorption component abuts against the upper surface of the corresponding magnetic base type magnetic switch. A rubber buffer pad is fixedly connected between the lower surface of the xy-axis moving platform and the upper surface of the magnetic base type magnetic switch. During operation, under the magnetic force of the magnetic base type magnetic switch, the entire base and microscope are adsorbed onto the surface of the object to be tested, and at this time the magnetic base type magnetic switch is in contact with the surface of the object to be tested.

2. The shockproof and vibration-resistant portable microscope base according to claim 1, characterized in that, The buffer and shock absorption assembly includes the following structure: The shell is a sleeve structure with a cover plate on the top and an open bottom; The spring, located inside the cavity of the housing, is always in a compressed state, and the direction of spring compression is parallel to the axis of the cavity of the housing; A limiting plate is fixed in the housing cavity and located at the lower end of the housing cavity. A limiting slot is opened in the middle of the limiting plate. A ball is inserted in the limiting slot. The ball abuts against the lower end of the spring. The elastic restoring force of the spring causes the ball to abut against the limiting slot. At this time, the lower end of the ball is exposed outside the housing. When the magnetic base type magnetic switch is fixedly connected to the xy axis moving platform, the lower end of the ball abuts against the surface of the object to be inspected; When the magnetic base type magnetic switch is hinged to the xy axis moving platform, the lower end of the ball abuts against the upper surface of the magnetic base type magnetic switch.

3. The shockproof and vibration-resistant portable microscope base according to claim 2, characterized in that, A rubber pad is provided at the upper end of the housing cavity, and the upper end of the spring abuts against the rubber pad.

4. The shockproof and vibration-resistant portable microscope base according to claim 3, characterized in that, The xy-axis moving platform includes the following structure: The microscope is mounted on the base plate. The first connecting plate is located below the base plate; the base plate is movably engaged with the first connecting plate and can slide along the X direction. The first mounting base is installed on the first connecting plate; The first threaded rod has its non-threaded portion rotatably connected to the first mounting base, and its threaded portion threadedly connected to the base plate. The second connecting plate is located below the first connecting plate; the first connecting plate is movably engaged with the second connecting plate and can slide along the Y direction. From a perspective perpendicular to the first connecting plate, the X and Y directions are perpendicular to each other. The second mounting base is installed on the second connecting plate; The second threaded rod has its non-threaded portion rotatably connected to the second mounting base, and its threaded portion threadedly connected to the first connecting plate.

5. The shockproof and vibration-resistant portable microscope base according to claim 4, characterized in that, The base plate, the first connecting plate, and the second connecting plate are all provided with microscope host connection holes, through which the microscope lens can observe the metallographic structure of the object under test.

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