Chip testing fixture
By optimizing the handle and main body structure of the chip testing fixture through angle design and rotating components, the problems of space occupation and inconvenience caused by the extended handle are solved, achieving an efficient and stable operating experience and reducing maintenance costs.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- RUZHONG INTELLIGENT TECH SUZHOU CO LTD
- Filing Date
- 2025-06-23
- Publication Date
- 2026-06-26
AI Technical Summary
The existing chip testing fixtures require an extended handle design to avoid components such as fans, resulting in large space occupation, high material consumption, inconvenient operation, lack of ergonomic design, insufficient grip stability, and easy generation of vibration noise and structural damage.
The handle, designed with an angle, is spatially misaligned with the main body of the fixture. It is connected to the base via the first and second rotating components, and combined with an anti-slip structure and shock absorption device, it optimizes space utilization and improves operational stability and comfort.
Significantly reduces space occupation, improves ease of operation, enhances grip stability and user comfort, reduces equipment maintenance costs, and ensures reliability for high-frequency operations.
Smart Images
Figure CN224416913U_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of chip testing, and in particular to a chip testing fixture. Background Technology
[0002] In the design and application of chip testing fixtures, with the trend towards miniaturization and integration, achieving efficient coordination between the fixture body (such as the chip-bearing base or pressing mechanism) and operating components (such as opening and closing handles) within a limited space has become crucial for improving equipment space utilization and operational convenience. Optimizing the fixture structure to solve space occupation and motion interference problems not only meets the layout requirements of compact testing environments but also reduces human error through improved user experience, which is of significant practical importance for improving testing efficiency and reducing equipment maintenance costs.
[0003] In existing chip testing fixtures, the handle design needs to avoid components such as fans when opened, requiring the handle to be lengthened. This results in a large space occupation, significant material waste, and inconvenience for operators. Furthermore, the handle's structural design often fails to adequately consider ergonomic requirements, leading to insufficient grip stability and a lack of necessary shock absorption and cushioning. This can easily cause vibration noise or structural damage during frequent operation.
[0004] Therefore, this application proposes a chip testing fixture to solve the above problems. Summary of the Invention
[0005] This application provides a chip testing fixture. Through an innovative structural design, the chip testing fixture can avoid parts in the chip testing fixture without the need for an extended handle, thereby significantly reducing the space occupied by the fixture, improving the inconvenience caused by an extended handle, and enabling operators to open and close the fixture more conveniently, thus improving operating efficiency and user comfort.
[0006] In a first aspect, a chip testing fixture is provided, the chip testing fixture comprising a fixture body, a handle, and a base, characterized in that:
[0007] The main body of the fixture is rotatably connected to the base via a first rotating assembly, and the handle is rotatably connected to the base via a second rotating assembly;
[0008] The handle includes a first arm and a second arm. The first arm is distributed on both sides of the fixture body along a first direction. An included angle α is provided at the connection between the first arm and the second arm. The included angle α is not 0°. The included angle α satisfies the motion avoidance condition between the handle and the fixture body, so that the rotation plane of the handle and the rotation plane of the fixture body are spatially misaligned.
[0009] It should be understood that the first direction is the width direction of the chip testing fixture. Clearance conditions typically refer to spatial or angular constraints set in mechanical structure design to ensure that components do not interfere with other components during movement. The core of these constraints lies in avoiding contact or obstruction between moving components through a reasonable structural layout. In the chip testing fixture provided in this application, the connection between the first and second arms of the handle forms an angle. This angle design ensures that the fixture body does not interfere with each other during rotation. Simultaneously, this angle design saves space occupied by the entire chip testing fixture, improves the operational inconvenience caused by the extended handle, and allows operators to open and close the fixture more conveniently, improving operational efficiency and user comfort.
[0010] In conjunction with the first aspect, in some implementations of the first aspect, the base is provided with a first mounting part and a second mounting part opposite to each other along the second direction, and the distance between the first mounting part and the second mounting part along the second direction is the sum of the maximum rotation radius of the fixture body and the handle;
[0011] The first rotating component cooperates with the first mounting part to make the fixture body rotatably connected to the base;
[0012] The second rotating component cooperates with the second mounting part to make the handle rotatably connected to the base.
[0013] It should be understood that the second direction is the length direction of the chip testing fixture. The first and second mounting parts of the base, arranged along the second direction, are designed with a distance that satisfies the sum of the maximum rotation radii of the fixture body and the handle. This allows for a reasonable division of the rotational space between the fixture body and the handle when they are connected to the base via different rotating components, avoiding motion interference caused by excessively close mounting positions and ensuring smooth rotation of the fixture body and handle within their respective rotational planes. Simultaneously, this structural design, through a clear cooperative relationship between the mounting parts and rotating components, enhances the stability and reliability of the overall fixture connection, provides structural support for the spatially staggered layout of the fixture body and handle, further ensuring the realization of clearance conditions, and optimizing space utilization while enhancing the coordination of the operation process.
[0014] In conjunction with the first aspect, in some implementations of the first aspect, the handle includes a grip portion, the surface of which is provided with an anti-slip structure, the anti-slip structure including one or more of knurled patterns, raised and recessed patterns, and rubber anti-slip layers.
[0015] In conjunction with the first aspect, in some implementations of the first aspect, a reinforcing structure is provided, the reinforcing structure is parallel to the grip portion, both ends of the reinforcing structure are connected to the second arm portion, and the reinforcing structure satisfies the motion avoidance condition between the handle and the main body of the fixture, so that the rotation plane of the handle and the rotation plane of the main body of the fixture are spatially misaligned.
[0016] It should be understood that the reinforcing structure is parallel to the grip and connects to the second arm. Without affecting the movement and clearance conditions of the handle and the main body of the fixture, it effectively enhances the overall structural strength of the handle, reduces the risk of deformation caused by force during gripping or rotation, and ensures that the handle maintains a stable spatial misalignment layout during long-term use.
[0017] In conjunction with the first aspect, in some implementations of the first aspect, the base is provided with a connecting slot, and the end of the fixture body away from the second rotating component is provided with a connecting interface. The connecting slot and the connecting interface cooperate with each other to lock the fixture body to the base.
[0018] In conjunction with the first aspect, in some implementations of the first aspect, the first arm is provided with a fixing groove, the fixture body is provided with a fixing block, and the fixing groove and the fixing block cooperate with each other to fix the fixture body.
[0019] In conjunction with the first aspect, in some implementations of the first aspect, the first rotating component includes a shock-absorbing device for damping vibrations when the fixture body is fixed to the base.
[0020] It should be understood that the first rotating component is equipped with a shock absorption device, which absorbs and buffers external vibrations or impacts generated during operation when the fixture body is fixed to the base through elastic elements. This effectively reduces the vibration transmission at the connection between the fixture body and the base, improves the stability of the fixture in the fixed state, extends the service life of key rotating components, and provides a guarantee for the reliable operation of the chip testing fixture under high-frequency operation or complex working conditions.
[0021] In conjunction with the first aspect, in some implementations of the first aspect, the handle is manufactured using sheet metal processing. Attached Figure Description
[0022] Figure 1 , Figure 2 This is a schematic diagram of a closed chip testing fixture provided in an embodiment of this application.
[0023] Figure 3 , Figure 4 This is a schematic diagram of a chip testing fixture handle provided in an embodiment of this application.
[0024] Figure 5This is a schematic diagram of the base of a chip testing fixture provided in an embodiment of this application.
[0025] Figure 6 This is a schematic diagram of an open chip testing fixture provided in an embodiment of this application. Detailed Implementation
[0026] The terminology used in the following embodiments is for the purpose of describing particular embodiments only and is not intended to be limiting of this application. As used in the specification and appended claims of this application, the singular expressions “a,” “an,” “the,” “the,” “the,” and “this” are intended to also include expressions such as “one or more,” unless the context clearly indicates otherwise. It should also be understood that in the following embodiments of this application, “at least one” and “one or more” refer to one, two, or more than two. The term “and / or” is used to describe the relationship between related objects, indicating that three relationships may exist; for example, A and / or B can indicate: A alone, A and B simultaneously, or B alone, where A and B can be singular or plural. The character “ / ” generally indicates that the preceding and following related objects are in an “or” relationship.
[0027] References to "one embodiment" or "some embodiments" as described in this specification mean that one or more embodiments of this application include a specific feature, structure, or characteristic described in connection with that embodiment. Therefore, the phrases "in one embodiment," "in some embodiments," "in other embodiments," "in still other embodiments," etc., appearing in different parts of this specification do not necessarily refer to the same embodiment, but rather mean "one or more, but not all, embodiments," unless otherwise specifically emphasized. The terms "comprising," "including," "having," and variations thereof mean "including but not limited to," unless otherwise specifically emphasized.
[0028] With the trend towards equipment miniaturization, chip testing fixtures need to achieve efficient collaboration between the main body and operating components within a limited space to improve space utilization and ease of operation. Optimizing the structure to address space occupation and motion interference issues is key to achieving compact layouts, improving testing efficiency, and reducing maintenance costs. The handle design of current fixtures is particularly problematic: to avoid components such as fans, they are often forced to be lengthened, which not only occupies a large space and results in significant material waste but also leads to inconvenience in operation. Furthermore, their structures often neglect ergonomics, resulting in insufficient grip stability and a lack of shock absorption, easily causing vibration noise and structural damage during frequent operation, which urgently needs improvement.
[0029] This application provides a chip testing fixture to solve the above-mentioned problems.
[0030] The technical solutions of the embodiments of this application will be described below with reference to the accompanying drawings.
[0031] Figure 1 , Figure 2 This is a schematic diagram of a closed chip testing fixture provided in an embodiment of this application. Figure 3 , Figure 4 This is a schematic diagram of a chip testing fixture handle provided in an embodiment of this application. (Reference) Figures 1 to 4 In some examples, the chip testing fixture includes a fixture body 100, a handle 200, and a base 300, characterized in that:
[0032] The fixture body 100 is rotatably connected to the base 300 via a first rotating assembly 110, and the handle 200 is rotatably connected to the base 300 via a second rotating assembly 210;
[0033] The handle 200 includes a first arm 220 and a second arm 230. The first arm 220 is distributed opposite to each other on both sides of the fixture body 100 along a first direction. An included angle α is provided at the connection between the first arm 220 and the second arm 230. The included angle α is not 0°. The included angle satisfies the motion avoidance condition between the handle 200 and the fixture body 100, so that the rotation plane of the handle 200 and the rotation plane of the fixture body 100 are spatially misaligned.
[0034] In one possible implementation, the connection point between the first and second arms is designed with an angle of less than 90° using sheet metal bending or machining, allowing them to connect at an acute angle. The first arm connects to the second rotating component of the base. This design effectively satisfies the clearance requirements for movement between the handle and the fixture body, creating a more significant spatial misalignment between the handle's rotation plane and the fixture body's rotation plane. This allows the handle to avoid mounting areas for components such as fans inside the fixture without needing to lengthen the arm when opened, significantly reducing lateral space occupation. Simultaneously, the acute angle structure optimizes the leverage effect when the operator applies force by shortening the lever arm distance, making the grip more conform to the natural bending angle of the hand when under force, improving operational comfort and stability. Furthermore, the triangular mechanical structure formed by the acute angle enhances the overall rigidity of the handle, reducing the risk of deformation during long-term use, thus achieving an organic unity of space optimization, operational convenience, and structural strength.
[0035] Optionally, the included angle α formed by the first arm and the second arm of the chip testing fixture handle provided in this application embodiment can be adjusted according to actual business needs to adapt to various different working scenarios.
[0036] Figure 5 This is a schematic diagram of the base of a chip testing fixture provided in an embodiment of this application. (Reference) Figure 1 , Figure 2 and Figure 5 In some examples, the base 300 is provided with a first mounting portion 310 and a second mounting portion 320 opposite each other along the second direction, and the distance between the first mounting portion 310 and the second mounting portion 320 along the second direction is the sum of the maximum rotation radius of the fixture body 100 and the handle 200;
[0037] The first rotating component 110 and the first mounting part 310 cooperate with each other to make the fixture body 100 rotatably connected to the base 300;
[0038] The second rotating component 210 and the second mounting part 320 cooperate with each other to make the handle 200 rotatably connected to the base 300.
[0039] Continue to refer to Figure 3 In some examples, the handle 200 includes a grip portion 240, the surface of which is provided with an anti-slip structure, the anti-slip structure including one or more of knurled texture, raised texture, and rubber anti-slip layer.
[0040] Continue to refer to Figure 3 In some examples, the handle 200 is provided with a reinforcing structure 250, which is parallel to the grip portion 240. The two ends of the reinforcing structure 250 are connected to the second arm portion 230. The reinforcing structure 250 satisfies the motion avoidance condition between the handle 200 and the fixture body 100, so that the rotation plane of the handle 200 and the rotation plane of the fixture body 100 are spatially misaligned.
[0041] refer to Figure 5 The base 300 is provided with a connecting slot 330, and the end of the fixture body 100 away from the second rotating component 210 is provided with a connecting interface 120. The connecting slot 330 and the connecting interface 120 cooperate with each other to lock the fixture body 100 and the base 300.
[0042] Figure 6 This is a schematic diagram showing the opening of a chip testing fixture provided in an embodiment of this application. (Reference) Figure 1 and Figure 6 The first arm 220 is provided with a fixing groove 221, and the fixture body 100 is provided with a fixing block 130. The fixing groove 221 and the fixing block 130 cooperate with each other to fix the fixture body 100.
[0043] refer to Figure 1 The first rotating assembly 110 includes a shock-absorbing device 111, which is used to absorb shock when the fixture body 100 is fixed to the base 300.
[0044] In one possible implementation, the shock absorption device 111 further includes multiple elastic components that provide shock absorption when the chip test fixture is closed.
[0045] In some examples, the handle 200 is manufactured using sheet metal processing.
[0046] The above are merely preferred embodiments of the present invention. The scope of protection of the present invention is not limited to the above embodiments. Any equivalent modifications or variations made by those skilled in the art based on the content disclosed in the present invention should be included within the scope of protection set forth in the claims.
Claims
1. A chip testing fixture, comprising a fixture body (100), a handle (200), and a base (300), characterized in that: The fixture body (100) is rotatably connected to the base (300) via a first rotating assembly (110), and the handle (200) is rotatably connected to the base (300) via a second rotating assembly (210); The handle (200) includes a first arm (220) and a second arm (230). The first arm (220) is distributed opposite to each other on both sides of the fixture body (100) along a first direction. An included angle α is provided at the connection between the first arm (220) and the second arm (230). The included angle α is not 0°. The included angle α satisfies the motion avoidance condition between the handle (200) and the fixture body (100), so that the rotation plane of the handle (200) and the rotation plane of the fixture body (100) are spatially misaligned.
2. The chip testing fixture according to claim 1, characterized in that, The base (300) is provided with a first mounting part (310) and a second mounting part (320) opposite each other along the second direction. The distance between the first mounting part (310) and the second mounting part (320) along the second direction is the sum of the maximum rotation radius of the fixture body (100) and the handle (200). The first rotating assembly (110) and the first mounting part (310) cooperate with each other to make the fixture body (100) rotatably connected to the base (300); The second rotating assembly (210) and the second mounting part (320) cooperate with each other to make the handle (200) rotatably connected to the base (300).
3. The chip testing fixture of claim 2, wherein, The handle (200) includes a grip portion (240), and the surface of the grip portion (240) is provided with an anti-slip structure, which includes one or more of the following: knurled texture, raised texture, and rubber anti-slip layer.
4. The chip testing fixture according to claim 3, characterized in that, The handle (200) is provided with a reinforcing structure (250), which is parallel to the grip (240). Both ends of the reinforcing structure (250) are connected to the second arm (230). The reinforcing structure (250) satisfies the movement clearance condition between the handle (200) and the fixture body (100), so that the rotation plane of the handle (200) and the rotation plane of the fixture body (100) are spatially misaligned.
5. The chip testing fixture according to claim 4, characterized in that, The base (300) is provided with a connecting slot (330), and the end of the fixture body (100) away from the second rotating component (210) is provided with a connecting interface (120). The connecting slot (330) and the connecting interface (120) cooperate with each other to lock the fixture body (100) and the base (300).
6. The chip testing fixture according to claim 5, characterized in that, The first arm (220) is provided with a fixing groove (221), and the fixture body (100) is provided with a fixing block (130). The fixing groove (221) and the fixing block (130) cooperate with each other to fix the fixture body (100).
7. The chip testing fixture according to claim 6, characterized in that, The first rotating assembly (110) includes a shock-absorbing device (111) which is used to absorb shock when the fixture body (100) is fixed to the base (300).
8. The chip testing fixture according to claim 7, characterized in that, The handle (200) is manufactured using sheet metal processing.