A kind of transmission electron microscope magnetic film sample pretreatment device

Abstract

This utility model relates to a sample pretreatment device for magnetic thin films used in transmission electron microscopy, belonging to the field of electron microscope sample technology. It includes a base, on which a rotating body is movably mounted. A top plate and a bottom plate, arranged vertically opposite each other, are fixedly connected to both ends of the rotating body. An upper magnet is located on the bottom surface of the top plate, and a lower magnet is located on the top surface of the bottom plate. The upper and lower magnets are arranged opposite each other to form a magnetic field. A sample placement hole is opened on the rotating body, and a sample rod containing the sample is securely fastened within the hole, placing the sample between the upper and lower magnets. A toggle hole is opened on the top plate, and a toggle rod is inserted into the toggle hole. Rotating the toggle rod causes the top plate, rotating body, and bottom plate to rotate synchronously, allowing the magnetic field to adsorb sample debris from various locations on the sample surface. This application improves sample adhesion and can simulate a magnetic field to pre-remove sample debris around the sample on the sample rod.

Description

Technical Field

[0001] This utility model relates to a pretreatment device for magnetic thin film samples in transmission electron microscopy, belonging to the field of electron microscope sample technology. Background Technology

[0002] Magnetic samples are a primary type of material used in our testing unit. Although they may affect the quality of observations and sometimes even damage the transmission electron microscope (TEM), their microstructure testing is essential. After the sample holder containing the magnetic thin film sample is inserted into the TEM, some of the magnetic alloy precipitates in the electrolytically sprayed thin film sample may not bond firmly to the substrate under corrosion, or a small amount of sample debris may exist around the thin area. Under the strong magnetic field of the objective lens, these debris detaches from the substrate and is adsorbed around the objective lens pole pieces, causing TEM contamination. Furthermore, if the sample holder is not securely fastened when loading the magnetic thin film sample, the sample is prone to vibration during the detection process under the magnetic field, affecting the detection results. Summary of the Invention

[0003] The technical problem to be solved by this utility model is to provide a transmission electron microscope magnetic thin film sample pretreatment device that improves sample compactness and can simulate a magnetic field to remove sample debris around the sample on the sample rod in advance.

[0004] The technical solution adopted by this utility model to solve the above problems is as follows: a transmission electron microscope magnetic thin film sample pretreatment device, including a base, a rotating body movably mounted on the base, a top plate and a bottom plate fixedly connected at both ends of the rotating body, an upper magnet on the bottom surface of the top plate and a lower magnet on the top surface of the bottom plate, the upper magnet and the lower magnet being arranged opposite to each other to form a magnetic field; a sample placement hole is opened on the rotating body, and a sample rod containing the sample is fastened in the sample placement hole, so that the sample is placed between the upper magnet and the lower magnet; a toggle hole is opened on the top plate, and a toggle rod is inserted into the toggle hole. Rotating the toggle rod causes the top plate, the rotating body and the bottom plate to rotate synchronously, so that the magnetic field adsorbs sample debris at various positions on the sample surface.

[0005] The top plate has an upper mounting groove on its bottom surface, and the upper magnet is engaged in the upper mounting groove; the bottom plate has a lower mounting groove on its top surface, and the lower magnet is engaged in the upper mounting groove.

[0006] The lever is an L-shaped hexagonal wrench, and the actuation hole is an internal hexagonal hole, which is matched with the lever.

[0007] The upper and lower magnets are magnets or electromagnets.

[0008] Compared with the prior art, the advantages of this utility model are: a transmission electron microscope magnetic thin film sample pretreatment device, which improves sample compactness and can simulate a magnetic field to remove sample debris around the sample on the sample rod in advance. Attached Figure Description

[0009] Figure 1 This is a schematic diagram of a transmission electron microscope magnetic thin film sample pretreatment device according to an embodiment of the present invention;

[0010] In the figure, 1 is the base, 2 is the sample rod, 3 is the rotating body, 4 is the top plate, 5 is the bottom plate, 6 is the upper magnet, 7 is the lower magnet, 8 is the actuating rod, and 9 is the actuating hole. Detailed Implementation

[0011] The present invention will be further described in detail below with reference to the accompanying drawings and embodiments.

[0012] like Figure 1 As shown, a transmission electron microscope (TEM) magnetic thin film sample pretreatment device in this embodiment includes a base 1. A vertically arranged rotating shaft is mounted on the base 1. One end of the rotating shaft is fixed to the base 1 via a bearing, and the other end is fixed to a hollow rotating body 3. A top plate 4 and a bottom plate 5, arranged vertically opposite to each other, are fixedly connected to both ends of the rotating body 3. An upper mounting groove is formed on the bottom surface of the top plate 4, and an upper magnet 6 is fitted into the upper mounting groove. A lower mounting groove is formed on the top surface of the bottom plate 5, and a lower magnet 7 is fitted into the lower mounting groove. The upper magnet 6 and the lower magnet 7 are arranged opposite to each other, forming a magnetic field. A horizontally penetrating placement hole is formed on the rotating body 3, and a horizontally arranged sample rod 2 is inserted into the placement hole. A magnetic thin film sample is mounted on the front end of the sample rod 2, and the sample rod 2 is fixed to the rotating body 3 by a fixing ring, so that the magnetic thin film sample is positioned between the upper and lower magnets. A toggle hole 9 is provided on the top plate 4, and a toggle rod 8 is inserted into the toggle hole 9. Pushing the toggle rod 8 causes the top plate 4, the rotating body 3 and the bottom plate 5 to rotate synchronously, so that the upper magnet rotates synchronously, that is, the magnetic field rotates. The rotating magnetic field adsorbs sample debris at various positions on the surface of the magnetic thin film sample.

[0013] The lever is an L-shaped hex wrench, and the actuation hole is an internal hexagonal hole that matches the lever.

[0014] Both the upper and lower magnets are magnets or electromagnets.

[0015] Load the magnetic thin film sample into the sample rod, and pass the front end of the sample rod through the placement hole on the rotating body so that the magnetic thin film sample is located between the upper magnet and the lower magnet. Insert the actuating rod into the actuating hole and rotate the actuating rod so that the rotating body, top plate, bottom plate, upper magnet and lower magnet rotate synchronously. The rotation range is ±10°. Rotate clockwise and counterclockwise alternately 5 times. Stop when you are sure that no sample debris falls off. The sample pretreatment is complete.

[0016] When loading the sample onto the sample rod, after the sample rod passes through the placement hole, a gasket and a beryllium ring are installed in sequence to fix the sample rod to the rotating body, improving the reliability of the sample rod's fastening. In the magnetic field formed by the two magnets, sample debris that is not firmly bonded to the magnetic thin film sample substrate and is invisible to the naked eye is detached from the sample. Using an L-shaped hex wrench as a rotating handle, sample debris from different directions and positions can be detached from the sample.

[0017] In addition to the above embodiments, this utility model also includes other implementation methods. All technical solutions formed by equivalent transformation or equivalent substitution should fall within the protection scope of the claims of this utility model.

Claims

1. A transmission electron microscope magnetic thin film sample pre-treatment apparatus, characterized by: The device includes a base on which a rotating body is movably mounted. A top plate and a bottom plate, arranged vertically opposite each other, are fixedly connected to both ends of the rotating body. An upper magnet is located on the bottom surface of the top plate, and a lower magnet is located on the top surface of the bottom plate. The upper and lower magnets are arranged opposite each other to form a magnetic field. An object placement hole is opened on the rotating body, and a sample rod containing the sample is fastened into the object placement hole, placing the sample between the upper and lower magnets. A toggle hole is opened on the top plate, and a toggle rod is inserted into the toggle hole. Rotating the toggle rod causes the top plate, the rotating body, and the bottom plate to rotate synchronously, allowing the magnetic field to attract sample debris from various locations on the sample surface.

2. The magnetic thin film sample pre-treatment device for transmission electron microscopy of claim 1, wherein: The top plate has an upper mounting groove on its bottom surface, and the upper magnet is engaged in the upper mounting groove; the bottom plate has a lower mounting groove on its top surface, and the lower magnet is engaged in the upper mounting groove.

3. The magnetic thin film sample pre-treatment device for transmission electron microscopy of claim 1, wherein: The lever is an L-shaped hexagonal wrench, and the actuation hole is an internal hexagonal hole, which is matched with the lever.

4. The magnetic thin film sample pre-treatment device for transmission electron microscopy of claim 1, wherein: The upper and lower magnets are magnets or electromagnets.

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