A testing device for photovoltaic cells
The photovoltaic cell testing device with a flexible conductive layer and guide shaft structure solves the problem that traditional probe arrays are not suitable for new types of cells, and realizes a testing solution that is easy to replace and reduces costs, thereby improving the reliability and versatility of the test.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- GOLD STONE (FUJIAN) ENERGY CO LTD
- Filing Date
- 2025-06-30
- Publication Date
- 2026-07-14
AI Technical Summary
Traditional probe array testing devices are not suitable for new photovoltaic cells, especially gridless photovoltaic cells. The large number of test points and small grid spacing lead to frequent replacements, difficult maintenance, and high costs.
The test P-cell and N-cell arrays are covered with a flexible conductive layer and conductive metal wires. Combined with the guide shaft structure of the test base and upper plate, the overall replacement is convenient, the processing accuracy requirements are reduced, and it can adapt to different cell shapes.
It improves the versatility and ease of maintenance of the testing device, reduces equipment costs, ensures the reliability of test quality, and solves the problems of frequent and costly maintenance of traditional probe arrays.
Smart Images
Figure CN224503331U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of photovoltaic equipment, and in particular to a testing device for photovoltaic cells. Background Technology
[0002] With the rapid development of photovoltaics, the types of photovoltaic cells are constantly being innovated and breakthroughs are being made, and production capacity is rapidly increasing, which brings enormous challenges to the quality testing of photovoltaic cells. Currently, the main testing methods for photovoltaic cells in the photovoltaic industry include: EL testing technology (electroluminescence) and IV testing technology (current-voltage characteristic testing). EL testing technology is used to detect internal defects in photovoltaic cells, such as microcracks and broken grids. It works by applying current to the grid lines, utilizing the principle of electroluminescence in crystalline silicon to cause the photovoltaic cell to emit light. A CCD camera is used to capture and analyze the images to determine the quality problems of the photovoltaic cell. IV testing technology tests the current and voltage under different temperature and irradiance conditions, plotting IV curves to analyze and evaluate the conversion efficiency and performance of photovoltaic cells.
[0003] In existing technologies, testing photovoltaic (PV) cells typically involves connecting probes to wires, mounting the probes on a probe array, and using a transmission mechanism to press the probe array against the PV cell. The probes then contact the grid lines on the PV cell, and testing is performed by applying power or illumination. However, with the advancements in PV cell technology, including the emergence of gridless PV cells, traditional probe array testing is no longer suitable due to the large number of test points and the small center-to-center distance between grid lines. Utility Model Content
[0004] To address the aforementioned issues, this invention provides a testing device for photovoltaic cells, which fundamentally replaces traditional probe testing. The device is highly versatile, not only solving the problem of frequent probe replacement and maintenance and optimizing the ease of device replacement, but also reducing the manufacturing cost of the testing device.
[0005] To solve the above-mentioned technical problems, the technical solution adopted by this utility model is: a testing device for photovoltaic cells, including a testing base, a testing P-type electrode array, a testing N-type electrode array, a wire lead-out outlet, a flexible conductive layer, a cell, and a testing upper plate. The testing P-type electrode array and the testing N-type electrode array are installed in the testing base according to their polarities. The flexible conductive layer is laid flat on the testing P-type electrode array and the testing N-type electrode array. The testing base is provided with guide shafts at its four corners, and the testing upper plate is provided with guide shaft sleeves corresponding to the guide shafts.
[0006] Furthermore, the flexible conductive layer is a conductive soft rubber plate configured to correspond to the external dimensions of the battery cell.
[0007] Furthermore, the flexible conductive layer is composed of a flexible buffer layer and conductive metal wires. The flexible buffer layer is laid on the test P-pole array and the test N-pole array, and the conductive metal wires are respectively connected to the test P-pole array and the test N-pole array and cover the upper surface of the flexible buffer layer.
[0008] Furthermore, the test plate is embedded with high-transparency glass for image capture windows.
[0009] Furthermore, the lead-in of the wire is connected to an external test power supply.
[0010] As can be seen from the above description of the structure of this utility model, compared with the prior art, this utility model has the following advantages:
[0011] This invention utilizes the characteristics of conductive devices to solve the problem of testing accuracy for small-gap grid lines in a low-cost manner. The tooling is easy to install and disassemble; the entire conductive device can be replaced simply by loosening the connectors, allowing for rapid replacement. The flexible conductive layer has a large coverage area, requires no changes in shape, and is highly versatile. By using a full-surface conductive material in contact with the solar cell, no precision positioning is required, reducing the overall processing precision of the equipment. This invention overcomes the challenge of testing gridless solar cells, reduces the cost of photovoltaic cell testing equipment, decreases the frequency of maintenance, improves maintenance convenience, and ensures the reliability of test quality. Attached Figure Description
[0012] The accompanying drawings, which form part of this application, are used to provide a further understanding of the present invention. The illustrative embodiments of the present invention and their descriptions are used to explain the present invention and do not constitute an undue limitation of the present invention. In the drawings:
[0013] Figure 1 This is a schematic diagram of the structure of Embodiment 1 of the present utility model;
[0014] Figure 2 This is a schematic diagram of the structure of Embodiment 2 of this utility model. Detailed Implementation
[0015] To make the objectives, technical solutions, and advantages of this utility model clearer, the present utility model will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present utility model and are not intended to limit the present utility model.
[0016] Example 1
[0017] A testing device for photovoltaic cells includes a test base 1, a test P-type electrode array 2, a test N-type electrode array 3, a wire lead-out outlet 4, a flexible conductive layer 5, a solar cell 6, and a test upper plate 7. The test P-type electrode array 2 and the test N-type electrode array 3 are installed in the test base 1 according to their polarities. The flexible conductive layer 5 is a conductive soft rubber plate with dimensions corresponding to the solar cell 6. The flexible conductive layer 5 is laid flat on the test P-type electrode array 2 and the test N-type electrode array 3. The test base 1 has guide shafts 10 at its four corners, and the test upper plate 7 has guide shaft sleeves 9 corresponding to the guide shafts 10.
[0018] The test plate 7 is embedded with high-transparency glass 8 for image capture windows.
[0019] The lead-out port 4 of the wire is connected to an external test power supply.
[0020] Photovoltaic cell EL test: The cell 6 is placed on a conductive soft rubber plate. The test plate 7 guides and presses down on the photovoltaic cell 6 through the guide sleeve 9 and the guide shaft 10. The photovoltaic cell 6 is energized by contacting the wire lead-out 4. The photovoltaic cell 6 emits light electroluminescence. Finally, the CCD camera captures and analyzes the image.
[0021] Example 2
[0022] The method is carried out in accordance with Embodiment 1, except that the flexible conductive layer 5 is composed of a flexible buffer layer 51 and a conductive metal wire 52. The flexible buffer layer 51 is laid on the test P-pole array 2 and the test N-pole array 3, and the conductive metal wire 52 is connected to the test P-pole array 2 and the test N-pole array 3 respectively and covers the upper surface of the flexible buffer layer 51.
[0023] Photovoltaic cell EL test: The cell 6 is placed on the conductive metal wire 52, the test plate 7 is pressed down and pressed tightly on the photovoltaic cell 6, and electricity is applied through the wire to the wire lead-out 4. The photovoltaic cell 6 emits light electroluminescence, and finally the CCD camera captures and analyzes the image.
[0024] This invention utilizes the characteristics of conductive devices to solve the accuracy problem of small-gap grid line testing in a low-cost manner. The tooling is easy to install and disassemble; simply loosening the connectors allows for the complete replacement of the conductive device, enabling rapid replacement and resolving maintenance difficulties. The flexible conductive layer has a large coverage area, requiring no changes in shape, and is highly versatile. It solves the problem of excessive pressure on the solar cell from numerous dense probes, which can easily cause microcracks or breakage. The insulating flexible material acts as a buffer, reducing pressure on the solar cell and protecting its surface from scratches, thus improving the reliability of the test quality. Compared to the expensive cost of micro-probes, it is relatively inexpensive in gridless testing due to the large quantity used. Using a full-surface conductive material in contact with the solar cell eliminates the need for precision positioning, reducing the overall processing precision of the equipment. This breakthrough in gridless solar cell testing reduces the cost of photovoltaic solar cell testing equipment, decreases the frequency of maintenance, improves maintenance convenience, and ensures the reliability of test quality. It has significant implications for the future development of the industry and has promising application prospects.
[0025] The above description is only a preferred embodiment of the present utility model and is not intended to limit the present utility model. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present utility model should be included within the protection scope of the present utility model.
Claims
1. A testing device for photovoltaic cells, characterized in that: The test includes a test base (1), a test P-pole array (2), a test N-pole array (3), a wire lead-out outlet (4), a flexible conductive layer (5), a battery cell (6), and a test upper plate (7). The test P-pole array (2) and the test N-pole array (3) are installed in the test base (1) according to their polarities. The flexible conductive layer (5) is laid flat on the test P-pole array (2) and the test N-pole array (3). The test base (1) has guide shafts (10) at its four corners, and the test upper plate (7) has guide sleeves (9) corresponding to the guide shafts (10).
2. The testing device for photovoltaic cells according to claim 1, characterized in that: The flexible conductive layer (5) is a conductive soft plastic plate with dimensions corresponding to the outer size of the battery cell (6).
3. The testing device for photovoltaic cells according to claim 1, characterized in that: The flexible conductive layer (5) is composed of a flexible buffer layer (51) and a conductive metal wire (52). The flexible buffer layer (51) is laid on the test P-pole array (2) and the test N-pole array (3). The conductive metal wire (52) is connected to the test P-pole array (2) and the test N-pole array (3) respectively and covers the upper surface of the flexible buffer layer (51).
4. The testing device for photovoltaic cells according to claim 1, characterized in that: The test plate (7) is embedded with high-transparency glass (8) for image capture windows.
5. The testing device for photovoltaic cells according to claim 1, characterized in that: The lead-out port (4) of the wire is connected to an external test power supply.