An in-situ atomic force microscope detection system
An in-situ atomic force microscope inspection system combining a honeycomb sandwich structure and a piezoelectric ceramic damper has solved the problems of vibration coupling and spatial constraints in ultra-precision machining, achieving high-precision, real-time surface inspection.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- TIANJIN UNIV OF TECH & EDUCATION (TEACHER DEV CENT OF CHINA VOCATIONAL TRAINING & GUIDANCE)
- Filing Date
- 2025-08-19
- Publication Date
- 2026-07-24
AI Technical Summary
Existing technologies for ultra-precision machining tools suffer from problems such as machine tool vibration coupling, spatial constraints, and insufficient real-time performance, making it difficult to meet the requirements of ultra-precision machining in terms of detection accuracy and stability.
An in-situ atomic force microscope (AFM) system combining a honeycomb sandwich structure horizontal plate and a shear-type piezoelectric ceramic damper suppresses low-frequency vibrations through the honeycomb sandwich structure and blocks high-frequency vibrations through the damper. Combined with an elastic pad and a high-damping silicon carbide composite probe holder, it achieves all-round vibration attenuation.
It enables high-precision, real-time surface morphology inspection of machined parts during ultra-precision machining, ensuring inspection accuracy and stability while meeting the internal space constraints of the machine tool.
Smart Images

Figure CN224553302U_ABST