LED lamp bead testing device

Abstract

The utility model belongs to LED lamp test technical field especially, a kind of LED lamp pearl testing device, in view of the problem that the existing test lamp pearl testing device lacks special heat dissipation mechanism, present and propose the following scheme, including integrating sphere and computer, the inside fixedly connected with spectrometer of integrating sphere, support seat is fixedly connected at the inside bottom of integrating sphere, electric appliance box is bonded in the top of support seat, heat dissipation mechanism is arranged between the both sides of two supports for the heat dissipation of the test lamp pearl of test, the heat dissipation mechanism includes the heat dissipation plate fixedly connected between the both sides of two supports, the top of two supports is fixedly connected with same fan, in the utility model, the heat generated when testing test lamp pearl is quickly absorbed by copper heat-conducting block excellent heat-conducting performance, the heat dissipation area of multiple copper heat-dissipating fins on its surface is greatly expanded, forced convection is formed by cooperating fan, heat export is accelerated, the influence caused by test lamp pearl heating during testing is avoided.

Description

Technical Field

[0001] This utility model relates to the field of LED lamp testing technology, and in particular to an LED lamp bead testing device. Background Technology

[0002] In the mass production of LED chips, accurate detection of light parameters is a core aspect of controlling product quality. Currently, the industry commonly uses an integrating sphere testing system to perform this test. The test chip is fixed at a designated position inside the integrating sphere, and the high-reflectivity coating on the inner wall of the integrating sphere causes multiple diffuse reflections of the light to form a uniform light field. The light parameter data is then collected and analyzed by a spectrometer. This method has high detection accuracy, but it still has the following problems: The light-emitting characteristics of LED beads are extremely sensitive to temperature. The heat dissipation problem during the test seriously restricts the detection accuracy. When the LED beads are powered on for testing, the temperature of the beads rises rapidly and cannot be dissipated in time, resulting in a significant deviation between the test results and the parameters under actual working conditions. The existing integrating sphere testing device does not have a dedicated heat dissipation mechanism and relies solely on the natural heat dissipation of the integrating sphere housing. This results in extremely low heat exchange efficiency and continuous heat accumulation in the LED beads, leading to significant deviations between the test results and the parameters under actual working conditions. Therefore, an LED bead testing device is proposed. Utility Model Content

[0003] The purpose of this invention is to address the shortcomings of existing LED bead testing devices, which lack a dedicated heat dissipation mechanism, and to propose an LED bead testing device.

[0004] To achieve the above objectives, the present invention adopts the following technical solution: An LED bead testing device includes an integrating sphere and a computer, with a spectrometer fixedly connected inside the integrating sphere; The support base is fixedly connected to the bottom inner side of the integrating sphere; The electrical box is glued to the top of the support base; Two supports are fixedly connected to one side of the electrical box; A heat dissipation mechanism is installed between two supports to dissipate heat from the test LEDs. The heat dissipation mechanism includes a heat dissipation plate fixedly connected between the two supports. The top of the two supports is fixedly connected to the same fan. The heat dissipation plate is composed of a copper heat-conducting block and multiple copper heat dissipation fins. A fixing component is provided on one side of the copper heat-conducting block to fix the position of the test LEDs.

[0005] In one possible design, the fixing component includes a limiting block fixedly connected to one side of the copper heat-conducting block of the heat sink, a rotating cover plate rotatably connected to one side of the limiting block, and a bolt threadedly connected to the limiting block inserted into one side of the rotating cover plate. The surfaces of both the limiting block and the rotating cover plate are provided with grooves that match the test LED.

[0006] In one possible design, multiple contacts are fixedly connected to one side of the test LED, and probe holes matching the multiple contacts are opened on the surface of the heat sink. T-shaped probes are slidably inserted into the inner circumference of the multiple probe holes, and springs are sleeved on the outer circumference of the multiple T-shaped probes. The springs are fixed to the T-shaped probes and probe holes respectively through spring seats.

[0007] In one possible design, the rotating cover plate and the limiting block are fixed together by bolts, the test lamp is clamped between the rotating cover plate and the limiting block, and the test lamp presses the T-shaped probe to make it abut against the contact point of the test lamp.

[0008] In one possible design, multiple magnets are embedded on the side of the electrical box and the support base that are close to each other, and the electrical box and the support base are detachably attached together by the magnets.

[0009] In one possible design, the bottom of the integrating sphere is fixedly connected to a support frame.

[0010] In one possible design, the electrical box contains a fixed battery and a PLC control board, and the computer is electrically connected to the spectrometer, fan, battery, PLC control board, and test LEDs.

[0011] In this application: Place the test LED in the groove of the limiting block, rotate the cover plate and fix it to the limiting block with bolts to stably clamp the test LED between the two. During this process, the contact of the test LED presses the T-shaped probe. Under the action of the spring, the T-shaped probe maintains close contact with the contact to form a stable electrical connection. During the test, the heat generated by the test LED is conducted to the copper heat-conducting block of the heat sink through the fixing component. The copper heat sink fins of the heat sink increase the heat dissipation area. At the same time, the fan generates airflow to force convection heat dissipation on the heat sink fins, maintaining the test LED at a suitable operating temperature and avoiding distortion of test parameters due to overheating. After the test LED is lit, the light emitted undergoes multiple diffuse reflections inside the integrating sphere, forming a uniform light field distribution. A spectrometer fixedly connected inside the integrating sphere detects the uniformly mixed light, accurately measuring key photoelectric parameters of the test LED, such as spectral power distribution, color temperature, color rendering index, and luminous flux. The battery inside the electrical box provides power to the entire system. The PLC control board coordinates and controls the fan speed and the working status of the test lamps. The computer is electrically connected to the spectrometer, fan, PLC control board and test lamps to realize the automated control of the testing process and complete the acquisition, processing and display of test data.

[0012] Beneficial effects: In this utility model, the LED lamp bead testing device, through the combined use of components such as support, fan, heat sink, and limiting block, has excellent thermal conductivity due to the copper heat-conducting block of the heat sink, which can quickly absorb the heat generated during the testing of the lamp beads. The multiple copper heat dissipation fins on the surface of the heat sink greatly expand the heat dissipation area. Combined with the fans on the top of the two supports, forced convection is formed, which accelerates the heat dissipation. This allows the surface temperature of the lamp beads to be controlled at a suitable and stable level during long-term testing, without being affected by temperature fluctuations, thus improving the accuracy and reliability of the test results. In this utility model, the LED lamp bead testing device uses components such as a limiting block, a rotating cover plate, a heat sink plate, and a back support. The grooves on the surfaces of the limiting block and the rotating cover plate are precisely matched with the outer contour of the test lamp bead. After the bolts are tightened, the lamp bead can be tightly pressed onto the surface of the copper heat-conducting block of the heat sink plate. The spring sleeved on the outside of the T-shaped probe can adapt to the height of the lamp bead contact point, which not only ensures the stable contact between the probe and the contact point, but also increases the contact area between the test lamp bead and the heat dissipation mechanism, thereby improving the heat transfer efficiency. In this invention, the excellent thermal conductivity of the copper heat-conducting block quickly absorbs the heat generated during the testing of the test LED beads. The multiple copper heat dissipation fins on its surface greatly expand the heat dissipation area, and together with the fan, they form forced convection to accelerate heat dissipation and avoid the impact of the test LED beads heating up during testing. Attached Figure Description

[0013] Figure 1 This is a schematic diagram of the overall view structure of an LED bead testing device proposed in this utility model; Figure 2 This is a schematic diagram of the internal view structure of the integrating sphere of an LED bead testing device proposed in this utility model; Figure 3 This utility model proposes an LED lamp bead testing device. Figure 2 A magnified view of the structure at point A; Figure 4 This is a schematic diagram of a partial cross-sectional view of the internal structure of the integrating sphere of an LED bead testing device proposed in this utility model. Figure 5 This is a magnified partial cross-sectional view of the internal structure of the integrating sphere of the LED lamp bead testing device proposed in this utility model. Figure 6 This utility model proposes an LED lamp bead testing device. Figure 5 A magnified view of the structure at point B.

[0014] In the diagram: 1. Integrating sphere; 2. Support frame; 3. Computer; 4. Support base; 5. Spectrometer; 6. Magnet; 7. Electrical box; 8. Support; 9. Fan; 10. Battery; 11. PLC control board; 12. Heat sink; 1201. Probe hole; 13. Limit block; 14. Test LED; 15. Rotating cover; 16. Spring; 17. T-type probe. Detailed Implementation

[0015] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present utility model. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments.

[0016] In one implementation case, refer to Figures 1-6 A lamp bead testing device includes: an integrating sphere 1 and a computer 3. A spectrometer 5 is fixedly connected inside the integrating sphere 1 for detecting various lighting parameters of the test lamp bead 14. In this embodiment, the support base 4 is fixedly connected to the inner bottom of the integrating sphere 1; The electrical box 7 is attached to the top of the support base 4 to prevent the internal electronic components from being contaminated by dust and water, which could damage the structure of the electronic components and improve the lifespan of the internal electronic components. Two supports 8 are fixedly connected to one side of the electrical box 7; In particular, a heat dissipation mechanism is provided between the two supports 8 for dissipating heat from the test LED 14. The heat dissipation mechanism includes a heat dissipation plate 12 fixedly connected between the two supports 8. The top of the two supports 8 is fixedly connected to the same fan 9. The heat dissipation plate 12 is composed of a copper heat-conducting block and multiple copper heat dissipation fins. The copper heat-conducting block transfers heat to the multiple copper heat dissipation fins. The copper heat dissipation fins improve heat dissipation efficiency by increasing the heat dissipation area. The fan 9 forms forced convection to accelerate heat dissipation, so that the surface temperature of the LED is controlled at a suitable and stable level during long-term testing. A fixing component is provided on one side of the copper heat-conducting block to fix the position of the test LED 14.

[0017] It should be noted that the fixing component includes a limiting block 13 fixedly connected to one side of the copper heat-conducting block of the heat sink 12. A rotating cover plate 15 is rotatably connected to one side of the limiting block 13. A bolt threadedly connected to the limiting block 13 is inserted into one side of the rotating cover plate 15. The surfaces of the limiting block 13 and the rotating cover plate 15 are both provided with grooves that match the test lamp bead 14, which are used to limit the offset of the test lamp bead 14.

[0018] This application can be used in the field of LED lamp testing technology, or in other fields applicable to this application.

[0019] In another implementation case, refer to Figures 1-6 An LED lamp bead testing device is disclosed, which is applied to the field of LED lamp testing technology. Multiple contacts are fixedly connected to one side of the test lamp bead 14. The surface of the heat sink 12 is provided with probe holes 1201 that match the multiple contacts. T-shaped probes 17 are slidably inserted into the inner circumference of the multiple probe holes 1201. Springs 16 are sleeved on the outer circumference of the multiple T-shaped probes 17. The springs 16 are fixed to the T-shaped probes 17 and the probe holes 1201 respectively through spring seats. The elasticity of the springs 16 provides continuous and controllable contact pressure to prevent poor contact between the T-shaped probes 17 and the test lamp bead 14 from interfering with the test results.

[0020] In this embodiment, the rotating cover plate 15 and the limiting block 13 are fixed together by bolts. The test lamp 14 is clamped between the rotating cover plate 15 and the limiting block 13. The test lamp 14 presses the T-shaped probe 17 to make it abut against the contact of the test lamp 14.

[0021] In particular, multiple magnets 6 are embedded on the side of the electrical box 7 and the support base 4 that are close to each other, and the electrical box 7 and the support base 4 are detachably attracted together by the magnets 6.

[0022] In addition, a support frame 2 is fixedly connected to the bottom of the integrating sphere 1 to prevent dust and water stains from contaminating the bottom interface of the integrating sphere 1, and to reduce the impact of ground vibration on the spectrometer 5 inside the integrating sphere 1.

[0023] It should be noted that the battery 10 and the PLC control board 11 are fixedly connected inside the electrical box 7. The computer 3 is electrically connected to the spectrometer 5, the fan 9, the battery 10, the PLC control board 11, and the test lamp 14.

[0024] However, as is well known to those skilled in the art, the working principles and wiring methods of the computer 3, spectrometer 5, fan 9, battery 10, PLC control board 11, and test lamp 14 are all conventional methods or common knowledge, and will not be described in detail here. Those skilled in the art can make any selections according to their needs or convenience.

[0025] The accompanying drawings in this application are for illustrative purposes only. The dimensions and shapes of the components shown are not actual limitations but are merely schematic representations. In actual implementation, the components can be reasonably configured and adjusted according to specific needs and actual conditions.

[0026] The above description is only a preferred embodiment of the present utility model, but the protection scope of the present utility model is not limited thereto. Any equivalent substitutions or changes made by those skilled in the art within the technical scope disclosed in the present utility model, based on the technical solution and the inventive concept of the present utility model, should be included within the protection scope of the present utility model.

Claims

1. An LED lamp bead testing device comprising a test lamp bead (14), characterized in that, Also includes: Integrating sphere (1) and computer (3), with spectrometer (5) fixedly connected inside the integrating sphere (1); The support base (4) is fixedly connected to the bottom inner side of the integrating sphere (1); The electrical box (7) is attached to the top of the support base (4); Two supports (8) are fixedly connected to one side of the electrical box (7); The heat dissipation mechanism is set between the two sides of the two supports (8) for heat dissipation of the test lamp (14). The heat dissipation mechanism includes a heat dissipation plate (12) fixedly connected between the two sides of the two supports (8). The top of the two supports (8) is fixedly connected to the same fan (9). The heat dissipation plate (12) is composed of a copper heat-conducting block and multiple copper heat dissipation fins. A fixing component is provided on one side of the copper heat-conducting block for fixing the position of the test lamp (14).

2. The LED bead testing device according to claim 1, characterized in that, The fixing component includes a limiting block (13) fixedly connected to one side of the copper heat-conducting block of the heat sink (12). A rotating cover plate (15) is rotatably connected to one side of the limiting block (13). A bolt threadedly connected to the limiting block (13) is inserted into one side of the rotating cover plate (15). The surfaces of the limiting block (13) and the rotating cover plate (15) are both provided with grooves that match the test lamp beads (14).

3. The LED bead testing device according to claim 2, characterized in that, The test lamp bead (14) has multiple contacts fixedly connected to one side. The surface of the heat sink (12) is provided with probe holes (1201) that match the multiple contacts. T-shaped probes (17) are slidably inserted into the inner circumference of the multiple probe holes (1201). Springs (16) are sleeved on the outer circumference of the multiple T-shaped probes (17). The springs (16) are fixed to the T-shaped probes (17) and the probe holes (1201) respectively through spring seats.

4. The LED bead testing device according to claim 2, characterized in that, The rotating cover plate (15) and the limiting block (13) are fixed together by bolts. The test lamp (14) is clamped between the rotating cover plate (15) and the limiting block (13). The test lamp (14) presses the T-shaped probe (17) to drive it to abut against the contact point of the test lamp (14).

5. The LED bead testing device according to claim 1, characterized in that, Multiple magnets (6) are embedded on the side of the electrical box (7) and the support base (4) that are close to each other. The electrical box (7) and the support base (4) are detachably attracted together by the magnets (6).

6. The LED bead testing device according to claim 1, characterized in that, The bottom of the integrating sphere (1) is fixedly connected to a support frame (2).

7. The LED bead testing device according to claim 1, characterized in that, The electrical box (7) is fixedly connected to a battery (10) and a PLC control board (11). The computer (3) is electrically connected to the spectrometer (5), fan (9), battery (10), PLC control board (11) and test lamp (14).

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