An apparatus for testing a power module

Abstract

The embodiment provides a device for testing a power module, comprising a control module, a program-controlled power module, an acquisition module, an electronic load module, an oscilloscope module and an MCU control module which are bidirectionally interconnected with the communication control module respectively; the output end of the program-controlled power module is connected with a power fixture, the output end of the power fixture is connected in parallel with the acquisition module and the oscilloscope, the output end of the acquisition module is further connected with the electronic load, and the MCU control module is further connected with an upper computer display module. The application is realized by using an integrated circuit, has the advantages of simple structure, high reliability, simple operation, difficulty in failure, stable work, automatic testing of the power module, improved testing efficiency and precision, convenience for a detection personnel to detect the power module and great convenience for the detection personnel.

Description

Technical Field

[0001] This utility model belongs to the field of power supply testing technology, specifically relating to a device for testing power supply modules. Background Technology

[0002] As an indispensable core power management unit for electronic devices, the power module's function is to precisely regulate the input DC voltage to the stable voltage required by downstream equipment through internally integrated rectification, filtering, voltage regulation, and protection circuits. This directly determines the operational stability, power consumption, and lifespan of the electronic equipment. Whether it's smartphones and laptops in consumer electronics, PLCs and servo motors in industrial control, or charging piles and battery management systems (BMS) in the new energy field, all rely on power modules to provide a continuous and reliable power supply. Because the performance of the power module is directly related to the safety and reliability of downstream systems, it must undergo rigorous multi-dimensional technical specification verification before leaving the factory to ensure compliance with design standards and application requirements. These core technical specifications are not only key to measuring module quality but also the core basis for downstream equipment manufacturers' selection. Power modules must meet multiple technical specifications such as voltage regulation, load regulation, and ripple before leaving the factory.

[0003] Currently, power module performance testing requires manually setting up a test platform and manually adjusting the load. This testing method suffers from low efficiency, low accuracy, and unstable results. Furthermore, manual operation can lead to wiring errors, affecting test accuracy. Therefore, this application aims to provide a device for testing power modules. Utility Model Content

[0004] In order to overcome the shortcomings of existing technologies that rely on manual testing of power modules, this invention provides a device for testing power modules.

[0005] To achieve the above objectives, this utility model provides the following technical solution:

[0006] This disclosure provides an apparatus for testing a power supply module, including a control module, and a programmable power supply module, an acquisition module, an electronic load module, an oscilloscope module, and an MCU control module that are bidirectionally interconnected with the communication control module; the output terminal of the programmable power supply is connected to a power clamp, the output terminal of the power clamp is connected in parallel to the acquisition module and the oscilloscope, the output terminal of the acquisition module is also connected to the electronic load, and the MCU control module is also connected to a host computer display module;

[0007] The communication control module is configured to control the on / off state of the programmable power supply module, the acquisition module, the electronic load module, and the oscilloscope module, and to enable data interaction between each module and the MCU control module. The power supply clamp is used to hold the power supply under test, the programmable power supply module is used to provide the input voltage of the power supply under test, the acquisition module is used to acquire the output power and output current of the power supply under test, the oscilloscope module is used to acquire the output ripple of the power supply under test, the electronic load module is used to adjust the current required by the load, and the MCU control module is configured to compare the difference between the acquired data and the pre-stored data and transmit it to the host computer display module.

[0008] Furthermore, the communication control module communicates with the programmable power supply module, the acquisition module, the electronic load module, and the oscilloscope module via an RS485 bus.

[0009] Furthermore, the power supply clamp includes a clamping device for fixing the power supply under test, a power conversion circuit, and a signal output circuit for electrical connection with other modules.

[0010] Furthermore, the acquisition module includes a current acquisition circuit and a voltage acquisition circuit;

[0011] The current acquisition circuit includes a current Hall sensor U1. Pins 1 and 2 of the current Hall sensor U1 are connected to the negative output terminal of the power supply clamp, and pins 3 and 4 of the current Hall sensor U1 are connected to the positive output terminal of the power supply clamp. Pin VCC of the current Hall sensor U1 is connected to a parallel power supply VCC and a capacitor C1, and capacitor C1 is grounded. Pin VOUT of the current Hall sensor U1 is connected to the communication control module through a resistor R1, and pin TILTER of the current Hall sensor U1 is connected to pin GND of the current Hall sensor U1 through a capacitor C2.

[0012] The voltage acquisition circuit includes an isolation amplifier U2. Pin VDD1 of the isolation amplifier U2 is connected to a first power supply, capacitor C4, and capacitor C5. Capacitors C4 and C5 are connected in parallel and to GND1. Pin INP of the isolation amplifier U2 is connected to one end of capacitor C8 and one end of resistor R5. The other end of resistor R5 is connected to one end of resistors R3 and R6 respectively. The other end of resistor R3 is connected to the output terminal of the power supply clamp, and the other end of resistor R6 is connected to GND1. Pin INN of the isolation amplifier U2 is connected to the other end of capacitor C8 and one end of capacitor R7. The other end of capacitor R7 is connected to GND1. Pin VDD2 of the isolation amplifier U2 is connected to a second power supply, capacitor C6, and capacitor C7. 7. Capacitors C6 and C7 are connected in parallel and connected to GND2; the OUTP pin of the isolation amplifier U2 is connected to one end of resistor R4, the other end of resistor R4 is connected to one end of resistor R2, the positive input of the operational amplifier, and one end of capacitor C9, the other end of resistor R2 is connected to GND2, the OUTN pin of the isolation amplifier U2 is connected to one end of resistor R8 and resistor R9, the other end of resistor R8 is connected to the other end of capacitor C9, one end of resistor R10, and the negative input of the operational amplifier, the other end of resistor R10 is connected to the output pin of operational amplifier U3, the output pin of operational amplifier U3 is also connected to the input of the student control model, and the other end of resistor R9 is connected to GND2.

[0013] Furthermore, the voltage of the first power supply is 5V, and the voltage of the second power supply is 3.3V.

[0014] The beneficial effects of this utility model are:

[0015] This application provides a device for testing power modules, including a control module, and a programmable power supply module, a data acquisition module, an electronic load module, an oscilloscope module, and an MCU control module, all bidirectionally interconnected with the communication control module. The output of the programmable power supply is connected to a power fixture, and the output of the power fixture is connected in parallel to the data acquisition module and the oscilloscope. The output of the data acquisition module is also connected to the electronic load, and the MCU control module is connected to a host computer display module. This application utilizes integrated circuits, resulting in a simple structure, high reliability, easy operation, low failure rate, and stable operation. It achieves automated testing of power modules, improves testing efficiency and accuracy, and facilitates power module testing for testing personnel, providing them with significant convenience. Attached Figure Description

[0016] Figure 1 A schematic diagram of the structure of a test power module according to an embodiment of the present disclosure is shown;

[0017] Figure 2 A current acquisition circuit diagram according to an embodiment of this disclosure is shown;

[0018] Figure 3 A voltage acquisition circuit diagram according to an embodiment of the present disclosure is shown. Detailed Implementation

[0019] The embodiments of this utility model will now be described in detail with reference to the accompanying drawings.

[0020] This disclosure provides an apparatus for testing power modules, which can effectively improve the testing accuracy and efficiency of power modules.

[0021] Figure 1 A schematic diagram of a test power module apparatus according to an embodiment of this disclosure is shown, such as... Figure 1 As shown, it includes a control module, and a programmable power supply module, an acquisition module, an electronic load module, an oscilloscope module, and an MCU control module that are bidirectionally interconnected with the communication control module; the output of the programmable power supply is connected to a power clamp, the output of the power clamp is connected in parallel to the acquisition module and the oscilloscope, the output of the acquisition module is also connected to the electronic load, and the MCU control module is also connected to a host computer display module;

[0022] The communication control module is configured to control the power supply module, data acquisition module, electronic load module, and oscilloscope module to turn on and off, and to enable data interaction between each module and the MCU control module. Specifically, the communication control module uses preset control commands, such as relay drive signals and serial port commands, to precisely control the output switching of the power supply, the connection / disconnection of the electronic load, the sampling start / stop of the data acquisition module, and the waveform capture triggering of the oscilloscope, replacing the manual "power on / off" operation and ensuring that the test process is executed sequentially. Simultaneously, the communication control module establishes a bidirectional data channel using a standardized communication protocol. On one hand, it distributes commands from the MCU control module to the corresponding modules; on the other hand, it aggregates feedback data from each module, such as voltage and current values ​​from the data acquisition module and ripple data from the oscilloscope, and uploads it to the MCU control module for processing. The communication latency must be controlled within milliseconds to avoid affecting the timeliness of dynamic testing.

[0023] The power supply clamp is used to hold the power supply under test. Specifically, the power supply clamp includes a clamping device for fixing the power supply under test, a power conversion circuit, and a signal output circuit for electrical connection with other modules. It should be noted that the power supply clamp is a standardized interface device specifically designed for the power supply module under test. It has built-in probes or terminals adapted to different module specifications to form a signal output circuit. The mechanical structure's clamping device enables rapid clamping of the power supply module, achieving automatic connection of input and output terminals, replacing manual plugging and unplugging of wires, and reducing wiring error rates.

[0024] The programmable power supply module is used to provide the input voltage of the power supply under test, simulate the actual working input conditions of the power supply under test, support a wide range of voltage adjustment, and can be precisely set through the program to avoid errors caused by manual adjustment.

[0025] The acquisition module is used to acquire the output power and output current of the power supply under test.

[0026] The oscilloscope module is used to acquire the output ripple of the power supply under test. It acquires the AC component in the output voltage through a high-frequency probe, captures transient ripple with the trigger function, and outputs the peak-to-peak value of the ripple in digital form.

[0027] The electronic load module is used to adjust the current required by the load, simulate different working states of downstream equipment, and supports multiple modes such as constant current (CC), constant voltage (CV), and constant resistance (CR). The current adjustment range covers the rated load of the power supply under test and accurately tests the load regulation rate.

[0028] The MCU control module is configured to compare the differences between the acquired data and the pre-stored data. It has a built-in standard parameter library for the power supply under test, such as rated output voltage 3.3V, voltage regulation ≤0.5%, and ripple ≤50mVpp. During operation, it compares the measured data from the acquisition module and oscilloscope with the pre-stored standard values, automatically determines whether the product is qualified, generates a test result containing "qualified / unqualified" or "specific value", and transmits it to the host computer display module.

[0029] Specifically, in this embodiment, the communication control module communicates with the programmable power supply module, the acquisition module, the electronic load module, and the oscilloscope module via an RS485 bus. RS485 bus communication is a serial communication standard widely used in industrial control, intelligent device networking, and other scenarios. With its strong anti-interference capability, long transmission distance, and support for multi-node networking, it is particularly suitable for scenarios involving multi-device collaboration in automated power module testing systems.

[0030] Specifically, in this embodiment of the disclosure, the acquisition module includes a current acquisition circuit and a voltage acquisition circuit; Figure 2 A current acquisition circuit diagram is shown in an embodiment of this disclosure, such as... Figure 2As shown, the current acquisition circuit includes a current Hall sensor U1. Pins 1 and 2 of the current Hall sensor U1 are connected to the negative output terminal of the power supply clamp, and pins 3 and 4 of the current Hall sensor U1 are connected to the positive output terminal of the power supply clamp. The negative output terminal of the power supply clamp is the input current JC-, and the positive output terminal is the input current JC+. The current Hall sensor U1 pin VCC is connected to a parallel power supply VCC and a capacitor C1. The capacitor C1 is grounded. The current Hall sensor U1 pin VOUT is connected to the communication control module through a resistor R1. The current Hall sensor U1 pin TILTER is connected to the current Hall sensor U1 pin GND through a capacitor C2.

[0031] Figure 3 A voltage acquisition circuit diagram is shown in an embodiment of this disclosure, such as... Figure 3 As shown, the voltage acquisition circuit includes an isolation amplifier U2. Pin VDD1 of the isolation amplifier U2 is connected to a first power supply, capacitor C4, and capacitor C5. Capacitors C4 and C5 are connected in parallel and to GND1. Pin INP of the isolation amplifier U2 is connected to one end of capacitor C8 and one end of resistor R5. The other end of resistor R5 is connected to one end of resistors R3 and R6 respectively. The other end of resistor R3 is connected to the output terminal of the power supply clamp, and the other end of resistor R6 is connected to GND1. Pin INN of the isolation amplifier U2 is connected to the other end of capacitor C8 and one end of capacitor R7. The other end of capacitor R7 is connected to GND1. Pin VDD2 of the isolation amplifier U2 is connected to a second power supply, capacitor C6, and... Capacitors C7, C6, and C7 are connected in parallel and then connected to GND2. The OUTP pin of isolation amplifier U2 is connected to one end of resistor R4. The other end of resistor R4 is connected to one end of resistor R2, the positive input of the operational amplifier, and one end of capacitor C9. The other end of resistor R2 is connected to GND2. The OUTN pin of isolation amplifier U2 is connected to one end of resistors R8 and R9. The other end of resistor R8 is connected to the other end of capacitor C9, one end of resistor R10, and the negative input of the operational amplifier. The other end of resistor R10 is connected to the output pin of operational amplifier U3, which is also connected to the input of the student control model. The other end of resistor R9 is connected to GND2. Specifically, the voltage of the first power supply is 5V, and the voltage of the second power supply is 3.3V.

[0032] In use, this application first issues test commands via LabVIEW software in the host computer display module. Then, the MCU control module sends commands to the programmable power supply via the communication control module, causing the programmable power supply to output the required rated voltage for the test power supply. Next, the MCU control module sends commands to the electronic load module via the communication control module to control the required test power supply to unload or load.

[0033] The MCU control module sends commands to the oscilloscope module via the communication control module and reads the ripple data detected by the oscilloscope module. The MCU control module also uses the communication control module to read the voltage and current values ​​inside the power supply under test under different input voltages, load conditions, and set output voltages from the acquisition module.

[0034] The MCU control module internally processes the obtained data and compares the corresponding data indicators with the information stored internally. If the measured data exceeds the range of information stored in the MCU, the indicator is determined to be unqualified, and the test data and conclusion are transmitted to the host computer display module. The host computer display module then displays the obtained data and conclusions on its interface.

[0035] It should be noted that the power modules tested are not limited to a single type; various power modules can be tested. The power module to be tested is electrically connected to the test equipment through a power supply fixture. Therefore, a specific power supply fixture is required for each power module to be tested. Testing different power modules simply requires changing the appropriate power supply fixture.

Claims

1. A device for testing a power supply module, characterized in that, It includes a control module, as well as a programmable power supply module, an acquisition module, an electronic load module, an oscilloscope module, and an MCU control module that are bidirectionally interconnected with the communication control module; the output of the programmable power supply is connected to a power clamp, the output of the power clamp is connected in parallel to the acquisition module and the oscilloscope, the output of the acquisition module is also connected to the electronic load, and the MCU control module is also connected to a host computer display module; The communication control module is configured to control the power supply module, data acquisition module, electronic load module and oscilloscope module to turn on and off, and to realize data interaction between each module and the MCU control module. The power supply clamp is used to hold the power supply under test, the programmable power supply module is used to provide the input voltage of the power supply under test, the acquisition module is used to acquire the output power and output current of the power supply under test, the oscilloscope module is used to acquire the output ripple of the power supply under test, the electronic load module is used to adjust the current required by the load, and the MCU control module is configured to compare the difference between the acquired data and the pre-stored data and transmit it to the host computer display module.

2. The apparatus for testing a power supply module according to claim 1, characterized in that, The communication control module communicates with the programmable power supply module, the acquisition module, the electronic load module, and the oscilloscope module via an RS485 bus.

3. The apparatus for testing a power supply module according to claim 1, characterized in that, The power supply clamp includes a clamping device for fixing the power supply under test, a power conversion circuit, and a signal output circuit for electrical connection with other modules.

4. The apparatus for testing a power supply module according to claim 1, characterized in that, The acquisition module includes a current acquisition circuit and a voltage acquisition circuit; The current acquisition circuit includes a current Hall sensor U1. Pins 1 and 2 of the current Hall sensor U1 are connected to the negative output terminal of the power supply clamp, and pins 3 and 4 of the current Hall sensor U1 are connected to the positive output terminal of the power supply clamp. Pin VCC of the current Hall sensor U1 is connected to a parallel power supply VCC and a capacitor C1, and capacitor C1 is grounded. Pin VOUT of the current Hall sensor U1 is connected to the communication control module through a resistor R1, and pin TILTER of the current Hall sensor U1 is connected to pin GND of the current Hall sensor U1 through a capacitor C2. The voltage acquisition circuit includes an isolation amplifier U2. Pin VDD1 of the isolation amplifier U2 is connected to a first power supply, capacitor C4, and capacitor C5. Capacitors C4 and C5 are connected in parallel and to GND1. Pin INP of the isolation amplifier U2 is connected to one end of capacitor C8 and one end of resistor R5. The other end of resistor R5 is connected to one end of resistors R3 and R6 respectively. The other end of resistor R3 is connected to the output terminal of the power supply clamp, and the other end of resistor R6 is connected to GND1. Pin INN of the isolation amplifier U2 is connected to the other end of capacitor C8 and one end of capacitor R7. The other end of capacitor R7 is connected to GND1. Pin VDD2 of the isolation amplifier U2 is connected to a second power supply, capacitor C6, and capacitor C7.

7. Capacitors C6 and C7 are connected in parallel and connected to GND2; the OUTP pin of the isolation amplifier U2 is connected to one end of resistor R4, the other end of resistor R4 is connected to one end of resistor R2, the positive input of the operational amplifier, and one end of capacitor C9, the other end of resistor R2 is connected to GND2, the OUTN pin of the isolation amplifier U2 is connected to one end of resistor R8 and resistor R9, the other end of resistor R8 is connected to the other end of capacitor C9, one end of resistor R10, and the negative input of the operational amplifier, the other end of resistor R10 is connected to the output pin of operational amplifier U3, the output pin of operational amplifier U3 is also connected to the input of the student control model, and the other end of resistor R9 is connected to GND2.

5. The apparatus for testing a power supply module according to claim 4, characterized in that, The voltage of the first power supply is 5V, and the voltage of the second power supply is 3.3V.

Images