Electrical testing mechanism and chip mounter

Abstract

The utility model relates to patch equipment technical field especially, and more particularly to a kind of electrical testing mechanism and chip mounter.The electrical testing mechanism includes mounting bracket and probe component, mounting bracket is used to connect in chip mounter, mounting bracket includes the positioning component of horizontal extension, positioning component includes first positioning piece and at least two second positioning pieces separately arranged in the two sides of first positioning piece, probe component is set to mounting bracket, probe component includes first probe component and second probe component, first probe component and second probe component are used to respectively carry out electrical property detection to workpiece, first probe component and second probe component are all provided with the joint surface for being engaged with first positioning piece, first probe component and second probe component are also each set with the positioning slot for being respectively corresponding with the second positioning piece on two sides.Joint surface can be set multiple electrical testing stations using the electrical testing mechanism and quickly and accurately carry out the disassembly or installation of probe station.

Description

Technical Field

[0001] This utility model relates to the field of chip mounting equipment technology, and more specifically, to an electrical testing mechanism and a chip mounting machine. Background Technology

[0002] Pick and place machines are one of the core pieces of equipment used in SMT production. The placement head of the pick and place machine reciprocates between the pick and place machine's loading device and the circuit board to be placed, continuously picking up the components to be placed from the carrier of the loading device and placing them onto the circuit board, completing the continuous placement process. During the placement process, an electrical testing mechanism is usually used to perform electrical tests on the components to ensure that they can be used on the circuit board. However, pick and place machines are typically single-nozzle machines, processing only one component at a time, which limits their efficiency due to cam speed limitations. Therefore, designing a multi-nozzle pick and place machine requires a multi-station electrical testing mechanism.

[0003] In the existing technology, electrical testing mechanisms need to use probes to perform electrical tests. After long-term use, there is a need to change the number of stations or replace the probes. Multi-station electrical testing mechanisms are difficult to disassemble the workpieces at each station freely and cannot guarantee the installation accuracy and testing accuracy after disassembly and assembly. Utility Model Content

[0004] To overcome the technical problems of existing multi-station electrical testing mechanisms being difficult to disassemble and install freely, and unable to guarantee installation and testing accuracy, this utility model provides an electrical testing mechanism, which includes: Mounting bracket for connection to a pick and place machine, the mounting bracket including a horizontally extending positioning component, the positioning component including a first positioning element and at least two second positioning elements respectively disposed on both sides of the first positioning element; A probe assembly is disposed on the mounting bracket. The probe assembly includes a first probe assembly and a second probe assembly. The first probe assembly and the second probe assembly are used to perform electrical testing on the workpiece, respectively. The first probe assembly and the second probe assembly are provided with mating surfaces for engaging with the first positioning member. The first probe assembly and the second probe assembly are also each provided with positioning grooves for corresponding to the second positioning members on both sides.

[0005] Furthermore, the probe assembly includes a test probe and a mounting plate assembly. The mounting plate assembly includes a first mounting plate, a second mounting plate, and a third mounting plate. The first and second mounting plates enclose a first groove, and the second and third mounting plates enclose a second groove. The test probe is slidably connected to the first groove and the second groove.

[0006] Furthermore, the tip of the test probe extends elastically from the mounting plate assembly.

[0007] Furthermore, the probe assembly also includes a limiting pin, the test probe is provided with a receiving groove, an elastic element is provided in the receiving groove, and the upper surface of the limiting pin engages and limits the bottom of the elastic element.

[0008] Furthermore, the upper surface of the limiting pin is provided with a limiting groove, and the two side walls of the limiting groove and the two side walls of the receiving groove abut against the periphery of the elastic member for limiting.

[0009] Furthermore, the probe assembly is movably connected to the pick and place machine along the X-axis, Y-axis, and Z-axis directions.

[0010] Furthermore, the mounting bracket includes a base and a first fixing member. The base has a first adjustment hole extending along the Y-axis direction. The first fixing member can be fixed to the pick-and-place machine and connected to different positions of the first adjustment hole.

[0011] Furthermore, the mounting bracket includes a connecting plate and a second fixing member. The connecting plate is provided with a second adjustment hole extending along the Z-axis direction, and the base is provided with a first fixing hole. The second fixing member passes through the first fixing hole and can be connected to different positions of the second adjustment hole.

[0012] Furthermore, the mounting bracket also includes a probe mounting base and a third fixing member. The probe mounting is provided with only a second adjustment hole extending along the X-axis direction. The connecting plate is provided with a second fixing hole. The third fixing member passes through the second fixing hole and can be connected to different positions of the third adjustment hole.

[0013] Another aspect of this invention provides a chip mounter that uses the aforementioned electrical testing mechanism.

[0014] Beneficial effects: This application provides an electrical testing mechanism, comprising a mounting frame and a probe assembly. The mounting frame is used to connect to a pick-and-place machine and includes a horizontally extending positioning component. The positioning component includes a first positioning element and at least two second positioning elements respectively disposed on both sides of the first positioning element. The probe assembly is disposed on the mounting frame and includes a first probe assembly and a second probe assembly. The first and second probe assemblies are used to perform electrical testing on the workpiece, respectively. Both the first and second probe assemblies are provided with mating surfaces for engaging with the first positioning element, and each of the first and second probe assemblies also has positioning grooves corresponding to the second positioning elements on both sides. During assembly and disassembly, the connection between the second positioning elements and the positioning grooves ensures the approximate position of the first and second probe assemblies. Then, the mating surfaces of the two probe assemblies abut against the first positioning element to ensure that they are in the correct position. Even if only a single station is installed, the engagement of the first and second positioning elements with the probe assembly ensures the accuracy of the installation. That is, this electrical testing mechanism can be equipped with multiple electrical testing stations and can quickly and accurately disassemble or install the probe stations. The pick-and-place machine using this electrical testing mechanism can perform electrical tests on multiple workpieces simultaneously. It can also appropriately change the number of stations or replace the probe assembly to ensure the accuracy of electrical testing, thereby improving the overall efficiency of the pick-and-place machine. Attached Figure Description

[0015] To more clearly illustrate the technical solutions of the embodiments of this utility model, the drawings used in the embodiments will be briefly introduced below. It should be understood that the following drawings only show some embodiments of this utility model and should not be regarded as a limitation of the scope. For those skilled in the art, other related drawings can be obtained from these drawings without creative effort.

[0016] Figure 1 This is a three-dimensional structural schematic diagram of the electrical testing mechanism provided by this utility model; Figure 2 This is a disassembled structural diagram of the probe assembly of the electrical testing mechanism provided by this utility model; Figure 3 This is a cross-sectional structural diagram of the probe assembly of the electrical testing mechanism provided by this utility model; Figure 4 yes Figure 3 Enlarged diagram of point A in the middle.

[0017] In the figure: 1. Mounting bracket; 11. Base; 111. First adjustment hole; 112. First fixing hole; 12. Connecting plate; 121. Second adjustment hole; 13. Probe mounting base; 131. Third adjustment hole; 141. Second positioning component; 142. First positioning component; 21. Mounting plate assembly; 211. First mounting plate; 212. Second mounting plate; 213. Third mounting plate; 22. Test probe; 221. Receiving groove; 222. Limiting pin; 223. Mating surface. Detailed Implementation

[0018] To make the objectives, technical solutions, and advantages of the embodiments of this utility model clearer, the technical solutions of the embodiments of this utility model will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of this utility model, not all of them. Therefore, the following detailed description of the embodiments of this utility model provided in the accompanying drawings is not intended to limit the scope of the claimed utility model, but merely to represent selected embodiments of this utility model. All other embodiments obtained by those skilled in the art based on the embodiments of this utility model without inventive effort are within the scope of protection of this utility model.

[0019] like Figures 1-4 As shown, this embodiment provides an electrical testing mechanism, which includes a mounting frame 1 and a probe assembly. The mounting frame 1 is used to connect to a pick-and-place machine. The mounting frame 1 includes a horizontally extending positioning assembly, which includes a first positioning member 142 and at least two second positioning members 141 respectively disposed on both sides of the first positioning member 142. The probe assembly is disposed on the mounting frame 1. The probe assembly includes a first probe assembly and a second probe assembly. The first probe assembly and the second probe assembly are used to perform electrical testing on the workpiece respectively. Both the first probe assembly and the second probe assembly are provided with a mating surface 223 for engaging with the first positioning member 142. The first probe assembly and the second probe assembly are also each provided with a positioning groove corresponding to the second positioning members 141 on both sides respectively.

[0020] Understandably, during assembly and disassembly of the electrical testing mechanism, the cooperation between the second positioning component 141 and the positioning groove ensures that the first probe assembly and the second probe assembly are at the appropriate height. Then, by using the mating surface 223 of both components to abut against the first positioning component 142, their respective horizontal positions are ensured. After positioning, the probe assembly can be installed on the mounting bracket 1 using threaded connectors or other fixing parts. In other words, this electrical testing mechanism allows for quick and accurate disassembly or installation of the probe stations. Using this electrical testing mechanism, a pick-and-place machine can simultaneously perform electrical tests on multiple workpieces. The number of stations can be appropriately changed, or the probe assemblies can be replaced to ensure the accuracy of the electrical tests, thereby improving the overall efficiency of the pick-and-place machine. Understandably, Figure 3 , Figure 4 The first positioning member 142 is shown in cross-sectional view, therefore the end of the first positioning member 142 is not shown. The end of the first positioning member 142 has a larger cross-sectional area, and the mating surface 223 abuts against the end of the first positioning member 142.

[0021] Preferably, the second positioning member 141 is a cuboid structure with a horizontally positioned upper surface and a square positioning groove. The two work together to facilitate the horizontal movement of the probe assembly, allowing the probe assembly to abut and be positioned against the first positioning member 142. More preferably, the mating surfaces include a first surface and a second surface that are perpendicular to each other. Taking the probe assembly on the left as an example, the first surface is horizontally positioned, and the second surface is vertically positioned. The first surface abuts against the upper surface of the first positioning member 142 to further determine the height position of the probe assembly, preventing inaccurate height positioning due to wear of the second positioning member 141 and the positioning groove over long-term use. The second surface abuts against the left surface of the first positioning member 142, thereby achieving horizontal positioning of the probe assembly.

[0022] Furthermore, the first probe assembly and the second probe assembly include a test probe 22 and a mounting plate assembly 21. The mounting plate assembly 21 includes a first mounting plate 211, a second mounting plate 212, and a third mounting plate 213. The first mounting plate 211 and the second mounting plate 212 enclose a first groove, and the second mounting plate 212 and the third mounting plate 213 enclose a second groove. The test probe 22 is slidably connected to the first groove and the second groove. It is understood that the test probe 22 is a non-insulating component; contact with the workpiece will generate current, causing the workpiece to undergo an electrical reaction. The mounting plate assembly 21 is an insulating component, preventing the test probe 22 from electrically connecting to the mounting frame 1 or other parts, thereby avoiding inaccurate test results. The first mounting plate 211, the second mounting plate 212, and the third mounting plate 213 are sequentially connected to construct an insulating channel, namely the first groove and the second groove. The test probe 22, positioned in the first groove and the second groove, can simultaneously contact the workpiece for electrical testing. Simultaneously, this probe assembly configuration allows for the individual replacement of the test probe 22 or the mounting plate, achieving efficient utilization of production materials. Preferably, the first groove is a reference groove. The positions of the remaining grooves can be determined based on the spacing required for the probe electrical test, i.e., the position of the base groove. The positional accuracy can be guaranteed by processing based on this.

[0023] Preferably, the mounting plate is made of ceramic material. Preferably, the first mounting plate 211 is a single plate corresponding to two test probes 22, while the second mounting plate 212 and the third mounting plate 213 are separate plates, each corresponding to a single test probe 22. Furthermore, the first positioning member 142 and the second positioning member 141 are centrally symmetrically arranged, allowing the second mounting plate 212 and the third mounting plate 213 to use components of the same shape. Parts with identical shapes can be clamped and machined in one operation, greatly ensuring the machining accuracy of the parts. Using the machined parts as the mounting and positioning reference ensures the installation and positioning accuracy of the testing mechanism.

[0024] Furthermore, the tip of the test probe 22 extends elastically from the mounting plate assembly 21. When performing electrical tests on the workpiece, the lifting mechanism must press the workpiece down onto the upper surface of the test probe 22. Electrical connection can only be achieved when the workpiece and test probe 22 are in close contact. The elastic extension of the test probe 22 from the mounting plate assembly 21 ensures sufficient pressure between the test probe 22 and the workpiece after the workpiece is pressed down, preventing excessive downward pressure that could damage the workpiece or the test probe 22.

[0025] Furthermore, the probe assembly also includes a limiting pin 222. The test probe 22 is provided with a receiving groove 221, and an elastic element is disposed within the receiving groove 221. The upper surface of the limiting pin 222 engages and limits the bottom of the elastic element. The elastic element is located in the receiving groove 221, with its top end connected to the test probe 22 and its bottom end connected to the limiting pin 222. When the workpiece is pressed down, the test probe 22 causes the elastic element in the receiving groove 221 to contract. After the workpiece is lifted, the test probe 22 returns to its original position under the elastic force of the elastic element.

[0026] Furthermore, a limiting groove is provided on the upper surface of the limiting pin 222, and the two side walls of the limiting groove and the two side walls of the receiving groove 221 abut against and limit the elastic element around its perimeter. The elastic element is a compression spring. The limiting groove and the receiving groove 221 together limit the compression elasticity, ensuring that it will not move radially and fall out of the receiving groove 221 when the compression spring deforms, thereby ensuring the elastic extension and contraction function of the test probe 22.

[0027] Specifically, Figure 1The directions shown are the X-axis, Y-axis, and Z-axis. The probe assembly is movably connected to the pick-and-place machine along the X-axis, Y-axis, and Z-axis. In the pick-and-place machine, workpiece loading and unloading rely on the nozzle mounted on the cam, so the workpiece's movement trajectory is circular. In this embodiment, electrical testing of the workpiece essentially confirms its orientation; therefore, the positional relationship between the placement assembly and the nozzle's movement trajectory needs to be pre-adjusted. The X-axis is the tangent direction of the movement trajectory; adjusting the probe assembly along the X-axis ensures that the nozzle rotates the workpiece by a preset angle and is positioned directly above the electrical testing station, meaning the electrical testing station has the correct testing angle. The Y-axis is the radial direction of the movement trajectory; adjusting the probe assembly along the Y-axis ensures that the probe assembly is directly below the movement trajectory. The Z-axis is the height direction; adjusting the Z-axis adjusts the height of the probe assembly, facilitating contact testing between the workpiece and the probe assembly.

[0028] Furthermore, the mounting bracket 1 includes a base 11 and a first fixing member. The base 11 has a first adjustment hole 111 extending along the X-axis. The first fixing member can be fixed to the pick-and-place machine and connected to different positions of the first adjustment hole 111. The first fixing member is a bolt, and the first adjustment hole 111 is an oblong hole with a threaded hole on the pick-and-place machine. The bolt can be threaded into the threaded hole, and the lower surface of the bolt head can press against the upper surface of the first adjustment hole 111, thereby fixing the base 11 to the pick-and-place machine. After loosening the bolt, the base 11 gains freedom in the Y-axis direction. After the base 11 moves to the target position, tightening the bolt can achieve the positioning and fixation of the base 11. The movement of the base 11 can realize the position adjustment of the probe assembly in the Y-axis direction.

[0029] Furthermore, the mounting bracket 1 includes a connecting plate 12 and a second fixing member. The connecting plate 12 is provided with a second adjustment hole 121 extending along the Z-axis direction, and the base 11 is provided with a first fixing hole 112. The second fixing member passes through the first fixing hole 112 and can be connected to different positions of the second adjustment hole 121. The second fixing member is a bolt, and the first fixing hole 112 is a threaded hole. The bolt can be threaded into the threaded hole, and the bottom surface of the bolt head can press tightly against the outer surface of the second adjustment hole 121, thereby fixing the connecting plate 12 to the base 11. After loosening the bolt, the connecting plate 12 gains freedom in the Z-axis direction. After the connecting plate 12 moves to the target position, tightening the bolt can achieve the positioning and fixation of the connecting plate 12. The movement of the connecting plate 12 can realize the position adjustment of the probe assembly in the Z-axis direction.

[0030] Furthermore, the mounting bracket 1 also includes a probe mounting base 13 and a third fixing member. The probe mounting base 13 is provided with a second adjustment hole 121 extending along the Y-axis direction, and the connecting plate 12 is provided with a second fixing hole. The third fixing member passes through the second fixing hole and can be connected to different positions of the third adjustment hole 131. The third fixing member is a bolt, and the second fixing hole is a threaded hole. The bolt can be threaded into the threaded hole, and the bottom surface of the bolt head can press tightly against the top surface of the third adjustment hole 131, thereby fixing the mounting base to the connecting plate 12. After loosening the bolt, the mounting base gains freedom in the X-axis direction. After the mounting base moves to the target position, tightening the bolt can achieve the positioning and fixation of the mounting base. The movement of the mounting base can realize the position adjustment of the probe assembly in the X-axis direction.

[0031] Specifically, this embodiment also provides a pick-and-place machine that uses the above-mentioned electrical testing mechanism. It can perform electrical tests on multiple workpieces simultaneously, and can also appropriately change the number of stations or replace the probe assembly to ensure the accuracy of electrical testing, thereby improving the overall efficiency of the pick-and-place machine.

[0032] The above description is merely a preferred embodiment of this utility model and is not intended to limit the utility model. Various modifications and variations can be made to this utility model by those skilled in the art. Any modifications, equivalent substitutions, or improvements made within the spirit and principles of this utility model should be included within the protection scope of this utility model.

Claims

1. An electrical testing mechanism, characterized in that, include: Mounting bracket (1), which is used to connect to a pick and place machine, includes a horizontally extending positioning component, which includes a first positioning element (142) and at least two second positioning elements (141) respectively disposed on both sides of the first positioning element (142). The probe assembly is disposed on the mounting bracket (1). The probe assembly includes a first probe assembly and a second probe assembly. The first probe assembly and the second probe assembly are used to perform electrical testing on the workpiece respectively. The first probe assembly and the second probe assembly are each provided with a mating surface (223) for engaging with the first positioning member (142). The first probe assembly and the second probe assembly are also each provided with a positioning groove corresponding to the second positioning members (141) on both sides respectively.

2. The electrical testing mechanism according to claim 1, characterized in that, Both the first probe assembly and the second probe assembly include a test probe (22) and a mounting plate assembly (21). The mounting plate assembly (21) includes a first mounting plate (211), a second mounting plate (212), and a third mounting plate (213). The first mounting plate (211) and the second mounting plate (212) enclose a first groove, and the second mounting plate (212) and the third mounting plate (213) enclose a second groove. The test probe (22) is slidably connected to the first groove and the second groove.

3. The electrical testing mechanism according to claim 2, characterized in that, The tip of the test probe (22) extends elastically out of the mounting plate assembly (21).

4. The electrical testing mechanism according to claim 3, characterized in that, The probe assembly also includes a limiting pin (222), the test probe (22) is provided with a receiving groove (221), an elastic element is provided in the receiving groove (221), and the upper surface of the limiting pin (222) engages and limits the bottom of the elastic element.

5. The electrical testing mechanism according to claim 4, characterized in that, The upper surface of the limiting pin (222) is provided with a limiting groove, and the two side walls of the limiting groove and the two side walls of the receiving groove (221) abut against the periphery of the elastic member for limiting.

6. The electrical testing mechanism according to claim 1, characterized in that, The probe assembly is movably connected to the pick and place machine via the mounting bracket (1) along the X-axis, Y-axis and Z-axis directions.

7. The electrical testing mechanism according to claim 6, characterized in that, The mounting bracket (1) includes a base (11) and a first fixing member. The base (11) has a first adjustment hole (111) extending along the Y-axis. The first fixing member can be fixed to the pick and place machine and connected to different positions of the first adjustment hole (111).

8. The electrical testing mechanism according to claim 7, characterized in that, The mounting bracket (1) includes a connecting plate (12) and a second fixing member. The connecting plate (12) is provided with a second adjustment hole (121) extending along the Z-axis direction. The base (11) is provided with a first fixing hole (112). The second fixing member passes through the first fixing hole (112) and can be connected to different positions of the second adjustment hole (121).

9. The electrical testing mechanism according to claim 8, characterized in that, The mounting bracket (1) also includes a probe mounting base (13) and a third fixing member. The probe mounting base (13) is provided with a third adjustment hole (131) extending along the X-axis direction. The connecting plate (12) is provided with a second fixing hole. The third fixing member passes through the second fixing hole and can be connected to different positions of the third adjustment hole (131).

10. A pick-and-place machine, characterized in that, The chip mounter is equipped with an electrical testing mechanism as described in any one of claims 1-9.

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