Test the end of the probe barrel

CN309448242SActive Publication Date: 2025-08-19LEENO IND INC
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Patent Information

Application Number
CN202430607356.6
Authority / Receiving Office
CN · China
Patent Type
Designs(China)
Current Assignee / Owner
Filing Date
2024-09-24
Publication Date
2025-08-19
Estimated Expiration
2039-09-24

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Abstract

1. The name of this design product: the end of the test probe tube. 2. Purpose of this design product: The overall purpose of this application is: a test probe barrel of a test probe used to measure electrical characteristics (such as continuity or resistance of wiring on a wafer); the local purpose of this application is: the end of the test probe barrel. 3. The key design features of this design product lie in the shape shown by the solid line. 4. The picture or photo that best illustrates the design points: three-dimensional picture. 5. The solid line portion represents the portion for which protection is claimed, the dotted line represents the portion for which protection is not claimed, and the dot-dash line represents the boundary between the portion for which protection is claimed and the portion for which protection is not claimed.
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