Probe pin for wafer testing
CN309594189SActive Publication Date: 2025-11-11SIDEA SEMICON EQUIP (SHENZHEN) CO LTD
View PDF 0 Cites 0 Cited by
Patent Information
- Application Number
- CN202530117434.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2025-03-12
- Publication Date
- 2025-11-11
- Estimated Expiration
- 2040-03-12
Smart Images
Figure 000007_ABST
Abstract
1. The name of the design product: probe needle seat for wafer test. 2. The use of the design product: for semiconductor wafer test. 3. The design points of the design product: in shape. 4. The picture or photo that best shows the design points: design 1 perspective view 1. 5. Design 1 is designated as the basic design.
Need to check novelty before this filing date? Find Prior Art