Sample exchange magazine (for electron microscope)
CN309596047SActive Publication Date: 2025-11-11HEFEI GUOJING INSTR TECH CO LTD
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Patent Information
- Application Number
- CN202530155975.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2025-03-27
- Publication Date
- 2025-11-11
- Estimated Expiration
- 2040-03-27
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Figure 000008_ABST
Abstract
1. The name of the design product: sample exchange magazine (for electron microscope). 2. The use of the design product: sample exchange magazine for electron microscope, for safe storage, transfer and protection of experimental / production samples, and to ensure that the main cavity of the electron microscope is in a vacuum or clean state, achieving the functions of rapid vacuum pumping and detection. 3. The design points of the design product: in shape. 4. The picture or photo that best indicates the design points: perspective view 1.
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