Patterned board level defectometry apparatus
CN309947798SActive Publication Date: 2026-04-28TAIYUAN FENGHUA INFORMATION EQUIP
View PDF 0 Cites 0 Cited by
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- TAIYUAN FENGHUA INFORMATION EQUIP
- Filing Date
- 2025-09-29
- Publication Date
- 2026-04-28
Smart Images

Figure 000007_ABST
Abstract
1. The name of the design product: graphical board-level defect quantity detection equipment. 2. The use of the design product: for the detection of glass substrate through holes in advanced packaging. 3. The design points of the design product: in shape. 4. The picture or photo that best indicates the design points: perspective view 1.
Need to check novelty before this filing date? Find Prior Art