Electrical connector with a plugged-in test switch
Patent Information
- Application Number
- DE102025100436
- Authority / Receiving Office
- DE · DE
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2024-06-13
- Filing Date
- 2025-01-08
- Publication Date
- 2025-07-17
Smart Images

Figure 00000000_0000_ABST
Abstract
Description
[0001] This application claims the benefit of Indian Application No. 202441002377, filed January 12, 2024, entitled "Electrical Position Assurance Connector Having a Spring on Device," and U.S. Application No. 63 / 641,567, filed May 2, 2024, entitled "Electrical Connector Having a Plugged Test Switch," the subject matter of which is incorporated herein by reference in its entirety.
[0002] The subject matter discussed here relates generally to electrical connectors.
[0003] Communication systems include electrical connectors that mate together to electrically connect various components of the system. For example, a connector may be attached to a device, such as a printed circuit board, to mate with a connector that can be connected to a wire harness or another printed circuit board. The electrical connectors typically include locks to secure the electrical connectors after mating. However, if mated improperly, the locks can work loose, allowing the electrical connectors to accidentally separate from each other over time. To prevent such a situation, some electrical connectors incorporate Connector Position Assurance (CPA) devices designed to ensure proper locking of the electrical connectors.CPA devices are typically mechanical devices that are mechanically actuated during installation and provide visual and / or tactile feedback to the installer. However, there may be instances where the installer fails to properly verify the operation of the CPA devices.
[0004] Some common electrical connectors use electrically activated connector test systems that verify proper mating using electrical signals that pass through a test circuit. For example, the electrical connectors may include contacts for the final connection in the connector and header terminal block. These contacts are mated after the connector and header terminal block are fully mated, creating a test circuit when the connector and header terminal block are fully mated. Such systems increase the overall cost of the communication system because both electrical connectors must be redesigned to accommodate the additional contacts.
[0005] There is still a need for a cost-effective and reliable system for testing electrical connectors.
[0006] In one embodiment, an electrical connector is provided that includes a housing with walls that extends between a mating end and a terminal end. The mating end is configured to be connected to a mating electrical connector. The electrical connector includes contacts supported by the housing. Each contact extends between a mating end and a terminal end. The mating end of the contact is configured to be connected to a mating contact of the mating electrical connector. The electrical connector includes a securing element configured to be lockably coupled to a mating securing element of the mating electrical connector when the housing is fully mated to the mating electrical connector. The electrical connector includes a mated test switch coupled to the housing.The mated test switch includes a first test contact and a second test contact, both connected to the housing. The second test contact is configured to be physically separated from the first test contact before the housing is fully mated to the mating electrical connector. The second test contact is configured to engage the first test contact when the housing is fully mated to the mating electrical connector to send a test signal through the mated test switch indicating that the electrical connector is mated to the mating electrical connector.
[0007] The invention will now be described by way of example with reference to the accompanying figures: Fig. 1 is a perspective view of a communication system in accordance with an exemplary embodiment. Fig. 2 is a front perspective view of the pin header connector according to an exemplary embodiment. Fig. 3 is a side view of the pin header connector according to an exemplary embodiment. Fig. 4 is a perspective view of the plugged test switch according to an exemplary embodiment. Fig. 5 is a perspective view of a portion of the header connector showing the plugged test switch coupled to the header housing according to an exemplary embodiment. Fig. 6 is a front perspective view of the connector according to an exemplary embodiment. Fig. 7 shows one of the connector contacts according to an exemplary embodiment. Fig. 8 is a cross-sectional view of a portion of the communication system showing the connector connected to the header connector according to an exemplary embodiment. Fig. 9 is a cross-sectional view of a portion of the communication system according to an exemplary embodiment. Fig. 10 is a cross-sectional view of a portion of the communication system showing the plugged test switch in an open position according to an exemplary embodiment. Fig. 11 is a cross-sectional view of a portion of the communication system showing the plugged test switch in a closed position according to an exemplary embodiment.
[0008] Fig. 1 is a perspective view of a communication system 10 in accordance with an exemplary embodiment. The communication system 10 includes a first electrical connector 100 and a second electrical connector 200 configured to mate with the first electrical connector 100. The communication system 10 may include a plurality of electrical connectors 100 and / or a plurality of electrical connectors 200. In the illustrated embodiment, a plurality of the electrical connectors 200 are configured to mate with a single electrical connector 100. The electrical connectors 200 are mating electrical connectors for the first electrical connector 100.Similarly, the first electrical connector 100 is considered as a mating electrical connector for the second electrical connectors 200.
[0009] In an exemplary embodiment, the first electrical connector 100 is a pin header connector and may be referred to below as pin header connector 100. The pin header connector 100 is attached to a component, such as a host circuit board 20. However, in alternative embodiments, the component may also be a non-electrical component, such as a plate or wall of the device used to receive the pin header connector 100. In an exemplary embodiment, the pin header connector 100 is a board-mounted connector that is mounted on and electrically connected to the host circuit board 20. In the illustrated embodiment, the pin header connector 100 is a right-angle connector in which the mounting end is oriented perpendicular to the mated end. Other orientations are possible in alternative embodiments, such asa straight through connector, such as a vertical connector. In other embodiments, the header connector 100 is a cable connector provided at one end of one or more cables.
[0010] In an exemplary embodiment, the second electrical connector 200 is a plug-in connector and may be referred to below as connector 200. The connector 200 is configured to be plugged into a receptacle or socket of the header connector 100. In an exemplary embodiment, the connector 200 is a cable connector provided at one end of one or more cables 202. In the illustrated embodiment, the cables 202 extend from an end opposite the mating end of the connector 200. In other embodiments, the connector 200 may be a right-angle connector in which the cables 202 extend perpendicular to the mating end. In other various embodiments, the connector 200 may be a board-mounted connector configured for mounting on a printed circuit board.
[0011] In an exemplary embodiment, the communication system 10 includes a test system 50 that provides electrical signals to ensure the mating of the electrical connectors 100, 200. For example, the test system 50 provides a test signal to the communication system 10 when the electrical connectors 100, 200 are fully mated or when the electrical connectors 100, 200 are not mated. For example, when the electrical connectors 100, 200 are not mated, the test system 50 has an open circuit (or a closed circuit, depending on the arrangement of the circuit components). When the electrical connectors 100, 200 are fully mated, the mated test system 50 has a closed circuit that transmits the test signal.The electrical connectors 100, 200 are fully mated when all contacts of the electrical connectors 100, 200 are mated and the locking components of the electrical connectors 100, 200 are engaged. Before the locking components are engaged, the electrical connectors 100, 200 are considered unmated, even if the contacts of the electrical connectors 100, 200 are mated. Therefore, the test system 50 forms a connector position assurance (CPA) device for the communication system 10.
[0012] In an exemplary embodiment, the test system 50 includes a test switch 52 configured to open and close based on the relative positions of the electrical connectors 100, 200. In an exemplary embodiment, the mated test switch 52 is normally open. The mated test switch 52 is configured to be closed when the electrical connectors 100, 200 are fully mated. Alternatively, the mated test switch 52 is normally closed and configured to open when the electrical connectors 100, 200 are fully mated. In an exemplary embodiment, the components of the mated test switch 52 are part of the header connector 100. For example, no components of the mated test switch 52 are part of the connector 200.However, in alternative embodiments, all components of the plugged test switch 52 may be part of the connector 200, and none of the components of the plugged test switch 52 may be part of the header connector 100. By providing all components on either the header connector 100 or the connector 200, the need to redesign both electrical connectors 100, 200 is eliminated, thereby reducing the overall manufacturing cost for the communication system 10. Providing all components on either the header connector 100 or the connector 200 reduces the complexity of the system.By providing all components on either the header connector 100 or the connector 200, the need to match components at the mating interface between the electrical connectors 100, 200 is eliminated, which would increase the complexity and tolerances of the mating interfaces. In an exemplary embodiment, the mated test switch 52 is configured to connect to the fully mated electrical connector for actuating the mated test switch 52.For example, if the test switch 52 is part of the header connector 100, one or more of the components of the associated test switch 52 interface with the connector 200 when the connector 200 is fully mated to the header connector 100 to actuate and close the associated test switch 52 to transmit the test signal only after the connector 200 is fully mated to the header connector 100. .
[0013] Fig. 2 is a front perspective view of the pin header connector 100 according to an exemplary embodiment. Fig. 3 is a side view of the pin header connector 100 in accordance with an exemplary embodiment. In an exemplary embodiment, the pin header connector 100 includes the associated test switch 52. In various embodiments, the pin header connector 100 may include multiple plugged test switches 52, e.g., to enable plugged connections with multi-plug connectors 200 (shown in Fig. 1) to ensure.
[0014] The header connector 100 includes a header housing 110 that holds a plurality of pin contacts 150. The header connector 100 includes a header securing element (shown in the figure) that serves to securely connect the connector 200 to the header connector 100. In an exemplary embodiment, the header securing element 140 is a latch and may be referred to below as latch 140. The latch 140 includes a locking element 142, such as a detent. In alternative embodiments, other types of securing elements may be used other than a latch, such as a fastener, a clip, or another type of securing element.
[0015] In an exemplary embodiment, the header housing 110 is made of a dielectric material. For example, the header housing 110 may be molded from a plastic material. The header housing 110 includes a plurality of walls 112 that form a cavity 114 that receives the connector 200. The header housing 110 extends between a mating end 116 and a terminal end 118. The connector 200 is configured to be mated to the mating end 116. The cavity 114 is open at the mating end 116 to receive the connector 200. In an exemplary embodiment, the terminal end 118 is configured to be bonded to the host circuit board 20 (in Fig. 1). In alternative embodiments, the terminal end 118 is configured to be connected to one or more cables.
[0016] The header housing 110 includes a front side 120 and a back side 122. The header housing 110 includes a top side 124 and a bottom side 126. The header housing 110 includes sides 128 between the top side 124 and the bottom side 126. In an exemplary embodiment, the mating end 116 is provided on the front side 120. In alternative embodiments, other locations are also possible, e.g., the top side 124. The cavity 114 is open at the front side 120 to receive the connector 200. In the illustrated embodiment, the latch 140 is provided on the top side 124. For example, the latch 140 is located along an inner surface of the top wall on the top side 124 of the header housing 110. Other locations are possible in alternative embodiments. In an exemplary embodiment, the terminal end 118 is provided on the bottom side 126.In alternative embodiments, other locations are also possible, such as the back side 122. In an exemplary embodiment, the header housing 110 includes interior walls, such as dividers, that divide the cavity 114 into various chambers, each configured to receive a corresponding connector 200. The dividers may extend between the top side 124 and the bottom side 126. In an exemplary embodiment, the header housing 110 includes guiding features 130 to guide the insertion of the connector 200 into the cavity 114. The guiding features 130 may define keying features for keyed mating with certain connectors 200.
[0017] The latch 140 extends from one of the walls 112 of the header housing 110, such as the top wall. Optionally, the latch 140 may be an integral part of the header housing 110, such as being molded with the header housing 110. In various embodiments, the latching feature 142 is a fixed latching feature having a ramp surface 144 and a detent surface 146. In alternative embodiments, the latching feature 142 may be a deflectable latch, such as a deflectable latch arm
[0018] The header contacts 150 are connected to the header housing 110. In one exemplary embodiment, the contacts 150 are connected to one or more of the walls 112 of the header housing 110. For example, the contacts 150 may be coupled to the backplane at the rear 122 of the header housing 110. In one exemplary embodiment, the contacts 150 are stamped and formed contacts. Each contact 150 extends between a mating end 152 and a terminal end 154. The mating end 152 is configured to be connected to the connector 200. The terminal end 154 is configured to be electrically coupled to the host circuit board 20. In one exemplary embodiment, the contact 150 is a right-angled contact with the mating end 152 perpendicular to the terminal end 154. For example, the plug end 152 may extend horizontally and the terminal end 154 may extend vertically.Other orientations are possible in alternative embodiments. The mating end 152 extends through the back wall into the cavity 114 for mating with the connector 200. Optionally, the contact 150 may include a pin on the mating end 152. In other embodiments, the contact 150 may include a socket or other type of mating end. The terminal end 154 extends through the bottom wall of the header housing 110 for connection to the host circuit board 20. The bottom wall may form a contact organizer that serves to maintain the relative positions of the terminal ends 154 of the contacts 150. Optionally, the terminal end 154 may include a solder tail. In other embodiments, the contact 150 may include a compliant pin or other type of terminal end. The contacts 150 may be arranged in one or more rows and one or more columns.The contacts 150 may include signal contacts and / or ground contacts and / or power contacts.
[0019] With additional reference to the Fig. 4 and Fig. 5 is Fig. 4 a perspective view of the plugged test switch 52 and Fig. 5 is a perspective view of a portion of the header connector 100 showing the mated test switch 52 connected to the header housing 110. The mated test system 50 includes the mated test switch 52. The mated test switch 52 is part of an associated test circuit 54 that transmits electrical signals to the communication system 10 and ensures the connection of the electrical connectors 100, 200. For example, the test system 50 provides a test signal via the test circuit 54 when the electrical connectors 100, 200 are fully mated or when the electrical connectors 100, 200 are unmated. The associated test circuit 54 may be formed by one or more conductors of the host circuit board 20 and / or one or more electrical components on the host circuit board 20, such as a microprocessor configured to process the test signal.The plugged test switch 52 is connected to the pin header housing 110. For example, the plugged test switch 52 may be connected to the back wall and / or the top wall of the pin header housing 110.
[0020] In an exemplary embodiment, the mated test switch 52 includes a first test contact 60 and a second test contact 70, both connected to the header housing 110. The second test contact 70 is configured to be physically separated from the first test contact 60 before the electrical connectors 100, 200 are fully mated. For example, the mated test circuit 54 is open when the test contacts 60, 70 are physically separated or open. The second test contact 70 is configured to engage the first test contact 60 when the connector 200 is fully mated to the header connector 100, e.g., when the housings are fully mated and / or when the contacts are fully mated and / or when the latches are fully engaged. For example, the test circuit 54 is closed when the test contacts 60, 70 are physically mated.The test circuit 54 sends the test signal through the test switch 52, indicating that the electrical connectors 100, 200 are connected. Upon receiving the test signal, a visual or audible indicator may be provided to indicate to the installer that the electrical connectors 100, 200 are fully plugged in. The connection verification circuit may function in reverse, being normally closed and configured to open when the electrical connectors are fully connected.
[0021] In one exemplary embodiment, the first test contact 60 is a stamped and formed contact. In other embodiments, the first test contact 60 may be a plated plastic conductor, e.g., a plated portion of the header housing 110 that forms a circuit. The first test contact 60 extends between a mating end 62 and a terminal end 64. The mating end 62 is configured to mate with the second test contact 70 and / or the connector 200. In one exemplary embodiment, the first test contact 60 includes a mating portion 66 on the mating end 62 that is configured to be connected to the second test contact 70. The terminal end 64 is configured to be electrically coupled to the host circuit board 20. In one exemplary embodiment, the first test contact 60 is a right-angle contact. The mating end 62 extends through the backplane into the cavity 114.The terminal end 64 extends through the bottom wall of the header housing 110 for connection to the host circuit board 20.
[0022] In one exemplary embodiment, the second test contact 70 is a stamped and formed contact. In other embodiments, the second test contact 70 may be a plated plastic conductor, e.g., a plated portion of the header housing 110 that forms a circuit. The second test contact 70 extends between a mating end 72 and a terminal end 74. The mating end 72 is configured to mate with the mating portion 66 of the first test contact 60 and / or the connector 200. In one exemplary embodiment, the second test contact 70 includes a connection tab 76 on the mating end 72 that is configured to interface with the first test contact 60. The terminal end 74 is configured to electrically couple to the host circuit board 20. In one exemplary embodiment, the second test contact 70 is a right-angle contact.The plug end 72 extends through the back wall into the cavity 114. The terminal end 74 extends through the bottom wall of the header housing 110 for connection to the host circuit board 20.
[0023] Fig. 6 is a front perspective view of the connector 200 according to an exemplary embodiment. The connector 200 includes a plug housing 210 that holds a plurality of plug contacts 250 (in Fig. 7). The connector 200 includes a plug retention element 240 that serves to securely connect the connector 200 to the header connector 100. In an exemplary embodiment, the header retention element 240 is a latch and is referred to below as latch 240. The latch 240 includes a locking element 242, such as a detent. In alternative embodiments, other types of retention elements may be used other than a latch, such as a closure, a clip, or another type of retention element.
[0024] In an exemplary embodiment, the connector housing 210 is made of a dielectric material. For example, the connector housing 210 may be molded from a plastic. The connector housing 210 includes a plurality of walls 212. The connector housing 210 includes contact cavities 214 that receive the corresponding connector contacts 250. The connector housing 210 extends between a mating end 216 and a terminal end 218. The mating end 216 is configured to fit into the cavity 114 of the header housing 110 (in Fig. 2). In an exemplary embodiment, the terminal end 218 is a cable end, with the cables 202 extending from the terminal end 218. In alternative embodiments, the terminal end 218 is configured to be mounted to a printed circuit board.
[0025] The connector housing 210 includes a front side 220 and a back side 222. The connector housing 210 includes a top side 224 and a bottom side 226. The connector housing 210 includes sides 228 between the top side 224 and the bottom side 226. In an exemplary embodiment, the mating end 216 is provided on the front side 220. In alternative embodiments, other locations are also possible, e.g., the top side 224. The contact cavities 214 are open on the front side 220 to receive the header contacts 150. In an exemplary embodiment, the terminal end 218 is provided on the back side 222. However, the terminal end 218 can also be located in other locations, e.g., on the bottom side 226. In the illustrated embodiment, the latch 240 is provided on the top side 224. For example, the latch 240 is located along an outer surface of the top wall on the top side 224 of the connector housing 210.Other positions are possible in alternative embodiments. In an exemplary embodiment, the connector housing 210 includes guide features 230 for guiding the mating of the connector 200 with the header connector 100. The guide features 230 may define keying features for a keyed connection with the connector housing 110.
[0026] The lock 240 extends from one of the walls 212 of the connector housing 210, such as the top wall. Optionally, the lock 240 may be an integral part of the connector housing 210, such as being molded with the connector housing 210. In various embodiments, the locking feature 242 includes a deflectable locking arm 244 having a locking opening 245 that receives the locking feature 142 of the header connector 100 to lockably connect the connector 200 to the header connector 100. In an exemplary embodiment, the locking arm 244 includes a ramp 246 configured to engage the header connector 100, for example, to deflect the locking arm 244. In the illustrated embodiment, the latch 240 includes an actuator 248, such as a push tab, used to release the latch 240.In an exemplary embodiment, the latch 240 is configured to engage with the plugged test switch 52 (in . Fig. 4) to activate the mated test switch 52. For example, the latch 240 may press against the second test contact 70 to engage the second test contact 70 with the first test contact 60 to close the mated test circuit 54. In an exemplary embodiment, the latch 240 is configured to engage the mated test switch 52 only when the latch 240 is lockably coupled to the latch 140 of the header connector 100, for example, when the locking member 142 is received in the locking opening 245.
[0027] With additional reference to Fig. 7, which shows one of the plug contacts 250 according to an exemplary embodiment. In an exemplary embodiment, the contacts 250 are configured to be connected to the cables 202, e.g., by being crimped onto the ends of the cables 202. The contacts 250 are configured to be received in the contact channels 214. Each plug contact 250 extends between a plug end 252 and a terminal end 254. The plug end 252 is configured to be connected to the corresponding pin header contact 150. In the illustrated embodiment, the plug end 252 comprises a socket; however, in alternative embodiments, other types of contacts may be provided, such as a pin, a blade, a cantilever, or another type of contact. The terminal end 254 is configured to be electrically connected to the cable 202.For example, the terminal end 254 may include a crimp barrel configured to be crimped to the cable 202.
[0028] Fig. 8 is a sectional view of a portion of the communication system 10 showing the connector 200 connected to the header connector 100. Fig. 9 is a cross-sectional view of a portion of the communication system 10. Portions of the connector 200 are removed to illustrate the interface with the header connector 100.
[0029] In an exemplary embodiment, the header contacts 150 are connected to the back and bottom walls of the header housing 110. The mating ends 152 extend into the cavity 114 to connect to the connector 200. The terminal ends 154 extend through the contact organizer on the bottom wall for connection to the host circuit board 20. The contacts 150 may include signal contacts, ground contacts, and / or power contacts.
[0030] In an exemplary embodiment, the first test contact 60 and the second test contact 70 are both connected to the header housing 110. The terminal ends 64, 74 extend through the bottom wall contact organizer for connection to the host circuit board 20. The mating ends 62, 72 extend through the back wall of the header housing 110 into the cavity 114 to contact the connector 200 to verify the connection of the connector 200 to the header connector 100. In the illustrated embodiment, the mating ends 62, 72 are located at the top of the cavity 114, such as along the top wall of the header housing 110. In an exemplary embodiment, the connecting tab 76 of the second test contact 70 is configured to interface with the connector 200, such as the latch 240 of the connector 200.The latch 240 is used to push or move the connecting tab 76 into a closed position, to physically engage the mating portion 66 of the first test contact 60, to close the mated test circuit 54, to send the test signal indicating that the electrical connectors 100, 200 are fully mated, and / or to send a signal when the electrical connectors 100, 200 are disconnected. In an exemplary embodiment, the second test contact 70 is configured to engage the first test contact 60 only after the locking element 242 of the plug latch 240 is lockably coupled to the locking element 142 of the header latch 140.
[0031] During mating, the connector 200 is inserted into the cavity 114 of the header housing 110, and the plug lock 240 is lockably coupled to the header lock 140 to secure the connector 200 to the header connector 100. The locks 140, 240 are lockably coupled to each other when the connector 200 is fully mated to the header connector 100. Prior to full mating, the locks 140, 240 are unlocked. In an exemplary embodiment, the plug lock 240 is deflectable and movable between a deflected position and a released position. For example, during initial loading of the connector 200 into the cavity 114 of the header housing 110, the connector latch 240 may be pushed downward toward the top wall of the connector housing 210 into the deflected position.For example, the ramp surface 144 of the header lock 140 may engage the locking arm 244 of the plug lock 240 to urge the locking arm 244 downward. In the deflected position, the plug lock 240 does not actuate or close the associated calibration switch. Once the locking opening 245 clears the locking member 142, the plug lock 240 is released and moved to a locked position lockably connected to the header lock 140. When the locking arm 244 is released, the plug lock 240 is free to move upward to the released position (. Fig. 9). In the released position, the connector latch 240 engages the second test contact 70 to move the second test contact 70 to the closed position. For example, the ramp 246 engages the connecting tab 76 to push the connecting tab 76 upward into the closed position to physically engage the portion 66 of the first test contact 60.
[0032] Fig. 10 is a cross-sectional view of a portion of the communication system 10 showing the plugged test switch 52 in an open position. Fig. Figure 11 is a cross-sectional view of a portion of the communication system 10 and shows the plugged test switch 52 in a closed position. The second test contact 70 is physically separated from the first test contact 60 in the open position ( Fig. 10). The second test contact 70 engages the first test contact 60 in the closed position ( Fig.11). When the test circuit 54 is closed, the test signal is configured to be transmitted through the test switch 52, indicating that the electrical connectors 100, 200 are connected to each other.
[0033] The second test contact 70 is configured to be physically separated from the first test contact 60 before the electrical connectors 100, 200 are fully mated. For example, the associated test circuit 54 is open when the test contacts 60, 70 are physically separated or open. The second test contact 70 is configured to engage the first test contact 60 when the connector 200 is fully mated to the header connector 100, for example, when the housings 110, 210 are fully mated and / or when the contacts 150, 250 are fully mated and / or when the latches 140, 240 are fully engaged. In an exemplary embodiment, the connector latch 240 is used to actuate or close the second test contact 70.For example, the connector latch 240 pushes the second test contact 70 upward to close the mated test circuit 54 by physically contacting the test contacts 60, 70. However, in alternative embodiments, other parts of the connector 200 may cooperate with the second test contact 70 to actuate or move the second test contact 70. For example, a portion of the housing may engage the second test contact 70. A projection, actuator, tab, or the like extending from the housing may engage the second test contact 70. A connector position assurance (CPA) component may engage the second test contact 70. The test circuit sends the test signal through the test switch, indicating that the electrical connectors 100, 200 are connected to each other.When the test signal is received, a visual or audible indication may be provided to indicate to the installer that the electrical connectors 100, 200 are fully mated. In alternative embodiments, e.g., when the test switch 52 is normally closed rather than normally open, the connector lock 240 may be used to separate the test contacts 60, 70 when they are fully mated, opening the test circuit 54 and indicating the mated state of the electrical connectors 100, 200. QUOTES CONTAINED IN THE DESCRIPTION
[0000] This list of documents submitted by the applicant was generated automatically and is included solely for the convenience of the reader. This list is not part of the German patent or utility model application. The DPMA assumes no liability for any errors or omissions. Cited patent literature
[0000] US 202441002377
[0001] US 63 / 641,567
[0001]
Claims
[1] An electrical connector (100) comprising: a housing (110) having walls (112) extending between a plug end (116) and a terminal end (118), the plug end configured to be connected to a mating electrical connector; Contacts (150) held by the housing, each contact extending between a plug end (152) and a terminal end (154), the plug end of the contact being configured to be connected to a mating contact of the mating electrical connector; a securing element (140) configured to be securely coupled to a counter-securing element of the mating electrical connector when the housing is fully connected to the mating electrical connector; and a mated test switch (52) coupled to the housing, the mated test switch comprising a first test contact (60) and a second test contact (70), both coupled to the housing, the second test contact configured to be physically separated from the first test contact before the housing is fully connected to the mating electrical connector, the second test contact configured to engage the first test contact when the housing is fully connected to the mating electrical connector to send a test signal through the mated test switch indicating that the electrical connector is connected to the mating electrical connector. [2] The electrical connector (100) of claim 1, wherein the second test contact (70) is movable between an open position and a closed position, the second test contact being configured to be physically separated from the first test contact (60) in the open position, the second test contact being configured to engage the first test contact in the closed position to transmit the test signal through the mated test switch (52). [3] The electrical connector (100) of claim 2, wherein the plugged test switch (52) in the closed position forms a plugged test circuit (54) to transmit the test signal. [4] The electrical connector (100) of claim 1, wherein the second test contact (70) is configured to be moved into contact with the first test contact (60) by interference with the mating electrical connector. [5] The electrical connector (100) of claim 1, wherein the walls (112) of the housing (110) define a cavity (114) configured to receive the mating electrical connector, the first test contact (60) and the second test contact (70) extending into the cavity to engage the mating electrical connector. [6] The electrical connector (100) of claim 1, wherein the first test contact (60) includes a plug portion (66), wherein the second test contact (70) includes a connecting tab (76) configured to engage the plug portion of the first test contact to electrically connect the first and second test contacts to transmit the test signal through the plugged test switch (52). [7] The electrical connector (100) of claim 1, wherein the second test contact (70) is configured to engage the first test contact (60) only after the securing element (140) is securely coupled to the counter-securing element of the mating electrical connector. [8] The electrical connector (100) of claim 1, wherein the second test contact (70) is configured to cooperate with the counter-locking element (140) of the mating electrical connector when the counter-locking element is securely coupled to the locking element to engage the first test contact (60). [9] The electrical connector (100) of claim 1, wherein the first and second test contacts (60, 70) are stamped and formed contacts. [10] The electrical connector (100) of claim 1, wherein the first and second test contacts (60, 70) comprise plated plastic conductors.
Citation Information
Patent Citations
US-ANMELDUNGNR.63/641,567
202441002377