METHOD FOR MONITORING EMPTYING

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of OLED, and in particular, to an evaporation monitoring method.BACKGROUND

[0002] Organic light-emitting diode (OLED) display technology is a novel display and illumination technology. In recent years, investment for OLED devices has gradually increased, and thus the OLED devices have become a hot spot in the industry.

[0003] In a manufacturing process of an OLED device, an organic material layer is formed by vacuum evaporation regularly using an evaporation mask. The evaporation mask usually includes a sheet mask having a pattern. During the vacuum evaporation, an organic material (heated and sublimated) passes through the pattern and then reaches a substrate to form an organic material layer on the substrate.

[0004] US patent No. 9 224 957 B1 discloses a method used for measuring an offset of a sub-pixel in an OLED manufacturing process, including depositing OLED material onto a display unit in a substrate through a hollow portion of a mask, the display unit including an effective region and a peripheral measuring region at periphery of the effective region, the OLED material forming a plurality of effective sub-pixels within the effective region and forming a plurality of dummy sub-pixels within the peripheral measuring region; and using UV light to excite at least a portion of the dummy sub-pixels of the OLED material to emit light, and measuring the offset of the dummy sub-pixel with respect to a predetermined position of a corresponding light emitting unit located on the substrate.

[0005] Japanese patent application 2013 211139 A discloses a film forming apparatus capable of providing a highly accurate deposition when the substrate becomes larger, in which inspection areas for detecting a positional deviation is provided in a non-pixel area provided outside the four corners of the four pixel areas. The inspection region is provided with an inspection vapor deposition hole as an inspection vapor deposition opening. A frame in the form of metal film is provided on the substrate corresponding to the inspection area and is used as a reference position, and the deviation from the metal film is used as the position deviation to obtain the correction amount.

[0006] Japanese patent application 2009 158328 A discloses an organic EL device comprising the pixel area and the inspection area. The inspection area is used for inspecting the positional deviation between the photomask and the organic EL device and is provided outside the pixel area (around the pixel area). The inspection portions of the inspection area is used for inspecting the deposition position of the light emitting layer materials. In the inspection portions, a first frame and a second frame, patterned with metal film, are formed to indicate the degree of positional deviation.

[0007] US patent application 2008 / 284690 A1 discloses an organic light emitting display device. The organic light emitting display device comprises a substrate, a displaying area located on the substrate, the displaying area comprising a plurality of sub pixels, each of which has an emission area; and a dummy area located on an area of the substrate other than the displaying area, the dummy area comprising a plurality of dummy patterns, wherein the dummy pattern contains the same material as that of the emission area.

[0008] The evaporation effect is very important to the manufacture of OLED devices. In the prior art, the evaporation effect (mainly including evaporation offset) cannot be monitored in time, each evaporation result is only spot checked through manual inspection using microscopes, and this method is time-consuming and labor-consuming, and fails to monitor the evaporation process all the time. Therefore, it has been a problem to be solved by those skilled in the art to provide a relatively real-time monitoring method of evaporation.SUMMARY

[0009] It is an object of the present application to provide an evaporation monitoring method to solve the problem that the evaporation process cannot be monitored in time in the prior art.

[0010] The present application provides an evaporation monitoring method, including: providing an evaporation mask, the evaporation mask comprising a first functional region and a first peripheral region disposed outside of the first functional region, the first functional region defining at least one first opening, and the first peripheral region defining at least one second opening; providing an OLED panel, the OLED panel comprising a second functional region and a second peripheral region disposed outside of the second functional region, the second peripheral region having an observation layer formed thereon; forming a functional layer and at least one monitoring structure on the second functional region and the observation layer of the OLED panel respectively using the evaporation mask; acquiring an actual center of the at least one monitoring structure on the OLED panel; and comparing the actual center of the monitoring structure with a theoretical center of the monitoring structure to obtain an evaporation effect of the at least one first opening of the evaporation mask. The observation layer is made of a reflective material and has a color different from a color of the monitoring structure to ease a contour of the monitoring structure being captured by an image capturing device. The observation layer covers an entirety of the second peripheral region. The actual center of the at least one monitoring structure is acquired in the following way: capturing the contour of the at least one monitoring structure by a camera or a video and calculating the center of the at least one monitoring structure according to the captured monitoring structures.

[0011] Alternatively, in the evaporation monitoring method, when the actual centers of the monitoring structures and the theoretical centers of the monitoring structures are at the same positions, the evaporation through the at least one first opening has no offset; and when the actual centers of the monitoring structures and the theoretical centers of the monitoring structures are at different positions, the evaporation through the at least one first opening has offset.

[0012] Alternatively, in the evaporation monitoring method, the comparison of actual centers and theoretical centers of the monitoring structures is achieved by comparing coordinates of the two.

[0013] In the evaporation monitoring method provided by the present application, the monitoring structure can be formed on the observation layer of the OLED panel by evaporation through the second opening of the evaporation mask, and then the evaporation effect of the first opening of the evaporation mask can be monitored through the monitoring structure, so that the evaporation effect is able to be monitored in time to achieve real-time on-line monitoring.BRIEF DESCRIPTION OF THE DRAWINGS

[0014] Figure 1 is a schematic top view of an evaporation mask according to Embodiment 1, which forms part of the claimed invention; Figure 2a is a schematic top view of an OLED panel according to Embodiment 1, which forms part of the claimed invention; Figure 2b is a schematic front view of the OLED panel according to Embodiment 1, which forms part of the claimed invention; Figure 3a is a schematic top view of a sheet mask in an evaporation mask according to Embodiment 2; which does not form part of the claimed invention; Figure 3b is a schematic top view of a support strip in an evaporation mask according to Embodiment 2; which does not form part of the claimed invention; Figure 4 is a schematic top view of an OLED panel according to Embodiment 2; which does not form part of the claimed invention.

[0015] In the figures, 100-evaporation mask; 110-sheet mask; 110a-first functional region; 110b-first peripheral region; 111-first opening; 112-second opening; L1-first edge; L2-second edge; 200-OLED panel; 200a-second functional region; 200b-second peripheral region; 210-observation layer; 220-monitoring structure; 230-functional layer; 300-evaporation mask; 310-sheet mask; 310a-first functional region; 310b-first peripheral region; 311-first opening; 312-second opening; 320-support strip; 321-third opening; L3-first edge; L4-second edge; 400-OLED panel; 400a-second functional region; 400b-second peripheral region; 410-observation layer; 420-monitoring structure; and 430-functional layer. DETAILED DESCRIPTION OF EMBODIMENTS

[0016] The evaporation mask, the OLED panel and system, and the evaporation monitoring method proposed in the present application will be described in greater detail below with reference to the drawings and specific embodiments. Advantages and features of the present application will become more apparent from the following description and claims. It should be noted that the drawings are presented in a very simplified form not precisely drawn to scale with the only purpose to facilitate convenience and clarity in explaining the embodiments of the present application.Embodiment 1 (i.e. forming part of the claimed invention)

[0017] Please refer to Figure 1, which is a structure diagram of an evaporation mask according to Embodiment 1 of the present application. As shown in Figure 1, in the embodiment of the present application, the evaporation mask 100 includes a first functional region 110a and a first peripheral region 110b disposed outside of the first functional region 110a, the first functional region 110a defining first openings 111 for forming a functional layer by evaporation, and the first peripheral region 110b defining second openings 112 for monitoring an evaporation effect of the first openings 111. In the embodiment of the present application, the functional layer may be any material layer having a certain function and formed by an evaporation process. For example, the functional layer may be an organic material layer having certain capacity of transporting electrons and holes, or a metal layer having certain electrical conductivity, or a dielectric layer having certain insulating property, etc. In the embodiment of the present application, the first functional region 110a may be used for forming a display area of an OLED panel, and the first peripheral region 110b may be used for forming a non-display area of the OLED panel.

[0018] Preferably, the shape of the second openings 112 is substantially same to that of the first openings 111. For example, if the first openings 111 are square, the second openings 112 are also square. For another example, if the first openings 111 are circular, the second openings 112 are also circular. Further, the size of the second openings 112 is substantially same to that of the first openings 111. For example, when the first openings 111 and the second openings 112 are both square, side lengths of the both are equal. Thus, when the evaporation effect of the first openings 111 is monitored through the second openings 112, the monitoring result will be more accurate.

[0019] Still referring to Figure 1, further, the first peripheral region 110b has a first edge L1 and a second edge L2, opposite to the first edge L1, on each side, wherein the first edge L1 is closer to the first functional region 110a than the second edge L2, and the second openings 112 are closer to the first edge L1 than to the second edge L2. Here, the second openings 112 are arranged as close as possible to the first functional region 110a, enabling the evaporation effect of the second openings 112 to be substantially consistent with the evaporation effect of the first openings 111, thus further improving the accuracy of the monitoring result.

[0020] In the embodiment of the present application, the evaporation mask 100 includes a sheet mask 110 including a first functional region 110a and a first peripheral region 110b disposed outside of the first functional region 110a, and the first openings 111 and the second openings 112 are both located on the sheet mask 110. Further, the evaporation mask 100 further includes a support strip (not shown), and the sheet mask 110 is fixed on the support strip. In the embodiment of the present application, the support strip exposes all the first openings 111 and all the second openings 112.

[0021] In the embodiment of the present application, the sheet mask 110 is rectangular. Further, the first functional region 110a is also rectangular, and the first peripheral region 110b is a rectangular ring. A plurality of second openings 112 are provided, being distributed in the first peripheral region 110b equably. For example, if eight second openings 112 are provided, two second openings 112 can be uniformly arranged on a strip region of each side of the first peripheral region 110b. The accuracy of the monitoring result is able to be further improved by monitoring the evaporation effect of the first openings 111 through the plurality of second openings 112.

[0022] In the embodiment of the present application, the first openings 111 are used for evaporating monochrome pixels, and the plurality of second openings 112 are used for monitoring the evaporation effect of pixels having the same color as the monochrome pixels evaporated through the first openings 111. For example, the first openings 111 are used for evaporating red pixels, and the plurality of second openings 112 are all used for monitoring the evaporation effect of the red pixels. For another example, the first openings 111 are used for evaporating blue pixels, and the plurality of second openings 112 are all used for monitoring the evaporation effect of the blue pixels.

[0023] In the embodiment of the present application, different evaporation masks 100 are often used for evaporating pixels of different colors. That is, when red pixels are evaporated, one evaporation mask 100 is used with the second openings 112 thereon being used for monitoring the evaporation effect of the red pixels; and when blue pixels are evaporated, another evaporation mask 100 is used with the second openings 112 thereon being used for monitoring the evaporation effect of the blue pixels. In this case, higher monitoring accuracy can be ensured, at the same time, the manufacturing cost of the evaporation mask 100 is increased.

[0024] Correspondingly, the present embodiment further provides an OLED panel. Specifically, please refer to Figure 2a and Figure 2b, wherein Figure 2a is a schematic top view of an OLED panel according to Embodiment 1 of the present application, and Figure 2b is a schematic front view of the OLED panel according to Embodiment 1 of the present application. As shown in Figure 2a and Figure 2b, the OLED panel 200 includes a second functional region 200a and a second peripheral region 200b disposed outside of the second functional region 200a, the second peripheral region 200b having an observation layer 210 formed thereon. Specifically, the OLED panel 200 may include a glass substrate including a second functional region and a second peripheral region, and the observation layer 210 may be formed on the glass substrate of the second peripheral region. In the embodiment of the present application, the second functional region 200a may be a display area, and the second peripheral region 200b may be a non-display area.

[0025] Please refer to Figure 1, Figure 2a and Figure 2b, the present embodiment further provides an OLED panel system including the evaporation mask 100 and the OLED panel 200, wherein the evaporation mask 100 is located below the OLED panel 200, the first openings 111 of the evaporation mask 100 are used for forming a functional layer 230 on the second functional area 200a of the OLED panel 200 by evaporation, the second openings 112 of the evaporation mask 100 are used for forming monitoring structures 220 on the observation layer 210 of the OLED panel 200 by evaporation, and the monitoring structures 220 are used for monitoring the evaporation effect of the first openings 111.

[0026] In the claimed invention, the monitoring structures 220 can be easily observed through the observation layer 210. The material of the observation layer 210 is a reflective material, thus enabling highlighting of the monitoring structures 220 to make the monitoring structures 220 easily to be observed, in particular, easily to be captured by an optical device. The color of the observation layer 210 is greatly different from that of the monitoring structures 220, such that the monitoring structures 220 are easily captured by an optical device.

[0027] When the monitoring structures 220 are formed on the observation layer 210 of the OLED panel 200 by evaporation through the second openings 112 of the evaporation mask 100, (the contour of) the monitoring structures 220 are able to be easily captured, such that the evaporation effect of the first openings 111 is easily judged according to the monitoring structures 220.

[0028] Preferably, the thickness of the observation layer 210 is from 100 nm to 200 nm. For example, the thickness of the observation layer 210 may be 100 nm, 110 nm, 130 nm, 150 nm, 170 nm, 185 nm, or 200 nm, etc. At this thickness, the shape of the monitoring structures 220 is able to be captured more easily. Further, the observation layer 210 may be made of silver (Ag), indium tin oxide (ITO), etc.

[0029] Still referring to Figure 2a and Figure 2b, in the claimed invention, the observation layer 210 covers the entire second peripheral region 200b. In other embodiments of the present application, not forming part of the claimed invention, the observation layer 210 may cover only a part of the second peripheral region 200b. Specifically, the region covered by the observation layer 210 corresponds to the region evaporated through the second openings 112, so that the monitoring structures 220 are able to be formed on the observation layer 210.

[0030] Preferably, the height difference between the surface of the second peripheral region 200b and the surface of the second functional region 200a is less than or equals to 200 nm. More preferably, the height difference between the surface of the second peripheral region 200b and the surface of the second functional region 200a is less than or equals to 100 nm. Thus, monitoring of the evaporation effect of the first openings 111 by the monitoring structures 220 formed on the observation layer 210 of the OLED panel 200 by evaporation through the second openings 112 of the evaporation mask 100 can be further improved.

[0031] Specifically, a film layer such as a silicon oxide layer, a silicon nitride layer, a titanium aluminum titanium layer, an organic adhesive layer or the like may be formed on the glass substrate of the second functional region 200a, and the thickness of the film may be from 5µm to 10µm. Correspondingly, a silicon oxide layer, a silicon nitride layer, a titanium aluminum titanium layer, an organic adhesive layer or the like may also be formed on the glass substrate of the second peripheral region 200b, and then the observation layer 210 is further formed thereon. The silicon oxide layer, the silicon nitride layer, the titanium aluminum titanium layer, the organic adhesive layer or the like on the glass substrate of the second peripheral region 200b may be formed at the same time as the silicon oxide layer, the silicon nitride layer, the titanium aluminum titanium layer, the organic adhesive layer or the like on the glass substrate of the second functional region 200a. Thus, height of the surface of the second peripheral region 200b and height of the surface of the second functional region 200a are ensured to be similar as well as an additional process step is able to be avoided.

[0032] In the embodiment of the present application, the monitoring structures 220 can be formed on the observation layer 210 of the OLED panel 200 by evaporation through the second openings 112 of the evaporation mask 100, and the evaporation effect of the first openings 111 of the evaporation mask 100 can be monitored through the monitoring structures 220, so that the evaporation effect is able to be monitored in time to achieve real-time on-line monitoring.

[0033] Correspondingly, the present embodiment further provides an evaporation monitoring method, including: forming a functional layer 230 and monitoring structures 220 on the OLED panel 200 using the evaporation mask 100; acquiring actual centers of the monitoring structures 220 on the OLED panel 200; and comparing the actual centers of the monitoring structures 220 with theoretical centers of the monitoring structures 220 to obtain an evaporation effect of first openings 111 of the evaporation mask 100.

[0034] The actual centers of the monitoring structures 220 on the OLED panel 200 are acquired in the following way: capturing (the contour or boundary of) the monitoring structures 220 by an image capturing device (e.g., a camera or a video, etc.), and then calculating centers of the captured monitoring structures 220 according to the captured monitoring structures 220, i.e., acquiring the actual centers of the monitoring structures 220. It is readily known that after the contour or boundary of the monitoring structures 220 is obtained, the centers thereof are easily obtained by calculation. For example, if the monitoring structure 220 is square, the intersection of two diagonals is the center of the monitoring structure 220. For another example, if the monitoring structure 220 is circular, the center of circle thereof is the center of the monitoring structure 220.

[0035] In the embodiment of the present application, when the actual centers of the monitoring structures 220 and the theoretical centers of the monitoring structures 220 are at the same positions, the evaporation through the second openings 112 has no offset, thus inferring that the evaporation through the first openings 111 also has no offset; and when the actual centers of the monitoring structures 220 and the theoretical centers of the monitoring structures 220 are at different positions, the evaporation through the second openings 112 has offset, thus inferring that the evaporation through the first openings 111 also has offset. The comparison of positions of the actual centers and theoretical centers of the monitoring structures 220 can be achieved by comparing coordinates of the two.

[0036] Further, the above evaporation monitoring method can be implemented by a terminal device having an image capturing function and a calculation function, so that the entire evaporation monitoring is very convenient, efficient and accurate.

[0037] Further, the present embodiment also provides an evaporation adjusting method, including: obtaining an evaporation effect of first openings 111 of the evaporation mask 100 on the OLED panel 200 using the above evaporation monitoring method; and adjusting the position of the evaporation mask 100 relative to the position of the OLED panel 200 when the evaporation through the first openings 111 has offset.

[0038] In the embodiment of the present application, for example, when the actual centers of the monitoring structures 220 and the theoretical centers of the monitoring structures 220 are compared and the actual centers of the monitoring structures 220 are found located on first sides of the theoretical centers of the monitoring structures 220, the position of the OLED panel 200 can be kept unchanged with the evaporation mask 100 being moved toward second sides, opposite to the first sides, of the theoretical centers, so that the adjustment of the evaporation mask 100 is able to be achieved to improve the subsequent evaporation effect.

[0039] To sum up, in the evaporation mask, the OLED panel and system, the evaporation monitoring method and adjusting method provided by the embodiment of the present application, monitoring structures can be formed on the observation layer of the OLED panel by evaporation through the second openings of the evaporation mask, and the evaporation effect of the first openings of the evaporation mask can be monitored through the monitoring structures, so that the evaporation effect is able to be monitored in time to achieve real-time on-line monitoring.Embodiment 2 (i.e. not forming part of the claimed invention)

[0040] Please refer to Figure 3a, which is a schematic top view of a sheet mask in an evaporation mask according to Embodiment 2 of the present application. As shown in Figure 3a, in the embodiment of the present application, the evaporation mask 300 includes a first functional region 310a and a first peripheral region 310b disposed outside of the first functional region 310a defining first openings 311 for forming a functional layer by evaporation, and the first peripheral region 310b defining second openings 312 for monitoring an evaporation effect of the first openings 311. In the embodiment of the present application, the functional layer may be any layer made of the material having a certain function and formed by an evaporation process. For example, the functional layer may be an organic layer having certain electron or hole transport capability, or a metal layer having certain electrical conductivity, or a dielectric layer having certain insulating property, etc. In the embodiment of the present application, the first functional region 310a may be used for forming a display area of an OLED panel, and the first peripheral region 310b may be used for forming a non-display area of the OLED panel.

[0041] Preferably, the shape of the second openings 312 is substantially same to that of the first openings 311. For example, if the first openings 311 are square, the second openings 312 are also square. For another example, if the first openings 311 are circular, the second openings 312 are also circular. Further, the size of the second openings 312 is substantially same to that of the first openings 311. For example, when the first openings 311 and the second openings 312 are both square, the side lengths of the two are equal; and when the first openings 311 and the second openings 312 are both circular, the diameters of the two are also equal. Thus, the monitoring result will be more accurate when the evaporation effect of the first openings 311 is monitored through the second openings 312.

[0042] Still referring to Figure 3a, further, the first peripheral region 310b has a first edge L3 and a second edge L4, opposite to the first edge L3, on each side. The first edge L3 is closer to the first functional region 310a than the second edge L4 to the first functional region 310a, and the second openings 312 are closer to the first edge L3 than to the second edge L4. Here, the second openings 312 are arranged as close as possible to the first functional region 310a, so that the evaporation effect of the second openings 312 is substantially consistent with the evaporation effect of the first openings 311, thus further improving the accuracy of the monitoring result.

[0043] In the embodiment of the present application, the evaporation mask 300 includes a sheet mask 310comprising a first functional region 310a and a first peripheral region 310b disposed outside of the first functional region 310a, and the first openings 311 and the second openings 312 are all located on the sheet mask 310.

[0044] In the embodiment of the present application, the sheet mask 310 is rectangular. Further, the first functional region 310a is also rectangular, and the first peripheral region 310b is a rectangular ring. A plurality of second openings 312 are provided, being distributed in the first peripheral region 310b equably. For example, if twelve second openings 312 are provided, three of the second openings 312 can be uniformly arranged on a strip region of each side of the first peripheral region 310b. The accuracy of the monitoring result is able to be further improved by monitoring the evaporation effect of the first openings 311 through the plurality of second openings 312.

[0045] In the embodiment of the present application, the first openings 311 are used for evaporating monochrome pixels, and the plurality of second openings 312 are used for monitoring the evaporation effects of pixels having different colors. For example, the first openings 311 are used for evaporating red pixels, and some of the second openings 312 are used for monitoring the evaporation effect of the red pixels. For another example, the first openings 311 are used for evaporating blue pixels, and some of the second openings 312 are used for monitoring the evaporation effect of the blue pixels.

[0046] In the embodiment of the present application, the same evaporation mask 300 can be used for evaporating pixels having different colors. That is, when red pixels are evaporated, an evaporation mask 300 is used, and some of the second openings 312 thereon are used for monitoring the evaporation effect of the red pixels; and when blue pixels are evaporated, the evaporation mask 300 is still used, and some of the second openings 312 thereon are used for monitoring the evaporation effect of the blue pixels, wherein some of the second openings 312 for monitoring the evaporation effect of the blue pixels is different from some of the second openings 312 for monitoring the evaporation effect of the red pixels (i.e., none of second openings is shared). In this case, not only can the evaporation effect of the first openings 311 be monitored, but also the manufacturing cost of the evaporation mask 300 is not increased.

[0047] In the embodiment of the present application, the plurality of second openings 312 are used for monitoring evaporation effects of different colors of pixels. For example, some of second openings 312 can be used for monitoring the evaporation effect of red pixels, some of the second openings 312 can be used for monitoring the evaporation effect of blue pixels, and some of the second openings 312 can be used for monitoring the evaporation effect of green pixels. Thus, when different colors of pixels are evaporated and the evaporation effects of the first openings 311 are monitored using the second openings 312, only some of the second openings 312 corresponding to the first openings 311can be used, and the remaining second openings 312 non-corresponding to the first openings 311 are ignored.

[0048] Next, please refer to Figure 3b, which is a schematic top view of a support strip in the evaporation mask according to Embodiment 2 of the present application. As shown in Figure 3b, the evaporation mask 300 further includes a support strip 320 for supporting the sheet mask 310, wherein the support strip 320 has a third opening 321 exposing only some of the second openings 312, and the exposed second openings 312 are used for monitoring the evaporation effect of pixels having the same color as the monochrome pixels evaporated through the first openings 311. That is, in an implementation of the embodiment of the present application, the second openings 312 that are temporarily not used are sheltered by the support strip 320. For example, when the first openings 311 are used for evaporating red pixels, the third opening 321 of the support strip 320 exposes only some of the second openings 312 for monitoring the evaporation effect of the red pixels, some of the second openings 312 for monitoring the evaporation effect of blue pixels and some of the second openings 312 for monitoring the evaporation effect of green pixels are sheltered by the support strip 320. In this case, when different colors of pixels are evaporated, the support strip 320 is often replaced or changed such that the third openings 321 on the support strip 320 expose different ones of the second openings 312. Due to the relatively low cost of the support strip, this method is able to ensure high monitoring accuracy and relatively low cost.

[0049] Correspondingly, the present embodiment further provides an OLED panel. Specifically, please refer to Figure 4, which is a schematic top view of an OLED panel according to Embodiment 2 of the present application. As shown in Figure 4, the OLED panel 400 includes a second functional region 400a and a second peripheral region 400b disposed outside of the second functional region 400a, and an observation layer 410 is formed on the second peripheral region 400b. Specifically, the OLED panel 400 may include a glass substrate including a second functional region and a second peripheral region, and the observation layer 410 may be formed on the glass substrate of the second peripheral region. In the embodiment of the present application, the second functional region 400a may be a display area, and the second peripheral region 400b may be a non-display area.

[0050] Please refer to Figure 3a, Figure 3b and Figure 4, the present embodiment further provides an OLED panel system including the evaporation mask 300 and the OLED panel 400, wherein the evaporation mask 300 is located below the OLED panel 400, the first openings 311 of the evaporation mask 300 are used for forming a functional layer 430 on the second functional area 400a of the OLED panel 400 by evaporation, the second openings 312 of the evaporation mask 300 are used for forming monitoring structures 420 on the observation layer 410 of the OLED panel 400 by evaporation, and the monitoring structures 420 are used for monitoring the evaporation effect of the first openings 311.

[0051] In the embodiment of the present application, the monitoring structures 420 are able to be easily observed through the observation layer 410. For example, the material made of the observation layer 410 is reflective to enable highlighting of the monitoring structures 420, thus enabling the monitoring structures 420 to be easily observed, and particularly, to be easily captured by an optical device. For another example, the color of the observation layer 410 is greatly different from that of the monitoring structures 420, thus enabling the monitoring structures 420 to be easily captured by the optical device.

[0052] When the monitoring structures 420 are formed on the observation layer 410 of the OLED panel 400 by evaporation through the second openings 312 of the evaporation mask 300, (the contour of) the monitoring structures 420 are able to be easily captured, such that the evaporation effect of the first openings 311 are able to be easily judged according to the monitoring structures 420.

[0053] Preferably, the thickness of the observation layer 410 is from 100 nm to 200 nm. For example, the thickness of the observation layer 410 may be 100 nm, 110 nm, 130 nm, 150 nm, 170 nm, 185 nm, or 200 nm, etc. At this thickness, the shape of the monitoring structures 420 is able to be captured more easily. Further, the observation layer 410 may be made of silver (Ag), indium tin oxide (ITO), etc.

[0054] Still referring to Figure 4, in the embodiment of the present application, not forming part of the claimed invention, the observation layer 410 covers only a part of the second peripheral region 200b. Specifically, the region covered by the observation layer 410 corresponds to the region evaporated through the second openings 312, and preferably, the region covered by the observation layer 410 is greater than or equals to the region evaporated through the second openings 312, so that the monitoring structures 420 are able to be formed on the observation layer 410. In the claimed invention, the observation layer 410 covers the entire second peripheral region 400b.

[0055] Preferably, the height difference between the surface of the second peripheral region 400b and the surface of the second functional region 400a is less than or equals to 200 nm. More preferably, the height difference between the surface of the second peripheral region 400b and the surface of the second functional region 400a is less than or equals to 100 nm. Thus, monitoring of the evaporation effect of the first openings 311 by the monitoring structures 420 formed on the observation layer 410 of the OLED panel 400 by evaporation through the second openings 312 of the evaporation mask 300 can be further improved.

[0056] Specifically, a film such as a silicon oxide layer, a silicon nitride layer, a titanium aluminum titanium layer, an organic adhesive layer or the like may be formed on the glass substrate of the second functional region 400a, and the thickness of the film may be from 5µm to 10µm. Correspondingly, a silicon oxide layer, a silicon nitride layer, a titanium aluminum titanium layer, an organic adhesive layer or the like may also be formed on the glass substrate of the second peripheral region 400b, and then the observation layer 410 is further formed thereon. The silicon oxide layer, the silicon nitride layer, the titanium aluminum titanium layer, the organic adhesive layer or the like on the glass substrate of the second peripheral region 400b may be formed at the same time as the silicon oxide layer, the silicon nitride layer, the titanium aluminum titanium layer, the organic adhesive layer or the like on the glass substrate of the second functional region 400a. Thus, height of the surface of the second peripheral region 400b and that of the surface of the second functional region 400a are ensured to be similar, as well as an additional process steps is able to be avoided.

[0057] In the embodiment of the present application, the monitoring structures 420 can be formed on the observation layer 410 of the OLED panel 400 by evaporation through the second openings 312 of the evaporation mask 300, and the evaporation effect of the first openings 311 of the evaporation mask 300 can be monitored through the monitoring structures 420, so that the evaporation effect is able to be monitored in time to achieve real-time on-line monitoring.

[0058] Correspondingly, the present embodiment further provides an evaporation monitoring method, including: forming a functional layer 430 and monitoring structures 420 on the OLED panel 400 using the evaporation mask 300; acquiring actual centers of the monitoring structures 420 on the OLED panel 400; and comparing the actual centers of the monitoring structures 420 with theoretical centers of the monitoring structures 420 to obtain an evaporation effect of first openings 311 of the evaporation mask 300.

[0059] The actual centers of the monitoring structures 420 on the OLED panel 400 can be acquired in the following way: capturing (the contour or boundary of) the monitoring structures 420 by an image capturing device (e.g., a camera or a video, etc.), and then calculating centers of the captured monitoring structures 420 according to the captured monitoring structures 420, i.e., acquiring the actual centers of the monitoring structures 420. It is readily known that after the contour or boundary of the monitoring structures 420 is obtained, the centers thereof are easily obtained by calculation. For example, if the monitoring structure 420 is square, the intersection of two diagonals is the center of the monitoring structure 420. For another example, if the monitoring structure 420 is circular, the center of circle thereof is the center of the monitoring structure 420.

[0060] In the embodiment of the present application, when the actual centers of the monitoring structures 420 and the theoretical centers of the monitoring structures 420 are at the same positions, the evaporation through the second openings 312 has no offset, thus inferring that the evaporation through the first openings 311 also has no offset; and when the actual centers of the monitoring structures 420 and the theoretical centers of the monitoring structures 420 are at different positions, the evaporation through the second openings 312 has offset, thus inferring that the evaporation through the first openings 311 also has offset. The comparison of positions of the actual centers and theoretical centers of the monitoring structures 420 can be achieved by comparing coordinates of the two.

[0061] Further, the above evaporation monitoring method can be implemented by a terminal device having an image capturing function and a calculation function, so that the entire evaporation monitoring is very convenient, efficient and accurate.

[0062] Further, the present embodiment also provides an evaporation adjusting method, including: obtaining an evaporation effect of first openings 311 of the evaporation mask 300 on the OLED panel 400 using the above evaporation monitoring method; and adjusting the position of the evaporation mask 300 relative to the position of the OLED panel 400 when the evaporation through the first openings 311 has offset.

[0063] In the embodiment of the present application, for example, when the actual centers of the monitoring structures 420 and the theoretical centers of the monitoring structures 420 are compared and the actual centers of the monitoring structures 420 are found located on first sides of the theoretical centers of the monitoring structures 420, the position of the OLED panel 400 can be kept unchanged with the evaporation mask 300 being moved toward second sides, opposite to the first sides, of the theoretical centers, so that the adjustment of the evaporation mask 300 is able to be achieved to improve the subsequent evaporation effect.

[0064] To sum up, in the evaporation mask, the OLED panel and system, the evaporation monitoring method and adjusting method provided by the embodiment of the present application, monitoring structures can be formed on the observation layer of the OLED panel by evaporation through the second openings of the evaporation mask, and the evaporation effect of the first openings of the evaporation mask can be monitored through the monitoring structures, so that the evaporation effect is able to be monitored in time to achieve real-time on-line monitoring.

[0065] Described above are merely preferred embodiments of the present application, and the scope of the present application is not limited in any way. Changes or modifications can be made by those skilled in the art concerning the foregoing disclosure, provided that such changes or modifications fall within the scope of the appended claims.

Claims

1. A method for evaporation monitoring, the method for evaporation monitoring comprises: providing an evaporation mask (100, 300), the evaporation mask (100, 300) comprising a first functional region (110a, 310a) and a first peripheral region (110b, 310b) disposed outside of the first functional region (110a, 310a), the first functional region (110a, 310a) defining at least one first opening (111, 311), the first peripheral region (110b, 310b) defining at least one second opening (112, 312), wherein the second opening (112, 312) is configured to form a monitoring structure (220, 420) on the OLED panel (200, 400) by evaporation; providing an OLED panel (200, 400), the OLED panel (200, 400) comprising a second functional region (200a, 400a) and a second peripheral region (200b, 400b) disposed outside of the second functional region (200a, 400a), the second peripheral region (200b, 400b) having an observation layer (210, 410) formed thereon, wherein the observation layer (210, 410) is configured to facilitate an observation of the monitoring structure (220, 420) ; forming a functional layer (230, 430) and at least one monitoring structure (220, 420) on the second functional region (200a, 400a) and the observation layer (210, 410) of the OLED panel (200, 400) respectively using the evaporation mask (100, 300); acquiring an actual center of the at least one monitoring structure (220, 420) on the OLED panel (200, 400); and comparing the actual center of the monitoring structure (220, 420) with a theoretical center of the monitoring structure (220, 420) to obtain an evaporation effect of the at least one first opening (111, 311) of the evaporation mask (100, 300), wherein the observation layer (210, 410) is made of a reflective material and has a color different from a color of the monitoring structure (220, 420) to ease a contour of the monitoring structure (220, 420) being captured by an image capturing device, characterized in that the observation layer (210, 410) covers an entirety of the second peripheral region (200b, 400b); and in that the actual center of the at least one monitoring structure (220, 420) is acquired in the following way: capturing the contour of the at least one monitoring structure (220, 420) by a camera or a video; and calculating the center of the at least one monitoring structure (220, 420) according to the captured monitoring structures.

2. The method for evaporation monitoring of claim 1, wherein the evaporation through the at least one first opening (111, 311) is considered to have no offset when the actual center of the monitoring structure (220, 420) and the theoretical center of the monitoring structure (220, 420) are at the same position, and the evaporation through the at least one first opening (111, 311) is considered to have offset when the actual center of the monitoring structure (220, 420) and the theoretical center of the monitoring structure (220, 420) are at different positions.

3. The method for evaporation monitoring of claim 1, wherein the comparison of positions of actual centers and theoretical centers of the monitoring structures (220, 420) is achieved by comparing coordinates of the two.