Inspection jig

Abstract

To provide an inspection jig that is hardly broken.SOLUTION: An inspection jig 1 comprises a substrate which can be electrically connected to a connector 100 to be inspected, a movable member which can move, an expansion / contraction member which can expands and contracts, an expansion / contraction member holding part which holds the expansion / contraction member, and an elastic member which energizes the movable member and expansion / contraction member away from each other. When the movable member is put closer to the expansion / contraction member so that the elastic member contracts by a predetermined quantity or more, the movable member presses the expansion / contraction member, which presses the substrate, so that the substrate is electrically connected to the connector 100 to be inspected.SELECTED DRAWING: Figure 13

Description

[Technical field]

[0001] The present invention relates to an inspection tool. [Background technology]

[0002] Conventionally, as in Patent Document 1, an inspection tool using a probe has been proposed. [Prior art documents] [Patent documents]

[0003] [Patent Document 1] Patent No. 6380549 Summary of the Invention [Problem to be solved by the invention]

[0004] However, the probe is in direct contact with the object to be inspected, and the inspection jig is prone to damage.

[0005] Accordingly, one object of the present invention is to provide an inspection tool that is less likely to break. Other objects of the present invention will become apparent from the description of this specification. [Means for solving the problem]

[0006] One aspect of the present invention is an inspection jig comprising a substrate that can be electrically connected to a connector to be inspected, a movable member, a stretchable member, an expandable member holding portion that holds the expandable member, and an elastic member that biases the movable member and the expandable member holding portion away from each other, wherein when the movable member is brought closer to the expandable member holding portion so that the elastic member shrinks by a predetermined amount or more, the movable member pushes the expandable member, and the expandable member pushes the substrate, so that the substrate is electrically connected to the connector to be inspected.

[0007] According to the above-described aspects of the present invention, it is possible to provide an inspection tool that is less susceptible to breakage. [Brief description of the drawings]

[0008] [Figure 1] FIG. 2 is an exploded perspective view of the inspection jig of the present embodiment, as viewed from below. [Diagram 2] FIG. 2 is an exploded perspective view of the inspection jig as viewed from above. [Diagram 3] 2 is a perspective view of the inspection jig and the connector to be inspected, viewed from above. FIG. [Figure 4] 1 is a perspective view of the inspection jig and the connector to be inspected, viewed from below. FIG. [Diagram 5] FIG. [Figure 6] 1 is a perspective view of an assembly of a front flexible board and a front connector, a front probe holding portion, a front connector base, and a front probe group. [Figure 7] 13 is a perspective view of the area where the tongue of the front flexible substrate is located, seen from the front and bottom. FIG. [Figure 8] FIG. [Figure 9] 1 is a yz cross-sectional view of the inspection jig and the connector to be inspected in a first state. FIG. [Figure 10] 1 is an xz cross-sectional view showing an enlarged area where a tongue piece of the front flexible substrate is located in a first state. [Figure 11] 11 is a yz cross-sectional view of the inspection jig and the connector to be inspected in a second state. FIG. [Figure 12] 13 is a yz cross-sectional view of the inspection jig and the connector to be inspected in a third state. FIG. [Figure 13] FIG. 13 is a yz cross-sectional view of the inspection jig and the connector to be inspected in a fourth state. [Figure 14] This is an xz cross-sectional view showing an enlarged area where the tongue of the front flexible board is located in the fourth state. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0009] Hereinafter, the present embodiment will be described with reference to Figs. 1 to 8. Note that the embodiment is not limited to the following embodiment. Furthermore, the contents described in one embodiment are, in principle, similarly applied to other embodiments. Furthermore, each embodiment and each modified example can be appropriately combined.

[0010] (Inspection jig 1) 1 to 8, the inspection jig 1 in this embodiment includes a board holding section 20, a board section 30, and a horizontal position adjustment section 40. The inspection jig 1 contacts a connector under inspection (BtoB connector, Board to Board connector) 100 to be inspected via a connector contact section 21a at the lower end of a lower holding section 21 of the board holding section 20, and is electrically connected to an internal front side flexible board 31a and a rear side flexible board 32a. Note that the connector under inspection 100 is not shown in FIGS. 1 and 2.

[0011] In order to explain the directions, the horizontal direction (front-rear direction) in which the two board assemblies (front board assembly 31, rear board assembly 32) are arranged is defined as the x direction, the direction (left-right direction) perpendicular to the x direction and in which the two support parts 43 (right support member 43a, left support member 43b) are arranged is defined as the y direction, and the direction (up-down direction) perpendicular to the x direction and the y direction is defined as the z direction (first direction). In FIG. 1, the directions indicated by the arrows of the xyz axes are defined as the front direction, the right direction, and the up direction, respectively. Specifically, the direction from the rear board assembly 32 toward the front board assembly 31 is defined as the front direction. In addition, the direction from the left support member 43b located at the upper right of FIG. 1 toward the right support member 43a located at the lower left of FIG. 1 among the two support parts 43 is defined as the right direction. In addition, the direction from the lower holding part 21 toward the horizontal position adjustment part 40 is defined as the up direction.

[0012] (Substrate holding part 20) The substrate holding part 20 has a lower holding part (work guide) 21 and an upper holding part (connecting plate) 23. The lower holding part 21 is provided on the lower side of the substrate part 30 in the z direction. The upper holding part 23 is provided on the upper side of the substrate part 30 in the z direction. The lower holding part 21 and the upper holding part 23 sandwich the substrate part 30 in the z direction.

[0013] The lower holding part 21 is a member that comes into contact with the housing of the connector 100 to be inspected (a member that holds electrodes that contact the front flexible board 31a or the rear flexible board 32a). The lower holding part 21 has a hole that penetrates in the z direction. The lower end of the board part 30 is inserted into the hole of the lower holding part 21 from above in the z direction. A convex part (connector contact part 21a) is formed on the lower side in the z direction of the lower holding part 21. The upper end of the connector 100 to be inspected is inserted into the connector contact part 21a from below in the z direction. In other words, the connector 100 to be inspected is attached in a detachable state to the connector contact part 21a.

[0014] The front probe holding portion 31c of the front board assembly 31 and the rear probe holding portion 32c of the rear board assembly 32 are attached to the upper side in the z direction of the lower holding portion 21. The front probe holding portion 31c is attached to the lower holding portion 21 by screwing from the lower side in the z direction. The rear probe holding portion 32c is attached to the lower holding portion 21 by screwing from the lower side in the z direction. Therefore, the front probe holding portion 31c and the rear probe holding portion 32c are attached to the lower holding portion 21 in a state where the distance in the z direction from the area of ​​the lower holding portion 21 (connector contact portion 21a) that contacts the housing of the connector 100 to be inspected does not change.

[0015] The upper holding part 23 has an upper right holding member 23a and an upper left holding member 23b. The front push block 31i of the front board assembly 31 and the rear push block 32i of the rear board assembly 32 are attached to the lower side in the z direction of the upper holding part 23. The front push block 31i is attached to the upper holding part 23 by screwing from above in the z direction. The rear push block 32i is attached to the upper holding part 23 by screwing from above in the z direction.

[0016] (Substrate part 30) The substrate unit 30 has a front substrate assembly 31 and a rear substrate assembly 32. The front substrate assembly 31 is disposed on the front side in the x direction, and the rear substrate assembly 32 is disposed on the rear side in the x direction.

[0017] (Front board assembly 31) As shown in FIG. 5, the front board assembly 31 has a front flexible board (flexible board) 31a, a front connector 31b, a front probe holding portion (expandable member holding portion) 31c, a front connector base 31d, a front connector cover 31f, a front probe group 31g, a front spring 31h, and a front push block (movable member) 31i.

[0018] (Front flexible board 31a) As shown in FIGS. 6 and 7, the front flexible substrate 31a has a connector connecting end (one end) 31a1, a holding portion connecting end (the other end) 31a2, and a pattern portion 31a3.

[0019] The connector connection end 31a1 is an end of the front flexible substrate 31a on the front side in the x direction and on the upper side in the z direction, and the front connector 31b is attached to the connector connection end 31a1 by soldering or the like. The holder connection end 31a2 is an end of the front flexible substrate 31a on the rear side in the x direction and on the upper side in the z direction, and is attached to the front probe holder 31c. For example, a hole 31a21 provided in the holder connection end 31a2 is fitted into a boss (not shown) provided on the upper side in the z direction of the probe receiver 31c1 of the front probe holder 31c. However, the attachment of the holder connection end 31a2 to the front probe holder 31c is not limited to fitting the hole 31a21 into the boss.

[0020] The pattern portion 31a3 is an area between the connector connecting end 31a1 and the holding portion connecting end 31a2. A pattern of a signal line and a ground line extending from the connector connecting end 31a1 is formed on the lower (front) surface of the pattern portion 31a3 in the z direction. The pattern portion 31a3 is bent to have a substantially V-shape when viewed from the y direction. The ends of the signal line and the ground line are provided on the lower end of the pattern portion 31a3 bent to have a substantially V-shape on the lower surface of the pattern portion 31a3 in the z direction. The ends of the signal line and the ground line are used as board-side electrodes that are electrically connected to electrodes of the connector 100 to be inspected. In addition, a slit S is provided around the ends of the signal line and the ground line (an area including a part of the pattern portion 31a3 that is electrically connected to the connector 100 to be inspected). The slit S forms a tongue piece 31a4 that is substantially U-shaped. The slit S is a cut (slit) with both ends closed, but one end may be an open end and the other end may be a closed end. The patterns provided on the lower (front) surface of the pattern portion 31a3 in the z direction are not limited to signal lines and ground lines.

[0021] In order to increase the amount of downward displacement in the z direction by the probe P of the front probe group 31g described later, it is desirable to increase the longitudinal length of the slit S forming the tongue 31a4. On the other hand, in order to prevent the deterioration of the characteristics of the signal line in the high frequency range, it is desirable to shorten the longitudinal length of the slit S forming the tongue 31a4. For this reason, the longitudinal length of the slit S forming the tongue 31a4 is determined while taking into consideration the amount of downward displacement of the tongue 31a4 in the z direction and the characteristics of the signal line in the high frequency range. Only one signal line, ground line, or power line may be provided in one tongue 31a4, or at least one of the signal line, ground line, and power line may be provided in multiple numbers. The tongue 31a4 may be provided with other types of lines other than the signal line, ground line, and power line.

[0022] Furthermore, the tongue piece 31a4 formed by the slit S is not limited to a substantially U-shape, but may have other shapes, such as a substantially V-shape, a substantially C-shape, a substantially L-shape, a substantially groove shape, etc., as long as it can be displaced downward in the z direction from the upper side in the z direction by the probe P of the front probe group 31g in a state where the pattern portion 31a3 is not stretched.

[0023] In addition, in the figures other than FIG. 1, FIG. 4, FIG. 5, and FIG. 7, the signal line and ground line of the pattern portion 31a3, the slit S, and the tongue piece 31a4 are omitted.

[0024] (Front connector 31b) The front connector 31b is attached to the connector connection end 31a1 of the front flexible substrate 31a. The front connector 31b is used to electrically connect the front flexible substrate 31a to an inspection device (not shown).

[0025] (Front probe holding portion 31c) The front probe holder 31c holds the front connector base 31d at its front side in the x direction. The front probe holder 31c holds the holder connection end 31a2 of the front flexible board 31a at its rear side in the x direction.

[0026] (Probe receiving portion 31c1) A probe receiving portion 31c1 that holds the front probe group 31g is provided on the rear side in the x direction and below the front probe holding portion 31c in the z direction.

[0027] The probe receiving portion 31c1 is formed of a hole extending in the z direction. However, the probe receiving portion 31c1 may be formed of a groove extending in the z direction, or may be formed of a groove and a hole. The widths in the x and y directions above (31c11) the hole of the probe receiving portion 31c1 are larger than the outer diameter of the spring housing portion (barrel) P2 of the probe P constituting the front probe group 31g. The widths in the x and y directions below (31c12) the hole of the probe receiving portion 31c1 are larger than the outer diameter of the tip portion P1 of the probe P constituting the front probe group 31g and smaller than the outer diameter of the spring housing portion P2. The upper and lower ends of the groove and / or hole of the probe receiving portion 31c1 are open. The upper end of the probe P protrudes upward through the upper portion 31c11 of the hole of the probe receiving portion 31c1 and contacts the front push block 31i. The lower end of the probe P protrudes downward through a lower portion 31c12 of the hole of the probe receiving portion 31c1 and comes into contact with the tongue piece 31a4.

[0028] (Attachment of front flexible substrate 31a to front probe holding portion 31c) The front flexible substrate 31a is attached to the front probe holding portion 31c so as to satisfy the following two conditions. First condition: the lower side in the z direction of the front probe holding portion 31c faces the upper surface in the z direction of the pattern portion 31a3 of the front flexible substrate 31a. Second condition: ends of the signal line and the ground line of the pattern portion 31a3 of the front flexible board 31a are located below the probe receiving portion 31c1 of the front probe holding portion 31c in the z direction.

[0029] (Front connector base 31d) The front connector base 31d holds the front connector 31b on the front side in the x direction (see FIG. 5). The front connector base 31d is located above the front probe holder 31c in the z direction and is attached to the front probe holder 31c.

[0030] The assembly of the front flexible board 31a and the front connector 31b is attached to the assembly of the front probe holding part 31c and the front connector base 31d so as to sandwich the front probe holding part 31c and the front connector base 31d in the x direction and to wrap the lower end of the front probe holding part 31c. The front probe holding part 31c is attached to the front connector base 31d by screws from below in the z direction.

[0031] (Front connector cover 31f) The front connector cover 31f covers a part of the pattern portion 31a3 of the front flexible board 31a and the front side of the front connector 31b in the x direction. The front connector cover 31f is attached to the front connector base 31d by screws from the front side in the x direction. The front connector cover 31f and the front connector base 31d sandwich the front connector 31b in the x direction.

[0032] (Front probe group 31g) The front probe group 31g has a plurality of probes (expandable members) P that expand and contract in the z direction (see FIG. 6). The plurality of probes P are arranged in the y direction. Each of the probes P constituting the front probe group 31g has a tip P1 on the lower side in the z direction, and a spring housing P2 above the tip P1 in the z direction. A spring (not shown) is housed in the spring housing P2. The tip P1 is biased by the spring in the spring housing P2 in a direction in which its entire length expands.

[0033] When each of the probes P constituting the front probe group 31g is placed on the probe receiving portion 31c1 of the front probe holding portion 31c without the front flexible substrate 31a being attached to the front probe holding portion 31c, the tip P1 of the probe P protrudes downward in the z direction from the groove and / or hole of the probe receiving portion 31c1. However, the spring accommodating portion P2 is held by a step between the upper side 31c11 and the lower side 31c12 of the hole of the probe receiving portion 31c1, so that the probe P does not fall from the probe receiving portion 31c1.

[0034] When the front flexible board 31a is attached to the front probe holding section 31c and each of the probes P constituting the front probe group 31g is placed on the probe receiving section 31c1 of the front probe holding section 31c, the tip P1 of the probe P contacts the back side of the area where the tongue piece 31a4 of the front flexible board 31a is located. For example, among the multiple probes P, a first probe P is in a positional relationship where it contacts one of the areas (one of the tongue pieces 31a4) of the front flexible board 31a that is electrically connected to the connector 100 to be inspected. Also, among the multiple probes P, a second probe P different from the first probe P is in a positional relationship where it contacts the tongue piece 31a4 corresponding to the first probe P and another tongue piece 31a4, which is one of the areas (one of the tongue pieces 31a4) of the front flexible board 31a that is electrically connected to the connector 100 to be inspected. However, since the probe P is light, it merely comes into contact with the tongue piece 31a4 and hardly displaces it downward in the z direction.

[0035] The assembly of the front flexible substrate 31a and the front connector 31b is attached to the front probe holding portion 31c and the front connector base 31d with each of the probes P constituting the front probe group 31g placed on the probe receiving portion 31c1.

[0036] (Front spring 31h, front push block 31i) The front push block 31i is fixed to the upper holding portion 23 (upper right holding member 23a, upper left holding member 23b). The front push block 31i is fixed to the upper holding portion 23 by screwing from above in the z direction. Therefore, the front push block 31i is attached to the bracket 45 via the support portion 43 without changing the distance between the bracket 45 and the front push block 31i in the z direction.

[0037] The front push block 31i is held by the front probe holder 31c and the front connector base 31d in a state in which it can move in the z direction. The front probe holder 31c of the front push block 31i holds the front push block 31i in a state in which it can move in the z direction by screwing it from the rear side in the x direction. The front push block 31i is used to push down each of the probes P constituting the front probe group 31g in the z direction. That is, the multiple probes P constituting the front probe group 31g are provided between the front flexible board 31a and the front push block 31i.

[0038] A front spring 31h is provided between the front probe holding portion 31c and the front push block 31i. The front spring 31h biases the front push block 31i and the front probe holding portion 31c so as to move them apart in the z direction. Therefore, the front push block 31i and the front probe holding portion 31c are maintained apart by the front spring 31h. The spring force of the front spring 31h is set to a load that allows the lower holding portion (work guide) 21 to fit without applying excessive force to the connector 100 to be inspected, and does not press the probe (expandable member) P.

[0039] (Rear board assembly 32) As shown in FIG. 8, the rear board assembly 32 has a rear flexible board (flexible board) 32a, a rear connector 32b, a rear probe holding portion 32c, a rear connector base 32d, a rear connector cover 32f, a rear probe group 32g, a rear spring 32h, and a rear push block (movable member) 32i.

[0040] The configuration of the rear board assembly 32 is the same as that of the front board assembly 31, except that the orientation in the x direction is reversed. The rear flexible board 32a of the rear board assembly 32 corresponds to the front flexible board 31a of the front board assembly 31. The rear connector 32b of the rear board assembly 32 corresponds to the front connector 31b of the front board assembly 31. The rear probe holding portion 32c of the rear board assembly 32 corresponds to the front probe holding portion 31c of the front board assembly 31. The rear connector base 32d of the rear board assembly 32 corresponds to the front connector base 31d of the front board assembly 31. The rear connector cover 32f of the rear board assembly 32 corresponds to the front connector cover 31f of the front board assembly 31. The rear probe group 32g of the rear board assembly 32 corresponds to the front probe group 31g of the front board assembly 31. The rear spring 32h of the rear board assembly 32 corresponds to the front spring 31h of the front board assembly 31. The rear push block 32i of the rear board assembly 32 corresponds to the front push block 31i of the front board assembly 31.

[0041] (Horizontal position adjustment section 40) The horizontal position adjustment section 40 has a support section (movable head) 43 and a bracket 45 (see FIGS. 1 to 4).

[0042] (Support part 43) The support portion 43 has a right support member 43a and a left support member 43b. The right support member 43a and the left support member 43b are aligned in the y direction. Each of the right support member 43a and the left support member 43b incorporates an elastic member such as an annular coil spring (not shown).

[0043] The right support member 43a is attached to the lower side in the z direction of the upper right holding member 23a. The right support member 43a is attached to the upper right holding member 23a by screwing from above in the z direction. The right support member 43a is also attached to the lower side in the z direction of the bracket 45. The right support member 43a and the bracket 45 sandwich the upper right holding member 23a in the z direction. The right support member 43a is attached to the bracket 45 by screwing from above in the z direction through holes in the upper right holding member 23a.

[0044] The region of the right support member 43a attached to the upper right holding member 23a is movable in the x and y directions (directions perpendicular to the z direction) relative to the region of the right support member 43a attached to the bracket 45 via the elastic member of the right support member 43a. Therefore, the upper right holding member 23a is held between the right support member 43a and the bracket 45 in a state where it can move in the x and y directions.

[0045] The left support member 43b is attached to the lower side in the z direction of the upper-left holding member 23b. The left support member 43b is attached to the upper-left holding member 23b by screwing from above in the z direction. The left support member 43b is also attached to the lower side in the z direction of the bracket 45. The left support member 43b and the bracket 45 sandwich the upper-left holding member 23b in the z direction. The left support member 43b is attached to the bracket 45 by screwing from above in the z direction through holes in the upper-left holding member 23b.

[0046] The region of the left support member 43b that is attached to the upper-left holding member 23b is movable in the x and y directions relative to the region of the left support member 43b that is attached to the bracket 45, via the elastic member of the left support member 43b. Therefore, the upper-left holding member 23b is held between the left support member 43b and the bracket 45 in a state that is movable in the x and y directions.

[0047] The support portion 43 (right support member 43a, left support member 43b) is used to absorb deviations from the position facing the electrodes of the connector 100 to be inspected in the z-direction in the area where the tongue 31a4 of the front flexible board 31a of the front board assembly 31 is located and in the area where the tongue of the rear flexible board 32a of the rear board assembly 32 is located.

[0048] For example, suppose that the region where tongue piece 31a4 of front-side flexible board 31a of front-side board assembly 31 is located and the region where tongue piece 32a of rear-side board assembly 32 is located are shifted on the xy plane from the position facing the electrode of connector 100 under inspection in the z direction. In this case, when inspection jig 1 is attached to connector 100 under inspection, bracket 45, the region attached to bracket 45 of right support member 43a, and the region attached to bracket 45 of left support member 43b do not move, but board holding section 20, board section 30, the region attached to upper right holding member 23a of right support member 43a, and the region attached to upper left holding member 23b of left support member 43b can move on the xy plane.

[0049] (Bracket 45) The bracket 45 is attached to a device (not shown), such as an inspection device or a machine tool, that holds and moves the inspection jig 1. The bracket 45 holds the front push block 31i and the rear push block 32i via the support portion 43 and the upper holding portion 23 in a state in which the bracket 45 is movable in a direction perpendicular to the z direction.

[0050] The bracket 45 has a first region 45a, a second region 45b, and a third region 45c. The first region 45a is located at the right end of the bracket 45, the second region 45b is located at the left end of the bracket 45, and the third region 45c is located between the first region 45a and the second region 45b. The upper right holding member 23a and the right support member 43a are disposed below the first region 45a in the z direction. The upper left holding member 23b and the left support member 43b are disposed below the second region 45b in the z direction.

[0051] The third region 45c has cutouts for accommodating the front connector 31b of the front board assembly 31 and the rear connector 32b of the rear board assembly 32, and is sandwiched in the x direction by the front connector 31b of the front board assembly 31 and the rear connector 32b of the rear board assembly 32. Therefore, the upper ends of the front connector 31b and the rear connector 32b are located above the upper holding portion 23 and the support portion 43 in the z direction.

[0052] (Positional relationship between the front push block 31i and the support portion 43) The front push block 31 i and the rear push block 32 i are disposed at positions closer to the bracket 45 than the support portion 43 is.

[0053] (Materials of each part, metal parts, plastic parts) Among the members constituting the inspection jig 1, the conductive areas such as the front flexible substrate 31a, the front probe group 31g, the rear probe group 32g, and the screws are made of metal. The other members constituting the inspection jig 1 are made of non-conductive materials such as resin.

[0054] (Procedure for connecting the inspection jig 1 to the connector 100 to be inspected) Next, changes in the expansion and contraction state of the front spring 31h and the like when the inspection jig 1 is moved from the upper side in the z direction to the lower side in the z direction and connected to the connector 100 to be inspected will be described (FIGS. 9 to 14).

[0055] In addition, in the yz cross-sectional configuration diagrams of Figures 9 and 11 to 13, the probe P is shown larger than that shown in other diagrams such as Figure 1 in order to make it easier to understand the configuration of the area where the probe P is located. For this reason, the number of probes P, the aspect ratio of each member, etc. do not match between the yz cross-sectional configuration diagrams of Figures 9 and 11 to 13 and other diagrams such as Figure 1.

[0056] The rear spring 32h is not shown in the yz cross-sectional configuration diagrams of FIG. 9 and FIG. 11 to FIG. 13. However, the rear spring 32h is located on the rear side of the front spring 31h in the x direction, and expands and contracts in the same way as the front spring 31h. The rear push block 32i is not shown in the yz cross-sectional configuration diagrams of FIG. 9 and FIG. 11 to FIG. 13. However, the rear push block 32i is located on the rear side of the front push block 31i in the x direction, and moves in the same way as the front push block 31i. The rear probe group 32g is not shown in the yz cross-sectional configuration diagrams of FIG. 9 and FIG. 11 to FIG. 13. However, the rear probe group 32g is located on the rear side of the front probe group 31g in the x direction, and moves in the same way as the front probe group 31g. The tongue of the rear flexible substrate 32a is not shown. However, the tongue piece of the rear-side flexible substrate 32a is located rearward in the x-direction of the tongue piece 31a4 of the front-side flexible substrate 31a, and is displaced in the same manner as the tongue piece 31a4 of the front-side flexible substrate 31a.

[0057] As shown in FIG. 9, before the inspection jig 1 comes into contact with the connector 100 to be inspected, the front spring 31h and the rear spring 32h are in an extended state, and the distance between the front push block 31i and the front probe holder 31c and the distance between the rear push block 32i and the rear probe holder 32c are not shortened (first state). At this time, the lower end P1 in the z direction of the probe P constituting the front probe group 31g contacts the tongue 31a4 of the front flexible board 31a (see FIG. 10). However, since the probe P is light, the tongue 31a4 of the front flexible board 31a is hardly pushed down in the z direction. Similarly, the lower end P1 in the z direction of the probe P constituting the rear probe group 32g contacts the tongue of the rear flexible board 32a. However, since the probe P is light, the tongue of the rear flexible board 32a is hardly pushed down in the z direction.

[0058] 11, immediately after the connector 100 to be inspected is fitted into the connector contact portion 21a of the inspection jig 1, the front spring 31h and the rear spring 32h are in an extended state, and the distance between the front push block 31i and the front probe holding portion 31c and the distance between the rear push block 32i and the rear probe holding portion 32c are not shortened (second state). At this time, the tongue piece 31a4 of the front flexible board 31a and the tongue piece of the rear flexible board 32a are not in contact with the connector 100 to be inspected.

[0059] As shown in FIG. 12, when the inspection jig 1 moves further downward in the z direction from the second state, the front spring 31h contracts in the z direction, and the front push block 31i approaches the front probe holding portion 31c (third state). At this time, the front push block 31i contacts the upper end of the probe P of the front probe group 31g. Similarly, the rear spring 32h contracts in the z direction, and the rear push block 32i approaches the rear probe holding portion 32c. At this time, the rear push block 32i contacts the upper end of the probe P of the rear probe group 32g. However, the front probe group 31g and the rear probe group 32g do not press down the tongue 31a4 of the front flexible board 31a and the tongue of the rear flexible board 32a, and therefore do not contact the connector 100 to be inspected.

[0060] 13, when the inspection jig 1 moves further downward in the z direction from the third state, the front spring 31h contracts further in the z direction, and the front push block 31i is brought closer to the front probe holding portion 31c (fourth state). At this time, the probes P of the front probe group 31g are pushed down by the front push block 31i. Similarly, the rear push block 32i contracts further in the z direction, and the rear push block 32i is brought closer to the rear probe holding portion 32c. At this time, the probes P of the rear probe group 32g are pushed down by the rear push block 32i.

[0061] As the front push block 31i moves downward in the z direction, the probe P of the front probe group 31g moves downward in the z direction, and the tip P1 of the probe P presses the back side (upper side in the z direction) of the front flexible board 31a. As a result, the tongue 31a4 of the front flexible board 31a is pressed downward in the z direction (see FIG. 14). That is, the probe P of the front probe group 31g brings the tongue 31a4 of the front flexible board 31a closer to the electrode of the connector 100 to be inspected. Similarly, as the rear push block 32i moves downward in the z direction, the probe P of the rear probe group 32g moves downward in the z direction, and the tip P1 of the probe P presses the back side (upper side in the z direction) of the rear flexible board 32a. As a result, the tongue of the rear flexible board 32a is pressed downward in the z direction. That is, the tongue of the rear flexible board 32a is brought close to the electrode of the connector 100 under inspection by the probe P of the rear probe group 32g.

[0062] Therefore, when the front push block 31i is brought close to the front probe holding portion 31c so that the front spring 31h is compressed by a predetermined amount or more, the front push block 31i pushes the probe P of the front probe group 31g, and the probe P of the front probe group 31g pushes the tongue 31a4 of the front flexible board 31a, so that the front flexible board 31a is electrically connected to the connector to be inspected 100. Similarly, when the rear push block 32i is brought close to the rear probe holding portion 32c so that the rear spring 32h is compressed by a predetermined amount or more, the rear push block 32i pushes the probe P of the rear probe group 32g, and the probe P of the rear probe group 32g pushes the tongue of the rear flexible board 32a, so that the rear flexible board 32a is electrically connected to the connector to be inspected 100.

[0063] As a result, the front side flexible board 31a and the rear side flexible board 32a are electrically connected to the inspection target connector 100. In addition, the front side push block 31i and the rear side push block 32i are pushed down to the lowest end of the movable range in the z direction.

[0064] (Effect of using a movable member (such as the front push block 31i) and an expandable member (probe P) in the inspection jig 1) First, the front push block 31i pushes the probe P of the front probe group 31g, and the rear push block 32i pushes the probe P of the rear probe group 32g. The pushed probe P pushes the tongue 31a4 of the front flexible board 31a and the tongue of the rear flexible board 32a, connecting the front flexible board 31a and the rear flexible board 32a to the connector 100 to be inspected. This allows the front flexible board 31a and the rear flexible board 32a included in the inspection jig 1 to be electrically connected to the connector 100 to be inspected without significantly deforming or displacing the front flexible board 31a and the rear flexible board 32a. That is, the front flexible board 31a and the rear flexible board 32a included in the inspection jig 1 to be electrically connected to the connector 100 to be inspected in a state in which the inspection jig 1 including the front flexible board 31a and the rear flexible board 32a is not easily damaged.

[0065] (Effect of disposing the movable member (such as the front push block 31i) closer to the bracket 45 than to the support portion 43) At least a part of each of the right support member 43a, the movable members (front push block 31i, rear push block 32i), and the left support member 43b can be aligned in a direction perpendicular to the first direction (y direction). Specifically, at least a part of each of the right support member 43a, the front push block 31i, and the left support member 43b overlap when viewed from the y direction. Also, at least a part of each of the right support member 43a, the rear push block 32i, and the left support member 43b overlap when viewed from the y direction. Therefore, the members can be efficiently arranged, and the dimension of the inspection jig 1 in the z direction can be reduced. By reducing the dimension of the inspection jig 1 in the z direction, the load when adjusting the deviation in the xy direction using the support part 43 can be reduced.

[0066] (Effect of Providing a Notch in the Third Region 45c of the Bracket 45) The upper end portion of the front board assembly 31 (such as the front connector 31b) and the upper end portion of the rear board assembly 32 (such as the rear connector 32) can be stored in the cutout, thereby reducing the z-direction dimension of the inspection jig 1.

[0067] (The effect of preventing the distance between the front push block 31i and the bracket 45 in the z direction from fluctuating) Except for the movement in the xy directions by the support part 43, the front push block 31i and the rear push block 32i are fixed to the bracket 45 in a desired posture. This makes it possible to prevent damage to the inspection jig 1 or the connector 100 to be inspected even if the inspection jig 1 and the connector 100 to be inspected are attached in an inclined state.

[0068] (The effect of preventing fluctuation in the distance in the z direction between the front probe holding portion 31c and the area in contact with the housing of the connector 100 to be inspected) The front probe holding portion 31c and the rear probe holding portion 32c are fixed to the lower holding portion 21 in a desired posture. This makes it possible to prevent damage to the inspection jig 1 or the connector 100 to be inspected even if the inspection jig 1 and the connector 100 to be inspected are attached in an inclined state.

[0069] (Effect of pressing individually with probe P) Taking into account the variation in height of the portion (electrode) of the signal line or ground line that comes into contact with the connector 100 under test, an expandable member such as a probe P can be pressed against each electrode individually, making it possible to reliably connect each electrode to the connector 100 under test.

[0070] (Effect of Providing Tongues on the Front Flexible Board 31a and the Rear Flexible Board 32a) When an elastic member such as a probe P is pressed against the flexible substrate 31a and a force is applied to the flexible substrate 31a in a region including the portion to which the force is applied, the tongue 31a4 of the front flexible substrate 31a is displaced in the pushed direction (downward in the z direction) away from other regions adjacent to the tongue 31a4 of the front flexible substrate 31a through the slit S. Also, the tongue of the rear flexible substrate 32a is displaced in the pushed direction (downward in the z direction) away from other regions adjacent to the tongue of the rear flexible substrate 32a through the slit S. Therefore, the flexible substrates (front flexible substrate 31a, rear flexible substrate 32a) are less likely to be damaged even if displaced, compared to a case where no tongue is provided.

[0071] (Effect of using the edge as an electrode) If an electrical connection is made to another component in the middle of a signal line, the area between the connection point and the end may function as an antenna, causing noise to be transmitted or received. By electrically connecting to another component near the end, it is possible to reduce the amount of noise transmitted or received. However, if an electrical connection is made to another component in the middle of a ground line, impedance matching may be lost.

[0072] (Other embodiments, telescopic members other than probes) In this embodiment, the probe P is used as an elastic member that pushes the front flexible substrate 31a downward in the z direction from the rear side (upper side in the z direction) and the rear flexible substrate 32a downward in the z direction from the rear side (upper side in the z direction). However, the elastic member is not limited to the probe P, and other elastic members such as rubber may be used as long as they are elastic in the z direction.

[0073] (Other embodiments, elastic members other than springs) In the present embodiment, the front spring 31h is provided between the front probe holding portion 31c and the front push block 31i, and the rear spring 32h is provided between the rear probe holding portion 32c and the rear push block 32i. However, the present embodiment is not limited to the spring, and any other elastic member may be used as long as the member is expandable and contractible in the z direction.

[0074] (Other embodiments, substrate) In the present embodiment, the substrate built into the inspection jig 1 has been described as being flexible. However, the substrate built into the inspection jig 1 may be a non-flexible substrate.

[0075] Although some embodiments of the present invention have been described, these embodiments are presented as examples and are not intended to limit the scope of the invention. These embodiments can be implemented in various other forms, and various omissions, substitutions, and modifications can be made without departing from the spirit of the invention. These embodiments and their modifications are included in the scope of the invention and its equivalents described in the claims, as well as in the scope and spirit of the invention.

[0076] According to the present specification, there is provided an inspection tool having the following aspects. (Aspect 1) Aspect 1 comprises a substrate that can be electrically connected to the connector to be tested, a movable movable member, an expandable and contractable member, an expandable member holding portion that holds the expandable member, and an elastic member that biases the movable member and the expandable member holding portion away from each other, and when the movable member is brought closer to the expandable member holding portion so that the elastic member contracts by a predetermined amount or more, the movable member pushes the expandable member, and the expandable member pushes the substrate, so that the substrate is electrically connected to the connector to be tested.

[0077] According to the above-mentioned aspect, the movable member first presses the expandable member. The expanded member presses the board, electrically connecting the board to the connector under test. This makes it possible to electrically connect the board included in the inspection jig to the connector under test without significantly deforming or displacing the board. In other words, it is possible to electrically connect the board included in the inspection jig to the connector under test without damaging the inspection jig including the board.

[0078] (Aspect 2) A second aspect further includes a support portion and a bracket that holds the movable member in a state in which the movable member can move in a direction perpendicular to the first direction via the support portion, and the movable member is positioned closer to the bracket than the support portion.

[0079] According to the above-mentioned aspect, the members can be efficiently arranged, and the dimension of the inspection jig in the first direction can be reduced. By reducing the dimension of the inspection jig in the first direction, the load when adjusting the misalignment in the direction perpendicular to the first direction using the support part can be reduced.

[0080] (Aspect 3) In a third aspect, the front substrate further includes a connector used for electrically connecting to an inspection device, and the bracket has a notch for accommodating the connector.

[0081] According to the above-described aspect, the dimension of the inspection jig in the first direction can be reduced.

[0082] (Aspect 4) In a fourth aspect, the movable member is attached to the bracket via the support portion in a state in which the distance between the movable member and the bracket in the first direction does not change.

[0083] According to the above-mentioned aspect, the movable member is fixed to the bracket in a desired posture, except for the movement by the support part in the direction perpendicular to the first direction, so that even if the inspection jig and the connector to be inspected are attached in an inclined state, damage to the inspection jig or the connector to be inspected can be prevented.

[0084] (Aspect 5) A fifth aspect further includes a member that contacts the housing of the connector to be inspected, and the elastic member holding portion is attached to the member without changing the distance in the first direction between the area of ​​the member that contacts the housing.

[0085] According to the above-mentioned aspect, the elastic member holding portion is fixed to the member that contacts the housing of the connector under test in a desired posture. This makes it possible to prevent damage to the inspection jig or the connector under test even if the inspection jig and the connector under test are attached in an inclined state. [Explanation of symbols]

[0086] 1 inspection jig, 20 board holding part, 21 lower holding part (work guide, member that contacts the housing of the connector to be inspected), 21a connector contact part, 23 upper holding part (connection plate), 23a upper right holding member, 23b upper left holding member, 30 board part, 31 front board assembly, 31a front flexible board (flexible board), 31a1 connector connection end, 31a2 holding part connection end, 31a21 hole, 31a3 pattern part, 31a4 tongue, 31b front connector, 31c front probe holding part (expandable member holding part), 31c1 probe receiving part, 31c11 above the hole of the probe receiving part, 31c12 below the hole of the probe receiving part, 31d front connector base, 31f front connector cover, 31g front probe group, 31h front spring (elastic member), 31i front push block (movable member), 32 rear board assembly, 32a rear flexible board (flexible board), 32b rear connector, 32c rear probe holder (retractable member holder), 32d rear connector base, 32f rear connector cover, 32g rear probe group, 32h rear spring (elastic member), 32i rear push block (movable member), 40 horizontal position adjustment section, 43 support section, 43a right support member, 43b left support member, 45 bracket, 45a first region, 45b second region, 45c third region, 100 connector to be inspected, P probe (retractable member), P1 tip, P2 spring housing section, S slit

Claims

1. An inspection jig that electrically connects a substrate and a connector to be inspected by pressing and displacing the substrate with an elastic member, a movable member that presses the extensible member in a first direction; a bracket for holding the movable member, The bracket holds the movable member so that the movable member can press the extensible member without changing the distance in the first direction between the movable member and the bracket.

2. An elastic member holding portion that holds the elastic member; an elastic member that biases the movable member and the expandable member holding portion so as to move them apart from each other; 2. The inspection jig of claim 1, wherein when the movable member is brought closer to the expandable member holding portion so that the elastic member contracts by a predetermined amount or more, the movable member pushes the expandable member, which in turn pushes the circuit board, so that the circuit board becomes electrically connected to the connector to be inspected.

3. The movable member further includes a support portion that supports the movable member in a state in which the movable member can move in a second direction perpendicular to the first direction; the bracket holds the movable member via the support portion, The inspection jig according to claim 1 or 2, wherein the movable member is disposed at a position closer to the bracket than the support portion.

4. the front substrate includes a connector for electrically connecting to an inspection device; The inspection jig according to claim 1 , wherein the bracket has a notch for accommodating the connector.

5. Further, a member that comes into contact with the housing of the connector to be inspected is provided, The inspection jig according to claim 2 , wherein the expandable member holding portion is attached to the member in a state in which the distance in the first direction from the region of the member that contacts the housing does not change.

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