Optical double Fabry-Perot interferometer film

The optical dual Fabry-Perot interferometer film with dual cavity layers addresses the complexity and cost issues of existing optical films by enhancing color purity through thickness adjustments, eliminating the need for patterning and reducing manufacturing costs.

JP2024546468AActive Publication Date: 2024-12-24KYUNGPOOK NAT UNIV IND ACADEMIC COOP FOUND
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Patent Information

Application Number
JP2024533119
Authority / Receiving Office
JP · JP
Patent Type
Applications
Current Assignee / Owner
Priority Date
2021-12-02
Filing Date
2022-12-01
Publication Date
2024-12-24
Estimated Expiration
2042-12-01

AI Technical Summary

Technical Problem

Existing optical films for improving color purity in optoelectronic devices require complex patterning processes and are costly, particularly for Fabry-Perot interferometers, which complicate the manufacturing of displays with high color reproduction rates.

Method used

An optical dual Fabry-Perot interferometer film with dual cavity layers, utilizing dielectric and metal thin films, that eliminates the need for patterning by adjusting the thickness of each cavity layer to achieve resonance in specific wavelength bands, enhancing color purity of primary colors.

Benefits of technology

The film simultaneously improves the color purity of red, green, and blue light without patterning, reducing manufacturing costs and time, suitable for large-area displays and lighting applications.

✦ Generated by Eureka AI based on patent content.

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Abstract

The present invention relates to an optical dual Fabry-Perot interferometer film, and more particularly to a technique for enhancing color purity using a dual cavity layer. An optical dual Fabry-Perot interferometer film according to an embodiment of the present invention includes a first anti-reflection layer, a second anti-reflection layer formed on the first anti-reflection layer, and first and second cavity regions formed between the first and second anti-reflection layers.
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Description

[Technical field]

[0001] The present invention relates to optical dual Fabry-Perot interferometer films, and in particular to a technique for enhancing color purity using dual cavity layers.

[0002] The present invention was derived from research conducted as part of the following electronic components industry technology development (R&D) project.

[0003] Information on national research and development issues related to this patent is as follows: Project unique number: 1415173989 Issue number: 20016350 Name of the ministry responsible for the project: Ministry of Trade, Industry and Energy Issue management (specialized) agency name: Korea Institute for Industrial Technology Evaluation and Management Research project name: Electronic Components Industry Technology Development (R&D) Research title: Development of ultra-high quality, long-life color conversion materials, processes, and core modules for the fabrication of ultra-large micro LED displays Project implementation organization name: Fine Love Co., Ltd. This work was supported by the Technology Innovation Program (20016350, Development of ultra high quality with long lifetime of color converting material, process and module for extremely large-area micro LED display) funded By the Ministry of Trade, Industry & Energy(MOTIE, Korea). [Background technology]

[0004] Various technologies are being researched to improve the color purity of light extracted from optoelectronic devices such as self-emitting devices (OLED, QLED, uLED) and liquid crystal displays. Displays using optoelectronic devices can express various colors through the three primary colors (RGB). The higher the color purity of the three primary colors, the higher the color reproduction rate of the display, which plays an important role in realizing all colors expressed in reality. In order to improve the purity of the three primary colors of light extracted from optoelectronic devices to the outside, there are various optical films and filters such as photonic crystals, Fabry-Perot interferometers, quantum dots, and surface plasmons composed of hole / dot array patterns. In order to improve the color purity of the three primary colors, the structure of the optical film is different for each of the three primary colors. In the case of a Fabry-Perot interferometer, a patterning process is required because the thickness of the cavity differs for each of the three primary colors, and many issues remain to be improved in terms of process and cost. Summary of the Invention [Problem to be solved by the invention]

[0005] An object of the present invention is to provide an optical film having high color purity.

[0006] It is also an object of the present invention to provide an optical film with a dual cavity layer.

[0007] Another object of the present invention is to provide an optical film capable of simultaneously increasing the color purity of the three primary colors.

[0008] Another object of the present invention is to provide an optical film that can be easily produced.

[0009] It is also an object of the present invention to provide an optical film that does not require a patterning operation during its manufacture.

[0010] Another object of the present invention is to provide an optical film capable of reducing the production cost. [Means for solving the problem]

[0011] According to one aspect of the present invention, an optical dual Fabry-Perot interferometer film is disclosed, the optical dual Fabry-Perot interferometer film including a first anti-reflective layer, a second anti-reflective layer formed on top of the first anti-reflective layer, and first and second cavity regions formed between the first and second anti-reflective layers.

[0012] In one embodiment, the optical dual Fabry-Perot interferometer film includes a first reflective layer formed on the top of the first anti-reflective layer, a second reflective layer formed on the top of the first reflective layer, and a third reflective layer formed between the second reflective layer and the second anti-reflective layer, and the first cavity region may be the first cavity layer formed between the first reflective layer and the second reflective layer, and the second cavity region may be the second cavity layer formed between the second reflective layer and the third reflective layer.

[0013] In one embodiment, the first cavity region is capable of generating a first order resonance in a particular wavelength band of light incident on the first cavity region.

[0014] In one embodiment, the second cavity region is capable of generating higher order resonances in a particular wavelength band of light incident on the second cavity region.

[0015] In one embodiment, the resonant order of the higher order resonance in the second cavity region may be determined by the thickness of the second cavity region.

[0016] In one embodiment, the thickness of the first cavity region may determine the spectral distribution of light transmitted through the optical dual Fabry-Perot interferometer film.

[0017] In one embodiment, the thickness of the first cavity region may be between 20 nm and 250 nm.

[0018] In one embodiment, the peak positions and color purity of the red, green, and blue resonant wavelengths of light transmitted through the optical dual Fabry-Perot interferometer film may be determined by the thickness of the second cavity region.

[0019] In one embodiment, the thickness of the second cavity region may be between 200 nm and 1000 nm.

[0020] In an embodiment, at least one of the first anti-reflective layer, the second anti-reflective layer, the first cavity region, and the second cavity region may include a dielectric material.

[0021] In one embodiment, the dielectric material may include inorganic or organic materials that are transparent and have low optical loss. For example, SiN x , Al2O3, SiO2, HfO2, WO3, TiO2, MoO3, ZnO, Ta2O5, V2O5, LiF and ZnS, or at least one organic material selected from PVP, PVC, PI, PMMA, NPB, TCTA and TPBi, but is not limited to the above dielectric materials.

[0022] In one embodiment, at least one of the first reflective layer, the second reflective layer and the third reflective layer may be formed of a semi-transparent reflector.

[0023] In one embodiment, the reflector may be formed from a thin metal film.

[0024] In one embodiment, the first reflective layer, the second reflective layer and the third reflective layer may be metal thin films having a thickness of 1 nm to 35 nm.

[0025] In one embodiment, the metal thin film may include at least one of gold (Au), silver (Ag), aluminum (Al), tungsten (W) and molybdenum (Mo).

[0026] In one embodiment, the metal thin film may include at least one of gold, silver, and aluminum alloy materials.

[0027] In one embodiment, the optical dual Fabry-Perot interferometer film can further include a substrate formed on top of the second anti-reflection layer.

[0028] In one embodiment, the substrate may be at least one of a glass substrate, an insulating polymer substrate, and a substrate having transparent properties, such as a semiconductor substrate.

[0029] In one embodiment, the substrate may be a transparent flexible substrate.

[0030] According to another aspect of the present invention, an optical dual Fabry-Perot interferometer film may include a first anti-reflection layer, a first reflection layer formed on top of the first anti-reflection layer, a second reflection layer formed on top of the first reflection layer, a first cavity layer formed between the first reflection layer and the second reflection layer, a third reflection layer formed on top of the second reflection layer, a second cavity layer formed between the second reflection layer and the third reflection layer, and a second anti-reflection layer formed on top of the third reflection layer. Effect of the Invention

[0031] According to one aspect of the present invention, it is possible to increase the color purity of an optical film.

[0032] According to another aspect of the present invention, there is provided an optical film with a dual cavity layer.

[0033] According to still another aspect of the present invention, it is possible to simultaneously improve the color purity of the three primary colors of an optical film through one film structure.

[0034] Furthermore, according to still another aspect of the present invention, it becomes possible to produce an optical film through a simple manufacturing process.

[0035] Furthermore, according to yet another aspect of the present invention, an optical film is made possible that does not require a patterning operation during manufacture.

[0036] Furthermore, according to still another aspect of the present invention, it is possible to reduce the manufacturing costs of the optical film. [Brief description of the drawings]

[0037] [Figure 1] FIG. 2 is a diagram showing the structure of an optical dual Fabry-Perot interferometer film according to one embodiment of the present invention. [Diagram 2] FIG. 2 illustrates parameters of an optical dual Fabry-Perot interferometer film according to one embodiment of the present invention. [Diagram 3] FIG. 13 is a diagram showing the calculated transmittance of light transmitted to a first cavity layer through a first reflective layer according to an embodiment of the present invention. [Figure 4] FIG. 2 is a diagram showing the calculated Fabry-Perot factor of a first cavity layer and the transmittance of light transmitted to a second cavity layer through a second reflective layer according to an embodiment of the present invention. [Diagram 5] 13 is a diagram showing the calculated Fabry-Perot factor of the second cavity layer and the transmittance of light transmitted to the outside through the third reflective layer according to an embodiment of the present invention. FIG. [Figure 6] FIG. 13 is a diagram showing the transmittance of an optical dual Fabry-Perot interferometer film using optical simulation according to one embodiment of the present invention. [Figure 7] 1 is a diagram showing an example in which an optical dual Fabry-Perot interferometer film according to an embodiment of the present invention is applied; [Figure 8] 13 is a view showing another example in which an optical dual Fabry-Perot interferometer film according to an embodiment of the present invention is applied. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0038] Specific structural or functional descriptions of embodiments in accordance with the inventive concepts disclosed herein are provided solely for purposes of illustrating embodiments in accordance with the inventive concepts, which may be embodied in various forms and are not limited to the embodiments described herein.

[0039] Since the embodiments according to the concept of the present invention can be modified in various ways and can have various forms, the embodiments are illustrated in the drawings and described in detail herein, but it is not intended to limit the embodiments according to the concept of the present invention to the particular disclosed forms, and includes modifications, equivalents, or alternatives within the spirit and technical scope of the present invention.

[0040] Terms such as "first" or "second" may be used to describe various components, but the components should not be limited by the terms. The terms are used only for the purpose of distinguishing one component from another component, for example, a first component may be named a second component, and similarly, a second component may be named a first component, without departing from the scope of the inventive concept.

[0041] When an element is referred to as being "coupled" or "connected" to another element, it should be understood that although it may be directly coupled or connected to the other element, there may be other elements between the elements. Conversely, when an element is referred to as being "directly coupled" or "directly connected" to another element, it should be understood that there are no other elements between the elements. Expressions describing the relationship between elements, such as "between," "immediately between," or "directly adjacent to," should be interpreted in the same manner.

[0042] The terms used in this specification are merely used to describe certain embodiments and are not intended to limit the present invention. The singular term includes the plural term unless the context clearly indicates otherwise. In this specification, the terms "include" or "have" are intended to specify the presence of features, numbers, steps, operations, components, parts, or combinations thereof described in the specification, and should be understood not to preclude the presence or additional possibility of one or more other features, numbers, steps, operations, components, parts, or combinations thereof.

[0043] Unless otherwise defined, all terms used herein, including technical or scientific terms, have the same meaning as commonly understood by a person of ordinary skill in the art to which the present invention belongs. Terms as defined in commonly used dictionaries should be interpreted as having a meaning consistent with the meaning they have in the context of the relevant art, and should not be interpreted in an ideal or overly formal sense unless expressly defined in this specification.

[0044] Hereinafter, embodiments will be described in detail with reference to the accompanying drawings. However, the scope of the patent application is not limited or restricted by such embodiments. The same reference numerals in each drawing indicate the same elements.

[0045] FIG. 1 is a diagram showing the structure of an optical dual Fabry-Perot interferometer film according to one embodiment of the present invention.

[0046] Referring to FIG. 1 , an optical dual Fabry-Perot interferometer film 1000 may include a first anti-reflection layer 1100, a first reflective layer 1200, a first cavity layer 1300, a second reflective layer 1400, a second cavity layer 1500, a third reflective layer 1600, a second anti-reflection layer 1700, and a substrate 1800.

[0047] The first anti-reflection layer 1100 (anti-reflection film 1) is transparent and can include a dielectric material with low optical loss. For example, the dielectric material can be SiN x , Al2O3, SiO2, HfO2, WO3, TiO2, MoO3, ZnO, Ta2O5, V2O5, LiF and ZnS, or at least one organic material selected from PI, PMMA, NPB, TCTA and TPBi, but is not limited to the dielectric material.

[0048] In one embodiment, the amount of light transmitted to the first cavity layer 1300 through the first anti-reflection layer 1100 can be controlled to be different depending on the thickness of the first anti-reflection layer 1100 .

[0049] The first reflective layer 1200 (reflector 1 ) may be a semi-transparent thin metal film formed on top of the first anti-reflective layer 1100 , ie, between the first anti-reflective layer 1100 and the first cavity layer 1300 .

[0050] In one embodiment, the first reflective layer may be a metal thin film having a thickness of 1 nm to 35 nm.

[0051] In one embodiment, the metal thin film may include at least one of gold (Au), silver (Ag), aluminum (Al), tungsten (W) and molybdenum (Mo).

[0052] In one embodiment, the metal thin film may include at least one of gold, silver, and aluminum alloy materials.

[0053] A first cavity layer 1300 (active cavity) may be formed on top of the first reflective layer 1200 , ie, between the first reflective layer 1200 and the second reflective layer 1400 .

[0054] In one embodiment, the first cavity layer 1300 may cause a first resonance phenomenon in a first preset wavelength band. That is, in the first cavity layer 1300, the light transmitted to the first cavity layer 1300 through the first anti-reflection layer 1100 may be multiple-reflected by the first reflective layer 1200 and the second reflective layer 1400, thereby causing the first resonance. In addition, the light in which the first resonance occurs may be transmitted to the second cavity layer 1500 through the second reflective layer 1400. In this case, the thickness of the first cavity layer 1300 may be adjusted so that the first resonance occurs.

[0055] In one embodiment, the first preset wavelength band may be determined according to the intended use of the optical dual Fabry-Perot interferometer film 1000 according to one embodiment of the present invention, and may be controlled by the thickness of the first cavity layer 1300. As a specific example, in FIG. 6, when the thickness of the first cavity layer 1300 is set so that the first preset wavelength of the first resonance is 700 nm, it can be confirmed that the spectral distribution of the light transmitted through the first cavity layer 1300 has maximum transmittance near the first preset wavelength of 700 nm.

[0056] In one embodiment, the thickness of the first cavity region may be between 20 nm and 250 nm.

[0057] In one embodiment, the thickness of the first cavity layer 1300 can control the spectral distribution of the light transmitted to the second cavity layer 1500 .

[0058] In one embodiment, the first cavity layer 1300 can include a dielectric material that is transparent and has low optical loss. For example, the dielectric material can be SiN x , Al2O3, SiO2, HfO2, WO3, TiO2, MoO3, ZnO, Ta2O5, V2O5, LiF and ZnS, or at least one organic material selected from PVP, PVC, PI, PMMA, NPB, TCTA and TPBi, but is not limited to the dielectric material.

[0059] The second reflective layer 1400 (reflector 2 ) may be a semi-transparent thin metal film formed on top of the first cavity layer 1300 , ie, between the first cavity layer 1300 and the second cavity layer 1500 .

[0060] In one embodiment, the second reflective layer may be a metal thin film having a thickness of 1 nm to 35 nm.

[0061] In one embodiment, the metal thin film may include at least one of gold (Au), silver (Ag), aluminum (Al), tungsten (W) and molybdenum (Mo).

[0062] In one embodiment, the metal thin film may include at least one of gold, silver, and aluminum alloy materials.

[0063] A second cavity layer 1500 (external cavity) may be formed on top of the second reflective layer 1400 , ie, between the second reflective layer 1400 and the third reflective layer 1600 .

[0064] In one embodiment, the second cavity layer 1500 can comprise a dielectric material that is transparent and has low optical loss. For example, the dielectric material can be SiN x , Al2O3, SiO2, HfO2, WO3, TiO2, MoO3, ZnO, Ta2O5, V2O5, LiF and ZnS, or at least one organic material selected from PVP, PVC, PI, PMMA, NPB, TCTA and TPBi, but is not limited to the dielectric material.

[0065] In one embodiment, the second cavity layer 1500 may cause a high-order (2nd, 3rd, 4th, etc.) resonance phenomenon in the second preset wavelength band. That is, in the second cavity layer 1500, the light transmitted to the second cavity layer 1500 through the second anti-reflection layer 1700 is multiple-reflected by the second reflective layer 1400 and the third reflective layer 1600, so that a high-order resonance may occur. At this time, the resonance order of the high-order resonance phenomenon occurring in the second cavity layer 1500 may be controlled by the thickness of the second cavity layer 1500. For example, the thicker the second cavity layer 1500 is, the higher the resonance order may be. That is, the light that has undergone a first resonance in the first cavity layer 1300 undergoes a second or higher order resonance in the second cavity layer 1500.

[0066] In one embodiment, the second preset wavelength band may be determined according to the intended use of the optical dual Fabry-Perot interferometer film 1000 according to one embodiment of the present invention, and may be controlled by the thickness of the second cavity layer 1500. As a specific example, in FIG. 6, when the thickness of the second cavity layer 1500 is set so that the second preset wavelength of the high-order resonance is 630 nm, the light transmitted through the second cavity layer 1500 may have a transmission spectrum having peaks in wavelength bands such as 630 nm, 540 nm, and 460 nm.

[0067] In one embodiment, the thickness of the second cavity region may be between 200 nm and 1000 nm.

[0068] In one embodiment, the peak position and color purity of a specific resonance wavelength of light transmitted through the second cavity layer 1500 can be adjusted depending on the thickness of the second cavity layer 1500. That is, the spectral width of each RGB color can be narrowed depending on the thickness of the second cavity layer 1500, so that color purity can be improved. That is, since the thickness of the first cavity layer 1300 and the second cavity layer 1500 can be made the same for all RGB colors, a patterning process for having cavity layers of different thicknesses for each RGB color is not required during the manufacture of the optical film. Therefore, since a patterning process is not required during the manufacture of the optical dual Fabry-Perot interferometer film 1000 according to the present invention, it is possible to reduce the manufacturing time and manufacturing costs. In addition, such characteristics may be advantageous for implementing devices such as large-area displays and lighting.

[0069] The third reflective layer 1600 (reflector 3 ) may be a semi-transparent metal thin film formed on top of the second cavity layer 1500 , ie, between the second cavity layer 1500 and the second anti-reflection layer 1700 .

[0070] In one embodiment, the third reflective layer may be a metal thin film having a thickness of 1 nm to 35 nm.

[0071] In one embodiment, the metal thin film may include at least one of gold (Au), silver (Ag), aluminum (Al), tungsten (W) and molybdenum (Mo).

[0072] In one embodiment, the metal thin film may include at least one of gold, silver, and aluminum alloy materials.

[0073] The second anti-reflection layer 1700 (anti-reflection film 2) may be formed on the upper portion of the third reflective layer 1600, i.e., between the third reflective layer 1600 and the substrate 1800. In this case, the second anti-reflection layer 1700 may affect the reflectance generated at the interface between the second cavity layer 1500 and the third reflective layer 1600, and the spectrum of light transmitted through the optical dual Fabry-Perot interferometer film 1000 to the outside.

[0074] In one embodiment, the second anti-reflective layer 1700 can comprise a dielectric material that is transparent and has low optical loss. For example, the dielectric material can be SiN x , Al2O3, SiO2, HfO2, WO3, TiO2, MoO3, ZnO, Ta2O5, V2O5, LiF and ZnS, or at least one organic material selected from PVP, PVC, PI, PMMA, NPB, TCTA and TPBi, but is not limited to the dielectric material.

[0075] A substrate 1800 is formed on the top of the second anti-reflection layer, and may be at least one of a glass substrate, an insulating polymer substrate, and a substrate having transparent properties, such as a semiconductor substrate.

[0076] In one embodiment, the substrate 1800 may be a transparent flexible substrate.

[0077] In addition, the resonance phenomenon of the first cavity layer 1300 and the second cavity layer 1500 can be controlled by adjusting the effective optical distances of the first cavity layer 1300 and the second cavity layer 1500 .

[0078] FIG. 2 is a diagram illustrating parameters of an optical dual Fabry-Perot interferometer film according to one embodiment of the present invention.

[0079] 2, important parameters for designing the transmittance of the optical double Fabry-Perot interferometer film are shown. Here, the transmittance of the optical double Fabry-Perot interferometer film can be derived through the following Equation 1.

[0080]

number

[0081] In formula 1, n0, n 12 , n 34 n and n4 are the refractive indices of the layers, t1 is the transmission coefficient through the first antireflection layer 1100 and the first reflective layer 1200, t2 is the transmission coefficient through the second reflective layer 1400, t4 is the transmission coefficient through the third reflective layer 1600 and the second antireflection layer 1700, r1 is the reflection coefficient between the first cavity layer 1300 and the first reflective layer 1200, r2 is the reflection coefficient between the first cavity layer 1300 and the second reflective layer 1400, r3 is the reflection coefficient between the second cavity layer 1500 and the second reflective layer 1400, r4 is the reflection coefficient between the second cavity layer 1500 and the third reflective layer 1600, R 12 is |r1r2|, R 34 is |r3r4|, Δφ 12 is the phase change occurring inside the first cavity layer 1300, Δφ 34 may represent a phase change occurring inside the second cavity layer 1500. Equation 1 may be expressed as a product of the transmittance of light transmitted into the first cavity layer 1300 through the first reflective layer 1200, the Fabry-Perot factor of the first cavity layer 1300, and the Fabry-Perot factor of the second cavity layer 1500.

[0082] Δφ 12 The formula that satisfies the constructive interference condition can be expressed as the following formula 2.

[0083] Δφ 12 =-φ1-φ2+2n 12 d 12 k0=2mπ(m=0) (Equation 2)

[0084] Equation 2 indicates that constructive interference occurs in the first cavity layer 1300, and when m=0, a first-order resonant mode may be exhibited in a specific wavelength band. φ1 may indicate a phase change occurring between the first cavity layer 1300 and the first reflective layer 1200, φ2 may indicate a phase change occurring between the first cavity layer 1300 and the second reflective layer 1400, and the thickness (d 12 ) can be adjusted to reveal a resonant wavelength, which can be related to the spectral distribution of light transmitted externally through the optical dual Fabry-Perot interferometer film 1000.

[0085] Δφ 34 The formula that satisfies the constructive interference condition can be expressed as the following formula 3.

[0086] Δφ 34 =-φ3-φ4+2n 34 d 34 k0=2mπ(m=1,2,3,…) (Equation 3)

[0087] Equation 3 indicates that constructive interference occurs in the second cavity layer 1500, and may indicate a high-order resonance mode (m=1, 2, 3, ...) in a specific wavelength band. φ3 may indicate a phase change occurring between the second cavity layer 1500 and the second reflective layer 1400, φ4 may indicate a phase change occurring between the second cavity layer 1500 and the third reflective layer 1600, and the thickness (d 34 ) can be adjusted to produce multiple resonant wavelengths. This can be related to the peak positions of multiple resonant wavelength bands of light transmitted to the outside through the double Fabry-Perot interferometer film 1000 and the improvement of color purity in each wavelength band.

[0088] FIG. 3 is a graph showing the calculated transmittance of light transmitted to the first cavity layer through the first reflective layer 1200 according to an embodiment of the present invention.

[0089] The light transmittance shown in FIG.

[0090]

number

[0091] The light spectrum calculated by Equation 4 of FIG. 3 can be adjusted by the thickness of the transparent and low-light-loss dielectric material of the first antireflection layer 1100, and by the thickness of the semi-transparent metal thin film of the first reflective layer 1200. It can also be adjusted by the refractive index of each layer. Here, the calculated transmittance can be defined as a first transmittance. This can be controlled so that the amount of light transmitted to the first cavity layer 1300 through the first antireflection layer 1100 is different.

[0092] FIG. 4 is a diagram showing the calculated Fabry-Perot factor of the first cavity layer 1300 and the transmittance of light transmitted through the second reflective layer 1400 to the second cavity layer 1500 according to one embodiment of the present invention.

[0093] The Fabry-Perot factor of the first cavity layer 1300 shown in FIG. 4 and the transmittance of light transmitted to the second cavity layer 1500 through the second reflective layer 1400 can be expressed by the following Equation 5.

[0094]

number

[0095] The second transmittance, which is the transmittance of light transmitted to the second cavity layer 1500 through the second reflective layer 1400 calculated by Equation 5 of FIG. 4, can be expressed as the product of the first transmittance and the Fabry-Perot factor_active cavity of the first cavity layer 1300. A peak can be shown in a specific wavelength band due to a resonance phenomenon occurring in the first cavity layer 1300. This peak can appear in a resonance wavelength band that satisfies the first resonance mode by adjusting the thickness of the first cavity layer 1300 in Equation 2. This can determine the spectral distribution of light transmitted through the optical dual Fabry-Perot interferometer film 1000.

[0096] FIG. 5 is a diagram showing the calculated Fabry-Perot factor of the second cavity layer 1500 and the transmittance of light transmitted to the outside through the third reflective layer 1600 according to an embodiment of the present invention.

[0097] The Fabry-Perot factor of the second cavity layer 1500 and the transmittance of light transmitted to the outside through the third reflective layer 1600 shown in FIG.

[0098] In FIG. 5, the final transmittance, which is the transmittance of light transmitted to the outside through the third reflective layer 1600 calculated by Equation 1, can be expressed as the product of the first transmittance, the second transmittance, and the Fabry-Perot factor_external cavity of the second cavity layer 1500. Due to the resonance phenomenon occurring in the second cavity layer 1500, multiple peaks can be shown in a specific wavelength band. This peak can appear in a resonance wavelength band that satisfies a high-order resonance mode by adjusting the thickness of the second cavity layer 1500 in Equation 2. This allows the position and color purity of a specific resonance wavelength of light transmitted through the optical dual Fabry-Perot interferometer film 1000 to be adjusted. Through Equation 1, the final transmittance can represent the transmittance of light transmitted through the optical dual Fabry-Perot interferometer film 1000.

[0099] FIG. 6 is a diagram showing the transmittance of an optical dual Fabry-Perot interferometer film using optical simulation according to one embodiment of the present invention.

[0100] Referring to FIG. 6, the spectral distribution of light transmitted through the first cavity layer 1300 (active cavity) of the optical dual Fabry-Perot interferometer film 1000 and the light transmitted through the first cavity layer 1300 (active cavity) and then transmitted through the second cavity layer 1500 (external cavity) of the optical dual Fabry-Perot interferometer film 1000 is shown. The spectral distribution of the transmitted light is consistent with the transmittance calculated above. The spectral distribution of the light shown in FIG. 6 can be determined by the thickness of the first cavity layer 1300 of the optical dual Fabry-Perot interferometer film 1000. When the light transmitted through the first cavity layer 1300 is transmitted through the second cavity layer 1500, a spectral distribution having multiple peak values ​​at a specific wavelength can be obtained. In FIG. 6, it can be seen that three peaks of red (R, red), green (G, green), and blue (B, blue) are generated. At this time, the red transmittance is 0.65, the green transmittance is 0.48, and the blue transmittance is 0.25. The red peak occurs at 630 nm, the green peak occurs at 532 nm, and the blue peak occurs at 460 nm. The full width at half maximum is 18 nm for red, 11 nm for green, and 10 nm for blue. Therefore, in one embodiment of the present invention, the optical dual Fabry-Perot interferometer film 1000 shows three peaks simultaneously in the red, green, and blue wavelength bands, and it can be confirmed that the color purity is improved due to the narrow full width at half maximum (FWHM).

[0101] FIG. 7 is a diagram showing an example in which an optical dual Fabry-Perot interferometer film according to an embodiment of the present invention is applied.

[0102] 7, an optical dual Fabry-Perot interferometer film 1000 applied to a top-emitting self-emitting device is shown. In the optical dual Fabry-Perot interferometer film 1000 disposed on the top surface of the top-emitting self-emitting device, red, green and blue light emitted from the top-emitting self-emitting device is transmitted to the first cavity layer 1300 through the first anti-reflection layer 1100 of the optical dual Fabry-Perot interferometer film 1000, and a first-order resonance occurs in a specific wavelength band. The light transmitted through the first cavity layer 1300 is transmitted through the second cavity layer 1500, and a higher-order resonance occurs, so that red, green and blue light with high color purity can be transmitted to the outside.

[0103] In one embodiment, the top-emitting self-luminous element may be an OLED, a QLED, a uLED, etc.

[0104] In one embodiment, an optical clear adhesive (OCA) may be used to adhere to the bottom of the first anti-reflection layer 1100 of the optical dual Fabry-Perot interferometer film 1000 .

[0105] FIG. 8 is a view showing another example to which an optical dual Fabry-Perot interferometer film according to an embodiment of the present invention is applied.

[0106] 8, an optical dual Fabry-Perot interferometer film 1000 applied to a back-emitting self-emitting device is shown. In the optical dual Fabry-Perot interferometer film 1000 disposed on the lower surface of the back-emitting self-emitting device, red, green and blue light emitted from the back-emitting device is transmitted to the first cavity layer 1300 via the first anti-reflection layer 1100 of the optical dual Fabry-Perot interferometer film 1000, and a first resonance occurs in a specific wavelength band. The light transmitted through the first cavity layer 1300 is transmitted through the second cavity layer 1500, and a higher resonance occurs, so that red, green and blue light with high color purity can be transmitted to the outside.

[0107] In one embodiment, the back-emitting self-luminous element may be an OLED, QLED, uLED, etc.

[0108] In one embodiment, an optical clear adhesive (OCA) may be used to adhere to the top of the second anti-reflection layer 1700 of the optical dual Fabry-Perot interferometer film 1000 .

[0109] As described above, although the embodiments have been described with reference to the drawings, those having ordinary skill in the art may make various modifications and variations from the above description. For example, the described techniques may be performed in a different order than described, and / or the components of the described systems, structures, devices, circuits, etc. may be combined or combined in a different manner than described, or may be replaced or substituted by other components or equivalents, and still achieve suitable results.

[0110] Accordingly, other implementations, other embodiments, and equivalents of the claims are within the scope of the following claims.

Claims

1. A first antireflection layer; a second anti-reflection layer formed on the first anti-reflection layer; an optical dual Fabry-Perot interferometer film comprising first and second cavity regions formed between the first and second antireflective layers;

2. a first reflective layer formed on the first anti-reflection layer; a second reflective layer formed on the first reflective layer; a third reflective layer formed between the second reflective layer and the second antireflection layer; The first cavity region includes: a first cavity layer formed between the first reflective layer and the second reflective layer; The second cavity region includes:

10. The optical dual Fabry-Perot interferometer film of claim 1, wherein a second cavity layer is formed between the second reflective layer and the third reflective layer.

3. The first cavity region includes: generating a first resonance in a first preset wavelength band of light incident on the first cavity region; The second cavity region includes:

10. The optical dual Fabry-Perot interferometer film of claim 1, generating higher order resonances in a second preset wavelength band of light incident on the second cavity region.

4. 4. The optical dual Fabry-Perot interferometer film of claim 3, wherein a resonance order of the higher order resonance in the second cavity region is determined by a thickness of the second cavity region.

5. 2. The optical dual Fabry-Perot interferometer film of claim 1, wherein a thickness of the first cavity region determines a spectral distribution of light transmitted through the optical dual Fabry-Perot interferometer film.

6. 3. The optical dual Fabry-Perot interferometer film of claim 2, wherein the first cavity layer has a thickness of 20 nm to 250 nm.

7. The optical dual Fabry-Perot interferometer film of claim 1, wherein the peak positions and color purity of the red, green and blue resonant wavelengths of light transmitted through the optical dual Fabry-Perot interferometer film are determined by the thickness of the second cavity region.

8. 3. The optical dual Fabry-Perot interferometer film of claim 2, wherein the second cavity layer has a thickness of 200 nm to 1000 nm.

9. 4. The optical dual Fabry-Perot interferometer film of claim 3, wherein at least one of the first anti-reflective layer, the second anti-reflective layer, the first cavity region, and the second cavity region comprises a dielectric material.

10. The dielectric material is SiN x , Al 2 O 3 , SiO 2 , HfO 2 , W.O. 3 , TiO 2 , MoO 3 , ZnO, Ta 2 O 5 , V 2 O 5 8. The optical dual Fabry-Perot interferometer film of claim 7, wherein the interferometer film is at least one inorganic material selected from the group consisting of LiF and ZnS, or at least one organic material selected from the group consisting of PVP, PVC, PI, PMMA, NPB, TCTA, and TPBi.

11. 8. The optical dual Fabry-Perot interferometer film of claim 7, wherein the dielectric material is transparent.

12. 3. The optical dual Fabry-Perot interferometer film of claim 2, wherein at least one of the first reflective layer, the second reflective layer, and the third reflective layer is formed of a semi-transparent reflector.

13. The optical dual Fabry-Perot interferometer film of claim 12 , wherein the reflector is formed of a thin metal film.

14. 14. The optical dual Fabry-Perot interferometer film of claim 13, wherein the metal thin film of at least one of the first reflective layer, the second reflective layer and the third reflective layer has a thickness of 1 nm to 35 nm.

15. The metal thin film is 14. The optical dual Fabry-Perot interferometer film of claim 13, comprising at least one of gold (Au), silver (Ag), aluminum (Al), tungsten (W), and molybdenum (Mo).

16. 12. The optical dual Fabry-Perot interferometer film of claim 11, wherein the thin metal film comprises at least one of the gold, silver, and aluminum alloy materials.

17. 10. The optical dual Fabry-Perot interferometer film of claim 1, further comprising a substrate formed on top of the second anti-reflection layer.

18. 20. The optical dual Fabry-Perot interferometer film of claim 17, wherein the substrate is at least one of a glass substrate, an insulating polymer substrate, a semiconductor substrate, and a transparent substrate.

19. The optical dual Fabry-Perot interferometer film of claim 15 , wherein the substrate is a transparent flexible substrate.

20. A first antireflection layer; a first reflective layer formed on the first anti-reflection layer; a second reflective layer formed on the first reflective layer; a first cavity layer formed between the first reflective layer and the second reflective layer; a third reflective layer formed on the second reflective layer; a second cavity layer formed between the second reflective layer and the third reflective layer; a second anti-reflective layer formed on top of the third reflective layer.

21. The first cavity layer comprises: generating a first resonance in a first preset wavelength band of light incident on the first cavity layer; The second cavity layer includes:

21. The optical dual Fabry-Perot interferometer film of claim 20, generating higher order resonances in a second preset wavelength band of light incident on the second cavity layer.

22. 22. The optical dual Fabry-Perot interferometer film of claim 21, wherein a resonance order of the higher order resonance in the second cavity layer is determined by a thickness of the second cavity region.

23. 21. The optical dual Fabry-Perot interferometer film of claim 20, wherein a thickness of the first cavity layer determines a spectral distribution of light transmitted through the optical dual Fabry-Perot interferometer film.

24. 21. The optical dual Fabry-Perot interferometer film of claim 20, wherein the first cavity layer has a thickness of 20 nm to 250 nm.

25. The optical dual Fabry-Perot interferometer film of claim 20, wherein the peak positions and respective color purity of the red, green and blue resonant wavelengths of light transmitted through the optical dual Fabry-Perot interferometer film are determined by the thickness of the second cavity region.

26. 21. The optical dual Fabry-Perot interferometer film of claim 20, wherein the second cavity layer has a thickness of 200 nm to 1000 nm.

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