Drive unit

Abstract

To enlarge the extension of a piezoelectric element and smoothly transmit it to an oscillating arm.SOLUTION: A drive unit 10A has a base 11, an oscillating arm 14 attached to a base 11 via a fulcrum, and a connecting arm 24 attached to the oscillating arm 14 via a pivot point. A drive arm 20 including a piezoelectric element 20A is provided on the base 11 via a first oscillating point 20A, and the drive arm 20 is connected to the connecting arm 24 via a second oscillating point 20B.SELECTED DRAWING: Figure 4A

Description

[Technical field]

[0001] The present disclosure relates to a drive device used in an electronic component processing device that processes chip-like electronic components. [Background technology]

[0002] The characteristics of the chip-shaped electronic components are first measured by an electronic component measuring device in the electronic component processing device, and then the electronic components are inserted into a carrier tape by an electronic component inserting device. Next, the electronic components in the carrier tape are mounted on a substrate or the like.

[0003] A known electronic component measuring device for measuring the characteristics of electrical components measures electrical characteristics by driving a measurement probe with a drive device to bring it into contact with chip-like electronic components transported sequentially by an index table. A known drive device for driving the measurement probe holds the measurement probe on a swingable swing arm, and swings the swing arm with a drive mechanism having an electromagnetic solenoid to move the measurement probe between a measurement position and a retracted position.

[0004] Alternatively, as a driving device for driving a measurement probe, a device that uses a piezoelectric element to swing a swing arm is also known.

[0005] However, in the case of a drive device having an electromagnetic solenoid, a magnetic field is generated by passing an electric current through it, and a magnetic body is attracted by the magnetic force, so that it is not possible to respond quickly.

[0006] Furthermore, in the case of a drive device that uses a piezoelectric element to swing a swing arm, a mechanism that smoothly swings the swing arm using the displacement of the piezoelectric element has not yet been developed. [Prior art documents] [Patent documents]

[0007] [Patent Document 1] JP 2003-194876 A [Patent Document 2] JP 2018-174636 A Summary of the Invention [Problem to be solved by the invention]

[0008] The present disclosure has been made in consideration of these points, and provides a drive device that can smoothly drive a drive device used in an electronic component processing device by using a piezoelectric element capable of high-speed operation. [Means for solving the problem]

[0009] The present disclosure relates to a drive device comprising: a base; a swing arm that is swingably mounted on the base via a fulcrum and has an operating end at its tip; a connecting arm that is swingably mounted on the swing arm via a force point; and a drive arm that includes a piezoelectric element that is swingably connected to the base via a first swing point and is swingably connected to the connecting arm via a second swing point.

[0010] The present disclosure is a drive device in which the drive arm has a drive unit including a piezoelectric element and an extension extending from the drive unit, a guide arm is provided on the base so as to be able to swing freely via an additional fulcrum, and the guide arm is attached to the extension via a third swing point.

[0011] The present disclosure is a drive device, wherein the second swing point and the third swing point of the drive arm are provided on the extension portion.

[0012] The present disclosure is a drive device in which, when the distance between the fulcrum and the operating end of the oscillating arm is L1 and the distance between the fulcrum and the force point of the oscillating arm is L2, the operating end is displaced by an amount L1 / L2 times larger than the extension amount of the drive arm.

[0013] The present disclosure relates to a drive device, in which an elastic member is interposed between the base and the swing arm.

[0014] The present disclosure is a drive device, wherein the swing arm, the extension of the drive arm, and the connecting arm are made of titanium material. Effect of the Invention

[0015] According to the present invention, the displacement of the piezoelectric element can be amplified and smoothly transmitted to the swing arm, thereby enabling the swing arm to swing quickly and accurately. [Brief description of the drawings]

[0016] [Figure 1] FIG. 1 is a schematic perspective view showing a drive device according to an embodiment of the present disclosure. [Diagram 2] FIG. 2 is a side cross-sectional view showing the workpiece placement table. [Diagram 3] FIG. 3 shows a workpiece to be measured by a measurement probe. [Figure 4A] FIG. 4A is a diagram showing the operation of the drive device. [Figure 4B] 4B is an enlarged view showing the vicinity of the fulcrum of the swing arm shown in FIG. 4A. [Diagram 5] FIG. 5 is a diagram showing the operation of the guide arm. [Figure 6] FIG. 6 is a schematic diagram showing the entire electronic component processing device. [Figure 7] FIG. 7 is a schematic perspective view showing a modified driving device according to the present disclosure. [Figure 8A] FIG. 8A shows the operation of the insertion nozzle. [Figure 8B] FIG. 8B is a diagram showing the operation of the insertion nozzle. [Figure 8C] FIG. 8C is a diagram showing the operation of the insertion nozzle. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0017] Hereinafter, an embodiment of the present invention will be described in detail.

[0018] <Embodiments of the present disclosure> First, with reference to FIG. 6, an electronic component processing apparatus for processing chip-like electronic components (hereinafter also referred to as workpieces) W such as condensers, resistors, capacitors, etc. will be described.

[0019] The electronic component processing apparatus 1 includes a part feeder 41 that supplies workpieces W, and an index table 40 that is connected to the part feeder 41 via a loader unit 42.

[0020] 6, a workpiece W is supplied from a parts feeder 41 to an index table 40 via a loader unit 42. The workpiece W supplied to the index table 40 is stored in a storage groove 45 provided on the outer periphery of the index table 40. While the index table 40 is rotating, the electrical characteristics of the workpiece W in the storage groove 45 of the index table 40 are first measured by the electronic component measuring device 10. In the electronic component measuring device 10, a measuring probe 30 (see FIG. 1), which will be described later, is used and the electrical characteristics of the workpiece W are measured by bringing the measuring probe 30 into contact with the workpiece W.

[0021] Thereafter, as the index table 40 rotates, the top and bottom outer surfaces of the workpiece W in the storage groove 45 are inspected using the top camera 43 and the bottom camera 44 .

[0022] The index table 40 further rotates, and the defective workpieces W are discharged to the outside through the discharge device 46, and only the non-defective workpieces W reach the electronic component insertion device 50.

[0023] In this electronic component insertion device 50, the workpiece W in the storage groove 45 of the index table 40 is adsorbed by the insertion nozzle 60 (see Figure 7), and then the insertion nozzle 60 descends and the workpiece W adsorbed by the insertion nozzle 60 is inserted into the recess 5a of the carrier tape 5.

[0024] After the workpieces W are placed in the recessed portion 5a, the top tape 6 is placed on the carrier tape 5. Next, the top tape 6 is adhered onto the carrier tape 5 by the iron unit 53, and the recessed portion 5a of the carrier tape 5 is sealed by the top tape 6. Thereafter, the carrier tape 5 with the recessed portion 5a sealed by the top tape 6 is discharged to the outside.

[0025] Next, an electronic component measuring device 10 incorporated in such electronic component processing device 1 will be described with reference to FIGS.

[0026] As shown in Figures 1 to 5, the electronic component measuring device 10 comprises a base 11, a swing arm 14 that is swingably mounted on the base 11 via a fulcrum 14a and has an operating end 18 at its tip, and a connecting arm 24 that is swingably mounted on the swing arm 14 via a force point 24a.

[0027] A drive arm 20 including a piezoelectric element 20A is provided to the base 11 so as to be able to swing via a first swing point 20a, and a connection arm 24 is connected to the drive arm 20 so as to be able to swing via a second swing point 20b.

[0028] Among these, the aforementioned operating end 18 is provided at the tip of the swing arm 14, which is attached to the base 11 via a fulcrum 14a. This operating end 18 is made of glass epoxy resin, and a measurement probe holding tube 19 that holds the four measurement probes 30 is attached to this operating end 18.

[0029] The four measuring probes 30 come into contact with the workpiece W stored in the storage groove 45 of the index table 40, as described below, and measure the electrical characteristics of the workpiece W.

[0030] As described above, the drive arm 20 has the piezoelectric element 20A. The drive arm 20 has a drive portion 21 including the piezoelectric element 20A, and an extension portion 22 extending upward from the drive portion 21.

[0031] Furthermore, a guide arm 25 is provided on the base 11 so as to be able to swing via an additional fulcrum 25a, and the drive arm 20 is connected to the guide arm 25 via a third swing point 20c.

[0032] As described later, the driving arm 20 expands and contracts by applying a voltage to the piezoelectric element 20A contained therein. As the driving arm 20 expands and contracts, the connecting arm 24 connected via the second swing point 20b swings, and a force is applied from the connecting arm 24 to the swing arm 14 via the force point 24a, causing the swing arm 14 to swing around the fulcrum 14a (see Figs. 4A and 4B). At this time, the driving arm 20 is connected to the guide arm 25 via the third swing point 20c, and the guide arm 25 is attached to the base 11 so as to be able to swing freely via the additional fulcrum 25a, so that the third swing point 20c moves along the trajectory of the swing end of the guide arm 25 (see Fig. 5). By moving the third swing point 20c of the driving arm 20 along the trajectory of the swing end of the guide arm 25 in this way, the posture of the driving arm 20 can be uniquely determined according to the expansion and contraction of the driving arm 20. In this way, by uniquely determining the posture of the drive arm 20 in accordance with the extension and contraction of the drive arm 20, the movements of the connecting arm 24 and the swing arm 14 can be uniquely determined, and the upward movement pitch of the swing arm 14 can be precisely set to a constant value.

[0033] On the other hand, without the guide arm 25, the position of the drive arm 20 may need to be stabilized in response to the extension and contraction of the drive arm 20, and the accuracy of the movements of the connecting arm 24 and the swing arm 14 may be somewhat reduced.

[0034] As shown in Figures 1 and 5, the drive arm 20 has a drive section 21 including a piezoelectric element 20A, and an extension section 22, and of the drive arm 20, a second swing point 20b which is a connection point with the connecting arm 24, and a third swing point 20c which is a connection point with the guide arm 25 are both provided on the extension section 22.

[0035] The piezoelectric element 20A provided in the driving section 21 of the driving arm 20 is obtained by, for example, stacking a plurality of plate-shaped piezoelectric bodies with electrodes between them to form a rectangular parallelepiped. The piezoelectric element 20A has electric terminals (not shown) for applying a voltage to the side surface, and is configured to expand and contract in the length direction when a voltage is applied between the electric terminals. A ceramic material having a piezoelectric effect is used as the piezoelectric material constituting the piezoelectric body, and a typical example of such a material is lead zirconate titanate (Pb(Zr,Ti)O3; PZT). The shape of the piezoelectric element 20A is not limited to a rectangular parallelepiped, and may be, for example, a polygonal prism such as a triangular prism or a hexagonal prism, or a cylinder.

[0036] 1, an operating end 18 is provided at the tip of a swing arm 14 which is attached via a fulcrum 14a to the base 11 of the electronic component measuring device 10, and a measurement probe 30 is held at this operating end 18 by a measurement probe holding tube 19. In this embodiment, the measurement probe 30 is held in the measurement probe holding tube 19 via a spring (not shown). Therefore, the measurement probe 30 held in the measurement probe holding tube 19 elastically abuts against the workpiece W.

[0037] In addition, above the operating end 18, a workpiece mounting table 15 is attached, extending from the base 11, on which the workpiece W is mounted. The workpiece mounting table 15 has a mounting table main body 15a fixed to the base 11, and a workpiece mounting surface 15b provided on the mounting table main body 15a and on which the workpiece W is mounted. A probe guide 32 that prevents the measurement probe 30 from rotating about its axis is attached to the mounting table main body 15a of the workpiece mounting table 15 via a connector 31. The measurement probe 30 may have an asymmetric tip shape, and if the measurement probe 30 rotates about its axis, the workpiece W cannot be measured with high accuracy. In this embodiment, the probe guide 32 prevents the measurement probe 30 from rotating about its axis, and the measurement probe 30 can measure the workpiece W with high accuracy.

[0038] Then, the drive arm 20 causes the swing arm 14 to swing about the fulcrum 14a, displacing the measurement probe 30 provided at the operating end 18 of the swing arm 14 in the vertical direction. This causes the measurement probe 30 to come into contact with the electrode W1 of the workpiece W placed on the workpiece placement table 15, making it possible to measure the electrical characteristics of the workpiece W.

[0039] Next, we will describe the materials used for the components of each part of electronic component measuring device 10. Base 11 of electronic component measuring device 10 is made entirely of steel, including base 13 that supports drive arm 20 and on which first swing point 20a of drive arm 20 is provided.

[0040] The swing arm 14, the extension 22 of the drive arm 20, and the connecting arm 24 are made of titanium.

[0041] By constructing the swing arm 14, the extension 22 of the drive arm 20, and the connecting arm 24 from titanium in this manner, the rigidity of the parts to which strong forces are applied when the electronic component measuring device 10 is in operation can be increased.

[0042] Therefore, wear and damage to components can be suppressed by operation of electronic component measuring device 10, and this allows measurement probe 30 to operate with high accuracy. Therefore, electrical characteristics of workpiece W can be measured with high accuracy by measurement probe 30.

[0043] The working end 18 provided at the tip of the swing arm 14 is made of glass epoxy resin, and the workpiece mounting table 15 has a mounting table body 15a made of aluminum, steel or other ordinary metallic materials. The workpiece mounting surface 15b provided on the mounting table body 15a is made of ceramics.

[0044] The workpiece mounting table main body 15a and the workpiece mounting surface 15b of the workpiece mounting table 15 are provided with through holes 15c through which the four measurement probes 30 pass (see FIG. 2).

[0045] The swinging motion of the measuring probe 30 provided at the working end 18 of the swinging arm 14 is guided by the through hole 15c of the workpiece placement table 15 and adjusted to a linear motion in the vertical direction.

[0046] Furthermore, a spring 16 is interposed between the base 11 and the swing arm 14 on the swing arm 14. When a voltage is applied to the piezoelectric element 20A of the drive arm 20 and the drive arm 20 extends, the swing arm 14 swings upward about the fulcrum 14a as described below, but by stopping the voltage to the piezoelectric element 20A, the drive arm contracts and at the same time, the compression force of the spring 16 causes the swing arm 14 to swing downward.

[0047] In addition, a cover 17 that covers the drive arm 20, the connecting arm 24, the guide arm 25, the swing arm 14 and the spring 16 is attached to the base 11.

[0048] In addition, of the electronic component measuring device 10 having the above-mentioned structure, the base 11, the oscillating arm 14, the driving arm 20, the connecting arm 24, the guide arm 25 and the spring 16 constitute a driving device 10A that drives the measuring probe 30 in the vertical direction.

[0049] The driving device 10A can convert the expansion and contraction displacement of the piezoelectric element 20A of the driving arm 20 into a change in the operating end 18 provided at the tip of the swinging arm 14.

[0050] When the piezoelectric element 20A of the driving device 10A of this embodiment targets a 1005-size workpiece W (chip-shaped electronic component), its displacement (also called extension) is, for example, 20 μm to 60 μm, and this displacement of the piezoelectric element 20A can be converted into the displacement of the operating end 18, i.e., the displacement of the measurement probe, for example, 100 μm to 300 μm.

[0051] In this embodiment, "upper" and "lower" refer to the "upper" and "lower" positions when electronic component measuring apparatus 10 is installed as shown in FIG.

[0052] Next, the operation of this embodiment having the above configuration will be described.

[0053] First, the workpiece W is stored in the storage groove 45 of the index table 40 from the parts feeder 41 via the loader unit 42 (see FIG. 6). Next, the index table 40 rotates, and the workpiece W stored in the storage groove 45 is sent to the electronic component measuring device 10.

[0054] When the work W in the storage groove 45 of the index table 40 reaches the electronic component measuring device 10 , the work W is placed on the work placement surface 15 b of the work placement table 15 .

[0055] 4A and 4B, a voltage is applied to piezoelectric element 20A built into drive arm 20 of electronic component measuring device 10, which causes drive arm 20 to extend. At this time, drive arm 20 swings relative to base 11 via first swing point 20a, and connecting arm 24, which is swingably attached to drive arm 20 via second swing point 20b, swings.

[0056] At the same time, the connecting arm 24 transmits force to the swinging arm 14 via the force point 24a, and the force from the connecting arm 24 causes the swinging arm 14 to swing upward about the fulcrum 14a, causing the four measurement probes 30 held by the actuating end 18 provided at the tip of the swinging arm 14 to rise.

[0057] During this time, the drive arm 20 is swingably connected to the guide arm 25 via the third swing point 20c, and the guide arm 25 is swingably attached to the base 11 via the additional fulcrum 25a, so that the posture of the drive arm 20 can be uniquely determined in accordance with the extension and contraction of the drive arm 20. This allows the movements of the connecting arm 24 and the swing arm 14 to be uniquely determined, and the ascending pitch of the swing arm 14, i.e., the ascending pitch of the measurement probe 30, to be accurately determined.

[0058] Next, the rising pitch of the measurement probe 30 will be described with reference to FIGS. 4A and 4B.

[0059] As shown in Figures 4A and 4B, if the distance from the fulcrum 14a of the swing arm 14 to the operating end 18 (the holding position of the measurement probe 30) is L1 and the distance from the fulcrum 14a of the swing arm 14 to the force point 24a is L2, then L1 / L2 = 5 to 50, preferably 10 to 30.

[0060] Further, the distance from the first swing point 20a to the second swing point 20b of the drive arm 20 is L3, where L1 / L3=1-2.

[0061] As described above, the extension amount of the drive arm 20 becomes an extremely small value, and this value is designated as x.

[0062] Also consider a triangle formed by the distance L2 between the fulcrum 14a of the swing arm 14 and the force point 24a, and the extension amount x of the drive arm 20. If the other side of the triangle formed by the distance L2 from the fulcrum 14a of the swing arm 14 to the force point 24a, and the extension amount x, is Z, L2 and Z form an angle Δθ.

[0063] As described above, the extension amount x of the drive arm 20 is extremely small, so the angle Δθ is a sufficiently small value.

[0064] At this time, if the lift distance (displacement) of the measurement probe 30 provided at the working end 18 of the swing arm 14 is y, then y=L1sinΔθ.

[0065] In addition, Δθ is a sufficiently small value. sinΔθ=x / L2.

[0066] This has resulted in

number

[0067] In this embodiment, L1 / L2=5 to 50, preferably 10 to 30, so that the extension amount x of the drive arm 20 can be expanded by L1 / L2, i.e., 5 to 50 times, preferably 10 to 30 times, to lift the measurement probe 30.

[0068] In this manner, the drive arm 20 is extended by an extension amount x, and the swing arm 14 is swung about the fulcrum. As a result, the four measurement probes 30 provided at the operating end 18 of the swing arm 14 are expanded and raised by a distance y, and the measurement probes 30 are brought into contact with the electrodes W1 of the workpiece W placed on the workpiece placement table 15, thereby measuring the electrical characteristics of the workpiece W.

[0069] In addition, since the extension amount x of the drive arm 20 is determined by the amount of voltage applied to the piezoelectric element 20A, the rising pitch of the measurement probe 30 can be adjusted as desired by changing the amount of voltage to the piezoelectric element 20A.

[0070] As described above, according to this embodiment, the swing arm 14 is swung via a fulcrum by extending the drive arm 20 including the piezoelectric element 20A, so there is no need to use an electromagnetic solenoid that has a delay time until a predetermined current value is reached. Therefore, by applying a voltage to the piezoelectric element 20A, the swing arm 14 can be swung quickly and reliably to raise the measurement probe 30, and the electrical characteristics of the workpiece W can be measured by the measurement probe 30. In addition, the upward stroke of the measurement probe 30 can be adjusted by changing the amount of voltage applied to the piezoelectric element 20A.

[0071] Furthermore, the drive arm 20 is extended, and the connecting arm 24 is pulled upward by the drive arm 20, and the movement of the connecting arm 24 is transmitted to the swing arm 14 via the force point 24a, causing the swing arm 14 to swing upward about the fulcrum 14a.

[0072] This allows the measurement probe 30 to be quickly raised by the swing arm 14. In this case, force can be smoothly transmitted from the drive arm 20 to the swing arm 14 via the connecting arm 24. When transmitting force between the drive arm 20, the connecting arm 24, and the swing arm 14, the drive arm 20, the connecting arm 24, and the swing arm 14 all transmit the force while performing a swinging motion around a fulcrum, so that smoother transmission of force can be achieved compared to, for example, a case in which force is transmitted using the deflection of a hinge.

[0073] Furthermore, the drive arm 20 is swingably connected to the guide arm 25 via a third swing point 20c, and the guide arm 25 is swingably attached to the base 11 via an additional fulcrum 25a. Therefore, the posture of the drive arm 20 can be uniquely determined in response to the extension and contraction of the drive arm 20, and thus the movements of the connecting arm 24 and the swing arm 14 can be uniquely determined, and the lifting pitch of the swing arm 14 and the lifting pitch of the measurement probe 30 can be accurately determined.

[0074] Furthermore, if the distance from the fulcrum 14a of the swing arm 14 to the operating end 18 is L1 and the distance from the fulcrum 14a of the swing arm 14 to the force point 24a is L2, then L1 / L2=5-50, preferably 10-30.

[0075] This allows the extension amount x of the drive arm 20 to be increased by 5 to 50 times, preferably 10 to 30 times (displacement increase), and the measurement probe 30 can be raised.

[0076] Furthermore, by making the swing arm 14, the extension 22 of the drive arm 20, and the connecting arm 24 out of titanium, it is possible to increase the rigidity of the parts which are subjected to strong forces when the electronic component measuring device 10 is operated, and therefore the parts will not be worn down or damaged by the operation of the electronic component measuring device 10. This allows the measuring probe 30 to operate with high precision, and the electrical characteristics of the workpiece W to be measured with high precision by the measuring probe 30. <Modifications of the present disclosure> Next, a modified example of the present disclosure will be described. This modified example relates to an electronic component insertion device 50 incorporated in the electronic component processing device 1, and this electronic component insertion device 50 will be described with reference to Figs. 7 to 8C.

[0077] As shown in Figures 7 to 8C, the electronic component insertion device 50 includes a base 11, a swing arm 14 swingably attached to the base 11 via a fulcrum 14a, and a connecting arm 24 swingably attached to the swing arm 14 via a force point 24a.

[0078] In addition, a drive arm 20 including a piezoelectric element 20A is freely swingable provided on a connecting body 13A connected to the base 11 via a first swing point 20a, and a connecting arm 24 is freely swingable connected to this drive arm 20 via a second swing point 20b.

[0079] Of these, an insertion nozzle holding tube 62 is attached to the operating end 14A located at the tip of the oscillating arm 14 which is attached to the base 11 via a fulcrum 14a, and the lower end of this insertion nozzle holding tube 62 holds an insertion nozzle 60 which adsorbs the workpiece W in the storage groove 45 of the index table 40 and inserts it into the recess 5a of the carrier tape 5.

[0080] As described above, the drive arm 20 has the piezoelectric element 20A. The drive arm 20 has a drive portion 21 including the piezoelectric element 20A, and an extension portion 22 extending downward from the drive portion 21.

[0081] Furthermore, a guide arm 25 is provided on the base 11 so as to be able to swing via an additional fulcrum 25a, and the drive arm 20 is connected to the guide arm 25 via a third swing point 20c.

[0082] As described later, the driving arm 20 expands and contracts by applying a voltage to the piezoelectric element 20A contained therein. As the driving arm 20 expands and contracts, the connecting arm 24 connected via the second swing point 20b swings, and a force is applied from the connecting arm 24 to the swing arm 14 side via the force point 24a, and the swing arm 14 swings around the fulcrum 14a. At this time, the driving arm 20 is connected to the guide arm 25 via the third swing point 20c, and the guide arm 25 is attached to the base 11 so as to be able to swing freely via the additional fulcrum 25a, so that the third swing point 20c moves along the trajectory of the swing end of the guide arm 25. By moving the third swing point 20c of the driving arm 20 along the trajectory of the swing end of the guide arm 25 in this way, the posture of the driving arm 20 can be uniquely determined according to the expansion and contraction of the driving arm 20. In this way, by uniquely determining the posture of the drive arm 20 in accordance with the extension and contraction of the drive arm 20, the movements of the connecting arm 24 and the swing arm 14 can be uniquely determined, and the descent pitch of the swing arm 14 can be precisely set to a constant value.

[0083] On the other hand, without the guide arm 25, the position of the drive arm 20 may need to be stabilized in response to the extension and contraction of the drive arm 20, and the accuracy of the movements of the connecting arm 24 and the swing arm 14 may be somewhat reduced.

[0084] As shown in Figure 7, the drive arm 20 has a drive part 21 including a piezoelectric element 20A, and an extension part 22, and of the drive arm 20, a second swing point 20b which is a connection point with the connecting arm 24, and a third swing point 20c which is a connection point with the guide arm 25 are both provided on the extension part 22.

[0085] The piezoelectric element 20A provided in the driving section 21 of the driving arm 20 is obtained by, for example, stacking a plurality of plate-shaped piezoelectric bodies with electrodes between them to form a rectangular parallelepiped. The piezoelectric element 20A has electric terminals (not shown) for applying a voltage to the side surface, and is configured to expand and contract in the length direction when a voltage is applied between the electric terminals. A ceramic material having a piezoelectric effect is used as the piezoelectric material constituting the piezoelectric body, and a typical example of such a material is lead zirconate titanate (Pb(Zr,Ti)O3; PZT). The shape of the piezoelectric element 20A is not limited to a rectangular parallelepiped, and may be, for example, a polygonal prism such as a triangular prism or a hexagonal prism, or a cylinder.

[0086] As shown in FIG. 7 , an insertion nozzle holding tube 62 is provided at the operating end 14A of a swing arm 14 which is attached to the base 11 of the electronic component insertion device 50 via a fulcrum 14a, and the insertion nozzle 60 is held at the lower end of this insertion nozzle holding tube 62.

[0087] Then, the drive arm 20 causes the swing arm 14 to swing about the fulcrum 14a, displacing the insertion nozzle holding tube 62 and the insertion nozzle 60 provided at the operating end 14A of the swing arm 14 downward. As a result, the insertion nozzle 60 adsorbs the workpiece W stored in the storage groove 45 of the index table 40, and inserts it into the recess 5a of the carrier tape 5.

[0088] Next, we will describe the materials of the components of the electronic component insertion device 50. The base 11 of the electronic component insertion device 50 is made of steel. The swing arm 14, the extension 22 of the drive arm 20, and the connecting arm 24 are made of titanium.

[0089] By constructing the swing arm 14, the extension 22 of the drive arm 20 and the connecting arm 24 from titanium in this manner, the rigidity of the components to which strong forces are applied when the electronic component insertion device 50 is in operation can be increased.

[0090] Therefore, wear and damage to components can be suppressed by the operation of the electronic component insertion device 50, and this allows the measurement probe 30 to operate with high precision. This allows the measurement probe 30 to measure the electrical characteristics of the workpiece W with high precision.

[0091] Furthermore, a spring 16A is interposed on the swing arm 14, located between the connector 13A extending from the base 11 and the swing arm 14. When a voltage is applied to the piezoelectric element 20A of the drive arm 20 and the drive arm 20 extends, the swing arm 14 swings downward about the fulcrum 14a as described below, during which the swing arm 14 swings elastically while receiving the tensile force of the spring 16A. By stopping the voltage to the piezoelectric element 20A, the tensile force of the spring 16A causes the swing arm 14 to swing upward and return.

[0092] In addition, a cover 17 is attached to the base 11 to cover the drive arm 20, the connecting arm 24, the guide arm 25, the swing arm 14 and the spring 16A.

[0093] In addition, among the electronic component insertion device 50 having the above-mentioned structure, the base 11, the oscillating arm 14, the drive arm 20, the connecting arm 24, the guide arm 25 and the spring 16A constitute a drive device 50A that drives the insertion nozzle holding tube 62 and the insertion nozzle 60 in the vertical direction.

[0094] The expansion and contraction displacement of the piezoelectric element 20A of the drive arm 20 can be converted into the displacement of the operating end 14A of the swing arm 14 by the drive device 50A.

[0095] With the driving device 50A of this embodiment, when the piezoelectric element 20A is intended for a 1005 size workpiece W (chip-shaped electronic component), the displacement amount of this piezoelectric element 20A can be enlarged and converted into the displacement amount of the working end 14A, i.e., the displacement amount of the insertion nozzle 60.

[0096] In this embodiment, the terms "upper" and "lower" refer to the "upper" and "lower" positions when electronic component insertion device 50 is placed in the state shown in FIG.

[0097] Next, the operation of this embodiment having the above configuration will be described.

[0098] First, the workpiece W is stored in the storage groove 45 of the index table 40 from the parts feeder 41 via the loader unit 42 (see FIG. 6). Next, the index table 40 rotates, and the electrical characteristics of the workpiece W stored in the storage groove 45 are measured by the electronic component measuring device 10. Thereafter, the workpiece W in the storage groove 45A is sent to the electronic component insertion device 50.

[0099] When the workpiece W in the storage groove 45 of the index table 40 reaches the electronic component insertion device 50, as shown in Figures 4A and 4B, a voltage is applied to the piezoelectric element 20A built into the drive arm 20 of the electronic component insertion device 50, which causes the drive arm 20 to extend. At this time, the drive arm 20 swings relative to the base 11 via a first swing point 20a, and in conjunction with this, the connecting arm 24, which is provided on the drive arm 20 so as to be able to swing freely via a second swing point 20b, swings.

[0100] At the same time, the connecting arm 24 transmits a force to the swinging arm 14 via the force point 24a, and the swinging arm 14 swings downward about the fulcrum 14a due to the force from the connecting arm 24. As a result, the insertion nozzle holding tube 62 and the insertion nozzle 60 held by the working end 14A of the swinging arm 14 are lowered.

[0101] During this time, the drive arm 20 is swingably connected to the guide arm 25 via the third swing point 20c, and the guide arm 25 is swingably attached to the base 11 via the additional fulcrum 25a, so that the posture of the drive arm 20 can be uniquely determined in accordance with the extension and contraction of the drive arm 20. This allows the movements of the connecting arm 24 and the swing arm 14 to be uniquely determined, and the descending pitch of the swing arm 14, i.e., the descending pitch of the insertion nozzle 60, to be accurately determined.

[0102] The operation of the insertion nozzle 60 in the electronic component insertion device 50 is substantially the same as the operation of the measuring probe 30 in the electronic component measuring device 10 shown in FIGS. 4A and 4B, and therefore a detailed description thereof will be omitted.

[0103] Next, the operation of the insertion nozzle 60 in the electronic component insertion device 50 will be further described with reference to FIGS. 8A to 8C.

[0104] When the workpiece W stored in the storage groove 45 of the index table 40 reaches the electronic component insertion device 50 , the index table 40 stops and the insertion nozzle 60 descends into the storage groove 45 .

[0105] As described above, the insertion nozzle holding tube 62 is provided at the working end 14A of the swing arm 14, and the insertion nozzle 60 is held by this insertion nozzle holding tube 62. Therefore, by swinging the swing arm 14 downward, the insertion nozzle 60 can be reliably lowered.

[0106] During this time, the inside of the insertion nozzle 60 is maintained in a vacuum state via a vacuum hose 61 connected to an insertion nozzle holding tube 62. As a result, the workpiece W in the storage groove 45 of the index table 40 is sucked to the lower end of the insertion nozzle 60 (see FIG. 8A).

[0107] Next, the insertion nozzle 60 further descends while adsorbing the workpiece W, and the insertion nozzle 60 inserts the workpiece W into the recess 5a of the carrier tape 5 arranged below the index table 40 via a separator 63 (see FIG. 8B).

[0108] 8C, the vacuum state in the insertion nozzle 60 is released, and at the same time, the operation of the carrier tape 5 is started. As a result, the workpiece W is completely separated from the lower end of the insertion nozzle 60, and the insertion nozzle 60 is raised by the upward swing of the swing arm 14.

[0109] In addition, since the amount of extension of the drive arm 20 is determined by the amount of voltage applied to the piezoelectric element 20A, the descending pitch of the insertion nozzle 60 can be adjusted as desired by changing the amount of voltage applied to the piezoelectric element 20A.

[0110] As described above, according to this modification, the drive arm 20 including the piezoelectric element 20A is extended to swing the swing arm 14 via a fulcrum, so there is no need to use an electromagnetic solenoid that has a delay time until a predetermined current value is reached. Therefore, by applying a voltage to the piezoelectric element 20A, the swing arm 14 can be swung quickly and reliably to lower the insertion nozzle 60, and the workpiece W in the storage groove 45 of the index table 40 can be inserted into the recess 5a of the carrier tape 5 by the insertion nozzle 60. In addition, the upward stroke of the insertion nozzle 60 can be adjusted by changing the amount of voltage applied to the piezoelectric element 20A.

[0111] Furthermore, the drive arm 20 is extended, and the connecting arm 24 is pulled downward by the drive arm 20, and the movement of the connecting arm 24 is transmitted to the swing arm 14 via the force point 24a, causing the swing arm 14 to swing downward about the fulcrum 14a.

[0112] This allows the insertion nozzle 60 to be quickly lowered by the swing arm 14. In this case, force can be smoothly transmitted from the drive arm 20 to the swing arm 14 via the connecting arm 24. When transmitting force between the drive arm 20, the connecting arm 24, and the swing arm 14, the drive arm 20, the connecting arm 24, and the swing arm 14 all transmit the force while performing a swinging motion around a fulcrum, so smooth transmission of force can be achieved.

[0113] Furthermore, the drive arm 20 is swingably connected to the guide arm 25 via a third swing point 20c, and the guide arm 25 is swingably attached to the base 11 via an additional fulcrum 25a. Therefore, the posture of the drive arm 20 can be uniquely determined in response to the extension and contraction of the drive arm 20, and thus the movements of the connecting arm 24 and the swing arm 14 can be uniquely determined, and the descending pitch of the swing arm 14 and the descending pitch of the insertion nozzle 60 can be accurately determined.

[0114] Furthermore, if the distance from the fulcrum 14a of the swing arm 14 to the operating end 18 is L1 and the distance from the fulcrum 14a of the swing arm 14 to the force point 24a is L2, then L1 / L2=5 to 50, preferably 10 to 30.

[0115] This allows the extension amount x of the drive arm 20 to be increased by 5 to 50 times, preferably 10 to 30 times (displacement increase), and the insertion nozzle 60 can be lowered.

[0116] Furthermore, by making the swing arm 14, the extension 22 of the drive arm 20, and the connecting arm 24 out of titanium, it is possible to increase the rigidity of the components that are subjected to strong forces when the electronic component insertion device 50 is operated, and therefore the components will not be worn out or damaged by the operation of the electronic component insertion device 50. This allows the insertion nozzle 60 to operate with high precision, and the workpiece W in the storage groove 45 of the index table 40 can be reliably inserted into the recess 5a of the carrier tape 5 by the insertion nozzle 60. [Explanation of symbols]

[0117] 1 Electronic parts processing equipment 5 Carrier Tape 5a Recess 6 Top Tape 10. Electronic component measuring equipment 10A Drive Unit 11. Base 13 Base 14 Swing Arm 14A Working End 14a Fulcrum 15 Workpiece placement table 15a Mounting table body 15b Workpiece placement surface 15c through hole 17 Cover 18 Working End 19 Measurement probe holding tube 20 Drive arm 20A Piezoelectric element 20a First swing point 20b Second swing point 20c 3rd swing point 21 Drive unit 22 Extension 24 Connecting Arm 24a Emphasis 25 Guide Arm 25a Additional anchor 30 Measuring Probes 31 Connector 32 Probe guide 40 Index Table 41 Parts feeder 42 Loader unit 45 Storage groove 50 Electronic component insertion device 50A driver 60 Insertion Nozzle 61 Vacuum Hose 62 Insertion nozzle holding tube

Claims

1. With the base, a swing arm that is swingably mounted on the base via a fulcrum and has an operating end at its tip; a connecting arm provided on the swing arm so as to be swingable via a force point; a drive arm including a piezoelectric element that is swingably connected to the base via a first swing point and swingably connected to the connecting arm via a second swing point, said drive device comprising:

2. the drive arm has a drive portion including a piezoelectric element and an extension portion extending from the drive portion, 2. The drive device according to claim 1, wherein a guide arm is provided on said base so as to be able to swing freely via an additional fulcrum, and said guide arm is attached to said extension portion via a third swing point.

3. 3. The drive device according to claim 2, wherein the second pivot point and the third pivot point of the drive arm are provided on the extension portion.

4. When the distance between the fulcrum and the actuation end of the swing arm is L1 and the distance between the fulcrum and the force point of the swing arm is L2, 2. The drive device according to claim 1, wherein the actuating end is displaced by an amount L1 / L2 larger than the amount of extension of the drive arm.

5. 5. The drive device according to claim 1, further comprising an elastic member interposed between said base and said swing arm.

6. 3. The drive mechanism of claim 2, wherein said swing arm, said extension of said drive arm, and said connecting arm are made of titanium material.

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