Inspection support device, method for operating inspection support device, program, and medical image photographing device

The inspection support device automates the creation of medical imaging inspection protocols, reducing operator burden and ensuring accurate protocol generation by utilizing subject and examination information.

JP2025060166APending Publication Date: 2025-04-10FUJIFILM CORP
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Patent Information

Application Number
JP2023170721
Authority / Receiving Office
JP · JP
Patent Type
Applications
Current Assignee / Owner
Filing Date
2023-09-29
Publication Date
2025-04-10

AI Technical Summary

Technical Problem

Operators in medical imaging face a significant burden in creating and confirming inspection protocols, especially when changes occur in the testing protocol transmitted from the imaging department information management system.

Method used

An inspection support device equipped with processors and memory that automates the creation of inspection protocols by obtaining subject information and examination information, reducing the operator's workload and enabling the generation of a first inspection protocol based on these inputs.

Benefits of technology

The solution reduces the operator's load in creating inspection protocols by automating the process, ensuring consistency and accuracy in protocol generation, and allowing for modifications and approvals within the system.

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Abstract

To provide an inspection support device, a method for operating an inspection support device, a program, and a medical image photographing device that reduce the burden on an operator related to creation of an inspection protocol.SOLUTION: An inspection support device acquires an inspection order in a subject of a medical image diagnostic inspection, acquires subject information on the subject (101), acquires inspection information on the medical image diagnostic inspection carried out for the subject (100), and on the basis of the subject information and inspection information, creates a first inspection protocol to be applied to the medical image diagnostic inspection carried out on the basis of the inspection order (108).SELECTED DRAWING: Figure 3
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Description

[Technical field]

[0001] The present disclosure relates to an examination support device, an operation method for an examination support device, a program, and a medical imaging device. [Background technology]

[0002] When imaging is performed using a medical imaging device, an examination order created in the hospital information system is sent to the imaging diagnostic department information management system. In the imaging diagnostic department information management system, various information related to the examination is input to the examination order and sent to the medical imaging device. In the medical imaging device, an examination protocol is set based on the examination order, and imaging of the subject is performed based on the set examination protocol.

[0003] The medical imaging device may be referred to as a modality. The hospital information system may be referred to as HIS, which is an abbreviation of Hospital Information System in English. The imaging department information management system may be referred to as RIS, which is an abbreviation of Radiology Information System in English.

[0004] Patent Document 1 describes an imaging support device that has a function of automatically determining an imaging protocol based on an examination order or the like and transmitting the determined imaging protocol to a modality. The device described in the document uses a trained learning model when determining an imaging protocol. The learning model used when determining an imaging protocol is a trained learning model that is trained using a set of variables of patient information, examination order, and examination instruction as learning data, and the imaging protocol used in the learning data as correct answer data.

[0005] In the operation of the learning model, a set of change factors extracted from each of the patient information, the examination order, and the examination instruction is input to the learning model from the imaging diagnosis department information management system, and the learning model outputs an imaging protocol. In the modality, the imaging protocol output from the learning model is applied, and imaging is performed.

[0006] In addition, in the device described in Patent Document 1, the shooting protocol sent from the imaging diagnosis department information management system is changed in the modality, and if the two do not match, the correspondence between the shooting protocol and the contents of the patient information, examination order, examination instructions, etc. is updated. [Prior art documents] [Patent documents]

[0007] [Patent Document 1] JP 2020-187542 A Summary of the Invention [Problem to be solved by the invention]

[0008] However, in a medical imaging device, when an examination protocol sent from the imaging diagnosis department information management system is changed, an operator such as a radiological technician must check the examination order, create the examination protocol, and check the examination protocol, and there is a need to reduce the burden on the operator.

[0009] Patent Document 1 describes that the shooting protocol transmitted from the imaging diagnosis department information management system to the modality is changed in the modality, but does not specifically describe how the shooting protocol is changed in the modality.

[0010] The present disclosure has been made in consideration of the above circumstances, and aims to provide an examination support device, an operating method for the examination support device, a program, and a medical imaging device, which reduce the burden on an operator in creating examination protocols. [Means for solving the problem]

[0011] An examination support device according to a first aspect of the present disclosure includes one or more processors and one or more memories in which a program including one or more instructions executed by the one or more processors is stored, and the one or more processors execute the program stored in the one or more memories to obtain an examination order for a subject of a medical imaging diagnostic examination, obtain subject information about the subject, obtain examination information about the medical imaging diagnostic examination to be performed on the subject, and create a first examination protocol to be applied to the medical imaging diagnostic examination to be performed based on the examination order, based on the subject information and the examination information.

[0012] According to the examination support device of the first aspect, a first examination protocol is generated based on subject information on an examination subject and examination information on a medical image diagnostic examination, thereby reducing the burden on an operator in creating an examination protocol.

[0013] The first examination protocol may include a first imaging protocol applied to imaging a medical image of the subject, and may include a sequence related to processing of the medical image.

[0014] In the examination support device of the second aspect, in the image processing device of the first aspect, one or more processors may acquire a second examination protocol associated with the examination order, and modify the second examination protocol based on the subject information and the examination information to create a first examination protocol.

[0015] According to this aspect, a first examination protocol in which defects in the examination order have been corrected can be generated.

[0016] A test support device according to a third aspect is the test support device of the second aspect, wherein the one or more processors may cause a comparison result of comparing the first test protocol with the second test protocol to be displayed on the display device.

[0017] According to this aspect, an operator or the like can visually recognize the difference between the first examination protocol and the second examination protocol.

[0018] In the test support device of the fourth aspect, one or more processors in the test support device of the second or third aspect may, when creating the first test protocol, perform at least one of replacing sequences in the second test protocol, changing the order of sequences, adding sequences, and deleting sequences.

[0019] According to this aspect, correction can be performed on a sequence basis that constitutes an examination protocol.

[0020] In the examination support device of the fifth aspect, in the examination support device of any one of the first to fourth aspects, one or more processors may acquire past examination information regarding past medical image diagnostic examinations previously performed on a subject, and create a first examination protocol based on the subject information, the examination information, and the past examination information.

[0021] According to this aspect, a first examination protocol that reflects past examination information can be created.

[0022] In a test support device according to a sixth aspect, in any one of the first to fifth aspects, one or more processors may cause a display device to display an authentication screen in which an operator inputs whether or not to approve the first test protocol.

[0023] According to this aspect, an operator who views the authentication screen can input approval or disapproval of the first examination protocol.

[0024] A test support device according to a seventh aspect is the test support device according to any one of the first to sixth aspects, wherein the one or more processors may accept a correction to the created first test protocol.

[0025] According to this embodiment, deficiencies in the first testing protocol can be corrected.

[0026] A test support device according to an eighth aspect is the test support device of the seventh aspect, wherein the one or more processors may store a correction history of the first test protocol.

[0027] According to this aspect, it is possible to use the revision history of the first examination protocol.

[0028] An operation method of an examination support device according to a ninth aspect of the present disclosure is a method of operating an examination support device, which includes obtaining an examination order for a subject of a medical imaging diagnostic examination, obtaining subject information about the subject, obtaining examination information about the medical imaging diagnostic examination to be performed on the subject, and creating a first examination protocol to be applied to the medical imaging diagnostic examination to be performed based on the examination order, based on the subject information and the examination information.

[0029] According to the operation method of the test support device according to the 9th aspect of the present disclosure, it is possible to obtain the same operational effects as those of the test support device according to the 1st aspect. The constituent elements of the test support device according to the 2nd to 8th aspects may be applied as the constituent elements of the operation method of the test support device according to the other aspects.

[0030] A program according to a tenth aspect of the present disclosure is a program that causes a computer to realize functions of obtaining an examination order for a subject of a medical imaging diagnostic examination, obtaining subject information about the subject, obtaining examination information about the medical imaging diagnostic examination to be performed on the subject, and creating a first examination protocol that is applied to the medical imaging diagnostic examination to be performed based on the examination order, based on the subject information and the examination information.

[0031] According to the program according to the tenth aspect of the present disclosure, it is possible to obtain the same operational effects as those of the test support device according to the first aspect. The components of the test support device according to the second to eighth aspects may be applied as the components of the program according to the other aspects.

[0032] A medical imaging device according to an eleventh aspect of the present disclosure is a medical imaging device equipped with an examination support device that supports capturing medical images, the examination support device comprising one or more processors and one or more memories in which a program including one or more instructions executed by the one or more processors is stored, and the one or more processors execute the program stored in the one or more memories to obtain an examination order for a subject of a medical imaging diagnostic examination, obtain subject information about the subject, obtain examination information about the medical imaging diagnostic examination to be performed on the subject, and create, based on the subject information and the examination information, a first examination protocol to be applied to the medical imaging diagnostic examination to be performed based on the examination order.

[0033] According to the medical imaging device according to the eleventh aspect of the present disclosure, it is possible to obtain the same operational effects as the examination support device according to the first aspect. The constituent elements of the examination support devices according to the second to eighth aspects may be applied as the constituent elements of the medical imaging device according to the other aspects. Effect of the Invention

[0034] According to the present disclosure, a first examination protocol is generated based on subject information on an examination subject and examination information on a medical image diagnostic examination, thereby reducing the burden on an operator in creating an examination protocol. [Brief description of the drawings]

[0035] [Figure 1] FIG. 1 is a block diagram showing an example of the configuration of a medical information system. [Diagram 2] FIG. 2 is a diagram showing the overall configuration of an MRI apparatus applied to the medical information system shown in FIG. [Diagram 3] FIG. 3 is a functional block diagram showing the electrical configuration of the test support device according to the first embodiment. [Figure 4] FIG. 4 is a block diagram showing a hardware configuration of the electrical configuration of the test support device shown in FIG. [Diagram 5]FIG. 5 is a flowchart showing the procedure of the inspection support method according to the first embodiment. [Figure 6] FIG. 6 is a table showing the correspondence between the examination information and the changes in the examination protocol. [Figure 7] FIG. 7 is a table showing the correspondence between subject information and changes to the examination protocol. [Figure 8] FIG. 8 is a schematic diagram showing an example of the configuration of a user interface. [Figure 9] FIG. 9 is a functional block diagram showing the electrical configuration of the test support device according to the second embodiment. [Figure 10] FIG. 10 is a flowchart showing the procedure of the inspection support method according to the second embodiment. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0036] Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings. In the following description and the accompanying drawings, the same components are denoted by the same reference numerals, and duplicated explanations will be omitted. In addition, when multiple components are exemplified in the following embodiments, it can be interpreted that at least one of the multiple components is included.

[0037] [Example of medical information system configuration] Fig. 1 is a block diagram showing an example of the configuration of a medical information system. The medical information system 1 shown in the figure is an information processing system introduced in a medical facility such as a hospital. The medical information system 1 includes a hospital information system 3, an image diagnosis department information management system 4, a modality device 5, and a medical image management system 6. The medical image management system may be referred to as PACS, which is an abbreviation of Picture Archiving and Communication Systems.

[0038] The hospital information system 3 is a system that manages various operations in the entire medical facility. The hospital information system 3 may be configured to include multiple systems such as an electronic medical record system, an ordering system, and a medical accounting system.

[0039] The imaging diagnosis department information management system 4 is a system that manages the operations of the imaging diagnosis department such as the radiology department. The imaging diagnosis department information management system 4 cooperates with the hospital information system 3 and performs processes such as examination reservations for imaging diagnosis examinations, creating examination orders, and managing examination results.

[0040] The modality device 5 is a medical imaging device that captures medical images of a subject. The modality device 5 captures medical images based on an examination order transmitted from the hospital information system 3. An examination protocol is associated with the examination order transmitted from the hospital information system 3 to the modality device 5. The modality device 5 captures medical images in accordance with the examination protocol associated with the examination order.

[0041] 1 illustrates an MRI device as an example of the modality device 5. Examples of the modality device 5 include a CT device, an ultrasonic diagnostic device, a PET device, a mammography device, an X-ray diagnostic device, an X-ray fluoroscopy diagnostic device, and an endoscope device.

[0042] Incidentally, MRI is an abbreviation of Magnetic Resonance Imaging, which is the English abbreviation of magnetic resonance image. CT is an abbreviation of Computed Tomography. PET is an abbreviation of Positron Emission Tomography. The subject described in the embodiment is an example of a subject of a medical image diagnostic examination.

[0043] The medical information system 1 may be equipped with a plurality of modality devices 5. The plurality of modality devices 5 may be of the same type or may be of different types. The number and types of the modality devices 5 are appropriately specified for each medical facility.

[0044] The medical image management system 6 is a computer system that stores and manages examination data including medical images captured and generated using the modality device 5. The medical image management system 6 includes a large-capacity external storage device and a database management program. The medical image management system 6 may be configured to include a DICOM server that operates based on the DICOM specifications. DICOM is an abbreviation for Digital Imaging and Communications in Medicine.

[0045] The hospital information system 3, the imaging diagnostic department information management system 4, the modality device 5, and the medical image management system 6 are electrically connected to each other so as to be able to communicate freely via a network. The network may be a local area network within a medical facility. Part of the network may be a wide area network. Note that the network is not shown in FIG. 1.

[0046] The medical image management system 6 receives various data including images generated in the modality device 5 via the network. The medical image management system 6 stores the received various data in a storage medium such as a large-capacity external storage device. The medical image management system 6 manages the various data stored in the storage medium.

[0047] The medical image management system 6 communicates with the hospital information system 3, the image diagnosis department information management system 4, etc. via a network. The medical image management system 6 transmits and receives various data including examination images from the hospital information system 3, etc. The DICOM protocol can be applied to the storage format of image data in the medical image management system 6 and the communication between devices via the network.

[0048] [Example of MRI system configuration] Fig. 2 is a diagram showing the overall configuration of an MRI apparatus applied to the medical information system shown in Fig. 1. An MRI apparatus 5A shown in Fig. 2 is an example of the modality apparatus 5 shown in Fig. 1.

[0049] The MRI apparatus 5A shown in Fig. 2 includes a measuring device 10, an examination support device 20, an output device 30, an input device 40, and an external storage device 50. The measuring device 10 includes a static magnetic field coil 11, a gradient magnetic field coil 12, and a gradient magnetic field power supply 15. The static magnetic field coil 11 generates a static magnetic field in a space in which a subject is placed. The gradient magnetic field coil 12 applies a magnetic field gradient to the static magnetic field generated by the static magnetic field coil 11. The gradient magnetic field power supply 15 is a drive power supply for the gradient magnetic field coil 12.

[0050] The measurement device 10 includes a transmitting coil 13, a receiving coil 14, a transmitter 16, and a receiver 17. The transmitting coil 13 generates a high-frequency magnetic field for a measurement region of the subject. The transmitter 16 supplies a pulse current, which is an excitation current, to the transmitting coil 13. The receiving coil 14 receives a nuclear magnetic resonance signal generated from the subject. The receiver 17 transmits the nuclear magnetic resonance signal received using the receiving coil 14 to the examination support device 20. The nuclear magnetic resonance signal may be referred to as an echo signal.

[0051] The MRI apparatus 5A applies either a vertical magnetic field type or a horizontal magnetic field type depending on the direction of the static magnetic field to be generated. Various types of static magnetic field coil 11 are adopted depending on the above-mentioned magnetic field type. The gradient magnetic field coil 12 includes a plurality of coils that generate gradient magnetic fields in three mutually orthogonal axial directions. Each of the plurality of coils included in the gradient magnetic field coil 12 is driven by a gradient magnetic field power supply 15. Due to the application of the gradient magnetic field, position information is added to the nuclear magnetic resonance signal generated from the subject.

[0052] Although FIG. 2 illustrates an example in which the transmitting coil 13 and the receiving coil 14 are provided separately, there may be an example in which a single coil having the functions of the transmitting coil 13 and the receiving coil 14 is provided.

[0053] The measurement device 10 includes a sequence control device 18. The sequence control device 18 controls the operation of the gradient magnetic field power supply 15 and the transmitter 16 to control the timing of generation of the gradient magnetic field and the high frequency magnetic field. The sequence control device 18 controls the operation of the receiver 17 to control the timing of reception of the nuclear magnetic resonance signal and executes the measurement. A control time chart applied to the sequence control device 18 is called an imaging sequence, which is set in advance according to the measurement and stored in a storage device or the like provided in the examination support device 20.

[0054] The examination support device 20 is a computer including one or more processors such as a CUP (Central Processing Unit), one or more memories, a storage device, etc. The examination support device 20 functions as a control device that controls the operation of each part of the measuring device 10 via the sequence control device 18. The examination support device 20 also functions as a calculation device that executes calculation processing on the nuclear magnetic resonance signal received via the receiver 17 and the sequence control device 18 and acquires an image signal of a predetermined imaging region. The examination support device 20 may be a device that constitutes the MRI device 5A, or may be an external device independent of the MRI device 5A.

[0055] In the examination support device 20, an output device 30, an input device 40, and an external storage device 50 are electrically connected to each other so as to enable data communication. The output device 30 may be a display that displays the results of arithmetic processing executed by the examination support device 20. For example, the output device 30 may display a reconstructed image reconstructed based on a nuclear magnetic resonance signal transmitted from the measuring device 10. The nuclear magnetic resonance signal may be referred to as an NMR signal, using the abbreviation of Nuclear Magnetic Resonance, the English expression of nuclear magnetism.

[0056] The output device 30 may be a liquid crystal display, an organic electroluminescence display, a projector, or the like. The output device 30 may be an appropriate combination of these. The organic electroluminescence may be referred to as OEL, which is an abbreviation of Organic Electro-Luminescence. The display in the following description is the display that functions as the output device 30 shown in FIG. 2.

[0057] The input device 40 is an interface through which an operator inputs conditions applied to measurement, conditions applied to calculation processing, parameters, etc. Examples of the input device 40 include a keyboard and a mouse. A display device functioning as the output device 30 may be integrated with the input device 40 by using a touch panel type display. The operator can use the input device 40 to input parameters such as the number of echoes to be measured, the echo time, and the echo interval.

[0058] The external storage device 50 stores data used in various arithmetic processing executed by the test support device 20, data derived as a result of the arithmetic processing, conditions and parameters applied to the arithmetic processing, and programs for executing the arithmetic processing. The external storage device 50 may realize a part of the functions of the internal storage device of the test support device 20, or a part of the functions of the external storage device 50 may be realized by the internal storage device of the test support device 20.

[0059] The MRI apparatus 5A includes a bed 60, a bed driving device 62, and a bed driving control device 64. The bed 60 has a structure on which a subject (subject) can be placed, and is configured to be freely movable by using the bed driving device 62 in the vertical direction, in the direction to enter the imaging area, and in the direction to retreat from the imaging area.

[0060] The bed driving device 62 includes a driving mechanism connected to the bed 60 and a driving source such as a motor connected to the driving mechanism. The driving mechanism and the driving source are not shown in the drawings.

[0061] The bed drive control device 64 applies specified drive conditions to control the operation of the bed drive device 62, moves the bed 60 in a specified direction, and stops it at a specified position. A computer is used as the bed drive control device 64. The bed drive control device 64 may include an input device such as a keyboard and an output device such as a display.

[0062] The examination support device 20 and the bed drive control device 64 may be configured as a console unit. The console unit functions as various control devices in the MRI apparatus 5A. The console unit is realized by using one or more computers.

[0063] [Example of configuration of the inspection support device according to the first embodiment] Fig. 3 is a functional block diagram showing the electrical configuration of the examination support device according to the first embodiment. The examination support device 20 includes an examination information receiving unit 100. The examination information receiving unit 100 receives examination information included in an examination order transmitted from the imaging diagnosis department information management system 4 shown in Fig. 1. Note that receiving an examination order is synonymous with receiving an examination order and acquiring an examination order. The substance of information in the following description is an electrical signal representing information.

[0064] The examination information may include the examination site, the examination type, the examination purpose, and whether or not an examination is requested for another modality, etc. An example of the examination information is that the examination site is the brain, the examination type is a non-contrast MRI examination, and the examination purpose is suspected cerebral infarction.

[0065] The examination support device 20 includes a subject information receiving unit 101. The subject information receiving unit 101 receives subject information included in an examination order. The subject information includes the subject's physique, height, whether or not a pre-examination is required, and physical characteristics. The subject's physique may be information that represents the subject's physique characteristics, such as being tall and thin.

[0066] Examples of the necessity of a pre-examination include information indicating whether or not a pre-examination such as an electrocardiogram examination and a cognitive function test is necessary before an MRI examination. Examples of physical characteristics include the presence or absence of metal in the body, the presence or absence of allergies, whether or not it is difficult to hold one's breath, and whether or not it is difficult to remain still. Examples of metal in the body include metal that fixes a fractured part. Note that the subject described in the embodiment is an example of a subject to be examined, and the subject information described in the embodiment is an example of subject information.

[0067] The examination information receiving unit 100 and the subject information receiving unit 101 function as components of an examination order receiving unit that receives an examination order transmitted from the imaging diagnosis department information management system 4.

[0068] The examination support device 20 includes an examination protocol receiving unit 102. The examination protocol receiving unit 102 receives a second examination protocol selected when an examination order is created in the image diagnosis department information management system 4. For example, the examination protocol receiving unit 102 may receive the second examination protocol, which is an examination protocol selected by a doctor when an examination order is created. The examination protocol may include an imaging protocol applied to capture a medical image. The examination protocol may simply be referred to as a protocol.

[0069] The second examination protocol is associated in advance with an examination order including examination information. That is, one or more second examination protocols are defined according to the examination part, examination method, and examination purpose. The correspondence between the second examination protocol and the examination order is shared between the imaging diagnosis department information management system 4 and the modality device 5.

[0070] Here, the examination protocol includes one or more sequences. The sequence includes the imaging sequence described above. For example, when a plurality of examination protocols with different sequences and a plurality of examination protocols with different combinations of sequences are stored in the modality device 5, individual identification information may be assigned to each of the plurality of examination protocols and managed. The identification information for each examination protocol in the modality device 5 may be shared between the imaging diagnosis department information management system 4 and the modality device 5.

[0071] The second test protocol may be included in the test order. That is, the test protocol receiver 102 may receive the second test protocol included in the test order. The test protocol receiver 102 may function as a component of the test order receiver.

[0072] The examination support device 20 includes a notification unit 104. The notification unit 104 may include a notification creation unit that creates a notification, and a notification display control unit that generates a display signal representing the notification and transmits the display signal to a display.

[0073] The notification unit 104 notifies the receipt of the test order. That is, the notification unit 104 notifies the receipt of the test information and the subject information. As a notification of the receipt of the test order, the notification unit 104 may cause text information representing the receipt of the test order to be displayed on a display. The notification unit 104 may notify the contents of the test information by applying the text information. The notification unit 104 may notify the contents of the subject information by applying the text information.

[0074] The notification unit 104 notifies the reception of the second test protocol. The notification unit 104 may display text information representing the reception of the second test protocol on the display as the notification of the reception of the second test protocol. The notification unit 104 may display text information representing the contents of the second test protocol on the display as the notification of the contents of the second test protocol.

[0075] The examination support device 20 includes an examination protocol setting unit 106. The examination protocol setting unit 106 sets an examination protocol to be applied to an examination, such as setting an imaging protocol to be applied to imaging of medical images in the modality device 5. For example, the examination protocol setting unit 106 may set the second examination protocol, which is received using the examination protocol receiving unit 102 and whose receipt has been notified using the notifying unit 104, as the examination protocol.

[0076] The examination support device 20 includes an examination protocol creation unit 108. When the second examination protocol is not approved as an examination protocol, the examination protocol creation unit 108 creates a first examination protocol to replace the second examination protocol.

[0077] Although the test order including the test information and the second test protocol are associated in advance, the second test protocol may need to be customized depending on the subject. For example, when the test order is incorrect or when a test order is created that overlooks a required test condition, the first test protocol is automatically created when the second test protocol is not approved.

[0078] The creation of the first test protocol may involve modifying the second test protocol. The modification of the second test protocol includes at least one of changing, adding, and deleting a sequence constituting the second test protocol. Hereinafter, the term "creation of the test protocol" may include concepts such as modification and change of the test protocol.

[0079] The examination support device 20 includes a second approval information acquiring unit 110. The second approval information acquiring unit 110 acquires approval information indicating whether the notified second examination protocol is approved or not approved. The approval information may be transmitted by an operator such as a radiologist who has confirmed the correspondence between the examination order and the second examination protocol, using the input device 40 shown in FIG.

[0080] When the second approval information acquisition unit 110 acquires approval information representing approval of the second inspection protocol, it transmits the approval information to the inspection protocol setting unit 106. The inspection protocol setting unit 106 sets the second inspection protocol as the inspection protocol based on the approval information.

[0081] When the second approval information acquiring unit 110 acquires non-approval information representing non-approval of the second examination protocol, the second approval information acquiring unit 110 transmits the non-approval information to the examination protocol creating unit 108. The examination protocol creating unit 108 creates the first examination protocol based on the non-approval information. For example, when the second examination protocol needs to be reviewed, the operator may operate the input device 40 shown in FIG. 2 to transmit non-approval information of the second examination protocol to the second approval information acquiring unit 110.

[0082] The examination support device 20 includes an examination information analysis unit 112. The examination information analysis unit 112 analyzes the examination information. The examination information analysis unit 112 transmits the analysis result of the examination information to the examination protocol creation unit 108. An example of the analysis of the examination information is a process of extracting the examination site, the examination method, the examination purpose, and the like.

[0083] The examination support device 20 includes a subject information analysis unit 113. The subject information analysis unit 113 analyzes the subject information. The subject information analysis unit 113 transmits the analysis result of the subject information to the examination protocol creation unit 108. An example of the subject information analysis is a process of extracting the subject's physique, height, weight, whether or not a pre-examination has been performed, physical characteristics, and the like from the examination order.

[0084] The examination support device 20 includes a past examination information acquisition unit 114 and a past examination information analysis unit 116. The past examination information acquisition unit 114 acquires past examination information related to past examinations performed in the past on a subject described in an examination order. The past examination information analysis unit 116 analyzes the past examination information. The past examination information analysis unit 116 transmits the analysis result of the past examination information to the examination protocol creation unit 108.

[0085] The past examination information may be acquired from an electronic medical record system included in the hospital information system 3 shown in Fig. 1, or may be acquired from a medical image storage device included in the medical image management system 6. The past examination information may be acquired from information stored in the modality device 5.

[0086] Examples of the analysis of past examination information include extraction of examination protocols applied to the past examinations, comments on the past examinations, past images acquired in the past examinations, and the presence or absence of requests for image interpretation.

[0087] The past examination information may include information on similar past examinations that are similar to the past examinations that were performed in the past. Examples of similar past examinations include examinations of different examination sites for a subject described in the examination order, and examinations of the same examination site but with different examination conditions.

[0088] Examples of the past similar examination information include a creation record of an examination protocol in a similar examination, a correction record of the examination protocol, etc. The past examination information analysis unit 116 may analyze the past similar examination information.

[0089] The examination protocol creation unit 108 creates a first examination protocol using the analysis result of the examination information and the analysis result of the subject information. The examination protocol creation unit 108 may use the analysis result of the past examination information when creating the first examination protocol.

[0090] Examples of creating a first examination protocol include adding pre-examination instructions, changing the order of imaging in cases of specific diseases, determining whether the limbs are left or right from previous examination images, performing imaging positioning from previous examination images, adding post-processing after imaging, adding destinations for sending examination images based on whether or not an image reading is requested, and adding destinations for sending previous examination images based on whether or not an image reading is requested.

[0091] For example, if metal is present in the subject's body, a warning message is added to the output, notifying that an MRI examination cannot be performed, or a warning message is added to the output, notifying that the imaging task will be changed.

[0092] If the patient is allergic to contrast media, a message will be output to indicate that contrast media cannot be used. If the patient requires assistance in bed, a message will be output to indicate that the patient requires assistance in bed.

[0093] If the purpose of the examination is suspected cerebral infarction, the sequence order is changed and the DWI sequence is performed first. Note that DWI is an abbreviation of Diffusion-Weighted Imaging. In other words, a specific imaging is performed first depending on the examination area and purpose.

[0094] If the examination site is not specified in the examination order, the examination site is specified by referring to the previous examination images. If the processing performed in the previous examination, such as 3D analysis, lesion detection, and report creation, is not included, the processing performed in the previous examination is added. If the destination of the examination image is not included, the destination of the previous examination image is added as the destination of the examination image.

[0095] The notification unit 104 notifies the first examination protocol. That is, the notification unit 104 may display a GUI on the display for confirming whether or not to approve the first examination protocol. The operator may operate the input device 40 to input approval or disapproval of the first examination protocol.

[0096] The notification unit 104 may display the second examination protocol on the GUI when displaying the GUI for confirming the approval of the first examination protocol. Note that GUI is an abbreviation of Graphical User Interface.

[0097] The examination support device 20 includes a comparison unit 118. The comparison unit 118 compares the second examination protocol with the first examination protocol and determines whether the first examination protocol is appropriate. The notification unit 104 displays the comparison result between the second examination protocol and the first examination protocol on a display.

[0098] The test support device 20 includes a first approval information acquisition unit 120. The first approval information acquisition unit 120 acquires information indicating approval or non-approval of the first test protocol. When the first approval information acquisition unit 120 acquires approval information indicating approval of the first test protocol, the test protocol setting unit 106 sets the first test protocol as the test protocol.

[0099] When the first approval information acquiring unit 120 acquires the non-approval information representing the non-approval of the first examination protocol, the examination protocol creating unit 108 may correct the first examination protocol. When the first approval information acquiring unit 120 acquires the non-approval information representing the non-approval of the first examination protocol, the examination protocol setting unit 106 may return the second examination protocol to the imaging diagnosis department information management system 4.

[0100] The examination support device 20 includes a correction instruction receiving unit 122. The correction instruction receiving unit 122 receives a correction instruction for the first examination protocol. For example, the correction instruction receiving unit 122 acquires a correction instruction for the first examination protocol input by an operator operating the input device 40.

[0101] The modification instruction receiving unit 122 transmits a modification instruction for the first examination protocol to the examination protocol creating unit 108. The examination protocol creating unit 108 modifies the first examination protocol based on the received modification instruction. The notification unit 104 may display a GUI on the display for confirming whether or not the first examination protocol approves the modified examination protocol.

[0102] The examination support device 20 includes a correction history storage unit 124. The correction history storage unit 124 stores the correction history of the examination protocol implemented in the examination protocol creation unit 108.

[0103] The revision history storage unit 124 can store, as revision history, the operator who approved or disapproved the examination protocol, the parts of the examination protocol that were revised, the parts of the captured medical images that were revised, the comments made at the time of the revision, the number of revisions, and the like.

[0104] The examination support device 20 includes a return processing unit 126. When the first approval information acquisition unit 120 acquires information indicating non-approval of the first examination protocol and a specified return condition is satisfied, the return processing unit 126 returns the second examination protocol to the imaging diagnosis department information management system 4. An example of the return condition is a case where the examination protocol after correction is not approved even after a specified number of corrections are performed.

[0105] Fig. 4 is a block diagram showing a hardware configuration of the electrical configuration of the test support device shown in Fig. 3. The computer applied to the test support device 20 may be a personal computer or a workstation. The computer may be a virtual machine. The test support device 20 may be configured using a plurality of computers.

[0106] The inspection support device 20 includes a processor 202, a memory 204 which is a main storage device, a storage 206 which is an auxiliary storage device, an input / output interface 208, and a bus 210. The processor 202 includes a CPU. The processor 202 may include a GPU. Note that CPU is an abbreviation for Central Processing Unit. GPU is an abbreviation for Graphics Processing Unit.

[0107] The processor 202 is connected to the memory 204, the storage 206, and the input / output interface 208 via a bus 210. The input device 40 and the output device 30 are connected to the examination support device 20 via the input / output interface 208.

[0108] The processor 202 executes a program including one or more instructions stored in the memory 204 to realize various functions. The input / output interface 208 includes a communication interface connectable to a network, and a connection interface connectable to an external device. As a connection interface connectable to an external device, for example, a universal serial bus and an HDMI may be applied. The universal serial bus may be referred to as USB, which is an abbreviation of Universal Serial Bus. HDMI is an abbreviation of High-Definition Multimedia Interface. USB and HDMI are registered trademarks.

[0109] The processor 202 communicates with various external devices of the MRI apparatus 5A via the input / output interface 208, and transmits and receives necessary information. Note that illustration of the various external devices is omitted.

[0110] The output device 30 may include a display that displays various information in addition to medical images captured using the modality device 5. The output device 30 is used as a part of a GUI when receiving input from the input device 40. The output device 30 is not limited to one, and may be in the form of a multi-display having multiple displays.

[0111] [Procedure of the inspection support method according to the first embodiment] Fig. 5 is a flowchart showing the procedure of the examination support method according to the first embodiment. In the examination order receiving step S10, the examination information receiving unit 100 shown in Fig. 3 receives examination information included in the examination order transmitted from the imaging diagnosis department information management system 4. Also, in the examination order receiving step S10, the subject information receiving unit 101 receives subject information included in the examination order transmitted from the imaging diagnosis department information management system 4.

[0112] The examination order receiving step S10 includes an examination information receiving step in which examination information is received, and a subject information receiving step in which subject information is received. After the examination order receiving step S10, the procedure of the examination support method proceeds to an examination protocol receiving step S12.

[0113] In the examination protocol receiving step S12, the examination protocol receiving unit 102 receives the examination protocol transmitted from the imaging diagnosis department information management system 4. The examination order receiving step S10 and the examination protocol receiving step S12 may be interchanged or may be executed in parallel. After the examination protocol receiving step S12, the procedure of the examination support method proceeds to a notification display step S14.

[0114] In the notification display step S14, the notification unit 104 notifies the receipt of the examination order and notifies the receipt of the examination protocol. In the notification display step S14, an examination order notification step of notifying the receipt of the examination order and an examination protocol notification step may be executed as separate steps. After the notification display step S14, the procedure of the examination support method proceeds to a second examination protocol approval decision step S16.

[0115] The operator who has confirmed receipt of the test order and the second test protocol notified in the notification display step S14 can confirm whether the second test protocol is appropriate for the test order.

[0116] In the second examination protocol approval determination step S16, the second approval information acquisition unit 110 determines whether to acquire approval information representing approval of the second examination protocol, or non-approval information representing non-approval of the second examination protocol.

[0117] In the second examination protocol approval determination step S16, if it is determined that approval information approving the second examination protocol has been acquired, a Yes determination is made, and the procedure of the examination support method proceeds to the examination protocol setting step S18.

[0118] In the examination protocol setting step S18, the examination protocol setting unit 106 sets the second examination protocol as the examination protocol. When the examination protocol applied to the examination is set in the examination protocol setting step S18, the procedure of the examination support method is terminated after a prescribed termination process is executed.

[0119] On the other hand, if it is determined in the second examination protocol approval determination step S16 that non-approval information not approving the second examination protocol has been acquired, the result is No, and the procedure of the examination support method proceeds to the examination information analysis step S20.

[0120] That is, the operator who has confirmed whether the second examination protocol is appropriate for the examination order may set the received second examination protocol as the examination protocol to be applied to the examination, or may modify the second examination protocol. If modification of the second examination protocol is selected, the following procedure is applied, and the first examination protocol with the modified second examination protocol is automatically generated.

[0121] In the test information analysis step S20, the test information analysis unit 112 analyzes the test information. The analysis result of the test information in the test information analysis step S20 is transmitted to the test protocol creation unit 108. After the test information analysis step S20, the procedure of the test support method proceeds to a subject information analysis step S21.

[0122] In the subject information analysis step S21, the subject information analysis unit 113 analyzes the subject information. The analysis result of the subject information in the subject information analysis step S21 is transmitted to the examination protocol creation unit 108. After the subject information analysis step S21, the procedure of the examination support method proceeds to a past examination information analysis step S22. Note that the examination information analysis step S20 and the subject information analysis step S21 may be interchanged in order or may be executed in parallel.

[0123] In the past examination information analysis step S22, the past examination information analysis unit 116 acquires the past examination information and analyzes the past examination information. The analysis result of the past examination information in the past examination information analysis step S22 is transmitted to the examination protocol creation unit 108. The past examination information analysis step S22 may include a past examination information acquisition step of acquiring the past examination information. After the past examination information analysis step S22, the procedure of the examination support method proceeds to an examination protocol creation step S24.

[0124] In the examination protocol creation step S24, the examination protocol creation unit 108 creates a first examination protocol in which at least a part of the second examination protocol is changed based on the analysis result of the examination information and the analysis result of the subject information. The analysis result of the past examination information may be used when creating the first examination protocol. After the examination protocol creation step S24, the procedure of the examination support method proceeds to a first examination protocol notification step S26.

[0125] In the first examination protocol notification step S26, the notification unit 104 displays the notification of the first examination protocol created in the examination protocol creation step S24. That is, in the first examination protocol notification step S26, the first examination protocol is displayed on the display.

[0126] In the first examination protocol notification step S26, the first examination protocol and the second examination protocol may be displayed. When the first examination protocol is displayed, a comparison step of comparing the second examination protocol with the first examination protocol may be executed, and a comparison result between the second examination protocol and the first examination protocol may be displayed. After the first examination protocol notification step S26, the procedure of the examination support method proceeds to a first examination protocol approval decision step S28.

[0127] That is, the operator who has confirmed the first examination protocol displayed on the display may set the first examination protocol as the examination protocol to be applied to the examination, or may further modify the first examination protocol.

[0128] In the first examination protocol approval determination step S28, the first approval information acquisition unit 120 determines whether to acquire approval information representing approval of the first examination protocol, or acquire non-approval information representing non-approval of the first examination protocol.

[0129] If it is determined in the first examination protocol approval determination step S28 that approval information approving the first examination protocol has been obtained, the result is a Yes determination, and the procedure of the examination support method proceeds to the examination protocol setting step S18, where the first examination protocol is set as the examination protocol to be applied to the examination.

[0130] On the other hand, if it is determined in the first examination protocol approval determination step S28 that non-approval information not approving the second examination protocol has been acquired, the determination is No, and the procedure of the examination support method proceeds to the correction determination step S30.

[0131] That is, in the first examination protocol approval judgment step S28, the received second examination protocol is compared with the created first examination protocol, and the operator judges whether the created first examination protocol is appropriate. The examination support device 20 displays a GUI on the display for confirming whether the first examination protocol is appropriate.

[0132] The examination support device 20 displays the first examination protocol and the second examination protocol side by side on the GUI. When the sequence of the first examination protocol differs from the sequence of the second examination protocol, the examination support device 20 displays information included in the examination order and the reason for changing the sequence on the GUI. The change location and the reason for the change may be displayed in a different manner from other information. Examples of the change in the display manner include a change in color and the use of highlighted characters.

[0133] For example, if an internal metal is overlooked in the examination order and the first examination protocol is replaced with an imaging sequence that relatively reduces metal artifacts, the examination support device 20 may display text information such as "internal metal" in the examination information on the GUI. This allows the operator of the modality 5 to confirm the reason for the change in the sequence.

[0134] In the modification judgment step S30, the examination protocol setting unit 106 judges whether to modify the first examination protocol or to return the second examination protocol to the imaging diagnosis department information management system 4. In the modification judgment step S30, if it is judged that the second examination protocol is to be returned to the imaging diagnosis department information management system 4, the judgment is No, and the process proceeds to the second examination protocol return step S32.

[0135] In the second examination protocol return step S32, the second examination protocol is returned to the imaging diagnosis department information management system 4. When the second examination protocol is returned, the examination order may be returned. When the second examination protocol is returned in the second examination protocol return step S32, a prescribed end process is executed, and then the procedure of the examination support method is terminated.

[0136] On the other hand, in the modification judgment step S30, if it is judged that the modification of the first examination protocol is executed, the judgment is Yes, and the process proceeds to the modification instruction receiving step S34. In the modification instruction receiving step S34, the modification instruction receiving unit 122 receives a modification instruction of the first examination protocol. The modification instruction of the first examination protocol is transmitted to the examination protocol creating unit 108. After the modification instruction receiving step S34, the process proceeds to the examination protocol creating step S24, where the modification of the first examination protocol is executed until the modified first examination protocol is approved or the second examination protocol is returned.

[0137] In the examination protocol creation step S24, when the first examination protocol is modified, a modification history storage step for storing the modification history of the first examination protocol may be executed, or a modification history notification step for notifying the modification history of the first examination protocol may be executed. Note that the examination support method whose procedure is illustrated in FIG. 6 is an example of an operation method of the examination support device.

[0138] [Example of creating an inspection protocol] Fig. 6 is a table showing the correspondence between the test information and the changes in the test protocol. In the test information analysis step S20 shown in Fig. 5, when the test information corresponding to the left column of the table shown in Fig. 6 is obtained, a correction instruction corresponding to the change in the test protocol in the right column of the table in Fig. 6 is received in the correction instruction receiving step S34 shown in Fig. 5.

[0139] For example, when it is difficult to identify the disease range or when it is desired to perform imaging of a wide range, the imaging conditions set in the examination protocol are changed to imaging conditions that enable imaging of a relatively wide range.

[0140] In addition, when the purpose is to examine a specific structure, such as when it is desired to image a specific structure in an examination area by applying relatively thin slices, an imaging task configured with relatively thin slices for each area or for each structure in the area is added.

[0141] When an instruction for comparative reading with a previous examination is included in the second examination protocol, a first examination protocol is proposed in which the imaging conditions such as the positioning of the imaging position and the slice thickness from the previous examination image match the imaging conditions of the previous examination image. In addition, the previous examination image is transmitted together with the examination image.

[0142] If the part to be imaged has left and right parts, such as the limbs, the user is prompted to make sure that the left and right parts are correct before imaging. If the left and right parts are not specified, left and right part information will be obtained from previous examination images if they exist.

[0143] If post-processing after the imaging is instructed, such as analysis of the examination image, post-processing after the imaging is added. If the disease name is included, the sequences are rearranged according to the disease name. Note that the disease name here is synonymous with the purpose of the examination. For example, if the disease name is suspected cerebral infarction, the sequence order is changed and the DWI sequence is performed first.

[0144] When a request to create an analysis report, or to detect lesions or assist with interpretation is made, the contents of the past analysis report are referenced and the analysis processing performed in the previous examination is added. In addition, the analysis conditions set in the previous examination are applied as the analysis conditions for the current examination.

[0145] Fig. 7 is a table showing the correspondence between subject information and changes to the examination protocol. In the subject information analysis step S21 shown in Fig. 5, when subject information corresponding to the left column of the table shown in Fig. 7 is obtained, a correction instruction corresponding to the change to the examination protocol in the right column of the table in Fig. 7 is received in the correction instruction receiving step S34 shown in Fig. 5.

[0146] If the subject information includes the presence or absence of metal in the subject's body, the time of implantation of the metal in the body, and the material of the metal in the body, in an MRI examination compatible with metal in the body, a change is made to the imaging task to reduce metal artifacts. In addition, in an MRI examination that is not compatible with metal in the body, a notice is displayed before the examination that the MRI examination is not compatible with metal in the body. The notice that the MRI examination is not compatible with metal in the body can be understood as a notice indicating that the MRI examination is not possible.

[0147] If the subject information includes risk factors for contrast allergy and side effects of contrast, the subject is prompted to be aware of contrast allergy before the examination. If the subject information includes breath-holding difficulties, such as a history of poor breath-holding, being able to hold breath only for relatively short periods, or being unable to hold breath at all, a body motion correction task is suggested.

[0148] Note that the correction instructions for the examination protocol corresponding to the examination information shown in FIG. 6 and the correction instructions corresponding to the subject information shown in FIG. 7 are merely examples, and may be added, deleted, or corrected as appropriate.

[0149] [Example of user interface configuration] Fig. 8 is a schematic diagram showing a configuration example of a user interface. A screen 300 shown in the figure is displayed on a display functioning as the output device 30 shown in Fig. 1. That is, the notification unit 104 shown in Fig. 3 transmits a display signal representing the screen 300 to the display.

[0150] The screen 300 includes an examination order information area 302 , a subject information area 304 , an examination site area 306 , an examination protocol area 308 , an examination information area 310 , a modality information area 312 , and a character input area 314 .

[0151] The test order information area 302 displays various information on the test order, such as the test ID and the creator of the test order. Note that ID is an abbreviation of IDentification. The subject information area 304 displays various information on the subject, such as the subject's name, subject ID, height, and weight. The subject information area 304 also displays subject information used to create a test protocol, such as the presence or absence of metal in the body, as shown in FIG. 7.

[0152] The examination part area 306 displays information about the part to be examined. As the part to be examined, an anatomical structure such as an organ, and a substructure included in the anatomical structure may be displayed. As the part to be examined, the examination part area 306 may display information indicating whether the left or right part is specified.

[0153] A second examination protocol associated with the examination order is displayed in the examination protocol area 308. The examination protocol area 308 may display identification information for identifying the type of the second examination protocol as the examination protocol.

[0154] The examination information area 310 displays examination information used for creating an examination protocol, such as the difficult to identify disease range shown in Fig. 6. The modality information area 312 displays modality information related to the modality device 5, such as the settings of the modality device 5. The character input area 314 displays character information input by the operator using the input device 40 shown in Fig. 2.

[0155] The screen 300 displays a first button 320, a second button 322, a third button 324, a fourth button 326, a fifth button 328, and a sixth button 330. Although six buttons are illustrated in Fig. 8, there may be one or more buttons.

[0156] The first button 320 and the like are assigned various pieces of information to be input to the modality device 5. For example, the first button 320 may be assigned information input representing the operator's approval of the examination protocol displayed in the examination protocol area 308.

[0157] Similarly, the second button 322 may be assigned to input information representing a correction to the test protocol displayed in the test protocol area 308. The third button 324 may be assigned to information representing a rejection of the second test protocol. That is, the first button 320 may function as an approval button, and the second button 322 may function as a correction instruction button. Furthermore, the third button 324 may function as a reject button.

[0158] For example, in the notification display step S14 illustrated in Fig. 5, the second examination protocol is displayed in the examination protocol area 308 of the screen 300 illustrated in Fig. 8. When the operator approves the second examination protocol, the operator may click the first button 320 to transmit information representing approval of the second examination protocol to the examination protocol setting unit 106 illustrated in Fig. 3.

[0159] On the other hand, when the operator modifies the second examination protocol, the operator clicks the second button 322 to transmit non-approval information of the second examination protocol and modification instruction information of the second examination protocol to the examination protocol setting unit 106.

[0160] In addition, in the first examination protocol notification step S26, the first examination protocol is displayed in the examination protocol area 308 of the screen 300. When the operator approves the first examination protocol, the operator clicks the first button 320 to transmit information indicating approval of the first examination protocol to the examination protocol setting unit 106 illustrated in FIG.

[0161] On the other hand, when the operator modifies the first examination protocol, the operator clicks the second button 322 to send information representing the modification of the first examination protocol to the examination protocol creation unit 108. Furthermore, when the operator does not modify the first examination protocol and sends back the second examination protocol, the operator clicks the third button 324 to send information representing the sending back of the second examination protocol to the examination protocol setting unit 106. The examination protocol setting unit 106 sends a signal representing the sending back of the second examination protocol to the sending back processing unit 126.

[0162] The comparison result between the second examination protocol and the first examination protocol may be displayed on the screen 300. The display of the comparison result between the second examination protocol and the first examination protocol may be applied to an examination protocol area 308.

[0163] The functions of the first button 320, the second button 322, and the third button 324 described above are merely examples, and the functions of the first button 320, etc. may be set as appropriate. Examples of functions that may be assigned to the first button 320, etc. include a function to advance a screen, a function to return a screen, a function to confirm input such as character input, and a function to cancel input. The screen 300 shown in Fig. 8 is an example of an authentication screen on which the operator inputs whether or not to approve the first examination protocol.

[0164] [Effects of the first embodiment] The test support device 20 and the test support method according to the first embodiment can provide the following advantageous effects.

[0165] [1] The examination support device 20 receives an examination order including subject information and examination information, and also receives a second examination protocol associated with the examination order, and notifies the receipt of the examination order and the second examination protocol. When non-approval information of the second examination protocol is acquired, the second examination protocol is modified based on the analysis result of the subject information and the analysis result of the examination information to create a first examination protocol. The modality device 5 applies the first examination protocol to perform an examination on the subject. This prevents the operator from modifying the second examination protocol associated with the examination order, thereby reducing the burden on the operator.

[0166] [2] The examination support device 20 acquires past examination information and analyzes the past examination information. The examination support device 20 creates a first examination protocol by modifying a second examination protocol with reference to the analysis result of the past examination information. In this way, information necessary for creating the first examination protocol can be acquired from the analysis result of the past examination information.

[0167] [3] The examination support device 20 displays the first examination protocol created based on the second examination protocol on a display functioning as the output device 30. This allows the operator to confirm the contents of the first examination protocol.

[0168] That is, it is preferable to perform imaging in the modality device 5 that the operator judges to be appropriate, but it is not preferable to automatically change the instructions sent from the imaging diagnosis department information management system 4. Therefore, a mechanism is provided in which the first protocol created based on the second examination protocol is displayed so that the operator can confirm the correction contents of the second examination protocol. In addition, it is possible to return the second examination protocol to the imaging diagnosis department information management system 4 as necessary.

[0169] [4] The screen 300 displaying the first examination protocol displays a first button 320 for outputting a signal representing approval of the first examination protocol. This allows the operator to operate the first button 320 to input a signal representing approval of the first examination protocol.

[0170] [5] The first examination protocol is created by performing at least one of replacing, changing the order, and adding sequences to the second examination protocol, thereby changing the examination protocol in units of sequences, and reducing the burden on the operator in changing the examination protocol.

[0171] [6] The examination support device 20 accepts the modification of the first examination protocol. This allows the modification of the first protocol suitable for the examination to be implemented, and a reduction in the burden on the operator in modifying the examination protocol can be realized.

[0172] [7] The examination support device 20 notifies the operator of the comparison result between the first examination protocol created based on the second examination protocol and the second examination protocol, thereby enabling the operator to determine whether the first examination protocol is appropriate.

[0173] [8] The examination support device 20 returns the second examination protocol associated with the examination order to the imaging diagnosis department information management system 4. This can notify the imaging diagnosis department information management system 4 that there is a problem with the association between the examination order and the second examination protocol.

[0174] [Example of configuration of the inspection support device according to the second embodiment] 9 is a functional block diagram showing an electrical configuration of an examination support device according to the second embodiment. The examination support device 20A receives an examination order from the image diagnosis department information management system 4, but does not receive a second examination protocol. The examination support device 20A creates a first examination protocol based on the examination information and subject information, and by referring to past examination information as necessary.

[0175] The examination support device 20A does not include the examination protocol receiving unit 102, the second approval information acquiring unit 110, and the comparing unit 118, which are different from the examination support device 20 shown in Fig. 3. In addition, the return processing unit 126A included in the examination support device 20A returns the examination order to the imaging diagnosis department information management system 4 when the first examination protocol is not approved and is not corrected.

[0176] [Procedure of the inspection support method according to the second embodiment] Fig. 10 is a flowchart showing the procedure of the examination support method according to the second embodiment. The flowchart shown in the figure does not include the examination protocol receiving step S12, the notification display step S14, and the second examination protocol approval decision step S16 shown in Fig. 5. Also, instead of the second examination protocol return step S32 for returning the second examination protocol shown in Fig. 5, an examination order return step S33 for returning the examination order is included. The examination support method whose procedure is shown in Fig. 10 is an example of an operation method of the examination support device.

[0177] [Effects of the second embodiment] In the examination support device and examination support method according to the second embodiment, even if an examination protocol is not transmitted when an examination order is transmitted, a first examination protocol is automatically generated based on the analysis result of the examination order. This eliminates the need for an operator to analyze the examination order and generate an examination protocol based on the analysis result, thereby reducing the burden on the operator.

[0178] [Hardware configuration of each processing unit] The hardware structure of the processing units that perform various processes, such as the test information receiving unit 100, the subject information receiving unit 101, and the test protocol receiving unit 102 in the test support device 20 shown in Figure 3 and the test support device 20A shown in Figure 9, is, for example, various processors as shown below.

[0179] Various types of processors include CPUs, which are general-purpose processors that execute programs and function as various processing units, GPUs, programmable logic devices (PLDs), such as FPGAs (Field Programmable Gate Arrays), which are processors whose circuit configuration can be changed after manufacture, and dedicated electrical circuits, such as ASICs (Application Specific Integrated Circuits), which are processors with a circuit configuration designed specifically to execute specific processes.

[0180] One processing unit may be composed of one of these various processors, or may be composed of two or more processors of the same type or different types. For example, one processing unit may be composed of multiple FPGAs, or a combination of a CPU and an FPGA, or a combination of a CPU and a GPU. Also, multiple processing units may be composed of one processor. As an example of multiple processing units being composed of one processor, first, as represented by a computer such as a client or a server, one processor is composed of a combination of one or more CPUs and software, and this processor functions as multiple processing units. Second, as represented by a system on chip (SoC), there is a form in which a processor is used that realizes the functions of the entire system including multiple processing units in one IC (Integrated Circuit) chip. In this way, the various processing units are composed of one or more of the above various processors as a hardware structure.

[0181] Furthermore, the hardware structure of these various processors is, more specifically, an electric circuit that combines circuit elements such as semiconductor elements.

[0182] [About the programs that run the computer] A program that causes a computer to realize some or all of the processing functions of the inspection support device 20, etc. in the embodiment can be recorded on a computer-readable medium such as an optical disk, a magnetic disk, a semiconductor memory, or other tangible non-transitory information storage medium, and the program can be provided through this information storage medium.

[0183] Also, instead of providing the program by storing it on a tangible, non-transitory computer-readable medium, it is also possible to provide a program signal as a download service using a telecommunications line such as the Internet.

[0184] Furthermore, a part or all of the processing functions of the inspection support device 20 etc. may be realized by cloud computing, and may also be provided as SaaS (Software as a Service).

[0185] [Application example to medical image diagnostic inspection system] The measuring device 10 and the examination support device 20 shown in Fig. 2 may be electrically connected via any network so as to freely communicate data to configure a medical image diagnostic examination system. The data communication between the measuring device 10 and the examination support device 20 may be wired communication or wireless communication. In addition, a computer functioning as a processing unit related to the creation of the first examination protocol and a computer functioning as a control device for the measuring device 10 shown in Fig. 3 may be separated from the examination support device 20, and the computer functioning as the processing unit and the computer functioning as a control device for the measuring device 10 may be electrically connected via any network so as to freely communicate data.

[0186] The present disclosure is not limited to the above-described embodiment, and various modifications are possible without departing from the spirit and scope of the technical idea of ​​the present disclosure. [Explanation of symbols]

[0187] 1. Medical information systems 3. Hospital information systems 4. Diagnostic Imaging Department Information Management System 5. Modality equipment 5A...MRI device 6. Medical image management system 20...Inspection support device 30...Output device 40...Input device 100…Inspection information receiving department 101...Subject information receiving unit 102…Test Protocol Receiving Department 104…Notification department 106...Inspection protocol setting section 108…Test Protocol Creation Department 112…Test Information Analysis Department 113…Subject Information Analysis Department 120...First approval information acquisition department

Claims

1. one or more processors; one or more memories in which a program including one or more instructions executed by the one or more processors is stored; Equipped with The one or more processors execute the programs stored in the one or more memories, Obtaining test orders for subjects of medical imaging diagnostic examinations; obtaining subject information regarding said subject; Obtaining examination information regarding a medical imaging diagnostic examination performed on the subject; An examination support device that creates a first examination protocol to be applied to a medical image diagnostic examination performed based on the examination order, based on the subject information and the examination information.

2. The one or more processors: Obtaining a second examination protocol associated with the examination order; The examination support device according to claim 1 , further comprising: a step of: generating the first examination protocol by modifying the second examination protocol based on the subject information and the examination information.

3. The one or more processors: The examination support device according to claim 2 , further comprising a display device that displays a comparison result between the first examination protocol and the second examination protocol.

4. The one or more processors: The examination support device according to claim 2 , wherein when creating the first examination protocol, at least one of replacing a sequence in the second examination protocol, changing an order of a sequence, adding a sequence, and deleting a sequence is performed.

5. The one or more processors: Obtaining past examination information regarding past medical imaging diagnostic examinations previously performed on the subject; The examination support device according to claim 1 , wherein the first examination protocol is created based on the subject information, the examination information, and the past examination information.

6. The one or more processors: The examination support device according to claim 1 , further comprising a display device that displays an authentication screen for an operator to input whether or not to approve the first examination protocol.

7. The one or more processors: The examination support device according to claim 1 , further comprising: a processor configured to receive a correction to the first examination protocol that has been created.

8. The one or more processors: The examination support device according to claim 7 , further comprising: a correction history of the first examination protocol.

9. A method for operating an examination support device, comprising: Obtaining test orders for subjects of medical imaging diagnostic examinations; obtaining subject information regarding said subject; Obtaining examination information regarding a medical imaging diagnostic examination performed on the subject; A method for operating an examination support device, which creates a first examination protocol to be applied to a medical image diagnostic examination performed based on the examination order, based on the subject information and the examination information.

10. On the computer, A function to obtain examination orders for subjects of medical imaging diagnostic examinations; obtaining subject information relating to said subject; A function of acquiring examination information regarding a medical imaging diagnostic examination performed on the subject; A program that realizes a function of creating a first examination protocol to be applied to a medical image diagnostic examination performed based on the examination order, based on the subject information and the examination information.

11. A medical imaging apparatus including an examination support device that supports imaging of medical images, The inspection support device includes: one or more processors; one or more memories in which a program including one or more instructions executed by the one or more processors is stored; Equipped with The one or more processors execute the programs stored in the one or more memories, Obtaining test orders for subjects of medical imaging diagnostic examinations; obtaining subject information regarding said subject; Obtaining examination information regarding a medical imaging diagnostic examination performed on the subject; A medical imaging apparatus that creates a first examination protocol to be applied to a medical image diagnostic examination performed based on the examination order, based on the subject information and the examination information.

Citation Information

Patent Citations

  • Imaging support device

    JP2020187542A