Strain gauge

By integrating a functional layer to promote α-Cr crystal growth and using a layered electrode structure with improved solder wettability, the strain gauge addresses the issue of poor solderability in Cr or Ni-containing resistor strain gauges, enhancing reliability and durability.

JP2025081736AActive Publication Date: 2025-05-27MINEBEAMITSUMI INC

Patent Information

Application Number
JP2025033045
Authority / Receiving Office
JP · JP
Patent Type
Applications
Current Assignee / Owner
Priority Date
2017-09-29
Filing Date
2025-03-03
Publication Date
2025-05-27
Estimated Expiration
2038-03-20

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Abstract

To improve the solderability of an electrode, in a strain gauge using as a resistor a material containing Cr (chromium) or Ni (nickel).SOLUTION: A strain gauge includes: a flexible base material made of resin; a functional layer formed directly on one surface of the base material and made of a metal, an alloy, or a metal compound; a resistor containing α-Cr as a main component, formed directly on one surface of the functional layer and made of a film containing Cr, CrN, and Cr2 N; and an electrode electrically connected to the resistor. The functional layer has a function of promoting crystal growth of the α-Cr to form a film containing the α-Cr as a main component. The resistor has a thickness of 0.05 μm or more and 2 μm or less, and the functional layer has a thickness of 1 nm or more and 100 nm or less. The electrode includes: a terminal portion extending from an end part of the resistor; a first metal layer formed on the terminal portion and made of copper, a copper alloy, nickel, or a nickel alloy; and a second metal layer formed on the first metal layer and made of a material more excellent in solder wettability than the first metal layer.SELECTED DRAWING: Figure 2
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Citation Information

Patent Citations

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