Scattering directivity measuring facility, scattering directivity measuring system, and scattering directivity measuring method

Abstract

To provide a scattering directivity measuring facility, a scattering directivity measuring system, and a scattering directivity measuring method with which it is possible to measure scattering directivity with good accuracy.SOLUTION: A scattering directivity measuring facility according to the present disclosure comprises: a base; a turntable provided in a Z direction of the base; a support unit provided in the Z direction of the turntable and formed substantially in the shape of the letter U extending from a first edge to a second edge in a Y direction perpendicular to the Z direction, extending from the second edge to a third edge in the Z direction, and extending from the third edge to a fourth edge in a direction opposite the Y direction, as seen from an X direction perpendicular to the Z direction and Y direction; and a wire extending from the first edge in the X direction and connecting to the fourth edge. The support unit and the wire are composed of nonconductors. The turntable and the support unit rotate in the clockwise direction or the counterclockwise direction as seen from the Z direction around the axis of rotation heading from the center point of the turntable toward the Z direction and penetrating the first edge and the fourth edge.SELECTED DRAWING: Figure 1

Description

[Technical Field]

[0001] The present disclosure relates to a scattering directivity measurement facility, a scattering directivity measurement system, and a scattering directivity measurement method, and in particular to a scattering directivity measurement facility, a scattering directivity measurement system, and a scattering directivity measurement method that are capable of measuring scattering directivity with high accuracy. [Background technology]

[0002] In recent years, demand for mobile communications has increased, leading to the installation of numerous mobile base stations for mobile communications. However, in urban areas, radio waves from mobile base stations cannot reach areas such as between buildings, resulting in scattered radio wave dead zones. Placing mobile base stations in these radio wave dead zones is inefficient. For this reason, methods have been studied to reduce radio wave dead zones by placing reflectors or other devices on the rooftops of buildings that cause radio wave dead zones, and reflecting radio waves from these reflectors to emit them into the radio wave dead zones. In these studies, a technique for measuring the degree of radio wave reflection in each direction of these reflectors, i.e., scattering directivity, is important.

[0003] Scattering directivity is measured by measuring the direction and strength of radio wave reflection from a reflecting object (object under test), but it is difficult to measure accurately. The scattering directivity of an object under test is measured by emitting radio waves to the object under test and measuring the radio wave reflected from the object under test. To measure the reflected waves, the object under test must be fixed to a support or stand and rotated for measurement. In this case, reflected waves are also generated from the support or stand on which the object under test is fixed, making it difficult to detect the reflected waves from only the object under test.

[0004] In measuring the scattering directivity of an object to be measured, radio waves are emitted to the object to be measured, and indicators that indicate the intensity of the radio waves reflected only in the direction of emission include radar cross section, scattering cross section, radar cross section (RCS), etc. This disclosure describes how to accurately measure scattering directivity in measuring RCS.

[0005] Patent Document 1 discloses "a test device including a radio wave generator that generates radio waves, a radome support device to which a radome covering an antenna that receives radio waves is attached and which supports the radome so that the angle of the radome relative to the radio waves can be changed, an antenna support device to which an antenna is attached and which supports the antenna so that the scanning angle of the antenna can be changed separately from the radome, a control and analysis device that acquires the radio waves received by the antenna as a signal, and a compact range that reflects the radio waves from the radio wave generator and converts the radio waves, which are spherical waves, into plane waves and guides the plane waves to the antenna." Patent Document 1 does not disclose scattering directivity measurement equipment, a scattering directivity measurement system, or a scattering directivity measurement method that can accurately measure scattering directivity.

[0006] Patent Document 2 describes that "a directional antenna and a transmitting antenna are installed inside a radio wave reverberation chamber, the directional antenna is placed on a turntable and placed in a test area, a network analyzer is connected to the directional antenna and the transmitting antenna, the orientation of the directional antenna is set in a plurality of directions, the network analyzer measures the antenna efficiency for each frequency for each orientation of the directional antenna, the difference in antenna efficiency that occurs depending on the orientation of the directional antenna is found for each frequency, and whether isotropy is satisfied is determined depending on whether the difference in antenna efficiency is within a predetermined range based on the standard deviation of the antenna efficiency." Patent Document 2 does not disclose scattering directivity measurement equipment, scattering directivity measurement system, or scattering directivity measurement method that can measure scattering directivity with high accuracy. [Prior art documents] [Patent documents]

[0007] [Patent Document 1] Japanese Patent Application Laid-Open No. 2011-122892 [Patent Document 2] Japanese Patent Application Publication No. 2014-228338 Summary of the Invention [Problem to be solved by the invention]

[0008] As described above, it is difficult to realize scattering directivity measurement equipment, scattering directivity measurement systems, and scattering directivity measurement methods that can measure scattering directivity with high accuracy using the techniques described in Patent Documents 1 and 2, and there has been a demand for such scattering directivity measurement equipment, etc.

[0009] An object of the present disclosure is to provide a scattering directivity measurement facility, a scattering directivity measurement system, and a scattering directivity measurement method for solving the above-mentioned problems. [Means for solving the problem]

[0010] The scattering directivity measurement equipment according to the present disclosure includes: The base and A rotating plate provided in the Z direction of the base; a support portion provided in the Z direction of the rotary plate, the support portion extending from a first end to a second end in a Y direction perpendicular to the Z direction, extending from the second end to a third end in the Z direction, and extending from the third end to a fourth end in a direction opposite to the Y direction, the support portion having a substantially U-shape when viewed from an X direction perpendicular to the Z direction and the Y direction; a wire extending from the first end in the Z direction and connecting to the fourth end; Equipped with the support portion and the wire are made of non-conductors, Triggered by a measurement start command, the rotating plate and the support part rotate clockwise or counterclockwise as viewed from the Z direction, with the rotation axis extending from the center point of the rotating plate in the Z direction and passing through the first end and the fourth end as the central axis.

[0011] The scattering directivity measurement equipment according to the present disclosure includes: The base and A rotating plate provided in the Z direction of the base; a support portion provided in the Z direction of the rotary plate, the support portion extending from a first end to a second end in a Y direction perpendicular to the Z direction, extending from the second end to a third end in the Z direction, and extending from the third end to a fourth end in a direction opposite to the Y direction, the support portion having a substantially U-shape when viewed from an X direction perpendicular to the Z direction and the Y direction; a first auxiliary support portion provided in the Z direction of the first end portion; a second auxiliary support portion provided in a direction opposite to the Z direction of the fourth end portion; a wire extending from the first auxiliary support portion in the Z direction and connecting to the second auxiliary support portion; Equipped with the support portion, the first auxiliary support portion, the second auxiliary support portion, and the wire are made of non-conductors, When a measurement start command is received as a trigger, the rotating plate and the support part rotate clockwise or counterclockwise as viewed from the Z direction, with the rotation axis extending from the center point of the rotating plate in the Z direction and passing through the first end and the fourth end as a central axis; The first auxiliary support portion and the second auxiliary support portion rotate in conjunction with each other, rotating clockwise or counterclockwise when viewed from the Z direction, with the rotation axis as the central axis.

[0012] The scattering directivity measurement equipment according to the present disclosure includes: a support portion that extends from a first end to a second end in a Y direction, extends from the second end to a third end in a Z direction perpendicular to the Y direction, and extends from the third end to a fourth end in a direction opposite to the Y direction, and has a substantially U-shape when viewed from an X direction perpendicular to the Z direction and the Y direction; a wire disposed between the first end and the fourth end; a first auxiliary support portion provided between the wire and the first end portion; a second auxiliary support portion provided between the wire and the fourth end portion; Equipped with the support portion, the wire, the first auxiliary support portion, and the second auxiliary support portion are made of non-conductors; Triggered by a measurement start command, the first auxiliary support part, the second auxiliary support part, and the wire rotate right or left as viewed from the Z direction, with a rotation axis that passes through the first end part, the first auxiliary support part, the second auxiliary support part, and the fourth end part in the Z direction as the central axis.

[0013] The scattering directivity measurement system according to the present disclosure comprises: A transmitting antenna, a scattering directivity measuring device, a receiving antenna, and a network analyzer are provided, the transmitting antenna has a transmission beam half width equal to or less than a predetermined transmission beam half width, the receiving antenna has a receiving beam half width equal to or less than a predetermined receiving beam half width, the network analyzer has a time domain measurement function; The scattering directivity measurement equipment is The base and A rotating plate provided in the Z direction of the base; a support portion provided in the Z direction of the rotary plate, the support portion extending from a first end to a second end in a Y direction perpendicular to the Z direction, extending from the second end to a third end in the Z direction, and extending from the third end to a fourth end in a direction opposite to the Y direction, the support portion having a substantially U-shape when viewed from an X direction perpendicular to the Z direction and the Y direction; a wire extending from the first end in the Z direction and connecting to the fourth end, the support portion and the wire are made of non-conductors, After the object to be measured is provided so as to be fixed to the wire, a measurement start command is triggered, and the rotating plate and the support part rotate clockwise or counterclockwise as viewed from the Z direction around the rotation axis extending from the center point of the rotating plate in the Z direction and passing through the first end and the fourth end, to a predetermined angle and then stop; the transmitting antenna radiates high-frequency power to the device under test; the receiving antenna receives the received high-frequency power reflected from the object under test, The network analyzer measures the reception level of the received high frequency power at the reception time by using the time domain measurement function.

[0014] The scattering directivity measurement system according to the present disclosure comprises: A transmitting antenna, a scattering directivity measuring device, a receiving antenna, and a network analyzer are provided, the transmitting antenna has a transmission beam half width equal to or less than a predetermined transmission beam half width, the receiving antenna has a receiving beam half width equal to or less than a predetermined receiving beam half width, the network analyzer has a time domain measurement function; The scattering directivity measurement equipment is The base and A rotating plate provided in the Z direction of the base; a support portion provided in the Z direction of the rotary plate, the support portion extending from a first end to a second end in a Y direction perpendicular to the Z direction, extending from the second end to a third end in the Z direction, and extending from the third end to a fourth end in a direction opposite to the Y direction, the support portion having a substantially U-shape when viewed from an X direction perpendicular to the Z direction and the Y direction; a first auxiliary support portion provided in the Z direction of the first end portion; a second auxiliary support portion provided in a direction opposite to the Z direction of the fourth end portion; a wire extending from the first auxiliary support portion in the Z direction and connecting to the second auxiliary support portion, the support portion, the first auxiliary support portion, the second auxiliary support portion, and the wire are made of non-conductors, After the object to be measured is provided so as to be fixed to the wire, a measurement start command is triggered, and the rotating plate and the support part rotate clockwise or counterclockwise as viewed from the Z direction around the rotation axis extending from the center point of the rotating plate in the Z direction and passing through the first end and the fourth end, to a predetermined angle and then stop; the first auxiliary support portion and the second auxiliary support portion rotate in conjunction with each other to the right or left as viewed from the Z direction, with the rotation axis as a central axis; the transmitting antenna radiates high-frequency power to the device under test; the receiving antenna receives the received high-frequency power reflected from the object under test, The network analyzer measures the reception level of the received high frequency power at the reception time by using the time domain measurement function.

[0015] The scattering directivity measurement system according to the present disclosure comprises: A transmitting antenna, a scattering directivity measuring device, a receiving antenna, and a network analyzer are provided, the transmitting antenna has a transmission beam half width equal to or less than a predetermined transmission beam half width, the receiving antenna has a receiving beam half width equal to or less than a predetermined receiving beam half width, the network analyzer has a time domain measurement function; The scattering directivity measurement equipment is a support portion that extends from a first end to a second end in a Y direction, extends from the second end to a third end in a Z direction perpendicular to the Y direction, and extends from the third end to a fourth end in a direction opposite to the Y direction, and has a substantially U-shape when viewed from an X direction perpendicular to the Z direction and the Y direction; a wire disposed between the first end and the fourth end; a first auxiliary support portion provided between the wire and the first end portion; a second auxiliary support portion provided between the wire and the fourth end portion; a motor for rotating the first auxiliary support, the second auxiliary support, and the wire; Equipped with the support portion, the wire, the first auxiliary support portion, and the second auxiliary support portion are made of non-conductors; When a measurement start command is received as a trigger, the first auxiliary support part, the second auxiliary support part, and the wire rotate clockwise or counterclockwise as viewed from the Z direction, with a rotation axis passing through the first end part, the first auxiliary support part, the second auxiliary support part, and the fourth end part in the Z direction as a central axis; When the motor is operated and the object to be measured fixed to the wire rotates, the support part does not rotate, the transmitting antenna radiates high-frequency power to the device under test; the receiving antenna receives the received high-frequency power reflected from the object under test, The network analyzer measures the reception level of the received high frequency power at the reception time by using the time domain measurement function. [Effects of the Invention]

[0016] According to the present disclosure, it is possible to provide a scattering directivity measurement facility, a scattering directivity measurement system, and a scattering directivity measurement method that are capable of measuring scattering directivity with high accuracy. [Brief explanation of the drawings]

[0017] [Figure 1] 1 is a perspective view illustrating a scattering directivity measurement setup according to the present disclosure. [Figure 2] FIG. 1 is a perspective view illustrating a scattering directivity measurement system according to the present disclosure. [Figure 3] 1 is a schematic diagram illustrating a measurement method using a scattering directivity measurement system according to the present disclosure. [Figure 4] 1 is a schematic diagram illustrating a measurement method using a scattering directivity measurement system according to the present disclosure. [Figure 5] 1 is a schematic diagram illustrating a measurement method using a scattering directivity measurement system according to the present disclosure. [Figure 6] 1 is a perspective view illustrating a scattering directivity measurement setup according to the present disclosure. [Figure 7] FIG. 1 is a perspective view illustrating a scattering directivity measurement system according to the present disclosure. [Figure 8] 1 is a schematic diagram illustrating a measurement method using a scattering directivity measurement system according to the present disclosure. [Figure 9] 1 is a schematic diagram illustrating a measurement method using a scattering directivity measurement system according to the present disclosure. [Figure 10]1 is a schematic diagram illustrating a measurement method using a scattering directivity measurement system according to the present disclosure. [Figure 11] 10 is a table illustrating simulation results of scattering directivity according to the present disclosure. [Figure 12] 1 is a graph illustrating an example of an image of the propagation time of a reflected wave according to the present disclosure. [Figure 13] 1 is a perspective view illustrating a scattering directivity measurement setup according to the present disclosure. [Figure 14] FIG. 10 is a block diagram illustrating a control unit of a scattering directivity measurement system according to the present disclosure. [Figure 15] FIG. 1 is a perspective view illustrating a scattering directivity measurement system according to the present disclosure. [Figure 16] 1 is a perspective view illustrating a scattering directivity measurement setup according to the present disclosure. DETAILED DESCRIPTION OF THE INVENTION

[0018] Hereinafter, embodiments of the present disclosure will be described with reference to the drawings. In each drawing, the same or corresponding elements are denoted by the same reference numerals, and for clarity of explanation, duplicate explanations will be omitted as necessary.

[0019] [Embodiment 1] <Measurement equipment> FIG. 1 is a perspective view illustrating a scattering directivity measurement setup according to the present disclosure. In FIG. 1, the upward direction is the Z direction, and the direction perpendicular to the Z direction is the Y direction. The direction perpendicular to the Z and Y directions is the X direction. The X direction is sometimes referred to as the first direction, the Y direction as the second direction, and the Z direction as the third direction. XYZ coordinates will be used as necessary in the following drawings.

[0020] As shown in FIG. 1, scattering directivity measurement equipment 11 according to the present disclosure includes base 111, rotating plate 112, support portion 113, and wire 114.

[0021] The rotating plate 112 is provided in the Z direction of the base 111. The rotating plate 112 has, for example, a disk shape.

[0022] The support portion 113 is provided in the Z direction of the rotating plate 112. The support portion 113 has a first horizontal support portion 113a, a vertical support portion 113c, and a second horizontal support portion 113b. The first horizontal support portion 113a is provided in the Z direction of the rotating plate 112 and extends from a first end portion 1131 to a second end portion 1132 in the Y direction. The vertical support portion 113c extends from the second end portion 1132 in the Z direction to a third end portion 1133. The second horizontal support portion 113b extends from the third end portion 1133 to a fourth end portion 1134 in the direction opposite to the Y direction. The support portion 113 has a substantially U-shape when viewed from the X direction. Furthermore, the joint between the first horizontal support portion 113a and the vertical support portion 113c, and the joint between the second horizontal support portion 113b and the vertical support portion 113c do not need to be at a right angle, and the vertical support portion 113c may be bow-shaped, and the support portion 113 may be shaped like an inverted C when viewed from the X direction.

[0023] The wire 114 extends from the first end 1131 in the Z direction and is connected to the fourth end 1134 of the support part 113. The object under test 115 is fixed to the wire 114. In order to fix the object under test 115 to the wire 114 and rotate it in synchronization with the rotation of the support part 113, it is desirable that there are at least two or more wires 114. More wires 114 may be used to fix the object under test 115 more stably. The wire 114 is made of a non-conductor (material) so as not to reflect radio waves. Examples of non-conductor materials that can be used for the wire 114 include nylon and glass fiber. The wire 114 also needs to be strong enough to support the object under test 115, so it may be made of fishing line or other materials.

[0024] Like the wire 114, the support 113 is made of a non-conductor (material) so as not to reflect radio waves. Examples of non-conductor materials for the support 113 include engineering plastics such as fiber reinforced plastics (FRP), wood, etc. By making the support 113 and the wire 114 out of a non-conductor material, it is possible to minimize the reflection of radio waves from the support 113 and the wire 114. This allows for more accurate measurement of the reflection of radio waves from the object under test 115. If necessary, a radio wave absorber may be attached to the surface of the support 113, or radio wave absorbing paint may be applied. This reduces reflection from the support 113, allows more accurate measurement of the reflection of radio waves from the object under test 115, and improves measurement accuracy.

[0025] The rotating plate 112 and the support part 113 are triggered by a measurement start command to rotate clockwise or counterclockwise as viewed from the Z direction, with rotation axis 112p extending in the Z direction from center point 112c on the Z-direction top surface 112s1 of the rotating plate 112 as the central axis. Rotation axis 112p passes through first end 1131 and fourth end 1134. The measurement start command is triggered after the object to be measured 115 is placed on wire 114. Top surface 112s1 is the Z-direction surface of rotating plate 112, which has a disk-like shape, and is therefore circular. The center point of the circle is center point 112c.

[0026] When the object to be measured 115 is set so as to be fixed to the wire 114 and then the support part 113 is rotated, the support part 113 and the object to be measured 115 rotate in unison, and the angle of rotation of the support part 113 as viewed from the Z direction is the same as the angle of rotation of the object to be measured 115.

[0027] Base 111 and rotating plate 112 are collectively referred to as the rotating table. Scattering directivity measurement equipment 11 can also be described as comprising: a substantially U-shaped support section 113 made up of first horizontal support section 113a, vertical support section 113c, and second horizontal support section 113b; wire 114 stretched above and below the left end of support section 113; rotating plate 112 provided below support section 113; and base 111 provided below rotating plate 112.

[0028] <Measurement system> FIG. 2 is a perspective view illustrating a scattering directivity measurement system according to the present disclosure.

[0029] As shown in FIG. 2, a scattering directivity measurement system 10 according to the present disclosure includes a transmitting antenna 12t, a scattering directivity measurement facility 11, a receiving antenna 12r, and a network analyzer 13.

[0030] The transmitting antenna 12t has a transmitting beam half width equal to or less than a predetermined transmitting beam half width, and emits high frequency power (radio waves) to the device under test 115.

[0031] The receiving antenna 12r has a receiving beam half width equal to or smaller than a predetermined receiving beam half width. The receiving antenna 12r receives high frequency power reflected from the object under test 115. The received high frequency power is referred to as received high frequency power.

[0032] Network analyzer 13 has a time domain measurement function. Network analyzer 13 uses this time domain measurement function to measure the reception level of received high-frequency power at the reception time. Specifically, network analyzer 13 measures the reception level of received high-frequency power at the reception time when a predetermined angle between rotating plate 112 and support part 113 as viewed in the Z direction is changed.

[0033] The scattering directivity measuring equipment 11 has already been explained, so a description thereof will be omitted.

[0034] <Measurement method> FIG. 3 is a schematic diagram illustrating a measurement method using a scattering directivity measurement system according to the present disclosure. 3 is a schematic diagram of the support unit according to the present disclosure in an unrotated state, i.e., the support unit 113 is not rotated (rotated 0 degrees) when viewed from the Z direction. FIG. 3 is a schematic diagram of the scattering directivity measurement system of FIG. 2 as viewed from the Z direction.

[0035] As shown in FIGS. 2 and 3, the scattering directivity measurement method according to the present disclosure is a scattering directivity measurement method that uses a scattering directivity measurement system 10.

[0036] First, the transmitting antenna 12t, the receiving antenna 12r, and the scattering directivity measuring equipment 11 are arranged so that the direction of the directivity of the transmitting antenna 12t and the receiving antenna 12r faces the direction from the second end 1132 to the first end 1131 of the support part 113 (step S101). This arrangement state is called a direct facing state.

[0037] A transmitting antenna 12t is connected to one port of the network analyzer 13, a receiving antenna 12r is connected to the other port, and an object to be measured 115 is fixed to a wire 114 connected between a first end 1131 and a fourth end 1134 of an approximately U-shaped support portion 113 (step S102).

[0038] The beam directions of the transmitting antenna 12t and the receiving antenna 12r are directed in the direction in which the object under test 115 is fixed (step S103). Ideally, the transmitting antenna 12t and the receiving antenna 12r should be positioned in the same location, but since this is physically impossible, they are placed as close as possible within a range that does not interfere with measurement.

[0039] A radio wave (high frequency power) is emitted from the transmitting antenna 12t (step S104). The radio wave emitted from the transmitting antenna 12t becomes an incident wave 21w to the object 115 under test.

[0040] The receiving antenna 12r receives the reflected wave from the object under test 115, and measures the magnitude of the reflected wave (referred to as a first reception level) (step S105). A gating operation is performed on the first reception level to eliminate reflected waves after a predetermined time has elapsed (step S106). The receiving antenna 12r receives radio waves reflected in the direction in which the receiving antenna 12r (transmitting antenna 12t) is located, among the radio waves reflected in all directions from the object under test 115. By receiving the reflected wave with the receiving antenna 12r, the scattering cross section (or radar cross section) can be measured.

[0041] The measurement of the reception level (scattering cross section) performed in steps S105 and S106 is repeated while rotating the rotating plate 112 by a predetermined angle (step S107). Specifically, in step S107, steps S107-1 to S107-3 shown below are performed.

[0042] The support part 113 is set at a predetermined angle when viewed from the Z direction (step S107-1). The predetermined angle of the support part 113 when viewed from the Z direction is, for example, 0 degrees in Fig. 3, 30 degrees in Fig. 4, and 110 degrees in Fig. 5.

[0043] The reflected wave from the object under test 115 is received by the receiving antenna 12r, and the second reception level of the reflected wave is measured (step S107-2).

[0044] A gating operation is performed on the second reception level to eliminate reflected waves after a predetermined time has elapsed (step S107-3). Step S107 makes it possible to measure the degree of reflection from various angles of the object under test 115, i.e., scattering directivity. However, strictly speaking, an angle error occurs because the positions of the transmitting antenna 12t and the receiving antenna 12r do not completely match.

[0045] In scattering directivity measurement, the sharper the directivity of transmitting antenna 12t and receiving antenna 12r, the more accurate the measurement. In scattering directivity measurement, the lack of sharpness of the directivity of transmitting antenna 12t and receiving antenna 12r is the first cause of measurement error. As shown in FIG. 2, when the directivity 200 of transmitting antenna 12t is sharp, if the incident wave 201w on second horizontal support member 113b is sufficiently small, the reflected wave 202w from second horizontal support member 113b decreases, reducing its influence. When the incident wave 201w on second horizontal support member 113b decreases, the reflected wave 202w also decreases, becoming much smaller than the reflected wave 22w from the object under test 115, thereby reducing measurement errors. The same applies to first horizontal support member 113a. Therefore, increasing the height H of vertical support member 113c enables more accurate scattering directivity measurement. Furthermore, by using a non-conductive material (non-metal) for the materials of first horizontal support portion 113a and second horizontal support portion 113b, reflection from first horizontal support portion 113a and second horizontal support portion 113b can be further reduced.

[0046] Although it is desirable to have a narrow beam width for each of the transmitting antenna 12t and receiving antenna 12r used in the measurement, there are practical limitations. Therefore, as a standard for the beam width, it is desirable that the ratio of the strength of the radio waves from the transmitting antenna 12t and receiving antenna 12r in the direction toward the object under test 115 to the strength of the radio waves from the transmitting antenna 12t and receiving antenna 12r in the direction toward the first horizontal support part 113a or the second horizontal support part 113b be 10 dB or more (10 times or more).

[0047] The beam widths of the transmitting antenna 12t and the receiving antenna 12r are determined by the distance (measurement distance) from the transmitting antenna 12t and the receiving antenna 12r to the object under test 115 and the length (height H) of the vertical support member 113c in the Z direction. For example, as shown in FIG. 2, if the height H is 2 meters and the distance L1 from the transmitting antenna 12t and the receiving antenna 12r to the support member 113 is 3 meters, the angle α between the direction from the transmitting antenna 12t and the receiving antenna 12r to the object under test 115 and the direction from the transmitting antenna 12t and the receiving antenna 12r to the second horizontal support member 113b is 18.4 degrees. Therefore, it can be seen that the transmitting antenna 12t and the receiving antenna 12r should be antennas with a beam width of 36.8 degrees or less, which is twice the 18.4 degrees, at which the intensity ratio is −10 decibels (dB).

[0048] Furthermore, when the height H is 2 m and the distance L1 is 6 m, the angle α between the direction from the transmitting antenna 12t and the receiving antenna 12r to the object under test 115 and the direction from the transmitting antenna 12t and the receiving antenna 12r to the second horizontal support part 113b is 9.5 degrees. Therefore, it can be seen that the transmitting antenna 12t and the receiving antenna 12r should be antennas with a beam width of 19.0 degrees or less, which is twice the 9.5 degrees, at which the intensity ratio is -10 dB.

[0049] The second factor that can cause measurement errors in scattering directivity measurements is the presence of the vertical support 113c. The radio waves transmitted (radiated) from the transmitting antenna 12t become incident waves 23w on the vertical support 113c, are reflected by the vertical support 113c, and become reflected waves 24w from the vertical support 113c, which are then received by the receiving antenna 12r. The reflected waves 24w are a factor in measurement errors. However, the reflected waves 24w can be eliminated by using the time domain function of the network analyzer 13. The time domain function of the network analyzer 13 can divide the received radio waves by time (this process is called gating). The propagation distance of the incident waves 21w and the reflected waves 22w through the propagation path is shorter than the propagation distance of the incident waves 23w and the reflected waves 24w through the propagation path by the round-trip distance of length D, i.e., length 2D. When length D = 1 m, length 2D is 2 m. The propagation speed of radio waves is 299.792 x 10 6 [m / s], so the propagation time is 2 [m] ÷ (299.792 × 10 6 [m / s]) = approximately 6 [nsec.]. That is, using the time domain function of the network analyzer 13, after receiving the reflected wave 22w, the reflected wave 24w arriving approximately 6 [nsec.] later is eliminated by gating.

[0050] In this way, the time domain function gating operation is performed on the reception level, and the reflected wave after a predetermined time has elapsed since the first (initial) reflected wave is eliminated (step S106). This makes it possible to eliminate errors due to reflection from the vertical support portion 113c. Note that, in order to perform the gating operation, the longer the length D is, the more accurate the measurement can be.

[0051] Here, a specific example of step S107 will be described. FIG. 4 is a schematic diagram illustrating a measurement method using a scattering directivity measurement system according to the present disclosure. FIG. 4 is a schematic diagram of a support part according to the present disclosure rotated 30 degrees. FIG. 4 is a schematic diagram of the scattering directivity measurement system of FIG. 2 as viewed from the Z direction.

[0052] Consider the case where support 113 is rotated 30 degrees as viewed in the Z direction, as shown in Figure 4. In this case, if the directivities of transmitting antenna 12t and receiving antenna 12r are sufficiently sharp, the proportion of incident wave 31w on device under test 115 will be dominant, and almost no radiation will be emitted to first horizontal support 113a and second horizontal support 113b (see Figure 2). Therefore, the reflected waves from first horizontal support 113a and second horizontal support 113b will be very small, and measurement accuracy will not deteriorate. Furthermore, even if the directivities of transmitting antenna 12t and receiving antenna 12r are sufficiently sharp, incident wave 33w on vertical support 113c will be large, and will become reflected wave 34w from vertical support 113c and be received by receiving antenna 12r.

[0053] However, there is a large difference between the total propagation distance of the incident wave 31w to the DUT 115 and the reflected wave 32w from the DUT 115 and the total propagation distance of the incident wave 33w to the vertical support 113c and the reflected wave 34w from the vertical support 113c. Therefore, the reflected wave 34w from the vertical support 113c can be eliminated by gating the time domain function. If the distance between the first horizontal support 113a and the second horizontal support 113b is set to 1 m or more, the reflected wave 34w from the vertical support 113c can be eliminated from the vertical support 113c at rotation angles from 0 to 60 degrees.

[0054] FIG. 5 is a schematic diagram illustrating a measurement method using a scattering directivity measurement system according to the present disclosure. FIG. 5 is a schematic diagram of a support part according to the present disclosure rotated 110 degrees. FIG. 5 is a view of the scattering directivity measurement system of FIG. 2 as seen from the Z direction.

[0055] Consider the case where the support part 113 is rotated from 60[degrees] to 120[degrees] when viewed from the Z direction. Here, consider the case where it is rotated 110[degrees] as a representative value.

[0056] As shown in FIG. 5, when the support 113 is rotated 110 degrees from the Z direction, the difference between the total propagation distance of the incident wave 41w to the DUT 115 and the reflected wave 42w from the DUT 115 and the total propagation distance of the incident wave 43w to the vertical support 113c and the reflected wave 44w from the vertical support 113c becomes smaller (compared to the case shown in FIG. 4, for example). Therefore, it becomes difficult to eliminate the reflected wave 44w from the vertical support 113c by gating the time domain function. On the other hand, since the vertical support 113c is far from the line extending from the transmitting antenna 12t and the receiving antenna 12r to the DUT 115, the reflected wave 44w from the vertical support 113c becomes very small by making the directivities of the transmitting antenna 12t and the receiving antenna 12r sufficiently sharp. Therefore, the reflected wave 44w from the vertical support 113c is not degraded.

[0057] Next, consider the case where support 113 is rotated beyond 120 degrees as viewed from the Z direction (not shown). In this case, the difference between vertical support 113c and the lines extending from transmitting antenna 12t and receiving antenna 12r toward object under test 115 becomes smaller. This increases the reflection from vertical support 113c, making it difficult to eliminate reflections by gating the time domain function, and thus making accurate measurement difficult. Therefore, the measurement method using scattering directivity measurement equipment 11 can accurately measure scattering directivity when the angle of support 113 as viewed from the Z direction is approximately in the range of -90 degrees to +90 degrees, or approximately -120 degrees to +120 degrees.

[0058] As described above, according to the first embodiment, it is possible to provide a scattering directivity measurement facility, a scattering directivity measurement system, and a scattering directivity measurement method that are capable of measuring scattering directivity with high accuracy.

[0059] The range of angles for accurately measuring scattering directivity when viewing support unit 113 from the Z direction increases as the directivity of each of transmitting antenna 12t and receiving antenna 12r increases. The range of angles for accurately measuring scattering directivity when viewing support unit 113 from the Z direction increases as the length D and height H (see FIG. 2) of support unit 113 increase.

[0060] <Features> The characteristics of the measurement method using the scattering directivity measurement system 10 are as follows. (1) The transmitting antenna 12t and the receiving antenna 12r are positioned so as to face the object under test 115 directly. (2) A transmitting antenna 12t is connected to one port of the network analyzer 13, and a receiving antenna 12r is connected to the other port. (3) The object to be measured 115 is placed near the center of the wire 114 connected to the support part 113 . (4) The rotating plate 112 below the support portion 113 is rotated from the state shown in FIG. 3 to the state shown in FIG. 4 (rotated clockwise when viewed from the Z direction) to measure the scattering directivity, and then further rotated from the state shown in FIG. 4 to the state shown in FIG. 5 to measure the scattering directivity of the object 115 to be measured. (5) With this measurement method, the influence of reflection from the vertical support portion 113c cannot be ignored when the angle (rotation angle) of the support portion 113 as viewed from the Z direction exceeds approximately 120 degrees. Therefore, accurate measurement is possible when the rotation angle is in the range of approximately -90 degrees to +90 degrees, or -120 degrees to +120 degrees.

[0061] [Embodiment 2] <Measurement equipment> FIG. 6 is a perspective view illustrating a scattering directivity measurement setup according to the present disclosure. As shown in FIG. 6, scattering directivity measuring equipment 21 according to the present disclosure differs from scattering directivity measuring equipment 11 in that first auxiliary support portion 1171 and second auxiliary support portion 1172 are provided.

[0062] Scattering directivity measurement equipment 21 according to the present disclosure includes base 111, rotating plate 112, support part 113, first auxiliary support part 1171, second auxiliary support part 1172, and wire 114. The configurations of base 111, rotating plate 112, and support part 113 are the same as those of scattering directivity measurement equipment 11 according to the first embodiment, and therefore description thereof will be omitted.

[0063] The first auxiliary support part 1171 is provided in the Z direction of the first end part 1131, and the second auxiliary support part 1172 is provided in the opposite direction to the Z direction of the fourth end part 1134. The wire 114 extends from the first auxiliary support part 1171 in the Z direction and connects to the second auxiliary support part 1172. The support part 113, the first auxiliary support part 1171, the second auxiliary support part 1172, and the wire 114 are made of non-conductors. The first auxiliary support part 1171 and the second auxiliary support part 1172 rotate clockwise or counterclockwise when viewed from the Z direction, with the rotation axis 112p as the central axis. The first auxiliary support part 1171 and the second auxiliary support part 1172 rotate in unison.

[0064] As the first auxiliary support part 1171 and the second auxiliary support part 1172 rotate, the object under test 115 fixed to the wire 114 rotates in conjunction with them. They are rotatable. The first auxiliary support part 1171 and the second auxiliary support part 1172 are collectively referred to as the auxiliary support part 117.

[0065] The first auxiliary support part 1171 is composed of a freely rotatable support plate 117a, and a bolt 117b and a nut 117c for fixing the support plate 117a to the first end part 1131. The second auxiliary support part 1172 is composed of a freely rotatable support plate 117a, and a bolt 117b and a nut 117c for fixing the support plate 117a to the fourth end part 1134. The wire 114 is connected to the rotatable first auxiliary support part 1171 and the second auxiliary support part 1172.

[0066] Scattering directivity measurement equipment 21 includes rotatable first auxiliary support part 1171 and second auxiliary support part 1172. As a result, when object under test 115 is provided so as to be fixed to wire 114 and then support part 113 is rotated, support part 113 and object under test 115 can rotate independently. As a result, the angle of rotation of support part 113 as viewed from the Z direction and the angle of rotation of object under test 115 can be made the same or different.

[0067] The configuration (mechanism) by which first auxiliary support part 1171 and second auxiliary support part 1172 can rotate freely independently of support part 113 is not limited to the method using bolts and nuts. Other methods, such as a method using bearings, may also be used. Furthermore, wire 114 is made of a non-conductive material to minimize reflection of radio waves. Furthermore, at least two or more wires 114 may be used to firmly secure device under test 115 and prevent it from rotating in an odd direction.

[0068] <Measurement system> FIG. 7 is a perspective view illustrating a scattering directivity measurement system according to the present disclosure.

[0069] 7, scattering directivity measurement system 20 according to the present disclosure includes transmitting antenna 12t, scattering directivity measurement equipment 21, receiving antenna 12r, and network analyzer 13. Scattering directivity measurement system 20 differs from scattering directivity measurement system 10 according to the first embodiment in that scattering directivity measurement equipment 21 is used instead of scattering directivity measurement equipment 11. Since transmitting antenna 12t, scattering directivity measurement equipment 21, receiving antenna 12r, and network analyzer 13 have already been described, a description thereof will be omitted.

[0070] <Measurement method> 8 to 10 are schematic diagrams showing a measurement method using the scattering directivity measurement system shown in FIG. FIG. 8 is a schematic diagram illustrating a measurement method using a scattering directivity measurement system according to the present disclosure. FIG. 9 is a schematic diagram illustrating a measurement method using a scattering directivity measurement system according to the present disclosure. FIG. 10 is a schematic diagram illustrating a measurement method using a scattering directivity measurement system according to the present disclosure. 8 to 10 are schematic diagrams of the scattering directivity measurement system according to the present disclosure as viewed from the Z direction.

[0071] As shown in FIG. 8, the scattering directivity measurement system 20 of the second embodiment performs the same operations as those of the first embodiment, from arranging the network analyzer 13, transmitting antenna 12t, receiving antenna 12r, and scattering directivity measurement equipment 21 so that they are directly facing each other (step S101), to measuring the magnitude of the reflected wave (first reception level) (step S105), and performing a gating operation on the first reception level to eliminate the reflected wave after a predetermined time has elapsed (step S106).

[0072] After step S106, as shown in FIG. 9, steps S105 to S106 are repeatedly executed while rotating the rotating plate 112 in increments of a first predetermined angle θ1 (e.g., 5 degrees) as viewed from the Z direction (step S207). Specifically, the first predetermined angle is set to 0 degrees, radio waves are emitted from the transmitting antenna 12t, the reflected waves from the device under test 115 are received by the receiving antenna 12r, a first reception level of the reflected waves is measured, and a gating operation is performed to eliminate the reflected waves after a predetermined time has elapsed. Thereafter, the first predetermined angle is set to 5 degrees, radio waves are emitted from the transmitting antenna 12t, the reflected waves from the device under test 115 are received by the receiving antenna 12r, a first reception level of the reflected waves is measured, and a gating operation is performed to eliminate the reflected waves after a predetermined time has elapsed. Similarly, measurements are repeated until the first predetermined angle becomes 50 degrees.

[0073] 10, after step S207, the rotatable auxiliary support part 117 is rotated to a second predetermined angle θ2, for example, 45 degrees, when viewed from the Z direction, and then the rotating plate 112, which has been rotated to the first predetermined angle, is returned to its original position by the first predetermined angle (step S208). That is, with the second predetermined angle θ2 set to 45 degrees, the first predetermined angle θ1 is returned to its original position of 0 degrees.

[0074] Step S207 is performed with the rotating plate 112 returned by the first predetermined angle. That is, the rotating plate 112 is returned to its original position, and then the rotating plate 112 is rotated again in the rotational direction by the first predetermined angle θ1 to measure the scattering directivity and eliminate reflected waves after a predetermined time has elapsed by gating. Specifically, the first predetermined angle is set to 0 degrees, radio waves are emitted from the transmitting antenna 12t, the reflected waves from the object under test 115 are received by the receiving antenna 12r, a first reception level of the reflected waves is measured, and the reflected waves after a predetermined time have elapsed are eliminated by gating. Thereafter, with the second predetermined angle still set to 45 degrees, the first predetermined angle θ1 is set to 5 degrees, radio waves are emitted from the transmitting antenna 12t, the reflected waves from the object under test 115 are received by the receiving antenna 12r, a first reception level of the reflected waves is measured, and the reflected waves after a predetermined time have elapsed are eliminated by gating. Similarly, the first predetermined angle θ1 is increased in 5-degree steps, radio waves are emitted from the transmitting antenna 12t, the reflected waves from the device under test 115 are received by the receiving antenna 12r, the first reception level of the reflected waves is measured, and the reflected waves after a predetermined time has passed are eliminated by a gating operation. This measurement is repeated until the first predetermined angle θ1 reaches 50 degrees. After that, with the second predetermined angle still set at 90 degrees, the first reception level is measured and the reflected waves after a predetermined time has passed are eliminated by a gating operation.

[0075] In this way, steps S207 and S208 are repeated. Then, by performing steps S207 and S208 eight times, it becomes possible to measure angles from 0 to 50 degrees, 45 to 95 degrees, 90 to 140 degrees, 135 to 185 degrees, 180 to 230 degrees, 225 to 275 degrees, 270 to 320 degrees, and 315 to 365 degrees, i.e., 0 to 360 degrees.

[0076] Note that the measurement ranges overlap by 5 degrees in each measurement to confirm data stitching. This overlap angle does not have to be 5 degrees; it can be 1 degree or 5 degrees. Furthermore, the measurement range does not have to be 50 degrees; it can be 40 degrees or 30 degrees. However, if the measurement range is reduced, the number of times required to measure 360 ​​degrees increases. On the other hand, if the measurement range is increased beyond 50 degrees, the number of times required to measure 360 ​​degrees can be reduced. However, if the measurement range is increased, it becomes difficult to eliminate the reflection component of the vertical support portion 113c during the gating operation of the time domain function.

[0077] The reason why the scattering directivity can be measured with high accuracy by the measurement method according to the second embodiment will now be explained.

[0078] As shown in FIG. 8 , in measurements taken in a head-on position, the influence of reflected waves from first horizontal support member 113a and second horizontal support member 113b can be eliminated by sharpening the directivity of transmitting antenna 12t and receiving antenna 12r and by sufficiently increasing height H of support member 113. Furthermore, because the difference between the total propagation distance of incident wave 51w to device under test 115 and the propagation path of reflected wave 52w from device under test 115 is large, and the total propagation distance of incident wave 53w to vertical support member 113c and the propagation path of reflected wave 54w from vertical support member 113c is large, the reflected wave 54w can be eliminated by gating the time domain function of network analyzer 13. This eliminates the influence of reflected wave 54w from vertical support member 113c. Therefore, accurate measurements are possible in head-on positions.

[0079] <Simulation results> 9, even when the rotating plate 112 is rotated by 50 degrees, the reflected wave 64w from the vertical support part 113c can be eliminated by using the gating operation of the time domain function of the network analyzer 13. This will be explained using FIG.

[0080] 9, the distance between transmitting antenna 12t and receiving antenna 12r and object under test 115 (which may be support 113) is denoted by L1 [m], and the length corresponding to first horizontal support 113a and second horizontal support 113b is denoted by d [m]. Furthermore, the distance between vertical support 113c and transmitting antenna 12t and receiving antenna 12r when rotating plate 112 is rotated clockwise (right-handed) by θ1 [deg.] as viewed in the Z direction is denoted by distance L2 [m].

[0081] In this case, the length of the distance L2 is calculated using equation (1). L2=((L1+d*cosθ1) 2 +(d*sinθ1) 2 ) 1 / 2 (1)

[0082] FIG. 11 is a table illustrating simulation results of scattering directivity according to the present disclosure. FIG. 12 is a graph illustrating an image of the propagation time of a reflected wave according to the present disclosure. Figures 11 and 12 show the calculation results (simulation results) of the propagation time of radio waves when distance L1 = 30 [m] and distance d = 1 [m] (see Figure 9). Propagation time t1 indicates the time it takes for radio waves to travel round trip across distance L1. Propagation time t2 indicates the time it takes for radio waves to travel round trip across distance L2. The difference in the propagation time between distance L2 and distance L1 is indicated as t2 - t1. When θ1 = 0 [degrees], t2 - t1 is 6.67 [nsec.] (nanoseconds), and when θ1 = 50 [degrees], t2 - t1 is 4.35 [nsec.].

[0083] FIG. 12 is a schematic diagram showing a graph of the reception level received by the network analyzer 13 when θ1=50 degrees.

[0084] Reflected wave 64w from vertical support portion 113c is delayed by 4.35 [nsec] compared to reflected wave 62w from object under test 115. Therefore, for example, by applying gating at 200.14±2 [nsec], it is possible to extract only reflected wave 62w from object under test 115. This makes it possible to eliminate the influence of reflected wave 64w from vertical support portion 113c.

[0085] The performance of network analyzer 13 allows gating in approximately 1 nsec or less, and if distance d>1 m, the influence of reflected wave 64w from vertical support portion 113c can be eliminated up to approximately θ1<60 degrees. If distance d is increased further, the influence of reflected wave 64w from vertical support portion 113c can be further eliminated, thereby widening the range of measurable angle θ1.

[0086] As explained above, in the measurement method according to the twenty-second embodiment, if the distance d is greater than 1 [m], the influence of the reflected wave 64w from the vertical support portion 113c can be eliminated and the scattering directivity can be measured with high accuracy when θ1 is between approximately 50 [degrees] and 60 [degrees].

[0087] When the angle θ1 exceeds 50 degrees, as shown in FIG. 10 , the auxiliary support unit 117 is rotated 45 degrees, the angle θ1 of the rotating plate 112 is returned to 0 degrees, and then the rotating plate 112 is rotated again to perform the measurement. This procedure is the same as steps S206 and S207 described above. According to the measurement method of the second embodiment, the scattering directivity can be measured accurately when the angle θ1 is in the range of −50 degrees to +50 degrees. Furthermore, even when the angle θ1 is less than −50 degrees or exceeds +50 degrees, the angle θ1 of the rotating plate 112 can be changed to the range of −50 degrees to +50 degrees by rotating the auxiliary support unit 117. Therefore, by combining these results, the 360-degree scattering directivity of the object under test 115 can be measured accurately.

[0088] [Embodiment 3] <Measurement equipment> FIG. 13 is a perspective view illustrating a scattering directivity measurement setup according to the present disclosure. FIG. 14 is a block diagram illustrating a control unit of a scattering directivity measurement facility according to the present disclosure.

[0089] 13, scattering directivity measurement equipment 31 according to the third embodiment differs from scattering directivity measurement equipment 21 according to the second embodiment (see FIG. 6) in that it includes motor 118 for automatically rotating auxiliary support part 117. Scattering directivity measurement equipment 31 rotates auxiliary support part 117 with motor 118, thereby rotating object under test 115.

[0090] The scattering directivity measuring equipment 31 according to the present disclosure includes a support 113, a wire 114, a first auxiliary support 1171, and a second auxiliary support 1172.

[0091] The support portion 113 extends from a first end portion 1131 in the Y direction to a second end portion 1132, extends from the second end portion 1132 in the Z direction perpendicular to the Y direction to a third end portion 1133, and extends from the third end portion 1133 in the direction opposite to the Y direction to a fourth end portion 1134. The support portion 113 is substantially U-shaped when viewed from the X direction perpendicular to the Z and Y directions.

[0092] The wire 114 is disposed between the first end 1131 and the fourth end 1134 .

[0093] The first auxiliary support portion 1171 is provided between the wire 114 and the first end portion 1131. The second auxiliary support portion 1172 is provided between the wire 114 and the fourth end portion 1134.

[0094] The support portion 113, the wire 114, the first auxiliary support portion 1171, and the second auxiliary support portion 1172 are made of non-conductors.

[0095] The first auxiliary support part 1171, the second auxiliary support part 1172, and the wire 114 are triggered by a measurement start command to rotate right or left as viewed from the Z direction, with the rotation axis 112p, which passes through the first end part 1131, the first auxiliary support part 1171, the second auxiliary support part 1172, and the fourth end part 1134 in the Z direction, as the central axis.

[0096] Scattering directivity measurement equipment 31 includes first auxiliary support part 1171, second auxiliary support part 1172, and motor 118 for rotating wire 114. Motor 118 has first motor 1181 and second motor 1182. First motor 1181 is provided on a surface of first end part 1131 facing in the opposite direction to the Z direction. Second motor 1182 is provided on a surface of fourth end part 1134 facing in the Z direction. Operation of motor 118 causes first auxiliary support part 1171, second auxiliary support part 1172, and wire 114 to rotate. Operation of motor 118 causes rotation of object under test 115, which is fixed to wire 114, but does not cause rotation of support part 113.

[0097] The scattering directivity measurement equipment 31 further includes an angle detector 119 for detecting the rotation angle of the first auxiliary support part 1171 and the second auxiliary support part 1172 as viewed from the Z direction. The angle detector 119 has a first angle detector 1191 and a second angle detector 1192. The first angle detector 1191 is provided on a surface of the first motor 1181 facing in the opposite direction to the Z direction. The second angle detector 1192 is provided on a surface of the second motor 1182 facing in the Z direction.

[0098] Since the scattering directivity measurement equipment 31 needs to drive (rotate) the upper and lower motors (i.e., the second motor 1182 and the first motor 1181) in synchronization, a first angle detector 1191 is added to the first motor 1181, and a second angle detector 1192 is added to the second motor 1182. The first angle detector 1191 detects the angle of rotation caused by the first motor 1181, and the second angle detector 1192 detects the angle of rotation caused by the second motor 1182.

[0099] 14, scattering directivity measurement equipment 31 further includes control unit 116 including control device 116a and motor drive circuit 116b. Control device 116a reads the detected rotation angle and controls motor drive circuit 116b so that first motor 1181 and second motor 1182 operate in synchronization.

[0100] Even if the object under test 115 rotates due to the operation of motor 118, support part 113 does not rotate. This makes it possible to easily eliminate the reflected wave from support part 113 by performing a gating operation. As a result, even when using scattering directivity measurement equipment 31 according to the third embodiment, scattering directivity can be measured with high accuracy.

[0101] <Measurement system> FIG. 15 is a perspective view illustrating a scattering directivity measurement system according to the present disclosure.

[0102] 15, scattering directivity measurement system 30 according to the present disclosure includes transmitting antenna 12t, scattering directivity measurement equipment 31, receiving antenna 12r, and network analyzer 13. Scattering directivity measurement system 30 differs from scattering directivity measurement system 20 according to the second embodiment in that scattering directivity measurement equipment 31 is used instead of scattering directivity measurement equipment 21. Also, scattering directivity measurement system 30 differs in that motor 118 is used to rotate object under test 115. Since transmitting antenna 12t, scattering directivity measurement equipment 31, receiving antenna 12r, and network analyzer 13 have already been described, a description thereof will be omitted.

[0103] The transmitting antenna 12t emits high-frequency power to the device under test 115. The receiving antenna 12r receives the received high-frequency power reflected from the device under test 115. The network analyzer 13 uses a time domain measurement function to measure the reception level of the received high-frequency power at the time of reception.

[0104] <Measurement method> The scattering directivity measurement method according to the present disclosure is a method that uses scattering directivity measurement system 30, and differs from the method that uses scattering directivity measurement system 20 (see embodiment 2) in that it uses motor 118 to rotate object under test 115. Therefore, the scattering directivity measurement method according to the present disclosure measures the propagation time of the reflected wave while rotating rotating plate 112 from 0 degrees to 50 degrees, and then rotates auxiliary support part 117 by 45 degrees, and repeats this process.

[0105] The scattering directivity measuring method according to the present disclosure may include and execute the following steps.

[0106] First, the transmitting antenna 12t, the receiving antenna 12r and the scattering directivity measuring equipment 31 are positioned so that the direction of the directivity of the transmitting antenna 12t and the receiving antenna 12r is directly opposite to the direction from the second end 1132 to the first end 1131 of the support part 113 of the scattering directivity measuring equipment 31 (step S301).

[0107] A transmitting antenna 12t is connected to one port of the network analyzer 13, a receiving antenna 12r is connected to the other port, and a device under test 115 is fixed to the wire 114 (step S302).

[0108] The beam directions of the transmitting antenna 12t and the receiving antenna 12r are directed in the direction in which the object under test 115 is fixed (step S303).

[0109] The radio wave is emitted from the transmitting antenna 12t (step S304).

[0110] The reflected wave from the object under test 115 is received by the receiving antenna 12r, and the first reception level of the reflected wave is measured (step S305).

[0111] A gating operation is performed on the first reception level to eliminate reflected waves after a predetermined time has elapsed (step S306).

[0112] The motor 118 is operated to rotate the first auxiliary support part 1171, the second auxiliary support part 1172, and the wire 114 in step angles up to a second predetermined angle when viewed from the Z direction, and the steps from emitting radio waves (step S304) to performing the gating operation (step S306) are repeatedly executed (step S307).

[0113] In this way, scattering directivity is measured by rotating object under test 115 up to 360 degrees in steps of one angle. According to the measurement method of the third embodiment, the reflected wave from vertical support portion 113c is eliminated by gating, so that scattering directivity can be measured with high accuracy.

[0114] [Modification of the third embodiment] <Measurement equipment> FIG. 16 is a perspective view illustrating a scattering directivity measurement setup according to the present disclosure.

[0115] 13, scattering directivity measurement equipment 31a according to the modified example does not have base 111 and rotating plate 112, as compared to scattering directivity measurement equipment 31. Scattering directivity measurement equipment 31a can measure scattering directivity in steps S301 to S307 described above. In this case, scattering directivity measurement equipment 31a measures the scattering cross section by rotating auxiliary support part 117 with motor 118, so base 111 and rotating plate 112 are not necessary. This allows for a corresponding reduction in costs, etc.

[0116] That is, when scattering directivity is measured using scattering directivity measurement equipment 31a, measurement is performed by rotating auxiliary support part 117 360 degrees by motor 118. The measurement method is the same as the measurement method from step S301 to step S307.

[0117] If a rotation angle accuracy higher than a predetermined accuracy is not required, the angle detector 119 can be eliminated by adopting open-loop control such as a step motor as the motor 118. Furthermore, eliminating the need for the angle detector 119 allows the control device 116a and the motor drive circuit 116b to be significantly simplified. Furthermore, the control device 116a can be replaced by a personal computer (PC).

[0118] In the above embodiment, the present disclosure has been described as a hardware configuration, but the present disclosure is not limited to this. The present disclosure can also be realized by having a CPU (Central Processing Unit) execute a computer program to perform the processing of each component.

[0119] In the above embodiments, the program can be stored and supplied to a computer using various types of non-transitory computer-readable media. Non-transitory computer-readable media include various types of tangible storage media. Examples of non-transitory computer-readable media include magnetic recording media (specifically, flexible disks, magnetic tapes, and hard disk drives), magneto-optical recording media (specifically, magneto-optical disks), CD-ROMs (Read Only Memory), CD-Rs, CD-R / Ws, semiconductor memories (specifically, mask ROMs, PROMs (Programmable ROMs), and EPROMs (Erasable PROMs)), flash ROMs, and RAMs (Random Access Memory). The program may also be supplied to a computer by various types of transitory computer-readable media. Examples of transitory computer-readable media include electrical signals, optical signals, and electromagnetic waves. The transitory computer-readable media can supply the program to a computer via a wired communication path such as an electric wire or optical fiber, or via a wireless communication path.

[0120] Additionally, although operations are depicted in a particular order, this should not be understood as requiring such operations to be performed in the particular order or sequential order depicted, or that all of the depicted operations be performed, to achieve desirable results. In certain situations, multitasking and parallel processing may be advantageous. Similarly, although details of several specific embodiments are included in the above discussion, these should not be construed as limitations on the scope of the disclosure, but rather as descriptions of features specific to particular embodiments. Certain features that are described in the context of separate embodiments may also be implemented in combination in a single embodiment. Conversely, various features that are described in the context of a single embodiment may also be implemented in multiple embodiments separately or in any suitable combination.

[0121] Although the present disclosure has been described above with reference to the embodiments, the present disclosure is not limited to the above. Various modifications that can be understood by a person skilled in the art can be made to the configuration and details of the present disclosure within the scope of the disclosure.

[0122] Furthermore, the present disclosure is not limited to the above-described embodiments, and can be modified as appropriate within the scope of the present disclosure.

[0123] A part or all of the above-described embodiments can be described as, but not limited to, the following supplementary notes. (Appendix 1) The base and A rotating plate provided in the Z direction of the base; a support portion provided in the Z direction of the rotary plate, the support portion extending from a first end to a second end in a Y direction perpendicular to the Z direction, extending from the second end to a third end in the Z direction, and extending from the third end to a fourth end in a direction opposite to the Y direction, the support portion having a substantially U-shape when viewed from an X direction perpendicular to the Z direction and the Y direction; a wire extending from the first end in the Z direction and connecting to the fourth end; Equipped with the support portion and the wire are made of non-conductors, When a measurement start command is received as a trigger, the rotating plate and the support part rotate clockwise or counterclockwise as viewed from the Z direction, with the rotation axis extending from the center point of the rotating plate in the Z direction and passing through the first end and the fourth end as a central axis. Scattered directivity measurement equipment. (Appendix 2) When the support part is rotated after the object to be measured is provided so as to be fixed to the wire, the support part and the object to be measured rotate in conjunction with each other, and the angle of rotation of the support part as viewed from the Z direction is the same as the angle of rotation of the object to be measured. Scattering directivity measurement equipment as described in Appendix 1. (Appendix 3) The base and A rotating plate provided in the Z direction of the base; a support portion provided in the Z direction of the rotary plate, the support portion extending from a first end to a second end in a Y direction perpendicular to the Z direction, extending from the second end to a third end in the Z direction, and extending from the third end to a fourth end in a direction opposite to the Y direction, the support portion having a substantially U-shape when viewed from an X direction perpendicular to the Z direction and the Y direction; a first auxiliary support portion provided in the Z direction of the first end portion; a second auxiliary support portion provided in a direction opposite to the Z direction of the fourth end portion; a wire extending from the first auxiliary support portion in the Z direction and connecting to the second auxiliary support portion; Equipped with the support portion, the first auxiliary support portion, the second auxiliary support portion, and the wire are made of non-conductors, When a measurement start command is received as a trigger, the rotating plate and the support part rotate clockwise or counterclockwise as viewed from the Z direction, with the rotation axis extending from the center point of the rotating plate in the Z direction and passing through the first end and the fourth end as a central axis; The first auxiliary support portion and the second auxiliary support portion rotate in conjunction with each other to rotate clockwise or counterclockwise around the rotation axis as viewed from the Z direction. Scattered directivity measurement equipment. (Appendix 4) When the support part is rotated after the object to be measured is provided so as to be fixed to the wire, the support part and the object to be measured rotate independently, and the angle of rotation of the support part as viewed from the Z direction and the angle of rotation of the object to be measured are the same or different. Scattering directivity measurement equipment as described in Appendix 3. (Appendix 5) a support portion that extends from a first end to a second end in a Y direction, extends from the second end to a third end in a Z direction perpendicular to the Y direction, and extends from the third end to a fourth end in a direction opposite to the Y direction, and has a substantially U-shape when viewed from an X direction perpendicular to the Z direction and the Y direction; a wire disposed between the first end and the fourth end; a first auxiliary support portion provided between the wire and the first end portion; a second auxiliary support portion provided between the wire and the fourth end portion; Equipped with the support portion, the wire, the first auxiliary support portion, and the second auxiliary support portion are made of non-conductors; When a measurement start command is received as a trigger, the first auxiliary support part, the second auxiliary support part, and the wire rotate clockwise or counterclockwise as viewed from the Z direction, with a rotation axis passing through the first end part, the first auxiliary support part, the second auxiliary support part, and the fourth end part in the Z direction as a central axis. Scattered directivity measurement equipment. (Appendix 6) further comprising a motor for rotating the first auxiliary support, the second auxiliary support, and the wire; When the motor is operated to rotate the object to be measured that is fixed to the wire, the support part does not rotate. Scattering directivity measurement equipment as described in Appendix 5. (Appendix 7) A transmitting antenna, a scattering directivity measuring device, a receiving antenna, and a network analyzer are provided, the transmitting antenna has a transmission beam half width equal to or less than a predetermined transmission beam half width, the receiving antenna has a receiving beam half width equal to or less than a predetermined receiving beam half width, the network analyzer has a time domain measurement function; The scattering directivity measurement equipment is The base and A rotating plate provided in the Z direction of the base; a support portion provided in the Z direction of the rotary plate, the support portion extending from a first end to a second end in a Y direction perpendicular to the Z direction, extending from the second end to a third end in the Z direction, and extending from the third end to a fourth end in a direction opposite to the Y direction, the support portion having a substantially U-shape when viewed from an X direction perpendicular to the Z direction and the Y direction; a wire extending from the first end in the Z direction and connecting to the fourth end, the support portion and the wire are made of non-conductors, After the object to be measured is provided so as to be fixed to the wire, a measurement start command is triggered, and the rotating plate and the support part rotate clockwise or counterclockwise as viewed from the Z direction around the rotation axis extending from the center point of the rotating plate in the Z direction and passing through the first end and the fourth end, to a predetermined angle and then stop; the transmitting antenna radiates high-frequency power to the device under test; the receiving antenna receives the received high-frequency power reflected from the object under test, the network analyzer measures the reception level of the received high-frequency power at the reception time by utilizing the time domain measurement function; Scattering directionality measurement system. (Appendix 8) 8. A scattering directivity measurement method using the scattering directivity measurement system of claim 7, comprising: a step of positioning the transmitting antenna, the receiving antenna, and the scattering directivity measurement equipment so that the direction of the directivity of the transmitting antenna and the receiving antenna is directly opposite to the direction from the second end to the first end of the support part of the scattering directivity measurement equipment; connecting the transmitting antenna to one port of the network analyzer, connecting the receiving antenna to the other port, and fixing the device under test to the wire; orienting the beam directions of the transmitting antenna and the receiving antenna in a direction in which the device under test is fixed; emitting radio waves from the transmitting antenna; receiving a reflected wave from the object under test with the receiving antenna and measuring a first reception level of the reflected wave; performing a gating operation on the first reception level and eliminating reflected waves after a predetermined time has elapsed; setting the support portion at a predetermined angle when viewed from the Z direction; receiving the reflected wave from the object under test with the receiving antenna and measuring a second reception level of the reflected wave; performing the gating operation on the second reception level and eliminating reflected waves after the predetermined time has elapsed; A scattering directivity measurement method comprising: (Appendix 9) A transmitting antenna, a scattering directivity measuring device, a receiving antenna, and a network analyzer are provided, the transmitting antenna has a transmission beam half width equal to or less than a predetermined transmission beam half width, the receiving antenna has a receiving beam half width equal to or less than a predetermined receiving beam half width, the network analyzer has a time domain measurement function; The scattering directivity measurement equipment is The base and A rotating plate provided in the Z direction of the base; a support portion provided in the Z direction of the rotary plate, the support portion extending from a first end to a second end in a Y direction perpendicular to the Z direction, extending from the second end to a third end in the Z direction, and extending from the third end to a fourth end in a direction opposite to the Y direction, the support portion having a substantially U-shape when viewed from an X direction perpendicular to the Z direction and the Y direction; a first auxiliary support portion provided in the Z direction of the first end portion; a second auxiliary support portion provided in a direction opposite to the Z direction of the fourth end portion; a wire extending from the first auxiliary support portion in the Z direction and connecting to the second auxiliary support portion, the support portion, the first auxiliary support portion, the second auxiliary support portion, and the wire are made of non-conductors, After the object to be measured is provided so as to be fixed to the wire, a measurement start command is triggered, and the rotating plate and the support part rotate clockwise or counterclockwise as viewed from the Z direction around the rotation axis extending from the center point of the rotating plate in the Z direction and passing through the first end and the fourth end, to a predetermined angle and then stop; the first auxiliary support portion and the second auxiliary support portion rotate in conjunction with each other to the right or left as viewed from the Z direction, with the rotation axis as a central axis; the transmitting antenna radiates high-frequency power to the device under test; the receiving antenna receives the received high-frequency power reflected from the object under test, the network analyzer measures the reception level of the received high-frequency power at the reception time by utilizing the time domain measurement function; Scattering directionality measurement system. (Appendix 10) 10. A scattering directivity measurement method using the scattering directivity measurement system of claim 9, comprising: a step of positioning the transmitting antenna, the receiving antenna, and the scattering directivity measurement equipment so that the direction of the directivity of the transmitting antenna and the receiving antenna is directly opposite to the direction from the second end to the first end of the support part of the scattering directivity measurement equipment; connecting the transmitting antenna to one port of the network analyzer, connecting the receiving antenna to the other port, and fixing the device under test to the wire; orienting the beam directions of the transmitting antenna and the receiving antenna in a direction in which the device under test is fixed; emitting radio waves from the transmitting antenna; receiving a reflected wave from the object under test with the receiving antenna and measuring a first reception level of the reflected wave; performing a gating operation on the first reception level and eliminating reflected waves after a predetermined time has elapsed; a measuring step in which the steps from the step of emitting the radio wave to the step of performing the gating operation are repeatedly performed while rotating the rotary plate by step angles up to a first predetermined angle as viewed from the Z direction; a step of rotating the first auxiliary support part and the second auxiliary support part to a second predetermined angle when viewed from the Z direction, and then returning the rotating plate that has been rotated to the first predetermined angle to its original position by the first predetermined angle; performing the measuring step in a state where the rotary plate is returned by the first predetermined angle; A scattering directivity measurement method comprising: (Appendix 11) A transmitting antenna, a scattering directivity measuring device, a receiving antenna, and a network analyzer are provided, the transmitting antenna has a transmission beam half width equal to or less than a predetermined transmission beam half width, the receiving antenna has a receiving beam half width equal to or less than a predetermined receiving beam half width, the network analyzer has a time domain measurement function; The scattering directivity measurement equipment is a support portion that extends from a first end to a second end in a Y direction, extends from the second end to a third end in a Z direction perpendicular to the Y direction, and extends from the third end to a fourth end in a direction opposite to the Y direction, and has a substantially U-shape when viewed from an X direction perpendicular to the Z direction and the Y direction; a wire disposed between the first end and the fourth end; a first auxiliary support portion provided between the wire and the first end portion; a second auxiliary support portion provided between the wire and the fourth end portion; a motor for rotating the first auxiliary support, the second auxiliary support, and the wire; Equipped with the support portion, the wire, the first auxiliary support portion, and the second auxiliary support portion are made of non-conductors; When a measurement start command is received as a trigger, the first auxiliary support part, the second auxiliary support part, and the wire rotate clockwise or counterclockwise as viewed from the Z direction, with a rotation axis passing through the first end part, the first auxiliary support part, the second auxiliary support part, and the fourth end part in the Z direction as a central axis; When the motor is operated and the object to be measured fixed to the wire rotates, the support part does not rotate, the transmitting antenna radiates high-frequency power to the device under test; the receiving antenna receives the received high-frequency power reflected from the object under test, the network analyzer measures the reception level of the received high-frequency power at the reception time by utilizing the time domain measurement function; Scattering directionality measurement system. (Appendix 12) 12. A scattering directivity measurement method using the scattering directivity measurement system of claim 11, comprising: a step of positioning the transmitting antenna, the receiving antenna, and the scattering directivity measurement equipment so that the direction of the directivity of the transmitting antenna and the receiving antenna is directly opposite to the direction from the second end to the first end of the support part of the scattering directivity measurement equipment; connecting the transmitting antenna to one port of the network analyzer, connecting the receiving antenna to the other port, and fixing the device under test to the wire; orienting the beam directions of the transmitting antenna and the receiving antenna in a direction in which the device under test is fixed; emitting radio waves from the transmitting antenna; receiving a reflected wave from the object under test with the receiving antenna and measuring a first reception level of the reflected wave; performing a gating operation on the first reception level and eliminating reflected waves after a predetermined time has elapsed; a measuring step of repeatedly executing steps from the step of emitting the radio wave to the step of performing the gating operation while operating the motor to rotate the first auxiliary support part, the second auxiliary support part, and the wire by step angles up to a second predetermined angle viewed from the Z direction; A measurement method for a scattering directivity measurement device comprising: [Explanation of symbols]

[0124] 10...Scattering Directivity Measurement System 11, 21, 31...Scattering directivity measurement equipment 111...Foundation 112...Rotating plate 112s1…Top surface 112s2…bottom surface 112p...rotation axis 112c…center point 113...Support part 1131...First end 1132…Second end 1133...Third end 1134...Fourth end 113a...first horizontal support part 113b…Second horizontal support part 113c…Vertical support part 114...Wire 115…Object to be measured 116...Control unit 116a...Control equipment 116b...Motor drive circuit 117...Auxiliary support part 1171...1st auxiliary support part 1172…Second auxiliary support part 117a...Support plate 117b...Bolt 117c...Nut 118...Motor 1181...1st motor 1182...Second motor 119...Angle detector 1191...First angle detector 1192...Second angle detector 12t...Transmitting antenna 12r...receiving antenna 13...Network analyzer

Claims

1. The base and A rotating plate provided in the Z direction of the base; a support portion provided in the Z direction of the rotary plate, the support portion extending from a first end to a second end in a Y direction perpendicular to the Z direction, extending from the second end to a third end in the Z direction, and extending from the third end to a fourth end in a direction opposite to the Y direction, the support portion having a substantially U-shape when viewed from an X direction perpendicular to the Z direction and the Y direction; a wire extending from the first end in the Z direction and connecting to the fourth end; Equipped with the support portion and the wire are made of non-conductors, When a measurement start command is received as a trigger, the rotating plate and the support part rotate clockwise or counterclockwise as viewed from the Z direction, with the rotation axis extending from the center point of the rotating plate in the Z direction and passing through the first end and the fourth end as a central axis. Scattered directivity measurement equipment.

2. When the support part is rotated after the object to be measured is provided so as to be fixed to the wire, the support part and the object to be measured rotate in conjunction with each other, and the angle of rotation of the support part as viewed from the Z direction is the same as the angle of rotation of the object to be measured. Scattering directivity measurement equipment according to claim 1 .

3. The base and A rotating plate provided in the Z direction of the base; a support portion provided in the Z direction of the rotary plate, the support portion extending from a first end to a second end in a Y direction perpendicular to the Z direction, extending from the second end to a third end in the Z direction, and extending from the third end to a fourth end in a direction opposite to the Y direction, the support portion having a substantially U-shape when viewed from an X direction perpendicular to the Z direction and the Y direction; a first auxiliary support portion provided in the Z direction of the first end portion; a second auxiliary support portion provided in a direction opposite to the Z direction of the fourth end portion; a wire extending from the first auxiliary support portion in the Z direction and connected to the second auxiliary support portion; Equipped with the support portion, the first auxiliary support portion, the second auxiliary support portion, and the wire are made of non-conductors, When a measurement start command is received as a trigger, the rotating plate and the support unit rotate clockwise or counterclockwise as viewed from the Z direction, with the rotation axis extending from the center point of the rotating plate in the Z direction and passing through the first end and the fourth end as a central axis, The first auxiliary support portion and the second auxiliary support portion rotate in conjunction with each other to rotate clockwise or counterclockwise around the rotation axis as a central axis when viewed from the Z direction. Scattered directivity measurement equipment.

4. When the support part is rotated after the object to be measured is provided so as to be fixed to the wire, the support part and the object to be measured rotate independently, and the angle of rotation of the support part as viewed from the Z direction and the angle of rotation of the object to be measured are the same as or different from each other. Scattering directivity measurement equipment according to claim 3.

5. a support portion that extends from a first end to a second end in a Y direction, extends from the second end to a third end in a Z direction perpendicular to the Y direction, and extends from the third end to a fourth end in a direction opposite to the Y direction, and has a substantially U-shape when viewed from an X direction perpendicular to the Z direction and the Y direction; a wire disposed between the first end and the fourth end; a first auxiliary support portion provided between the wire and the first end portion; a second auxiliary support portion provided between the wire and the fourth end portion; Equipped with the support portion, the wire, the first auxiliary support portion, and the second auxiliary support portion are made of non-conductors; When a measurement start command is received as a trigger, the first auxiliary support part, the second auxiliary support part, and the wire rotate clockwise or counterclockwise as viewed from the Z direction, with a rotation axis passing through the first end part, the first auxiliary support part, the second auxiliary support part, and the fourth end part in the Z direction as a central axis. Scattered directivity measurement equipment.

6. further comprising a motor for rotating the first auxiliary support, the second auxiliary support, and the wire; When the motor is operated to rotate the object to be measured that is fixed to the wire, the support part does not rotate.

6. The scattering directivity measurement facility according to claim 5.

7. A transmitting antenna, a scattering directivity measuring device, a receiving antenna, and a network analyzer are provided, the transmitting antenna has a transmission beam half width equal to or less than a predetermined transmission beam half width, the receiving antenna has a receiving beam half width equal to or less than a predetermined receiving beam half width, the network analyzer has a time domain measurement function; The scattering directivity measurement equipment is The base and A rotating plate provided in the Z direction of the base; a support portion provided in the Z direction of the rotary plate, the support portion extending from a first end to a second end in a Y direction perpendicular to the Z direction, extending from the second end to a third end in the Z direction, and extending from the third end to a fourth end in a direction opposite to the Y direction, the support portion having a substantially U-shape when viewed from an X direction perpendicular to the Z direction and the Y direction; a wire extending from the first end in the Z direction and connecting to the fourth end, the support portion and the wire are made of non-conductors, After the object to be measured is provided so as to be fixed to the wire, a measurement start command is triggered, and the rotating plate and the support part rotate clockwise or counterclockwise as viewed from the Z direction around a rotation axis extending from a center point of the rotating plate in the Z direction and passing through the first end and the fourth end, to a predetermined angle and then stop; the transmitting antenna radiates high-frequency power to the device under test; the receiving antenna receives the received high-frequency power reflected from the object under test, the network analyzer measures the reception level of the received high-frequency power at the reception time by utilizing the time domain measurement function; Scattering directionality measurement system.

8. A scattering directivity measurement method using the scattering directivity measurement system of claim 7, comprising: a step of positioning the transmitting antenna, the receiving antenna, and the scattering directivity measurement equipment so that the direction of the directivity of the transmitting antenna and the receiving antenna is directly opposite to the direction from the second end to the first end of the support part of the scattering directivity measurement equipment; connecting the transmitting antenna to one port of the network analyzer, connecting the receiving antenna to the other port, and fixing the device under test to the wire; orienting the beam directions of the transmitting antenna and the receiving antenna in a direction in which the device under test is fixed; emitting radio waves from the transmitting antenna; receiving a reflected wave from the object under test with the receiving antenna and measuring a first reception level of the reflected wave; performing a gating operation on the first reception level and eliminating reflected waves after a predetermined time has elapsed; setting the support portion at a predetermined angle when viewed from the Z direction; receiving the reflected wave from the object under test with the receiving antenna and measuring a second reception level of the reflected wave; performing the gating operation on the second reception level and eliminating reflected waves after the predetermined time has elapsed; A scattering directivity measurement method comprising:

9. A transmitting antenna, a scattering directivity measuring device, a receiving antenna, and a network analyzer are provided, the transmitting antenna has a transmission beam half width equal to or less than a predetermined transmission beam half width, the receiving antenna has a receiving beam half width equal to or less than a predetermined receiving beam half width, the network analyzer has a time domain measurement function; The scattering directivity measurement equipment is The base and A rotating plate provided in the Z direction of the base; a support portion provided in the Z direction of the rotary plate, the support portion extending from a first end to a second end in a Y direction perpendicular to the Z direction, extending from the second end to a third end in the Z direction, and extending from the third end to a fourth end in a direction opposite to the Y direction, the support portion having a substantially U-shape when viewed from an X direction perpendicular to the Z direction and the Y direction; a first auxiliary support portion provided in the Z direction of the first end portion; a second auxiliary support portion provided in a direction opposite to the Z direction of the fourth end portion; a wire extending from the first auxiliary support portion in the Z direction and connected to the second auxiliary support portion, the support portion, the first auxiliary support portion, the second auxiliary support portion, and the wire are made of non-conductors, After the object to be measured is provided so as to be fixed to the wire, a measurement start command is triggered, and the rotating plate and the support part rotate clockwise or counterclockwise as viewed from the Z direction around a rotation axis extending from a center point of the rotating plate in the Z direction and passing through the first end and the fourth end, to a predetermined angle and then stop; the first auxiliary support portion and the second auxiliary support portion rotate in conjunction with each other to the right or left as viewed from the Z direction, with the rotation axis as a central axis, the transmitting antenna radiates high-frequency power to the device under test; the receiving antenna receives the received high-frequency power reflected from the object under test, the network analyzer measures the reception level of the received high-frequency power at the reception time by utilizing the time domain measurement function; Scattering directionality measurement system.

10. A scattering directivity measurement method using the scattering directivity measurement system of claim 9, comprising: a step of positioning the transmitting antenna, the receiving antenna, and the scattering directivity measurement equipment so that the direction of the directivity of the transmitting antenna and the receiving antenna is directly opposite to the direction from the second end to the first end of the support part of the scattering directivity measurement equipment; connecting the transmitting antenna to one port of the network analyzer, connecting the receiving antenna to the other port, and fixing the device under test to the wire; orienting the beam directions of the transmitting antenna and the receiving antenna in a direction in which the device under test is fixed; emitting radio waves from the transmitting antenna; receiving a reflected wave from the object under test with the receiving antenna and measuring a first reception level of the reflected wave; performing a gating operation on the first reception level and eliminating reflected waves after a predetermined time has elapsed; a measuring step of repeatedly performing steps from the step of emitting the radio wave to the step of performing the gating operation while rotating the rotary plate by step angles up to a first predetermined angle as viewed from the Z direction; rotating the first auxiliary support portion and the second auxiliary support portion to a second predetermined angle when viewed from the Z direction, and then returning the rotating plate that has been rotated to the first predetermined angle to its original position by the first predetermined angle; performing the measuring step in a state where the rotary plate is returned by the first predetermined angle; A scattering directivity measurement method comprising:

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