Adaptive count rate modulation for secondary ion mass analyzers.

JP2025526308APending Publication Date: 2025-08-13NOVA MEASURING INSTRUMENTS INC
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Patent Information

Application Number
JP2025502362
Authority / Receiving Office
JP · JP
Patent Type
Applications
Current Assignee / Owner
Priority Date
2022-07-17
Filing Date
2022-12-29
Publication Date
2025-08-13

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Abstract

An adaptive secondary ion mass spectrometry method, comprising: (a) adaptively setting detection parameters that affect the instantaneous count rate of a detector; (b) scanning an evaluation sample with a focused primary ion beam; (c) sensing secondary ions emitted by the scanning with the detector to provide a detection signal; and (d) analyzing the composition of the evaluation sample based on (i) the detection signal and (ii) a mapping between the values of the detection parameters and the instantaneous count rate of the detector.
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