Adaptive count rate modulation for secondary ion mass analyzers.
JP2025526308APending Publication Date: 2025-08-13NOVA MEASURING INSTRUMENTS INC
View PDF 0 Cites 0 Cited by
Patent Information
- Application Number
- JP2025502362
- Authority / Receiving Office
- JP · JP
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2022-07-17
- Filing Date
- 2022-12-29
- Publication Date
- 2025-08-13
Smart Images

Figure 2025526308000001_ABST
Abstract
An adaptive secondary ion mass spectrometry method, comprising: (a) adaptively setting detection parameters that affect the instantaneous count rate of a detector; (b) scanning an evaluation sample with a focused primary ion beam; (c) sensing secondary ions emitted by the scanning with the detector to provide a detection signal; and (d) analyzing the composition of the evaluation sample based on (i) the detection signal and (ii) a mapping between the values of the detection parameters and the instantaneous count rate of the detector.
Need to check novelty before this filing date? Find Prior Art