Antenna arrangement with ridged blind-mating waveguide flange and automatic test equipment - Patent Application 20070122997

Abstract

The present invention relates to an antenna apparatus for establishing wireless coupling to a device under test, comprising an antenna structure and a first blind-mating waveguide flange coupled to the antenna structure, wherein the first waveguide flange has a ridged waveguide structure including at least two ridges.

Description

[Technical Field]

[0001] SUMMARY OF THE INVENTION Embodiments of the present invention relate to antenna devices and automatic test equipment, particularly those comprising ridged structures.

[0002] DETAILED DESCRIPTION OF THE INVENTION Embodiments according to the present invention relate to blind-mating dual-ridge and quad-ridge waveguide interfaces for high volume production testing on millimeter-wave automatic test equipment. [Background technology]

[0003] BACKGROUND OF THE INVENTION Modern devices such as mobile phones are increasingly using higher frequencies. For example, 5G NR (New Radio) technology will use two frequency bands, with the "second" frequency range FR2 potentially employing a bandwidth of, for example, 24-53 GHz, which spans more than an octave. Summary of the Invention [Problem to be solved by the invention]

[0004] Standard commercially available waveguide geometries are limited in the frequency range they can support. In some cases, two different waveguide geometries must be used to cover the 24-53 GHz 5G frequency band, requiring two separate insertions during production testing, increasing testing costs. Coaxial connectors typically cannot withstand the number of insertions (e.g., more than 1 million mating cycles) required for most mass production.

[0005] Therefore, there is a need for an antenna arrangement that improves the trade-off between test efficiency and bandwidth. [Means for solving the problem]

[0006] (Summary of the Invention) One embodiment of the present invention is directed to an antenna apparatus for establishing a wireless coupling to a device under test, the antenna apparatus comprising an antenna structure (e.g., an antenna element (e.g., a measurement antenna)) and a first blind-mating waveguide flange coupled to the antenna structure, the first waveguide flange having a ridged waveguide structure including at least two ridges.

[0007] It is recognized that the first waveguide flange enables fast and robust docking with test equipment adapted to carry a device under test. The ridged structure enables increased bandwidth (e.g., 24 GHz to 53 GHz), allowing test equipment (devices under test, DUTs) operating at such wide bandwidths to be tested using only the claimed antenna arrangement (e.g., instead of using multiple antenna arrangements that collectively cover the bandwidth of the device under test). Because the waveguide flange is configured for blind mating, docking can be faster (compared to non-blind-mating connectors) and may optionally be automated. Additionally, the use of a blind-mating waveguide flange simplifies proper alignment of the first waveguide flange with a waveguide flange on a test fixture or with a waveguide flange attached to, for example, the test head or load board of the automated test equipment, reducing the risk of poor connection between the automated test equipment and the antenna arrangement. In conclusion, the first waveguide flange is configured for blind mating, thereby reducing the risk of misalignment and achieving good signal transmission (e.g., with low loss and / or low reflection) over a very wide frequency range. The first waveguide flange improves the compromise between mating reliability and bandwidth.

[0008] The antenna arrangement may form or be part of a blind-mate interconnect design based on dual-ridge and / or quad-ridge waveguide designs. Such blind-mate interconnects are useful, for example, in automated test equipment (ATE) applications where a test fixture containing a device under test (DUT) needs to be automatically undocked.

[0009] According to one embodiment, the face of the first waveguide flange has a choke structure. The choke structure can improve electromagnetic continuity between the first blind-mating waveguide flange and the second waveguide flange coupled thereto. In other words, the choke structure can help reduce the effect of parasitic gaps in the waveguide flanges. As a result, reflection loss can be increased, transmission loss can be reduced, and coupling reliability can be improved.

[0010] According to one embodiment, at the face of the first waveguide flange, the inner waveguide structure (e.g., a double-ridged hollow waveguide structure) of the first waveguide flange may be surrounded by a recess (e.g., a rectangular recess (e.g., a trench-shaped recess)) (e.g., with a conductive structure at least partially between the inner waveguide structure and the recess). The recess may form a choke structure, may be part of the choke structure, or may be provided in addition to the choke structure. The recess may have a depth of, for example, one-quarter (e.g., within a tolerance of ±10% or ±5%) of the maximum wavelength (e.g., 12.5 mm corresponding to 24 GHz), center wavelength (e.g., 7.8 mm corresponding to 38.5 GHz), or minimum wavelength (e.g., 5.7 mm corresponding to 53 GHz) of the spectrum transmitted by the first waveguide flange. The distance between the recess and at least one inner surface of the first waveguide flange may be, for example, one-quarter of the maximum wavelength (e.g., 12.5 mm corresponding to 24 GHz), the center wavelength (e.g., 7.8 mm corresponding to 38.5 GHz), or the minimum wavelength (e.g., 5.7 mm corresponding to 53 GHz) of the spectrum to be transmitted by the first waveguide flange (within a tolerance of, for example, ±10% or ±5%). This structure can therefore provide good electrical (electromagnetic) transmission characteristics and reduce sensitivity to mechanical tolerances and / or surface imperfections.

[0011] The recess forms a resonant short-circuit stub and can establish a high impedance (e.g., at the transition between the recess and the coupling recess). This high impedance can be transformed into a low impedance in the region between the recess and the waveguide (i.e., within the coupling recess). Thus, a low or very low impedance can be achieved at the inner boundary of the coupling recess. This structure can therefore reduce reflection losses across the first waveguide flange and the coupled second waveguide flange.

[0012] According to one embodiment, the inner waveguide structure of the first waveguide flange has a substantially rectangular cross-section and two ridges (e.g., two ridges having a substantially rectangular cross-section) are provided on two opposite sides (e.g., boundaries) (e.g., opposite long sides or opposite long boundaries) of the partly rectangular cross-section of the inner waveguide structure. The boundaries of the inner waveguide structure have coupling recesses in the region of the two further sides (e.g., boundaries) of the substantially rectangular cross-section of the inner waveguide structure (e.g., in the region of opposite short sides or opposite short boundaries) to enable coupling between the inner waveguide structure and the recess surrounding the inner waveguide structure.

[0013] The coupling recesses, for example, present a low impedance to the inner waveguide structure, reducing discontinuities and helping to obtain good electrical (electromagnetic) transmission characteristics.

[0014] According to one embodiment, the first waveguide flange has a removable face structure (eg, a structure including a straight waveguide section) that includes a face of the first waveguide flange.

[0015] The removable face structure can be replaced or removed (e.g., for repair) after it wears from repeated bonding procedures. Therefore, wear is limited to a relatively small structure (e.g., the removable face structure) that can be replaced and / or repaired. This avoids the need to replace the antenna device, which is typically an expensive part. Furthermore, there is no need to apply special plating to the antenna.

[0016] According to one embodiment, the removable face structure is at least partially plated with plating including at least one of nickel and gold, which may include an outer gold plating (including or formed of gold) and an inner nickel plating (including or formed of nickel).

[0017] Gold-containing plating is recognized to be stable to many bonding processes (eg, over one million bonding processes), and nickel (eg, as a barrier metal) improves wear resistance.

[0018] According to one embodiment, the plating comprises a gold layer with a thickness in the range of 1.5 μm to 2.5 μm and a nickel layer with a thickness in the range of 0.5 μm to 1.2 μm.

[0019] Such dimensions have been recognized to provide a better compromise between wear resistance and material cost, and have also been found to provide good electrical properties.

[0020] According to one embodiment, the first waveguide flange has a substantially rectangular cross-section including two (relatively) wide inner surfaces and two (relatively) narrow inner surfaces that are narrower than the wide inner surfaces. The first and second ridges of the ridged waveguide structure extend from the wide inner surfaces toward each other (so that a double-ridged waveguide structure is formed). The first and second ridges may, for example, have at least essentially the same dimensions. The first and second ridges may each be provided on a central axis of a respective one of the wide inner surfaces.

[0021] Such an arrangement of first and second ridges can provide a larger bandwidth compared to a similar waveguide without the ridges. A double-ridged waveguide can provide a bandwidth that spans over an octave (i.e., spans more than an octave) (e.g., the maximum wavelength of the bandwidth is greater than twice the minimum wavelength of the bandwidth). Thus, the waveguide can transmit signals that enable testing of wideband devices (DUTs).

[0022] According to one embodiment, the narrow inner surface has a width in the range of 2.4 mm to 2.7 mm, or in the range of 2.5 mm to 2.6 mm, and the wide inner surface has a width in the range of 5.3 mm to 5.7 mm, or in the range of 5.4 mm to 5.6 mm, or in the range of 5.44 mm to 5.54 mm. The width of the first ridge and the second ridge and the spacing is in the range of 1.0 mm to 1.2 mm, or in the range of 1.04 mm to 1.14 mm, and the width of the first ridge and the second ridge is in the range of 1.3 mm to 1.5 mm, or in the range of 1.32 mm to 1.42 mm, etc.

[0023] It has been recognized that such dimensions provide a waveguide flange having a bandwidth ranging from 24 GHz to 53 GHz with an improved compromise between insertion loss (e.g., less than 1 dB) and return loss (e.g., greater than 20 dB). Such a waveguide flange is therefore particularly suitable for use in the 5G spectrum (e.g., frequency range 2).

[0024] According to one embodiment, the ratio of the width (e.g., overall width) of the wide inner surface (e.g., measured in a cross section perpendicular to the axis of the waveguide) to the width (e.g., overall width) of the narrow inner surface (e.g., measured in a cross section perpendicular to the axis of the waveguide) is 2.15 with a tolerance of ±10% (or within a tolerance of ±5%). The ratio of the width (e.g., overall width) of the wide inner surface (e.g., measured in a cross section perpendicular to the axis of the waveguide) to the width of the spacing between the first and second ridges (e.g., measured in a cross section perpendicular to the axis of the waveguide) is 5.04 with a tolerance of ±10% (or within a tolerance of ±5%). The ratio of the width (e.g., overall width) of the wide inner surface (e.g., measured in a cross section perpendicular to the axis of the waveguide) to the widths of the first ridge and the second ridge (e.g., measured in a cross section perpendicular to the axis of the waveguide) is 4.01 with a tolerance of ±10% (or within a tolerance of ±5%).

[0025] A waveguide flange with such dimensions can have a bandwidth of more than one octave and offers an improved compromise between insertion loss and return loss (eg, at the transition).

[0026] According to one embodiment, the first waveguide flange has a substantially rectangular (e.g., square) cross-section including four (e.g., equal width) inner surfaces, and the ridged waveguide structure has four ridges, each of which extends from a respective one of the four inner surfaces toward a central axis of the first waveguide flange (such that four ridged waveguide structures are formed).

[0027] It has been found that four ridges can be used advantageously in high-bandwidth dual-polarization applications. For example, a first waveguide flange can be coupled to two double-ridged waveguides (e.g., at the ends of a quad-ridged waveguide on opposite sides of the flange). These two double-ridged waveguides can couple two different polarizations into a quad-ridged waveguide extending toward the first waveguide flange. The use of a quad-ridged waveguide can save footprint space for dual-polarization applications. Furthermore, when using a waveguide structure with four ridges, only one blind-mating waveguide connection is required to transmit signals associated with the two polarizations. This can significantly reduce mechanical requirements in some cases.

[0028] According to one embodiment, the inner surfaces have a width of 5.1 mm to 5.3 mm, or 5.15 mm to 5.25 mm (e.g., such that the spacing between opposing inner surfaces is within the range of 5.1 mm or 5.15 mm to 5.25 mm without considering the ridges). Each of the four ridges extends toward the central axis of the ridged waveguide structure within the range of 0.9 mm to 1.1 mm, or within the range of 0.95 mm to 1.05 mm. Each of the four ridges has a width within the range of 1.1 mm to 1.3 mm, or within the range of 1.15 mm to 1.25 mm.

[0029] Such dimensions are required to achieve good transmission characteristics within the bandwidth (e.g., scattering parameter S 1,2 , S 2,1 and S 1,1 , S 2,2It has been recognized that this allows for wide bandwidth (eg, wide monomode bandwidth) (eg, greater than 24 GHz) while providing high performance (with respect to

[0030] According to one embodiment, the inner surfaces have widths that are equal to within a tolerance of ±10% or ±5% (e.g., such that the spacing between opposing inner surfaces is equal to within a tolerance of ±10% or ±5% if the ridges are not taken into account), the ratio of the maximum distance between a first pair of opposing inner surfaces (e.g., 5.2 mm) to the radial extension of the ridges on the first pair of inner surfaces (e.g., extension perpendicular to the respective inner surfaces and toward the axis of the ridged waveguide structure) (e.g., 1 mm) is 5.2 mm with a tolerance of ±10 or ±5%, and the ratio of the maximum distance between a second pair of opposing inner surfaces ( The ratio of the radial extension (e.g., extension perpendicular to the respective inner surfaces, toward the axis of the ridged waveguide structure) of the ridges on the second pair of inner surfaces (e.g., 1 mm) to 5.2 mm with a tolerance of ±10% or ±5%, and the ratio of the width (e.g., measured parallel to the respective inner surfaces on which the respective ridges are provided) of each ridge (e.g., 1.2 mm) to the width (e.g., 5.2 mm) of the respective inner surfaces on which the respective ridges are provided is 0.23 mm with a tolerance of ±10% or ±5%.

[0031] Such dimensions provide a wide bandwidth (e.g., a wide monomode bandwidth) (e.g., greater than 24 GHz) while at the same time providing good transmission characteristics within the bandwidth (e.g., a low scattering parameter S 1,2 , S 2,1 and S 1,1 , S 2,2 ) is provided.

[0032] According to one embodiment, the antenna structure is a dual polarized antenna structure, and the antenna apparatus is configured (e.g., with a suitable feed structure) such that a first propagation mode of the ridged waveguide structure couples predominantly (e.g., 80% or more, or 90% or more) with a first polarization of the dual polarized antenna structure, and a second propagation mode of the ridged waveguide structure couples predominantly (e.g., 80% or more, or 90% or more) with a second polarization of the dual polarized antenna structure that is different from the first polarization.

[0033] Thus, signals of the first and second polarizations can be coupled to a first waveguide flange having four ridges (e.g., a quad-ridged waveguide) and independently (at least partially) guided within the four-ridged waveguide structure. Therefore, a single (blind-mating) waveguide connection is sufficient to separately transmit signals associated with two different (e.g., orthogonal) polarizations. The antenna device can be easily coupled to automatic test equipment (ATE), and polarization-separated signals can be exchanged unidirectionally or bidirectionally between the ATE components and the antenna.

[0034] One embodiment of the present invention is directed to an automated test equipment comprising an antenna apparatus as described herein and a test fixture (e.g., a test head structure or load board) having a second blind-mating waveguide flange configured to mate with a first waveguide flange of the antenna apparatus, the second waveguide flange having a ridged waveguide structure that mates with the ridged waveguide structure of the first waveguide flange (e.g., the cross-section of the ridged waveguide structure of the second waveguide flange may be identical to the cross-section of the ridged waveguide structure of the first waveguide flange, e.g., except for manufacturing tolerances).

[0035] The first and second waveguide flanges can be mated and coupled, so that the test fixture and the antenna device can be coupled so that electromagnetic waves can be transmitted therebetween. The first waveguide flange is a blind-mating flange and has a ridged waveguide structure, so that it can transmit electromagnetic waves in the wide bandwidth made possible by the ridged waveguide structure, and can be mated (aligned) blindly with the second waveguide flange.

[0036] According to one embodiment, the second waveguide flange can be depressed (e.g., by applying a mating force to the second waveguide flange via the mating first waveguide flange) against a bias (e.g., a restoring force of a spring structure and / or a waveguide coupled to the second waveguide flange) extending in a direction extending essentially perpendicular to the face of the second waveguide flange. This provides a mating force (contact force) that helps ensure a reliable connection. Furthermore, in some cases, the antenna arrangement can be positioned at (slightly) different distances from the test fixture (e.g., to increase compatibility with different sized devices under test and / or to achieve earlier contact between the first and second waveguide flanges during the coupling procedure) while still allowing (reliable) physical contact between the first and second waveguide flanges.

[0037] According to one embodiment, the second waveguide flange is mounted (e.g., mounted in a floating assembly) to float (e.g., in a direction parallel to the face of the second waveguide flange). Because the first waveguide flange is configured for blind mating, alignment may require (at least slight) movement of at least one of the first and second waveguide flanges (e.g., for self-alignment guided by one or more conical alignment pins, etc.). The floating mounting of the second waveguide flange allows the second waveguide flange to move during mating with the first waveguide flange, thereby improving the mating process (e.g., by compensating for inaccuracies in the positioning of the first waveguide flange). With proper attention to, for example, surface plating, the second waveguide flange can provide a robust blind-mate interconnection.

[0038] According to one embodiment, the test fixture includes a device under test socket configured to electrically couple to the device under test. The device under test socket can thus provide an interface for transmitting and receiving electrical signals (e.g., wired signals) to and from the device under test. For example, the device under test socket can enable transmission of control signals (e.g., causing the device under test to emit electromagnetic waves) for the device under test, reception of (e.g., wired) measurement signals for the device under test, and / or reception of power signals for powering the device under test.

[0039] According to one embodiment, the second waveguide flange has a removable face structure (e.g., a structure including a straight waveguide section) that includes the face of the second waveguide flange. The removable face structure can be replaced or removed for repair after it wears from repeated bonding procedures. Thus, wear is (substantially) limited to a smaller structure (e.g., the removable face structure) that can be replaced and / or repaired. This avoids the need to replace the second waveguide flange (or the waveguide-to-coax adapter that is part of it), which is typically an expensive component. Furthermore, no special plating is required on the second waveguide flange.

[0040] According to one embodiment, the removable face structure (of the second waveguide flange) is at least partially plated with plating including at least one of nickel and gold (e.g., the plating may include a gold layer having a thickness in the range of 1.5 μm to 2.5 μm and a nickel layer having a thickness in the range of 0.5 μm to 1.2 μm).

[0041] Gold-containing plating is recognized to be stable to many bonding processes (eg, over one million bonding processes), and nickel (eg, as a barrier metal) improves wear resistance.

[0042] According to one embodiment, the second waveguide flange has a substantially rectangular cross-section with two wide inner surfaces and two narrow inner surfaces narrower than the wide inner surfaces, and the first and second ridges of the ridged waveguide structure extend from the wide inner surfaces towards each other (so that a double-ridged waveguide is formed) (wherein the geometric details may, for example, be identical to the geometric details of the first waveguide flange).

[0043] Thus, both the first and second waveguide flanges have a ridged waveguide structure including two ridges (e.g., which may be adjacently positioned to form the same cross section when the first and second waveguide flanges are mated). As a result, both the first and second waveguide flanges benefit from increased bandwidth and reduced signal loss at the transition between the first and second waveguide flanges. Furthermore, by using the same or similar cross sections, discontinuities at the transition between the flanges can be avoided.

[0044] According to one embodiment, the second waveguide flange has a substantially rectangular (e.g., square) cross-section including four inner surfaces (e.g., of equal width), and the ridged waveguide structure of the second waveguide flange has four ridges, each of which extends from one of the four inner surfaces toward the central axis of the first waveguide flange (so that four ridged waveguide structures are formed) (wherein the geometric details may, for example, be identical to the geometric details of the first waveguide flange).

[0045] As a result, the second waveguide flange can guide broadband signals of two different polarization directions. For example, the first waveguide flange may also have four ridges, thereby allowing broadband signals of two different polarization directions to be transmitted to the second waveguide flange or vice versa.

[0046] According to one embodiment, the automated test equipment includes a waveguide-to-coax adapter coupled to the second blind-mating waveguide flange to establish a connection between ATE equipment (e.g., one or more signal generators and / or one or more signal evaluators) and the second blind-mating waveguide flange.

[0047] One embodiment of the present invention is directed to a method for testing a device under test, the method including: establishing a coupling between the device under test and automatic test equipment using an antenna apparatus, the antenna apparatus comprising an antenna structure and a first blind-mating waveguide flange coupled to the antenna structure, the first waveguide flange having a ridged waveguide structure including at least two ridges; and coupling the first waveguide flange to a second blind-mating waveguide flange of the automatic test equipment (where the second blind-mating waveguide flange may be mounted to the automatic test equipment in a floating manner, for example).

[0048] The coupling between the first and second waveguide flanges can be realized in the form of a blind fit. Therefore, the coupling uses some alignment structure and provides sufficient accuracy for automatic coupling. Since a wireless coupling is established between the device under test and the antenna unit, a communication connection can be established between the device under test and the automatic test equipment via the antenna unit.

[0049] According to one embodiment, the method includes electrically coupling (e.g., by wire) the device under test to a test socket of an automatic test equipment (the test socket may, for example, be provided on a test fixture or may be part of the test fixture).

[0050] As a result, the automatic test equipment can send and receive electrical signals to and from the device under test via the test socket. For example, the automatic test equipment can send control signals to the device under test (e.g., to cause it to emit electromagnetic radiation) and / or receive measurement signals from the device under test.

[0051] According to one embodiment, the method may include transmitting signals between the device under test and the automatic test equipment via at least the antenna structure, the first waveguide flange, and the second waveguide flange. The signals may be transmitted from the device under test to the automatic test equipment and / or vice versa.

[0052] The signal transmission allows for evaluation of signals received from or transmitted to the device under test (e.g., by automatic test equipment) and benefits from (at least) the wide frequency bandwidth of the ridged first waveguide flange, since the transmission frequency can be selected within the wide bandwidth of the ridged first waveguide flange.

[0053] According to one embodiment, the second waveguide flange is depressible against a bias (e.g., a spring load) in a direction extending essentially perpendicular to a face of the second waveguide flange, and coupling the first waveguide flange to the second waveguide flange includes forcing a face of the first waveguide flange against a face of the second waveguide flange against the bias of the second waveguide flange, and mounting the antenna apparatus to a test fixture.

[0054] Due to the depressibility and bias of the second waveguide flange, the step of forcing the face of the first waveguide flange into the face of the second waveguide flange can be performed with more diverse devices (e.g., with different thicknesses), and the (mechanical) bias of the second waveguide flange helps to provide sufficient mating force to establish a good connection. [Brief explanation of the drawings]

[0055] The drawings are not necessarily to scale, emphasis instead generally being placed upon illustrating the principles of the invention. In the following description, various embodiments of the invention are described with reference to the following drawings: [Figure 1] 1 shows a schematic diagram of an embodiment of an antenna arrangement for establishing a wireless coupling to a device under test; [Figure 2A] 1 illustrates an example cross section of a first waveguide flange having a ridged waveguide structure including two ridges. [Figure 2B] 2B shows a graphical representation of the results of a simulation of the insertion loss and return loss of the waveguide flange of FIG. 2A. [Figure 3A]1 shows an example of a square cross section of a first waveguide flange having a ridged waveguide structure including four ridges. [Figure 3B] 3B shows the results of a simulation of vertical polarization at the first waveguide flange shown in FIG. 3A. [Figure 3C] 3C shows a graphical representation illustrating the results of a simulation of scattering parameters at the first waveguide flange shown in FIGS. 3A and 3B. [Figure 4] 1 shows a perspective view of an embodiment of an antenna arrangement comprising an antenna structure and a first blind-mating waveguide flange having a ridged waveguide structure. [Figure 5A] FIG. 1 shows a side view of a first example of a protrusion having a conical surface and a rounded tip. [Figure 5B] 10 shows a side view of a second example of a protrusion having a shaft and a truncated conical tip. [Figure 5C] 10 shows a side view of a third example of a protrusion having two conical surfaces with different diameters. [Figure 5D] 10 shows a side view of a fourth example of a protrusion having a circumferential projection around the shaft. [Figure 6] 1 illustrates a perspective view of an embodiment of a first waveguide flange, where a first face of the first waveguide flange has a choke structure. [Figure 7A] 1 shows a schematic side view of an embodiment of an antenna apparatus, wherein a first waveguide flange has a removable face structure that includes a face of the first waveguide flange. [Figure 7B] 7B shows a schematic side view of the antenna apparatus of FIG. 7A, with the face structure removed from the housing. [Figure 7C] FIG. 2 shows a perspective view of a face structure. [Figure 8A] 1 shows a cross section taken by scanning electron microscopy of the plating on a face structure prior to use in repeated mating cycles. [Figure 8B] A cross section of the plating on the face structure after over 1 million mating cycles is shown, captured by a scanning electron microscope (SEM). [Figure 9] 1 shows a schematic cross-sectional view of an automatic test device. [Figure 10A] FIG. 1 shows a perspective view of a test fixture waveguide to coaxial adapter. [Figure 10B] 10B shows a different perspective view of the waveguide-to-coax adapter of FIG. 10A. [Figure 10C] 10A and 10B show yet another perspective view of the waveguide-to-coax adapter of FIGS. [Figure 11A] FIG. 1 illustrates a perspective view of a waveguide-to-coax adapter having a first housing portion and a second housing portion. [Figure 11B] FIG. 2 shows a perspective view of the first housing part. [Figure 12A] FIG. 2 shows a perspective view of the second housing part. [Figure 12B] 1 shows a plot of simulated return loss for a waveguide-to-coax adapter with manufacturing deviations of less than 50 μm. [Figure 13] 1 shows a perspective view of an example of an antenna device and a waveguide to coaxial adapter. [Figure 14] 14 shows a perspective view of the antenna apparatus and waveguide to coaxial adapter of FIG. 13. [Figure 15] 15 shows a perspective view of the antenna device and waveguide-to-coaxial adapter of FIGS. 13 and 14. FIG. [Figure 16] 1 shows a schematic diagram of an automatic test equipment with an antenna arrangement, a waveguide to coaxial adapter, and ATE equipment. [Figure 17] 1 shows a schematic flow diagram of a method for testing a device under test. DETAILED DESCRIPTION OF THE INVENTION

[0056] Detailed Description of the Embodiments In the following description, like or equivalent elements, or elements having like or equivalent functions, are designated with like or equivalent reference numerals even if they appear in different figures.

[0057] In the following description, numerous details are set forth to provide a more thorough explanation of embodiments of the present invention. However, it will be apparent to those skilled in the art that embodiments of the present invention may be practiced without these specific details. In other instances, well-known structures and devices are shown in block diagram form, rather than in detail, to avoid obscuring embodiments of the present invention. Furthermore, features of different embodiments described hereinafter can be combined with each other unless otherwise noted.

[0058] 1 shows a schematic diagram of one embodiment of an antenna arrangement 100 for establishing a wireless coupling with a device under test (not shown). The antenna arrangement 100 comprises an antenna structure 110 and a first blind-mating waveguide flange 120 coupled to the antenna structure 110. The first waveguide flange 120 has a ridged waveguide structure 140 having at least two ridges 150a, b.

[0059] The antenna structure 110 may have a radiating aperture. For example, the antenna structure 110 may have a waveguide end face (e.g., rectangular or square, optionally with a ridged waveguide structure). In this case, for example, the waveguide of the antenna structure 110 may have at least essentially the same cross section as the first waveguide flange 120. The antenna structure 110 may be formed by or have an aperture in a metal housing. In some embodiments, the antenna structure 110 may be formed by or have at least one of a monopole antenna, a dipole antenna, a horn antenna, and a parabolic antenna. The antenna structure 110 may have (or be part of) an antenna array, for example.

[0060] The first blind-mating waveguide flange 120 is coupled to the antenna structure 110, i.e., electromagnetic waves received by the antenna structure 110 are transmitted to the first blind-mating waveguide flange 120 (and vice versa). The first waveguide flange 120 may be coupled to the antenna structure 110, for example, via a coupling element 112. The coupling element 112 may include, for example, at least one of a waveguide, a cable, a printed circuit board structure, an air interface, an amplifier, and a waveguide splitter / combiner structure (e.g., a T-junction). The coupling element 112 may include, for example, a connecting waveguide (optionally having a waveguide splitter / combiner structure) having at least two end faces, one end face forming or including the antenna structure 110 and the other end face forming or including the first waveguide flange 120. The coupling element 112 (e.g., a connecting waveguide) may, for example, extend (e.g., be wired) in a U-shape (e.g., so that the main lobe direction of the antenna structure is directed in the same direction as the first waveguide flange 120).

[0061] The first waveguide flange 120 may be provided at the end of a waveguide (e.g., a waveguide having at least essentially the same cross section as the first waveguide flange 120 (e.g., including the ridged waveguide structure 140 in its cross section)). The first waveguide flange 120 (and optionally the waveguide connected thereto) may have a (substantially) rectangular (e.g., rectangular or square) cross section.

[0062] For example, first waveguide flange 120 may have a cross-section having a width in the range of 5.3 mm to 5.7 mm, or in the range of 5.4 mm to 5.6 mm, or in the range of 5.44 mm to 5.54 mm, e.g., at least essentially 5.49 mm. First waveguide flange 120 may have a cross-section having a height in the range of 2.4 mm to 2.7 mm, or in the range of 2.5 mm to 2.6 mm, e.g., at least essentially 2.55 mm. Alternatively, first waveguide flange 120 may have an at least substantially square cross-section with a width in the range of 5 mm to 6 mm, e.g., a width in the range of 5.1 mm to 5.3 mm, e.g., a width of at least essentially 5.2 mm.

[0063] FIG. 2A shows an example cross-section of a first waveguide flange 220 having a ridged waveguide structure 240 including two ridges 250 a, b. The first waveguide flange 220 has a width a (e.g., the total width of the wide inner surface 223 a) of, for example, 5.49 mm and a height b (e.g., the total width of the short inner surface 223 b) of, for example, 2.55 mm. The two ridges 250 a, b extend from (or are provided on) the wide inner surface 223 a of the first waveguide flange 220. The ridges 250 a, b are centrally located along the width of the wide inner surface 223 a. The spacing 225 b between the ridges 250 a, b has a width b1 of, for example, 1.09 mm. The two ridges 250 a, b have at least essentially the same cross-section. Alternatively, the ridges 250 a, b may have different cross-sections. Ridges 250a,b have a height (e.g., measured radially from the central axis of the waveguide) of, for example, 0.73 mm (i.e., (b-b1) / 2=(2.55 mm-1.09 mm) / 2=0.73 mm). Ridges 250a,b have a width a1 (e.g., in a direction parallel to wide inner surface 223a) of, for example, 1.37 mm. Note that first waveguide flange 220 may have different dimensions. For example, at least one of the dimensions described herein may be different.

[0064] Alternatively or additionally, the entire cross section may be differently scaled (eg, all dimensions may be enlarged or reduced by a common factor, eg, 2).

[0065] According to one embodiment, the ratio of the width of the wide inner surface 223a to the width of the narrow inner surface is 2.15 with a ±10% tolerance (or within a ±5% tolerance). In the example shown in FIG. 2A , the ratio of width a to width b is approximately a / b = 5.49 mm / 2.55 mm = 2.15. The ratio of the width of the wide inner surface 223a to the width of the spacing 225 between the first and second ridges may be 5.04 with a ±10% tolerance (or within a ±5% tolerance). In the example shown in FIG. 2A , the ratio of width a to b1 is approximately a / b1 = 5.49 mm / 1.09 mm = 5.04. The ratio of the width of the wide inner surface 223a to the width of the first edge and the width of the second edge may be 4.01 with a ±10% tolerance (or within a ±5% tolerance). In the example shown in FIG. 2A, the ratio of a to a1 is approximately a / a1=5.49 mm / 1.37 mm=4.01.

[0066] FIG. 2B is a graphical representation of a simulation of the insertion loss (IL, dark solid line) and return loss (RL, dashed line) of a waveguide flange 220 having the dimensions defined herein with reference to FIG. 2A. The horizontal axis represents frequency in GHz (i.e., 15-60 GHz), and the vertical axis represents IL and RL in dB (where insertion loss is preferably expressed as a positive number). The solid gray line 203 (see the -10 dB horizontal line) indicates the target bandwidth of 24-53 GHz. As can be seen in the simulation plot, within the target bandwidth, the insertion loss is near zero and the return loss is approximately 20-32 dB.

[0067] The first waveguide flange 120 (and optionally the waveguide connected thereto) may have a square cross-section, e.g., including an inner surface having a width of 5.1 mm to 5.3 mm, e.g., 5.15 mm to 5.25 mm, e.g., at least essentially 5.2 mm. The ridged waveguide structure may have four ridges, each having a height (perpendicular to the inner surface along which each ridge extends) of, e.g., 0.9 mm to 1.1 mm, e.g., 0.95 mm to 1.05 mm, e.g., at least essentially 1 mm. The ridges may have a width (parallel to the inner surface along which each ridge extends) of, e.g., 1.1 mm to 1.3 mm, e.g., 1.15 mm to 1.25 mm, e.g., at least essentially 1.1 mm.

[0068] FIG. 3A shows an example cross-sectional view of a first waveguide flange 320 (also referred to as a quad-ridged waveguide flange) having a ridged waveguide structure 340 including four ridges 350a-d. The first waveguide flange 320 has a square cross-section, with each of the four inner surfaces having a width of 5.2 mm. One of the four ridges 350a-d extends from the center of each inner surface, and one of the ridges 350a,b extends toward the respective opposing ridge 350c,d (e.g., in FIG. 3A, the left ridge 350d extends toward the right ridge 350b). The four ridges 350a-d depicted in FIG. 3A have, for example, identical cross-sections (ignoring orientation, as ridges 350b,d are shown rotated 90° relative to ridges 350a,c). Alternatively, at least one of the ridges 350a-d may have a different cross-section (e.g., different width or length). The ridges 350a-d have a height (in a (radial) direction perpendicular to the inner surface along which the ridges 350a-d extend) of, for example, 1 mm. Therefore, a pair of opposing ridges 350a, c or 350b, d are separated by a distance of, for example, 3.2 mm (e.g., 5.2 mm - (2 x 1 mm) = 3.2 mm). The ridges 350a-d have a width (in a direction parallel to the inner surface along which the ridges 350a-d extend) of, for example, 1.2 mm.

[0069] The ridged waveguide structure 340, which includes four ridges 350a-d, essentially forms a combination of two double-ridge interconnects into one quad-ridge interconnect.

[0070] Figure 3B shows the results of a simulation of a vertically polarized wave (more precisely, a vertically polarized mode) in the first waveguide flange 320 shown in Figure 3A. The four ridges 350a-d allow for the excitation of a vertically polarized wave.

[0071] 3C shows a graphical representation of the results of a simulation of the scattering parameters (S-parameters) of the first waveguide flange 320 shown in FIGS. 3A and 3B. The horizontal axis represents frequency in GHz (i.e., 20-32 GHz) and the vertical axis represents the scattering parameters S 1,1 , S 2,1 , S 1,2 and S 2,2 The parameter S is expressed in dB. 1,1 and S 2,2 The magnitudes of the parameters are almost the same, and the parameter S 2,1 and S 1,2 The magnitudes of the parameters S 1,1 and S 2,2 The magnitude of the parameter S 2,1 and S 1,2 The magnitude of the S-parameters is smaller than that of the quad-ridged waveguide flange, indicating low reflectivity and high transmittance. The magnitudes of the S-parameters are reversed only between approximately 24.2 GHz and 28.2 GHz. The advantage of the quad-ridged waveguide flange is its ability to transmit two polarizations. However, the implementation shown in Figure 3A may operate at a smaller bandwidth compared to the implementation using a double-ridged waveguide. However, the simulation results shown in Figure 3C are based on an unoptimized design. It should be noted that optimizing the parameters (e.g., dimensions) of the first waveguide flange can significantly increase the bandwidth.

[0072] Figure 4 is a schematic perspective view of one embodiment of an antenna arrangement 400 comprising an antenna structure 410 and a first blind-mating waveguide flange 420 having a ridged waveguide structure 440. In the example shown in Figure 4, the first waveguide flange 420 has a rectangular overall cross-section, and the ridged waveguide structure 440 (which is part of the first waveguide flange and modifies the overall cross-section of the first waveguide flange) has two ridges 450a,b. The first waveguide flange 420 has two wide (i.e., relatively wide) inner surfaces and two short (i.e., relatively short) inner surfaces. Each ridge 450a,b extends toward each other from the center of the respective wide inner surface.

[0073] The ridges 450a,b have a rectangular cross-section, with the wide side of each ridge 450a,b extending parallel to the wide side of the first waveguide flange 420. As a result, the wide sides of the ridges 450a,b face each other. Alternatively, the short sides of the ridges 450a,b may face each other. Further alternatively, the ridges 450a,b may have a square cross-section. The first waveguide flange 440 may have the same (or similar) dimensions as those shown in FIG. 2A, for example.

[0074] The double-ridged first waveguide flange 420 has an increased bandwidth (or wide bandwidth) (e.g., 24-53 GHz) and allows devices within the increased bandwidth to be tested using only a single (wideband) antenna arrangement (e.g., antenna arrangement 400) instead of using a combination of conventional antenna arrangements that would (traditionally) be required to cover the increased bandwidth in combination.

[0075] 4 has (or is formed by) an opening 414 in a (e.g., metal) housing 480. The housing 480 may have multiple (e.g., two, three, or more) layers. For example, at least one of the antenna structure 410, the opening 414, the coupling element 412, the first waveguide flange 420, and the ridged waveguide structure 440 may be formed, at least in part, by a recess in two adjacent layers of the housing 480.

[0076] The first waveguide flange 420 has a first blind-mating interface 470, including, for example, an exemplary single protrusion 472a. Generally speaking, the first blind-mating interface 470 may have, for example, one or more protrusions and / or one or more recesses, enabling self-mating alignment between the first waveguide flange 420 and a mating (e.g., second) waveguide flange. The first waveguide flange 420 may have, for example, at least one first protrusion and at least one recess configured to receive a second protrusion having the same shape (or at least essentially the same shape) as the first protrusion. As a result, during the blind-mating procedure, insertion of the first protrusion and the second protrusion can occur simultaneously. Alternatively, the recess may be configured to receive a second protrusion that is longer or shorter than the first protrusion. As a result, the blind-mating procedure can be accomplished by enabling two temporally subsequent alignment phases (e.g., different alignment steps). However, it should be noted that different alignment structures may be used to enable blind mating of a first waveguide flange with another waveguide flange, such as, for example, alignment structures that coaxially surround opening 414. However, any type of self-alignment feature may be used in embodiments according to the present invention.

[0077] When a protrusion is used as the self-mating alignment means, the protrusion may, for example, be attached (e.g., screwed, pierced, welded, or integrally formed) to the face of the first waveguide flange 420 and / or any other part of the antenna apparatus 400 (e.g., the housing 480). The protrusion may be attachable (and optionally removable) from the face of the first waveguide flange 420.

[0078] 5A-5D show different examples of protrusions 572a-d, which may function, for example, as alignment structures for blind mating and may, for example, take on the role of protrusion 472a. It should be understood that instead of, or in addition to, one or more protrusions 572a-d, first blind-mating interface 470 may have one or more similarly (e.g., appropriately) shaped (e.g., inverted) recesses configured to receive protrusions such as those described herein.

[0079] 5A shows a side view of a first example of a protrusion 572a having a conical surface 574a and a rounded tip. The conical surface 571a of the protrusion 572a makes the protrusion self-aligning when received by a corresponding recess.

[0080] 5B shows a side view of a second example of a protrusion 572b having a shaft and a truncated conical tip. The truncated conical tip provides a conical surface 574b for self-alignment. The shaft provides a lateral abutment surface that limits lateral movement.

[0081] 5C shows a side view of a third example of a protrusion 572c having two conical surfaces 574c, 575c with different diameters (e.g., different diameters at the base of each conical surface 574c, 575c). The two conical surfaces 574c, 575c form two stages, one for rough alignment (e.g., smaller diameter, see upper conical surface 574c in FIG. 5C) and one for fine alignment (e.g., larger diameter, see lower conical surface 575c in FIG. 5C).

[0082] FIG. 5D shows a side view of a fourth example of a protrusion 572d having a circumferential protrusion 576 (e.g., ring-shaped) around the shaft. The protrusion 576 may be integrally formed with the rest of the protrusion 572d. Alternatively, the protrusion 576 may be a separate part, for example, comprising a metal or a polymer (e.g., rubber). The protrusion 576 may abut against the surface of the shaft or the conical surface 574d, 575d, or may be disposed within a groove in the shaft or the conical surface 574d, 575d. The protrusion 576 may, for example, frictionally engage with a receiving recess and / or absorb excessive force during the mating process. The protrusion 572d in FIG. 5D may correspond to the protrusion 572c in FIG. 5C, except for the fact that the protrusion 576 is added to the protrusion 572d in FIG. 5D. However, the protrusion 576 may be used in combination with any other protrusion described herein, for example, in combination with the protrusions 572a, 572b.

[0083] 6 shows a perspective view of an embodiment of a first waveguide flange 620, where a first face 622 of the first waveguide flange 620 has a choke structure 660. The first waveguide flange 620 shown in FIG. 6 has a ridged waveguide structure 640 including two ridges 650a, 650b in a central region. The choke structure 660 is disposed surrounding the ridged waveguide structure 640. However, in some embodiments, and with some modifications, the choke structure 660 can be used with any other number of ridges (e.g., four ridges).

[0084] The first face 622 is the (optionally flat) surface of the first waveguide flange 620 facing away from the waveguide that feeds the first waveguide flange 620. The first face 622 is oriented perpendicular to the extension direction of the feed waveguide. The choke structure 660 includes a recess 662 formed in the first face 622 and extends at least partially or entirely (e.g., as seen in FIG. 6 ) around the inner waveguide structure of the first waveguide flange 620 (e.g., the opening of the feed waveguide).

[0085] The recess 662 shown in FIG. 6 extends, for example, along a rectangular path such that a boundary 664 formed between the recess 662 and the inner surface of the first waveguide flange 620 has at least essentially the same thickness t on the short and long sides of the boundary 664. Alternatively, the boundary 664 may have a different wall thickness on at least one of its four sides. Further alternatively, the recess 662 may have any other path, such as a circle, an ellipse, or a polygon (e.g., a regular polygon) (e.g., with rounded corners). The boundary 664 may have a wall thickness of at least essentially ¼ of the wavelength of the operating frequency of the waveguide flange 620. The operating frequency may be, for example, a center frequency (e.g., 38.5 GHz), a lower cutoff frequency (e.g., 24 GHz), an “upper cutoff” frequency (e.g., the frequency at which the waveguide begins to propagate one or more non-evanescent modes) (e.g., 53 GHz), or any frequency in between.

[0086] The boundary 664 may have coupling recesses 666a, 666b in two (further) side regions (e.g., in opposing short side regions or opposing short boundary regions) of the substantially rectangular cross-sectional boundary 664 of the inner waveguide structure to enable coupling between the inner waveguide structure and the recess 662 surrounding the inner waveguide structure.

[0087] The coupling recesses 666a, 666b are recessed relative to the first face 622 of the first waveguide flange 620 (in a direction perpendicular to the first face 622). The boundary 664 may have, for example, a non-recessed boundary portion 668a (and typically also a non-recessed boundary portion 668b) having a face surface that is flush with the first face 622 of the first waveguide flange 620. The ridges 650a, 650b may terminate at (or transition to, or be part of) the non-recessed boundary portions 668a, 668b. The non-recessed boundary portions 668a, 668b may have a T-shape. Alternatively, the non-recessed boundary portions may have, for example, an L-shape, an I-shape, or an E-shape.

[0088] The first waveguide flange 620 may have a ridged waveguide structure 640 dimensioned to implement a resonant stub (e.g., using the recess 662 and coupling recesses 666a, 666b). For example, the recess 662 may have a depth of at least essentially ¼ of a wavelength of the operating frequency of the waveguide flange 620. The operating frequency may be the center frequency (e.g., 38.5 GHz), a lower cutoff frequency (e.g., 24 GHz), an “upper cutoff” frequency (e.g., the frequency at which the waveguide begins to propagate one or more non-evanescent modes) (e.g., 53 GHz), or any frequency in between.

[0089] It should be noted that the first waveguide flange 620 may optionally be used in any of the antenna devices disclosed herein.

[0090] Figure 7A shows a schematic side view of an embodiment of an antenna arrangement 700 according to an embodiment of the invention, where a first waveguide flange 720 has a removable face structure 782 that includes a face 722 of the first waveguide flange 720. In Figure 7A, the face structure 782 is attached to a housing 780. The signal path from the antenna structure 710 to the opening in the face 722 is shown (schematically) by a dashed line.

[0091] Figure 7B shows a schematic side view of the antenna arrangement 700 of Figure 7A with the face structure 782 removed from the housing 780. The housing 780 has, for example, a waveguide including a first (e.g., tapered) opening forming the antenna structure 710 and a second opening that could (in principle) function as a first waveguide flange. However, when the face structure 782 is attached to the housing 780, the face structure 782 can function as at least a part of the first waveguide flange.

[0092] To designate the elements of antenna apparatus 700 having removable face structure 782, the second opening of housing 780 is referred to as first waveguide base flange 721, and first waveguide flange 720 has first waveguide base flange 721 and removable face structure 782. However, it should be noted that in the absence of removable face structure 782, first waveguide base flange 721 may be used as the first waveguide flange.

[0093] 7C shows a perspective view of face structure 782. Face structure 782 has a connecting surface 784 that faces antenna apparatus 700 when face structure 782 is attached to housing 780. Connecting surface 784 is opposite face 722 of face structure 782 (and opposite the "overall" face of the first blind-mate waveguide flange when face structure 782 is attached to housing 780) (where face 722 of the face structure forms the "overall" face of the blind-mate waveguide structure when face structure 782 is attached to housing 780).

[0094] Face structure 782 includes a plurality of holes 786. Holes 786 may be through holes 786a or blind holes 786b. The holes may be configured to receive protrusions (e.g., protrusions 572a, b, c, d) and / or to receive mounting elements (e.g., screws), for example, to mount face structure 782 to housing 780 or to mount face structure 782 to another waveguide flange.

[0095] The face structure 782 may include at least one of a ridged waveguide structure 740 and a choke structure (not visible in FIG. 7C because the choke structure is located on the face 722).

[0096] The face structure 782 may be at least partially plated (e.g., at least partially or entirely plated on the face 722 and / or other surfaces of the face structure 782). Optionally, the entire face structure 782 may be plated. The plating may, for example, include multiple layers (e.g., two, three, four, or more layers). The plating may, for example, include at least one of nickel and gold. The plating may, for example, include an (inner) gold layer and an (outer) nickel layer on the gold layer. The nickel layer may, for example, have a thickness (e.g., average thickness) of 0.5 μm to 10 μm, for example, 2 to 4 μm, for example, at least essentially 3 μm. The gold layer may, for example, have a gold thickness (e.g., average thickness) of 0.5 μm to 5 μm, for example, 1 μm to 3 μm, for example, at least essentially 1.5 μm. The nickel layer, for example, provides a barrier metal that improves wear resistance.

[0097] The face structure 782 can function as a connector saver to prevent or reduce contact damage when the first waveguide flange 720 is connected to another waveguide, providing a reliable interconnection for a large number of cycles (e.g., over one million cycles). The connector saver can be replaced in the event of excessive damage. This eliminates the need to replace the antenna device 700 or its connected waveguides, which are typically expensive components. Furthermore, eliminating the need to use special plating on the antenna device 700 or its connected waveguides helps reduce costs (e.g., because plating small face structures is generally cheaper than plating large antenna structures).

[0098] FIG. 8A shows a cross section taken by scanning electron microscope (SEM) of the plating on face structure 782 before it is used in repeated mating cycles.

[0099] FIG. 8B shows a cross section taken by (SEM) of the plating of face structure 782 after being used for over 1 million mating cycles.

[0100] In Figures 8A and 8B, the top image shows a conventional SEM image, the middle image shows the gold region detected by energy dispersive spectroscopy (EDS), and the bottom image shows the nickel region detected by EDS. Measuring the thickness of the gold and nickel layers using SEM images revealed that for fresh plating, the gold layer was 1.9 μm to 2.2 μm thick, and the nickel layer was 0.8 μm to 0.9 μm thick. After 1 million mating cycles, measurements from the SEM images showed that the gold layer was 1.5 μm to 2.4 μm thick, and the nickel layer was 0.8 μm to 0.9 μm thick.

[0101] As can be seen in Figures 8A and 8B, the plating on the face structure 782 maintains the separation of the gold and nickel layers essentially intact, even after over one million mating cycles. While the gold layer appears to vary in thickness more after mating cycles, its overall thickness does not significantly decrease. Therefore, the plating can be used for over one million cycles without significant degradation of the face structure 782. Figures 8A and 8B illustrate how the (increased) plating on the surface of a removable face structure (e.g., a connector saver) allows it to withstand over one million cycles of use with a good gold layer for contact.

[0102] The antenna arrangement described herein can be used in any device requiring coupling between an air interface and a waveguide. For example, the antenna arrangement can be used in automatic test equipment. However, other application areas are also feasible, such as applications in base stations, high frequency calibration equipment, etc.

[0103] FIG. 9 shows a cross-sectional schematic diagram of an automatic test equipment 902 .

[0104] Automatic test equipment (ATE) 902 includes an antenna apparatus 900 as described herein and a test fixture 980. The test fixture 980 includes a second blind-mating waveguide flange 991 configured to be coupled to the first waveguide flange 920 of the antenna apparatus 900, the second waveguide flange 991 having a ridged waveguide structure that mates with the ridged waveguide structure of the first waveguide flange 920.

[0105] The first waveguide flange 920 can be coupled to the second waveguide flange 991, thereby enabling electromagnetic wave coupling between the antenna structure 910 of the antenna device 900 and the second waveguide flange 991, and the coupling between the first and second waveguide flanges 920, 991 can be performed easily (due to the first blind mating interface) and over many cycles (e.g., due to the use of waveguide flanges that are relatively resistant to wear).

[0106] Such an automatic test equipment 902 can be used to serially couple multiple devices under test to a measuring instrument. The automatic test equipment 902 shown in FIG. 9 includes a signal source 992a and / or a measuring instrument 992b. The signal source 992a is configured to generate an electromagnetic wave (e.g., a microwave signal), and the measuring instrument 992b is configured to measure / analyze an electromagnetic wave (e.g., a microwave signal) in, for example, a millimeter wave range (e.g., 1 mm (i.e., 300 GHz) to 10 mm (i.e., 30 GHz), or 20 GHz to 60 GHz). Therefore, the measuring instrument 992b may be configured to measure an electromagnetic wave (signal) of the 5G standard, such as a signal in the FR2 band (or FR2 frequency range). Alternatively or additionally, the measuring instrument 992b may be configured to measure in the centimeter wave range (e.g., between 3 and 30 GHz) and / or the submillimeter wave range (e.g., 300 GHz to 1 THz).

[0107] The test fixture 980 may include a device under test socket 993 configured to electrically couple to a device under test 904. For example, the device under test may be or may include at least one of an antenna, an antenna in package (AIP), a radio-frequency integrated circuit (RFIC), a microchip, a printed circuit board, a radio-frequency identification (RFID) chip, a transceiver, a receiver, and user equipment (e.g., a mobile phone). Figure 9 shows an example of a device under test socket 993 configured to couple to an AIP device under test 904.

[0108] The device under test socket 993 may have one or more electrical contacts (e.g., in the form of pins) configured to electrically couple with the device under test 904. The device under test socket 993 may be configured to electrically couple to the device under test 904 when the device under test is placed in the device under test socket 993.

[0109] The device under test may be held in place, for example, by being disposed between the device under test socket 993 and the antenna apparatus 900, where the antenna apparatus 900 is pushed into the test fixture (e.g., by a handler) and / or attached to the test fixture (e.g., using a clamp). Alternatively or additionally, the antenna apparatus 900 may include, for example, a device coupling element 906 (shown schematically in FIG. 9 , but the actual implementation may vary) configured to hold or engage the device under test 904. The device coupling element 906 may have, for example, at least one of a suction opening (e.g., a suction cup), a magnet, and a clamp. The device coupling element 906 can pick up the device under test 904 and couple with it, for example, to dispose the device under test 904 on, in, or under the device under test socket 993.

[0110] Test fixture 980 may have different types of waveguides coupled between second waveguide flange 991 and signal source 992a and / or measurement device 992b. For example, the test fixture may have a waveguide-to-coaxial transition to couple second waveguide flange 991 and signal source 992a and / or measurement device 992b. Alternatively, the test fixture may have a rectangular (e.g., including a rectangular or square shape) waveguide (or waveguide portion) that terminates at (i.e., is directly coupled to) second waveguide flange 991. Test fixture 980 may further include a coaxial cable coupled to the rectangular waveguide (e.g., via a waveguide-to-coaxial transition).

[0111] A coaxial cable may be more compatible with common measuring instruments and have more flexible wiring compared to a rectangular waveguide, while a rectangular waveguide may be more compatible with second waveguide flange 992 and have better electrical properties (e.g., lower attenuation and better stability of properties) compared to a coaxial cable. Thus, test fixture 980 provides an improved compromise between compatibility and efficiency.

[0112] It should be noted that the automatic test equipment 902 and test fixture 980 may be optionally supplemented with any of the features, functions and details disclosed herein.

[0113] FIG. 10A is a perspective view of a waveguide-to-coaxial adapter 1030 of a test fixture (wherein the waveguide-to-coaxial adapter may optionally be used in test fixture 980 of FIG. 9). As seen in FIG. 10A, the waveguide-to-coaxial adapter 1030 has a second waveguide flange 1091 (which may, for example, correspond to second waveguide flange 991) and a coaxial connector 1031. However, the coaxial connector 1031 may be (or may have) any suitable type of radio frequency connector capable of operating in the desired frequency range. The coaxial connector 1031 may be a male connector or a female connector.

[0114] The second waveguide flange 1091 is coupled to the coaxial connector 1031. As a result, the waveguide-to-coaxial adapter 1030 shown in FIG. 10A forms a double-ridged waveguide-to-coaxial adapter that couples electromagnetic waves between the second waveguide flange 1091 and the coaxial connector 1031. The second waveguide flange 1091 shown in FIG. 10A has a double-ridged structure. However, the second waveguide flange 1091 may have a different ridged waveguide structure, such as a quad-ridged waveguide (e.g., particularly when the first waveguide flange also has a quad-ridged waveguide structure); for example, the waveguide-to-coaxial adapter may have two coaxial connectors to couple two polarizations in and out in the latter case.

[0115] FIG. 10B is a different perspective view of the waveguide-to-coax adapter 1030 of FIG. 10A . The second waveguide flange 1091 has a (second) blind-mate interface 1032. The (second) blind-mate interface 1032 of the second waveguide flange can be formed similarly to the (first) blind-mate interface of the first blind-mate waveguide flange. Thus, the second blind-mate interface 1032 may have, for example, a through hole and / or a blind hole that can support self-mating (blind-mate) alignment between the first and second waveguide flanges. Additionally or alternatively, the second blind-mate interface 1032 may include a protrusion, for example, a protrusion formed by a rod integrally formed with the second face 1033, attached to the second face 1033, or inserted (or threaded) into a through hole or blind hole in the second blind-mate interface 1032. The holes and / or protrusions may be holes and / or protrusions as described above (see, e.g., FIGS. 4-5D). The first blind-mating interface and the second blind-mating interface may be complementary. For example, the first blind-mating interface may include at least one hole configured to receive a protrusion of the second blind-mating interface, and / or vice versa. In other words, for example, the holes and protrusions of the first and second waveguide flanges may be complementary to each other.

[0116] FIG. 10C shows yet another perspective view of the waveguide-to-coax adapter 1030 of FIGS. 10A and 10B. In the example shown in FIG. 10C, the coaxial connector 1031, and thus its inner conductor (not shown in FIG. 10C), extends perpendicular to the axis of the waveguide of the second waveguide flange 1091. Furthermore, the inner conductor extends perpendicular to and penetrates the interior of the waveguide. As a result, the inner conductor extends inside the interior volume of the waveguide and functions, for example, as a coupling pin. However, a coupling loop could be used instead.

[0117] A waveguide-to-coax adapter (e.g., waveguide-to-coax adapter 1030 of FIGS. 10A-C) may have a housing including first and second housing portions. The first housing portion may include a recess also designated as a "first housing recess," and the second housing portion may include a housing recess also designated as a "second housing recess," where the first and second housing recesses form at least a portion of a waveguide extending toward (or feeding into) a second waveguide flange.

[0118] 11A, for example, is a perspective view of a waveguide-to-coaxial adapter 1130 having a first housing portion 1134A and a second housing portion 1134B. At least one of the first and second housing portions 1134A, B may be constructed of metal. Preferably, however, both housing portions may be constructed of metal.

[0119] The first housing portion 1134A includes a first recess 1135A, and the second housing portion 1134B includes a second recess 1135B, where the first and second recesses 1135A,B form the (double-ridged) waveguide of the waveguide-to-coax adapter, which is also designated hereinafter as the "adapter waveguide." In the example shown in FIG. 11A, the first and second recesses 1135A,B are at least essentially equal in size (ignoring the inverted orientation). In other words, the first surface of the first housing portion 1134A that faces and abuts the (second) surface of the second housing portion 1135A defines an imaginary plane that passes through the waveguide 1136 of the waveguide-to-coax adapter, where the imaginary plane in the example shown in FIG. 11A cuts the waveguide 1136 down the middle.

[0120] However, the imaginary plane may be located at other positions along the short inner surface of the (adapter) waveguide 1136. For example, the surface of the first housing may be aligned with the wide inner surface of the (adapter) waveguide 1136 at the side of the first or second housing portion 1134A,B, or may be aligned with the surface of a ridge of the (adapter) waveguide 1136.

[0121] The (adapter) waveguide 1136 (and optionally also the second waveguide flange 1191 as seen in FIG. 11A) may have a similar shape to the first waveguide flange. For example, the first and second waveguide flanges 1136 may both have dimensions as described with reference to FIG. 2A, such as widths a and Δw1 of 5.49 mm, heights b and Δh of 2.55 mm, ridge widths a1 and Δt of 1.37 mm, etc.

[0122] 11B is a perspective view of the first housing portion 1134A. In this example, the first housing portion 1134A includes a coaxial connector (not shown) and an inner conductor 1137.

[0123] The inner conductor 1137 extends perpendicular to the inner wide side of the (adapter) waveguide 1136. Furthermore, the inner conductor 1137 extends from a first ridge 1150a of the adapter waveguide 1136. The first ridge 1159a (and optionally a second ridge opposite the first ridge 1150a) may have a tapered shape, where the height of the first (and / or second) ridge increases in a direction from the second waveguide flange toward the inner conductor 1137. For example, the taper may have one, two, three, or more steps 1151a.

[0124] The inner conductor 1137 may have a conductor ring 1138. This ring may act as a fixing element for the inner conductor 1137 and / or may provide further tapering (e.g., in addition to the tapering of the first ridge 1150a).

[0125] Figure 12A shows a perspective view of the second housing portion 1134B. The second housing portion 1134B has a ridge recess 1139 configured to receive the tip (which optionally has a tapered end) of the inner connector 1137. As can be seen in Figure 12A, the second ridge 1150b may have a taper (e.g., in the form of a step 1151b).

[0126] The first and second housing recesses 1135a,b can be manufactured, for example, by milling and / or micro-machining, which is a time- and energy-efficient manufacturing process. For example, the first and second housing recesses 1135A,B can be at least partially milled using an end mill having a diameter of at least essentially 1 mm. As a result, the adapter waveguide can have rounded edges at the dimensions of the end mill.

[0127] The dimensions of the adapter waveguide 1136 may have a tolerance of, for example, 50 μm, or 30 μm, or 10 μm. More specifically, the tolerance of the width Δw1 of the (adapter) waveguide 1136 (e.g., the width of the opening, the diameter of the launch hole) may be ±0.05 mm. The tolerance of the width of the ridge Δt may be ±0.05 mm. The tolerance of the height Δh of the adapter waveguide may be ±0.05 mm.

[0128] Figure 12B shows a simulated return loss (RL) for a waveguide-to-coax adapter with a manufacturing tolerance of 50 μm or less. Note that, in practice, Figure 12B shows the magnitude (in decibels) of the reflection parameter, with negative decibel values ​​resulting in a return loss of over 20 dB for a target bandwidth of 24–53 GHz. While negative and positive values ​​are commonly used to define return loss, it is well understood in the field of scattering parameters that negative and positive values ​​can indicate the same return loss. In other words, an engineer familiar with the field of microwave engineering can properly interpret the numbers regardless of their actual sign.

[0129] It should be noted that the antenna device may have one or more housing portions. For example, the antenna device may have a first housing portion including the antenna structure and a first waveguide flange, and a second housing portion including at least a portion of a waveguide structure connecting the antenna structure and the first waveguide flange. The first and second housing portions may both include recesses that, when combined, form at least a portion of a waveguide connecting the antenna structure and the first waveguide flange.

[0130] Thus, the descriptions herein relating to the first and second housing portions of the waveguide to coaxial adapter (including dimensions and tolerances) are also applicable to, for example, the antenna apparatus.

[0131] The second waveguide flange, like the first waveguide flange, may have a removable second face structure that includes a second face of the second waveguide flange.

[0132] FIG. 13 shows a perspective view of an example of an antenna apparatus 1300 and a waveguide-to-coaxial adapter 1330, in which a first waveguide flange 1320 has a removable first face structure 1382 (e.g., as described above) and a second waveguide flange 1391 has a removable second face structure 1394 (e.g., as described above).

[0133] 7B , in the following, the opening of the housing of the antenna apparatus 1300 will be referred to as a first waveguide base flange 1321, and the first waveguide flange 1320 has a first waveguide base flange 1321 and a first removable face structure 1382. Furthermore, the opening of the (adapter) waveguide facing the second removable face structure 1394 will be referred to as a second waveguide base flange 1395, and the second waveguide flange 1391 has a second waveguide base flange 1395 and a second removable face structure 1394. However, in the absence of the respective removable face structures, the first waveguide base flange 1321 may be used as the first waveguide flange 1320, and the second waveguide base flange 1395 may be used as the second waveguide flange 1391.

[0134] The removable second face structure 1394 has a waveguide structure formed therein. The waveguide structures of the first and second waveguide flanges 1320, 1391 are configured to mate. As such, the first and second waveguide flanges 1320, 1391 may have at least essentially the same shape (e.g., the same waveguide dimensions). In particular, the waveguide structure of the first waveguide base flange 1321, the waveguide structure of the removable first face structure 1382, the waveguide structure of the removable second face structure 134, and the waveguide structure of the second waveguide base flange 1395 may have at least essentially the same shape (e.g., in the sense of having the same cross-section of the waveguide opening) (except for special structures that reduce discontinuities at the transitions, such as choke structures). Waveguide sections having at least essentially similar waveguide structures can form a continuous waveguide essentially without interruptions or steps. As a result, unintended reflections of electromagnetic waves can be reduced.

[0135] Alternatively, at least one of the first waveguide base flange 1321, the first removable face structure 1382, the second removable face structure 134, and the second waveguide base flange 1395 may have different shapes (e.g., waveguide openings). The different shapes can, for example, form steps that suppress transmission of unwanted frequencies (e.g., higher harmonics).

[0136] The removable first face structure 1382 has (or forms) a first blind-mating interface 1370, and the removable second face structure 1394 has (or forms) a second blind-mating interface 1332. At least one of the first and second blind-mating interfaces 1370, 1332 may have at least one of a protrusion and a recess. In the example shown in FIG. 13 , the first blind-mating interface 1370 has two protrusions 1372 a, b (e.g., provided in or adjacent to opposing corner regions of the waveguide opening). Additionally, the second blind-mating interface 1332 has (at least) two recesses (not shown in FIG. 13 ) configured to respectively receive one of the protrusions 1372 a, b.

[0137] However, the first blind-mate interface 1370 may, for example, have any other number of protrusions 1372 (e.g., 0, 1, 3, 4, or more protrusions), and the second blind-mate interface 1332 may, for example, have the same or more number of recesses. Alternatively or additionally, the second blind-mate interface 1332 may, for example, have one or more protrusions, and the first blind-mate interface 1370 may, for example, have the same or more number of recesses configured to receive the protrusions of the second blind-mate interface 1332.

[0138] The first waveguide base flange 1321 may, for example, have at least one protrusion (e.g., on a surface facing the first waveguide base flange 1321) that is received in a recess of the removable first face structure 1382. Alternatively or additionally, the removable first face structure 1382 may have at least one protrusion that is received in a recess of the first waveguide base flange. In the example shown in Figure 13, the first waveguide base flange 1321 has four protrusions (in addition to the shafts 1373a,b connected to the protrusions 1372a,b) that are received in four respective recesses of the removable first face structure 1382.

[0139] For example, at least one of the protrusions may be (or may have) a first screw (or bolt) 1396a or a part thereof (e.g., a screw head or a screw shank). The first screw 1396a may, for example, be threaded into a hole (e.g., a through-hole) that penetrates the housing of the antenna device 1300. The screw may, for example, be inserted into the through-hole from the side facing away from the removable first face structure 1382 (i.e., from the top in FIG. 13 ), extend through the housing of the antenna device 1300, and exit from the surface facing the removable first face structure 1382. The screw may be configured to attach the removable first face structure 1382 to the first waveguide base flange 1321. For this purpose, the removable first face structure 1382 may have one or more screw holes. In the example shown in Figure 13, the first waveguide flange 1320 has two (first) screws 1396aa, 1396ab, the heads of which are visible in Figure 14. However, any number of (first) screws may be used.

[0140] At least one of the protrusions may be integrally formed and attached to a surface of the removable first face structure 1382 (and / or the removable second face structure 1394). Alternatively, the removable first face structure 1382 may have blind or through holes configured to receive shafts that terminate within the protrusions. In the example shown in FIG. 13 , the removable first face structure 1382 has two holes that receive shafts 1373 a, b that terminate in protrusions 1372 a, b. The shafts 1373 a, b extend through the removable first face structure 1382 (e.g., to ensure precise alignment) and further extend toward the first waveguide base flange 1321. The first waveguide base flange 1321 has holes (e.g., in a surface surrounding the opening of the first waveguide base flange 1321) configured to receive the shafts 1373 a, b. The shaft may have a flat surface (e.g., for precise alignment) and may include an external thread (forming a second thread) configured to be screwed into a threaded hole in at least one of the first waveguide base flange 1321 and the removable first face structure 1382.

[0141] The second waveguide base flange 1395 has through holes (e.g., two or more through holes) extending through the plate of the second waveguide base flange 1395 and configured to receive third screws 1396c received in holes in the removable second face structure 1394. At least one of the second waveguide base flange 1395 and the removable second face structure 1394 may have threaded holes. For example, the second waveguide base flange 1395 may have through holes with a flat inner surface, and the removable second face structure 1394 may have threaded holes. The third screws 1396c are configured to attach the removable second face structure 1394 to the second waveguide base flange 1395. In the example shown in FIG. 13 , the second waveguide flange 1391 has two third screws 1396c, although other numbers of third screws 1396c may be used.

[0142] Alternatively or additionally, the second waveguide flange 1391 may have at least one fourth screw 1396d that is inserted into a through-hole in the removable second face structure 1394 from the side facing away from the second waveguide base flange 1395 and that exits from the removable second face structure 1394 on the side facing the second waveguide base flange 1395. In the example shown in FIG. 13 , the second waveguide flange 1391 has two fourth screws 1396da, 1396db, but other numbers of fourth screws 1396d may be used.

[0143] 14 shows a perspective view of the antenna apparatus 1300 and waveguide-to-coax adapter 1330 of FIG. 13 , with a first removable face structure 1382 attached to a first waveguide base flange 1321 and a second removable face structure 1394 attached to a second waveguide base flange 1395. This attachment may be achieved using at least one of first, second, third, and fourth screws 1396 a, 1372, 1396 c, and 1396 d. Alternatively or additionally, other fastening elements (e.g., at least one of a clamp, a magnet, and a suction cup) may be used.

[0144] FIG. 15 shows a perspective view of the antenna apparatus 1300 of FIGS. 13 and 14 and a waveguide-to-coaxial adapter 1330, in which the first waveguide flange 1320 is coupled to the second waveguide flange 1391.

[0145] The removable first and second face structures 1382, 1394 can be removed and replaced with new or refurbished versions of the first and second face structures 1382, 1394. The removable first and second face structures 1382, 1394 protect the housing of the antenna apparatus 1300 from wear caused by repeated mating of the first waveguide flange 1320 and the second waveguide flange 1391.

[0146] In this coupled configuration, the antenna apparatus 1300 and the waveguide-to-coaxial adapter 1330 form a continuous (or substantially continuous) path for transmission of electromagnetic signals from the antenna structure 1310 to the coaxial connector 1331 (where, for example, there may be several bends in the signal path and the transition between the first and second waveguide flanges may naturally have some imperfections). As a result, electromagnetic signals received at the antenna structure 1310 are transmitted to the coaxial connector 1331 and vice versa.

[0147] It should be noted that the antenna apparatus 1300 may have more than one first blind-mating waveguide flange.

[0148] The coaxial connector 1331 can be used to couple measurement equipment, such as a signal generator and / or automatic test equipment instruments, to the antenna arrangement 1300 .

[0149] 16 is a schematic diagram of automatic test equipment (ATE) 1602 including an antenna apparatus 1600, a waveguide-to-coaxial adapter 1630, and ATE equipment 1602. The ATE equipment 1602 has a coaxial connector (e.g., a female connector) connected to (or connectable to) the coaxial connector of the waveguide-to-coaxial adapter 1630. As a result, the ATE equipment 1602 can at least one of detect, measure, analyze, and process electromagnetic signals received at the antenna structure 1610. Alternatively or additionally, the ATE equipment can provide one or more signals to the antenna structure 1610.

[0150] FIG. 17 is a schematic flow diagram of a method for testing a device under test described herein.

[0151] The method includes, in step 1702, establishing a coupling between a device under test and an antenna apparatus, the antenna apparatus including an antenna structure and a first blind-mating waveguide flange coupled to the antenna structure, the first waveguide flange having a ridged waveguide structure including at least two ridges. The method further includes, in step 1704, coupling the first waveguide flange to a second blind-mating waveguide flange of an automatic test equipment. It should be noted that steps 1702 and 1704 can be performed substantially simultaneously or in any order.

[0152] Establishing a coupling between the device under test and the antenna arrangement may include placing the device under test in a test socket of automatic test equipment.

[0153] The method may further include electrically coupling the device under test to a test socket of the automatic test equipment. The test socket may, for example, be provided on or be part of the test fixture. The electrical coupling may include providing one or more electrical terminals of the device under test on pins of the test socket. It should be noted that the electrical coupling of the device under test may, for example, occur before steps 1702 and 1704, or may occur simultaneously with one or both of these steps 1702, 1704. For example, the device under test may be pressed into the test socket when coupling the antenna apparatus (i.e., the first waveguide flange) to the second waveguide flange.

[0154] The method may include transmitting a signal between the device under test and the automatic test equipment via at least the antenna structure, the first waveguide flange, and the second waveguide flange. Transmitting the signal may include, for example, causing the device under test to radiate electromagnetic waves, receiving the electromagnetic waves at the antenna structure, and transmitting the electromagnetic waves to the automatic test equipment via the first waveguide flange and the second waveguide flange. The method may include generating a control signal that causes the device under test to radiate the electromagnetic waves. The method may further include generating a measurement signal based on the electromagnetic waves received by the automatic test equipment. The method may further include processing the measurement signal, which may include at least one of filtering, amplifying, storing, and logging the measurement signal or a signal derived therefrom. Alternatively, or in addition, the signal may be provided to the antenna structure, in which case the signal is transmitted to the device under test via the antenna structure. A response of the device under test to the transmitted signal can then be used to derive test results.

[0155] The method may include recording a parameter indicative of a number of bonding processes between the first waveguide flange and the second waveguide flange. The method may include generating an output indicating that a threshold number of bonding processes have been completed. The output may include an indication that the removable first face structure needs to be replaced or will soon need to be replaced. The output may include an indication that the removable second face structure needs to be replaced or will soon need to be replaced.

[0156] The second waveguide flange may be depressible against a bias in a direction extending essentially perpendicular to a face of the second waveguide flange, and coupling the first waveguide flange to the second waveguide flange may include forcing a face of the first waveguide flange into a face of the second waveguide flange against the bias of the second waveguide flange, and attaching the antenna apparatus to a test fixture. The test fixture may include one or more clamps configured to engage the antenna apparatus by pressure applied to the one or more clamps by the antenna apparatus.

[0157] (Implementation method) Although some aspects have been described in the context of an apparatus, it will be apparent that these aspects also represent a description of a corresponding method, where a block or apparatus corresponds to a method step or feature of a method step. Similarly, aspects described in the context of a method step also represent a description of a corresponding block or item or feature of a corresponding apparatus.

[0158] Depending on particular implementation requirements, embodiments of the present invention can be implemented in hardware or software. Implementation may be performed using a digital storage medium, for example a floppy disk, DVD, CD, ROM, PROM, EPROM, EEPROM or FLASH memory, having electronically readable control signals stored thereon, which cooperates (or is capable of cooperating) with a programmable computer system so that the respective methods are performed.

[0159] Some embodiments of the present invention comprise data carriers having electronically readable control signals, which may cooperate with a programmable computer system to perform one of the methods described herein.

[0160] Generally, embodiments of the present invention may be implemented as a computer program product having program code operable to perform one of the methods when the computer program product is run on a computer. The program code may, for example, be stored on a machine-readable carrier.

[0161] In another embodiment the computer program for performing one of the methods described herein is stored on a machine readable carrier.

[0162] In other words, an embodiment of the inventive methods is, therefore, a computer program having a program code for performing one of the methods described herein, when the computer program runs on a computer.

[0163] A further embodiment of the inventive method is therefore a data carrier (or digital storage medium, or computer-readable medium) having recorded thereon a computer program for performing one of the methods described herein. The data carrier, digital storage medium, or recording medium is typically tangible and / or non-transitory.

[0164] A further embodiment of the inventive method is therefore a data stream or a sequence of signals representing the computer program for performing one of the methods defined herein, the data stream or sequence of signals may for example be adapted to be transferred via a data communication connection, such as the Internet.

[0165] A further embodiment comprises a processing means, for example a computer, or a programmable logic device, configured to or adapted to perform one of the methods defined herein.

[0166] A further embodiment comprises a computer having installed thereon the computer program for performing one of the methods described herein.

[0167] A further embodiment according to the invention comprises an apparatus or a system configured to transfer (e.g. electronically or optically) a computer program for performing one of the methods described herein to a receiver. The receiver may for example be a computer, a mobile device, a memory device, etc. The apparatus or system may for example comprise a file server for transferring the computer program to the receiver.

[0168] In some embodiments, a programmable logic device (e.g., a field programmable gate array) may be used to perform some or all of the functionality of the methods described herein. In some embodiments, a field programmable gate array may cooperate with a microprocessor to perform one of the methods described herein. In general, the methods are preferably performed by any hardware apparatus.

[0169] The apparatus described herein can be implemented using a hardware apparatus, or using a computer, or using a combination of a hardware apparatus and a computer.

[0170] The apparatus described herein, or any components of the apparatus described herein, may be implemented at least in part in hardware and / or software.

[0171] The methods described herein can be performed using a hardware apparatus, or using a computer, or using a combination of a hardware apparatus and a computer.

[0172] The above-described embodiments merely illustrate the principles of the present invention. It is understood that modifications and variations of the arrangements and details described herein will be apparent to those skilled in the art. It is therefore intended to be limited only by the scope of the following claims, and not by the specific details presented in the description and explanation of the embodiments herein.

Claims

1. 1. An antenna apparatus for establishing a wireless coupling with a device under test, comprising: an antenna structure; a first blind-mating waveguide flange coupled to the antenna structure; the first waveguide flange has a ridged waveguide structure including at least two ridges; Antenna device.

2. a face of the first waveguide flange having a choke structure; The antenna device according to claim 1 .

3. the inner waveguide structure of the first waveguide flange is surrounded by a recess in the face of the first waveguide flange; 3. The antenna device according to claim 1.

4. the inner waveguide structure of the first waveguide flange has a substantially rectangular cross section; the two ridges are provided on two opposite sides of a substantially rectangular cross section of the inner waveguide structure; and a boundary of the inner waveguide structure having coupling recesses in the region of two further sides of the substantially rectangular cross section of the inner waveguide structure to allow coupling between the inner waveguide structure and the recess surrounding the inner waveguide structure; The antenna device according to claim 3 .

5. the first waveguide flange has a removable face structure that includes a face of the first waveguide flange.

5. The antenna device according to claim 1.

6. the removable face structure is at least partially plated with at least one of nickel and gold; 6. The antenna device according to claim 5.

7. The plating includes a gold layer having a thickness in the range of 1.5 μm to 2.5 μm and a nickel layer having a thickness in the range of 0.5 μm to 1.2 μm.

7. The antenna device according to claim 6.

8. the first waveguide flange has a substantially rectangular cross-section including two wide inner surfaces and two narrow inner surfaces narrower than the wide inner surfaces; the first and second ridges of the ridged waveguide structure extend toward each other from the large inner surface; 8. An antenna device according to claim 1.

9. the narrow inner surface has a width in the range of 2.4 mm to 2.7 mm, or in the range of 2.5 mm to 2.6 mm; the wide inner surface has a width in the range of 5.3 mm to 5.7 mm, or in the range of 5.4 mm to 5.6 mm, or in the range of 5.44 mm to 5.54 mm; the width of the gap between the first ridge and the second ridge is in the range of 1.0 mm to 1.2 mm, or in the range of 1.04 mm to 1.14 mm; the width of the first ridge and the second ridge is in the range of 1.3 mm to 1.5 mm, or in the range of 1.32 mm to 1.42 mm; 9. The antenna device according to claim 8.

10. the ratio of the width of the wide inner surface to the width of the narrow inner surface is 2.15 with a tolerance of ±10%; the ratio of the width of the wide inner surface to the width of the spacing between the first ridge and the second ridge is 5.04 with a tolerance of ±10%; the ratio of the width of the wide inner surface to the width of the first ridge and the width of the second ridge is 4.01 with a tolerance of ±10%; 10. The antenna device according to claim 8 or 9.

11. the first waveguide flange has a substantially rectangular cross-section including four interior surfaces; the ridged waveguide structure has four ridges; each of the four ridges extending from a respective one of the four inner surfaces toward a central axis of the first waveguide flange; 8. An antenna device according to claim 1.

12. the inner surface has a width in the range of 5.1 mm to 5.3 mm, or in the range of 5.15 mm to 5.25 mm; each of the four ridges extends toward a central axis of the ridged waveguide structure within a range of 0.9 mm to 1.1 mm, or within a range of 0.95 mm to 1.05 mm; each of the four ridges has a width in the range of 1.1 mm to 1.3 mm, or in the range of 1.15 mm to 1.25 mm; The antenna device according to claim 11.

13. the inner surfaces have equal widths with a tolerance of ±10% or a tolerance of ±5%; the ratio of the maximum distance between a first pair of opposing inner surfaces to the radial extension of ridges on said first pair of inner surfaces is 5.2 mm with a tolerance of ±10% or a tolerance of ±5%; the ratio of the maximum distance between a second pair of opposing inner surfaces to the radial extension of ridges on said inner surfaces of said second pair of inner surfaces is 5.2 mm with a tolerance of ±10 or pf ±5%; the ratio of the width of each ridge to the width of each inner surface on which said ridge is provided is 0.23 mm with a tolerance of ±10% or ±5%; 13. The antenna device according to claim 11 or 12.

14. the antenna structure is a dual polarized antenna structure; the antenna device is configured such that a first propagation mode of the ridged waveguide structure is coupled primarily with a first polarization of the dual polarized antenna structure, and a second propagation mode of the ridged waveguide structure is coupled primarily with a second polarization of the dual polarized antenna structure that is different from the first polarization; 14. An antenna device according to any one of claims 11 to 13.

15. an antenna device according to any one of claims 1 to 14; a test fixture having a second blind-mating waveguide flange configured to be coupled with the first waveguide flange of the antenna device; the second waveguide flange has a ridged waveguide structure that mates with the ridged waveguide structure of the first waveguide flange. Automatic test equipment.

16. the second waveguide flange is depressible against a bias extending essentially perpendicular to a face of the second waveguide flange; 16. The automatic test equipment of claim 15.

17. the second waveguide flange is mounted so as to float; 17. Automatic test equipment according to claim 15 or 16.

18. the test fixture having a device under test socket configured to electrically couple to the device under test; 18. Automatic test equipment according to any one of claims 15 to 17.

19. the second waveguide flange has a removable face structure that includes a face of the second waveguide flange.

19. Automatic test equipment according to any one of claims 15 to 18.

20. the removable face structure is at least partially plated with at least one of nickel and gold; Automatic test equipment according to one of claims 15 to 19.

21. the second waveguide flange has a substantially rectangular cross-section including two wide inner surfaces and two narrow inner surfaces narrower than the wide inner surfaces; the first and second ridges of the ridged waveguide structure extend toward each other from the large inner surface; 21. Automatic test equipment according to any one of claims 15 to 20.

22. the second waveguide flange has a substantially rectangular cross-section including four interior surfaces; the ridged waveguide structure of the second waveguide flange has four ridges; each of the four ridges extending from a respective one of the four inner surfaces toward a central axis of the first waveguide flange; 21. A waveguide structure according to any one of claims 15 to 20.

23. the automatic test equipment includes a waveguide-to-coaxial adapter coupled to the second blind-mate waveguide flange, the waveguide-to-coaxial adapter establishing a connection between an ATE device and the second blind-mate waveguide flange; Automatic test equipment according to one of claims 15 to 22.

24. 1. A method for testing a device under test, comprising: The method comprises: establishing a coupling between the device under test and automatic test equipment using an antenna apparatus, the antenna apparatus comprising: an antenna structure; and a first blind-mating waveguide flange coupled to the antenna structure, the first waveguide flange having a ridged waveguide structure including at least two ridges; and coupling the first waveguide flange to a second blind-mate waveguide flange of an automatic test equipment. method.

25. further comprising electrically coupling the device under test to a test socket of the automatic test equipment.

25. The method of claim 24.

26. transmitting signals between the device under test and the automatic test equipment via at least the antenna structure, the first waveguide flange, and the second waveguide flange.

26. The method of claim 24 or 25.

27. the second waveguide flange is depressible against a bias extending essentially perpendicular to a face of the second waveguide flange; Coupling the first waveguide flange to the second waveguide flange comprises: forcing a face of the first waveguide flange into a face of the second waveguide flange against a bias of the second waveguide flange; and attaching the antenna device to the test fixture.

28. The method of any one of claims 25 to 27.

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