Dielectric ceramic composition and multilayer ceramic capacitor including the same
A dielectric ceramic composition with BaTiO3, Dy, and Nd addresses reliability issues in miniaturized capacitors by optimizing neodymium content, ensuring high dielectric constant and insulation resistance for ultra-compact, high-capacity capacitors.
Patent Information
- Application Number
- JP2020016923
- Authority / Receiving Office
- JP · JP
- Patent Type
- Patents
- Current Assignee / Owner
- Priority Date
- 2019-06-14
- Filing Date
- 2020-02-04
- Publication Date
- 2025-01-15
- Estimated Expiration
- 2040-02-04
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Figure 0007613681000002 
Figure 0007613681000003 
Figure 0007613681000004
Abstract
Description
[Technical field]
[0001] The present invention relates to a dielectric ceramic composition capable of improving reliability and a multilayer ceramic capacitor including the same. [Background technology]
[0002] In general, electronic components using ceramic materials, such as capacitors, inductors, piezoelectric elements, varistors, or thermistors, comprise a ceramic body made of a ceramic material, an internal electrode formed inside the body, and an external electrode arranged on the surface of the ceramic body so as to be connected to the internal electrode.
[0003] Recently, as electronic products become smaller and more multifunctional, chip components are also becoming smaller and more functional. This has created a demand for multilayer ceramic capacitors that are small in size and have a large capacitance.
[0004] One way to achieve both miniaturization and high capacitance in multilayer ceramic capacitors is to reduce the thickness of the internal dielectric layers and electrode layers and stack a large number of them. Currently, the thickness of the dielectric layer is about 0.6 μm, and development is ongoing to make it thinner.
[0005] In this situation, ensuring the reliability of the dielectric layer has emerged as a major issue for dielectric materials. At the same time, the increase in insulation resistance deterioration defects of the dielectrics and the difficulty of quality and yield management have become important issues.
[0006] In order to solve these problems, a new method is required that can ensure high reliability not only in terms of the structure of the multilayer ceramic capacitor, but also in terms of the dielectric composition in particular.
[0007] If a dielectric composition capable of raising the reliability level one step further from the current level could be secured, it would be possible to manufacture multilayer ceramic capacitors with even thinner layers. Summary of the Invention [Problem to be solved by the invention]
[0008] The present invention relates to a dielectric ceramic composition capable of improving reliability and a multilayer ceramic capacitor including the same. [Means for solving the problem]
[0009] One embodiment of the present invention is BaTiO 3 The present invention provides a dielectric ceramic composition that includes a matrix main component and subcomponents, the subcomponents including dysprosium (Dy) and neodymium (Nd) as a first subcomponent, and the content of the neodymium (Nd) is less than 0.699 mol % relative to 100 mol % of titanium (Ti) in the matrix main component.
[0010] Another embodiment of the present invention provides a ceramic body having a dielectric layer, the ceramic body including a first internal electrode and a second internal electrode disposed to face each other with the dielectric layer therebetween, a first external electrode disposed outside the ceramic body and electrically connected to the first internal electrode, and a second external electrode electrically connected to the second internal electrode, the dielectric layer including dielectric grains including a dielectric ceramic composition, the dielectric ceramic composition being BaTiO 3 The present invention provides a multilayer ceramic capacitor that includes a base material main component and subcomponents, the subcomponents including dysprosium (Dy) and neodymium (Nd) as a first subcomponent, and a content of the neodymium (Nd) is less than 0.699 mol % relative to 100 mol % of titanium (Ti) in the base material main component. Effect of the Invention
[0011] According to one embodiment of the present invention, the dielectric ceramic composition contained in the dielectric layer in the ceramic body contains neodymium (Nd), which is a new rare earth element, as an auxiliary component, and by controlling the content of neodymium (Nd), it is possible to ensure a high dielectric constant and improve reliability such as improving insulation resistance. [Brief description of the drawings]
[0012] [Figure 1] 1 is a schematic perspective view showing a multilayer ceramic capacitor according to an embodiment of the present invention; [Diagram 2] 2 is a cross-sectional view taken along line II' in FIG. [Diagram 3] 1 is a graph showing IV curve results according to an embodiment of the present invention and a comparative example. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS
[0013] Hereinafter, preferred embodiments of the present invention will be described with reference to the accompanying drawings. However, the embodiments of the present invention can be modified into various other forms, and the scope of the present invention is not limited to the embodiments described below. Furthermore, the embodiments of the present invention are provided to more completely explain the present invention to those having average knowledge in the art. Therefore, the shapes and sizes of elements in the drawings may be enlarged or reduced (or highlighted or simplified) for clearer explanation, and elements indicated by the same reference numerals in the drawings are the same elements.
[0014] FIG. 1 is a schematic perspective view showing a multilayer ceramic capacitor according to an embodiment of the present invention, and FIG. 2 is a cross-sectional view taken along line II' of FIG.
[0015] 1 and 2, a multilayer ceramic capacitor 100 according to an embodiment of the present invention includes a ceramic body 110 having a dielectric layer 111 and including a first internal electrode 121 and a second internal electrode 122 arranged to face each other with the dielectric layer 111 therebetween, a first external electrode 131 arranged on the outside of the ceramic body 110 and electrically connected to the first internal electrode 121, and a second external electrode 132 electrically connected to the second internal electrode 122.
[0016] In the multilayer ceramic capacitor 100 according to an embodiment of the present invention, the "length direction" is defined as the "L" direction in Fig. 1, the "width direction" is defined as the "W" direction, and the "thickness direction" is defined as the "T" direction. Here, the "thickness direction" can be used in the same concept as the direction in which the dielectric layers are stacked, i.e., the "stacking direction".
[0017] The shape of the ceramic body 110 is not particularly limited, but may be a hexahedron as shown in the drawing.
[0018] A plurality of internal electrodes 121 and 122 formed inside the ceramic body 110 have one end exposed to one surface of the ceramic body or the other surface opposite to the one surface.
[0019] The internal electrodes 121 and 122 may be paired with a first internal electrode 121 and a second internal electrode 122 having different polarities.
[0020] One end of the first internal electrode 121 may be exposed to one surface of the ceramic body, and one end of the second internal electrode 122 may be exposed to the other surface opposite the one surface.
[0021] First and second external electrodes 131 and 132 may be formed on one surface and the other surface facing the one surface of the ceramic body 110 and may be electrically connected to the internal electrodes.
[0022] The material for forming the first and second internal electrodes 121, 122 is not particularly limited, and the first and second internal electrodes 121, 122 may be formed using a conductive paste containing one or more of silver (Ag), lead (Pb), platinum (Pt), nickel (Ni), and copper (Cu), for example.
[0023] The first and second external electrodes 131, 132 may be electrically connected to the first and second internal electrodes 121, 122 to form a capacitance, and the second external electrode 132 may be connected to a different potential than the first external electrode 131.
[0024] The conductive material contained in the first and second external electrodes 131, 132 is not particularly limited, but may be nickel (Ni), copper (Cu), or an alloy thereof.
[0025] The thickness of the first and second external electrodes 131, 132 can be appropriately determined depending on the application and is not particularly limited, and may be, for example, 10 to 50 μm.
[0026] According to an embodiment of the present invention, the material for forming the dielectric layer 111 is not particularly limited as long as it can obtain a sufficient capacitance. For example, barium titanate (BaTiO 3 ) powder.
[0027] The material forming the dielectric layer 111 is barium titanate (BaTiO 3 Depending on the object of the present invention, various additives, organic solvents, plasticizers, binders, dispersants, etc. may be added to the powder such as cellulose acetate.
[0028] The dielectric layers 111 are in a sintered state, and may be integrated to such an extent that the boundaries between adjacent dielectric layers cannot be recognized.
[0029] First and second internal electrodes 121 and 122 may be formed on the dielectric layer 111, and the internal electrodes 121 and 122 may be formed inside the ceramic body by sintering with one dielectric layer sandwiched therebetween.
[0030] The thickness of the dielectric layer 111 can be changed as desired depending on the capacitance design of the capacitor. In one embodiment of the present invention, the thickness of the dielectric layer after firing may preferably be 0.4 μm or less per layer.
[0031] Moreover, the thickness of the first and second internal electrodes 121, 122 after firing may preferably be 0.4 μm or less per layer.
[0032] According to an embodiment of the present invention, the dielectric layer 111 includes dielectric grains containing a dielectric ceramic composition, and the dielectric ceramic composition is BaTiO 3 The alloy includes a base material main component and subcomponents, and the subcomponents include dysprosium (Dy) and neodymium (Nd) as a first subcomponent, and the content of the neodymium (Nd) is less than 0.699 mol % relative to 100 mol % of titanium (Ti) in the base material main component.
[0033] Recently, in order to develop ultra-small, large-capacity multilayer ceramic capacitors, BaTiO 3 It is currently necessary to develop a dielectric composition that can improve domain wall mobility and achieve a high dielectric constant when forming the same grain size in the main component of the matrix.
[0034] For this reason, there is a research result that when a donor-type dopant composition is applied, the concentration of the pinning source in the lattice decreases, and the movement between the domain walls becomes easier.
[0035] To this end, we aimed to develop a dielectric composition that can minimize lattice mismatching and achieve high dielectric properties by applying Ba, one of the various known donor-type dopants, and an additive with the most similar ion size.
[0036] In addition, in general, when the content of a donor-type additive is increased, the insulation resistance (IR) decreases and it becomes difficult to ensure reduction resistance, so we tried to select an appropriate content ratio.
[0037] Dysprosium (Dy) is the most commonly used donor-type dopant that has an effect on improving the dielectric constant and reliability of multilayer ceramic capacitors. By appropriately adjusting the content of this donor-type dopant and acceptor-type dopant, the required dielectric properties and reliability can be achieved.
[0038] In the present invention, a dielectric composition containing neodymium (Nd) as a rare earth element having a valence of +3 or more is invented, which can chemically suppress the generation of oxygen vacancies or reduce the concentration of defects in the dielectric composition.
[0039] Neodymium (Nd) element has an ionic radius intermediate between Ba element, which is the main component, and Dy element, which is a donor-type dopant, so it can be effectively substituted at the site of Ba element and be dissolved in solid solution.
[0040] In one embodiment of the present invention, dysprosium (Dy) and neodymium (Nd) elements, which exhibit stable dielectric properties, are used and an optimal content ratio is selected to ensure high dielectric constant and excellent reliability.
[0041] According to one embodiment of the present invention, the dielectric ceramic composition is BaTiO 3 The alloy includes a base material main component and subcomponents, and the subcomponents include dysprosium (Dy) and neodymium (Nd) as a first subcomponent, and the content of the neodymium (Nd) is less than 0.699 mol % relative to 100 mol % of titanium (Ti) in the base material main component.
[0042] By adjusting the content of the neodymium (Nd) to less than 0.699 mol % relative to 100 mol % titanium (Ti) among the main components of the base material, a high dielectric constant can be ensured, and reliability can be improved, such as by improving insulation resistance.
[0043] In particular, according to an embodiment of the present invention, the content of neodymium (Nd) may satisfy 0.233 mol %≦Nd≦0.466 mol % with respect to 100 mol % of titanium (Ti) among the main components of the matrix.
[0044] When the content of the neodymium (Nd) satisfies 0.233 mol%≦Nd≦0.466 mol% relative to 100 mol% of titanium (Ti) among the main components of the base material, high dielectric properties can be obtained and excellent reliability improvement effects such as improved insulation resistance can be achieved.
[0045] According to one embodiment of the present invention, the dielectric layer in the ceramic body contains a dielectric ceramic composition including rare earth elements dysprosium (Dy) and neodymium (Nd) as minor components, and the content of dysprosium (Dy) and neodymium (Nd) is controlled to ensure higher dielectric properties and improve reliability such as improved insulation resistance.
[0046] When the content of neodymium (Nd) is less than 0.233 mol % relative to 100 mol % of titanium (Ti) among the main components of the base material, the effect of increasing the dielectric constant is not as great as that of a conventional material containing only dysprosium (Dy).
[0047] Furthermore, if the content of neodymium (Nd) exceeds 0.466 mol % relative to 100 mol % of titanium (Ti) among the main components of the base material, a decrease in insulation resistance due to semiconductor formation may occur.
[0048] According to an embodiment of the present invention, the total content of dysprosium (Dy) and neodymium (Nd) may be 1.0 mol % or less with respect to 100 mol % of titanium (Ti) among the main components of the matrix.
[0049] Generally, the higher the total rare earth content, the more advantageous it is from the viewpoint of reliability. However, since the temperature characteristics are significantly reduced as Tc moves to room temperature, it is preferable to adjust the above dysprosium (Dy) and neodymium (Nd) contents to 1.0 mol % or less relative to 100 mol % of titanium (Ti), which is the main component of the base material.
[0050] If the content of dysprosium (Dy) and neodymium (Nd) exceeds 1.0 mol % relative to 100 mol % of titanium (Ti) among the main components of the base material, there is a possibility that temperature characteristics such as the temperature coefficient of capacitance (TCC) may decrease.
[0051] According to an embodiment of the present invention, the first subcomponent further includes an oxide or carbonate containing lanthanum (La), and the lanthanum (La) may be disposed at grain boundaries of the dielectric grains.
[0052] On the other hand, when a rare earth element having a larger ionic radius than dysprosium (Dy), such as lanthanum (La), is used, it can more effectively substitute the Ba site, and therefore is more effective in reducing the defect concentration of oxygen vacancies.
[0053] Therefore, in order to improve reliability, the concentration of oxygen vacancy defects is minimized, and lanthanum (La) can be further included as a first minor component in order to ensure insulation resistance.
[0054] However, if the lanthanum (La) content is too high, there is a problem that the insulation resistance drops rapidly due to excessive semiconductivity. Therefore, the lanthanum (La) content is preferably 0.233 mol % or more and 0.699 mol % or less relative to 100 mol % of titanium (Ti) among the main components of the base material.
[0055] As described above, the multilayer ceramic capacitor 100 according to an embodiment of the present invention is characterized in that, in an ultra-compact, large-capacity product, the thickness of the dielectric layer 111 is 0.4 μm or less, and the thickness of the first and second internal electrodes 121, 122 is 0.4 μm or less, but is not necessarily limited thereto.
[0056] In addition, the size of the multilayer ceramic capacitor 100 may be 1005 (length×width, 1.0 mm×0.5 mm) or less.
[0057] That is, since the multilayer ceramic capacitor 100 according to an embodiment of the present invention is an ultra-compact, high-capacity product, the dielectric layer 111 and the first and second internal electrodes 121, 122 are made of a thin film that is thinner than that of conventional products. In the case of products to which such thin dielectric layers and internal electrodes are applied, research into improving reliability such as insulation resistance is a very important issue.
[0058] That is, in the case of the conventional multilayer ceramic capacitor, since the dielectric layers and the internal electrodes included in the multilayer ceramic capacitor according to the embodiment of the present invention are relatively thicker than those included in the multilayer ceramic capacitor according to the embodiment of the present invention, even if the composition of the dielectric ceramic composition is the same as that of the conventional multilayer ceramic capacitor, there has been no significant problem in reliability.
[0059] However, in a product in which a thin dielectric layer and an internal electrode are applied, such as in one embodiment of the present invention, the reliability of the multilayer ceramic capacitor is important, and therefore, it is necessary to adjust the composition of the dielectric ceramic composition.
[0060] That is, in one embodiment of the present invention, as the first sub-component, it contains dysprosium (Dy) and neodymium (Nd), and the content of the above neodymium (Nd) is adjusted to be less than 0.699 mol% with respect to 100 mol% of titanium (Ti) in the base material main component. In particular, by adjusting the content of the above neodymium (Nd) to satisfy 0.233 mol% ≤ Nd ≤ 0.466 mol% with respect to 100 mol% of titanium (Ti) in the base material main component, even in the case of a thin film with a thickness of the dielectric layer 111 of 0.4 μm or less, the reliability such as improvement of insulation resistance can be improved.
[0061] However, the above thin film does not mean that the thicknesses of the dielectric layer 111 and the first and second internal electrodes 121 and 122 are 0.4 μm or less, and it is better to understand it as a concept including a dielectric layer and internal electrodes with a thickness thinner than that of conventional products.
[0062] Hereinafter, each component of the dielectric ceramic composition according to one embodiment of the present invention will be described more specifically.
[0063] a) Base material main component The dielectric ceramic composition according to one embodiment of the present invention can include a base material main component represented by BaTiO 3 .
[0064] According to one embodiment of the present invention, the above base material main component is BaTiO 3 , (Ba 1-x Ca x )(Ti 1-y Ca y )O 3 (where x is 0 ≤ x ≤ 0.3, y is 0 ≤ y ≤ 0.1), (Ba 1-x Ca x )(Ti 1-y Zr y )O 3 (where x is 0 ≤ x ≤ 0.3, y is 0 ≤ y ≤ 0.5), and Ba(Ti 1-y Zr y )O 3 (where 0 < y ≤ 0.5), and includes one or more selected from the group consisting of, but is not necessarily limited thereto.
[0065] The dielectric ceramic composition according to an embodiment of the present invention may have a room temperature dielectric constant of 2000 or more.
[0066] The main component of the matrix is not particularly limited, but the average particle size of the main component powder may be 40 nm or more and 150 nm or less.
[0067] b) First subcomponent According to one embodiment of the present invention, the dielectric ceramic composition necessarily contains dysprosium (Dy) and neodymium (Nd) as first minor component elements, and may further contain 0.233 mol % to 0.699 mol % of lanthanum (La) oxide or carbonate relative to 100 mol % of titanium (Ti) among the main components of the matrix.
[0068] In one embodiment of the present invention, the first subcomponent plays a role in preventing a decrease in reliability of a multilayer ceramic capacitor to which the dielectric ceramic composition is applied.
[0069] If the content of lanthanum (La) is less than 0.233 mol%, there is no effect of improving the dielectric constant, and if it exceeds 0.699 mol%, there is a possibility that the insulation resistance may decrease or the problem of a decrease in the dielectric loss (Dissipation Factor, Df) may occur.
[0070] According to one embodiment of the present invention, the first minor component includes dysprosium (Dy) and neodymium (Nd), and the content of the neodymium (Nd) is adjusted to be less than 0.699 mol% relative to 100 mol% of titanium (Ti) among the main components of the base material. In particular, the content of the neodymium (Nd) is adjusted to satisfy 0.233 mol%≦Nd≦0.466 mol% relative to 100 mol% of titanium (Ti) among the main components of the base material. This makes it possible to improve reliability, such as by improving insulation resistance, even when the dielectric layer 111 is a thin film having a thickness of 0.4 μm or less.
[0071] When the content of neodymium (Nd) is less than 0.233 mol % relative to 100 mol % of titanium (Ti) among the main components of the base material, the effect of increasing the dielectric constant is not as great as that of the conventional material containing only dysprosium (Dy).
[0072] If the content of neodymium (Nd) exceeds 0.466 mol % relative to 100 mol % of titanium (Ti) among the main components of the base material, a decrease in insulation resistance due to semiconductor formation may occur.
[0073] c) Second subcomponent According to an embodiment of the present invention, the dielectric ceramic composition may include, as a second minor component, an oxide or carbonate containing at least one of Mn, V, Cr, Fe, Ni, Co, Cu, and Zn.
[0074] As the second subcomponent, an oxide or carbonate containing at least one of Mn, V, Cr, Fe, Ni, Co, Cu, and Zn may be contained in an amount of 0.1 to 2.0 mol per 100 mol of the main component of the base material.
[0075] The second subcomponent serves to lower the firing temperature of the multilayer ceramic capacitor to which the dielectric ceramic composition is applied and to improve the high temperature withstand voltage characteristics.
[0076] The content of the second subcomponent and the contents of the third to sixth subcomponents described below refer to the amounts contained per 100 moles of the base powder, and can be specifically defined as the moles of metal ions contained in each subcomponent.
[0077] If the content of the second subcomponent is less than 0.1 mol, the firing temperature becomes high and the high-temperature voltage resistance characteristics may be slightly deteriorated.
[0078] Furthermore, if the content of the second subcomponent is 2.0 moles or more, the high-temperature withstand voltage characteristics and room-temperature resistivity may decrease.
[0079] In particular, the dielectric ceramic composition according to one embodiment of the present invention may contain a second subcomponent having a content of 0.1 to 2.0 mol per 100 mol of the main matrix component, which allows low-temperature firing and high high-temperature withstand voltage characteristics.
[0080] d) Third subcomponent According to an embodiment of the present invention, the dielectric ceramic composition may include a third subcomponent which is an oxide or carbonate containing Mg, which is a fixed-valence acceptor element.
[0081] The fixed-valence acceptor element Mg may contain 0.001 to 0.5 mol of a third subcomponent per 100 mol of titanium (Ti) among the main components of the matrix.
[0082] The third minor component is a fixed-valence acceptor element or a compound containing the same, and acts as an acceptor to reduce the concentration of electrons. By adding 0.001 to 0.5 mol of Mg, the fixed-valence acceptor element of the third minor component, to 100 mol of titanium (Ti) of the main component of the matrix, the reliability improvement effect due to the n-type can be maximized.
[0083] If the content of the third subcomponent exceeds 0.5 moles per 100 moles of titanium among the main components of the base material, this is not preferable because it causes a problem of a low dielectric constant.
[0084] However, according to one embodiment of the present invention, it is preferable to add 0.5 moles of the third subcomponent to 100 moles of titanium (Ti) in order to maximize the effect of improving reliability by making the material n-type; however, this is not necessarily limited to this amount, and the third subcomponent may be added in an amount of 0.5 moles or less or slightly more than 0.5 moles.
[0085] e) Fourth subcomponent According to an embodiment of the present invention, the dielectric ceramic composition may include, as a fourth subcomponent, an oxide containing at least one of Si and Al, or a glass compound containing Si.
[0086] The dielectric ceramic composition may further contain 0.0 to 4.0 moles of a fourth subcomponent which is an oxide containing at least one of Si and Al, or a glass compound containing Si, relative to 100 moles of the base material main component.
[0087] The content of the fourth minor component may be based on the content of at least one of Si and Al contained in the fourth minor component, regardless of the added form such as glass, oxide, or carbonate.
[0088] The fourth subcomponent serves to lower the firing temperature of the multilayer ceramic capacitor to which the dielectric ceramic composition is applied, and to improve the high-temperature withstand voltage characteristics.
[0089] If the content of the fourth subcomponent exceeds 4.0 moles per 100 moles of the main component of the matrix, it is not preferable because it reduces sinterability and density and causes problems such as the generation of secondary phases.
[0090] In particular, according to one embodiment of the present invention, the dielectric ceramic composition contains Al in an amount of 4.0 mol or less, which makes it possible to uniformly control grain growth, and is effective in improving voltage resistance characteristics and reliability, and also improves DC-bias characteristics.
[0091] The present invention will be described in more detail below with reference to examples and comparative examples. However, these are intended to aid in the specific understanding of the invention, and the scope of the present invention is not limited to these examples. EXAMPLES
[0092] (Example) An embodiment of the present invention is barium titanate (BaTiO 3Additives such as Dy, Nd, La, Al, Mg, Mn, etc., a binder, and an organic solvent such as ethanol are added to a dielectric raw material powder containing a ZnO powder, and the mixture is wet-mixed to provide a dielectric slurry. The dielectric slurry is then applied to a carrier film and dried to provide a ceramic green sheet, thereby forming a dielectric layer.
[0093] At this time, the additive elements were added in a monodispersed state so that the size ratio of all the additive elements was 40% or less relative to the barium titanate.
[0094] In particular, the content of dysprosium (Dy) and neodymium (Nd) among the added rare earth elements was set to 1.0 mol or less per 100 mol of titanium (Ti) among the main components of the base material.
[0095] Of the above examples, Example 1 was produced by adding 0.699 mol % of dysprosium (Dy) and 0.233 mol % of neodymium (Nd), and Example 2 was produced by adding 0.466 mol % of dysprosium (Dy) and 0.466 mol % of neodymium (Nd).
[0096] The ceramic green sheet can be produced by mixing ceramic powder, a binder, and a solvent to prepare a slurry, and then forming the slurry into a sheet having a thickness of several μm using a doctor blade method.
[0097] Next, a conductive paste for the internal electrodes containing 40 to 50 parts by weight of nickel powder having an average nickel particle size of 0.1 to 0.2 μm can be provided.
[0098] The conductive paste for the internal electrodes was applied onto the green sheets by a screen printing method to form internal electrodes, and the green sheets on which the internal electrode patterns were arranged were laminated to form a laminate, and then the laminate was compressed and cut.
[0099] The cut laminate was then heated to remove the binder and then fired at high temperature in a reducing atmosphere to form the ceramic body.
[0100] In the above firing process, a reducing atmosphere (0.1% H 2 / 99.9% N 2 , H 2 O / H 2 / N 2 After baking for 2 hours at 1100-1200°C in nitrogen (N 2 The sample was then heat-treated for 3 hours under an oxidizing atmosphere.
[0101] Next, the fired ceramic body was subjected to a termination process using copper (Cu) paste and then fired to form external electrodes.
[0102] Moreover, the dielectric layer 111 and the first and second internal electrodes 121, 122 inside the ceramic body 110 were manufactured so as to have a thickness of 0.4 μm or less after firing.
[0103] Comparative Example 1 Comparative Example 1 is a conventional case in which 0.932 mol % of dysprosium (Dy) is added to 100 mol % of titanium (Ti) among the main components of the base material, and the other manufacturing processes are the same as those of the above-mentioned examples.
[0104] Comparative Example 2 In the case of Comparative Example 2, 0.233 mol % of dysprosium (Dy) and 0.699 mol % of neodymium (Nd) were added, and the other manufacturing processes were the same as those of the above-mentioned examples.
[0105] Comparative Example 3 In the case of Comparative Example 3, 0.932 mol % of neodymium (Nd) was added to 100 mol % of titanium (Ti) among the main components of the base material, and the other manufacturing processes were the same as those of the above-mentioned examples.
[0106] The prototype MLCC samples of Examples 1 and 2 and Comparative Examples 1 to 3 were subjected to dielectric constant, dielectric loss (Dissipation Factor, DF), and insulation resistance (IR) tests, and the results were evaluated.
[0107] The above tests were carried out under three conditions, namely, 1140°C (average 1135°C), 1160°C (average 1157°C), and 1180°C (average 1172°C).
[0108] Table 1 below shows the dielectric constant, dielectric loss (Dissipation Factor, DF), and insulation resistance (IR) of prototype multilayer ceramic capacitor (MLCC) chips according to experimental examples (Examples 1 and 2 and Comparative Examples 1, 2, and 3).
[0109] [Table 1]
[0110] Referring to Table 1 above, in the case of Comparative Example 2 and Comparative Example 3, in which the content of neodymium (Nd) is 0.699 mol % or more relative to 100 mol % of titanium (Ti) among the main components of the base material, it can be seen that there is a problem of a decrease in the dielectric loss (Dissipation Factor, DF) and insulation resistance (IR).
[0111] In contrast, in Examples 1 and 2 of the present invention, the contents of dysprosium (Dy) and neodymium (Nd) are 1.0 mol % or less relative to 100 mol % of titanium (Ti) among the main components of the base material, and the content of neodymium (Nd) satisfies 0.233 mol %≦Nd≦0.466 mol % relative to 100 mol % of titanium (Ti) among the main components of the base material, and it is clear that a high dielectric constant can be ensured and reliability can be improved, such as by improving insulation resistance.
[0112] FIG. 3 is a graph showing the results of IV curves according to the examples of the present invention and comparative examples.
[0113] Referring to FIG. 3, it can be seen that Examples 1 and 2, in which the neodymium (Nd) content satisfies 0.233 mol%≦Nd≦0.466 mol% relative to 100 mol% of titanium (Ti) among the main components of the base material, are capable of realizing stable dielectric properties similar to those of Comparative Example 1, in which only dysprosium (Dy) was added.
[0114] Although the embodiments of the present invention have been described in detail above, it will be apparent to those skilled in the art that the scope of the present invention is not limited thereto, and that various modifications and variations are possible within the scope of the technical idea of the present invention described in the claims. [Explanation of symbols]
[0115] 110 Ceramic body 111 Dielectric layer 121, 122 First and second internal electrodes 131, 132 First and second external electrodes
Claims
1. BaTiO 3 The base material includes a main component and a subcomponent, and the subcomponent includes dysprosium (Dy) and neodymium (Nd) as a first subcomponent, The content of the neodymium (Nd) satisfies Nd≦0.466 mol% with respect to 100 mol% of titanium (Ti) in the main component of the base material, The first subcomponent further includes 0.233 mol % or more and 0.699 mol % or less of lanthanum (La) oxide or carbonate relative to 100 mol % of titanium (Ti) in the base material main component; A dielectric ceramic composition, wherein the total content of the dysprosium (Dy) and neodymium (Nd) is 1.0 mol % or less relative to 100 mol % of titanium (Ti) in the main component of the matrix.
2. BaTiO 3 The base material includes a main component and a subcomponent, and the subcomponent includes dysprosium (Dy) and neodymium (Nd) as a first subcomponent, The content of the neodymium (Nd) satisfies Nd≦0.466 mol% with respect to 100 mol% of titanium (Ti) in the main component of the base material, The matrix main component titanium (Ti) contains 0.001 to 0.5 moles of a third subcomponent which is an oxide or carbonate containing Mg as a fixed-valence acceptor element, relative to 100 moles of the matrix main component titanium (Ti); A dielectric ceramic composition, wherein the total content of the dysprosium (Dy) and neodymium (Nd) is 1.0 mol % or less relative to 100 mol % of titanium (Ti) in the main component of the matrix.
3. 3. The dielectric ceramic composition according to claim 2, wherein the content of said neodymium (Nd) satisfies 0.233 mol %≦Nd≦0.466 mol % relative to 100 mol % of titanium (Ti) in the main component of the matrix.
4. The dielectric ceramic composition according to claim 2 or 3, wherein the first subcomponent further contains an oxide or carbonate containing La.
5. The dielectric ceramic composition according to any one of claims 1 to 4, wherein the dielectric ceramic composition contains 0.1 to 2.0 moles of a second subcomponent which is an oxide or carbonate containing at least one of Mn, V, Cr, Fe, Ni, Co, Cu, and Zn, relative to 100 moles of the base material main component.
6. The dielectric ceramic composition according to claim 1, wherein the dielectric ceramic composition contains 0.001 to 0.5 moles of a third subcomponent which is an oxide or carbonate containing Mg as a fixed-valence acceptor element with respect to 100 moles of titanium (Ti) as the main component of the matrix.
7. The dielectric ceramic composition according to any one of claims 1 to 6, wherein the dielectric ceramic composition contains 0.001 to 4.0 moles of a fourth subcomponent which is an oxide containing at least one of Si and Al, or a glass compound containing Si, relative to 100 moles of the base material main component.
8. a ceramic body having a dielectric layer, the ceramic body including a first internal electrode and a second internal electrode arranged to face each other with the dielectric layer therebetween; a first external electrode disposed outside the ceramic body and electrically connected to the first internal electrode, and a second external electrode electrically connected to the second internal electrode, the dielectric layer includes dielectric grains including a dielectric ceramic composition; The dielectric ceramic composition is BaTiO 3 The base material includes a main component and a subcomponent, and the subcomponent includes dysprosium (Dy) and neodymium (Nd) as a first subcomponent, The content of the neodymium (Nd) satisfies Nd≦0.466 mol% with respect to 100 mol% of titanium (Ti) in the main component of the base material, The first subcomponent further includes an oxide or carbonate containing 0.233 mol % or more and 0.699 mol % or less of La relative to 100 mol % of titanium (Ti) in the base material main component, and the La is arranged at the crystal grain boundaries of the dielectric grains, The total content of the dysprosium (Dy) and neodymium (Nd) is 1.0 mol % or less relative to 100 mol % of titanium (Ti) in the main component of the base material.
9. a ceramic body having a dielectric layer, the ceramic body including a first internal electrode and a second internal electrode arranged to face each other with the dielectric layer therebetween; a first external electrode disposed outside the ceramic body and electrically connected to the first internal electrode, and a second external electrode electrically connected to the second internal electrode, the dielectric layer includes dielectric grains including a dielectric ceramic composition; The dielectric ceramic composition is BaTiO 3 The base material includes a main component and a subcomponent, and the subcomponent includes dysprosium (Dy) and neodymium (Nd) as a first subcomponent, The content of the neodymium (Nd) satisfies 0.233 mol%≦Nd≦0.466 mol% with respect to 100 mol% of titanium (Ti) in the main component of the base material, The first internal electrode and the second internal electrode include at least one material selected from the group consisting of silver (Ag), lead (Pb), platinum (Pt), and nickel (Ni); The total content of the dysprosium (Dy) and neodymium (Nd) is 1.0 mol % or less relative to 100 mol % of titanium (Ti) in the main component of the base material.
10. The multilayer ceramic capacitor according to claim 9 , wherein the first minor component further includes an oxide or carbonate containing La, and the La is disposed at crystal grain boundaries of the dielectric grains.
11. The multilayer ceramic capacitor according to any one of claims 8 to 10, wherein the dielectric ceramic composition contains 0.1 to 2.0 moles of a second subcomponent which is an oxide or carbonate containing at least one of Mn, V, Cr, Fe, Ni, Co, Cu, and Zn, relative to 100 moles of the base material main component.
12. The multilayer ceramic capacitor according to any one of claims 8 to 11, wherein the dielectric ceramic composition contains 0.001 to 0.5 moles of a third subcomponent which is an oxide or carbonate containing Mg as a fixed-valence acceptor element with respect to 100 moles of titanium (Ti) in the base material main component.
13. The dielectric ceramic composition contains 0.001 to 4.0 moles of a fourth subcomponent which is an oxide containing at least one of Si and Al, or a glass compound containing Si, relative to 100 moles of the base material main component. The multilayer ceramic capacitor according to any one of claims 8 to 12.
14. The multilayer ceramic capacitor according to claim 8 , wherein the dielectric layers have a thickness of 0.4 μm or less.
15. 15. The multilayer ceramic capacitor according to claim 8, wherein the size of the multilayer ceramic capacitor is 1005 (length x width, 1.0 mm x 0.5 mm) or less.
16. The multilayer ceramic capacitor according to claim 8 , wherein the first internal electrodes and the second internal electrodes have a thickness of 0.4 μm or less.
17. 16. The multilayer ceramic capacitor according to claim 8, wherein the first internal electrodes and the second internal electrodes have a thickness of 0.4 μm or less, and the dielectric layer has a thickness of 0.4 μm or less.
18. a ceramic body having a dielectric layer, the ceramic body including a first internal electrode and a second internal electrode arranged to face each other with the dielectric layer therebetween; a first external electrode disposed outside the ceramic body and electrically connected to the first internal electrode, and a second external electrode electrically connected to the second internal electrode, the dielectric layer includes dielectric grains including a dielectric ceramic composition; The dielectric ceramic composition is BaTiO 3 , (Ba 1-x Ca x ) (Ti 1-y Ca y ) O 3 (where x is 0≦x≦0.3, y is 0≦y≦0.1), (Ba 1-x Ca x ) (Ti 1-y Zr y ) O 3 (wherein x is 0≦x≦0.3 and y is 0≦y≦0.5), and Ba(Ti 1-y Zr y ) O 3 (where 0<y≦0.5), and the subcomponents include one or more selected from the group consisting of dysprosium (Dy) and neodymium (Nd) as a first subcomponent; The content of the neodymium (Nd) satisfies Nd≦0.466 mol% with respect to 100 mol% of titanium (Ti) in the main component of the base material, The first subcomponent further includes an oxide or carbonate containing 0.233 mol % or more and 0.699 mol % or less of La relative to 100 mol % of titanium (Ti) in the base material main component, and the La is arranged at the crystal grain boundaries of the dielectric grains, The total content of the dysprosium (Dy) and neodymium (Nd) is 1.0 mol % or less relative to 100 mol % of titanium (Ti) in the main component of the base material.
19. a ceramic body having a dielectric layer, the ceramic body including a first internal electrode and a second internal electrode arranged to face each other with the dielectric layer therebetween; a first external electrode disposed outside the ceramic body and electrically connected to the first internal electrode, and a second external electrode electrically connected to the second internal electrode, the dielectric layer includes dielectric grains including a dielectric ceramic composition; The dielectric ceramic composition is BaTiO 3 , (Ba 1-x Ca x ) (Ti 1-y Ca y ) O 3 (where x is 0≦x≦0.3, y is 0≦y≦0.1), (Ba 1-x Ca x ) (Ti 1-y Zr y ) O 3 (wherein x is 0≦x≦0.3 and y is 0≦y≦0.5), and Ba(Ti 1-y Zr y ) O 3 (where 0<y≦0.5), and the subcomponents include one or more selected from the group consisting of dysprosium (Dy) and neodymium (Nd) as a first subcomponent; The content of the neodymium (Nd) satisfies 0.233 mol%≦Nd≦0.466 mol% with respect to 100 mol% of titanium (Ti) in the main component of the base material, The first internal electrode and the second internal electrode include at least one material selected from the group consisting of silver (Ag), lead (Pb), platinum (Pt), and nickel (Ni); The total content of the dysprosium (Dy) and neodymium (Nd) is 1.0 mol % or less relative to 100 mol % of titanium (Ti) in the main component of the base material.
20. The multilayer ceramic capacitor according to claim 19 , wherein the first minor component further includes an oxide or carbonate containing La, and the La is disposed at crystal grain boundaries of the dielectric grains.
21. The multilayer ceramic capacitor according to any one of claims 18 to 20, wherein the dielectric ceramic composition contains 0.1 to 2.0 moles of a second subcomponent which is an oxide or carbonate containing at least one of Mn, V, Cr, Fe, Ni, Co, Cu, and Zn, relative to 100 moles of the base material main component.
22. The multilayer ceramic capacitor according to any one of claims 18 to 20, wherein the dielectric ceramic composition contains 0.001 to 0.5 mol of a third subcomponent which is an oxide or carbonate containing Mg as a fixed-valence acceptor element with respect to 100 mol of titanium (Ti) in the base material main component.
23. 23. The multilayer ceramic capacitor according to claim 18, wherein the dielectric layer has a thickness of 0.4 μm or less.
24. 24. The multilayer ceramic capacitor according to claim 18, wherein the first internal electrodes and the second internal electrodes have a thickness of 0.4 μm or less.
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