Structure inspection device, structure inspection method, and structure inspection system
The structure inspection device improves accuracy and efficiency by using intersecting inspection tools to gather comprehensive electromagnetic wave data, overcoming the limitations of conventional methods in densely arranged reinforcing bars and large-area inspections.
Patent Information
- Application Number
- JP2020219426
- Authority / Receiving Office
- JP · JP
- Patent Type
- Patents
- Current Assignee / Owner
- Priority Date
- 2020-01-08
- Filing Date
- 2020-12-28
- Publication Date
- 2025-01-22
- Estimated Expiration
- 2040-12-28
AI Technical Summary
Conventional structure inspection equipment struggles with accurately assessing the internal state of structures when reinforcing bars are densely arranged or overlap, requiring skilled labor and inefficient movement for large areas.
A structure inspection device and method using a moving body with multiple inspection tools arranged in intersecting directions, including a first inspection section along the moving direction and a second inspection section perpendicular to it, to gather comprehensive electromagnetic wave data.
Enables high-accuracy, stable assessment of internal structures with reduced movement, providing detailed three-dimensional imaging and increased efficiency in inspecting large areas.
Smart Images

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Abstract
Description
[Technical field]
[0001] The present invention relates to a structure inspection device, a structure inspection method, and a structure inspection system. [Background technology]
[0002] Civil engineering structures such as bridges and tunnels for roads and railways that were constructed in the past, as well as the exterior walls of large structures such as buildings and apartment buildings, and floor surfaces such as asphalt and concrete on roads, are deteriorating and aging with time, and the maintenance and management of these structures (hereinafter referred to as large structures, etc.) is becoming an urgent task. As a method for inspecting these large structures, etc., a structure inspection device that uses an electromagnetic wave radar to inspect the condition of voids, reinforcing bars, pipes, etc. (for example, the presence or absence of breaks, unplaced parts, unconstructed parts, etc.) in the ground, asphalt, and reinforced concrete structures is known (see, for example, Patent Document 1).
[0003] The structure inspection device described in Patent Document 1 (hereinafter referred to as the conventional structure inspection device) comprises a moving body that moves along the surface of a structure, and an inspection tool that is attached to the moving body and uses an electromagnetic wave radar. In the conventional structure inspection device, an operator moves the structure inspection device in a predetermined direction along the surface of the structure while irradiating electromagnetic waves into the inside of a large structure, etc., and receives the reflected waves with a receiving unit to inspect the condition of the concrete and underground. [Prior art documents] [Patent documents]
[0004] [Patent Document 1] JP 2000-19257 A Summary of the Invention [Problem to be solved by the invention]
[0005] However, with conventional structure inspection devices, the reflected waves are received (scanned) while the device is moved along a specified direction, so there is a problem in that it is difficult to grasp the internal condition of a structure with high accuracy when there are internal voids, reinforcing bars, pipes, etc. densely arranged in the ground, asphalt, or inside a concrete structure, or when multiple reinforcing bars, etc. are overlapping, such as in double reinforcement.
[0006] In addition, with conventional structure inspection devices, operators grasp the internal condition of a structure based on the waveform data of the reflected wave, but identifying the internal condition of a structure from the waveform data of the reflected wave requires specialized knowledge and experience, and is therefore dependent on the skill of the operator, making it difficult to grasp the internal condition of a structure with a stable and high degree of accuracy.
[0007] Furthermore, with conventional structural inspection devices, when inspecting a large area, such as the exterior walls or floors of a large structure, the structural inspection device must be moved back and forth multiple times, making it difficult to improve work efficiency.
[0008] Therefore, the present invention has been made to solve such problems, and aims to provide a structure inspection device, a structure inspection method, and a structure inspection system that are capable of grasping the internal condition of a structure with high accuracy even when the reinforcing bars in a concrete structure, etc. are densely arranged, or when multiple reinforcing bars are overlapped, such as in double reinforcement, and that are capable of stably grasping the internal condition of a structure with high accuracy and that are capable of increasing work efficiency. [Means for solving the problem]
[0009] The first structural inspection device of the present invention is a structural inspection device that inspects a structure using an electromagnetic radar, and is characterized in that it comprises a mobile body that moves continuously or intermittently along the surface of the structure, a first inspection unit connected to the mobile body and in which a plurality of first inspection tools using electromagnetic radar are arranged along a direction intersecting the movement direction of the mobile body, and a second inspection unit connected to the mobile body and in which a second inspection tool using electromagnetic radar is movable on the surface of the structure in a direction that has at least a component perpendicular to the movement direction of the mobile body.
[0010] The structure inspection method of the present invention is a structure inspection method for inspecting a structure using a structure inspection device that includes a mobile body that moves continuously or intermittently along the surface of the structure, a first inspection unit connected to the mobile body and in which a first inspection tool using an electromagnetic wave radar is arranged in a direction intersecting the movement direction of the mobile body, and a second inspection unit connected to the mobile body and in which a second inspection tool using an electromagnetic wave radar is movable in a direction having at least a component perpendicular to the movement direction of the mobile body, wherein the method is characterized in that while the mobile body is moved continuously or intermittently, a first irradiation unit of the first inspection unit irradiates one side of the structure with an electromagnetic wave and a first receiving unit of the first inspection unit receives the reflected wave, and while the second inspection tool is moved in a direction on the surface of the structure that has at least a component perpendicular to the movement direction of the mobile body, a second irradiation unit of the second inspection tool irradiates one side of the structure with an electromagnetic wave and a second receiving unit of the second inspection tool receives the reflected wave, thereby inspecting the structure.
[0011] The structure inspection system of the present invention is characterized in that it comprises a structure inspection device of the present invention, an analysis unit that analyzes the internal condition of a structure to be inspected based on information including at least first reflected wave information obtained by a first inspection unit of the structure inspection device, second reflected wave information obtained by a second inspection unit of the structure inspection device, and positional information of the second inspection tool of the structure inspection device, and a display unit that displays the internal condition of the structure based on the analysis results of the analysis unit.
[0012] The second structure inspection device of the present invention is a structure inspection device that inspects a structure using an electromagnetic wave radar, and is characterized in that it comprises a mobile body that moves continuously or intermittently along the surface of the structure, and an inspection unit connected to the mobile body and an inspection tool using electromagnetic wave radar that can move on the surface of the structure in a direction that has at least a component perpendicular to the movement direction of the mobile body. Effect of the Invention
[0013] According to the first structure inspection device, structure inspection method, and structure inspection system of the present invention, the system includes a moving body that moves continuously or intermittently along the surface of the structure, a first inspection unit connected to the moving body and having a plurality of first inspection tools using electromagnetic radar arranged along a direction intersecting the moving direction of the moving body, and a second inspection unit connected to the moving body and having a second inspection tool using electromagnetic radar that can move on the surface of the structure in a direction having at least a component perpendicular to the moving direction of the moving body, so that the first inspection unit can obtain reflected wave information in a direction along the moving direction of the moving body, and the second inspection unit can obtain reflected wave information in a direction perpendicular to the moving direction of the moving body. Therefore, even when there are voids, reinforcing bars, pipes, etc. in the ground, asphalt, or inside a concrete structure, or when multiple reinforcing bars, etc. are arranged in a dense state, or when multiple reinforcing bars, etc. are overlapped as in double reinforcing bars, the internal condition of the structure can be grasped with high accuracy.
[0014] According to the first structure inspection device, structure inspection method, and structure inspection system of the present invention, as described above, it is possible to obtain reflected wave information in a direction along the moving direction of the moving body and reflected wave information of a component perpendicular to the moving direction of the moving body, so that it is possible to obtain planar position information and depth information of each point with high accuracy. Also, since it is possible to analyze the internal state of the structure to be inspected based on information including at least the first reflected wave information obtained by the first inspection unit of the structure inspection device, the second reflected wave information obtained by the second inspection unit of the structure inspection device, and the position information of the second inspection unit of the structure inspection device, it is possible to obtain the position information and the depth information of each point with high accuracy, and it is possible to display it three-dimensionally (for example, as a virtual image such as a three-dimensional CT image) by the display unit. Therefore, since it is not necessary to identify the internal state of the structure from the waveform data of the reflected wave, it is possible to grasp the internal state of the structure with high accuracy without being influenced by the skill of the operator.
[0015] Furthermore, according to the first structure inspection device, structure inspection method, and structure inspection system of the present invention, there are provided a mobile body that moves continuously or intermittently along the surface of the structure, a first inspection unit connected to the mobile body and having a first inspection tool using electromagnetic radar arranged in a direction intersecting the movement direction of the mobile body, and a second inspection unit connected to the mobile body and having a second inspection tool using electromagnetic radar that is movable on the surface of the structure in a direction that has at least a component perpendicular to the movement direction of the mobile body, so that with a single movement of the mobile body, both reflected wave information in the movement direction of the mobile body and reflected wave information in a direction perpendicular to the movement direction of the mobile body can be obtained. In addition, since multiple first inspection tools are arranged and the second inspection tool moves in a direction that has at least a component perpendicular to the movement direction of the moving body, a wide range of reflected wave information can be obtained with a single movement of the moving body. Therefore, even when inspecting a large area such as the floor or exterior walls of a large structure, the number of times the structure inspection device needs to be moved back and forth can be reduced, thereby improving work efficiency.
[0016] According to the second structure inspection device of the present invention, the second inspection tool connected to the moving body and using an electromagnetic radar includes a second inspection unit that is movable on the surface of the structure in a direction having at least a component perpendicular to the moving direction of the moving body, so that the second inspection unit can obtain reflected wave information in a direction along the moving direction of the moving body as well as reflected wave information in a direction perpendicular to the moving direction of the moving body. Therefore, even when there are voids, reinforcing bars, pipes, etc. inside the soil, asphalt, concrete structure, etc., or when multiple reinforcing bars, etc. are arranged densely, such as in double reinforcing bars, the internal condition of the structure can be grasped with high accuracy. [Brief description of the drawings]
[0017] [Figure 1] 1 is a diagram showing a structure inspection device 1 according to a first embodiment. [Diagram 2] FIG. 2 is a diagram shown for explaining a first inspection tool 21 and a second inspection tool 31 in the first embodiment. [Diagram 3] 5A to 5C are diagrams illustrating the operation of the second inspection tool 31 in the first embodiment. [Figure 4] 2 is a schematic diagram shown for explaining a second irradiating section 33 and a second receiving section 34 of a second inspection tool 31. FIG. [Diagram 5] 4 is a diagram illustrating a schematic view of a trajectory of a second inspection unit 30 in the first embodiment. FIG. [Figure 6] FIG. 1 is a diagram showing a structure inspection system 100 according to a first embodiment. [Figure 7] FIG. 2 is a diagram showing a first inspection tool 21 and a second inspection tool 31 moving in a predetermined area in the first embodiment. [Figure 8] FIG. 1 is a diagram showing a structure inspection device 2 according to a second embodiment. [Figure 9] FIG. 11 is a diagram illustrating a schematic trajectory of a second inspection unit 30a in the second embodiment. [Figure 10] FIG. 11 is a diagram showing a structure inspection device 3 according to a third embodiment. [Figure 11] 13A to 13C are diagrams illustrating the operation of a second inspection unit 30a and a rail 51 in the third embodiment. [Figure 12] 13 is a diagram illustrating a schematic view of a trajectory of a second inspection unit 30 in the third embodiment. FIG. [Figure 13] FIG. 11 is a diagram showing a structure inspection device 4 according to a fourth embodiment. [Figure 14] FIG. 13 is a diagram showing a structure inspection device 5 according to a fifth embodiment. [Figure 15] 13A to 13C are diagrams illustrating the operation of the second inspection tool 31 in the fifth embodiment. [Figure 16] FIG. 1 is a diagram showing a structure inspection device 1a according to a first modified example. [Figure 17] 13A to 13C are diagrams illustrating the operation of a second inspection tool 31 in the first modified example. [Figure 18] FIG. 13 is a diagram showing a structure inspection device 2a according to a second modified example. [Figure 19] 13A to 13C are diagrams illustrating the operation of a second inspection tool 31a in Modification 2. [Figure 20] FIG. 13 is a diagram showing a structure inspection device 3a according to a third modified example. [Figure 21] FIG. 13 is a diagram showing a structure inspection device 4a according to a fourth modified example. [Figure 22] FIG. 13 is a diagram showing a structure inspection device 5a according to a fifth modified example. [Figure 23] FIG. 13 is a diagram showing a structure inspection device 1b according to a sixth modified example. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS
[0018] Hereinafter, a structure inspection device, a structure inspection method, and a structure inspection system according to an embodiment of the present invention will be described with reference to the drawings. The structure inspection device, the structure inspection method, and the structure inspection system are an inspection device, an inspection method, and an inspection system that non-destructively inspect the presence or absence of abnormalities such as deterioration of a structure or the inclusion of foreign matter. Examples of structures include civil engineering structures such as road and railway bridges and tunnels, exterior walls of large structures such as buildings and apartment buildings, and floor surfaces such as asphalt and concrete of roads.
[0019] [Embodiment 1] 1. Configuration of structure inspection device 1 according to embodiment 1 FIG. 1 is a diagram showing a structure inspection device 1 according to the first embodiment. FIG. 1(a) is a schematic plan view of the structure inspection device 1, and FIG. 1(b) is a schematic side view of the structure inspection device 1. FIG. 2 is a diagram shown for explaining a first inspection tool 21 and a second inspection tool 31 in the first embodiment. FIG. 2(a) is a schematic plan view of the first inspection tool 21, FIG. 2(b) is a schematic side view of the first inspection tool 21, FIG. 2(c) is a schematic plan view of the second inspection tool 31, and FIG. 2(d) is a schematic side view of the second inspection tool 31. FIG. 3 is a schematic view shown for explaining the operation of the second inspection tool 31 in the first embodiment. FIG. 4 is a schematic view shown for explaining a second irradiation unit 33 and a second receiving unit 34 of the second inspection tool 31.
[0020] As shown in FIG. 1, the structure inspection device 1 according to the first embodiment includes a moving body 10, a first inspection unit 20, a second inspection unit 30, and a second inspection tool moving mechanism 40. The structure inspection device 1 is a device that receives electromagnetic wave information (reflected electromagnetic wave information) in the moving direction of the moving body and in a direction perpendicular to the moving direction of the moving body by using an electromagnetic wave radar by the first inspection unit 20 and the second inspection unit 30 while moving along the surface of the structure such as the floor surface, inclined surface, vertical surface, or ceiling surface of the structure or road, and inspects the internal state of a large structure or the like. The structure inspection device 1 according to the first embodiment can be suitably used by being mounted on a wall climbing robot that ascends and processes in a perpendicular direction, but can also be mounted on a cart that travels on the ground or a concrete floor surface.
[0021] The moving body 10 includes a main unit 11, and drive wheels 12 and driven wheels 13 arranged on the sides of the main unit 11. A pair of drive wheels 12 are arranged on the front side of the moving body 10 in the traveling direction, and a pair of driven wheels 13 are arranged on the rear side. A distance meter (not shown) is provided at a predetermined location of the moving body 10 (for example, the drive wheels 12).
[0022] The main unit 11 has a main unit drive section 15 . The main body drive unit 15 has two motors (not shown), one of which drives the drive wheel 12 on the left side relative to the traveling direction of the mobile body 10, and the other motor drives the drive wheel 12 on the right side. This not only allows the mobile body 10 (i.e., the structure inspection device) to move forward (upward in FIG. 1(a)) or backward (downward in FIG. 1(a)), but also allows the mobile body 10 to be turned right or left, and moved freely across the floor surface of the structure, etc.
[0023] The first inspection section 20 has a first inspection tool 21 and a first inspection tool connecting section 22. The first inspection tool 21 is connected to the rear of the moving body 10 via the first inspection tool connecting section 22, and follows the movement of the moving body 10. In the first inspection section 20, a plurality of first inspection tools 21 using electromagnetic wave radar are arranged on the surface of the structure along a direction intersecting the moving direction of the moving body 10 (a direction perpendicular to the moving direction in the first embodiment), and form a first inspection tool unit 27 (see FIG. 2(a)).
[0024] Each of the multiple first inspection tools 21 has a first irradiation section 23 and a first receiving section 24. Two wheels 26 are provided on each end of the first inspection tool unit 27. This makes it possible to follow the movement of the moving body 10, and also makes it possible to keep the height of the first irradiation section 23 and the first receiving section 24 constant with respect to the surface of the structure. The first inspection tool unit 27 is pressed against the surface of the structure with a predetermined pressing force by a spring (not shown), its own weight, suction, etc. This makes it possible to form an appropriate gap between the surface of the structure and the first irradiation section 23 and the first receiving section 24 by the action of the wheels 26.
[0025] 2(b), the first irradiating unit 23 is disposed on the surface of the first inspection tool 21 facing the structure, and irradiates electromagnetic waves toward one surface of the structure. The timing of irradiating the electromagnetic waves is stored in a storage unit (not shown).
[0026] The first receiving unit 24 is arranged on the surface of the first inspection tool 21 facing the structure, and receives a reflected wave that propagates in the direction of movement of the moving body 10 in a planar view in response to the electromagnetic wave irradiated from the first irradiating unit 23.
[0027] In the structure inspection device 1 according to the first embodiment, the first inspection unit 20 has a plurality of first inspection tools 21, each of which has a first irradiation unit 23 and a first receiving unit 24, and further, the second inspection unit 30 described later has a second inspection tool 31 and has a first irradiation unit 23 and a second receiving unit 34. Therefore, there is a risk that the electromagnetic waves and reflected waves irradiated from each of the first irradiation units 23 and the second irradiation unit 33 may interfere with each other, and it is desirable to take measures to prevent crosstalk between each pair of irradiation unit and receiving unit. For this reason, it is desirable to, for example, make the frequencies of the electromagnetic waves irradiated from each of the first irradiation units 23 and the second irradiation unit 33 different from each other, or to shift the irradiation timing and reception timing of the pulsed electromagnetic wave irradiation.
[0028] The first inspection tool connecting portion 22 is a plate having one end connected to the moving body 10 and the other end connected to the first inspection tool unit 27.
[0029] 1, the second inspection unit 30 has a second inspection tool 31 and a second inspection tool connecting part 32. The second inspection unit 30 is connected to the rear of the moving body 10 (further rearward of the first inspection unit 20) via the second inspection tool connecting part 32. Note that, although the moving body 10, the first inspection unit 20, and the second inspection unit 30 are arranged in this order from the front in the movement direction of the moving body 10, this order is arbitrary.
[0030] The second inspection tool 31 has a second irradiation section 33 and a second receiving section 34 (see Fig. 2(c), Fig. 2(d) and Fig. 4). The second inspection tool 31 swings (perpendicular motion with a part of the moving body 10 as a fulcrum) along the surface of the structure via the second inspection tool connecting section 32 by a second inspection tool moving mechanism 40 described later. Two wheels 36 are provided on each end of the second inspection tool 31, allowing it to swing smoothly.
[0031] The second irradiating unit 33 is disposed on the surface of the second inspection tool 31 facing the structure, and irradiates electromagnetic waves toward the surface of the structure. The electromagnetic waves are pulse waves. However, they may be continuous waves or electromagnetic waves of other appropriate waveforms may be irradiated. The electromagnetic waves may have the same frequency as the electromagnetic waves irradiated by the first irradiating unit 23, but it is preferable to use a frequency different from that of the first irradiating unit 23 so as not to interfere with the electromagnetic waves of the first irradiating unit 23.
[0032] The second receiving unit 34 is arranged on the surface of the second inspection tool 31 facing the structure, and receives a reflected wave that propagates in a direction having at least a component perpendicular to the movement direction of the moving body 10 in a planar view in response to the electromagnetic wave irradiated from the second irradiating unit 33.
[0033] One end of the second inspection tool connecting part 32 is attached to the moving body 10, and the other end is attached to the second inspection tool 31. The second inspection tool connecting part 32 bridges between one end and the other end so as to avoid the first inspection part 20. A holding plate 35 for holding the second inspection tool 31 is provided at the other end of the second inspection tool connecting part 32. The holding plate 35 is pressed against the surface of the structure with a predetermined pressing force by a spring, its own weight, suction, etc. (not shown). This allows an appropriate gap to be formed between the surface of the structure and the second irradiation part 33 and the second receiving part 34 by the action of the wheels 36.
[0034] The second inspection tool moving mechanism 40 (link mechanism) swings (perpendicular movement) the second inspection tool 31 along the surface of the structure via the second inspection tool connecting portion 32. The second inspection tool moving mechanism 40 may be configured as appropriate, and may, for example, be configured as follows.
[0035] 3, the second inspection tool moving mechanism 40 has a link motor 41, a link drive wheel 42 which rotates coaxially with the link motor 41, and a driven arm 43 which is actuated by the link drive wheel 42. One end of the driven arm 43 is rotatably supported by a pin or the like on the outer peripheral edge of the link drive wheel 42, and the other end is rotatably supported by the second inspection tool connecting part 32. The connecting part between the second inspection tool connecting part 32 and the driven arm 43 is a joint part 44 in the second inspection tool moving mechanism 40.
[0036] Due to the rotation of the link drive wheel 42 and the link action, the second inspection tool connecting part 32 swings around the rotation shaft 37 as the center of rotation. That is, the second inspection tool 31 swings. The link drive wheel 42 may be rotated in one direction, or may be rotated alternately clockwise and counterclockwise. Also, a direct motor drive mechanism may be used instead of the link mechanism.
[0037] 2. Operation of the First Inspection Tool 21 and the Second Inspection Tool 31 Fig. 5 is a diagram showing the operation of the second inspection unit 30 in the first embodiment. Fig. 5(a) is a diagram showing the state where the moving body 10 is moved intermittently and the second inspection tool 31 is swung from one end to the other end (when the moving body 10 is not moving in the moving direction, the second inspection tool 31 is swung from one end to the other end, and when the moving body 10 is moving in the moving direction, the second inspection tool 31 is stopped), Fig. 5(b) is a diagram showing the state where the moving body 10 is moved intermittently and the second inspection tool 31 is swung between one end and the other end (when the moving body 10 is not moving in the moving direction, the second inspection tool 31 is swung from one end to the other end and back to one end, and when the moving body 10 is moving in the moving direction, the second inspection tool 31 is stopped), and Fig. 5(c) is a diagram showing the state where the moving body 10 is moved continuously and the second inspection tool 31 is swung. In Fig. 5, the dashed line indicates the trajectory of the first inspection tool 21, the solid line indicates the trajectory of the second inspection tool 31 when it is oscillating, and the circle indicates the end of the oscillation. Also, Fig. 5 shows an example in which the second inspection unit 30 operates on the opposite side to the traveling direction of the moving body 10, but since the traveling direction of the moving body 10 can be freely changed, the moving body 10 may also travel in the opposite direction to that shown in Fig. 5. In Fig. 5, the trajectory of the first inspection tool 21 when it moves on the surface of the structure is represented by a, and the trajectory of the second inspection tool 31 when it moves on the surface of the structure is represented by A.
[0038] The second inspection tool moving mechanism 40 causes the second inspection tool 31 to swing (perform a pendulum motion) along the surface of the structure via the second inspection tool connecting portion 32. Specifically, the moving body 10 is moved intermittently, and the second inspection tool 31 is swung from one end to the other end. That is, when the moving body 10 is not moving in the moving direction, the second inspection tool 31 is swung from one end to the other end, and when the moving body 10 is moving in the moving direction, the second inspection tool 31 is stopped (see FIG. 5(a)). By repeating such an operation, efficient operation is possible.
[0039] Also, the moving body 10 may be moved intermittently, and the second inspection tool 31 may be moved back and forth between one end and the other end. That is, when the moving body 10 is not moving in the moving direction, the second inspection tool 31 is swung from one end to the other end and then back to the one end, and when the moving body 10 is moving in the moving direction, the second inspection tool 31 is stopped (see FIG. 5(b)). By repeating such an operation, the second inspection tool 31 is rotated twice on the same trajectory, that is, the same part is inspected twice, which makes it possible to increase the reliability of the inspection.
[0040] Furthermore, the movable body 10 may be moved continuously and the second inspection tool 31 may be swung (see FIG. 5(c)). By repeating such an operation, the inspection can be continued without stopping the movable body 10, so that the inspection of structures (especially large structures) can be performed with higher work efficiency. The pitch (or gradient) of the trajectory of the second inspection tool 31 rolling from left to right or from right to left can be adjusted to be denser or sparser by changing the running speed of the movable body 10 and the swaying speed of the second inspection tool 31.
[0041] 3. Structure inspection method according to embodiment 1 and structure inspection system 100 according to embodiment 1 Using the structure inspection device 1 of the above-mentioned embodiment 1, while the moving body 10 is moved continuously or intermittently, the first irradiating unit 23 of the first inspection unit 20 irradiates electromagnetic waves toward one side of the structure and the first receiving unit 24 of the first inspection unit 20 receives the reflected waves, and while the second inspection tool 31 is moved in a direction having at least a component perpendicular to the movement direction of the moving body 10 on the surface of the structure, the second irradiating unit 33 of the second inspection tool 31 irradiates electromagnetic waves toward one side of the structure and the second receiving unit 34 of the second inspection tool 31 receives the reflected waves, thereby inspecting the structure (structure inspection method of embodiment 1).
[0042] In the structure inspection system 100 of embodiment 1, the internal condition of the structure is analyzed based on each piece of information obtained by the structure inspection device 1 of embodiment 1, and is displayed three-dimensionally (for example, as a virtual image such as a three-dimensional CT image) on the display unit.
[0043] The structure inspection system 100 of embodiment 1 includes a structure inspection apparatus 1 of embodiment 1, an analysis unit 70 that analyzes the internal state of the structure to be inspected based on information including at least first reflected wave information obtained by the first inspection unit 20 of the structure inspection apparatus 1, second reflected wave information obtained by the second inspection unit 30 of the structure inspection apparatus 1, and positional information of the second inspection tool 31 of the structure inspection apparatus 1, and a display unit 80 that displays the internal state of the structure based on the analysis results of the analysis unit 70.
[0044] As shown in FIG. 6 , the structure inspection device 1 of embodiment 1 sends to the analysis unit 70: (1) moving body position information obtained by a rangefinder attached to the drive wheel 12 of the moving body 10; (2) first electromagnetic wave information (e.g., frequency, timing, etc. of the electromagnetic wave) irradiated by the first irradiating unit 23 of the first inspection unit 20 and first reflected wave information received by the first receiving unit 24; (3) second electromagnetic wave information (e.g., frequency, timing, etc. of the electromagnetic wave) irradiated by the second irradiating unit 33 of the second inspection unit 30 and second reflected wave information received by the second receiving unit 34; and (4) position information of the second inspection tool 31 being swung by the second inspection tool moving mechanism 40. The analysis unit 70 stores the above information in a storage unit (not shown) within the analysis unit 70.
[0045] The analysis unit 70 uses a computer or the like to analyze the internal state of the structure at each point on the surface of the structure based on the information stored in the storage unit. Specifically, the position where the reflected wave was received by the first receiving unit 24 and the position where the reflected wave was received by the second receiving unit 34 are identified based on the moving body position information and the second inspection tool position information. The second reflected wave information is also separated into a component in the moving direction of the moving body 10 and a component perpendicular to the moving direction. In this way, reflected wave information in the moving direction of the moving body 10 and reflected wave information in a direction perpendicular to the moving direction at each point on the surface of the structure can be obtained, and by analyzing this information, information on the internal state of the structure in the depth direction can be obtained with high accuracy.
[0046] The analysis unit 70 uses the second reflected wave information by dividing it into a component in the moving direction of the moving body 10 and a component perpendicular thereto, but the second reflected wave information may be corrected by a computer program or the like.
[0047] The analysis unit 70 divides the surface of the structure into regions using a mesh, and analyzes the internal state of the structure based on the first reflected wave information and the second reflected wave information for each region (see FIG. 7). However, the first reflected wave information and the second reflected wave information at positions near each intersection of the mesh may be weighted to analyze information on the internal state of the structure in the depth direction at each intersection of the mesh, or the internal state of the structure may be appropriately analyzed using other appropriate methods.
[0048] The display unit 80 displays the internal state of the structure analyzed by the analysis unit 70. The structure inspection device 1 according to the first embodiment can obtain reflected wave information in the moving direction of the moving body 10 and reflected wave information in a direction perpendicular to the moving direction. Therefore, detailed and highly accurate data on the internal state of the structure can be obtained, and the internal state of the structure can be displayed in three dimensions (for example, displayed as a virtual image such as a three-dimensional CT image).
[0049] 4. Effects of the structure inspection device 1, structure inspection method, and structure inspection system 100 according to the first embodiment According to the structure inspection device 1, the structure inspection method, and the structure inspection system 100 of the first embodiment, the first inspection unit 20 is connected to the moving body 10 and includes a first inspection tool 21 using an electromagnetic wave radar arranged in a direction intersecting the moving direction of the moving body 10, and the second inspection unit 30 is connected to the moving body 10 and includes a second inspection tool 31 using an electromagnetic wave radar that is movable on the surface of the structure in a direction having at least a component perpendicular to the moving direction of the moving body 10. Therefore, the first inspection unit 20 can obtain reflected wave information in a direction along the moving direction of the moving body 10, and the second inspection unit 30 can obtain reflected wave information in a direction perpendicular to the moving direction of the moving body 10. Therefore, even when there are voids, reinforcing bars, pipes, etc. in the ground, asphalt, or inside a concrete structure, or when multiple reinforcing bars, etc. are overlapped as in double reinforcing bars, the internal condition of the structure can be grasped with high accuracy.
[0050] Furthermore, according to the structure inspection device 1, structure inspection method, and structure inspection system 100 of embodiment 1, as described above, it is possible to obtain reflected wave information in a direction along the movement direction of the moving body 10 and reflected wave information of a component perpendicular to the movement direction of the moving body 10, so that planar position information and depth information for each point can be obtained with high accuracy. Furthermore, since the internal state of the structure to be inspected can be analyzed based on information including at least the first reflected wave information obtained by the first inspection unit 20 of the structure inspection device 1, the second reflected wave information obtained by the second inspection unit 30 of the structure inspection device 1, and the position information of the second inspection tool 31 of the structure inspection device 1, the position information and the depth information of each point can be obtained with high accuracy, and the display unit can display the information in three dimensions (for example, as a virtual image such as a three-dimensional CT image). Therefore, since it is no longer necessary to identify the internal state of the structure from the waveform data of the reflected wave, the internal state of the structure can be grasped stably and with high accuracy without being influenced by the skill of the operator.
[0051] In addition, the structure inspection device 1, structure inspection method, and structure inspection system 100 of embodiment 1 include a moving body 10 that moves continuously or intermittently along the surface of the structure, a first inspection unit 20 connected to the moving body 10 and having a plurality of first inspection tools 21 using electromagnetic radar arranged along a direction intersecting the movement direction of the moving body 10, and a second inspection unit 30 connected to the moving body 10 and having a second inspection tool 31 using electromagnetic radar that is movable on the surface of the structure in a direction that has at least a component perpendicular to the movement direction of the moving body 10.Therefore, with one movement of the moving body 10, both reflected wave information in the movement direction of the moving body 10 and reflected wave information in a direction perpendicular to the movement direction of the moving body 10 can be obtained. In addition, since multiple first inspection tools 21 are arranged and the second inspection tool 31 moves in a direction having at least a component perpendicular to the movement direction of the moving body 10, a wide range of reflected wave information can be obtained with a single movement of the moving body 10. Therefore, even when inspecting a large area such as the exterior wall of a large structure, the number of times the structure inspection device needs to be moved back and forth can be reduced, thereby improving work efficiency.
[0052] Moreover, according to the structure inspection device 1, the structure inspection method, and the structure inspection system 100 according to the first embodiment, each first inspection tool 21 has a first irradiation section 23 that irradiates one side of the structure with an electromagnetic wave and a first receiving section 24 that receives the reflected wave of the electromagnetic wave irradiated from the first irradiation section 23, and the second inspection tool 31 has a second irradiation section 33 that irradiates one side of the structure with an electromagnetic wave and a second receiving section 34 that receives the reflected wave of the electromagnetic wave irradiated from the second irradiation section 33, so that in one inspection (in one movement of the moving body 10), it is possible to receive both the reflected wave propagating in the moving direction of the moving body 10 as viewed in a plane and the reflected wave propagating in a direction having a component perpendicular to the moving direction of the moving body 10. Therefore, information about the internal state of the structure can be efficiently acquired.
[0053] Furthermore, according to the structure inspection device 1 of embodiment 1, since it is equipped with the second inspection tool moving mechanism 40 that oscillates the second inspection tool 31 along the surface of the structure, it is possible to receive reflected waves that propagate in a direction having a component perpendicular to the movement direction of the moving body 10 in a planar view in a relatively simple manner.
[0054] [Embodiment 2] FIG. 8 is a diagram showing a structure inspection device 2 according to the second embodiment. FIG. 8(a) is a schematic plan view of the structure inspection device 2, and FIG. 8(b) is a schematic side view of the structure inspection device 2. FIG. 9 is a diagram showing the operation of the second inspection unit 30a in the second embodiment. FIG. 9(a) is a diagram showing a state in which the moving body 10 is moved intermittently and the second inspection tool 31a is moved from one end to the other end, FIG. 9(b) is a diagram showing a state in which the moving body 10 is moved intermittently and the second inspection tool 31a is moved back and forth between one end and the other end, and FIG. 9(c) is a diagram showing a state in which the moving body 10 is moved continuously and the second inspection tool 31a is moved back and forth.
[0055] The structure inspection device 2 according to the second embodiment basically has the same configuration as the structure inspection device 1 according to the first embodiment, but the configuration of the second inspection unit is different from that of the structure inspection device 1 according to the first embodiment. That is, in the structure inspection device 2 according to the second embodiment, the second inspection tool 31a is moved back and forth along the rail 51 (see FIG. 8). Note that in the second embodiment, the moving body 10, the second inspection tool 31a, and the first inspection tool 21 are arranged in this order from the front in the moving direction of the moving body 10, but they may be arranged in the order of the moving body 10, the first inspection tool 21, and the second inspection tool 31a, or in any other appropriate order.
[0056] The structure inspection device 2 of embodiment 2 includes a rail 51 extending in a direction perpendicular to the movement direction of the moving body 10, and a second inspection tool moving mechanism 52 that moves the second inspection tool 31a along the rail 51 (see FIG. 8). The rail 51 extends between two support parts 53 extending from the movable body 10 in a direction perpendicular to the moving direction of the movable body 10. A rail groove is formed in the rail 51, and a runner attached to the second inspection tool 31a is combined with the rail groove, and the second inspection tool 31a is connected to the rail 51 so as to be movable back and forth along the rail 51. Two wheels 36 are disposed on each end of the second inspection tool 31a, allowing the second inspection tool moving mechanism 52 to move it smoothly.
[0057] In the second embodiment, the first inspection unit 20 follows the movement of the moving body 10, and the second inspection unit 30a moves the second inspection tool 31a along the rail 51. As a method of reciprocating the second inspection tool 31a, the movable body 10 may be moved intermittently while the second inspection tool 31a is moved from one end to the other end (see Figure 9(a)), or the movable body 10 may be moved intermittently while the second inspection tool 31a is moved back and forth between one end and the other end (see Figure 9(b)), or the movable body 10 may be moved continuously while the second inspection tool 31a is moved back and forth (see Figure 9(c)).
[0058] As described above, the structure inspection device 2 of embodiment 2 has a different configuration of the second inspection unit from the structure inspection device 1 of embodiment 1, but like the structure inspection device 1 of embodiment 1, it is equipped with a first inspection unit 20 that is connected to the moving body 10 and follows the movement of the moving body 10, and in which a plurality of first inspection tools 21 using electromagnetic radar are arranged along a direction intersecting the movement direction of the moving body 10, and a second inspection unit 30a that is connected to the moving body 10 and in which a second inspection tool 31a using electromagnetic radar is movable in a direction having at least a component perpendicular to the movement direction of the moving body 10. Therefore, the first inspection unit 20 can obtain reflected wave information in a direction along the movement direction of the moving body 10, and the second inspection unit 30a can obtain reflected wave information in a direction perpendicular to the movement direction of the moving body 10. Therefore, even when there are internal voids, reinforcing bars, piping, etc. densely arranged in the ground, asphalt, or inside a concrete structure, or when multiple reinforcing bars are overlapping, such as in double reinforcement, the internal condition of the structure can be grasped with high accuracy.
[0059] Furthermore, the structure inspection device 2 of embodiment 2 is equipped with a rail 51 extending in a direction having at least a component perpendicular to the movement direction of the moving body 10, and a second inspection tool moving mechanism 52 that moves the second inspection tool 31a back and forth along the rail 51. Therefore, with a relatively simple configuration, reflected wave information in a direction along the movement direction of the moving body 10 and reflected wave information in a direction perpendicular to the movement direction of the moving body 10 can be obtained in a single inspection.
[0060] In addition, the structure inspection device 2 of embodiment 2 has the same configuration as the structure inspection device 1 of embodiment 1 except for the configuration of the second inspection unit, and therefore has the relevant effects among the effects of the structure inspection device 1 of embodiment 1.
[0061] [Embodiment 3] Fig. 10 is a diagram showing a structure inspection device 3 according to embodiment 3. Fig. 10(a) is a schematic plan view of the structure inspection device 3, and Fig. 10(b) is a schematic side view of the structure inspection device 3. Fig. 11 is a diagram showing typically the operation of the second inspection unit 30a and the rail 51 in embodiment 3. Figs. 11(a) to 11(f) are diagrams showing each process. Fig. 12 is a diagram showing typically the trajectory of the second inspection unit 30 in embodiment 3.
[0062] The structure inspection device 3 according to the third embodiment basically has the same configuration as the structure inspection device 2 according to the second embodiment, but differs from the structure inspection device 2 according to the second embodiment in that it switches the direction in which the rail extends. That is, the structure inspection device 3 according to the third embodiment includes a rail extension direction switching mechanism 54 that switches the direction in which the rail 51 extends (see FIG. 10). Note that detailed illustration of the connection between the rail 51 and the two support parts 53 is omitted.
[0063] In embodiment 3, the second inspection tool moving mechanism 52 moves the second inspection tool 31a along the rail 51, but the rail extension direction switching mechanism 54 tilts the rail 51 relative to the movement direction of the movable body 10, so that the second inspection tool 31a moves diagonally backward relative to the movement direction of the movable body 10.
[0064] Here, by linking the operation of the second inspection tool moving mechanism 52 and the rail extending direction switching mechanism 54 with the movement of the moving body 10, the second inspection tool 31a can be moved in a pseudo-linear manner. Specifically, first, when the second inspection tool 31a is on the left side of the traveling direction of the moving body 10 while the moving body 10 is moving, the rail extension direction switching mechanism 54 tilts the rail 51 so that the right end of the rail 51 is located behind the traveling direction of the moving body 10 (so that the rail 51 slopes downward to the right as shown in FIG. 11(a)). Then, the second inspection tool moving mechanism 52 moves the second inspection tool 31a from left to right. At this time, the moving body 10 and the second inspection tool 31a are moving, but the second inspection tool 31a appears to be moving in a straight line when viewed from the outside (see FIGS. 11(a) to 11(c) and 12). When the second inspection tool 31a moves to the right end, the rail extension direction switching mechanism 54 tilts the rail 51 so that the left end of the rail 51 is located behind the traveling direction of the moving body 10 (so that the rail 51 slopes downward to the left as shown in FIG. 11(d)). Then, the second inspection tool 31a is moved from right to left by the second inspection tool moving mechanism 52. At this time, the movable body 10 and the second inspection tool 31a are moving, but the second inspection tool 31a appears to be moving in a straight line when viewed from the outside (see Figs. 11(d) to 11(f) and Fig. 12). This is repeated thereafter. As a result, the second inspection tool 31a can be moved in a direction perpendicular to the moving direction of the movable body 10, as shown in Fig. 12.
[0065] As such, the structure inspection device 3 of embodiment 3 differs from the structure inspection device 2 of embodiment 2 in that it switches the direction in which the rails extend. However, like the structure inspection device 2 of embodiment 2, it is equipped with a first inspection unit 20 that is connected to the moving body 10 and follows the movement of the moving body 10, and in which a plurality of first inspection tools 21 using electromagnetic radar are arranged along a direction intersecting the movement direction of the moving body 10, and a second inspection unit 30a that is connected to the moving body 10 and in which a second inspection tool 31a using electromagnetic radar is movable in a direction having at least a component perpendicular to the movement direction of the moving body 10. Therefore, the first inspection unit 20 can obtain reflected wave information in a direction along the movement direction of the moving body 10, and the second inspection unit 30a can obtain reflected wave information in a direction perpendicular to the movement direction of the moving body 10. Therefore, even when there are internal voids, reinforcing bars, piping, etc. densely arranged in the ground, asphalt, or inside a concrete structure, or when multiple reinforcing bars are overlapping, such as in double reinforcement, the internal condition of the structure can be grasped with high accuracy.
[0066] Furthermore, the structure inspection device 3 according to the third embodiment includes a rail extending direction switching mechanism 54 that switches the extending direction of the rail 51, and therefore by adjusting the second inspection tool moving mechanism 52 and the rail extending direction switching mechanism 54 and linking the movement of the second inspection tool 31a with the movement of the moving body 10, it is possible to move the second inspection tool 31a in a pseudo-linear manner in a direction perpendicular to the moving direction of the moving body 10. Therefore, in the process of analyzing the received reflected wave data, it is not necessary to remove the component in the moving direction of the moving body 10, and it is possible to obtain reflected wave data in a direction perpendicular to the moving direction of the moving body 10 with high accuracy.
[0067] In addition, the structure inspection device 3 of embodiment 3 has a configuration similar to that of the structure inspection device 2 of embodiment 2 except for switching the direction in which the rails extend, and therefore has the relevant effects among the effects of the structure inspection device 2 of embodiment 2.
[0068] [Embodiment 4] Fig. 13 is a diagram showing a structure inspection device 4 according to embodiment 4. Fig. 13(a) is a schematic plan view of the structure inspection device 4, and Fig. 13(b) is a schematic side view of the structure inspection device 4.
[0069] The structure inspection device 4 according to the fourth embodiment basically has the same configuration as the structure inspection device 1 according to the first embodiment, but the configurations of the first inspection unit and the second inspection unit are different from those of the structure inspection device 1 according to the first embodiment. That is, in the structure inspection device 4 according to the fourth embodiment, a first inspection tool 21b (first inspection unit 27b) and a second inspection tool 31b are attached between the driving wheel 12 and the driven wheel 13 on the underside (the surface side facing the surface of the structure) of the moving body 10b. Note that in FIG. 13(b), the connection part that connects the moving body 10b and the first inspection tool unit 27 is not shown.
[0070] As described above, the structure inspection device 4 of embodiment 4 has a different configuration of the first inspection unit and the second inspection unit from the structure inspection device 1 of embodiment 1, but like the structure inspection device 1 of embodiment 1, it is equipped with a first inspection unit 20 that is connected to the moving body 10b and follows the movement of the moving body 10b, and in which a plurality of first inspection tools 21 using electromagnetic radar are arranged along a direction intersecting the movement direction of the moving body 10b, and a second inspection unit 30b that is connected to the moving body 10b and in which a second inspection tool 31b using electromagnetic radar is movable in a direction having at least a component perpendicular to the movement direction of the moving body 10. Therefore, the first inspection unit 20 can obtain reflected wave information in a direction along the movement direction of the moving body 10b, and the second inspection unit 30b can obtain reflected wave information in a direction perpendicular to the movement direction of the moving body 10b. Therefore, even when there are internal voids, reinforcing bars, piping, etc. densely arranged in the ground, asphalt, or inside a concrete structure, or when multiple reinforcing bars are overlapping, such as in double reinforcement, the internal condition of the structure can be grasped with high accuracy.
[0071] In addition, the structure inspection device 4 of embodiment 4 has a configuration similar to that of the structure inspection device 1 of embodiment 1 except for the configurations of the first inspection unit and the second inspection unit, and therefore has the relevant effects among the effects of the structure inspection device 1 of embodiment 1.
[0072] [Embodiment 5] FIG. 14 is a diagram showing a structure inspection device 5 according to the fifth embodiment. FIG. 14(a) is a schematic plan view of the structure inspection device 5, and FIG. 14(b) is a schematic side view of the structure inspection device 5. FIG. 15 is a diagram showing the operation of the second inspection tool 31 in the fifth embodiment. FIG. 15(a) is a diagram showing a movable range of the second inspection tool 31 as seen from the moving body 10, FIG. 15(b) is a diagram showing the operation of the second inspection tool 31 when the second inspection tool 31 is linearly moved back and forth in a direction perpendicular to the moving direction of the moving body, FIG. 15(c) is a diagram showing the operation of the second inspection tool 31 when the second inspection tool 31 is moved back and forth in a direction obliquely intersecting the moving direction of the moving body 10, and FIG. 15(d) is a diagram showing the trajectory of the second inspection tool 31 in the case of FIG. 15(c).
[0073] The structure inspection device 5 according to the fifth embodiment basically has the same configuration as the structure inspection device 1 according to the first embodiment, but the configuration of the second inspection tool connecting part is different from that of the structure inspection device 1 according to the first embodiment. That is, in the structure inspection device 5 according to the fifth embodiment, the second inspection tool connecting part 32c has an extension mechanism (not shown) that extends or retracts the length from the fulcrum around which the second inspection tool 31 swings to the second inspection tool 31 (specifically, an elastic body such as a spring is built in), and the second inspection tool connecting part 32c can be extended or retracted while swinging the second inspection tool 31 to change the distance between the second inspection tool 31 and the moving body 10.
[0074] This allows the second inspection tool 31 to move over a wide range (over the entire area indicated by symbol B in FIG. 15(a) when the moving body 10 is stopped). Therefore, by linking the extension and contraction of the second inspection tool connecting portion 32c with the reciprocating movement of the second inspection tool 31, for example, the second inspection tool 31 can be moved linearly in a direction perpendicular to the moving direction of the moving body (see FIG. 15(b)). In this case, the second inspection tool 31 can be moved so as to follow a trajectory as shown in FIG. 9. Also, the second inspection tool 31 can be moved back and forth in a direction that intersects obliquely with the moving direction of the moving body 10 (see FIG. 15(c)). Therefore, by linking it with the movement of the moving body 10, it can be moved back and forth in a pseudo-linear manner in a direction perpendicular to the moving direction of the moving body 10 (see FIG. 15(d)).
[0075] In this way, the structure inspection device 5 according to the fifth embodiment has a different configuration of the second inspection tool connecting part from that of the structure inspection device 1 according to the first embodiment, but like the structure inspection device 1 according to the first embodiment, the structure inspection device 5 includes a first inspection unit 20 connected to the moving body 10 and including a plurality of first inspection tools 21 using electromagnetic radar arranged along a direction intersecting the moving direction of the moving body 10, and a second inspection unit 30 connected to the moving body 10 and including a second inspection tool 31 using electromagnetic radar that can move in a direction having at least a component perpendicular to the moving direction of the moving body 10. Therefore, the first inspection unit 20 can obtain reflected wave information in a direction along the moving direction of the moving body 10, and the second inspection unit 30 can obtain reflected wave information in a direction perpendicular to the moving direction of the moving body 10. Therefore, even when there are voids, reinforcing bars, pipes, etc. in the ground, asphalt, or inside a concrete structure, or when multiple reinforcing bars, etc. are arranged in a dense state, or when multiple reinforcing bars, etc. are overlapped as in double reinforcing bars, the internal state of the structure can be grasped with high accuracy.
[0076] In addition, the structure inspection device 5 of embodiment 5 has a configuration similar to that of the structure inspection device 1 of embodiment 1 except for the configurations of the first inspection unit and the second inspection unit, and therefore has the relevant effects among the effects of the structure inspection device 1 of embodiment 1.
[0077] [Variation 1] Fig. 16 is a diagram showing a structure inspection device 1a according to Modification 1. Fig. 16(a) is a schematic plan view of the structure inspection device 1a, and Fig. 16(b) is a schematic side view of the structure inspection device 1a. Fig. 17 is a diagram showing a schematic operation of the second inspection section 30 in Modification 1. Figure 17(a) is a diagram showing how the moving body 10 is moved intermittently and the second inspection tool 31 is oscillated from one end to the other end (when the moving body 10 is not moving in the movement direction, the second inspection tool 31 is oscillated from one end to the other end, and when the moving body 10 is moving in the movement direction, the second inspection tool 31 is stopped), Figure 17(b) is a diagram showing how the moving body 10 is moved intermittently and the second inspection tool 31 is oscillated from one end to the other end (when the moving body 10 is not moving in the movement direction, the second inspection tool 31 is oscillated from one end to the other end and then back to one end, and when the moving body 10 is moving in the movement direction, the second inspection tool 31 is stopped), and Figure 17(c) is a diagram showing how the moving body 10 is moved continuously and the second inspection tool 31 is oscillated.
[0078] The structure inspection apparatus 1a of variant example 1 basically has the same configuration as the structure inspection apparatus 1 of embodiment 1, but differs from the structure inspection apparatus 1 of embodiment 1 in that it does not have a first inspection tool (see Figure 16).
[0079] In the structure inspection device 1a according to the first modification, a first inspection tool is not provided, but a second inspection tool 31 performs pendulum motion, and reflected wave information can be obtained in a direction along the moving direction of the moving body 10 as well as in a direction perpendicular to the moving direction of the moving body 10. Therefore, by making the moving interval of the moving body shorter than that of the first embodiment (see FIG. 17), not only can reflected wave information in a direction perpendicular to the moving direction of the moving body 10 be obtained in detail, but also reflected wave information in a direction along the moving direction of the moving body 10 can be obtained.
[0080] Thus, the structure inspection device 1a according to the first modification is different from the structure inspection device 1 according to the first embodiment in that the first inspection tool is not provided, but the second inspection unit 30 is provided, in which the second inspection tool 31 using an electromagnetic wave radar is connected to the moving body 10 and can move in a direction having at least a component perpendicular to the moving direction of the moving body 10, and therefore the second inspection unit 30 can obtain reflected wave information in a direction along the moving direction of the moving body 10 as well as reflected wave information in a direction perpendicular to the moving direction of the moving body 10. Therefore, even when there are voids, reinforcing bars, piping, etc., in the ground, asphalt, or inside a concrete structure, etc., or when multiple reinforcing bars, etc. are arranged in a dense state, such as in double reinforcing bars, the internal condition of the structure can be grasped with high accuracy.
[0081] Furthermore, according to the structure inspection device 1a of the first modification, since the first inspection tool is not provided, the internal state of the structure can be grasped with high accuracy with a relatively simple configuration.
[0082] In addition, the structure inspection device 1a of variant example 1 has a configuration similar to that of the structure inspection device 1 of embodiment 1 except that it does not have a first inspection tool, and therefore has the relevant effects among the effects of the structure inspection device 1 of embodiment 1.
[0083] [Variation 2] FIG. 18 is a diagram showing a structure inspection device 2a according to Modification 2. FIG. 18(a) is a schematic plan view of the structure inspection device 2a, and FIG. 18(b) is a schematic side view of the structure inspection device 2a. FIG. 20 is a diagram showing the operation of the second inspection unit 30a in Modification 2. FIG. 19(a) is a diagram showing a state in which the moving body 10 is moved continuously and the second inspection tool 31 is moved back and forth, FIG. 19(b) is a diagram showing a state in which the moving body 10 is moved intermittently and the second inspection tool 31a is moved from one end to the other end, and FIG. 19(c) is a diagram showing a state in which the moving body 10 is moved intermittently and the second inspection tool 31a is moved back and forth.
[0084] The structure inspection apparatus 1a of the modified example 2 basically has the same configuration as the structure inspection apparatus 2 of the embodiment 2, but differs from the structure inspection apparatus 2 of the embodiment 2 in that it does not have a first inspection tool (see FIG. 18).
[0085] Similarly to the structure inspection device 1a according to the first modification, the structure inspection device 2a according to the second modification does not have a first inspection tool, but by moving the second inspection tool 31a back and forth from one end to the other end while moving the moving body 10 (see FIG. 19(a)), it is possible to obtain information including both reflected wave information in a direction along the moving direction of the moving body 10 and reflected wave information in a direction perpendicular to the moving direction of the moving body 10. By making the moving interval of the moving body shorter than that in the second embodiment (see FIG. 19), it is possible to obtain more detailed reflected wave information in a direction along the moving direction of the moving body 10, so that even with only the second inspection tool, it is possible to grasp the internal state of the structure with sufficiently high accuracy.
[0086] As shown in Figures 19(b) and 19(c), when the second inspection tool 31a moves in a direction perpendicular to the movement direction of the moving body 10, reflected wave information in the direction along the movement direction of the moving body 10 cannot be obtained. However, reflected wave information in the direction perpendicular to the movement direction of the moving body 10 can be repeatedly obtained from various directions by the reciprocating motion of the second inspection tool 31a. Therefore, by shortening the movement interval of the moving body, detailed reflected wave information can be obtained, and the internal condition of the structure can be grasped with relatively high accuracy.
[0087] Thus, the structure inspection device 2a according to the second modification differs from the structure inspection device 2 according to the second embodiment in that the first inspection tool is not provided, but since the second inspection tool 31a includes the second inspection unit 30a that is movable in a direction having at least a component perpendicular to the moving direction of the moving body 10, the second inspection unit 30 can obtain reflected wave information in a direction along the moving direction of the moving body 10 as well as reflected wave information in a direction perpendicular to the moving direction of the moving body 10. Therefore, even when there are internal voids, reinforcing bars, piping, etc. in the ground, asphalt, or inside a concrete structure, etc., or when multiple reinforcing bars, etc. are densely arranged, such as in double reinforcing bars, the internal condition of the structure can be grasped with high accuracy.
[0088] Furthermore, according to the structure inspection device 2a of the modified example 2, since the first inspection tool is not provided, it is possible to provide a relatively simple, inexpensive, and lightweight configuration. Although the first inspection tool is not provided, by shortening the movement interval of the moving body compared to the embodiment 1, the second inspection tool can receive the reflected wave information with high accuracy, and therefore, by analyzing the reflected wave information received by the second inspection tool, the internal condition of the structure can be grasped with high accuracy.
[0089] In addition, the structure inspection device 2a of the modified example 2 has a configuration similar to that of the structure inspection device 2 of the embodiment 2 except that it does not have a first inspection tool, and therefore has the relevant effects among the effects of the structure inspection device 2 of the embodiment 2.
[0090] Although the present invention has been described based on the above embodiment, the present invention is not limited to the above embodiment. The present invention can be embodied in various forms without departing from the spirit of the present invention, and for example, the following modifications are also possible.
[0091] (1) The number, shape, position, size, etc. of the components described in each of the above embodiments are examples and can be changed without impairing the effects of the present invention. For example, in each of the above embodiments, the second inspection unit has one inspection tool, but the present invention is not limited to this. The second inspection unit may have multiple inspection tools.
[0092] (2) In the structure inspection devices 3 to 5 according to the above-mentioned embodiments 3 to 5, the first inspection tool is provided, but the first inspection tool may not be provided (structure inspection device 3a according to modified example 3 (see FIG. 20), structure inspection device 4a according to modified example 4 (see FIG. 21), and structure inspection device 5a according to modified example 5 (see FIG. 22)). Even in this case, as in modified examples 1 and 2, the second inspection tool is provided with a second inspection unit that can move in a direction having both a component along the moving direction of the moving body and a component perpendicular to the moving direction of the moving body. Therefore, the reflected wave information in the direction along the moving direction of the moving body and the reflected wave information in the direction perpendicular to the moving direction of the moving body can be obtained by the second inspection unit. Therefore, even when there are voids, reinforcing bars, pipes, etc. in the ground, asphalt, or inside a concrete structure, or when multiple reinforcing bars, etc. are arranged in a dense state, or when multiple reinforcing bars, etc. are overlapped as in double reinforcing bars, the internal state of the structure can be grasped with high accuracy. Furthermore, by making the movement interval of the moving body shorter than in embodiments 3-5, the second inspection tool can receive the reflected wave information with high accuracy, and the internal condition of the structure can be grasped with high accuracy by analyzing the reflected wave information received by the second inspection tool.
[0093] (3) In the above-mentioned embodiments 1, 4, and 5 and modified examples 1, 4, and 5, the second inspection tool connecting part is a second inspection tool connecting part of one plate, but the present invention is not limited to this. For example, the second inspection tool connecting part may be a second inspection tool connecting part 32a having a link structure using two parallel arms (for example, the structure inspection device 1b according to modified example 6 (see FIG. 23)). In this case, the second inspection tool 31 swings while always facing the same direction (direction perpendicular to the moving direction) with respect to the moving direction of the moving body 10 (see FIG. 23(b)). Therefore, there is an advantage that it is not necessary to consider the inclination of the second inspection tool 31 when analyzing data of the reflected wave of the second inspection tool, and data analysis of the reflected wave information is facilitated.
[0094] (4) In the above-mentioned embodiments 1, 4, and 5, the second inspection tool is moved in a direction including a component perpendicular to the moving direction of the moving body by swinging, and in the above-mentioned embodiments 2 and 3, the second inspection tool is moved by a rail, but the present invention is not limited to this. For example, the second inspection tool may be moved in a direction including a component perpendicular to the moving direction of the moving body by using a spring, or the second inspection tool may be moved in a direction including a component perpendicular to the moving direction of the moving body by any other appropriate method.
[0095] (5) In each of the above embodiments, the first inspection tool 21 is disposed so as to be perpendicular to the moving direction of the moving body 10, but the present invention is not limited to this. The first inspection tool may be disposed obliquely to the moving direction of the moving body.
[0096] (6) In the second embodiment, the rails 51 are arranged so as to be perpendicular to the direction of movement of the moving body 10, but the present invention is not limited to this. The rails 51 may be arranged at an angle to the direction of movement of the moving body.
[0097] (7) In the above embodiment 3, the second inspection tool is moved in a quasi-linear manner by interlocking the moving speeds of the movable body 10 and the second inspection tool 31a with the inclination of the rail, and in the above embodiment 5, the moving speeds of the movable body 10 and the second inspection tool 31a with the extension and contraction of the second inspection tool connecting portion 32c, but the present invention is not limited to this. For example, the second inspection tool may be moved in a quasi-linear manner by performing a quasi-linear motion using a so-called Watts link mechanism.
[0098] (8) In the above embodiments, a vehicle that travels on a floor surface is used as the moving body, but the present invention is not limited to this. A vehicle that travels (climbs) along the surface of a structure, such as an inclined surface, vertical surface, or ceiling surface of a structure, or a flying object that travels through the air, such as a drone, may be used as the moving body.
[0099] (9) In each of the above embodiments, a driving unit is provided on the movable body, and a self-propelled movable body is used, but the present invention is not limited to this. A movable body that does not have a driving unit and is assumed to be moved by an operator may be used.
[0100] (10) In each of the above embodiments, the first inspection tool and the second inspection tool are provided, but it is also possible to consider a case where the second inspection tool is not provided. In this case, by arranging a large number of first inspection tools and obtaining a large amount of reflected wave information, the internal condition of the structure can be grasped with high accuracy and from multiple angles.
[0101] (11) In the above embodiments, wheels consisting of drive wheels and driven wheels are used as the means for moving the moving body, but the present invention is not limited to this. Any suitable means for moving the moving body, such as a caterpillar using a running track, can be used. [Explanation of symbols]
[0102] 1, 1a, 1b, 2, 2a, 3, 3a, 4, 4a, 5, 5a...Structural inspection device, 10...Moving body, 11...Main unit, 12...Driving wheel, 13...Driven wheel, 15...Main body driving section, 20...First inspection section, 21, 21b...First inspection tool, 22...First inspection tool connecting section, 23...First irradiation section, 24...First receiving section, 26, 36...Wheel, 27...First inspection tool unit, 30, 30a, 30b, 30c...Second inspection section, 31, 31 a, 31b, 31c...second inspection tool, 32, 32c...second inspection tool connecting section, 33...second irradiation section, 34...second receiving section, 35...holding plate, 37...rotating shaft, 40, 52...second inspection tool moving mechanism, 41...link motor, 42...link drive wheel, 43...follower arm, 44...joint section, 51...rail, 53...support plate, 54...rail extension direction switching mechanism, 70...analysis section, 80...display section, 100...structure inspection system
Claims
1. A structure inspection device that inspects a structure using an electromagnetic wave radar, A moving body that moves continuously or intermittently along a surface of the structure; a first inspection unit connected to the moving body, the first inspection tool using an electromagnetic wave radar being arranged in a direction intersecting the moving direction of the moving body; A structure inspection device characterized in that it comprises a second inspection unit connected to the moving body and having a second inspection tool using an electromagnetic wave radar that is movable on the surface of the structure in a direction that has at least a component perpendicular to the movement direction of the moving body.
2. Each of the first inspection tools has a first irradiating unit that irradiates one surface of the structure with an electromagnetic wave and a first receiving unit that receives a reflected wave of the electromagnetic wave irradiated from the first irradiating unit, 2. The structure inspection device according to claim 1, wherein the second inspection tool has a second irradiating unit that irradiates electromagnetic waves onto one side of the structure, and a second receiving unit that receives reflected waves of the electromagnetic waves irradiated from the second irradiating unit.
3. 3. The structure inspection device according to claim 1, further comprising a second inspection tool moving mechanism that swings the second inspection tool along the surface of the structure.
4. The second inspection unit has a second inspection tool connecting portion that connects the movable body and the second inspection tool, 4. A structure inspection device according to claim 3, wherein the second inspection tool connecting portion has an extension mechanism that extends or retracts a length from a fulcrum about which the second inspection tool swings to the second inspection tool.
5. A structure inspection device as described in claim 1 or 2, further comprising a rail extending in a direction having at least a component perpendicular to the movement direction of the movable body, and a second inspection tool moving mechanism that moves the second inspection tool back and forth along the rail.
6. The structure inspection device according to claim 5 , further comprising a rail extension direction switching mechanism that switches the direction in which the rail extends.
7. A structure inspection method for inspecting a structure using a structure inspection device including: a moving body that moves continuously or intermittently along a surface of the structure; a first inspection unit that is connected to the moving body and has a first inspection tool using an electromagnetic wave radar arranged in a direction intersecting the moving direction of the moving body; and a second inspection unit that is connected to the moving body and has a second inspection tool using an electromagnetic wave radar that can move in a direction having at least a component perpendicular to the moving direction of the moving body, While the moving body moves continuously or intermittently, A first irradiating unit of the first inspection unit irradiates an electromagnetic wave onto one surface of the structure, and a first receiving unit of the first inspection unit receives the reflected wave, and A structure inspection method characterized in that while moving the second inspection tool in a direction having at least a component perpendicular to the movement direction of the moving body on the surface of the structure, a second irradiation unit of the second inspection tool irradiates electromagnetic waves onto one side of the structure, and a second receiving unit of the second inspection tool receives the reflected waves, thereby inspecting the structure.
8. A structure inspection device according to any one of claims 1 to 6, an analysis unit that analyzes an internal state of the structure to be inspected based on information including at least first reflected wave information obtained by a first inspection unit of the structure inspection device, second reflected wave information obtained by a second inspection unit of the structure inspection device, and position information of the second inspection tool of the structure inspection device; A structure inspection system comprising: a display unit that displays an internal state of the structure based on the analysis results of the analysis unit.
Citation Information
Patent Citations
Radio measuring apparatus
JP1996043540A
Buried object-investigating device and display processing method in it
JP2000019257A
Ground probing system
JP2004245742A
Antenna for underground search radar
JP2008275639A
Cantilevered manipulator for autonomous non-contact scanning of natural surfaces for the deployment of landmine detectors
US6333631B1