Measuring device and measuring method

Abstract

To provide a measuring device that is able to obtain more accurate information on the state of a to-be measured object moving on a production line.SOLUTION: A measurement device 1 according to the present disclosure includes: a first measuring module 10 having a probe unit 11 that emits a probe L1 to a first region R1 of a front surface of a to-be measured object A moving on a production line, and a first detection unit 12 that detects the probe L1 including information on a first parameter of the to-be measured object; a second measuring module 20 having an emitting unit 21 that emits emission light to a second region R2 overlapping the first region R1, and a second detection unit 22 that detects the emission light including information on a second parameter of the to-be measured object A; and a control unit 31 that controls the probe unit 11 and the emitting unit 21 so that emitting timing of the probe L1 to the first region R1 and emitting timing of the emission light to the second region R2 are the same.SELECTED DRAWING: Figure 2

Description

[Technical Field]

[0001] The present disclosure relates to a measurement device and a measurement method. [Background technology]

[0002] 2. Description of the Related Art Conventionally, there is known a technique for measuring parameters including the thickness and basis weight of an object moving in a moving direction on a production line.

[0003] For example, Patent Document 1 discloses a radiation inspection device that uses a radiation detector to detect radiation emitted from a radiation source and passing through an object to be measured, and measures the basis weight of the object. The radiation inspection device described in Patent Document 1 calculates air weight based on a temperature detected by a temperature sensor and air pressure detected by an air pressure sensor, and corrects the basis weight based on the calculated air weight.

[0004] It is also possible to construct a measuring device that includes, for example, a laser-based thickness gauge in addition to the basis weight meter described in Patent Document 1. Such a measuring device is capable of measuring multiple parameters of the object to be measured. In such a measuring device, measurement modules such as the basis weight meter and thickness gauge arranged on the same frame can each move in a direction perpendicular to the direction of movement of the object to be measured moving along the production line. [Prior art documents] [Patent documents]

[0005] [Patent Document 1] Japanese Patent Application Laid-Open No. 2013-108859 Summary of the Invention [Problem to be solved by the invention]

[0006] As with conventional technology, it is possible to operate multiple measurement modules on the same frame. However, a certain physical distance exists between each measurement module. As a result, even if multiple measurement modules perform measurements at the same time, only measurement results reflecting the state at different positions on the object under test can be obtained. In other words, it is difficult to obtain measurement results that reflect the state at the same position on the object under test using multiple measurement modules. Therefore, it is difficult to obtain more accurate information about the state of the object under test through measurements.

[0007] An object of the present disclosure is to provide a measuring device and a measuring method that are capable of obtaining more accurate information about the state of an object to be measured moving on a production line. [Means for solving the problem]

[0008] In some embodiments, the measuring device includes a first measurement module having a probe unit that irradiates a probe onto a first area on the surface of an object to be measured moving down a production line and a first detection unit that detects the probe, which includes information about a first parameter of the object to be measured; a second measurement module having an irradiation unit that irradiates irradiation light onto a second area overlapping the first area and a second detection unit that detects the irradiation light, which includes information about a second parameter of the object to be measured; and a control unit that controls the probe unit and the irradiation unit so that the timing of irradiating the first area with the probe and the timing of irradiating the second area with the irradiation light are the same.

[0009] This allows for more accurate information about the condition of the workpiece moving along the production line. The measurement device overlaps the first and second regions and synchronizes the timing of the probe's irradiation on the first region and the light's irradiation on the second region, enabling simultaneous, coherent measurement of multiple parameters using multiple measurement modules. Even if there is a predetermined physical distance between each measurement module on the frame, the measurement device can easily obtain measurement results that reflect the condition of the workpiece at the same position and time. In other words, the measurement device can examine the characteristics of the workpiece more closely aligned with the actual state of the workpiece.

[0010] In one embodiment, the measurement device may include a reflection system that reflects at least one of the probe and the irradiated light so that the first and second regions overlap each other on the surface. This makes it possible to easily configure the optical path of the irradiated light for overlapping the first and second regions on the surface of the object to be measured. For example, it is also possible to configure the optical path of the irradiated light so that the radiation and the irradiated light are perpendicularly incident on the object to be measured for both the beta-ray basis weight meter constituting the first measurement module and the non-contact thickness meter constituting the second measurement module. This simplifies the arrangement of the radiation source unit and the first detection unit, as well as the arrangement of the optical system in the second measurement module. This therefore facilitates the manufacture of the measurement device and improves its manufacturing efficiency.

[0011] In one embodiment, the reflecting system may include an optical mirror that reflects the irradiated light on an optical path connecting the irradiating unit to the second region, thereby achieving the same effect as described above.

[0012] In one embodiment, at least one of an axis of the first measurement module connecting the probe unit and the first detection unit and an optical axis of the second measurement module may be tilted obliquely with respect to the surface. This makes it easy to overlap the first and second regions on the surface of the object to be measured without using a reflection system. For example, by tilting either the beta-ray basis weight meter constituting the first measurement module or the non-contact thickness meter constituting the second measurement module obliquely with respect to the surface of the object to be measured, it becomes easy to overlap the first and second regions on the surface of the object to be measured.

[0013] In one embodiment, the axis of the first measurement module may be perpendicular to the surface, and the optical axis of the second measurement module may be oblique to the surface, thereby achieving the same effect as above.

[0014] In one embodiment, the control unit may calculate a third parameter of the object under test based on the measured first parameter and second parameter, thereby enabling the state of the object under test to be examined from multiple angles based on more parameters.

[0015] In one embodiment of the measuring device, when the control unit determines that the state of the object is inappropriate, the control unit may feedback-control an upstream operating element in the production line to optimize at least one of the first parameter and the second parameter. This allows the production process of the object to be adjusted to optimize the state of the object. For example, the measuring device may feedback-control the operating element by adjusting the temperature distribution and extrusion pressure of a nozzle that squeezes out a material so that the thickness and density of a sheet-like object are uniform. This allows the measuring device to improve the quality of the object produced on the production line.

[0016] In one embodiment, the first parameter may include basis weight, and the second parameter may include thickness, allowing the measuring device to obtain more accurate information about the condition of the object being measured as it moves along a production line based on the basis weight and thickness.

[0017] In some embodiments, a measurement method includes the steps of irradiating a probe onto a first area on the surface of an object to be measured moving on a production line, detecting the probe containing information about a first parameter of the object to be measured, irradiating a second area overlapping the first area with irradiation light, and detecting the irradiation light containing information about a second parameter of the object to be measured, wherein the timing of irradiating the probe onto the first area and the timing of irradiating the irradiation light onto the second area are identical to each other.

[0018] This allows for more accurate information about the state of the workpiece moving along the production line. The measurement device that executes the measurement method overlaps the first and second regions and synchronizes the timing of the probe irradiation on the first region and the timing of the light irradiation on the second region, enabling simultaneous, coherent measurement of multiple parameters using multiple measurement modules. Even if there is a predetermined physical distance between each measurement module on the frame, the measurement device can easily obtain measurement results that reflect the state of the workpiece at the same position and time. In other words, the measurement device can examine the characteristics of the workpiece that are more in line with the actual state of the workpiece. [Effects of the Invention]

[0019] According to the present disclosure, it is possible to provide a measuring device and a measuring method that are capable of obtaining more accurate information about the state of an object to be measured moving on a production line. [Brief explanation of the drawings]

[0020] [Figure 1] 1 is a functional block diagram showing a schematic configuration of a measurement device according to a first embodiment of the present disclosure. [Figure 2]2 is a schematic diagram showing the arrangement of a first measurement module and a second measurement module of the measurement device of FIG. 1. FIG. [Figure 3] 2 is a flowchart illustrating an example of the operation of the measurement device of FIG. [Figure 4] FIG. 10 is a functional block diagram showing a schematic configuration of a measurement device according to a second embodiment of the present disclosure. [Figure 5] 5 is a schematic diagram showing a first example of an arrangement of a first measurement module and a second measurement module of the measurement device of FIG. 4. FIG. [Figure 6] 5 is a schematic diagram showing a second example of the arrangement of the first measurement module and the second measurement module of the measurement device of FIG. 4. FIG. DETAILED DESCRIPTION OF THE INVENTION

[0021] The background and problems of the prior art will now be described in more detail.

[0022] Conventionally, a plurality of measurement modules are known that measure parameters including the thickness and basis weight of an object moving in a moving direction on a production line.

[0023] For example, a transmission basis weight meter is a measurement module that measures the basis weight of an object without contact, utilizing the property that radiation attenuates due to absorption and scattering as it passes through a material. One example of a transmission basis weight meter is a beta-ray basis weight meter. Beta-ray basis weight meter measures the basis weight of an object by utilizing the property that beta rays emitted from a beta-ray source attenuate according to the basis weight of the object. Beta-ray basis weight meters are often used to measure the basis weight of objects including paper, as well as relatively thin films and plastic sheets of a few millimeters or less. Beta-ray sources commonly used include 147Pm, 85Kr, and 90Sr, depending on the thickness range of the object. A beta-ray basis weight meter irradiates one side of the object with beta rays and detects the beta rays that pass through the object and exit the other side.

[0024] For example, a non-contact thickness gauge is a measurement module that uses two laser displacement sensors to sandwich an object from above and below and measure its thickness without contact. In a non-contact thickness gauge, one laser displacement sensor placed above the object measures the position of the object's top surface, while the other laser displacement sensor placed below the object measures the position of the object's bottom surface. The non-contact thickness gauge calculates the object's thickness based on the difference between the measured positions of the top and bottom surfaces.

[0025] When measuring multiple parameters of a sheet-like object moving along a production line, multiple measurement modules are installed on a frame extending in a direction perpendicular to the moving direction. Each of the multiple measurement modules is movable in a direction perpendicular to the moving direction of the object while being arranged on the same frame. By installing multiple measurement modules on the same frame in this way, it becomes possible to simultaneously measure various parameters of the object.

[0026] As described above, it is possible to operate multiple measurement modules on the same frame in conventional technology. However, a certain physical distance exists between each measurement module. As a result, even if multiple measurement modules perform measurements at the same time, only measurement results reflecting the state at different positions on the object under test can be obtained. In other words, it has been difficult to obtain measurement results that reflect the state at the same position on the object under test using multiple measurement modules. Therefore, it has been difficult to obtain more accurate information about the state of the object under test through measurements.

[0027] In addition, when measuring on a production line, the object being measured moves over time. That is, the positional relationship between the frame on which the measurement module is installed and the object being measured changes. This makes it even more difficult to obtain measurement results that reflect the state of the object at the same position. Therefore, it is difficult to meet user demands for more detailed and accurate confirmation of the state of the object being measured.

[0028] Furthermore, because it is difficult to measure the state at the same position on the object being measured, there is also the problem that errors occur due to differences in measurement positions on the object being measured when calculating other parameters of the object being measured based on multiple parameters measured by multiple measurement modules.

[0029] In order to solve the above problems, the present disclosure aims to provide a measurement device and a measurement method that can obtain more accurate information about the state of a measured object moving on a production line. Hereinafter, one embodiment of the present disclosure will be mainly described with reference to the accompanying drawings.

[0030] (First embodiment) FIG. 1 is a functional block diagram showing a schematic configuration of a measurement device 1 according to a first embodiment of the present disclosure.

[0031] The measuring device 1 measures a plurality of parameters of an object moving in a moving direction on a production line. In this specification, the "object" includes, for example, paper, as well as relatively thin films and plastic sheets of a few millimeters or less. The "parameters" include, for example, thickness, basis weight, density, material filling rate, and porosity. The measuring device 1 includes a first measuring module 10, a second measuring module 20, and a control module 30.

[0032] The measuring device 1 measures a first parameter of the object to be measured using a first measurement module 10. In this specification, the "first parameter" includes, for example, basis weight from among the multiple parameters described above. The first measurement module 10 includes, for example, a beta-ray basis weight meter. The first measurement module 10 has a radiation source unit 11 that irradiates a first region on the surface of the object to be measured as it moves along the production line with radiation, and a first detection unit 12 that detects radiation that includes information about the first parameter of the object to be measured. The "radiation" corresponds to a "probe" in the claims. The "radiation source unit" corresponds to a "probe unit" in the claims.

[0033] The radiation source unit 11 has a low-energy β-ray source including 147Pm and 85Kr, etc. The radiation source unit 11 irradiates a first region on the surface of an object to be measured that is moving on a production line with low-energy β-rays.

[0034] The first detection unit 12 has an ionization chamber and detects β rays that are irradiated from the radiation source unit 11 to the first region, pass through the object under test, and are attenuated, and contain information about the first parameter of the object under test.

[0035] The measuring device 1 uses a first measurement module 10 to measure a first parameter of the object based on the beta rays detected by a first detection unit 12, utilizing the property that low-energy beta rays irradiated from a radiation source unit 11 having a beta-ray source attenuate depending on the basis weight of the object. The type of low-energy beta-ray source, including 147Pm and 85Kr, is determined depending on the thickness range of the object. The first measurement module 10 irradiates one side of the object with beta rays using the radiation source unit 11, and detects the beta rays that pass through the object and exit from the other side using the first detection unit 12.

[0036] The measurement device 1 measures a second parameter of the object using a second measurement module 20. In this specification, the "second parameter" includes, for example, the thickness of the above-mentioned multiple parameters. The second measurement module 20 includes, for example, a non-contact thickness meter. The second measurement module 20 includes an irradiation unit 21 that irradiates a second area overlapping with a first area on the surface of the object moving on the production line with irradiation light, and a second detection unit 22 that detects the irradiation light containing information about the second parameter of the object. In addition, the second measurement module 20 includes a reflection system 23.

[0037] The irradiation unit 21 has a laser light source that irradiates the second region of the object with irradiation light. The wavelength band of the irradiation light irradiated from the laser light source is included in any wavelength range in which the thickness of the object can be measured in a non-contact manner as a laser displacement sensor.

[0038] The second detection unit 22 has a photodetector capable of detecting the irradiated light emitted from the laser light source of the irradiation unit 21. The wavelength band of the photodetector matches the wavelength band of the irradiated light. The second detection unit 22 detects the irradiated light that is irradiated from the irradiation unit 21 to the second region and reflected by the surface of the object to be measured, and that contains information about the second parameter of the object to be measured.

[0039] The reflection system 23 includes any optical system that reflects the irradiated light so that the first area and the second area overlap each other on the surface of the object to be measured. The reflection system 23 includes at least one optical mirror that reflects the irradiated light on the optical path connecting the irradiation unit 21 to the second area.

[0040] The measuring device 1 uses two laser displacement sensors in the second measurement module 20 to sandwich the object from above and below and measure the second parameter in a non-contact manner. The measuring device 1 measures the position of the top surface of the object using one laser displacement sensor arranged above the object, and measures the position of the bottom surface of the object using the other laser displacement sensor arranged below the object. The measuring device 1 calculates the thickness of the object based on the difference between the positions of the top and bottom surfaces of the object measured using the second measurement module 20.

[0041] Fig. 2 is a schematic diagram showing the arrangement of the first measurement module 10 and the second measurement module 20 of the measurement device 1 in Fig. 1. The measurement device 1 is configured by combining a beta-ray basis weight meter constituting the first measurement module 10 and a non-contact thickness meter constituting the second measurement module 20.

[0042] The first measurement module 10 and the second measurement module 20 are installed on a frame F extending in a direction D2 perpendicular to the moving direction D1 of a sheet-like object A to be measured, which moves along the production line in the moving direction D1. Here, the moving direction D1 is a direction perpendicular to the paper surface and includes a direction from the front side to the back side of the paper surface. The direction D2 includes a left-right direction.

[0043] Each of the first measurement module 10 and the second measurement module 20 is arranged on the same frame F and is movable in a direction D2 perpendicular to the movement direction D1 of the object A moving along the production line. The measurement apparatus 1 simultaneously measures multiple parameters of the object A using the first measurement module 10 and the second measurement module 20 installed on the same frame F. The measurement apparatus 1 can also measure the first parameter and the second parameter at multiple positions on the object A while moving each of the first measurement module 10 and the second measurement module 20 on the same frame F in conjunction with an automatic stage system. The measurement apparatus 1 can also measure changes in thickness and basis weight on one side of the object A based on the measurement results at each position on the object A.

[0044] The first measurement module 10 is disposed relative to the object A to be measured, which is moving on the production line in the movement direction D1, so as to sandwich the object A in the vertical direction. More specifically, the radiation source unit 11 of the first measurement module 10 is disposed below the object A to be measured. The first detection unit 12 of the first measurement module 10 is disposed above the object A to face the radiation source unit 11 in the vertical direction. The axis of the first measurement module 10 connecting the radiation source unit 11 and the first detection unit 12 is perpendicular to the surface of the object A to be measured, i.e., the top and bottom surfaces.

[0045] Radiation L1 irradiated from the radiation source unit 11 is incident perpendicularly on the bottom surface of the object A to be measured. The radiation L1 passes through the inside of the object A from the bottom surface and is emitted perpendicularly from the top surface of the object A to be measured. The radiation L1 emitted perpendicularly from the top surface of the object A to be measured is detected by the first detection unit 12. The radiation L1 travels perpendicularly to the object A to be measured and passes through first regions R1 on each of the top and bottom surfaces of the object A to be measured.

[0046] The second measurement module 20 is arranged parallel to the first measurement module 10 in the direction D2. The second measurement module 20 is arranged relative to the object A to be measured so as to sandwich the object A, which is moving on the production line in the moving direction D1, in the vertical direction.

[0047] More specifically, the irradiation unit 21 of the second measurement module 20 has a first laser light source 211 and a second laser light source 212. The second detection unit 22 of the second measurement module 20 has a first photodetector 221 and a second photodetector 222. A set C1 of the first laser light source 211 and the first photodetector 221 is disposed below the object A to be measured. A set C2 of the second laser light source 212 and the second photodetector 222 is disposed above the object A to be measured so as to face the set C1 in the vertical direction. An axis connecting the sets C1 and C2 is perpendicular to the surfaces of the object A to be measured, i.e., the upper and lower surfaces.

[0048] The first irradiation light L21 emitted from the first laser light source 211 of the irradiation unit 21 is reflected by two optical mirrors 23a and 23b included in the reflection system 23, and propagates so that its optical path immediately before entering the object A overlaps within the incident region of the radiation L1. The first irradiation light L21 is perpendicularly incident on the bottom surface of the object A. The first irradiation light L21 is irradiated onto a second region R2 included in the first region R1 on the bottom surface of the object A, and is reflected perpendicularly by the second region R2. The first irradiation light L21 reflected perpendicularly from the bottom surface of the object A is reflected by the two optical mirrors 23b and 23a, propagates along the original optical path, and is detected by the first photodetector 221.

[0049] The second irradiation light L22 irradiated from the second laser light source 212 of the irradiation unit 21 is reflected by two optical mirrors 23c and 23d included in the reflection system 23, and propagates so that its optical path immediately before entering the object A overlaps within the emission region of the radiation L1. The second irradiation light L22 is perpendicularly incident on the top surface of the object A. The second irradiation light L22 is irradiated onto a second region R2 included in the first region R1 on the top surface of the object A, and is reflected perpendicularly by the second region R2. The second irradiation light L22 reflected perpendicularly from the top surface of the object A is reflected by the two optical mirrors 23d and 23c, propagates along the original optical path, and is detected by the second photodetector 222.

[0050] 1 again, the control module 30 is connected to the first measurement module 10 and the second measurement module 20 and controls the operations of the first measurement module 10 and the second measurement module 20. The control module 30 has a control unit 31, a memory unit 32, and a communication unit 33.

[0051] The control unit 31 has one or more processors. In one embodiment, the "processor" may be, but is not limited to, a general-purpose processor or a dedicated processor specialized for a particular process. The control unit 31 is communicably connected to each component of the measurement device 1 and controls the operation of the measurement device 1 as a whole.

[0052] The control unit 31 controls the radiation source unit 11 and the irradiation unit 21 so that the timing of irradiating the first region R1 with the radiation L1 and the timing of irradiating the second region R2 with the irradiation light including the first irradiation light L21 and the second irradiation light L22 are the same. The control unit 31 synchronizes the radiation source unit 11 and the irradiation unit 21 with each other to irradiate the radiation L1 and the irradiation light, respectively.

[0053] The control unit 31 calculates a first parameter of the object A under measurement based on the intensity of the radiation L1 detected by the first detection unit 12 of the first measurement module 10. The control unit 31 calculates a second parameter of the object A under measurement based on the first irradiation light L21 and the second irradiation light L22 detected by the second detection unit 22 of the second measurement module 20. The control unit 31 calculates a third parameter of the object A under measurement based on the measured first and second parameters. The "third parameter" includes, for example, density, packing ratio, and porosity from among the above-mentioned multiple parameters.

[0054] When the density of the object A is non-uniform, the control unit 31 2 ]÷thickness [m] gives the apparent density ρ [g / m 3 When the density of the object A is uniform and voids are mixed in the object A, the control unit 31 calculates the apparent density ρ [g / m 3 ]÷Reference density ρ0[g / m 3]. The control unit 31 calculates the porosity by 1 - filling rate. Here, the apparent density means a value calculated based on a first parameter of the object A to be measured calculated based on detection information from the first detection unit 12 and a second parameter of the object A to be measured calculated based on detection information from the second detection unit 22. The reference density means a uniform density in a portion of the object A to be measured where no voids exist.

[0055] The storage unit 32 has any storage module including a hard disk drive (HDD), a solid state drive (SSD), an electrically erasable programmable read-only memory (EEPROM), a read-only memory (ROM), and a random access memory (RAM). The storage unit 32 functions as, for example, a main storage device, an auxiliary storage device, or a cache memory. The storage unit 32 stores any information used in the operation of the measurement device 1.

[0056] The memory unit 32 stores the intensity of the radiation L1 detected by the first detection unit 12. The memory unit 32 stores the intensities of the first irradiation light L21 and the second irradiation light L22 detected by the second detection unit 22. The memory unit 32 stores the first parameter, the second parameter, and the third parameter calculated by the control unit 31. The memory unit 32 stores system programs, application programs, and the like. The memory unit 32 is not limited to being built into the measurement device 1, and may have an external memory module connected via a digital input / output port such as a USB (Universal Serial Bus).

[0057] The communication unit 33 has any communication module that is communicatively connected to various control elements installed on the production line that produces the object A to be measured. In this specification, the "control element" includes, for example, a nozzle that squeezes out a material, a slit, etc. The measuring device 1 is communicatively connected to various control elements installed on the production line via the communication unit 33. The control unit 31 can transmit control information of the control elements to the control elements via the communication unit 33. The control unit 31 can receive information about the operating status of the control elements from the control elements via the communication unit 33.

[0058] 2 again, the two optical mirrors 23b and 23d arranged within the region through which the radiation L1 passes are arranged with an area that does not interfere with measurement of the first parameter using the radiation L1. That is, the beam diameters of the two irradiation light beams emitted from the two laser light sources, respectively, are smaller than the beam diameter of the radiation L1. Therefore, the attenuation rate of the radiation L1 by the two optical mirrors 23b and 23d is small, and measurement of the first parameter using the radiation L1 is not interfered with.

[0059] Here, we will explain the measurement principle of the β-ray basis weight meter that constitutes the first measurement module 10 and the influence of the presence or absence of an optical mirror. The transmission characteristics of radiation L1 are generally expressed by the following formula 1.

[0060] [Number 1] I=I0·exp(-α*BW) (Equation 1) I represents the intensity of radiation L1 at the first detection unit 12. I0 represents the intensity of radiation L1 when the object A is not present, i.e., the intensity of radiation L1 incident on the object A. α represents the absorption coefficient of the object A, which is determined by the material. BW represents the basis weight of the object A.

[0061] The control unit 31 of the measurement device 1 can calculate the basis weight BW of the object A by calculating the ratio I / I0 of the intensities of the radiation L1 detected by the first detection unit 12 when the object A is present and when it is not. Even if the radiation L1 is attenuated at a certain rate due to obstacles such as optical mirrors 23b and 23d being placed in the path of the radiation L1, the ratio I / I0 is not affected because the same attenuation rate is multiplied by both I and I0. Therefore, the measurement device 1 can accurately measure the first parameter.

[0062] Fig. 3 is a flowchart for explaining an example of the operation of the measurement device 1 in Fig. 1. With reference to Fig. 3, an example of an information processing method including a measurement method executed by the measurement device 1 in Fig. 1 will be described.

[0063] In step S100, the control unit 31 of the measurement device 1 uses the radiation source unit 11 of the first measurement module 10 to irradiate a first region R1 on the surface of the object A being measured, which is moving on the production line, with radiation L1. The control unit 31 of the measurement device 1 uses the irradiation unit 21 of the second measurement module 20 to irradiate a second region R2 overlapping with the first region R1 with irradiation light including first irradiation light L21 and second irradiation light L22. At this time, the control unit 31 controls the radiation source unit 11 and the irradiation unit 21 so that the irradiation timing of the radiation L1 onto the first region R1 and the irradiation timing of the irradiation light onto the second region R2 are the same.

[0064] In step S101, the control unit 31 uses the first detection unit 12 of the first measurement module 10 to detect radiation L1 including information on a first parameter of the object A. The control unit 31 uses the second detection unit 22 of the second measurement module 20 to detect irradiation light including information on a second parameter of the object A.

[0065] In step S102, the control unit 31 calculates a third parameter of the object A to be measured based on the measured first and second parameters.

[0066] In step S103, the control unit 31 determines whether the state of the object A under test is inappropriate. In this specification, the "state of the object A under test" includes, for example, the physical state of the object A under test characterized by at least one of the first parameter, the second parameter, and the third parameter of the object A under test. For example, the control unit 31 determines that the state of the object A under test is inappropriate if the value of at least one of the measured first parameter and the second parameter deviates from the value of the design specification of the object A under test by a predetermined percentage. If the control unit 31 determines that the state of the object A under test is inappropriate, it executes the process of step S104. If the control unit 31 determines that the state of the object A under test is not inappropriate, i.e., is appropriate, it ends the process.

[0067] In step S104, if the control unit 31 determines in step S103 that the state of the object A to be measured is inappropriate, it feedback controls the upstream operating end in the production line so as to optimize at least one of the first parameter and the second parameter.

[0068] (Second embodiment) Fig. 4 is a functional block diagram showing a schematic configuration of a measurement device 1 according to a second embodiment of the present disclosure. Fig. 5 is a schematic diagram showing a first example of an arrangement of the first measurement module 10 and the second measurement module 20 of the measurement device 1 of Fig. 4. Fig. 6 is a schematic diagram showing a second example of an arrangement of the first measurement module 10 and the second measurement module 20 of the measurement device 1 of Fig. 4. The configuration and functions of the measurement device 1 according to the second embodiment will be mainly described with reference to Figs. 4 to 6.

[0069] The measurement device 1 according to the second embodiment differs from the first embodiment in that the second measurement module 20 does not have a reflection system 23. Other configurations, functions, effects, modifications, etc. are the same as those of the first embodiment, and the corresponding explanations also apply to the measurement device 1 according to the second embodiment. In the following, components that are the same as those in the first embodiment are given the same reference numerals, and their explanations will be omitted. Differences from the first embodiment will mainly be explained.

[0070] In the second embodiment, at least one of the axis of the first measurement module 10 connecting the radiation source unit 11 and the first detection unit 12 and the optical axis of the second measurement module 20 is inclined obliquely with respect to the surface of the object A to be measured.

[0071] 5, for example, the axis X1 of the first measurement module 10 is perpendicular to the surface of the object A. The first measurement module 10 is configured in the same manner as in the first embodiment. On the other hand, the optical axis X2 of the second measurement module 20 is inclined obliquely with respect to the surface of the object A. The optical axis X2 of the non-contact thickness meter constituting the second measurement module 20 is inclined at an angle θ from the perpendicular direction with respect to the surface of the object A.

[0072] More specifically, the set C1 of the first laser light source 211 and the first photodetector 221 is disposed below the object A. The set C2 of the second laser light source 212 and the second photodetector 222 is disposed above the object A. The optical axes X2 of the sets C1 and C2 are inclined obliquely with respect to the surface of the object A.

[0073] The first irradiation light L21 emitted from the first laser light source 211 of the irradiation unit 21 travels straight and propagates so that the optical path immediately before entering the object A overlaps within the incident region of the radiation L1. The first irradiation light L21 is incident on the lower surface of the object A from obliquely below at an incident angle θ. The first irradiation light L21 is irradiated onto a second region R2 included in the first region R1 on the lower surface of the object A, and is reflected obliquely downward by the second region R2 at a reflection angle θ. The first irradiation light L21 reflected obliquely downward from the lower surface of the object A travels straight and is detected by the first photodetector 221.

[0074] The second irradiation light L22 emitted from the second laser light source 212 of the irradiation unit 21 travels straight and propagates so that its optical path immediately before entering the object A overlaps within the incident region of the radiation L1. The second irradiation light L22 is incident on the top surface of the object A from obliquely above at an incident angle θ. The second irradiation light L22 is irradiated onto a second region R2 included in the first region R1 on the top surface of the object A, and is reflected obliquely upward by the second region R2 at a reflection angle θ. The second irradiation light L22 reflected obliquely upward from the top surface of the object A travels straight and is detected by the second photodetector 222.

[0075] Here, it is assumed that the thickness and optical properties of the object A are uniform in the vicinity of the measurement area of ​​the object A measured by the second measurement module 20. Based on the distance l measured using the second measurement module 20, the control unit 31 of the measurement device 1 can calculate the thickness d of the object A as its vertical component, i.e., d = l cos θ.

[0076] 6, for example, the optical axis X2 of the second measurement module 20 is perpendicular to the surface of the object A. The second measurement module 20 is configured similarly to the first embodiment except that it does not have the reflection system 23. On the other hand, the axis X1 of the first measurement module 10 is inclined obliquely with respect to the surface of the object A. The axis X1 of the beta ray basis weight meter constituting the first measurement module 10 is inclined at an angle θ from the perpendicular direction with respect to the surface of the object A.

[0077] More specifically, the radiation source unit 11 is disposed below the object A to be measured. The first detection unit 12 is disposed above the object A to be measured. The radiation L1 irradiated from the radiation source unit 11 travels straight and is incident on the bottom surface of the object A to be measured from diagonally below at an incident angle θ. The radiation L1 passes through the inside of the object A to be measured and is emitted diagonally upward from the top surface of the object A to be measured at an emission angle θ. The radiation L1 travels straight and is detected by the first detection unit 12.

[0078] Here, we will explain the measurement principle of the β-ray basis weight meter that constitutes the first measurement module 10. The transmission characteristics of radiation L1 are expressed by the following equation 2.

[0079] [Number 2] I θ =I 0θ ·exp(-α*BW θ ) (Formula 2) I θ represents the intensity of the radiation L1 at the first detection unit 12. 0θ represents the intensity of radiation L1 when the object A is not present, i.e., the intensity of radiation L1 incident on the object A. α represents the absorption coefficient of the object A, which is determined by the material. BW θ represents the basis weight of the object A on the axis X1.

[0080] BW θ It is assumed that the thickness and basis weight of the object A have already been calculated, and that the thickness and basis weight of the object A are uniform near the measurement area of ​​the object A. It is further assumed that the distance that the radiation L1 passes through the object A near the measurement area of ​​the object A is proportional to the basis weight. In this case, the control unit 31 of the measuring device 1 calculates the basis weight BW in a direction perpendicular to the surface of the object A. If the distance that the radiation L1 passes through the object A is l (l), its perpendicular component, i.e., the thickness d of the object A, can be expressed as l·cosθ. The control unit 31 can calculate the basis weight BW when measured in a direction perpendicular to the surface of the object A using the assumption that the passing distance of the radiation L1 is proportional to the basis weight, using the following equation 3.

[0081] [Number 3] BW / BW θ =l cosθ / l BW=BW θ ·cosθ (Equation 3)

[0082] (effect) The measuring device 1 according to the embodiment described above can obtain more accurate information about the state of the object A moving along a production line. The measuring device 1 overlaps the first region R1 and the second region R2, and synchronizes the timing of irradiating the first region R1 with radiation L1 and the timing of irradiating the second region R2 with light, thereby enabling simultaneous, coherent measurement of multiple parameters using multiple measurement modules. Even if there is a predetermined physical distance between the measurement modules on the frame F, the measuring device 1 can easily obtain measurement results that reflect the state of the object A at the same position and time. In other words, the measuring device 1 can examine the characteristics of the object A that are more in line with the actual state of the object A.

[0083] This allows the measuring device 1 to compare multiple measurement data at the same position on the object A. For example, by simultaneously checking thickness data when basis weight is locally increased, the measuring device 1 or user can estimate, through profile comparison, more detailed causes of the inappropriate condition of the object A. The measuring device 1 or user can easily identify which parameter is inappropriate for a specific position on the object A.

[0084] By detecting local changes in the object A at an early stage in this way, the measuring device 1 can quickly identify areas for improvement on the production line that produces the object A. This enables the measuring device 1 to quickly identify the control terminal that should be controlled among the various control terminals installed upstream of the measuring device 1 in the production line, and to perform feedback control of that control terminal more quickly. By accurately identifying the control terminal that needs improvement and performing feedback control quickly, the measuring device 1 can quickly optimize the production process of the object A.

[0085] Since the measuring device 1 can easily obtain measurement results that reflect the state of the object A at the same position and the same time, when calculating other parameters of the object A based on multiple parameters measured by multiple measurement modules, it is also possible to suppress errors due to differences in measurement positions on the object A. For example, when calculating parameters such as density, packing ratio, and porosity from the basis weight and thickness of the object A, the measuring device 1 can suppress errors due to differences in measurement positions and calculate the parameters with higher accuracy.

[0086] In the first embodiment, since the second measurement module 20 has a reflection system 23 that reflects the irradiation light, it is possible to easily configure the optical path of the irradiation light for overlapping the first region R1 and the second region R2 on the surface of the object A. For example, as shown in FIG. 2, it is also possible to configure the optical path of the irradiation light so that the radiation L1 and the irradiation light are perpendicularly incident on the object A for both the beta-ray basis weight meter constituting the first measurement module 10 and the non-contact thickness meter constituting the second measurement module 20. This simplifies the arrangement of the radiation source unit 11 and the first detection unit 12, as well as the arrangement of the optical system in the second measurement module 20. This therefore facilitates the manufacture of the measurement device 1, improving its manufacturing efficiency.

[0087] In the first embodiment, the reflection system 23 includes an optical mirror that reflects the irradiated light on the optical path connecting the irradiating unit 21 to the second region R2, thereby achieving the same effect as above.

[0088] In the second embodiment, at least one of the axis X1 of the first measurement module 10 and the optical axis X2 of the second measurement module 20 is tilted obliquely with respect to the surface of the object A, which makes it easy to overlap the first region R1 and the second region R2 on the surface of the object A without using the reflection system 23 as in the first embodiment. For example, as shown in Figures 5 and 6, by tilting either the beta-ray basis weight meter constituting the first measurement module 10 or the non-contact thickness meter constituting the second measurement module 20 obliquely with respect to the surface of the object A, it makes it easy to overlap the first region R1 and the second region R2 on the surface of the object A.

[0089] In the second embodiment, the axis X1 of the first measurement module 10 is perpendicular to the surface of the object A to be measured, and the optical axis X2 of the second measurement module 20 is inclined obliquely with respect to the surface of the object A to be measured, thereby achieving the same effect as above.

[0090] In the above embodiment, the measurement device 1 calculates a third parameter of the object A to be measured based on the measured first and second parameters, thereby enabling the state of the object A to be examined from multiple angles based on more parameters.

[0091] In the above embodiment, the measuring device 1 adjusts the production process of the object A to optimize the state of the object A by feedback-controlling the operating terminal on the upstream side of the production line so as to optimize at least one of the first parameter and the second parameter. For example, the measuring device 1 can feedback-control the operating terminal by adjusting the temperature distribution and extrusion pressure of the nozzle that squeezes out the material so that the thickness, density, etc. of the sheet-like object A are uniform. In this way, the measuring device 1 can also improve the quality of the object A produced on the production line.

[0092] In the above embodiment, the first parameter includes the basis weight and the second parameter includes the thickness, so that the measuring device 1 can obtain more accurate information about the condition of the object A to be measured moving down the production line based on its basis weight and thickness.

[0093] (Variation) Although the present disclosure has been described based on the drawings and examples, it should be noted that those skilled in the art can easily make various modifications and alterations based on the present disclosure. Therefore, it should be noted that these modifications and alterations are included in the scope of the present disclosure. For example, the functions included in each configuration or step can be rearranged so as not to be logically inconsistent, and multiple configurations or steps can be combined or divided into one.

[0094] For example, the present disclosure may be realized as a program or a storage medium on which a program is recorded, which describes the processing details for realizing each function of the above-described measuring device 1. It should be understood that these are also included within the scope of the present disclosure.

[0095] For example, the shape, arrangement, orientation, and number of each of the above-described components are not limited to those described above and illustrated in the drawings, and may be arbitrarily configured as long as the components can achieve their functions.

[0096] In the first embodiment, the second measurement module 20 has been described as having the reflection system 23, but is not limited to this. The second measurement module 20 may have any other optical system that can adjust the optical path of the irradiated light so that the first region R1 and the second region R2 overlap each other on the surface of the object A. In addition to or instead of the second measurement module 20, the first measurement module 10 may have a reflection system that reflects the radiation L1.

[0097] In the first embodiment, the reflection system 23 is described as including a plurality of optical mirrors arranged as shown in Fig. 2, but is not limited to this. The reflection system 23 may include at least one optical mirror arranged in any manner as long as the first region R1 and the second region R2 overlap each other.

[0098] In the second embodiment, it has been described that either the axis X1 of the first measurement module 10 or the optical axis X2 of the second measurement module 20 is inclined obliquely with respect to the surface of the object A to be measured, but this is not limiting. Both the axis X1 of the first measurement module 10 and the optical axis X2 of the second measurement module 20 may be inclined obliquely with respect to the surface of the object A to be measured.

[0099] In the above embodiment, the measurement device 1 calculates the third parameter of the object A to be measured based on the measured first and second parameters, but this is not limiting. The measurement device 1 does not have to perform such a calculation process.

[0100] In the above embodiment, the measuring device 1 is described as performing feedback control on the upstream control element in the production line, but this is not limiting. The measuring device 1 does not have to perform such feedback control. The user may manually adjust these control elements.

[0101] In the above embodiment, the first parameter includes basis weight, and the second parameter includes thickness, but is not limited thereto. Either the first parameter or the second parameter may include any other parameter among the above parameters.

[0102] In the above embodiment, the second region R2 is entirely contained in the first region R1, but this is not limiting. The first region R1 may be entirely contained in the second region R2, or one region may partially overlap the other region.

[0103] In the above embodiment, the object A to be measured may include, for example, paper, a relatively thin film or plastic sheet having a thickness of a few millimeters or less, but is not limited thereto. The object A may also include a metal product. In this case, the radiation source unit 11 of the first measurement module 10 may have a highly penetrating gamma ray source including 137Cs and 241Am. The first detection unit 12 of the first measurement module 10 may have an ionization chamber or a plastic scintillation detector. The object A to be measured may also include rubber and a relatively thick plastic sheet. In this case, the radiation source unit 11 of the first measurement module 10 may have a high-energy beta ray source including 90Sr.

[0104] In the above embodiment, the first measurement module 10 is described as including a basis weight meter that uses radiation L1, but is not limited thereto. The first measurement module 10 may also include any other transmission basis weight meter. For example, the first measurement module 10 may include an X-ray basis weight meter, an infrared basis weight meter, a microwave basis weight meter, or the like. In this case, the probe may include X-rays, infrared rays, microwaves, or the like. The probe unit may include an irradiation unit that irradiates each electromagnetic wave.

[0105] In the above embodiment, the second measurement module 20 is described as including a non-contact thickness meter having a laser displacement sensor, but is not limited to this. The second measurement module 20 may include a non-contact thickness meter having an interferometer such as OCT (Optical Coherence Tomography) that can measure the thickness of the object A itself, instead of a laser displacement sensor that measures the distance to the surface of the object A.

[0106] In the above embodiment, the control unit 31 of the control module 30 is described as collectively controlling the first measurement module 10 and the second measurement module 20, but this is not limited to this. At least one of the first measurement module 10 and the second measurement module 20 may have its own control unit. Such a control unit may control the corresponding measurement module in response to a control signal from the control unit 31 of the control module 30, or independently of the control unit 31.

[0107] The present disclosure provides: (1) a first measurement module having a probe unit that irradiates a probe onto a first region on the surface of an object to be measured that is moving on a production line, and a first detection unit that detects the probe that contains information on a first parameter of the object to be measured; a second measurement module including an irradiation unit that irradiates a second area overlapping the first area with irradiation light, and a second detection unit that detects the irradiation light including information on a second parameter of the object to be measured; a control unit that controls the probe unit and the irradiation unit so that the timing of irradiating the first region with the probe and the timing of irradiating the second region with the irradiation light are the same; Equipped with measuring equipment, is.

[0108] (2) The measuring device described in (1) above is The apparatus may further include a reflecting system that reflects at least one of the probe and the irradiated light so that the first region and the second region overlap each other on the surface.

[0109] (3) In the measuring device described in (2) above, The reflection system may include an optical mirror that reflects the irradiation light on an optical path connecting the irradiation unit to the second region.

[0110] (4) In the measuring device according to any one of (1) to (3), At least one of an axis of the first measurement module connecting the probe unit and the first detection unit and an optical axis of the second measurement module may be inclined obliquely with respect to the surface.

[0111] (5) In the measuring device described in (4) above, the axis of the first measurement module is perpendicular to the surface; The optical axis of the second measurement module may be inclined obliquely relative to the surface.

[0112] (6) In the measuring device according to any one of (1) to (5), The control unit may calculate a third parameter of the device under test based on the measured first parameter and second parameter.

[0113] (7) In the measuring device according to any one of (1) to (6), When the control unit determines that the state of the object to be measured is inappropriate, the control unit may feedback control an upstream operating element in the production line so as to optimize at least one of the first parameter and the second parameter.

[0114] (8) In the measuring device according to any one of (1) to (7), the first parameter includes a basis weight; The second parameter may include a thickness.

[0115] The present disclosure provides: (9) irradiating a probe onto a first area on a surface of an object being measured while it is moving along a production line; detecting the probe containing information of a first parameter of the device under test; irradiating a second region overlapping the first region with irradiation light; detecting the irradiated light containing information on a second parameter of the object; Including, the timing of irradiating the first region with the probe and the timing of irradiating the second region with the irradiation light are the same. measurement method, is. [Explanation of symbols]

[0116] 1. Measuring equipment 10 First measurement module 11 Radiation source unit (probe unit) 12 First detection unit 20 Second measurement module 21 Irradiation unit 211 First laser light source 212 Second laser light source 22 Second detection unit 221 First photodetector 222 Second Photodetector 23 Reflection system 23a Optical mirror 23b Optical mirror 23c Optical Mirror 23d optical mirror 30 Control Module 31 Control Unit 32 Storage section 33 Communications Department A Measured object Group C1 Group C2 D1 Movement direction D2 direction F Frame L1 radiation (probe) L21 1st irradiation light L22 2nd irradiation light R1 1st area R2 2nd area X1 axis X2 optical axis

Claims

1. a first measurement module including a probe unit that irradiates a probe onto a first region on the surface of an object to be measured that is moving on a production line, and a first detection unit that detects the probe that includes information on a first parameter of the object to be measured; a second measurement module including an irradiation unit that irradiates a second area overlapping the first area with irradiation light, and a second detection unit that detects the irradiation light including information on a second parameter of the object to be measured; a control unit that controls the probe unit and the irradiation unit so that the timing of irradiating the first region with the probe and the timing of irradiating the second region with the irradiation light are the same; a reflection system that reflects at least one of the probe and the irradiation light so that the first region and the second region overlap each other on the surface; Equipped with Measuring equipment.

2. the reflection system includes an optical mirror that reflects the irradiation light on an optical path connecting the irradiation unit to the second region. The measuring device according to claim 1 .

3. A first measurement module having a probe unit that irradiates a probe onto a first area on the surface of an object to be measured moving on a production line, and a first detection unit that detects the probe containing information on a first parameter of the object to be measured; a second measurement module including an irradiation unit that irradiates a second area overlapping the first area with irradiation light, and a second detection unit that detects the irradiation light including information on a second parameter of the object to be measured; a control unit that controls the probe unit and the irradiation unit so that the timing of irradiating the first region with the probe and the timing of irradiating the second region with the irradiation light are the same; Equipped with an axis of the first measurement module connecting the probe unit and the first detection unit is perpendicular to the surface; the optical axis of the second measurement module is inclined obliquely with respect to the surface; Measuring equipment.

4. the control unit calculates a third parameter of the object to be measured based on the measured first parameter and the measured second parameter.

4. The measuring device according to claim 1.

5. when determining that the state of the object to be measured is inappropriate, the control unit feedback-controls an upstream operating end in the production line so as to optimize at least one of the first parameter and the second parameter.

4. The measuring device according to claim 1.

6. the first parameter includes a basis weight; The second parameter includes a thickness.

4. The measuring device according to claim 1.

7. irradiating a probe onto a first area on a surface of an object being measured while it is moving along a production line; detecting the probe containing information of a first parameter of the device under test; irradiating a second region overlapping the first region with irradiation light; detecting the irradiated light containing information on a second parameter of the object; Including, the timing of irradiating the first region with the probe and the timing of irradiating the second region with the irradiation light are the same, and further comprising reflecting at least one of the probe and the irradiating light so that the first region and the second region overlap each other on the surface. Measurement method.

8. A step of irradiating a probe onto a first region of a surface of an object to be measured moving on a production line using a probe portion; detecting the probe including information on a first parameter of the object to be measured by a first detection unit; irradiating a second region overlapping with the first region with irradiation light by an irradiation unit; detecting the irradiated light including information on a second parameter of the object to be measured by a second detection unit; Including, the timing of irradiating the first region with the probe and the timing of irradiating the second region with the irradiation light are the same, an axis of the first measurement module connecting the probe unit and the first detection unit of the first measurement module is perpendicular to the surface; an optical axis of a second measurement module having the irradiation unit and the second detection unit is inclined obliquely with respect to the surface; Measurement method.

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