AFM imaging with creep correction

Abstract

An atomic force microscope (AFM) and method for operating an atomic force microscope includes a separate Z-height sensor for measuring the probe-sample distance pixel-by-pixel during AFM data acquisition in conjunction with AFM system control. By mapping the AFM data to low-resolution data of the Z-height data, a final creep-corrected high-resolution data image is generated in real time.

Description

[Technical Field]

[0001] The preferred embodiment relates to atomic force microscopy (AFM), and more particularly to a method for correcting creep in a system in real time during AFM data collection. [Background technology]

[0002] A scanning probe microscope, such as an atomic force microscope (AFM), is an instrument that uses a probe equipped with a tip to interact with the surface of a sample with an appropriate force to characterize the surface down to the atomic level. Typically, the probe is introduced to the surface of the sample, and by providing a relative scanning movement between the tip and the sample, surface property data can be obtained for specific regions of the sample and a corresponding map of the sample can be generated.

[0003] A typical AFM system is shown diagrammatically in FIG. 1. The AFM 10 uses a probe device 12, which includes a probe 14 and a cantilever 15. A scanner 24 generates relative motion between the probe 14 and a sample 22 while the probe-sample interaction is measured. In this manner, images or other measurements of the sample can be acquired. The scanner 24 typically consists of one or more actuators that generate motion in three orthogonal directions (X, Y, and Z). Often, the scanner 24 is a single, integrated unit that includes one or more actuators that move the sample or probe in all three axes, such as a piezoelectric tube actuator. Alternatively, the scanner may be an assembly of multiple separate actuators. Some AFMs separate the scanner into multiple components, such as an XY scanner that moves the sample and a separate Z actuator that moves the probe. Thus, the device can generate relative motion between the probe and the sample while measuring the topography or some other surface characteristic of the sample, as described, for example, in U.S. Patent No. 6,229,999 to Hansma et al., U.S. Patent No. 6,229,999 to Elings et al., and U.S. Patent No. 6,229,999 to Elings et al.

[0004] In a typical configuration, the probe 14 is often coupled to an oscillating actuator or drive 16 that is used to drive the probe 14 at or near the resonant frequency of the cantilever 15. An alternative configuration measures the deflection, torsion, or other motion of the cantilever 15. The probe 14 is often a micromachined cantilever with an integrated tip 17.

[0005] Generally, an electronic signal from a signal source 18 is applied under the control of an SPM controller 20 to cause an actuator 16 (or alternatively, a scanner 24) to vibrate the probe 14. The probe-sample interaction is typically controlled by feedback from the controller 20. In particular, the actuator 16 may be coupled to the scanner 24 and the probe 14, but may also be integrally formed with the cantilever 15 of the probe 14 as part of a self-actuated cantilever / probe.

[0006] In many cases, sample characteristics are monitored by detecting changes in one or more characteristics of the vibration of the probe 14 as the selected probe 14 contacts the sample 22, as described above. In this regard, a deflection detection device is typically utilized to direct a beam toward the backside of the probe 14, where it is then reflected toward a detector 26. As the beam moves across the detector 26, an appropriate signal is processed in block 28 to determine, for example, an RMS deflection, which is transmitted to a controller 20, which processes the signal to determine changes in the vibration of the probe 14. Generally, the controller 20 generates control signals to maintain a relatively constant interaction between the tip and the sample (or deflection of the lever 15) to maintain a setpoint characteristic of the vibration of the probe 14. More specifically, the controller 20 may include a PI Gain Control block 32 and a High Voltage Amplifier 34 that compares a signal corresponding to the probe deflection due to the tip-sample interaction with the setpoint and circuit 30 to adjust the obtained error signal. For example, the controller 20 is often used to hold the oscillation amplitude at a fixed value AS to ensure a generally constant force between the tip and the sample. Alternatively, a setpoint phase or frequency may be used.

[0007] A workstation 40 may also be provided within the controller 20 and / or within a separate, coupled, or stand-alone controller, and receives data from the controller and manipulates data acquired during scanning to perform point selection, curve fitting, and distance determination. The AFM may be designed to operate in a variety of modes, including contact and vibration modes. Operation is achieved by moving the sample or probe assembly up and down perpendicular to the sample's surface in response to deflections of the probe assembly's cantilever as it is scanned across the surface. Scanning typically occurs in an "xy" plane, at least parallel to the sample's surface, with vertical movement occurring in the "z" direction, perpendicular to the xy plane. Note that the term "generally parallel" is used because many samples have out-of-plane roughness, curvature, and tilt. Data associated with this vertical movement may thus be stored and used to construct an image of the sample surface corresponding to measured sample characteristics, such as surface topography. In a mode of AFM operation known as TappingMode® AFM (TappingMode® is a trademark of the applicant), the tip oscillates at or near the resonant frequency of the cantilever relative to the probe. A feedback loop attempts to minimize the "tracking force," i.e., the force resulting from the tip / sample interaction, and to keep the amplitude of that oscillation constant.

[0008] Alternative feedback devices hold the phase or oscillation frequency constant. As with contact mode, these feedback signals are collected, stored, and used as data to characterize the sample. Note that "SPM" and abbreviations for specific types of SPM may be used herein to refer to microscope devices or related technologies, such as atomic force microscopes. An improvement over the ubiquitous TappingMode®, called Peak Force Tapping® (PFT), discussed in U.S. Patent Nos. 5,629,499; 5,729,529; and 5,729,529, the feedback is expressly incorporated herein by reference and is based on the force (termed the transient probe-sample interaction force) measured with each oscillation period.

[0009] Regardless of the mode of operation, AFMs can achieve atomic-level resolution on a variety of insulating and conducting surfaces in air, liquid, or vacuum by using piezoelectric scanners, optical lever deflection detectors, and extremely small cantilevers fabricated using photolithography techniques. Because of their resolution and versatility, AFMs are important measurement tools in a variety of fields, from semiconductor manufacturing to biological research.

[0010] In this context, AFMs may be used in automated applications involving high-precision manufacturing processes, such as semiconductor manufacturing. AFMs have proven useful in the semiconductor space because they can provide high-resolution measurements of nanoscale surface features (e.g., topography). However, AFM data have traditionally been hindered by mechanical perturbations within the system, such as drift and creep, which are inherent problems for most AFMs. Drift is an artifact that occurs in any type of SPM, or indeed any microscope, but is more severe in high-resolution techniques such as AFM. Generally, this is known as "drift" because the sample (or probe) moves slowly in a certain direction. This can typically be perceived as a "distortion" in the image that changes when changing the slow scan direction. This effect can be particularly noticeable when the user moves to a new region of interest within the scan range. Piezo creep occurs when a set voltage is applied to a piezo scanner and then the piezo tends to continue moving in the same direction for a period of time when you try to hold that voltage to move to a specific position. This essentially means that features stretch or compress, especially when a new image scan is initiated. Piezo creep can sometimes subside over time during an AFM image scan, but it remains a problem.

[0011] Inaccurate detection of cantilever movement can also introduce errors during scanning. Scanners can "age," meaning that their properties, including bow and hysteretic effects, can change significantly over time. These factors can also interfere with accurate vertical metrology measurements. Furthermore, hysteresis and aging can cause measurements to vary with time, sample tilt, and other factors, potentially reducing the repeatability of measurements and making pre-calibration to the required level of accuracy difficult.

[0012] Conventional techniques used to remove instrument errors typically fail to remove AFM scanner errors and detection idiosyncrasies such as those described above. One such conventional technique models instrument errors as a simple mathematical function. For example, a best-fit of scan data to a theoretical surface defined by a polynomial or other simple function can be calculated. Subtracting this theoretical surface from the scan data removes some of the scan errors. However, in the case of AFM, curvature, hysteresis, and detection errors often cannot be accurately described by a simple mathematical function. Furthermore, the fitting step can be corrupted by features that deviate from a smooth surface, possibly features that require measurement. Therefore, fitting and subtraction do not result in a sufficient improvement in accuracy for many applications requiring an accuracy of approximately 1 nm (e.g., measuring pole tip recessions).

[0013] Another type of attempt to correct for instrument errors uses reference subtraction. In this technique, a reference scan of a standard sample is made. A candidate reference sample can have a flat surface, such as a cleaved or polished silicon wafer. This scan is subtracted from all subsequent data scans of the sample. See U.S. Patent No. 6,299,499 to Yoshizumi. This technique is primarily used with interferometers to correct for optical imperfections. However, in the case of AFM, hysteresis introduces scanner idiosyncrasies that depend on the overall tilt of the sample and can vary significantly from sample to sample. These errors therefore vary from one reference sample to another and from one scan to another. Therefore, there is no "standard sample," and standard reference subtraction cannot be used to remove scanning errors.

[0014] Returning to creep, high-resolution AFM data is acquired by a control signal, a scalable command signal transmitted to the piezo to achieve picometer resolution. However, this signal is affected by the structure of the piezo, including the physical properties of the material. The piezo crystal itself behaves differently depending on how long it remains in a particular physical position (extension / contraction) and on changes in the command voltage. This introduces artifacts into the final data image that are difficult to remove given their complex nature (e.g., second-order errors). In other words, it is difficult for post-processing algorithms to correct these second-order errors without introducing additional artifacts.

[0015] As a result, the AFM field, including automated AFMs, has needed a solution to identify and correct for mechanical perturbations within an AFM system, particularly perturbations associated with the scanner relative to the sample due to Z-height changes within the system, including effects due to system "creep." [Prior art documents] [Patent documents]

[0016] [Patent Document 1] U.S. Patent Reissue No. 34489 [Patent Document 2] U.S. Patent No. 5,266,801 [Patent Document 3] U.S. Patent No. 5,412,980 [Patent Document 4] U.S. Patent No. 8,739,309 [Patent Document 5] U.S. Patent No. 9,322,842 [Patent Document 6] U.S. Patent No. 9,588,136 [Patent Document 7] U.S. Patent No. 5,283,630 Summary of the Invention [Problem to be solved by the invention]

[0017] It was desired to improve data acquisition and display times while maintaining the resolution of the AFM data, preferably with minimal post-image acquisition processing. [Means for solving the problem]

[0018] The preferred embodiments overcome the shortcomings of current AFM systems that attempt to address creep effects in AFM imaging by providing a system and method that independently measures Z-height with an independent sensor that is not affected by creep effects and generates a reference image (i.e., plane). Once a data scan is performed and AFM data is acquired, the system overlays or maps the AFM data onto the reference data in a manner that corrects for creep. This method improves image resolution without requiring post-imaging processing, allowing creep-corrected data to be communicated to the user in real time. Real-time processing performs data processing quickly during AFM image acquisition, providing near-instantaneous output. This allows for system flexibility by allowing expert users to adjust system parameters in real time to obtain improved AFM data.

[0019] According to a preferred embodiment, an atomic force microscopy (AFM) method includes providing a relative scanning motion between a probe and a sample in a region of interest of the sample. The providing step is a data scan having a fast scan axis and a slow scan axis. The method then includes detecting probe deflection during the providing step, the probe deflection indicating a surface characteristic of the sample. Surface data is then generated based on the detecting step, and a Z-height between the AFM probe and the sample is measured simultaneously with the detecting step. The method then generates Z-height data based on the measuring step, and extracts a low-resolution topographic reference image from the height data. The surface data is then overlaid or mapped onto the low-resolution topographic reference data to generate a final data image.

[0020] In another aspect of this preferred embodiment, the step of generating the final data image is performed in real time during the steps of providing and detecting. In accordance with another aspect of this preferred embodiment, the extracting step is performed in the slow scan axis of the data scan.

[0021] In a further aspect of this preferred embodiment, the measuring step is performed with a sensor coupled to the head of the AFM. According to a further aspect of this preferred embodiment, the sensor is supported by a scanner mounted as part of the head of the AFM, the scanner preferably being a piezoelectric tube scanner.

[0022] In yet another aspect of this preferred embodiment, the tube scanner is an XYZ tube scanner and the sensor is a capacitance sensor. In yet another aspect of this preferred embodiment, the low-resolution reference image defines a reference plane, and the detecting step is performed in one of a tapping mode, a peak force tapping (PFT) mode, and a contact mode.

[0023] In another preferred embodiment, an atomic force microscope (AFM) includes a scanner that provides relative scanning motion between the AFM probe and the sample. To perform the data scan, a detector measures the deflection of the probe in response to the probe interacting with the sample, and this deflection is stored as surface data indicative of the sample topography. This deflection data is often corrupted by creep effects. Therefore, the AFM of the preferred embodiment also includes a sensor for measuring the probe deflection and for measuring the Z-height between the probe and the sample. The Z-height is stored as Z-height data. A processor extracts reference data from the Z-height data and maps the surface data to the reference data to generate a final data image of the sample.

[0024] In accordance with another aspect of this preferred embodiment, the reference data is along the slow scan axis of the data scan and is low resolution topographic data. In a further aspect of this preferred embodiment, the processor extracts reference data and maps the surface data to the reference data in real time during AFM operation. In particular, the reference data is preferably a reference plane.

[0025] In accordance with a further aspect of this preferred embodiment, the sensor is a capacitance sensor coupled to a piezoelectric tube scanner. These and other features and advantages of the present invention will become apparent to those skilled in the art from the following detailed description and accompanying drawings. It should be understood, however, that the detailed description and specific examples, while indicating preferred embodiments of the invention, are given by way of illustration and not of limitation. Many changes and modifications may be made within the scope of the invention without departing from the spirit thereof, and the invention includes all such modifications.

[0026] Preferred embodiments of the present invention are illustrated in the accompanying drawings, in which like reference numerals refer to like parts throughout. [Brief explanation of the drawings]

[0027] [Figure 1] 1 is a schematic diagram of a prior art atomic force microscope (AFM). [Figure 2] FIG. 1 is a block diagram of an AFM system for acquiring AFM data and correcting for creep without post-acquisition processing. [Figure 3] 3 is a flow chart illustrating the creep correction method of the preferred embodiment. [Figure 4] Raw AFM topography image without creep correction. [Figure 5] 5 is a chart illustrating the effect of creep on the AFM data shown in FIG. 4. [Figure 6] Height images acquired using a separate Z-height sensor to measure the probe-sample separation independently from the AFM control. [Figure 7] 7 is a diagram corresponding to the height image of FIG. 6 similar to the diagram of FIG. 5, showing height data unaffected by creep. [Figure 8] FIG. 7 is a low-resolution height image extracted from the Z sensor height image of FIG. 6. [Figure 9] 9 is a diagram corresponding to FIG. 8 showing low-resolution height data. [Figure 10] 1 is a composite high-resolution topographic image resulting from using the real-time creep correction method of the preferred embodiment. [Figure 11] 11 is a chart corresponding to FIG. 10 showing creep correction of AFM data. DETAILED DESCRIPTION OF THE INVENTION

[0028] Preferred embodiments are directed to a creep correction method and system for atomic force microscopes (AFMs) that minimizes the adverse effects of system creep in the "Z" direction on AFM data without subsequent image processing. The method described herein involves generating two sets of height data—one from an AFM control signal (standard AFM image) and one from a separate Z sensor coupled to a Z piezo actuator—to measure the distance from the piezo to the sample. Meanwhile, Z command signal "creep" is primarily affected by the piezo response, which has both command duration and temperature-dependent sensitivity to the input control voltage. The height measurement provided by the Z sensor is not affected by system creep because the Z sensor measures the physical displacement of the scanner relative to the sample surface, which is primarily affected by changes in the mechanical distance from the scanner to the sample, but only to a lesser extent by command duration and temperature.

[0029] A scanning probe microscope instrument 150 (e.g., AFM) according to a preferred embodiment is shown in FIG. 2. In this embodiment, a probe 152 having a tip 154 ​​extending from the distal end of a cantilever 155 is held by a probe holder (not shown) supported by an actuator, such as a piezoelectric tube scanner 156. The scanner 156 is a "Z" or vertical scanner that responds to sample characteristics within a closed-loop control system to position the tip 154 ​​relative to a sample 158 during AFM imaging (alternative Z actuators, including self-actuated probes, may be provided). In this embodiment, the tube scanner 156 is coupled to an XY scanner 160, preferably a piezoelectric tube, that is used to raster the probe tip 154 ​​relative to the sample surface during AFM operation. A mechanical Z stage 162 is used to provide large Z-direction movements between the tip 154 ​​and the sample 158, for example, during AFM start-up to align the tip 154 ​​with the sample 158 prior to operation and image acquisition. The tube scanners 156, 160 and mechanical Z-stage 162 are mounted as part of the AFM head (not separately shown). The sample 158 is mounted on an XY stage 164, which primarily provides general XY motion for positioning the probe 152 over a region of interest on the sample 158. An XY stage controller 166 controls the stage 164 to position the probe / sample over its region of interest. However, the stage 164 can be configured to provide relative scanning motion between the tip 154 ​​and the sample 158 at a selected scanning rate, depending on the application. A controller 174 provides instructions for positioning the image scan over the region of interest. The controllers 166, 174 are implemented by a computer 180.

[0030] The AFM 150 also includes a Z measurement or position sensor 190 for detecting the distance, i.e., the Z height, between the scanner 156 (and its coupled probe) and the sample 158. The sensor 190 is preferably a capacitive sensor, although other suitable options can be used. The height measurement is not affected by creep artifacts because the height sensor is primarily sensitive to changes in the physical distance from the scanner to the sample, rather than changes in the piezo's response to an input control signal, which causes creep.

[0031] In operation, after the tip 154 ​​is aligned with the sample 158, a rapid scan of the sample begins using the XY scanner 160 in an AFM mode (e.g., PFT mode) as described above. The interaction of the tip 154 ​​with the surface of the sample 158 causes a deflection of the probe 152, which is measured by an optical beam-bounce deflection detection apparatus 168. The apparatus 168 includes a laser 170 that directs a beam "L" from the rear facet of the cantilever 155 toward a photodetector 172 that transmits the deflection signal to, for example, a DSP 176 in an AFM controller 174 for rapid processing. The AFM controller 174 continuously determines a control signal depending on the AFM operating mode and transmits it to the piezo tube 156 to maintain the Z position of the probe 152 relative to the sample 158, more specifically, to maintain the probe deflection at a feedback setpoint. The controller 174 also provides real-time processing of data acquired from both the AFM control and the Z height sensor, which is explained in more detail in the manner shown in FIG.

[0032] Referring to FIG. 3, a method 200 for correcting creep effects in AFM image data in real time is shown. In block 202, the AFM tip is aligned with the sample surface in a region of interest. Next, in block 204, a scan of the sample begins in a selected AFM operating mode. In addition to a Z command position signal (a voltage indicative of topography), the height detected by a Z metrology sensor (190 in FIG. 2, e.g., a capacitive sensor) is captured and recorded. This data is acquired simultaneously at each scan position. In block 206, the method 200 extracts low-resolution topography reference data from the Z metrology sensor. This is a low-resolution portion of the height data acquired by sensor 190 (i.e., sensor height data extracted at the slow scan axis of the data scan). This data provides a reference plane for the region of interest for later removal / minimization of time / voltage-dependent position errors unrelated to the physical sample surface.

[0033] Next, in block 208, creep correction method 200 includes using low-resolution topographical reference data to achieve creep correction. More specifically, surface data corresponding to AFM control signals, i.e., fine-feature Z command voltages, are superimposed / mapped line-by-line onto the low-resolution topographical reference image data in real time. By superimposing or mapping (e.g., subtracting) the surface data of the data scan onto the low-resolution topographical reference data (defining a reference plane), method 200 corrects for creep in the acquired AFM data. In block 210, the method uses the "creep-corrected" data to generate an image of the sample surface. As a result, AFM resolution is improved in real time. This allows for real-time adjustment of scanning parameters to improve the quality of the AFM data. Method 200 and example data are described below in connection with FIGS. 4, 5, 6, and 7, along with the low-resolution Z-height image of FIG. 8 (transitions shown in FIG. 9). FIGS. 10 and 11 show creep-corrected AFM images.

[0034] More specifically, referring first to FIG. 4, a conventional AFM image of the Z control signal 300 is shown, with the sample imaged in a selected AFM operating mode. This image contains creep artifacts in the data, as shown in the graph of data in FIG. 5. As expected, the creep artifacts impair image detail / resolution. FIG. 5 shows graph 302 of a bare silicon wafer, with plotted data showing line-to-line Z height variation on the Y-axis and the position of the slow-scan axis line in the image on the X-axis. Creep artifacts associated with nonlinear changes in Z position are highlighted in region 304. Referring to FIG. 6, a height image generated from the output of Z sensor 190 (FIG. 2) is shown. In this case, for reasons previously discussed, creep does not impair sample surface detail. This is illustrated in FIG. 7. In FIG. 7, the graph showing line-to-line Z height variation on the Y-axis and the position of the slow-scan axis line in the image on the X-axis does not show any abrupt nonlinear changes in position, as highlighted by region 314. The sensor 190 data is time and voltage independent and therefore does not exhibit second order "creep" errors.

[0035] Next, as part of the method 200 of the preferred embodiment, data corresponding to the low-resolution portion of the height data acquired by the sensor 190 is extracted. This image 320, shown in FIG. 8, and the data plotted in graph 322, shown in FIG. 9, are used as a topography reference (block 206 of FIG. 3). As previously mentioned, this topography reference 320 is free of creep effects. The fine-feature Z command voltage AFM data (FIG. 4) is then mapped to the topography reference 320 to correct for creep in the AFM image 300. The result is shown as high-resolution AFM image 330 in FIG. 10. Similar to the data 312 plotted in FIG. 7 for height measurements of the sample surface using the sensor 190 of the system 100 (FIG. 2), the creep-corrected data 332 no longer contains second-order creep errors. As shown in the reference figure, removing approximately 5 nm of erroneous sample topography caused by creep artifacts significantly improves surface feature resolution. In typical cases, creep artifacts of 1-10 nm can be reliably removed using the techniques described herein, significantly improving the resolution of surface features across the sample range.

[0036] In summary, preferred embodiments are directed to a method and apparatus for providing high-resolution AFM images that are substantially free of second-order creep errors without the need for image post-processing. The creep correction technique is fully automated, performed in real time during image acquisition, and does not display creep during image acquisition. Creep in the AFM system is suppressed and no additional image distortion is introduced.

[0037] While the best mode contemplated by the inventors for carrying out the invention has been disclosed above, the practice of the invention is not limited to the above, and it will be apparent that various additions, modifications, and rearrangements of the features of the invention can be made without departing from the spirit and scope of the concept of the invention.

Claims

1. 1. A method for atomic force microscopy (AFM), comprising: providing relative scanning motion between the probe and the sample in a region of interest of the sample to produce a data scan having a fast scan axis and a slow scan axis; detecting a deflection of a probe in the fast scan axis of the data scan during the providing step, the deflection of the probe being indicative of a topography of a surface of the sample; generating surface data based on the detecting step; a measuring step of measuring a Z height between the AFM probe and the sample simultaneously with the detecting step; generating Z-height data based on the measuring step; extracting low resolution topographical reference data from the Z height data in the slow scan axis of the data scan; a mapping step of mapping the surface data onto the low-resolution topographical reference data; generating a final data image based on said mapping step; A method comprising:

2. The method of claim 1 , wherein the step of generating the final data image is performed in real time during the steps of providing and detecting.

3. The method described in claim 1, wherein the mapping step maps the surface data to the low-resolution topography reference data to correct for the effects of AFM creep in the surface data.

4. The method of claim 1 , wherein the measuring step is performed with a sensor coupled to a head of the AFM.

5. The method of claim 4 , wherein the sensor is supported by an actuator mounted on a head of the AFM.

6. The method of claim 4 , wherein the sensor is a capacitance sensor.

7. The method of claim 5 , wherein the actuator is a piezoelectric tube scanner.

8. The method of claim 1 , wherein the low-resolution topographical reference data defines a reference plane.

9. The method of claim 1 , wherein the detecting step is performed in one of a tapping mode, a peak-force tapping (PFT) mode, and a contact mode.

10. An atomic force microscope (AFM), a scanner that provides relative scanning motion between the probe of the AFM and a sample in a data scan having a fast scan axis and a slow scan axis; a detector that measures deflection of the probe in the fast scan axis of the data scan in response to probe-sample interaction during AFM operation, the deflection being indicative of sample topography and stored as surface data; a sensor for measuring a Z height between the probe and the sample simultaneously with measuring deflection of the probe, the Z height being stored as Z height data; a processor for extracting reference data from the Z height data in the slow scan axis of the data scan and for mapping the surface data to the reference data to generate a final data image of the sample; including atomic force microscopes.

11. An atomic force microscope as described in claim 10, wherein the processor maps the surface data to the reference data to correct for the effects of AFM creep on the surface data.

12. The atomic force microscope of claim 10 , wherein the processor maps the surface data to the reference data in real time during AFM operation.

13. The atomic force microscope of claim 10, wherein the scanner is a piezoelectric tube scanner.

14. The atomic force microscope of claim 10 , wherein the sensor is a capacitance sensor coupled to the scanner.

15. 12. The atomic force microscope of claim 11, wherein the AFM operates in one of a peak force tapping (PFT) mode, a contact mode, and a tapping mode.

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