Peel Test Equipment

Abstract

A peel test device is provided that can maintain a constant peel angle during a peel test even for a stretchable test film, thereby obtaining a highly reliable evaluation index. [Solution] The apparatus includes an adherend 1 forming an adherend surface 1x, a base 2 supporting the adherend 1, a test film holder 3 holding one end Ta of the test film T, a vertical movement mechanism 4 moving the base 2 in the direction perpendicular to the surface D3 to pull the test film T, a horizontal movement mechanism 5 moving the base 2 in the surface length direction D1 in accordance with the movement of the base 2 by the vertical movement mechanism 4, and a correction unit 6 correcting a deviation in the peel angle θ of the test film T caused by the elongation deformation of the test film T when the test film T is pulled. The horizontal movement mechanism 5 actively moves the base 2 to one side D1a in the surface length direction D1 at a speed approximately equal to the movement speed of the base 2 by the vertical movement mechanism 4. The correction unit 6 is a correction slide mechanism that passively slides the adherend 1 relative to the base 2 to the other side D1b in the surface length direction D1 due to the tensile force of the test film T.

Description

[Technical Field]

[0001] The present invention relates to a peel test device. [Background technology]

[0002] Currently, adhesives (adhesive tapes, adhesive sheets) are used for a variety of purposes, including industrial products and medical supplies. However, when using them for such purposes, it is necessary to evaluate and understand the physical properties of the adhesive, such as adhesive strength and peel strength, in advance.

[0003] For this reason, there exists a peel test for measuring adhesive strength or peel force, which is the peel adhesive strength of adhesives, etc., and the test method is specified in JIS Z 0237. Also, test equipment for carrying out such peel tests is generally known, as described in Patent Document 1, for example. [Prior art documents] [Patent documents]

[0004] [Patent Document 1] Patent No. 4717156 Summary of the Invention [Problem to be solved by the invention]

[0005] In the peel test described above, if the peel angle of the adhesive tape or other test object changes, the actual measured value of the peel force (peel resistance) will also change, so it is necessary to pull the test object at a constant peel angle and peel it from the adherend surface. However, if the test object is stretchable, it is difficult to maintain a constant peel angle during the peel test, making it difficult to obtain accurate measurement results. In fact, products such as transdermal patches and adhesive bandages, for example, are stretchable, and there is a desire to reduce the pain that occurs when they are removed from the skin as much as possible. Therefore, it is necessary to measure and evaluate the peeling force of such stretchable products as accurately as possible.

[0006] Therefore, the present invention provides a peel test device that can maintain a constant peel angle during a peel test, even for test objects (hereinafter referred to as test films) that have elasticity, and can obtain highly reliable evaluation indicators. [Means for solving the problem]

[0007] A peel test device according to one aspect of the present invention is a peel test device that peels a test film from a surface to be adhered by pulling a spaced region of the test film spaced from the surface to be adhered, with the test film attached along the surface length direction of the surface to be adhered, the peel test device comprising: an adherend that forms the surface to be adhered; a base supporting the adherend; a test film holder that holds an end of the spaced region of the test film; a vertical movement mechanism that pulls the test film by moving the base and the test film holder away from each other in a surface-orthogonal direction that is orthogonal to the surface to be adhered; a lateral movement mechanism that moves the base in the surface length direction relative to the test film holder in accordance with the relative movement by the vertical movement mechanism; and a peel test device that peels the test film when the test film is pulled. The device is equipped with a correction unit that corrects the deviation in the peel angle of the test film due to the elongational deformation of the test film, and a load measuring device that measures the load in the direction perpendicular to the surface when the test film is peeled from the adherend surface, and the lateral movement mechanism actively moves the base relative to the test film holder at a speed approximately equal to the speed of the relative movement by the vertical movement mechanism to one side of the surface length direction toward which the inner surface of the film faces in the separation region of the test film, when the surface of the test film that adheres to the adherend surface is the inner surface of the film and the surface opposite to the inner surface of the film is the outer surface of the film, and the correction unit is a correction slide mechanism that passively slides the adherend relative to the base to the other side of the surface length direction by the tensile force of the test film.

[0008] A peel test device according to another aspect of the present invention is a peel test device that peels a test film from a surface to be adhered by pulling a spaced region of the test film that is spaced from the surface to be adhered, with the test film attached along the surface length direction of the surface to be adhered. The peel test device comprises an adherend that forms the surface to be adhered, a base that supports the adherend, a test film holder that holds an end of the spaced region of the test film, a vertical movement mechanism that pulls the test film by moving the base and the test film holder relatively away from each other in a plane perpendicular to the surface to be adhered, and a pulling mechanism for pulling the test film. and a load measuring device that measures the load in the direction perpendicular to the surface when the test film is peeled from the adherend surface. The correction device is a correction slide mechanism that, when the surface of the test film that adheres to the adherend surface is the inner surface of the film and the surface opposite to the inner surface of the film is the outer surface of the film, causes the adherend to slide relative to the base by the tensile force of the test film to one side in the length direction of the surface that faces the outer surface of the film in the separation region of the test film.

[0009] In the above-mentioned peel test apparatus, the base may be provided with a guide portion that is positioned near the boundary between the separation region of the test film and the adhesion region, which is the region of the test film that is attached to the deposition surface, and that faces the outer surface of the test film.

[0010] In the peel test device, the guide portion may be rotatable relative to the base about an axis extending in a face width direction of the adherend surface, which is a direction intersecting the face length direction.

[0011] In the above peel test apparatus, the load measuring device is connected to the test film holder, and the peel test apparatus may further include a dummy test film that is attached to the adherend surface in a line with the surface width direction of the adherend surface, which is a direction that intersects the surface length direction with respect to the test film, and whose area spaced apart from the adherend surface (hereinafter referred to as a dummy separation area) is arranged along the separation area of ​​the test film, and a support base that holds the end of the dummy separation area and supports the load measuring device.

[0012] In the peel test apparatus, the load measuring device is connected to the test film holder, and the peel test apparatus further comprises a dummy test film attached to the adherend surface in a line with the surface width direction of the adherend surface, which is a direction intersecting the surface length direction, and a region of the dummy test film spaced from the adherend surface (hereinafter, dummy spaced region) arranged along the spaced region of the test film, and a support base that holds an end of the dummy spaced region and supports the load measuring device, and the base has a support base that holds the dummy spaced region of the dummy test film and a support base that holds the load measuring device. A guide portion is provided near the boundary between the separation region of the test film and a dummy attachment region that is a region attached to the deposition surface of the test film, and near the boundary between the separation region of the test film and an attachment region that is a region attached to the deposition surface of the test film, and when the surface of the dummy test film that attaches to the deposition surface is the dummy film inner surface and the surface opposite the dummy film inner surface is the dummy film outer surface, the guide portion has a dummy facing region that faces the dummy film outer surface and a test film facing region that faces the film outer surface of the test film, and the distance between the test film facing region and the test film may be greater than the distance between the dummy facing region and the dummy test film.

[0013] The peel test apparatus may further include an adherend movement amount sensor that measures the amount of movement of the adherend relative to the base in the surface length direction, a base / holder movement amount measurement sensor that measures the relative movement distance between the base and the test film holder in the direction perpendicular to the surface, and a calculation device that calculates an index related to the elongation amount of the test film from the actual measurement value of the movement amount measurement sensor and the actual measurement value of the base / holder movement amount measurement sensor.

[0014] A peel test device according to another aspect of the present invention is a peel test device that peels a test film from an adherend surface by pulling a spaced region of the test film spaced from the adherend surface, with the test film attached along the surface length direction of the adherend surface, and includes an adherend that forms the adherend surface; a test film holder that holds an end of the spaced region of the test film; a vertical movement mechanism that pulls the test film by relatively moving the adherend and the test film holder away from each other in the extension direction of the spaced region of the test film; and a lateral movement mechanism that moves the adherend in the surface length direction relative to the test film holder in accordance with the relative movement by the vertical movement mechanism. The device is equipped with a correction unit that corrects the deviation in the peel angle of the test film due to the elongation deformation of the test film that occurs when the test film is pulled, and a load measuring device that measures the load in the extension direction of the separation region when the test film is peeled from the adherend surface, and the lateral movement mechanism moves the adherend relative to the test film holder to the side toward which the inner surface of the film in the separation region of the test film faces, when the surface of the test film that adheres to the adherend surface is the inner surface of the film and the surface opposite to the inner surface of the film is the outer surface of the film, and the correction unit has a distance sensor that measures the distance from itself to the outer surface or the inner surface of the film in the separation region, and a lateral movement control device that adjusts the movement speed of the adherend by the lateral movement mechanism so that the actual measurement value of the distance sensor becomes approximately constant. [Effects of the Invention]

[0015] According to the above peel test device, even for a test film that has elasticity, it is possible to maintain a constant peel angle during the peel test and obtain a highly reliable evaluation index. [Brief explanation of the drawings]

[0016] [Figure 1] 1A and 1B are plan views of a peel test device according to a first embodiment of the present invention, in which (a) shows the state before the start of tensioning the test film, and (b) shows the state after the deviation in the peel angle due to the elongation deformation of the test film has occurred and the deviation in the peel angle has been corrected. [Figure 2]FIG. 2 is a cross-sectional view of the peel test device of the first embodiment, showing cross section II of FIG. 1(a). [Figure 3] FIG. 1 is a schematic diagram for explaining the following formula (2). [Figure 4] FIG. 2 is a cross-sectional view of a modified example of the peel test device according to the first embodiment, which is a cross-sectional view corresponding to cross section II in FIG. 1(a). [Figure 5] 10A and 10B are plan views of a peel test device according to a second embodiment of the present invention, in which (a) shows the state before the start of tensioning the test film, and (b) shows the state after the deviation in the peel angle due to the elongation deformation of the test film has occurred and the deviation in the peel angle has been corrected. [Figure 6] FIG. 5(b) is a cross-sectional view of the peel test device of the second embodiment, showing the VV cross section of FIG. 5(a). [Figure 7] FIG. 6 is a cross-sectional view of a modified example of the peel test device according to the second embodiment, which is a cross-sectional view corresponding to the VV cross section of FIG. 5(a). [Figure 8] 10A and 10B are plan views of a peel test device according to a third embodiment of the present invention, in which (a) shows the state before tensioning of the test film begins, and (b) shows the state after the deviation in the peel angle due to elongation deformation of the test film has occurred and the deviation in the peel angle has been corrected. [Figure 9] FIG. 1 is a plan view showing an experimental device used in the examples. [Figure 10] Graphs showing experimental results, with the horizontal axis representing the base movement speed and the vertical axis representing the peel force of the test film and the horizontal component of force acting on the adherend. (a) shows the results when the peel angle of the test film was 60 degrees, (b) shows the results when the peel angle of the test film was 90 degrees, (c) shows the results when the peel angle of the test film was 120 degrees, and (d) shows the results when the peel angle of the test film was 178 degrees. DETAILED DESCRIPTION OF THE INVENTION

[0017] First Embodiment Hereinafter, a first embodiment of the present invention will be described in detail with reference to the drawings. (Overall composition) As shown in FIGS. 1(a) and 1(b), the peel test device 100 is a device that pulls the portion of the sheet-like or film-like test film T that is separated from the adherend surface 1x while the test film T is attached to the adherend surface 1x, thereby peeling the test film T from the adherend surface 1x. In this embodiment, the test film T is an adhesive tape, adhesive sheet, or the like made of a material that stretches in its longitudinal direction. Hereinafter, the region of the test film T that is attached to the adherend surface 1x will be referred to as the adherent region T1. Furthermore, the region of the test film T that is separated from the adherend surface 1x will be referred to as the separated region T2. ​​As the peel test progresses, the adherent region T1 becomes shorter, while the separated region T2 becomes longer.

[0018] Specifically, this peel test apparatus 100 includes an adherend 1 forming the above-mentioned adherend surface 1x, a base 2 supporting the adherend 1, a test film holder 3 holding one end Ta of the test film T which is the end of the separation region T2 of the test film T, a vertical movement mechanism 4 and a horizontal movement mechanism 5 for moving the base 2, a correction slide mechanism (correction unit) 6 that allows the adherend 1 to move relative to the base 2, a load measuring device 7 that measures the load (peel resistance) when the test film T is peeled from the adherend surface 1x, and a support 8 that supports the load measuring device 7. The peel test apparatus 100 also includes an adherend movement amount measuring sensor 9 that measures the amount of movement of the adherend 1 relative to the base 2, a base / holder movement amount measuring sensor 10 that measures the amount of movement of the base 2 relative to the test film holder 3, and a computing device 11 that calculates a predetermined index related to the amount of elongation of the test film T from the actual measurement values ​​of the adherend movement amount measuring sensor 9 and the base / holder movement amount measuring sensor 10.

[0019] The adherend 1 extends in the direction in which the adherend surface 1x extends (hereinafter referred to as the surface length direction D1).

[0020] The base 2 supports the adherend 1 from below, which is one side of the adherend surface 1x in a face width direction D2 that intersects (is perpendicular to) the face length direction D1 of the adherend surface 1x. The base 2 may also support the adherend 1 from a face-orthogonal direction D3 that is perpendicular to the face length direction D1 and the face width direction D2.

[0021] The test film holder 3 is disposed at a distance from the adherend surface 1x, i.e., the adherend 1, to one side (downward as viewed in FIG. 1) in the direction perpendicular to the surface D3, and holds one end Ta of the test film T with the spaced region T2 of the test film T in a position approximately perpendicular to the adherend surface 1x. The configuration of the test film holder 3 is not particularly limited, and the test film holder 3 holds one end Ta of the test film T by clamping the one end Ta of the test film T or by attaching it without clamping. The test film holder 3 is designed not to move relative to the base surface 100a that defines the bottom of the peel test apparatus 100.

[0022] The vertical movement mechanism 4 is a mechanism for pulling the test film T by "actively" moving the base 2 together with the adherend 1 toward the other side of the plane-orthogonal direction D3 (upward as viewed in FIG. 1 ) relative to the test film holder 3. The structure of the vertical movement mechanism 4 is not particularly limited, but the vertical movement mechanism 4 of this embodiment includes a power unit 41 that supports the base 2 from below via a stage 51 (described later) and moves the base 2 together with the stage 51 in the plane-orthogonal direction D3, and a vertical movement control device 42 that controls the power unit 41. Although detailed illustrations of the power unit 41 are omitted, the power unit 41 includes a drive unit (such as a motor or actuator) and a power transmission mechanism (such as gears). The vertical movement control device 42 is configured by a computer including a microprocessor or the like, and controls the power unit 41 to move the base 2 together with the stage 51 (described later) at any speed and stop it at any position.

[0023] The vertical movement mechanism 4 is not limited to moving the base 2 relative to the test film holder 3, but may also move the test film holder 3 relative to the stationary base 2, or may move both the base 2 and the test film holder 3, as long as it moves the base 2 and the test film holder 3 relatively away from each other in the direction D3 perpendicular to the surface.

[0024] The lateral movement mechanism 5 has a stage 51 interposed between the vertical movement mechanism 4 and the base 2, and a movement structure 52 that "actively" moves the base 2 together with the adherend 1 relative to the stage 51 in the surface length direction D1, thereby moving the base 2 relative to the test film holder 3. In this embodiment, the stage 51 is, for example, disk-shaped, but its shape is not particularly limited. Although detailed illustration of the movement structure 52 is omitted, it may be composed of, for example, gears for transmitting the power of the power unit 41 in the vertical movement mechanism 4 to the base 2, slide rails interposed between the stage 51 and the base 2, etc.

[0025] Here, the surface of the test film T that adheres to the adherend surface 1x is defined as the film inner surface Ti, and the surface opposite to the film inner surface Ti is defined as the film outer surface To. The lateral movement mechanism 5 moves the base 2 relative to the test film holder 3 to one side D1a in the surface length direction D1, which is the side toward which the film inner surface Ti faces in the separation region T2 of the test film T, at a speed substantially equal to the speed at which the base 2 moves in the surface-orthogonal direction D3 by the vertical movement mechanism 4. That is, the lateral movement mechanism 5 moves the base 2 in the surface length direction D1 in accordance with the movement of the base 2 in the surface-orthogonal direction D3 by the vertical movement mechanism 4. As a result, if the test film T does not elongate and deform, the peel angle θ of the test film T with respect to the adherend surface 1x during the peel test is maintained at substantially 90 degrees.

[0026] Furthermore, the horizontal movement mechanism 5 may have a power unit separate from the power unit 41 of the vertical movement mechanism 4, and this power unit may be controlled together with the vertical movement mechanism 4 by the vertical movement control device 42 or another control device, for example, so that the base 2 is moved in the face length direction D1 at a speed approximately equal to the movement speed in the face perpendicular direction D3.

[0027] When the test film T is pulled by moving the base 2 in the direction D3 orthogonal to the surface by the vertical movement mechanism 4, the correction slide mechanism (correction unit) 6 "followingly" slides the adherend 1 to the other side D1b in the surface length direction D1 relative to the base 2 by the tensile force. In other words, the correction slide mechanism 6 can move the adherend 1 relative to the base 2 to the side opposite to the side to which the base 2 is moved by the horizontal movement mechanism 5.

[0028] 2, the correction slide mechanism 6 has a rail 60 extending in the surface length direction D1 on the surface of the base 2, and an engagement portion (such as an engagement groove) 61 formed on the adherend 1 that engages with the rail 60. Note that the engagement portion may be provided on the side of the base 2 and the rail on the side of the adherend 1, and the structure is not particularly limited as long as it allows the adherend 1 to slide relative to the base 2. It is preferable that the movement resistance of the adherend 1 relative to the base 2 is as small as possible, and a material with lower friction (such as a lubricant or resin coating) than the base 2 and the adherend 1 may be used for the rail 60 and / or the engagement portion 61 themselves, or for their surfaces.

[0029] 1(a) and 1(b), the load measuring device 7 is connected to the test film holder 3 from one side in the plane-orthogonal direction D3, and measures the load in the plane-orthogonal direction D3 applied to the test film holder 3 when peeling the test film T from the adherend surface 1x, i.e., the peel force of the test film T. The load measuring device 7 has a load cell (not shown) and is electrically connected to a computing device 11, which will be described in detail later. The method for detecting the load in the load measuring device 7 is not particularly limited, and may be any of a strain gauge type, a piezoelectric type, a capacitance type, an electromagnetic type, a tuning fork type, or the like.

[0030] The support table 8 supports the load measuring device 7 from below, which is one side in the surface width direction D2. Even when the base 2 moves, the support table 8 does not move relative to the base surface 100a of the peel test apparatus 100, and is fixed at a predetermined position on this base surface 100a.

[0031] The adherend movement amount measuring sensor 9 is a non-contact distance sensor that uses, for example, laser light or ultrasonic waves to measure the amount of movement of the adherend 1 in the surface length direction D1 relative to the base 2. Therefore, the adherend movement amount measuring sensor 9 is fixed to a predetermined position on the base 2. The adherend movement amount measuring sensor 9 irradiates laser light or ultrasonic waves to a protrusion 1t protruding from the adherend 1 on one side in the surface-orthogonal direction D3, receives the reflected wave, obtains the distance to the protrusion 1t itself, and measures the amount of movement of the adherend 1 in the surface length direction D1 from the change in this distance as the peel test progresses. Note that other types of sensors, such as a potentiometer or rotary encoder, may also be used for the adherend movement amount measuring sensor 9.

[0032] Similar to the adherend movement measurement sensor 9, the base / holder movement measurement sensor 10 is a non-contact distance sensor that uses laser light or ultrasonic waves to measure the amount of movement of the base 2 in the plane-orthogonal direction D3. Similar to the support table 8, the base / holder movement measurement sensor 10 is fixed at a predetermined position on the base surface 100a of the peel test apparatus 100, irradiates the base 2 with laser light or ultrasonic waves, receives the reflected waves, obtains the distance to the base 2, and measures the amount of movement of the base 2 in the plane-orthogonal direction D3 from changes in this distance as the peel test progresses. Note that other types of sensors, such as a potentiometer or rotary encoder, may also be used for the base / holder movement measurement sensor 10.

[0033] The calculation device 11 is configured by a computer including a microprocessor or the like, and has a test result output unit 11a that outputs each numerical value obtained in the peel test, and an elongation index calculation output unit 11b that calculates and outputs a predetermined index related to the elongation amount of the test film T based on each numerical value obtained in the peel test. The calculation device 11 may be realized by the same computer as each of the above-mentioned control devices.

[0034] The test result output unit 11a receives a signal relating to the actual measured value of the movement amount of the adherend 1 in the surface length direction D1 relative to the base 2 measured by the adherend movement amount measuring sensor 9, a signal relating to the actual measured value of the movement amount of the base 2 in the surface perpendicular direction D3 measured by the base / holding body movement amount measuring sensor 10, and a signal relating to the actual measured value of the peel force from the load measuring instrument 7, and outputs these actual measured values.

[0035] In this embodiment, the elongation index calculation output unit 11b calculates and outputs the "elongation rate ε [%]", which is a predetermined index related to the elongation amount of the test film T. The elongation rate ε [%] is calculated using the following formula (1).

[0036] In the following formula (1), L D [mm] indicates the actual measurement value of the base / holder movement amount measuring sensor 10, that is, the pulling distance of the test film T, which is the movement amount of the base 2. Also, ΔL [mm] indicates the actual measurement value of the adherend movement amount measuring sensor 9, that is, the movement distance of the adherend 1 relative to the base 2. Also, L I [mm] indicates the length dimension of the separation region T2 in the test film T before the start of the peel test, i.e., the initial setting distance. D -ΔL” is the elongation of the test film T. ε=(L D -ΔL) / (ΔL+L I )···(1)

[0037] More specifically, the calculation device 11 is configured to obtain an output such as that shown in the following Table 1. Note that the values ​​shown in the following Table 1 are not actual measured values, but are assumed values ​​that would be obtained when a test is performed using the peel test device 100 of this embodiment. [Table 1]

[0038] In Table 1 above, the pulling distance L of the test film T DThe reason why the elongation rate of the test film T is "0" until the elongation rate reaches 1 mm is because peel tests are generally based on the premise that the test is started after the separation region T2 of the test film T is slightly bent (in the so-called "setback" state).

[0039] (Action and effect) According to the peel test apparatus 100 of the present embodiment described above, during a peel test, the base 2 is moved away from the test film holder 3 in the direction perpendicular to the surface D3, and the base 2 is actively moved in the surface length direction D1 in response to this movement, causing the test film T to gradually peel off from the adherend surface 1x. If the test film T does not elongate or deform, the peel angle θ is maintained at approximately 90 degrees. In the case of the test film T of the present embodiment, elongation and deformation occur in the test film T during the peel test, and the peel angle becomes larger than 90 degrees due to the elongation and deformation of the test film T, as shown in FIG. 1(b), resulting in a deviation in the peel angle θ.

[0040] In this case, a component force acts from the test film T on the adherend 1 to pull the adherend 1 toward the other side D1b in the surface length direction D1, and the correction slide mechanism 6 causes the adherend 1 to slide relative to the base 2 due to the tensile force of the test film T so that the peel position of the test film T returns to the other side D1b in the surface length direction D1 in a direction that eliminates the deviation in the peel angle, i.e., so that the peel angle θ is reduced, thereby making it possible to correct the deviation in the peel angle θ.

[0041] Therefore, even if the test film T is stretched during the peel test, the peel angle θ is kept constant at approximately 90 degrees, making it possible to measure the peel force accurately and obtain a highly reliable evaluation index for the test film T. In reality, the peel angle θ is not expected to always be exactly 90 degrees, and it is expected that there will be some variation (of a few degrees) from 90 degrees, which is why it is described as "approximately 90 degrees."

[0042] If the test film T does not have elasticity, the geometric relationship between the pulling distance LT of the test film T, the peeling distance LP of the test film T, and the peeling angle θ satisfies the following equation (2), as shown in Figure 3. LT = (1 - cosθ)LP (2) In the above formula (2), if the peel angle θ = 90 degrees, then LT = LP, and it can be seen that the tensile distance LT of the test film T is equal to the peel distance LP. Therefore, when a peel test is performed with the peel angle θ set to 90 degrees, no force acts on the test film T in the plane length direction D1 intersecting the tensile direction (plane-orthogonal direction D3), but only a force acts in the plane-orthogonal direction D3. In other words, no shear force acts on the test film T, and only a tensile force acts on it. Therefore, performing a peel test with the peel angle θ set to 90 degrees as in this embodiment has the advantage of allowing for a more accurate evaluation of the peel force of the test film T.

[0043] Furthermore, by setting the peel angle θ to 90 degrees, the risk of the test film T self-adhering during the peel test can be reduced compared to when the peel angle θ is an obtuse angle, even if the test film T is a double-sided adhesive tape. Therefore, various types of adhesive tapes and films can be used as the test film T, increasing versatility.

[0044] Furthermore, in the peel test device 100 of this embodiment, by providing the adherend movement measurement sensor 9 and the base / holder movement measurement sensor 10, it is possible to measure the elongation amount of the test film T as well as the peel force, and by using the above formula (1), it is also possible to acquire and output data on the elongation rate of the test film T. Therefore, it is possible to evaluate the physical properties of the test film T made of a stretchable material from multiple perspectives.

[0045] As shown in Table 1 above, the base 2 is moved in the direction perpendicular to the surface D3 until a predetermined pulling distance (11 mm in the example of Table 1) is reached, and the tensile force acts to stretch the test film T, so the peel force remains low. After that, when the predetermined pulling distance (11 mm in the example of Table 1) is reached, the elongation ε of the test film T becomes almost constant, and the test film T begins to peel from the adherend surface 1x. Therefore, it can be seen that the peel force required to peel the stretchable test film T can be determined by referring to the numerical value of the peel force when the pulling distance is equal to or greater than the predetermined distance (11 mm or greater in the example of Table 1). Since the peel test apparatus 100 of this embodiment can acquire data on the elongation rate of the test film T, the peel force of the stretchable test film T can be accurately determined, enabling accurate evaluation of the peel force.

[0046] In this embodiment, a dummy test film DT may be provided alongside the test film T, as shown in FIG. 4. The dummy test film DT is attached to the adherend surface 1x alongside the test film T in the surface width direction D2. The dummy test film DT has a dummy attachment region DT1 attached to the adherend surface 1x and a dummy separation region DT2 spaced apart from the adherend surface 1x. The dummy separation region DT2 is arranged to extend in the surface-orthogonal direction D3 along the separation region T2 of the test film T. The number of dummy test films DT is not particularly limited, but it is preferable to provide the same number of dummy test films DT on both sides of the test film T in the surface width direction D2, for example, one on each side. The dimensions (thickness and width) and material of the dummy test film DT are approximately the same as those of the test film T, but it is preferable to say that they are completely the same.

[0047] One end DTa of the dummy test film DT, which is the end of each dummy separation region DT2, is held by a dummy holder 80 provided on the support base 8, and the dummy test film DT is not connected to the load measuring device 7. When the base 2 is moved in the direction D3 orthogonal to the surface by the vertical movement mechanism 4, the dummy test film DT is also pulled together with the test film T.

[0048] When such a dummy test film DT is provided, the test result output unit 11a in the computing device 11 calculates and outputs the peel force F of the test film T using the following formula (3) based on the input signal related to the actual measurement value of the load measuring device 7. In the following formula (3), "N" represents the number of dummy test films DT, and "F0" represents the actual measurement value of the peel force obtained by the load measuring device 7. F = F0 / N (3)

[0049] By providing such a dummy test film DT, it is possible to reduce measurement errors in the peel force due to the movement resistance (frictional resistance, etc.) of the adherend 1 when the base 2 is moved to pull the test film T. That is, the actual measurement value obtained by the load measuring device 7 includes not only the original peel force of the test film T but also the movement resistance force when the adherend 1 slides relative to the base 2, but by using the above formula (3), the movement resistance force included in the finally calculated peel force F can be set to 1 / N. Therefore, it is possible to reduce the difference between the original peel force and the peel force F output by the calculation device 11, and improve measurement accuracy.

[0050] Second Embodiment Next, a peel test apparatus 100A according to a second embodiment of the present invention will be described. The same components as those in the first embodiment will be assigned the same reference numerals and detailed description will be omitted. 5(a) and 5(b), the peel test apparatus 100A of this embodiment differs from the peel test apparatus 100 of the first embodiment in that it is not provided with a lateral movement mechanism 5. That is, in the peel test apparatus 100A of this embodiment, the base 2 is not moved in the surface length direction D1 relative to the test film holder 3.

[0051] When the test film T is pulled by moving the base 2 in the direction D3 perpendicular to the surface by the vertical movement mechanism 4, the correction slide mechanism (correction unit) 6A "follows" by the tensile force to slide the adherend 1 to one side D1a in the surface length direction D1 relative to the base 2. In other words, the correction slide mechanism 6A moves the adherend 1 in the direction opposite to the movement direction of the adherend 1 in the first embodiment.

[0052] In this embodiment, the base 2 is provided with a guide pin (guide portion) 21. The guide pin 21 is disposed near the boundary between the adhesion region T1 and the separation region T2 in the test film T, and faces the test film T from the other side D1b in the surface length direction D1, which is opposite to the side along which the adherend 1 moves when the test film T is pulled and peeled off. In other words, the guide pin 21 faces the outer film surface To of the test film T.

[0053] 6, the guide pin 21 is rotatable about an axis O extending in the face width direction D2 relative to the base 2, and guides the test film T by wrapping the test film T around a portion of its outer circumferential surface. Note that the guide pin 21 does not necessarily have to be a rotating rod-shaped member; for example, instead of the guide pin 21, a plate-shaped or block-shaped guide portion facing the test film T may be provided.

[0054] (Action and effect) According to the peel test apparatus 100A of the present embodiment described above, when the test film T is pulled and gradually peeled from the adherend surface 1x during the peel test, the test film T undergoes elongation and deformation. This elongation and deformation causes the peel angle θ to become smaller than 90 degrees, as shown in FIG. 5(b), resulting in a deviation in the peel angle θ. In this case, a component force pulling the adherend 1 toward one side D1a in the surface length direction D1 acts on the adherend 1 from the test film T. The correction slide mechanism 6A slides the adherend 1 relative to the base 2 to move the peel position of the test film T toward one side D1a in the surface length direction D1 in a direction that eliminates the deviation in the peel angle, i.e., to increase the peel angle θ, thereby correcting the deviation in the peel angle θ. Therefore, even if the test film T is stretched during the peel test, the peel angle θ is maintained constant at approximately 90 degrees, enabling accurate measurement of the peel force and obtaining a highly reliable evaluation index for the test film T.

[0055] Furthermore, in the case of this embodiment, the sliding movement amount of the adherend 1 when correcting the peel angle θ is greater than in the first embodiment, but the lateral movement mechanism 5 of the first embodiment is not necessary, which simplifies the device and reduces costs.

[0056] In addition, in this embodiment, data such as that shown in Table 1 above can be obtained using a method similar to that of the first embodiment described above, and the physical properties of the test film T made of an elastic material can be evaluated in a multifaceted and accurate manner.

[0057] Furthermore, the provision of guide pin 21 can prevent the peel point on adherend surface 1x of test film T from moving significantly toward the other side D1b in the surface length direction D1 due to elongation and deformation of test film T. In other words, guide pin 21 performs an auxiliary function of correcting deviation of peel angle θ due to the driven sliding movement of adherend 1. Furthermore, in this embodiment, the rotation of guide pin 21 can reduce the frictional resistance between test film T and guide pin 21, preventing this frictional resistance force from being included in the measured value of peel force, thereby enabling more accurate measurement of peel force.

[0058] 7, a dummy test film DT may be provided in this embodiment as in the first embodiment. In this case, a guide pin (guide portion) 21A provided on the base 2 is arranged near the boundary between the dummy attachment region DT1 and the dummy separation region DT2 in the dummy test film DT, and is also arranged near the boundary between the attachment region T1 and the separation region T2 in the test film T.

[0059] The guide pin 21A is rod-shaped and rotatable about an axis O1 extending in the surface width direction D2 relative to the base 2, and guides the dummy test film DT by wrapping the dummy test film DT around its outer peripheral surface. Specifically, the guide pin 21A has a dummy facing region 21Ax facing the dummy test film DT from the other side D1b in the surface length direction D1, and a test film facing region 21Ay facing the test film T from the other side D1b in the surface length direction D1. That is, the dummy facing region 21Ax faces the outer film surface DTo of the dummy test film DT (the surface opposite to the inner film surface DTi on the side adhering to the deposition surface 1x), and the test film facing region 21Ay faces the outer film surface To of the test film T. The test membrane facing region 21Ay is formed with a smaller diameter than the dummy facing region 21Ax, and the distance between the test membrane facing region 21Ay and the test membrane T is greater than the distance between the dummy facing region 21Ax and the dummy test membrane DT (the radial distance perpendicular to the axis O1). Note that, like the guide pin 21, the guide pin 21A does not necessarily have to rotate or be rod-shaped.

[0060] By providing the guide pin 21A with a test film facing area 21Ay having a smaller diameter than the dummy facing area 21Ax in this way, when the dummy facing area 21Ax comes into contact with the dummy test film DT and guides the dummy test film DT, the test film T can be kept out of contact with the test film facing area 21Ay, and the rotational resistance force that occurs when the guide pin 21A is rotated and the frictional resistance force between the guide pin 21A and the test film T can be prevented from occurring between the guide pin 21A and the test film T.This makes it possible to exclude this rotational resistance force and frictional resistance force from the actual measurement value obtained by the load measuring device 7.As a result, the difference between the actual peel force and the peel force F output by the calculating device 11 can be reduced, and the measurement accuracy can be improved.

[0061] Third Embodiment Next, a peel test apparatus 100B according to a third embodiment of the present invention will be described. The same components as those in the first and second embodiments are designated by the same reference numerals, and detailed description thereof will be omitted. As shown in Figures 8(a) and 8(b), the peel test apparatus 100B of this embodiment differs from the first and second embodiments in that it is equipped with a correction unit 6B, instead of the correction slide mechanisms 6 and 6A, that corrects the deviation in the peel angle caused by the elongation deformation of the test film T through electrical control.

[0062] In this embodiment, the above-mentioned base 2 is not provided, and instead, for example, an adherend 1B is provided in which the adherend 1 and the base 2 are integrated, and the lateral movement mechanism 5B is configured to move the adherend 1B to one side D1a in the face length direction D1.

[0063] In addition, in this embodiment, the peel angle θ of the test film T does not necessarily have to be 90 degrees, and the vertical movement mechanism 4 moves the substrate 1B away from the test film holder 3 in the extension direction of the separation region T2 of the test film T, i.e., in a direction forming an angle θ with respect to the substrate surface 1Bx, and the load measuring device 7 measures the load in the extension direction of this separation region T2.

[0064] The correction unit 6B is equipped with a distance sensor 60B that measures the distance Lx from itself to the surface of the separation region T2, and a lateral movement control device 61B that adjusts the movement speed of the substrate 1B by the lateral movement mechanism 5B so that the actual measurement value of the distance sensor 60B becomes an approximately constant value.

[0065] The distance sensor 60B is a non-contact sensor that is arranged, for example, facing the inner film surface Ti or the outer film surface To of the separation region T2 of the test film T, and measures the distance between the distance sensor 60B itself and the test film T by irradiating the inner film surface Ti or the outer film surface To with laser light or ultrasonic waves and receiving the reflected wave, but other types of sensors may also be used. The distance sensor 60B is arranged on the base surface 100a of the peel test apparatus 100B, and is fixed at a predetermined position on the base surface 100a so that the distance sensor 60B itself does not move even when the adherend 1B moves as the peel test progresses.

[0066] The lateral movement control device 61B is configured by a computer including a microprocessor or the like, and is controlled in an integrated manner together with the longitudinal movement control device 42 of the longitudinal movement mechanism 4. Therefore, the lateral movement mechanism 5B of this embodiment is not, for example, like the above-mentioned moving structure 52, a gear-like device for transmitting the power of the power device 41 in the longitudinal movement mechanism 4 to the base 2, but has a power device separate from the power device 41 of the vertical movement mechanism 4, and this power device is preferably controlled by the lateral movement control device 61B.

[0067] If the test film T does not elongate, and the peel angle is θ and the movement speed of the adherend 1B in the direction perpendicular to the surface D3 by the vertical movement mechanism 4 is VT, then the movement speed VP of the adherend 1B in the direction of the surface length D1 by the horizontal movement mechanism 5B can be calculated from the following equation (4) based on the geometric relationship. Note that with regard to this geometric relationship, it is clear that the following equation (4) can be derived by replacing LP with VP and LT with VT in Figure 2 and the above equation (2). VP=VT / (1-cosθ) (4)

[0068] The lateral movement control device 61B controls the movement speed VP of the substrate 1B in the surface length direction D1 to be slower than the speed indicated by the right side of the above equation (4), thereby moving the substrate 1 in a direction that eliminates the deviation in the peel angle θ, i.e., returns the peel position of the test film T to the other side D1b in the surface length direction D1 so as to reduce the peel angle θ, thereby correcting the deviation in the peel angle θ and maintaining the peel angle θ constant.

[0069] (Action and effect) As the peel test progresses and the test film T undergoes elongation deformation, the peel angle becomes larger than θ due to the elongation deformation of the test film T, as shown in θz in FIG. 8(b), causing a deviation in the peel angle θ and reducing the distance Lx from the distance sensor 60B to the separation region T2 of the test film T. In this regard, according to the peel test apparatus 100B of the present embodiment described above, the lateral movement control device 61B of the correction unit 6B can correct the deviation in the peel angle θ by maintaining a constant distance from the distance sensor 60B to the separation region T2 of the test film T. Therefore, even when the test film T undergoes elongation deformation, accurate measurement of the peel force is possible, and a highly reliable evaluation index for the test film T can be obtained.

[0070] The present invention is not limited to the above-described embodiment, and it goes without saying that various modifications can be made without departing from the spirit of the present invention. [Example]

[0071] The following describes the results of a verification experiment to explain why it is preferable to use the actual measured value when a peel test is performed at a peel angle of 90 degrees as the peel force of the test film T. As shown in FIG. 9, a peel test was performed using an experimental peel test device 200 having the same configuration as the peel test device 100A of the second embodiment, and the peel angle θ T Test membrane T T In addition to measuring the peel force, the horizontal component force acting on the adherend 201 (the component force in the surface length direction D11 of the adherend surface 201x of the adherend 201) was measured.

[0072] In the peel test device 200, the adherend 201 is placed on a base 202, and the adherend 201 is supported by a slider (slide mechanism) 220 so as to be freely movable relative to the base 202 in the surface length direction D11 of the adherend surface 201x. T Adhesion area T T 1 is attached, and the base 202 is moved by the vertical movement device 204, whereby the test film T T The test film T TThe tensile direction of the test film T T The separation area T T 2 in the extension direction of the test membrane T T The pulling direction of the test film T is a plane perpendicular direction D13 perpendicular to the adherend surface 201x (perpendicular to the plane length direction D11 and the plane width direction D12). A load cell (load measuring device) 210 for measuring the horizontal component force was connected to the adherend 201. T One end of T T a is connected to the test membrane T through the test membrane holder 203. T A load cell (load measuring device) 207 for measuring the peeling force was connected. Although not shown, the vertical movement device 204 is equipped with a power device for moving the base 202 and a control device for controlling the power device.

[0073] In this experiment, test membrane T T Peel angle θ T The following four patterns were used. Pattern 1: 60 degrees Pattern 2: 90 degrees Pattern 3: 120 degrees Pattern 4: 178 degrees Pattern 4 simulates a peel angle of 180 degrees, which is physically impossible to achieve.

[0074] In this experiment, the test membrane T T The following materials were used: ·Resin composition (mol ratio): BA / AA (98 / 2) Curing agent: TETRAD® C (manufactured by Mitsubishi Gas Chemical Company, Inc.) Epoxy equivalent: 100 ·Curing agent content (solid content wt%): 0.191 ·Glue thickness-dry(μm):30 · PET substrate thickness (μm): 25 Release film thickness (μm): 38

[0075] In addition, during the peeling test, the moving speed of the base 202 was kept constant, and this moving speed was set to the following four patterns. Pattern A: 3 [mm / min] Pattern B: 30 mm / min Pattern C: 300 (mm / min) Pattern D: 3000 (mm / min)

[0076] Figure 10 shows a graph plotting the peel force [N] and horizontal component force [N] obtained in this experiment. As shown in Figure 10(a) to (d), the test film T T In the case where the peeling angle is other than 90 degrees (in the case of the above patterns 1, 3, and 4), the moving speed of the base 202, i.e., the test film T T It was confirmed that both the peel force and the horizontal component force increase linearly as the pulling speed increases. On the other hand, it was confirmed that the horizontal component force is almost zero when the peel angle is 90 degrees (Pattern 2 above).

[0077] Thus, referring to the results of this experiment, the peel angle θ T When the angle is 90 degrees, the test film T T It was found that almost no force acts in the surface length direction D11 of the adherend surface 201x, and that the most reliable numerical value can be obtained when trying to evaluate purely the peel force. [Industrial Applicability]

[0078] According to the peel test device of the present invention, even for a test film that has elasticity, it is possible to maintain a constant peel angle during the peel test and obtain a highly reliable evaluation index. [Explanation of symbols]

[0079] 1, 1B...Adherent 1x, 1Bx…Adhesive surface 2...Foundation 3...Test membrane holder 4...Vertical movement mechanism 5, 5B…Lateral movement mechanism 6, 6A... Correction slide mechanism (correction part) 6B...Correction section 7...Load measuring device 8…Support stand 9...Substrate movement measurement sensor 10...Base / holder movement measurement sensor 11...Arithmetic device 11a...Test result output section 11b...Indicator calculation output section 21, 21A...Guide pin (guide part) 21Ax: Dummy facing area 21Ay...Test membrane opposing area 41...Power plant 42...Vertical movement control device 60B...Distance sensor 61B...Lateral movement control device 80...Dummy holder 100, 100A, 100B...Peel test equipment D1: Face length direction D2…Surface width direction D3: Perpendicular to the surface T...Test membrane T1: Adhesion region T2…Separation area DT...Dummy test membrane DT1: Dummy attachment area DT2: Dummy separation area Ti...Inner surface of film To...Membrane outer surface

Claims

1. A peel test device in which a test film is attached along the length direction of a surface to be adhered, and the test film is peeled from the surface to be adhered by pulling a spaced area of ​​the test film that is spaced from the surface to be adhered, an adherend that forms the adherend surface; a base for supporting the adherend; a test membrane holder that holds an end of the spaced region of the test membrane; a vertical movement mechanism that pulls the test film by relatively moving the base and the test film holder away from each other in a plane perpendicular to the adherend surface; a horizontal movement mechanism that moves the base in the surface length direction relative to the test film holder in accordance with the relative movement by the vertical movement mechanism; a correction unit that corrects deviation in the peel angle of the test film caused by elongation deformation of the test film that occurs when the test film is pulled; a load measuring device for measuring a load in a direction perpendicular to the surface when the test film is peeled off from the adherend surface; Equipped with the horizontal movement mechanism actively moves the base relative to the test film holder at a speed substantially equal to the speed of the relative movement by the vertical movement mechanism to one side in the length direction of the surface of the test film that is the side toward which the inner film surface faces in the separation region of the test film, when the surface of the test film that adheres to the deposition surface is the inner film surface and the surface opposite to the inner film surface is the outer film surface; The correction unit is a correction slide mechanism that causes the adherend to slide relative to the base toward the other side in the surface length direction by the tensile force of the test film in the peel test device.

2. A peel test device in which a test film is attached along the length direction of a surface to be adhered, and the test film is peeled from the surface to be adhered by pulling a spaced area of ​​the test film that is spaced from the surface to be adhered, an adherend that forms the adherend surface; a base supporting the adherend; a test membrane holder that holds an end of the spaced region of the test membrane; a vertical movement mechanism that pulls the test film by relatively moving the base and the test film holder away from each other in a plane perpendicular to the adherend surface; a correction unit that corrects deviation in peel angle when the test film is pulled; a load measuring device for measuring a load in a direction perpendicular to the surface when the test film is peeled off from the adherend surface; Equipped with the correction unit is a correction slide mechanism that, when the surface of the test film that adheres to the adherend surface is defined as the film inner surface and the surface opposite to the film inner surface is defined as the film outer surface, causes the adherend to slide relative to the base by the tensile force of the test film toward one side in the surface length direction that is the side toward which the film outer surface faces in the separation region of the test film; an adherend movement amount sensor that measures the amount of movement of the adherend in the surface length direction relative to the base; a base / holder movement amount measuring sensor for measuring a relative movement distance between the base and the test film holder in a direction perpendicular to the plane; a computing device that calculates an index relating to the elongation amount of the test film from the actual measurement values ​​of the movement amount measuring sensor and the actual measurement values ​​of the base / holder movement amount measuring sensor; The peel test device further comprises:

3. The peel test device according to claim 2, wherein the base is provided with a guide portion that is positioned near the boundary between the separation region of the test film and an adhesion region that is the region of the test film that is attached to the deposition surface, and that faces the outer surface of the test film.

4. 4. The peel test device according to claim 3, wherein the guide portion is rotatable relative to the base about an axis extending in a face width direction of the adherend surface, which is a direction intersecting the face length direction.

5. the load measuring device is connected to the test film holder; A dummy test film is attached to the adherend surface in a width direction of the adherend surface, which is a direction intersecting the length direction of the surface of the test film, and a region of the dummy test film spaced from the adherend surface (hereinafter referred to as a dummy spaced region) is arranged along the spaced region of the test film; a support base that holds an end of the dummy separation area and supports the load measuring device; The peel test apparatus of claim 1 further comprising:

6. A peel test device in which a test film is attached along the length direction of a surface to be adhered, and the test film is peeled off from the surface to be adhered by pulling a spaced area of ​​the test film spaced from the surface to be adhered, an adherend that forms the adherend surface; a base supporting the adherend; a test membrane holder that holds an end of the spaced region of the test membrane; a vertical movement mechanism that pulls the test film by relatively moving the base and the test film holder away from each other in a plane perpendicular to the adherend surface; a correction unit that corrects deviation in peel angle when the test film is pulled; a load measuring device for measuring a load in a direction perpendicular to the surface when the test film is peeled off from the adherend surface; Equipped with the correction unit is a correction slide mechanism that, when the surface of the test film that adheres to the adherend surface is defined as the film inner surface and the surface opposite to the film inner surface is defined as the film outer surface, causes the adherend to slide relative to the base by the tensile force of the test film toward one side in the surface length direction that is the side toward which the film outer surface faces in the separation region of the test film; the load measuring device is connected to the test film holder; A dummy test film is attached to the adherend surface in a width direction of the adherend surface, which is a direction intersecting the length direction of the surface of the test film, and a region of the dummy test film spaced from the adherend surface (hereinafter referred to as a dummy spaced region) is arranged along the spaced region of the test film; a support base that holds an end of the dummy separation area and supports the load measuring device; The peel test device further comprises:

7. The base is provided with a guide portion near the boundary between the dummy separation region of the dummy test film and a dummy attachment region that is the region of the dummy test film attached to the adhesion surface, and near the boundary between the separation region of the test film and an attachment region that is the region of the test film attached to the adhesion surface, When the surface of the dummy test film that adheres to the adherend surface is defined as the inner surface of the dummy film, and the surface opposite to the inner surface of the dummy film is defined as the outer surface of the dummy film, The guide portion is a dummy facing region facing an outer surface of the dummy film; A test membrane facing region facing the membrane outer surface of the test membrane; and 7. The peel test device according to claim 6, wherein the distance between the test film facing area and the test film is greater than the distance between the dummy facing area and the dummy test film.

8. an adherend movement amount sensor that measures the amount of movement of the adherend in the surface length direction relative to the base; a base / holder movement amount measuring sensor for measuring a relative movement distance between the base and the test film holder in a direction perpendicular to the plane; a computing device that calculates an index relating to the elongation amount of the test film from the actual measurement values ​​of the movement amount measuring sensor and the actual measurement values ​​of the base / holder movement amount measuring sensor; The peel test apparatus of claim 1 further comprising:

9. A peel test device in which a test film is attached along the length direction of a surface to be adhered, and the test film is peeled from the surface to be adhered by pulling a spaced area of ​​the test film that is spaced from the surface to be adhered, an adherend that forms the adherend surface; a test membrane holder that holds an end of the spaced region of the test membrane; a longitudinal movement mechanism that pulls the test membrane by relatively moving the adherend and the test membrane holder away from each other in the extension direction of the separation region of the test membrane; a lateral movement mechanism that moves the adherend in the surface length direction relative to the test film holder in accordance with the relative movement by the vertical movement mechanism; a correction unit that corrects deviation in the peel angle of the test film caused by elongation deformation of the test film that occurs when the test film is pulled; a load measuring device for measuring a load in an extension direction of the separation region when the test film is peeled from the adherend surface; Equipped with the lateral movement mechanism moves the adherend relative to the test membrane holder to a side in the separation region of the test membrane toward which the inner membrane surface faces, when the surface of the test membrane that adheres to the adherend surface is defined as the inner membrane surface and the surface opposite to the inner membrane surface is defined as the outer membrane surface; The correction unit a distance sensor for measuring a distance from itself to the outer surface or the inner surface of the membrane in the separation region; a lateral movement control device that adjusts the movement speed of the adherend caused by the lateral movement mechanism so that the actual measurement value of the distance sensor becomes a substantially constant value; A peel test device having:

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