Integrating sphere, integrating sphere inspection device, and lamp inspection system using the same

Abstract

To enable a lamp being an inspection object to be quickly and correctly arranged, and provide an integrating sphere that reduces the inspection time and prevents the temperature rise.SOLUTION: An integrating sphere 2 includes: an integrating sphere lower section 3 and an integrating sphere upper section 4 which are a pair of hemispherical surface shapes divided at the spherical center, and in which a diffuse reflective coating 5 is provided on the inner wall; a pair of lead wire receiving grooves 30 which is engraved at both ends corresponding to a horizontal line passing through the center 3RC of the curved surface of the inner wall of the integrating sphere lower section 3; a light-receiving element 40 which is arranged at the top of the integrating sphere upper section or the lowest part of the integrating sphere lower section, and is directed toward the center of the curved surface of the inner wall of the integrating sphere when the integrating sphere lower section and the integrating sphere upper section are closed together; and a light-shielding plate 42 which is arranged between the light-receiving element and the center of the curved surface of the inner wall of the integrating sphere upper section when the light-receiving element is provided in the integrating sphere upper section, or arranged between the light-receiving element and the center of the curved surface of the inner wall of the integrating sphere lower section when the light-receiving element is provided in the integrating sphere lower section, and in which the diffuse reflective coating is provided on the entire surface thereof.SELECTED DRAWING: Figure 1

Description

[Technical Field]

[0001] The present invention relates to integrating spheres, which are widely used in the field of optical radiation measurement, and more particularly to an integrating sphere suitable for measuring the total luminous flux of small and specially shaped lamps, an integrating sphere inspection device, and a lamp inspection system using the same. [Background technology]

[0002] For general filament lamps, conventional spherical or oval integrating spheres with an inner diameter of approximately 30 cm are used for product development and quality control. For lamps of general size and shape, current and total luminous flux can be measured efficiently without any problems.

[0003] Among filament lamps, for example, small, specially shaped cylindrical axial lamps with a diameter of 2 mm or less and a length of 3.5 to 10 mm have thin lead wires with a diameter of 0.25 mm extending coaxially and straight from both ends of the lamp, and the total length including both lead wires can be, for example, about 30 to 40 mm. When measuring the current value and total luminous flux, if a conventional 30 cm integrating sphere is used, the opening and closing operation of the integrating sphere becomes large and the labor required to position and set such small axial lamps increases, taking about 15 seconds per lamp, which is a factor in raising production costs.

[0004] For example, Patent Document 1 (JP Patent Publication No. 7-146175) discloses a total luminous flux measuring device that is configured to include a lamp, a lamp lighting device, an integrating sphere, a cooling device for the integrating sphere, a lamp temperature control device, and a lamp power measuring device, and that is configured to cool the integrating sphere to a specific temperature when the lamp to be measured is lit at a constant power, and that can stably reproduce the optical characteristics and electrical characteristics of the lamp to be measured within the spherical photometer, thereby enabling accurate measurement of the total luminous flux.

[0005] In addition, Patent Document 2 (JP Patent Publication No. 6-167388A) combines an integrating hemisphere with a hemispherical inner wall coated with a light-diffusing material, a photodetector with a light-receiving window on the inner hemisphere of the integrating hemisphere, and a plane mirror that passes through the center of curvature of the inner hemisphere and covers the opening of the integrating hemisphere. An opening is provided at the center of this plane mirror, with the same shape as the longitudinal cross-section of the light source under test so that the center of the light source can be placed so that it coincides with the center of curvature of the inner hemisphere of the integrating hemisphere. A lighting fixture is installed in the opening so that the light source under test coincides with the center of curvature of the inner hemisphere of the integrating hemisphere. This allows the light source to be illuminated in the space within the integrating sphere without the lighting fixture, thereby avoiding luminous flux absorption by the lighting fixture. Furthermore, half of the light source under test is outside the integrating space, enabling temperature control of the light source under test. This technology provides a photometer that achieves high-precision total luminous flux measurement. [Prior art documents] [Patent documents]

[0006] [Patent Document 1] Japanese Patent Application Publication No. 7-146175 [Patent Document 2] Japanese Patent Application Publication No. 6-167388 Summary of the Invention [Problem to be solved by the invention]

[0007] However, the total luminous flux measuring device disclosed in Patent Document 1 is provided with a cooling device controlled by a lamp temperature control device, and is capable of measuring the total luminous flux of the lamp with high accuracy. However, since it requires the installation of a cooling device and a lamp temperature control device, it has the disadvantage that it increases manufacturing costs and is unable to make accurate measurements while the cooling device is cooling the integrating sphere to a specific temperature.

[0008] Furthermore, in the photometer disclosed in Patent Document 2, the lighting fixture supporting the light source to be measured is disposed outside the integrating space, but the support structure for the light source to be measured relative to the lighting fixture is not disclosed. However, unless the light source to be measured corresponds to the center of curvature of a half-sphere or quarter-sphere integrating sphere and is accurately positioned in the opening of the plane mirror, high-precision luminous flux measurement cannot be achieved. For this reason, the positioning of the light source to be measured relative to the lighting fixture must be performed carefully and accurately, which raises concerns about an increase in work man-hours.

[0009] In view of the above circumstances, the present invention provides an integrating sphere, an integrating sphere inspection device, and a lamp inspection system using the same that enable the lamp to be inspected to be positioned quickly and accurately at the center of curvature inside an integrating sphere, and that also prevents the temperature inside the integrating sphere from rising without requiring a cooling device or the like. [Means for solving the problem]

[0010] The present invention relates to an integrating sphere comprising a lower integrating sphere and an upper integrating sphere, each of which is a pair of hemispherical surfaces cut in half at the center of the sphere and has diffuse reflecting inner walls; a pair of lead wire receiving grooves engraved on each of both ends corresponding to a horizontal line passing through the center of the curved surface of the inner wall of the lower integrating sphere; a light-receiving element disposed on the upper integrating sphere or on the inner wall of the lower integrating sphere and facing the center of the curved surface of the inner wall of the integrating sphere when the lower integrating sphere and the upper integrating sphere are closed together; and a light-shielding plate, the entire surface of which is a diffuse reflecting surface, disposed between the light-receiving element and the center of the curved surface of the inner wall of the upper integrating sphere when the light-receiving element is disposed on the upper integrating sphere, or between the light-receiving element and the center of the curved surface of the inner wall of the lower integrating sphere when the light-receiving element is disposed on the lower integrating sphere.

[0011] The lower integrating sphere portion forms the lower half of the integrating sphere and supports the lamp to be measured at the center of the curved inner wall of the integrating sphere and the lower integrating sphere portion. The entire inner wall of the lower integrating sphere may be a diffuse reflection surface. The lower integrating sphere portion may have lead wire receiving grooves engraved at both ends corresponding to a horizontal line passing through the center of the curved inner wall of the lower integrating sphere portion, through which linear lead wires of the lamp to be measured are supported and passed.

[0012] The lower integrating sphere part may be provided with a light-receiving element at the lowest part of the lower integrating sphere part, facing the center of the curved surface of the inner wall of the integrating sphere when the lower integrating sphere part and the upper integrating sphere part are closed together. In this case, the lower integrating sphere part provided with the light-receiving element may be provided with a light-shielding plate, the entire surface of which is a diffuse reflection surface, disposed between the light-receiving element and the center of the curved surface of the inner wall of the lower integrating sphere part.

[0013] The lead wire receiving groove supports the lamp to be measured at the center of the curved inner wall of the integrating sphere and the integrating sphere's lower part. The lead wire receiving groove may be engraved on each of both ends corresponding to a horizontal line passing through the center of the curved inner wall of the integrating sphere and the integrating sphere's lower part. Both lead wire receiving grooves may be provided with a positive electrode and a negative electrode for applying a voltage between the lead wires of the lamp to be measured that are suspended between them. A voltage is applied between the positive electrode provided on one of the pair of lead wire receiving grooves and the negative electrode provided on the other of the pair of lead wire receiving grooves at the integrating sphere's lower part, causing the lamp to emit light.

[0014] The upper integrating sphere forms the upper half of the integrating sphere, and a light-receiving element can be provided on the tops of the integrating sphere and the upper integrating sphere, facing the center of the curved surface of the inner wall of the integrating sphere when the lower integrating sphere and the upper integrating sphere are closed together. In this case, the upper integrating sphere on which the light-receiving element is provided can be provided with a light-shielding plate, the entire surface of which is a diffuse reflection surface, disposed between the light-receiving element and the center of the curved surface of the inner wall of the upper integrating sphere.

[0015] The light-receiving element detects the total luminous flux of the lamp to be measured and outputs the total luminous flux value. The light-receiving element can be arranged on the inner wall of the upper or lower part of the integrating sphere, with the light-receiving portion facing the center of the curved surface of the inner wall of the integrating sphere. The light-receiving portion can be arranged at the top of the upper part of the integrating sphere or on another part of the inner wall of the upper part of the integrating sphere. The light-receiving portion can also be arranged at the lowest part of the lower part of the integrating sphere or on another part of the inner wall of the lower part of the integrating sphere. A detachable neutral density filter can be provided on the light-receiving portion.

[0016] The light-shielding plate blocks light emitted from the lamp to be measured so that the light-receiving portion of the light-receiving element is not directly irradiated with the light. The light-shielding plate can be disposed between the center of the curved surface of the inner wall of the integrating sphere and the light-receiving portion of the light-receiving element. When the light-receiving portion is disposed above the integrating sphere, the light-shielding plate can be disposed relative to the upper portion of the integrating sphere, and when the light-receiving portion is disposed below the integrating sphere, the light-shielding plate can be disposed relative to the lower portion of the integrating sphere.

[0017] The diffuse reflective surface diffuses and homogenizes the light inside the integrating sphere, improving the accuracy of the detected total luminous flux value. The diffuse reflective surface can be a diffuse reflective coating made of an optical thin film. The diffuse reflective coating can be, for example, a white paint coated with a light-diffusing powder such as titanium oxide, magnesium fluoride, barium sulfate, or silicon dioxide, or a diffuse reflective film layer coated with a light-diffusing powder.

[0018] The present invention relates to an integrating sphere inspection device using the integrating sphere, comprising: a measurement stage in which the lower part of the integrating sphere is embedded with its inner wall facing upward; a positive electrode provided in one of a pair of lead wire receiving grooves in the lower part of the integrating sphere, and a negative electrode provided in the other; an upper lid mounted on the measurement stage in which the upper part of the integrating sphere is embedded with its inner wall facing downward; a hinge section that opens and closes the upper lid to the measurement stage so that the lower part of the integrating sphere and the upper part of the integrating sphere form an integrating sphere; and an opening biasing section that is provided between the measurement stage and the upper lid and biases the upper part of the integrating sphere in an opening direction relative to the lower part of the integrating sphere.

[0019] The measurement stage stably holds the integrating sphere in a buried state with the bottom open upward, and the top of the integrating sphere and the top lid are attached so that they can be opened and closed. The measurement stage can be made of a material that is electrically insulating, heat-resistant, and has sufficient mechanical strength, such as a thermosetting resin such as cloth-reinforced Bakelite or melamine resin. The measurement stage can have the top lid attached via a hinge. The measurement stage can be mounted on a base plate that can be placed stably on a workbench, for example. The base plate has sufficient strength to stably support the measurement stage. Furthermore, the measurement stage can be designed to efficiently dissipate heat. For example, the measurement stage can be made of aluminum, copper, brass, bronze, iron, stainless steel, titanium, alloys thereof, fine ceramics, or the like. For example, the base plate can have the top lid attached via a hinge.

[0020] The upper lid is integrated with the upper part of the integrating sphere so that it opens downward, and is attached so as to be freely opened and closed relative to the lower part of the integrating sphere and the measurement table. The upper lid, like the measurement table, can be made of a material that has electrical insulation, heat resistance, and sufficient mechanical strength, such as cloth-reinforced Bakelite or a thermosetting resin such as melamine resin. The upper lid can be attached to the measurement table or base plate via a hinge.

[0021] The hinge unit integrates the upper lid with the measurement table or base plate so that it can be opened and closed freely. The hinge unit can be, for example, detachably attached to the measurement table, base plate, or upper lid. The hinge unit has a detachable connecting part in the middle, which allows the upper lid to be detached from the measurement table or base plate, improving maintainability. The hinge unit can be located at the rear of the measurement table and upper lid, or on either the left or right side.

[0022] The opening biasing unit biases the upper part of the integrating sphere in an opening direction relative to the lower part of the integrating sphere. The opening biasing unit biases the upper cover in an opening direction relative to the measurement table or base plate. For example, the opening biasing unit may utilize a spring such as a compression spring, tension spring, or leaf spring; elastic force such as rubber; fluid pressure such as hydraulic pressure or compressed air; or the repulsive or attractive force of a permanent magnet or electromagnet. The opening biasing unit may be provided with an opening limiting unit that restricts the opening angle of the upper cover relative to the measurement table or base plate. The opening limiting unit may be, for example, a deformation limiting unit that restricts the deformation amount of the opening biasing unit to a deformation range corresponding to the maximum opening angle of the upper cover relative to the measurement table or base plate. The deformation limiting unit may be a limiting frame disposed outside the opening biasing unit. The opening limiting unit may be, for example, a stopper provided on the measurement table or base plate that abuts against an abutting portion or engaging portion provided on the rear wall, side wall, or side wall of the upper cover when opened relative to the measurement table or base plate, thereby limiting the opening angle of the upper cover.

[0023] The integrating sphere inspection device may be provided with a closed switch. The closed switch may be configured to close when the upper cover and the upper part of the integrating sphere are closed relative to the measurement table and the lower part of the integrating sphere, and open when they are opened. Alternatively, the closed switch may be configured to open when closed and close when opened. The closed switch counts the number of times the upper part of the integrating sphere is closed relative to the lower part of the integrating sphere. The open / close counting unit may, for example, send a signal to a counting unit in the circuit of the lamp inspection system for each open / close. The open / close counting unit may, for example, be connected to a quantity counter or an inspection counter. The closed switch may be provided, for example, on the measurement table, the lower part of the integrating sphere, the base plate, the upper cover, the upper part of the integrating sphere, or the hinge unit.

[0024] The closed switch may be configured to close or open an internal power supply output terminal serving as an application unit in a lamp inspection system circuit, thereby applying a voltage between the positive and negative electrodes. In this case, the switch may be configured to be ON when the upper part of the integrating sphere on the upper cover is closed to the lower part of the integrating sphere on the measurement stage, and OFF when the upper part of the integrating sphere on the upper cover is opened. The closed switch may be configured to apply a voltage between the positive and negative electrodes upon receiving power from a lamp inspection system that operates by receiving external power. The closed switch may also function as an open / close counting unit.

[0025] The present invention relates to a lamp inspection system having the integrating sphere inspection device, which is equipped with an inspection value display unit having a luminous flux value display unit that receives the output signal of the light receiving element and displays the total luminous flux of the lamp under inspection, and a current value display unit that displays the current value applied to the lamp under inspection, and a quantity counter unit that counts the opening and closing operations of the lower and upper integrating spheres as the upper cover is opened and closed relative to the measurement table.

[0026] The inspection value display unit displays the detection results of the lamp being inspected. The inspection value display unit may be provided in a lamp inspection system. The inspection value display unit may be an inspection value display device. The inspection value display unit may, for example, have a luminous flux value display unit and a current value display unit. Alternatively, the inspection value display unit may have a luminous flux value display unit, a current value display unit, and a voltage value display unit. A unit for displaying the open / close count of the quantity counter may be added. The luminous flux value display unit may, for example, be linked to the closing operation of the lower and upper integrating spheres, receive the output signal of the light receiving element, and display the total luminous flux of the lamp being inspected. The current value display unit may, for example, be linked to the closing operation of the lower and upper integrating spheres, and display the current value applied to the lamp being inspected. The voltage value display unit may, for example, be linked to the closing operation of the lower and upper integrating spheres, and display the voltage value applied to the lamp being inspected. The quantity counter may display the count of the closing operation of the lower and upper integrating spheres. The quantity counter unit may be provided in the lamp inspection system, and may be an inspection counter machine.

[0027] The present invention relates to a lamp inspection system that includes a judgment unit that judges whether the lamp being inspected is good or bad based on the total luminous flux of the lamp and the applied current value, and a judgment display unit that has a signal sound memory unit and a speaker that emits a signal sound indicating a good product judgment when the judgment unit judges the lamp to be good, and emits a signal sound indicating a bad product judgment that is different from the good product judgment when the judgment unit judges the lamp to be bad.

[0028] The judgment unit judges whether the lamp under inspection is good or bad based on the total luminous flux of the lamp and the applied current value. The judgment unit can be composed of hardware and software of the lamp inspection system. The judgment display unit displays whether the lamp judged by the judgment unit is good or bad. The judgment display unit can be a display provided in the lamp inspection system. The judgment display unit can be a judgment display device connected to the lamp inspection system.

[0029] The signal sound storage unit stores data on the signal sound that transmits the judgment result by the judgment unit. It can be a ROM (Read Only Memory) or RAM (Random Access Memory), etc. The recorded data can be data such as buzzer sounds or speech with different high and low frequencies and playback times. The signal sound storage unit can be installed in the lamp inspection system, judgment display unit, or judgment display device. The speaker plays the judgment result by the judgment unit based on the signal sound data stored in the signal sound storage unit. The signal sound can be buzzer sounds with different frequencies, volume, playback times (number of seconds), human voice (words), other sounds, etc. The unit can be equipped with a signal sound amplifier, volume switch, etc. The lamp inspection system can be, for example, a system incorporating the integrating sphere inspection device, an inspection counter, a judgment display, an inspection value display unit, and a personal computer or the like that controls these devices in an integrated manner.

[0030] The present invention relates to the lamp inspection system in which the quantity counter unit incorporates a chattering prevention circuit that improves counting accuracy, a delay circuit that eliminates errors in the count number, and a rectification circuit that corrects erroneous count numbers.

[0031] The chattering prevention circuit eliminates chattering in the quantity counter. The delay circuit eliminates errors in the count number. The rectifier circuit corrects incorrect count numbers. These improve the accuracy of the count. The chattering prevention circuit can be replaced with hardware in which a capacitor is inserted in parallel with a switch, or with a switch circuit controlled by software. The delay circuit can be replaced with hardware such as a sequencer or relay circuit, or with a switch circuit controlled by software. The rectifier circuit can be replaced with hardware using diodes, capacitors, thyristors, etc., or with a switch circuit controlled by software.

[0032] The present invention relates to a lamp inspection system comprising a voltage value display unit that displays the voltage applied to the lamp under inspection, a current value digital meter relay provided in the current value display unit, and a total luminous flux value digital meter relay provided in the luminous flux value display unit.

[0033] The current value digital meter relay provided in the current value display unit displays the current value of the lamp under test. For example, it can have a relay output with a standard range setting (e.g., Hi / Lo). The total luminous flux value digital meter relay provided in the luminous flux value display unit displays the total luminous flux value of the lamp under test. For example, it can have a relay output with a standard range setting (e.g., Hi / Lo). [Effects of the Invention]

[0034] The integrating sphere of the present invention functions simply by bridging the lead wires of the lamp to be inspected between the pair of lead wire receiving grooves in the lower part of the integrating sphere and then closing the upper and lower parts of the integrating sphere together, which has the excellent effect of significantly reducing the number of steps required to position and set the lamp to be inspected and start the inspection. Since the inspection is completed in an extremely short time and the integrating sphere is opened, temperature rise is prevented, and a cooling device is not required.

[0035] With the integrating sphere inspection device of the present invention, the lead wires of the lamp to be inspected are placed between a pair of lead wire receiving grooves, and the inspection is completed simply by closing the upper cover onto the measurement table, which significantly reduces the inspection time. While conventional models require 15 seconds per lamp to be inspected, the present invention reduces this to 5 seconds per lamp.

[0036] According to the lamp inspection system of the present invention, simply connecting the inspection value display unit, which has a luminous flux value display unit and a current value display unit, and the quantity counter unit to the integrating sphere inspection device, the lamp inspection system can begin inspecting the lamps to be inspected. The total luminous flux value, current value, and quantity of inspected lamps can be quickly confirmed, enabling more accurate inspection.

[0037] According to the lamp inspection system of the present invention, since it is equipped with a judgment unit, a signal sound memory unit, and a judgment display unit having a speaker, the inspection results can be confirmed not only visually but also by a signal sound, thereby enabling smoother and more accurate inspection.

[0038] According to the lamp inspection system of the present invention, the quantity counter section is provided with a chattering prevention circuit, a delay circuit, and a rectifier circuit, so that more accurate quantity counting and faster inspection can be achieved.

[0039] According to the lamp inspection system of the present invention, a voltage value display unit is provided, a current value digital meter relay is provided in the current value display unit, and a total luminous flux value digital meter relay is provided in the luminous flux value display unit, so that the voltage value display unit, current value display unit, and luminous flux value display unit can be compactly integrated into the inspection value display section and arranged on the same board. [Brief explanation of the drawings]

[0040] [Figure 1] FIG. 1 is a perspective view showing an integrating sphere inspection device 1. [Figure 2]3A and 3B are a side view and a plan view showing the lower part 3 of the integrating sphere. [Figure 3] 3A and 3B are side and bottom views showing the upper part 4 of the integrating sphere. [Figure 4] FIG. 2 is a side view showing the integrating sphere inspection device 1. [Figure 5] FIG. 2 is a side view showing the integrating sphere inspection device 1. [Figure 6] FIG. 1 is a plan view showing an integrating sphere inspection device 1. [Figure 7] Schematic diagram of a lamp inspection system. [Figure 8] (a) is a front view of the inspection counter machine 6. (b) is a rear view of the inspection counter machine 6. (c) is a plan view of the circuit board of the inspection counter machine 6. [Figure 9] (a) is a front view of the test value display device 8. (b) is a perspective view of the judgment display device 7 and a front view of the display screen. (c) is a perspective view showing a sorting box for the lamp LP1 to be tested. DETAILED DESCRIPTION OF THE INVENTION

[0041] The integrating sphere 2, integrating sphere inspection device 1, and lamp inspection system using them according to this embodiment will be specifically described below with reference to the drawings. In particular, this embodiment is capable of efficiently measuring the current value and total luminous flux value of an axial-type lamp LP1 (object of inspection) that is a cylindrical filament lamp with a diameter of 2 mm or less and has linear lead wires extending from both ends.

[0042] As shown in FIGS. 1 to 3 , integrating sphere 2 has an inner diameter 2ID of 20 mm to 50 mm (e.g., 39 mm) and a pair of hemispherical integrating sphere lower and upper portions 3 and 4. The outer diameter 2OD of lower and upper portions 3 and 4 may be, for example, 44.5 mm. The outer wall radius 3OR of lower portion 3 may be 22.3 mm. A pair of lead wire receiving grooves 30 are engraved on the left and right ends of the curved inner wall of lower portion 3, corresponding to a horizontal line passing through center 3RC. Each lead wire receiving groove 30 is engraved in a V-shape with a width 30W (e.g., 5 mm) and a depth 3DP (e.g., 2.5 mm). While a V-shape is preferred, lead wire receiving grooves 30 can also be U-shaped, concave, or other shapes. The pair of left and right lead wire receiving grooves 30 can support and bridge lead wires LP2 extending linearly from both ends of the lamp LP1 under inspection. The lamp LP1 under inspection, with the lead wires LP2 bridged between the pair of left and right lead wire receiving grooves 30, has its light-emitting portion LP1 disposed at the center 3RC of the curved surface of the inner wall of the lower part 3 of the integrating sphere (the center 2C of the integrating sphere 2).

[0043] A light-receiving element 40 having a light-receiving portion 401 facing the center of the curved inner wall of the integrating sphere upper portion 4 is provided on the top of the integrating sphere upper portion 4. The light-receiving portion 401 may be, for example, a Si photodiode 401 with a diameter of 8 mm. The light-receiving element 40 may be configured such that the light-receiving portion 401 is mounted on a substrate 402. A mounting window 41 having a shape corresponding to the light-receiving portion 401 is opened in the top of the integrating sphere upper portion 4, and the substrate 402 is mounted from the outside of the top of the integrating sphere upper portion 4 so that the light-receiving portion 401 faces the mounting window 41. The substrate 402 and the integrating sphere upper portion 4 are screwed together, and the light-receiving element 40 is mounted on the top of the integrating sphere upper portion 4.

[0044] A 20 mm diameter light-shielding plate 42 is disposed between the light-receiving element 40 and the center 4RC of the curved inner wall of the integrating sphere upper part 4. The light-shielding plate 42 can be fixed to and supported by the integrating sphere upper part 4 via legs 420 or leg walls 420. The distance SL between the light-shielding plate 42 and the center 4RC of the curved inner wall of the integrating sphere upper part 4 can be set to 10 mm. The entire surfaces of the integrating sphere lower part 3, the inner walls of the integrating sphere upper part 4, and the light-shielding plate 42 (legs or leg walls 420) can be provided with a diffuse reflection coating 5 as a diffuse reflection surface 5, which is formed by applying a white paint mixed with a light-diffusing powder such as magnesium fluoride or titanium oxide.

[0045] Light receiving section 401 of light receiving element 40 can be, for example, a photodiode with a built-in visibility filter. Furthermore, a diffusion filter can be attached to light receiving section 401 so that the light inside integrating sphere 2 strikes it evenly. Light receiving element 40 and light shielding plate 42 provided at the top of integrating sphere upper section 4 can prevent the adhesion of dust and dirt when measurements are repeated.

[0046] 1 to 8, the lamp inspection system can be configured, for example, as a system consisting of three components: an integrating sphere inspection device 1 (AXL measurement device), an inspection counter device 6, and a judgment display device 7. Alternatively, the lamp inspection system can be configured as a system consisting of four components: an integrating sphere inspection device 1 (AXL measurement device), an inspection counter device 6, a judgment display device 7, and an inspection value display device 8.

[0047] The lamp inspection system can be configured, for example, such that the integrating sphere 2, quantity counter unit 6, judgment display unit 7, and inspection value display unit 8 are hardware components connected to a PC (personal computer, hereinafter referred to as PC) via a circuit board, connector, network, etc. The lamp inspection system can be controlled in an integrated manner by the PC and software installed on the PC.

[0048] The integrating sphere inspection device 1 is provided with an aluminum base plate 10. A measurement stage 11 is mounted on the base plate 10. The integrating sphere lower part 3 is embedded in the measurement stage 11 with its inner wall facing upward, and the upper opening edge of the measurement stage 11 is fixedly supported at a position elevated from the top surface of the measurement stage 11 by a depth 3DP (e.g., 2.5 mm) of the lead wire receiving groove 30. The measurement stage 11 may be made of black cloth-reinforced Bakelite. A positive electrode 301 is provided in one of a pair of lead wire receiving grooves 30 in the integrating sphere lower part 3, and a negative electrode 302 is provided in the other of the pair of lead wire receiving grooves 30. The positive electrode 301 and negative electrode 302 apply voltage to the lamp LP1 to be inspected, which is suspended between the pair of lead wire receiving grooves 30.

[0049] An upper cover 12 is mounted on the measurement stage 11, with the integrating sphere upper part 4 embedded in its inner wall facing downward. The upper cover 12 can be made of black cloth-reinforced Bakelite. As shown in FIGS. 4 and 5 , a canopy 120 is attached to the top surface of the upper cover 12 via a detachable structure using screws, claws, or the like. Removing the canopy 120 exposes the light-receiving element 40 screwed to the top of the integrating sphere upper part 4, allowing maintenance without removing the integrating sphere upper part 4. The rear end of the upper cover 12 can be connected to the measurement stage 11 via a hinge 13 so as to be able to open and close freely. The hinge 13 connects the integrating sphere lower part 3 and the integrating sphere upper part 4 so as to be able to open and close freely, forming the ultra-compact integrating sphere 2.

[0050] An opening biasing member 14 may be provided spanning between measurement table 11 and the rear end of upper lid 12. Opening biasing member 14 may be a tension coil spring 14 that elastically maintains the open position of integrating sphere upper part 4 relative to integrating sphere lower part 3. Tension coil spring 14 can maintain upper lid 12 at a constant open angle by balancing its tension with the weight of upper lid 12. Also, as shown in FIGS. 4 and 5 , stopper 140 is provided as opening limiter 140, which restricts the open position of integrating sphere upper part 4 relative to integrating sphere lower part 3 to a constant angle against the biasing force of opening biasing member 14, so that integrating sphere upper part 4 can always be maintained open at a constant angle relative to integrating sphere lower part 3 when no external force is applied.

[0051] The opening biasing unit 14 can be replaced with a tension coil spring 14, a compression coil spring, a leaf spring, a C-shaped spring, a spring utilizing the repulsive force of a permanent magnet, or a spring utilizing the elastic force of a fluid. Alternatively, a weight can be provided behind the hinge 13 of the upper lid 12, and gravity acting on the weight can bias the upper lid 12 in the opening direction. A microswitch 15 is provided between either the left or right side of the measurement table 11 and the upper lid 12 facing it, as a closing switch 15 and an opening / closing counting unit 15. The microswitch 15 functions as an opening / closing counting unit 15 that transmits a count signal each time the upper lid 12 is closed to the measurement table 11. The microswitch 15 can also function as a closing switch 15 that applies a voltage between the positive electrode 301 and the negative electrode 302.

[0052] As shown in Figure 1, a closing hook 16 can be provided between the sides of the integrating sphere lower part 3 and the integrating sphere upper part 4 to lock the integrating sphere inspection device 1 in the closed state against the biasing force of the opening biasing part 14 when the device is not in use (when the power supply is stopped).

[0053] As shown in Figure 6, on the top wall of the rearmost part of the base plate 10, an output signal terminal 102 connected to the light receiving element 40, an output signal terminal 103 of the quantity counter unit 6 connected to the microswitch (opening / closing count unit) 15, and a power supply terminal 104 connected to the positive electrode 301 and the negative electrode 302 can be provided on a terminal block 101.

[0054] As shown in Figures 5 and 6, the dimensions of each part of the integrating sphere inspection device 1 can be set, for example, as follows: overall width 1W is 100 mm, overall height 1H is 68 mm, overall length 10L of base plate 10 is 190 mm, overall length 11L of measurement table 11 is 120 mm, and overall length 12L of upper cover 12 is 80 mm.

[0055] As shown in Figures 7 and 9(a), the luminous flux value display unit (E15) of the lamp inspection system can be a luminous flux value display section 80 provided in an inspection value display device 8 as inspection value display section 8. Luminous flux value display section 80 can be, for example, a luminous flux display digital panel meter (80, E15) that receives an output signal from light receiving element 401 in conjunction with the closing operation of lower integrating sphere section 3 and upper integrating sphere section 4 accompanying the closing operation of upper cover 12 relative to measurement table 11, and displays the total luminous flux value of the lamp being inspected.

[0056] The voltage value display unit (E3) of the lamp inspection system can be a voltage value display unit 81 provided in an inspection value display device 8 as the inspection value display unit 8. The voltage value display unit 81 can be a voltage value display unit (81, E3) provided in the inspection value display device 8. The voltage value display unit (81, E3) can be, for example, a supply voltage display digital panel meter (81, E3) that displays the voltage value applied to the lamp LP1 under inspection in conjunction with the closing operation of the integrating sphere lower part 3 and the integrating sphere upper part 4 that accompanies the closing operation of the upper cover 12 relative to the measurement table 11.

[0057] The current value display unit (E13) of the lamp inspection system can be a current value display unit 82 provided in the inspection value display device 8 as the inspection value display unit 8. The current value display unit 82 can be a current value display unit (82, E13) provided in the inspection value display device 8. The current value display unit (82, E13) can be, for example, a current display digital panel meter (82, E13) that displays the current value applied to the lamp LP1 under inspection, in which both lead wires LP2 are connected between both lead wire receiving grooves 30, when the lamp LP1 under inspection emits light upon receiving a voltage applied between the positive electrode 301 and the negative electrode 302. Because there is a time lag of 1 to 2 seconds until the filament light emission of the lamp LP1 under inspection stabilizes, it is preferable to close the lower integrating sphere 3 and the upper integrating sphere 4 together and measure the current value and total luminous flux value 1 to 2 seconds after the lamp LP1 receives power and starts to emit light. Also, for example, the lamp LP1 to be inspected may be spanned between the positive electrode 301 and the negative electrode 302, and the light emission state may be detected based on the voltage and current values ​​that change with the light emission, and a control unit may be provided to control the display so as to display the current value applied to the lamp LP1 to be inspected 1 to 2 seconds after the light emission state of the lamp LP1 is detected (after the time until the light emission becomes stable).

[0058] As shown in Figures 8(a), (b), and (c), counting unit 6 can be an inspection counter device 6 provided separately from inspection value display device 8. As shown in Figures 1, 4, and 5, integrating sphere inspection device 1 is provided with microswitch 15 as opening / closing counting unit 15 that generates a count signal to count the opening and closing operations between integrating sphere lower part 3 and integrating sphere upper part 4 that accompany the opening and closing of upper cover 12 relative to measurement table 11.

[0059] The count signal of the microswitch 15 is sent to an inspection counter (quantity counter unit) 6 connected to an output signal terminal 103 of a terminal block 101. The inspection counter (quantity counter unit) 6 may incorporate a chattering prevention circuit, a delay circuit for eliminating errors in the count number, and a rectifier circuit for correcting an erroneous count number.

[0060] As shown in FIGS. 7 and 9(b), the lamp inspection system may include a digital unit (determination unit) (E17) that determines whether a lamp LP1 to be inspected is a good or bad product based on the total luminous flux of the lamp LP1 and the supplied current value. The system may also include a determination indicator (determination display unit) 7 that displays the determination of whether the lamp is good or bad based on the output signal of the digital unit (determination unit) (E17). The determination indicator (determination display unit) 7 may include a signal sound memory unit and a speaker 7SK, and may be connected to the lamp inspection system via the display connector (E18) shown in FIG. 7. When the digital unit (determination unit) (E17) shown in FIG. 7 determines that the lamp is good, it may emit a signal sound indicating a good product determination, and when the lamp is bad, it may emit a signal sound indicating a bad product determination that is different from a good product determination.

[0061] In the lamp inspection system, quantity counter unit 6 and inspection value display unit 8 can be provided integrally with integrating sphere inspection device 1, or each can be connected as a separate unit. Quantity counter unit 6 counts the number of times that integrating sphere lower part 3 and integrating sphere upper part 4 are opened and closed as upper cover 12 is opened and closed relative to measurement table 11. Quantity counter unit 6 can be, for example, an inspection counter machine 6 provided separately from integrating sphere inspection device 1, as shown in FIG.

[0062] The test value display unit 8 displays the test value of the lamp LP1 being tested. The test value display unit 8 may include a luminous flux value display unit 80. The luminous flux value display unit 80 may be a luminous flux display digital panel meter (E15) that receives the output signal of the light receiving element 40 when the top cover 12 is closed relative to the measurement table 11 and displays the total luminous flux of the lamp LP1. The test value display unit 8 may include a voltage value display unit 81 and a current value display unit 82. The voltage value display unit 81 may be, for example, a supply voltage display digital panel meter (E3) that displays the voltage value applied to the lamp LP1 when the top cover 12 is closed relative to the measurement table 11. The current value display unit 82 may be, for example, a current display digital panel meter (E13) that displays the current value supplied to the lamp LP1 when the top cover 12 is closed relative to the measurement table 11. The luminous flux value display unit 80, the voltage value display unit 81, and the current value display unit 82 may be, for example, a luminous flux display digital panel meter (E15), a voltage display digital panel meter (E3), and a current display digital panel meter (E13) provided with a control unit that controls the lamp LP1 to be inspected, which is connected between the positive electrode 301 and the negative electrode 302, to detect the light emission state based on the voltage value and current value that change with light emission, and detect and display the total luminous flux value, voltage value, and current value of the lamp LP1 to be inspected one to two seconds after the light emission state of the lamp LP1 is detected (after the time until the light emission stabilizes). The inspection value display unit 8 may be, for example, an inspection value display device 8 provided separately from the integrating sphere inspection device 1.

[0063] As shown in FIG. 7, the circuit of the lamp inspection system may include an internal power output terminal (E1), an external power input terminal (E2), a supply voltage display (E3), a multi-switch power supply (E4), a voltage monitoring and control unit (E5), a voltage divider (E6), a terminator / director (E7), a rectifier unit (E8), a stabilizing unit (E9), a voltage regulator (E10), a voltage switching unit (E11) of the stabilizing unit (E9), a shunt (E12), a current display unit (E13), a current digital meter relay (E13), a PMLA unit (E14), a luminous flux display unit (E15), a total luminous flux digital meter relay (E15), an amplifier unit (E16), a digital unit (E17), a display connector (E18), etc.

[0064] As shown in Figures 1 to 9, the internal power output terminals (OUT+, OUT-) (E1) are power outputs for lighting the lamp LP1. To avoid the influence of voltage drops along the way, the voltage supplied to the lamp LP1 is detected from the connection terminals connected to the lamp LP1 of the integrating sphere 2. For example, this can be a four-terminal arrangement as in a typical measuring instrument.

[0065] The external power input terminals (EXT_IN+, EXT_IN-) (E2) are used when power is supplied to the lamp LP1 from an external source. For example, a switch can be used to switch between internal and external power sources. The voltage display unit (DPM: Digital Panel Meter) (E3): (A9111-01, setting: 13 range (19.999V)) can display the voltage supplied to the lamp LP1. The multi-switch power supply (E4) can be a multi-output switching power supply that supplies, for example, ±12V to the operational amplifier of the photoamplifier unit (E16), which amplifies the output of the photodiode 401 from the integrating sphere 2, and DC 5V to the voltage monitoring unit (E5) and other devices.

[0066] The voltage monitoring and control unit (E5) controls the constant voltage power supply, and for example, can be configured to control the voltage supplied to the lamp LP1 to be variable and constant. The voltage divider (1 / 10) (E6) switches the display of the voltage value display unit (E3), and can be configured to switch the display of the voltage value display unit (E3) between 199.99V and 19.999V, for example. The TERM / DIRECT (E7) can switch the display of the voltage value display unit (E3) of the test value display section (test value display) 8 between the voltage at the external power input terminal (E2) and the output voltage at the internal power output terminal (E1). The rectifier unit (E8) is an AC to DC conversion circuit, and can be configured, for example, to include a bridge diode and an electrolytic capacitor.

[0067] The rectifier unit (E8) has, for example, a power transformer that switches the voltage between Hi and Lo using a relay. For example, the AC voltage HI indicator (red) of the rectifier unit (E8) can be a red LED lamp that lights up when the voltage is switched to Hi. The stabilization unit (E9) controls the constant voltage power supply and can, for example, control the voltage applied to the lamp LP1 to be variable and constant. The heat sink (2SB1018) of the stabilization unit (E9) cools the transistor (control unit) of the stabilization unit (E9). The voltage adjustment unit (10K 10T PM) (E10) of the stabilization unit (E9) adjusts the voltage so that it is the same when the power transformer is switched between Lo and Hi.

[0068] The voltage switching section (LOW, HIGH) (E11) of the stabilization unit (E9) controls the power transformer terminals to switch from a constant voltage to another. The shunt (ASH-400-25) (E12) applies the internal power supply output voltage to the current display unit (DPM) (E13), which reads the voltage. The current display unit (DPM: digital panel meter): (A6111-11, setting: 11 range (99.99 mV) (E13) can be, for example, a current digital meter relay (E13) with a relay output for the standard range setting (Hi / Lo). The current digital meter relay (E13) can be, for example, built into the current display unit (DPM: digital panel meter) (E13).

[0069] The PMLA unit (E14) may be connected to a current value display unit (DPM: digital panel meter) (E13) and a luminous flux value display unit (DPM: digital panel meter) (E15). The luminous flux value display unit (DPM: digital panel meter) (E15) may have, for example, a total luminous flux value digital meter relay (E15) and may perform a synthesis operation on the input signal from the total luminous flux value digital meter relay (E15). The luminous flux value display unit (E15) may transmit the data obtained by the operation to the digital unit (E14). The operation result may be output as a matrix of, for example, Lo / Good / Hi for the current and Lo / Good / Hi for the total light speed. The luminous flux value display unit (DPM: Digital Panel Meter): (A7111-1 setting: 13 range (9.999V) (E15) displays the total luminous flux value of the lamp LP1 under test, and can be, for example, a digital meter relay (E15) with a relay output with standard range settings (Hi / Lo).

[0070] For example, the total luminous flux value digital meter relay (E15) can be built into the luminous flux value display unit (DPM: digital panel meter) (E15). The AMP unit (photoamplifier unit) (E16) can include a switching circuit for amplifying the output of the Si photodiode 401 from the integrating sphere 2 and a calibration circuit for matching the value to that of the standard lamp. The DIGITAL UNIT (determination unit) (E17) can be connected to a determination display device (determination display unit) 7 provided separately from the lamp inspection system and equipped with a transmission circuit for transmitting a signal indicating the determination result. As shown in FIG. 9(b), the determination display device (determination display unit) 7 can be equipped with a circuit for playing a signal sound selected from the signal sound storage unit based on the received signal, a speaker 7SK, and a volume switch 7VR for adjusting the volume. Signal sounds of different tones can be emitted depending on the current magnitude and the quality of the non-defective product. The display connector (receptacle solder surface) (E18) can connect the judgment display (judgment display unit) 7 to the digital unit (judgment unit) (E17).

[0071] 9(b) shows an example of display items of the judgment result displayed on the judgment display device (judgment display unit) 7. For example, items such as "low current," "high current," "high luminous flux poor," "high luminous flux good," "good," "low luminous flux good," and "low luminous flux poor" are displayed, and the corresponding item can be lit or flashing.

[0072] The judgment display device (judgment display unit) 7 (external device) outputs the judgment result, for example, by displaying it or by sounding a signal. The judgment display device 7 can be an external device connected to the lamp inspection system and placed near the inspector. As shown in Figures 1, 4, and 5, the microswitch 15 can be attached to the measurement table 11, for example, and pressed by the metal fittings of the upper cover 12 when closed. The "chattering prevention circuit" for improving the accuracy of the ON signal from the microswitch 15 can be, for example, a hardware circuit built into the quantity counter unit 6 that processes the signal electrically, or it can be replaced by a control process using software that controls the quantity counter unit 6. The "delay circuit" for eliminating errors in the count can be, for example, a circuit built into the inspection counter device (quantity counter unit) 6 that processes the signal electrically.

[0073] The quantity counter unit 6 may be, for example, a circuit built into the inspection counter (quantity counter unit) 6. A "signal sound adjustment circuit" capable of correcting an erroneous count may be mounted on a circuit board built into the inspection counter (quantity counter unit) 6. The signal sound generation circuit may be, for example, built into the inspection counter (quantity counter unit) 6 and include a sound data storage unit, a sound data playback unit, an amplifier, a volume control, a speaker, and the like. For example, as shown in FIGS. 8(a), (b), and (c), a volume switch 60VR for the beep may be provided on the back of the housing of the inspection counter (quantity counter unit) 6, and a volume switch 61VR for adjusting the length of the beep and a volume switch 62VR for setting the frequency of the beep may be provided on the internal circuit board.

[0074] (Measurement operation) As shown in Figures 1 to 9, the lamp inspection system comprises integrating sphere inspection device 1, inspection counter 6, judgment display device 7, and inspection value display device 8 arranged on a workbench, the wiring connected, and the power turned on. Multiple lamps LP1 to be inspected are lined up side-to-side or front-to-back in the space in front of the workbench, and when closing hook 16 is unlocked, upper cover 12 of integrating sphere upper part 4 is opened, for example, to an angle of 30° to 60°, preferably 45°, around the axis of hinge portion 13, due to the force of tension coil spring 14 and the opening restriction of stopper 140.

[0075] One end of the lead wire LP2 of one lamp LP1 to be inspected is grasped with tweezers, and the lamp LP1 is set across the left and right lead wire receiving grooves 30 so that it is positioned at the center 3RC of the curved surface of the inner wall of the integrating sphere lower part 3, as shown in Figures 1 and 2. The lead wires LP2 at both ends of the lamp LP1 are grounded to the positive electrode 301 and the negative electrode 302, respectively, and the set lamp LP1 to be inspected emits light, and the light emission state stabilizes 1 to 2 seconds after the start of emission.

[0076] One to two seconds after lamp LP1 begins to emit light, upper cover 12 is closed against the opening force of tension coil spring 14 to measurement table 11, thereby closing lower sphere 3 and upper sphere 4 of integrating sphere 2. When integrating sphere 2 is closed, inspection counter 6 and judgment display 7 each emit a buzzer sound, completing the measurement operation. The measured total luminous flux and current values ​​are displayed on inspection value display 8, and the standard judgment result and sound allow the user to know whether the product is good or bad.

[0077] When the inspection is completed and the downward force on the upper lid 12 is released, the tension of the tension coil spring 14 causes the upper lid 12 to open to the angle restricted by the stopper 140. After the inspection, the lamps LP1 are picked up by one of the lead wires LP2 with tweezers, packed into an inner box for transportation, and sorted by the quality determined in the sorting box 70 shown in Figure 9(c). The sorting box 70 is connected to, for example, a determination display device 7, which lights up to indicate the placement position of the determined lamp LP1.

[0078] The lamp LP1 to be inspected is made of glass with a diameter of 2 mm, and the lead wires are thin and only 0.25 mm in diameter, making them difficult to handle. Therefore, even though automatic measurement is difficult, we were able to obtain a sufficient effect in improving inspection efficiency.

[0079] The inspection counter 6 is equipped with a chattering prevention circuit to improve the accuracy of the ON signal from the microswitch 15, thereby preventing chattering. Also, if an error occurs in the count, a delay circuit corrects the erroneous count. Furthermore, if the count is incorrect, a rectifier circuit corrects the count. [Industrial Applicability]

[0080] The integrating sphere, integrating sphere inspection device, and lamp inspection system using the same of the present invention can be used to measure various characteristics such as current value and total luminous flux value of specially shaped lamps that have lead wires extending straight from both ends. [Explanation of symbols]

[0081] 1. Integrating sphere inspection device 1W Overall width of the integrating sphere inspection device 1 1H Overall height of integrating sphere inspection device 1 10 Same base plate 10L Total length of base plate 10 101 Same terminal block 102 Output signal terminal of the light receiving element 40 103 Output signal terminal 104 Same power supply terminal 11 Measuring table 11L Total length of measuring table 11 12 Upper lid 120 Same canopy 12L Same total length 13 Hinge part 14 Tension coil spring (opening biasing part) 140 Same stopper (opening limiter) 15 Microswitch (closed switch, open / close count section) 16 Closure hook 2 integrating sphere 2C Center of curvature of the inner wall of the integrating sphere ID2 Inner diameter of the integrating sphere OD2 Outer diameter of the integrating sphere 3 Lower part of the integrating sphere 30R Radius of the outer wall of the lower part of the integrating sphere 3 3RC Center of the curved inner wall of the lower part of the integrating sphere 3 30 Lead wire receiving groove 30W Same Lead wire receiving groove width 3DP Lead wire receiving groove depth 301 Same positive electrode 302 Same negative electrode 4 Upper part of integrating sphere 4RC Center of the curved surface of the inner wall of the upper part of the integrating sphere 40 Si photodiode (photodetector) 401 Same light receiving unit 402 Same board 41 Same installation window 42 Same as above SL: Distance from the center 4RC of the curved inner wall of the upper integrating sphere 4 5 Diffuse reflective coating (diffuse reflective surface) 6 Inspection counter machine (quantity counter section) 60VR Dial tone volume switch 61VR Volume switch to adjust the length of the beep 62VR Volume switch for setting the frequency of the dial tone 7 Judgment display (judgment display section) 7SK same speaker (signal sound memory unit) 7VR Volume control switch 70 Same sorting box 8 Test value display unit (test value display device) 80 Same luminous flux value display unit 81 Voltage value display unit 82 Current value display unit 9 Power supply (power supply section) (Lamp inspection system circuit) (E1) Internal power output terminal (applying section) (E2) External power input terminal (E3) Voltage display unit (supply voltage display digital panel meter) (E4) Multi-Switch Power Supply (E5) Voltage monitoring and control unit (E6) Voltage divider (E7) TERM / DIRECT (E8) Rectification unit (E9) Stabilization Unit (E10) Voltage adjustment section (E11) Voltage switching section of stabilization unit (E9) (E12) Flow divider (E13) Current display unit (current digital meter relay, current display digital panel meter) (E14) PMLA UNIT (E15) Luminous flux value display unit (total luminous flux value digital meter relay, luminous flux display digital panel meter) (E16) AMP unit (photo amplifier unit) (E17) DIGITAL UNIT (judgment section) (E18) Display connector LP1 Lamp to be inspected LP2 same lead wire

Claims

1. a pair of hemispherical lower and upper integrating spheres, each half cut at the center of the sphere, with the inner walls being diffuse reflection surfaces; a pair of lead wire receiving grooves engraved on both ends of the inner wall of the lower portion of the integrating sphere, the grooves corresponding to a horizontal line passing through the center of the curved surface; a light-receiving element disposed on the inner wall of the upper integrating sphere or the lower integrating sphere, and directed toward the center of the curved surface of the inner wall of the integrating sphere when the lower integrating sphere and the upper integrating sphere are closed together; a light-shielding plate, the entire surface of which is a diffuse reflection surface, disposed between the light-receiving element and the center of the curved surface of the inner wall of the upper part of the integrating sphere when the light-receiving element is disposed above the integrating sphere, or disposed between the light-receiving element and the center of the curved surface of the inner wall of the lower part of the integrating sphere when the light-receiving element is disposed below the integrating sphere; An integrating sphere comprising:

2. a measurement table in which the lower part of the integrating sphere is embedded with its inner wall facing upward; a positive electrode provided in one of a pair of lead wire receiving grooves in the lower part of the integrating sphere, and a negative electrode provided in the other; an upper cover mounted on the measurement stage and having the upper part of the integrating sphere embedded therein with its inner wall facing downward; a hinge portion that connects the upper cover to the measurement stage so as to be able to open and close freely, so that the lower and upper portions of the integrating sphere form an integrating sphere; 2. An integrating sphere inspection device using an integrating sphere according to claim 1, further comprising: an opening biasing portion provided between said measurement table and said upper cover, said opening biasing portion biasing said upper portion of said integrating sphere in an opening direction relative to said lower portion of said integrating sphere.

3. a luminous flux value display unit that receives the output signal of the light receiving element and displays the total luminous flux of the lamp under test; and a test value display unit having a current value display unit for displaying the current value applied to the lamp under test; a quantity counter that counts the number of opening and closing operations between the lower and upper integrating spheres in association with the opening and closing of the upper cover relative to the measurement table; 3. A lamp inspection system comprising the integrating sphere inspection device according to claim 2.

4. a determination unit that determines whether the lamp being inspected is a good product or a defective product based on the total luminous flux of the lamp and the applied current value; a judgment display unit having a signal sound storage unit and a speaker, which emits a signal sound indicating a pass / fail judgment when the judgment by the judgment unit is a pass / fail judgment, and emits a signal sound indicating a fail / fail judgment different from the pass / fail judgment when the judgment by the judgment unit is a fail / fail judgment; 4. The lamp inspection system according to claim 3, comprising:

5. The quantity counter unit, A chattering prevention circuit that improves the accuracy of the count number, A delay circuit that eliminates errors in the count number, a rectifier circuit for correcting the erroneous count; 4. The lamp inspection system of claim 3, wherein:

6. a voltage value display unit that displays the voltage applied to the lamp under test; a current value digital meter relay provided in the current value display unit; a total luminous flux value digital meter relay provided in the luminous flux value display unit; 4. The lamp inspection system of claim 3, comprising:

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