A system and related method for characterizing aerosol-type particles in ambient gas.

Abstract

The present invention relates to a system (S) for characterizing particles in an aerosol, characterized in that it comprises a sampler (E) suitable for collecting ambient gas likely to contain particles in the form of an aerosol, a device (D) for characterizing particles by laser-induced plasma spectroscopy suitable for generating jets of particles from the collected particles and analyzing them by interaction with a laser beam, and at least one means (M) for diluting the concentration of particles in the form of an aerosol in the ambient gas collected by the sampler so that the focal volume (VF) of the laser beam contains only one particle of each jet. The present invention also relates to a method for implementing the system.

Description

[Technical Field]

[0001] This invention relates to the field of aerosol characterization. [Background technology]

[0002] Aerosols are composed of particles of various sizes suspended in the surrounding gas (for example, the surrounding air).

[0003] The aerosols in question may, in non-limiting examples, originate from industrial equipment (e.g., smoke), from accidental sources (e.g., fire), or from ambient air where the source of the aerosols is not necessarily identified.

[0004] Currently, the impaction method is commonly used. Impaction is a principle widely used to collect particles from aerosols. It consists of drawing ambient air, potentially containing aerosols, into a housing at a controlled, fixed flow rate and collecting the particles on a support. After collection, the support can be recovered and analyzed later.

[0005] Therefore, impact devices operating in a "cascade" manner can be found in the literature. A detailed example of the design of such a device is shown in Non-Patent Literature 1. This device consists of several impact stages arranged in series along the airflow. The largest and heaviest particles in the surrounding air collide in the first stage. The remaining particles pass through this first stage, with larger particles colliding in the second stage, and so on. The various stages that define the "cascade" principle allow for the collection of particles of various sizes. Thus, with such a device, the size of the particles that collided in each stage after the collection campaign can be determined.

[0006] Therefore, this type of instrument cannot perform real-time analysis because it must wait until the collection campaign is complete. Furthermore, the instrument used can only classify particles by their size (typically ranging from tens of nanometers to several microns). Consequently, samples must be collected to characterize the particles using other measurement techniques (particularly to obtain particle shape, chemical properties, or concentration retrospectively and in the laboratory).

[0007] However, there are devices for real-time characterization of particles in the surrounding air. For example, PLAIR has proposed the RAPID-E device, which enables real-time analysis. See Patent Document 1 for details. The measurement principle is based on fluorescence induced by particles exposed to a laser beam (sometimes called SLS (Static Light Scattering)). The angular distribution of the signal scattered by the particles is then analyzed by measuring the intensity distribution at the level of a photodetector. This type of device allows access to the size and morphology of the particles. However, to obtain this information, it is necessary to know the optical properties, i.e., the chemical properties, of the material that makes up the particles under consideration. Therefore, in practice, it is important to know what is being sampled. [Prior art documents] [Patent Documents]

[0008] [Patent Document 1] U.S. Patent Application Publication No. 2019 / 033191 [Non-patent literature]

[0009] [Non-Patent Document 1] Misra et al., "Development and evaluation of a personal cascade impactor sampler (PCIS)", Aerosol Science 33 (2002), 1027-1047

Summary of the Invention

Problems to be Solved by the Invention

[0010] One object of the present invention is to propose a more efficient solution than existing solutions for characterizing particles in the form of aerosols in ambient gas in real time in situ.

Means for Solving the Problems

[0011] For this object, the present invention is a system for characterizing particles in the form of aerosols in ambient gas, comprising a sampler capable of sampling ambient gas that is likely to contain particles in the form of aerosols, a device for characterizing the particles by laser-induced plasma spectroscopy, the device comprising a system for generating a jet of the particles in a chamber from the gas coming from the sampler, the chamber being associated (connected) with means for pumping the gas present in the chamber to create a vacuum in the chamber, a laser capable of emitting a laser beam in the form of pulses, the laser being associated with an optical device configured to focus the laser beam in the chamber perpendicular to the propagation direction of the particle jet in order to generate a plasma in a focal volume by the interaction between the laser beam and the particles of the jet, the plasma emitting other particles specific to the interaction between the laser beam and the particles of the jet, at least one detection device comprising means for collecting the particles emitted by the plasma and means for performing spectral analysis of the particles, A system is proposed that comprises at least one so-called dilution means for reducing the concentration of aerosol particles in the ambient gas sampled by a sampler such that the focal volume contains at most one individual particle.

[0012] The system according to the invention can comprise at least one of the following features, alone or in combination. The dilution means is arranged between a sampling region of the ambient gas that is likely to contain particles in the form of aerosol from the sampler and a device for characterizing said particles by laser-induced plasma spectroscopy. The dilution means belongs to the sampler. Additional dilution means are arranged between the sampler and a device for characterizing said particles by laser-induced plasma spectroscopy. The system comprises a processor configured to control the dilution means and optionally additional dilution means according to data provided by a detection device of a device for characterizing particles by laser-induced plasma spectroscopy. The detection device comprises a plurality of N optical fibers (N is a natural number strictly greater than 1), and one end of each optical fiber is arranged around the focal volume and is directed towards this focal volume in order to ensure the collection of particles emitted by the plasma. The optical fibers are attached to the spherical outer wall of the chamber. The means for performing spectral analysis of the particles emitted by the plasma comprises at least one notch-type filter capable of ensuring filtering in a given wavelength band and at least one optical detector, for example of the photomultiplier tube type. The means for performing spectral analysis of the particles emitted by the plasma comprises a plurality of notch-type filters capable of ensuring filtering in different wavelength bands and an optical detector, for example of the electron photomultiplier tube type, associated with each notch filter. The means for performing spectral analysis of the particles emitted by the plasma comprises an optical spectrometer equipped with a camera of the intensified charge-coupled device type. The system comprises a plurality of optical assemblies mounted on a chamber and distributed at angles around the chamber for collecting particles emitted by the plasma, and other detection devices comprising at least one photodetector connected to the plurality of optical assemblies for analyzing the angular distribution of the particles. This system includes an infrared camera positioned to measure temperature changes of particles within the particle jet.

[0013] The present invention also provides a method for carrying out the system according to the present invention, the method being: a) A step of sampling the ambient gas which is likely to contain aerosolized particles at a characteristic number concentration, b) A step of detecting the particles by laser-induced plasma spectroscopy, wherein each detection consists of detecting up to one individual particle within the focal volume, c) A step of counting the number of particles detected in step b) per unit time, d) The method also relates to a method comprising the step of determining the number concentration of the particles in the sampled ambient gas by comparing the data obtained from step c) with a database that associates the number concentration with the above count value per unit time.

[0014] Furthermore, between step a) and step b), a step may be provided in which the concentration of particles present as aerosols in the sampled ambient gas is reduced in a controlled manner that ensures the focal volume contains at most one individual particle.

[0015] Other features and advantages of the present invention will become apparent from the following detailed description, with reference to the accompanying drawings. [Brief explanation of the drawing]

[0016] [Figure 1] This is a schematic diagram of a system for characterizing aerosol particles according to the present invention. [Figure 2]Figure 1 shows a sampler belonging to the system used for sampling aerosols from the surrounding gas. [Figure 3] Figure 1 shows a system belonging to the one described above, which operates using laser-induced plasma spectroscopy and is used to characterize aerosol particles. [Figure 4] Figure 3 schematically shows the region of interaction within the apparatus shown, between the particle jet formed from aerosol particles from the sampler in Figure 2 and the laser beam. [Figure 5a] Figure 2 is an external perspective view of a part of the characterization apparatus shown, in which a means for collecting particles generated by the interaction between the laser beam of the apparatus and aerosol particles is shown in the form of multiple optical fibers. [Figure 5b] Figure 5a is a first cross-sectional plan view. [Figure 5c] This is a second cross-sectional view of Figure 5a. [Figure 5d] This is a third cross-sectional view of Figure 5a. [Figure 6a] Figures 5a to 5d are schematic diagrams of a detection device equipped with optical fiber collection means. [Figure 6b] This is also a schematic diagram of an alternative detection device equipped with optical fiber collection means, as shown in Figures 5a to 5d. [Figure 7] Figure 2 is an enlarged cross-sectional view of the apparatus shown in Figure 2, showing a different collection means, which is complementary to those shown in Figures 5a to 5d, and is formed by an optical collector assembly capable of collecting particles generated by the interaction between a laser beam and aerosol particles. [Figure 8] Figure 7 shows the means for analyzing the particles collected by the collection method. [Figure 9] Figure 2 shows enlarged views of different cross-sections of the device. [Figure 10] This is another diagram of the apparatus shown in Figure 2, in yet another cross-section, which is different from the cross-section in Figure 9. [Modes for carrying out the invention]

[0017] In the following explanation, (O, X, Y, Z) defines an orthogonal reference frame.

[0018] The present invention relates to a system S for characterizing aerosol particles.

[0019] As schematically shown in Figure 1, the system S comprises a sampler E capable of sampling ambient gas that is likely to contain particles in aerosol form, an apparatus D for characterizing the particles by laser-induced plasma spectroscopy (LIBS), and at least one so-called dilution means MD, MD' for reducing the concentration of particles in aerosol form in the ambient gas sampled by the sampler.

[0020] Figure 2 shows a cross-sectional view of an example of sampler E that is likely to be used within the scope of the present invention.

[0021] The sampler E includes a sampling region ZP for the ambient gas. This sampling region ZP is, for example, in the form of a hollow cylinder CC having an inlet ENT, an outlet SORT, and a sampling conduit CP leading to the hollow cylinder CC. The diameter of the sampling conduit CP is significantly smaller than the diameter of the hollow cylinder CC.

[0022] In this case, sampler E is special in that it also integrates a dilution means MD. This dilution means MD is, for example, in the form of one or more additional conduits CA that open favorably into the annular chamber CHA connected to the sampling conduit CP by a plurality of orifices OR1, OR2 distributed throughout the entire internal contour of the annular chamber CHA. The dilution allows for the provision of an additional gas flow rate to the gas sampled at the level of the sampling area ZP within the sampling conduit CP. The gas does not contain particles in the form of aerosols. This gas can be air, argon, or nitrogen. Furthermore, this supply is carried out in a relatively uniform manner thanks to the annular chamber CHA and its orifices OR1, OR2, and particle loss is limited (for example, an asymmetric supply of dilution gas flow rate could bypass the walls of the conduit in question, accumulate there, and eventually block the conduit).

[0023] For example, a sampling conduit CP with a diameter of 4 mm can be provided. The flow rate sampled through this conduit CP is low (depending on the properties of the aerodynamic lens LA selected for the apparatus D, for example, 0.1 liters / min to 0.2 liters / min (NCTP conditions: Normal Conditions of Temperature and Pressure)). An annular chamber CHA can be provided with a length of 120 mm and an inner diameter of 40 mm, having 12 orifices evenly distributed on the inner circumference of the annular chamber CHA, each orifice having a diameter of 1 mm. Thus, in this design, a theoretical loss of approximately 0.5% of particles is determined for a dilution ratio of 90% (flow supply through the orifices of the annular chamber), and a theoretical loss of approximately 1% is determined for a dilution ratio of 50%.

[0024] At the outlet OUT of sampler E, the gas carrying the aerosol particles, which may be diluted, is then directed towards the inlet region ZE of apparatus D, where the particles are characterized by laser-induced plasma spectroscopy. The conduit connecting the outlet of the annular chamber CHA, and therefore the outlet of sampler E, is 10 mm in diameter, using the example above.

[0025] Optionally, an additional dilution means MD' can be considered. In this case, this additional dilution means MD' is placed between the sampler E and the apparatus D that characterizes the particles by laser-induced plasma spectroscopy. For example, commercially available dilution devices such as the VKL10E proposed by PALAS can be provided.

[0026] Within the scope of the present invention, dilution means MD, MD' play a role in determining the particle number concentration (number of particles per unit volume) in the aerosol present in the gas sampled by the sampler (a concentration that is unknown in the sampled gas and is to be precisely determined). This is because it must be ensured that the particle characterization device D using laser-induced plasma spectroscopy analyzes at most one individual particle at a time (i.e., at most one particle at a time).

[0027] The advantages of the dilution means for this purpose can be better explained with reference to Figure 3 and below, after a further description of the apparatus D in question.

[0028] Figure 3 shows in more detail the apparatus D used to characterize the particles by laser-induced plasma spectroscopy (LIBS).

[0029] Apparatus D comprises a system SG that generates a jet JP of particles JP in a chamber CH from a gas coming from a sampler E, wherein the chamber CH is associated with a means MP for pressurizing the gas present in the chamber in order to create a vacuum within the chamber. Typically, the pressure in the chamber CH can be on the order of 0.05 mbar or less.

[0030] The system SG may comprise, for example, an aerodynamic lens LA, a chamber CH' evacuated by a pressurizing means MP', and advantageously a diverter ECO. The aerodynamic lens LA is supplied with a sampled and possibly diluted gas at its inlet ENT' from a sampler E, which may contain particles in the form of an aerosol. At the outlet SORT' of the aerodynamic lens LA, a jet J of particles in the carrier gas is discharged. G However, due to the fact that it is in a vacuum (usually the pressure is on the order of 0.5 mbar or less), it is generated in the expansion chamber CH'. Next, the particle jet J in the carrier gas G The gas then passes through a diverter ECO, which has the effect of removing most of the carrier gas, leaving only the particle jet JP behind the diverter, i.e., in the chamber CH. When using an aerodynamic lens, typically 10 -3 The chamber CH can be subjected to a vacuum defined by a pressure of mbar to 1 mbar. This ensures optimal operation.

[0031] Instead of an aerodynamic lens, a nozzle can be provided (not shown). Using a nozzle typically ensures optimal operation for the same purpose. -3 A vacuum defined by a pressure of mbar to 1 mbar can be created inside the chamber CH.

[0032] Device D also includes a laser L that can emit a laser beam FL in pulse form.

[0033] In relation to this laser L, an optical device DO is positioned to focus the beam FL within the chamber CH perpendicular to the propagation direction DP of the particle jet JP.

[0034] This results in the laser beam FL and the particle N in the jet JP. P The interaction between the laser beam FL and the particles in the jet can generate a plasma within the focal volume VF, and this plasma emits other particles specific to the interaction between the laser beam FL and the particles in the jet. These other particles may be ions, electrons, or photons.

[0035] In particular, please refer to Figure 3.

[0036] Laser beam FL and jet JP particles N P The fact that the interaction between the particles occurs under vacuum within a chamber CH allows for the easy detection of extremely small particles, typically less than a few hundred nanometers, especially less than 200 nm, and even less than 100 nm. This has already been reported with gold nanoparticles on the order of 15 nm in size.

[0037] Laser L can be, for example, a fiber laser.

[0038] The repetition frequency (of the pulse) is generally between 1 kHz and 1 MHz. The minimum repetition frequency is important for characterizing a large number of aerosol particles sampled within a reasonable time. When the particle concentration in the gas sampled by the sampler is relatively low, much higher repetition frequencies on the order of MHz may be important to increase the particle counting rate per unit time.

[0039] The minimum intensity implemented at the focal volume level is typically 10 GW / cm². 2 This is on the order of magnitude. This roughly corresponds to the intensity required to generate plasma within the focal volume VF. To achieve this, the inherent properties of the laser L can obviously be used, but instead, or in addition to them, the properties of the optical device DO can also be used.

[0040] The optical device DO may, in particular, be in the form of an optical lens or simply a microscope objective lens.

[0041] Typically, a fiber laser L operating at 1065 nm, with a pulse energy of approximately 0.2 mJ associated with a 10x magnification microscope objective lens DO, delivers 10 GW / cm² within the focal volume VF. 2 This minimum intensity can be obtained.

[0042] After exceeding the focal volume VF, i.e., after interacting with the particles of the particle jet JP, the laser beam FL is advantageously recollimated by a so-called recollimation optical device DOR in the form of, for example, a set of lenses. Then, the recollimated laser beam FL can be sent to means (not shown in the attached figures) capable of measuring the output of the laser beam FL. Thereby, it can be confirmed afterwards that the output theoretically injected by the laser L is actually provided by this laser L.

[0043] The device D also comprises at least one detection device DD comprising means MC for collecting the particles emitted by the plasma and means MAS for performing a spectroscopic analysis of these particles.

[0044] The means MC for collecting the particles emitted by the plasma can be of various designs.

[0045] However, within the scope of the present invention, as the collecting means, it is advantageous to assume a plurality of N optical fibers FO1, FO2, FO3, …, FO N-1 、FO N (where N is a natural number strictly greater than 1), and one end E1, E2, E3, …, E N-1 、FO N of each optical fiber FO1, FO2, FO3, …, FO N-1 、E N is arranged around the focal volume VF for this purpose and is directed towards this focal volume VF.

[0046] The advantage of providing a large number of optical fibers is, in particular, that the number of collected particles can be doubled compared to the use of a single optical fiber for collecting the particles emitted by the plasma. Thereby, the sensitivity of the detection device DD can be increased. It can be understood that the higher the number of optical fibers, the higher the sensitivity.

[0047] Advantageously, the outer wall P EXTA spherical chamber CH can also be provided. In this case, the optical fibers FO attached to the wall of the chamber CH can be positioned on this sphere to best cover the maximum solid angle of 4π steradians around the focal volume VF where the plasma is generated. This configuration allows for increased sensitivity of the detection device DD compared to other configurations for a given number N collecting optical fibers. Each optical fiber FO1, FO2, FO3, ..., FO N-1 , FO N The ends of the focal volume VF are typically located a few millimeters from the center, and their exact value depends on the core diameter of the optical fiber used to maintain the same solid collection angle.

[0048] As a non-limiting example, one possible implementation configuration is shown below. N=158 optical fibers connect to the spherical outer wall P of the chamber CH. EXT It is attached to the core diameter of each optical fiber, which is 1 mm. With this arrangement, theoretically, the respective ends of the different optical fibers are E1, E2, E3, ..., E N-1 , E N However, if positioned 4mm to 6mm from the center of the focal volume VF, it becomes possible to capture 44% of all particles emitted by the plasma. Compared to a collection method with a single optical fiber having a core diameter of 600 microns and its collection end positioned 4mm from the center of the focal volume VF, the amount of particles emitted by the plasma that can be captured is theoretically 317 times greater.

[0049] Various options are available for the spectroscopic analysis methods MAS and MAS'.

[0050] Therefore, according to the first option shown in Figure 6(a), a spectroscopic analysis means (MAS) can be envisioned that comprises at least one notch-type filter FCB capable of ensuring filtering in a given wavelength band, and at least one photodetector PDT (e.g., an electron-photomultiplier tube type). For example, the PMT H12775 proposed by Hamamatsu can be used. See https: / / www.hamamatsu.com / eu / en / product / type / H12775 / index.html.

[0051] Therefore, the notch filter selects a specific spectral region, and the intensity of the light within this spectral region (some of the particles emitted by the plasma are photons) is determined by a photodetector (PDT).

[0052] For example, considering four spectral bands A, B, C, and D, the signal intensity in each of the bands considered (i.e., depending on the spectral bands considered, I) I (I = A, B, C, or D)) is obtained. For this purpose, it is necessary to provide multiple notch filter FCBs to ensure selection in separate bands, and the same number of photodetectors PDTs (especially of the electron-photomultiplier tube type) as the filter FCBs.

[0053] Also, the overall signal strength I G It is also possible to measure (i.e., the intensity acquired over a long storage time for all of bands A, B, C, and D).

[0054] Alternatively, for each of the spectral bands A, B, C, and D considered, the number of events N depends on the spectral band being considered (regardless of the intensity measurement). EI (I = A, B, C, or D) can be counted.

[0055] These different data, N EI , I I , and I GThis relates to different physical quantities of particles within the particle jet being analyzed.

[0056] Therefore, event N EI The number can be related to the number of particles in the detected particle jet, and knowing the dilution ratio applied by the dilution means MD, MD', it is possible to ensure that at most one individual particle (i.e., at most only one particle) is present in the focal volume VF.

[0057] This will be explained in more detail below.

[0058] Therefore, the number of particles in the gas sampled by sampler E, that is, the number concentration of particles in the gas sampled by sampler E (i.e., the number of particles per unit volume), can be determined.

[0059] Furthermore, I I This is proportional to the number of atoms of a given chemical element present in each individual particle analyzed, i.e., the proportion of the corresponding chemical element in each individual particle analyzed. Therefore, by comparing the intensities measured in different spectral bands A, B, C, and D, it is clear that the proportions of each of the various chemical elements (four if there are intensities in the four spectral bands mentioned above) present in each individual particle analyzed can be obtained.

[0060] On the other hand, if each particle being analyzed contains only one chemical element, then signal I I The intensity I across numerous events depends solely on the size of the individual particles being analyzed. I The determination of the average value is proportional to the average size of the individual particles continuously analyzed in the gas sampled by sampler E. And the representative data is this average size.

[0061] Also, the overall Strength I GThis is proportional to the number of atoms present in each particle being analyzed. In this way, the mass concentration of particles in the gas sampled by sampler E can be determined.

[0062] Therefore, for example, in the case of atmospheric monitoring of an aerosol with a given chemical property, it is possible to obtain the mass concentration, number concentration, and average size of the particles present in the aerosol.

[0063] From a practical standpoint, this can be done after calibration of the types of aerosols detected for different particle sizes. This calibration should first be performed in the laboratory so that the assembly of this data can be determined in the field.

[0064] Furthermore, it should be noted that the response time of electron-photomultiplier tube type photodetectors is very short, typically on the order of a few nanoseconds. Therefore, this type of detection is particularly suitable for the use of pulsed lasers with high repetition frequencies, as in the present invention. No special precautions are needed to avoid the response / storage time of the photodetector PDT becoming longer than one cycle of the laser (cycle = time between two pulses of the laser).

[0065] Knowing what type of particles are forming the aerosol can further improve the efficiency of the measurement. In this case, it is indeed advantageous to limit the measurement time to the time (known experimentally) when the plasma is emitting photon-containing particles, by stopping the accumulation performed by the photodetector or each photodetector PDT as soon as the plasma stops emitting particles. This can be perfectly synchronized with the operation of the pulsed laser L. This allows for an increased signal-to-noise ratio by limiting the signal accumulation time to the minimum necessary. Thus, the signal intensity measurement becomes better.

[0066] Taking the example again, considering the number of available optical fibers N=158, if we want to perform detection in four different spectral bands simultaneously (for example, the aforementioned bands A, B, C, and D can characterize four particles of different properties in a particle jet), we can provide four interference filters. Note that in this case, for example, 40 optical fibers for three of the four interference filters and 38 optical fibers for the fourth interference filter can bring the particles emitted by the plasma, collected by the plasma, into each interference filter.

[0067] According to the second option shown in Figure 6(b), we can envision a spectroscopic analysis means MAS' equipped with an optical spectrograph SO that has an intensifier charge-coupled element ICCD type camera.

[0068] This second option allows for complete spectral analysis over a very wide wavelength range.

[0069] Furthermore, after laboratory calibration, it is possible to quantify the chemical elements present in individual particles of the particle jet being analyzed.

[0070] This option ultimately allows access to the same information obtained with the first option: the mass concentration, number concentration, and size of the aerosol particles.

[0071] In reality, intensity I G This can be obtained by selecting a mode called "accumulation" on the camera's ICCD.

[0072] On the other hand, I I and N IETo obtain (in the above example, I=A, B, C, or D), it is necessary to use a specific operating mode of the camera ICCD to compensate for the slow acquisition speed of this camera. The response time of this type of camera is on the order of 100 milliseconds, which is not necessarily compatible with the use of pulsed lasers operating at high repetition frequencies. Also, the storage time of the camera ICCD must be kept shorter than the time between two laser pulses, taking into account the delay between the laser pulse and the start of acquisition by the camera ICCD, the gate width (i.e., the time the camera ICCD stores the signal), and the readout time of the camera ICCD (i.e., the time it takes for the electronics associated with the camera to read the information contained in the pixels of the camera ICCD).

[0073] As mentioned above, the dilution means MD, MD' play a role in determining the number concentration (i.e., volume) of particles in the aerosol present in the gas sampled by the sampler, which can only be done correctly by ensuring that the particle characterization device D using laser-induced plasma spectroscopy analyzes only one individual particle at a time within the focal volume VF.

[0074] From a statistical standpoint, the focal volume VF of apparatus D can be shown to indicate individual particles from the particle jet only if a particle is detected at most once in 10 laser shots (see Figure 4). If this value is exceeded, the dilution means MD and, if necessary, MD' can be controlled to ensure that only one particle is detected for every more than 10 laser shots. The dilution ratio applied by the dilution means MD, MD' to obtain a maximum of one particle detection per 10 laser shots is what enables tracking the number concentration of aerosol particles in the gas sampled by sampler E.

[0075] Furthermore, as shown (by dotted lines) in Figure 1, the system S according to the present invention may also include a processor P configured to control a dilution means MD and optionally an additional dilution means MD', if necessary depending on the data provided by a detection device DD of a device D that characterizes particles by laser-induced plasma spectroscopy (detection of a large number of particles per 10 laser shots).

[0076] The information obtained using the system S according to the present invention (in particular, the characterization device D) as described above (i.e., the concentration of particle mass, number, and size) can be finalized.

[0077] Therefore, the system S according to the present invention is advantageous as shown in Figure 7, Multiple optical assemblies EO1-EO8, attached to the chamber CH and distributed at an angle around the chamber CH, for collecting particles emitted by the plasma, To analyze the angular distribution of the aforementioned particles, the system includes another detection device ADD comprising at least one photodetector PDT' connected to the plurality of optical assemblies EO1 to EO8.

[0078] In particular, each optical assembly EO1 to EO8 can be formed by lenses. Figure 7 shows a specific number (N=8) of optical assemblies and their specific angular positions (angular values) as indicators, representing one implementation form that is actually achievable.

[0079] This other detection device, ADD, is intended to determine the angular scattering of a light beam across a particle jet (containing photons), a method called SLS (static light scattering).

[0080] The technique itself is known, and if the optical properties of the particles are known, i.e., if their chemical properties are known, then the size and morphology of the particles in aggregate form can be determined. As described above, LIBS makes it possible to determine the chemical properties of the elements present in the particles of a particle jet. For this purpose, the lasers mentioned above are used, but it is possible to avoid generating plasma. This can be done, for example, with a continuous laser beam. Another laser operating at wavelengths close to green or blue can also be used.

[0081] The data provided by SLS also allows for better estimation of the mass and number concentrations of particles in the analyzed particle jet, which can be compared with the results obtained by LIBS. Typically, particles in aggregate form are soot (combustion products: combustion engines, fire, etc.).

[0082] Therefore, the system S according to the present invention also advantageously includes an infrared CIR (generally near-infrared) sensitive camera configured to measure the temperature change of particles in the particle jet, as shown in Figure 9.

[0083] Camera-inducing infrared (CIR) technology enables the implementation of a technique known by the acronym LII, which stands for "Laser-Induced Incandescence."

[0084] To implement this technology, it is necessary to reduce the output provided by the laser L, referring to LIBS. No plasma is generated within the focal volume, but particles N are present within the focal volume VF. POnly heating occurs. This method aims to determine the cooling of particles that depends solely on the power lost by radiation (no convection or conduction) because the chamber CH is under vacuum. This power lost by radiation is related to the size and chemical properties of the particles under consideration. Cooling can be determined by time. However, here this measurement is performed in a spatially advantageous manner (this is made possible by the mounting in Figure 9). In fact, the particles are flying in the particle jet and are animated at a constant velocity that can be fully calculated (particularly using a CFD "computational fluid dynamics" type calculation code) depending on their size and chemical properties. Because this velocity is relatively high (typically 140-350 m / s depending on particle size and concentration) and the particles cool slowly (radiation is the only contributing factor in a vacuum), the cooling rate is measured spatially by a camera CIR which is favorably equipped with a wide-angle lens. In Figure 9, considering the direction of travel of the particle jet JP, the camera is positioned downstream of the focal volume VF. Next, the camera CIR allows for the acquisition of images of the thermal radiation of particles flying within the particle jet, from the laser beam FL in the focal volume VF, and therefore further after interaction with the laser beam FL.

[0085] Finally, it should be noted that collecting particles for excitatory analysis and verifying or completing the results obtained in real time by the system S according to the present invention may be of interest.

[0086] Therefore, it is useful for apparatus D to provide a substrate holder MET that can include a substrate (e.g., a deposit can be used to perform X-ray fluorescence) and grids on both sides thereof (for performing transmission electron microscopy), particularly as shown in Figure 10. It is advantageous for the substrate holder to be mounted so that it can rotate around its principal axis so that the grids can be exposed to the particle jet for a relatively short time. In fact, for the purpose of performing transmission electron microscopy, the actual aggregation state of particles in the jet can be investigated (this could not be considered if a layer of particles were deposited on these grids when performed on a substrate).

[0087] Among the possible characterizations, those relating to the number concentration of the characterized particles are of particular interest within the scope of this invention.

[0088] Furthermore, the present invention relates to a method for implementing the system S according to the present invention, wherein the method is a) A step of sampling the ambient gas which is likely to contain aerosolized particles at a characteristic number concentration, b) A step of detecting the particles by laser-induced plasma spectroscopy, wherein each detection consists of detecting up to one individual particle within the focal volume VF, c) A step of counting the number of particles detected in step b) per unit time, The present invention relates to a method comprising the step of determining the number concentration of the particles in a sampled ambient gas by comparing the data obtained from step c) with a database that associates the number concentration with the count value per unit time.

[0089] It should be noted that the particles whose number concentration is to be characterized inevitably have a given elemental chemical composition.

[0090] The database is established by performing calibrations that establish a relationship between the known number concentrations of the relevant particle types and the counts performed on them, for each of the different particle types of interest. This foundation makes it possible to determine the number concentration of the desired particle type from counts performed on samples where the number concentration is unknown during use.

[0091] This method may include a step between step a) and step b) to controllly reduce the concentration of particles present as aerosols in the sampled ambient gas, ensuring that the focal volume VF contains at most one individual particle.

Claims

1. A system (S) that characterizes particles in the form of aerosols in the surrounding gas, A sampler (E) capable of sampling the ambient gas, An apparatus (D) for characterizing the particles by laser-induced plasma spectroscopy, wherein the apparatus (D) is A system (SG) that generates a jet (JP) of particles (JP) in a chamber (CH) from a gas coming from the sampler (E), wherein the chamber (CH) is associated with means (MP) for pressurizing the gas present in the chamber in order to create a vacuum in the chamber, A laser (L) capable of emitting a laser beam (FL) in pulse form, wherein the laser (L) comprises the laser beam (FL) and the jet particles (N ＮＰ An optical device (DO) configured to focus the laser beam in the chamber (CH) perpendicular to the propagation direction of the particle jet (JP) in order to generate a plasma in the focal volume (VF) through interaction between the laser (L) and the particle jet (JP), wherein the plasma emits other particles specific to the interaction between the laser beam and the particles of the jet, A detection device (DD, DD') includes means (MC) for collecting the particles emitted by the plasma and means (MAS, MAS') for performing spectroscopic analysis of the particles, and The apparatus (D) comprises, At least one so-called dilution means (MD, MD') for reducing the concentration of the particles in aerosol form in the ambient gas sampled by the sampler such that the focal volume (VF) contains at most one individual particle, A system (S) characterized by comprising:

2. The system (S) according to claim 1, characterized in that the dilution means (MD) is arranged between the sampling region (ZP) of the ambient gas of the sampler (E) and the apparatus (D) for characterizing the particles by laser-induced plasma spectroscopy.

3. The system (S) according to claim 1 or 2, characterized in that the dilution means (MD) belongs to the sampler (E).

4. The system (S) according to any one of claims 1 to 3, further comprising an additional dilution means (MD') positioned between the sampler (E) and the apparatus (D) for characterizing the particles by laser-induced plasma spectroscopy.

5. The system (S) according to any one of claims 1 to 4, comprising a processor (P) configured to control the dilution means (MD) and optionally additional dilution means (MD') as a function of data provided by a detection device (DD) of the apparatus (D) for characterizing the particles by laser-induced plasma spectroscopy.

6. The detection device (DD, DD') includes a plurality of N optical fibers (FO １ , FO ２ , FO ３ , …, FO Ｎ－１ , FO Ｎ ), where N is a natural number strictly greater than 1. One end (E1, E2, E3, …, EN) of each optical fiber (FO １ , FO ２ , FO ３ , …, FO Ｎ－１ , FO Ｎ ) is arranged around the focal volume (VF) and is oriented towards the focal volume (VF) for collecting the particles emitted by the plasma. The system (S) according to any one of claims 1 to 5, characterized in that.

7. The optical fiber (FO) is located within the spherical outer wall (P) of the chamber (CH). ＥＸＴ The system (S) according to claim 6, characterized in that it is attached to ).

8. The means (MAS) for performing spectroscopic analysis of the particles emitted by the plasma is: A notch-type filter (FCB) capable of filtering in a given wavelength band, At least one photodetector (PDT) and A system (S) according to any one of claims 1 to 7, characterized by comprising:

9. The means for performing spectroscopic analysis of the particles emitted by the plasma is, Multiple notch-type filters (FCBs) capable of filtering in different wavelength bands, Each notch filter has a photodetector (PDT) associated with it. A system (S) according to any one of claims 1 to 8, characterized by comprising:

10. The means (MAS') for performing spectroscopic analysis of the particles emitted by the plasma is, The system (S) according to any one of claims 1 to 8, characterized by comprising an optical spectrometer (OS) equipped with an intensifier charge-coupled device (ICCD) type camera.

11. A plurality of optical assemblies (EO1 to EO8) attached to the chamber (CH) and distributed at an angle around the chamber (CH) for collecting the particles emitted by the plasma, To analyze the angular distribution of the particles, at least one photodetector (PDT') is connected to the plurality of optical assemblies (EO1 to EO8) and The system (S) according to any one of claims 1 to 10, characterized by comprising another detection device (ADD) equipped with

12. The system (S) according to any one of claims 1 to 11, further comprising an infrared camera (CIR) configured to measure the temperature change of the particles in the particle jet.

13. A method for characterizing particles in the form of aerosols in an ambient gas using a system according to any one of claims 1 to 12, a) A step of sampling the ambient gas at characteristic concentrations, b) A detection step comprising detecting the particles by laser-induced plasma spectroscopy, wherein each detection consists of detecting up to one individual particle within the focal volume (VF), c) A step of counting the number of particles detected in step b) per unit time, d) A method comprising the step of determining the number concentration of the particles in the sampled ambient gas by comparing the data obtained from step c) with a database relating the number concentration to the count value per unit time.

14. The method according to claim 13, characterized in that between step a) and step b), the step of controllingly reducing the concentration of the particles present in the sampled ambient gas in the form of an aerosol such that the focal volume (VF) contains at most one individual particle.

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