Information processing device, information processing method, and information processing program

Abstract

To provide a simulation result responding to testing conditions of an entry test.SOLUTION: An information processing apparatus 10 according to the present invention has a simulation unit 20B. The simulation unit 20B simulates an examination of an entry to a market with using examination conditions represented by examination condition information representing the examination of the entry to the market based on actual data of a user, to calculate simulated results including an examination success rate.SELECTED DRAWING: Figure 1

Description

Technical Field

[0001] Embodiments of the present invention relate to an information processing apparatus, an information processing method, and an information processing program.

Background Art

[0002] When a consumer enters the power supply-demand adjustment market, a pre-examination of the consumer is conducted. In the pre-examination, confirmation of compliance with requirements may be performed on the consumer by conducting an entry test such as an actual operation test.

[0003] Therefore, a method for pre-evaluating consumers for the supply-demand adjustment market has been disclosed. For example, a technique for ranking the optimal consumers who perform power reduction in response to a power reduction (demand response) request based on the standard deviation of the difference between the assumed demand and the actual demand of the operator per unit time has been disclosed.

[0004] In the entry test, tests are conducted under various test conditions. However, in the prior art, ranking is performed only according to the standard deviation of the difference between the assumed demand and the actual demand of the operator, and no proposal has been made regarding the provision of simulation results according to the test conditions of the entry test.

Prior Art Documents

Patent Documents

[0005]

Patent Document 1

Summary of the Invention

Problems to be Solved by the Invention

[0006] An object of the present invention is to provide an information processing apparatus, an information processing method, and an information processing program that can provide simulation results according to the test conditions of an entry test.

Means for Solving the Problems

[0007] The information processing device of this embodiment includes a simulation unit. The simulation unit is used by customers Regarding received power Performance data and, Test condition information representing the test conditions for market entry testing. and, by te Shi Run the simulation and calculate the simulation results, including the test success rate. The test condition information includes test date information representing the test date, test time period, test content, and reference value method used to calculate the reference value power, and resource information relating to power reduction resources for the consumer. The simulation unit calculates the reference value power for each unit time period on the test date using the reference value method with respect to the actual data, calculates the target amount of power received for each unit time period included in the test time period using the test content and the reference value power, and performs a simulation to adjust the power reduction resources so that the amount of power received for each unit time period on the test date included in the power received data becomes the target amount of power received. The simulation calculates a dwell rate for each test day, which is the percentage of the time period on the test date in which the power received value is within ±10% of the target amount of power received, and calculates the success rate of the test as the percentage of test days in which the dwell rate is 100% among the multiple test days. [Brief explanation of the drawing]

[0008] [Figure 1] A diagram showing the functional configuration of an information processing device. [Figure 2] A schematic diagram of the data structure of received power data. [Figure 3] A schematic diagram of the input screen for test condition information. [Figure 4] A diagram illustrating the calculation of the output request value. [Figure 5] A schematic diagram of the output screen for the simulation results. [Figure 6] A flowchart illustrating an example of the information processing flow. [Figure 7] A schematic diagram of the simulation results. [Figure 8A] A schematic diagram of the output screen for the simulation results. [Figure 8B] A schematic diagram of the output screen for the simulation results. [Figure 8C] A schematic diagram of the output screen for the simulation results. [Figure 9] A schematic diagram of the output screen. [Figure 10] A schematic diagram of the output screen. [Figure 11] A flowchart illustrating the flow of information processing. [Figure 12] A schematic diagram of the input screen for test condition information. [Figure 13] A schematic diagram of the output screen. [Figure 14] A schematic diagram of the output screen. [Figure 15] A flowchart illustrating the flow of information processing. [Figure 16] Hardware configuration diagram.

Embodiment for Carrying Out the Invention

[0009] Hereinafter, embodiments of an information processing apparatus, an information processing method, and an information processing program according to the present invention will be described with reference to the drawings. Note that, hereinafter, the time refers to two types: a case where it indicates an instant of time and a case where it indicates the time width of a unit time. The unit time is, for example, a 5-minute unit or the like, but is not limited to this unit. Hereinafter, the unit time may be referred to as a slot in some cases.

[0010] (First Embodiment) FIG. 1 is a diagram showing an example of the functional configuration of the information processing apparatus 10 of the present embodiment.

[0011] The information processing apparatus 10 is an information processing apparatus for executing a simulation of an entry test into the market. The market is a mechanism related to transactions of elements such as energy such as electric power and wind power, and goods. In the present embodiment, a form in which the market is a supply-demand adjustment market will be described as an example. The supply-demand adjustment market is a market for a general power transmission and distribution business operator to procure adjustment power necessary for stabilizing the power system. The entry test is conducted for consumers who plan to enter the supply-demand adjustment market. Note that the entry test is not limited to the entry test into the supply-demand adjustment market. For example, the entry test may be an entry test into a market related to transactions of elements other than electric power, and is not limited to the entry test into a market related to electric power.

[0012] The information processing apparatus 10 is a PC (Personal Computer) or the like, and has a hardware configuration using a normal computer including a CPU (Central Processing Unit), a memory, an HDD (Hard Disk Drive), a communication interface (I / F), a display device such as a display, and an input device such as a keyboard and a mouse.

[0013] The information processing device 10 comprises a communication unit 12, an input unit 14, a display unit 16, a storage unit 18, and a control unit 20. The communication unit 12, the input unit 14, the display unit 16, the storage unit 18, and the control unit 20 are communicated together via a bus or the like.

[0014] The communication unit 12 communicates with an external information processing device via a network or the like. The input unit 14 is an input device such as a keyboard that accepts user input. The display unit 16 is a display that shows various kinds of information. The storage unit 18 stores various kinds of information. The storage unit 18 is, for example, an HDD or memory.

[0015] The control unit 20 is an arithmetic unit that performs information processing. The control unit 20 comprises a reception unit 20A, a simulation unit 20B, and an output control unit 20C.

[0016] At least one of the reception unit 20A, the simulation unit 20B, and the output control unit 20C is implemented by, for example, one or more processors. For example, each of the above units may be implemented by having a processor such as a CPU execute a program, i.e., by software. Each of the above units may be implemented by a dedicated IC (Integrated Circuit) or other processor, i.e., by hardware. Each of the above units may be implemented by using a combination of software and hardware. When multiple processors are used, each processor may implement one of the above units, or two or more of the above units.

[0017] Reception unit 20A receives customer performance data and test condition information.

[0018] For example, the reception unit 20A receives actual data and test condition information from the input unit 14 by receiving user input from the input unit 14. Alternatively, the reception unit 20A may receive actual data and test condition information by acquiring at least a portion of the actual data and test condition information from an external information processing device via the communication unit 12. Alternatively, the reception unit 20A may receive actual data and test condition information by reading the actual data and test condition information stored in the storage unit 18.

[0019] Customer performance data refers to data representing a customer's past electricity supply and demand performance. In this embodiment, we will describe an example of using a customer's past power received data as performance data. Power received data refers to historical information on a customer's past power received. In the following, the customer's past power received data may be simply referred to as power received data.

[0020] Figure 2 is a schematic diagram of an example of the data structure of received power data. Figure 2 shows an example of past received power data for one customer that plans to enter the supply and demand adjustment market.

[0021] The power reception data represents the power reception value for each time period on each day within a specified past period. Figure 2 shows an example of the power reception value for each minute elapsed on each day over the past year. The power reception values ​​included in the power reception data are the actual power reception values ​​for each time period on each day in the past for the consumer.

[0022] Returning to Figure 1, let's continue the explanation. The reception unit 20A receives power reception data by reading power reception data input by, for example, user instructions for operation of the input unit 14. Alternatively, the reception unit 20A can also receive power reception data by reading power reception data specified by user instructions for operation of the input unit 14 from the storage unit 18 or other information processing device.

[0023] Next, we will explain the test condition information. Test condition information refers to information that represents the test conditions for entry testing into the supply and demand adjustment market.

[0024] Test condition information includes, for example, test date information, exclusion date information, test information, and at least one of resource information.

[0025] Test date information refers to information representing the test dates of the entry examination. In other words, test date information represents the simulation target dates for the entry examination. Test date information is represented, for example, by the examination period from the start date to the end date. In this embodiment, test date information represents dates within a period that represents the customer's past power consumption data. Furthermore, in this embodiment, the form in which test date information represents multiple test dates represented by the examination period will be explained as an example.

[0026] Exclusion date information refers to information indicating dates that are excluded from the exam. An exclusion date represents any of the multiple exam dates indicated by the exam date information.

[0027] Test information refers to information relating to the entry examination. Test information includes, for example, information representing at least one of the following: the examination time period, the amount of power that can be supplied, the standard value method used to calculate the standard value power, and the content of the examination.

[0028] The test time slot is information that indicates the time period during which the entry test will be conducted on the test day, as indicated by the test date information. In other words, the test time slot is information that indicates the time period during which bidding is scheduled for the supply and demand adjustment market.

[0029] The available supply amount refers to the amount of electricity that a consumer can supply. This available supply amount is the upper limit for bids to the supply and demand adjustment market, provided that the entry test is successful and the preliminary screening is passed.

[0030] The baseline method is a method for calculating baseline power. Baseline power is information that represents the amount of power used per unit time by a consumer under normal conditions. Baseline power may also be called the baseline or reference value. The baseline method may also be called the baseline calculation method. Examples of baseline methods include the averaging method, regression analysis method, equivalent day adoption method, and weighted moving average method. An example of the averaging method is the High X of Y method. The High X of Y method is a method that uses data from the X days with the highest power consumption out of the most recent Y days to calculate the baseline. Furthermore, each baseline method may include methods with and without daily adjustments. In addition, the baseline method may use a calculation result in which a fixed bias, such as a certain percentage of the available supply, is increased or decreased as the baseline power.

[0031] The "exam content" refers to information that describes the content of the entrance examination. For example, the exam content can be represented by the type of exam.

[0032] For example, let's consider a case where the entry test is an entry test concerning the adjustment capacity defined by Tertiary Adjustment Capacity 2, one of the commodities handled in Japan's supply and demand adjustment market. The "2" in Tertiary Adjustment Capacity 2 is actually represented by a circled character. In the case of this entry test for Tertiary Adjustment Capacity 2, the test content includes, for example, three types of test content: Test a, Test b, and Test c.

[0033] Test A is a test to confirm the response time and duration when the command value is set to the available supply amount. In Test A, the customer is instructed to reduce demand from a pre-specified baseline power value to the available supply amount within 45 minutes, and it is confirmed that the customer can maintain the available supply amount for 3 hours or more.

[0034] Test b is a test to confirm the response when the command value is repeatedly changed. In Test b, the demand of consumers is reduced by an arbitrary amount within the range of 30% to 70% of the available supply amount from the standard power value, and it is confirmed that consumers are following the command.

[0035] Test c is a test to confirm the response when the command value is zero. In test c, it is confirmed that the customer is responding based on the standard power value.

[0036] The test content is not limited to tests a to c. For example, the test content may include one, two, or four or more types of test content. In this embodiment, we will describe a configuration in which the test content consists of three types: tests a to c.

[0037] Resource information refers to information about power reduction resources available to consumers. Power reduction resources are resources used to reduce the demand for electricity. Examples of power reduction resources include generators and storage batteries. A generator is a power reduction resource that generates electricity. Generators are power reduction resources that utilize the natural environment and resources, such as solar power, geothermal energy, wind power, and water power.

[0038] Resource information includes, for example, information representing at least one of the following for a power reduction resource: the adjustable upward output rate, the downward output rate, capacity, measurement delay time, and control delay time. Measurement delay time is the time required from the time the power demanded by the customer is measured until it is actually measured. The shorter the measurement delay time, the more accurate the demand forecast. Control delay time is the time required from the time the power demanded by the customer is measured until control is performed on the power reduction resource according to the measured power value. The control delay time is always greater than the measurement delay time. For example, if the control delay time is less than 4 minutes, it is possible to send more than two adjustment requests to the customer within a 5-minute time slot.

[0039] If the power reduction resource is a generator, the resource information includes information representing the rated output, rate of change in increased output, rate of change in decreased output, measurement delay time, control delay time, etc. The rate of change in increased output means the rate of change in the increasing direction. The rate of change in decreased output means the rate of change in the decreasing direction. If the power reduction resource is a battery, the resource information includes information representing the charge output, discharge output, capacity, measurement delay time, control delay time, etc.

[0040] In this embodiment, the reception unit 20A will be described as receiving test condition information by receiving information entered by the user through operation instructions of the input unit 14. The user inputs test condition information by operating the input unit 14 while viewing the input screen displayed on the display unit 16.

[0041] Figure 3 is a schematic diagram of an example of the input screen 30 for test condition information. For example, the output control unit 20C displays the input screen 30 on the display unit 16. The user inputs the power reception data period, test date information represented by the test period, exclusion date information, test time period, available supply amount, standard value method, test content, and resource information for power reduction resources by operating the input unit 14 while viewing the input screen 30.

[0042] The input field for the power reception data period included in input screen 30 is the input field for the period of dates shown in the past power reception data received separately.

[0043] The input fields for the test period included in input screen 30 are input fields for the test start date and test end date, which are any period within the power reception data period. In other words, the input fields for the test period included in input screen 30 are input fields for test period information, and are input fields for multiple test dates represented by the test period.

[0044] The "Excluded Dates Input Button" included in input screen 30 is the input field for setting excluded dates.

[0045] For example, when a user operates the "Excluded Day Input Button" on the input screen 30, the output control unit 20C displays a calendar showing a list of dates included in the test period. The user can input dates to be excluded by checking the checkboxes for the days to be excluded in the calendar.

[0046] Furthermore, as shown in Figure 3, the input screen 30 may include a selection field for choosing whether the test date is "all days" or "weekdays only," and selection fields such as "exclude days with negative baseline values" and "exclude days with negative demand." These selection fields are for accepting exclusion dates.

[0047] In detail, "all days" as the test days means that all days within the test period are considered test days. "Weekdays only" means that holidays included within the test period are excluded. "Excluding days with negative baseline values" means that days within the test period where the baseline power value is negative are excluded. "Excluding days with negative demand" means that days where the power received value included in the power received data is negative are excluded.

[0048] The user can specify exclusion dates by operating the input unit 14 and selecting an option from the selection field. The reception unit 20A receives exclusion date information representing the specified exclusion dates via the input screen 30.

[0049] The reception unit 20A checks if, among the test days represented by the test date information entered as the test period on the input screen 30, the test days are holidays, and if the power received value indicated by the previously received power received data is below the first threshold or the first threshold... Value Test dates that show a value higher than the second threshold may be accepted as excluded date information, indicating they are not included in the test. The first and second thresholds can be predetermined. Furthermore, the first and second thresholds may be changed as appropriate by user instructions for operation of the input unit 14.

[0050] The reception unit 20A searches for test dates that fall on holidays among the test dates represented by the input test date information. Then, the reception unit 20A accepts the exclusion date information for the excluded date by setting the inspected test date as an excluded date. In addition, the reception unit 20A checks if the received power value indicated by past received power data is below the first threshold or the first threshold. Value The system searches for test dates that show a value higher than the second threshold. The reception unit 20A then accepts the exclusion date information for the found test dates by setting them as exclusion dates. By accepting as exclusion date information test dates that show a power received value below the first threshold or above the second threshold, the reception unit 20A can set days with a clearly low success rate for the entry test as exclusion dates.

[0051] A day with a clearly low success rate in the entry test is, for example, a day when the baseline power is too high, and even if the output from power reduction resources is adjusted to zero, the customer's received power value cannot be brought up to the lower limit of the test success condition. The second threshold should be set to identify that this condition is met, i.e., that the baseline power is too high. A day with a clearly low success rate in the entry test is, for example, a day when the baseline power is too low, and the target received power amount is too high compared to the customer's received power value, and even if the output from power reduction resources is adjusted to the maximum, the customer's received power value cannot be brought up to the upper limit of the test success condition. Also, a day with a clearly low success rate in the entry test is, for example, a day when a sudden large demand occurs that exceeds the rate of change in output of power reduction resources. The first threshold should be set to identify that this condition is met, i.e., that at least one of the baseline power being too low and a sudden large demand occurring.

[0052] The receiving unit 20A may accept exclusion date information for excluded days by identifying days on which the success rate of these tests is clearly low, based on the received power reception data and test condition information. Alternatively, the receiving unit 20A may accept exclusion date information by setting the above-mentioned first and second thresholds that can identify days on which the success rate of these tests is clearly low.

[0053] The input field for the test time slot included in input screen 30 allows you to enter any test time slot. Figure 3 shows checkboxes for selecting from eight 3-hour segments within a 24-hour period, which are used as input fields for the test time slot.

[0054] The input fields for test details included in input screen 30 are for inputting the available quantity and the condition values ​​for the test details.

[0055] As mentioned above, the available supply quantity is the upper limit for bidding on the supply and demand adjustment market if the entry test is successful and the preliminary screening is passed. Furthermore, the available supply quantity is the base value used to derive the command values ​​corresponding to each type of test. For example, the user can input the upper limit of the output of power reduction resources such as generators as the available supply quantity by operating the input unit 14. Alternatively, the user can input the result of multiplying this upper limit by the supply rate as the available supply quantity by operating the input unit 14.

[0056] Depending on the type of test, it may be possible to set arbitrary condition values. For example, as mentioned above, in test b, demand is suppressed by an arbitrary suppression amount within the range of 30% to 70% of the available supply amount from the reference power value, and it is confirmed that the system is following the command. For this reason, the output control unit 20C displays an input screen 30, which includes an input field for the range of the suppression amount, on the display unit 16 for test b. Figure 3 shows an example where the user has entered "30%", "70%", and "0%" of the available supply amount as the hourly trend of the suppression amount in test b. In this case, the reception unit 20A receives test condition information including "30%", "70%", and "0%", which represent the hourly trend of the suppression amount relative to the available supply amount, as condition values ​​for test b.

[0057] The input field for the reference value method included in the input screen 30 includes a checkbox that allows selection of one of several types of reference value methods, and an input field for the bias width of the reference power calculated according to the reference value method.

[0058] The input field for power reduction resources included in the input screen 30 includes an input field for information about power reduction resources.

[0059] The user inputs any test conditions to be used in the entry examination by operating the input unit 14 while viewing the input screen 30. The reception unit 20A receives test condition information representing the test conditions entered on the input screen 30.

[0060] Returning to Figure 1, we continue the explanation.

[0061] The simulation unit 20B performs a simulation of the entry test based on the test conditions represented by the test condition information received by the reception unit 20A, using the power received data received by the reception unit 20A, and calculates the simulation results, including the test success rate.

[0062] The simulation unit 20B calculates simulation results, including the success rate of the test, by performing simulations according to the following processes for each test date and test content represented by the test date information.

[0063] First, let's explain how to set the test dates to be simulated. The simulation unit 20B identifies the excluded dates, which are represented by the excluded date information, from among the test dates represented by the test date information included in the test condition information. Then, the simulation unit 20B identifies the test dates other than the identified excluded dates, from among the test dates represented by the test date information included in the test condition information, as the test dates to be used for calculating the test success rate, i.e., the test dates to be simulated.

[0064] The simulation unit 20B then performs a simulation according to the test content for each of the multiple types of test content included in the test condition information and calculates the test success rate.

[0065] In this embodiment, the simulation unit 20B identifies test a, test b, and test c as multiple types of test contents included in the test condition information. Then, for each of the multiple types of test contents, the simulation unit 20B executes a simulation in accordance with the test contents for each of the identified test dates to be simulated.

[0066] By running the simulation, the simulation unit 20B calculates the occupancy rate for each of the multiple test days within the test period, which is the percentage of the time when the predicted power received value is within ±10% of the target power received value, for each of the multiple test contents. The simulation unit 20B also calculates the success rate of the test, which is the percentage of test days within the test period where the occupancy rate is 100%.

[0067] Furthermore, the simulation unit 20B calculates an overall test success rate, which is an integrated result of the success rates of each of the multiple types of test contents, as the overall test success rate for the customer's entry test.

[0068] Furthermore, the simulation unit 20B may further calculate the average of the success rates for each of the multiple types of test contents as the success rate for the customer's entry test.

[0069] The output control unit 20C outputs the simulation results from the simulation unit 20B to the display unit 16, etc.

[0070] The processes performed by the simulation unit 20B will be explained in detail.

[0071] First, let's assume that the power reduction resource provided to the consumer is a generator, the unit time slot is 5 minutes, and the success rate of the test is evaluated every 5 minutes.

[0072] First, the simulation unit 20B calculates the reference power value for each unit time during the test period on the test day using a reference value method represented by the test condition information.

[0073] In detail, the simulation unit 20B uses the power reception data received by the reception unit 20A and the reference value method included in the test condition information to calculate the reference power value for each unit time of the test period included in the test condition information on the test day to be simulated.

[0074] Next, the simulation unit 20B calculates the target power received per unit time within the test period using the test content represented by the test condition information and the calculated reference power value.

[0075] For example, consider a scenario where the command value for time t0 to time t0+4 within a single slot is R. The command value represents the command value for output change. Also, consider a scenario where the simulation unit 20B calculates the target power received for each slot consisting of time t0 to time t+4.

[0076] In this case, the simulation unit 20B calculates the predicted power demand of the consumer at time t using the following formula (1).

[0077] D(t)=d(t0-T) for t=t0~T0+4...Equation (1)

[0078] In equation (1), D(t) represents the customer's predicted power demand at time t. d(t) represents the customer's received power value at time t. In other words, d(t) represents the received power value for the corresponding test date and time in the received power data received by reception unit 20A. T represents the measurement delay time. d(t0-T) represents the latest demand value obtained at time t0. The demand value means the received power value.

[0079] The simulation unit 20B then calculates the target power received for each time t included in the test period using the following equation (2).

[0080]

number

[0081] In equation (2), target(t) represents the target power received by the customer at time t. b(t) represents the reference power value at the customer at time t. R represents the command value.

[0082] The command value R is determined by the type of test being performed.

[0083] If the test type is test a, the command value R for all slots in all time periods will match the available supply amount. Therefore, if the test type is test a, the simulation unit 20B sets the available supply amount included in the test condition information for the command value R at all time t.

[0084] If the test type is test c, the command value R for all slots in all time periods will be zero (0.0). Therefore, if the test type is test a, the simulation unit 20B sets the command value R for all time t to zero (0.0).

[0085] If the test type is test b, the command value R will be a value corresponding to the change in the suppression amount input as a condition value for test b. For example, consider a scenario where the reception unit 20A receives inputs of "30%", "70%", and "0%" of the available amount as the hourly changes in the suppression amount for test b (see Figure 3). In this case, the simulation unit 20B sets the command value R to a value that changes every hour as 0.3 × available amount, 0.7 × available amount, and 0.0.

[0086] Furthermore, when tests a to c are used as the test content, the command value R for the hour prior to the start of the test must also be set to the reference power value. In other words, when tests a to c are used as the test content, it is required to satisfy the success conditions assuming that the command value R is set to 0.0. For this reason, in this embodiment, the test time period is set to 4 hours, which is 3 hours plus 1 hour, and for each 5-minute slot included in the test time period, it is determined whether the predicted power received value is within ±10% of the target power received value.

[0087] In the case of test b, the target power received changes rapidly in accordance with the rapid change in the command value R (see equation (2)). For this reason, in the case of test b, the simulation unit 20B may use a value adjusted so that the command value R changes smoothly as the command value R.

[0088] Next, the simulation unit 20B identifies the received power value for each unit time (slot) of the test time period on the test day to be processed from the received power data. In this embodiment, the simulation unit 20B identifies the received power value for each time t from the received power data. The simulation unit 2B0 then executes a simulation to adjust the power reduction resources so that the received power value at the identified time t becomes the target received power amount target(t) at that time t. The simulation unit 20B calculates the test success rate by executing this simulation.

[0089] In other words, in this embodiment, the simulation unit 20B performs a simulation to adjust the power reduction resources so that the received power value at each time t included in the slot becomes the target received power amount at the same time t as the received power value. The simulation unit 20B then determines, based on the execution of this simulation, whether the predicted received power value is within ±10% of the target received power amount for each slot. The simulation unit 20B then calculates the occupancy rate for each of the multiple test days within the test period, which is the percentage of the multiple test days within the test period for which the predicted received power value is within ±10% of the target received power amount. For each of the multiple types of test content, the simulation unit 20B calculates the percentage of test days with a occupancy rate of 100% among the multiple test days within the test period as the test success rate.

[0090] For example, let's assume that the power reduction resource is a generator. In this case, the simulation unit 20B calculates the output request value y(t) for the generator at time t. The output request value y(t) is an adjustment value used to adjust the power reduction resource so that the amount of electricity received by the consumer at time t becomes the target amount of electricity received at time t, target(t).

[0091] First, the simulation unit 20B calculates the target output value y1(t) of the generator at time t, including the unimplemented amount, using the following equation (3).

[0092]

number

[0093]

number

[0094] In equation (3), part (3A) represents the process of mechanically allocating a target reduction value for power demand using the predicted power demand D(t) of the consumers at time t. In equation (3), part (3B) represents the past reduction amount prior to time t0. The past reduction amount prior to time t0 is used for constraints on the rate of change of output and maximum output. Therefore, equation (3) represents the target output value y1(t) of the generator at time t, assuming that the output required by time t-0, including past unimplemented reductions, is the reduction amount at time t0. Note that in equation (3), D(t), b(t), and R have the same meaning as in the above equation and are therefore omitted from explanation.

[0095] Here, considering the rate of change in output from one time point prior, the generator's target output value y2(t) at time t must satisfy the following equation (4).

[0096] y2(t)=min(max(y2(t-1)-DN,y(t)),y2(t-1)+UP)...Equation (4)

[0097] In equation (4), DN represents the rate of change in the generator's output downwards. UP represents the rate of change in the generator's output upwards. The meaning of y(t) in equation (4) has been explained above, so its explanation is omitted.

[0098] Furthermore, considering that the rated output and the generator output cannot be less than 0, the output request value y(t) to the generator at time t, which is used to adjust the generator to achieve the target amount of received power target(t), is expressed by the following equation (5).

[0099] y(t)=max(0,min(OUTPUT,y2(t)))...Equation (5)

[0100] In equation (5), OUTPUT represents the rated output of the generator. The meanings of y(t) and y2(t) in equation (5) have been explained above, so their explanation is omitted here.

[0101] The simulation unit 20B calculates the output request value y(t) to the generator for each time t by repeating the calculation of equations (1) to (5) for each time t0 to t0+4.

[0102] Next, let's consider the case where the power reduction resource is a battery. In this case, the simulation unit 20B should calculate the output request value y(t) to the battery at time t in the same way as in the case of the generator, except that it uses equation (6) below instead of equation (5) above.

[0103] y(t) = max(charge output, min(discharge output, y(t))) ... Equation (6)

[0104] In equation (6), the meaning of y(t) has been explained above, so the explanation is omitted.

[0105] The simulation unit 20B calculates the output request value y(t) for each time t included in each 5-minute slot within the 4-hour test period by repeating the calculation of equations (1) to (5), or equations (1) to (4) and (6) for each time t from t0 to t0+4.

[0106] Specifically, the simulation unit 20B calculates the customer's predicted power demand D(t) for each time t, which is calculated from the power received value d(t) represented by the customer's past power received data. Then, the simulation unit 2B0 calculates the output request value y(t) to the power reduction resources in order to adjust the power reduction resources so that the customer's predicted power demand D(t) becomes the target power received amount target(t).

[0107] Through these processes, the simulation unit 20B calculates the difference between the customer's predicted power demand D(t) and the target power received amount target(t) as the output request value y(t). Furthermore, if the predicted power demand D(t) is less than the target power received amount target(t), the simulation unit 20B does not adjust the power reduction resources, i.e., calculates the output request value y(t) as zero. Also, if the target power received amount target(t) is too small, the simulation unit 20B calculates the maximum output that the power reduction resources can output as the output request value y(t).

[0108] The simulation unit 20B then calculates the predicted power received value m(t) when the consumer adjusts their power reduction resources to produce the calculated output request value y(t) for each time t. The predicted power received value m(t) is the predicted power received value for the consumer when the consumer adjusts their power reduction resources, which are represented by resource information, to produce the output request value y(t).

[0109] The simulation unit 20B calculates the predicted power received value m(t) at each time t using the following equation (7).

[0110] m(t) = d(t) - y(t) ... Equation (7)

[0111] The simulation unit 20B then calculates the occupancy rate for each test day and test content, which is the percentage of time t when the predicted received power value m(t) is within ±10% of the target received power amount target(t). The simulation unit 20B then calculates the percentage of test days with a occupancy rate of 100% among multiple test days as the test success rate for each test content.

[0112] Specifically, the lower limit l(t) of the predicted power received value m(t) is expressed by the following equation (8). Furthermore, the upper limit u(t) of the predicted power received value m(t) is expressed by the following equation (9).

[0113] l(t)=b(t) / 5-R+0.1×A...Equation (8) u(t)=b(t) / 5-R-0.1×A...Equation (9)

[0114] In equations (8) and (9), A represents the amount available for supply. In equations (8) and (9), R and b(t) are the same as above.

[0115] As mentioned above, the command value R may change depending on the type of test. In the case of a test where the command value R changes, the lower and upper limits of the stay rate corresponding to the type of test should be used as the lower limit l(t) and upper limit u(t) respectively.

[0116] The simulation unit 20B then determines whether the following equation (10) is satisfied. Based on this determination, the simulation unit 20B determines whether the predicted power received value is within ±10% of the target power received value for each slot included in the 4-hour test period. Equation (10) shows the formula when the test success rate is determined every 5 minutes from time t0 to time t0+4 as the unit time.

[0117]

number

[0118] The simulation unit 20B then calculates the stay rate for each test day, which is the percentage of the multiple slots included in the test day that satisfy the above formula (10). The simulation unit 20B then calculates the percentage of test days with a stay rate of 100% among the multiple test days as the test success rate for each test content.

[0119] Furthermore, the simulation unit 20B calculates an integrated test success rate for each test day by combining the test success rates for each test content. For example, the simulation unit 20B calculates the overall test success rate by multiplying the individual test success rates of multiple types of test content.

[0120] The above explanation assumes that a unit time of 5 minutes is used and that the judgment in equation (10) above is made for each 5-minute slot. However, if the control delay time is less than 4 minutes, it is possible to issue commands to the customer at shorter intervals of less than 5 minutes. In this case, it is possible to modify the command value R within the unit time of 5 minutes.

[0121] Therefore, if the control delay time is less than 4 minutes, the simulation unit 20B replaces the predicted demand power D(t) in equation (3) with a predicted value based on the latest demand value. Furthermore, for the output request value y(t) for each time t in equation (3) for which the actual value of the received power has already been obtained, the simulation unit 20B should replace the actual value with the actual reduction. Then, the simulation unit 20B should perform the same processing as above using the replaced equation (3).

[0122] We will explain the output request value y(t) in the case where the control delay time is less than 4 minutes and commands can be issued to the customer at short intervals of less than 5 minutes, using a specific example.

[0123] Figure 4 is an explanatory diagram illustrating an example of calculating the output request value y(t) when the control delay time is less than 4 minutes and commands can be issued to the customer at short intervals of less than 5 minutes.

[0124] For example, let's consider a scenario where the power reduction resource available to the customer is a generator. We will also assume that the generator's maximum output is 200kW and its output change rate is 100kW, and we will explain the scenario in which we calculate the output request value y(t) for each time t from 15:01 to 15:05. Furthermore, we will consider a scenario in which the predicted power demand D(t) for time t is 1200kW, and the customer's target power received, target(t), which is the value obtained by subtracting the command value R from the reference power, is 1000kW.

[0125] First, let's assume a control delay time of 4 minutes or more. In this case, as shown in (1) in Figure 4, the simulation unit 20B calculates the output request value y(t) for each time t by subtracting the target received power amount target(t) from the predicted demand power D(t). Specifically, as shown in (1) in Figure 4, the simulation unit 20B calculates 200 kW per minute as the output request value y(t).

[0126] Let's also consider the case where the control delay time is 3 minutes. In this case, as shown in (2) in Figure 4, the simulation unit 20B adjusts the output request value y(t) at the stage when the received power value at the initial time 15:01 is obtained, that is, at the time 15:04, which is 3 minutes later, the control delay time. More specifically, since the control cannot keep up for the first 4 minutes (times x1 to x4), the simulation unit 20B calculates the output request value y(t) in the same way as in (1) in Figure 4. Then, the simulation unit 20B adjusts the output request value y(t) at the time x5, which is the last minute.

[0127] Specifically, the actual power received value d(t) at time x1 (the first minute) is 897kW. In this case, the consumer has reduced the power received by 103kW, which is the result of subtracting the power received value d(t) 897kW from the target power received amount target(t) 1000kW. Therefore, the simulation unit 20B needs to adjust for this by 103kW at time x5 (the last minute). However, as mentioned above, the generator's output change rate is 100kW. So, the simulation unit 20B adjusts the output request value y(t) at time x5 (the last minute) to 100kW.

[0128] Let's also consider the case where the control delay time is 2 minutes. In this case, the simulation unit 20B calculates the same output request value y(t) as in (1) and (2) in Figure 4 for the first 3 minutes (times x1 to x3), as shown in (3) in Figure 4. Then, the simulation unit 20B adjusts the output request value y(t) at the last 2 minutes, time x4 and time x5.

[0129] Specifically, at time x4, a received power value of 897kW is obtained. Therefore, the simulation unit 20B adjusts the output request value y(t) at time x4 to 100kW, similar to (2) in Figure 4. Then, at time x5, a received power value of 897kW and 960kW are obtained. Thus, in this case, the consumer reduced the received power too much by 143kW in the first two minutes. Also, as shown in (3) in Figure 4, consumer B adjusts the output request value y(t) to 100kW at time x4. Therefore, the simulation unit 20B adjusts the output request value y(t) at time x5 to the remaining 43kW. In other words, assuming an output change rate of 100kW, the simulation unit 20B can adjust the output request value in each 5-minute slot by a total of up to 300kW.

[0130] It is assumed that the entry test is an entry test concerning adjustment capacity defined in Tertiary Adjustment Capacity 1, one of the products handled in Japan's supply and demand adjustment market. The "1" in Tertiary Adjustment Capacity 1 is actually represented by a circled character. In Tertiary Adjustment Capacity 1, the unit time, or slot, is defined as 1 minute. When the slot is 1 minute, the simulation unit 20B should calculate the output request value y(t) of the customer at time t0 every minute, and also calculate the test success rate every minute. Similarly, when a slot other than 1 minute is used, the part of the above process from time t0 to t0+4 should be replaced with the length of time corresponding to the slot and the simulation should be performed.

[0131] Returning to Figure 1, we continue the explanation.

[0132] The output control unit 20C outputs the simulation results from the simulation unit 20B. For example, the simulation unit 20B outputs the simulation results to the display unit 16. The simulation unit 20B may also store the simulation results in the storage unit 18. Alternatively, the simulation unit 20B may transmit the simulation results to an external information processing device via the communication unit 12.

[0133] In this embodiment, the output control unit 20C will be described as an example of a configuration in which it displays the simulation results from the simulation unit 20B on the display unit 16.

[0134] Figure 5 is a schematic diagram showing an example of the output screen 40 of the simulation results.

[0135] The simulation results include at least the test success rate. The output control unit 20C displays the output screen 40 of the simulation results, including the test success rate calculated by the simulation unit 20B, on the display unit 16.

[0136] Furthermore, the output control unit 20C may identify the optimal test implementation date by selecting a predetermined number of test days corresponding to the highest occupancy rate among the occupancy rates calculated for each of the multiple test days. The output control unit 20C may then output a simulation result that includes the identified optimal test implementation date. Note that this process of identifying the optimal test implementation date may be performed by the simulation unit 20B.

[0137] Furthermore, the output control unit 20C may output simulation results that also include the test condition information used in the simulation.

[0138] Figure 5 shows an example of a simulation result output screen 40 that includes information representing test conditions and test results. The test conditions included in the output screen 40 include at least some of the information included in the test condition information entered via the input screen 30. The test results include at least the test success rate. Figure 5 shows an example of a simulation result output screen 40 that includes the test success rate for each type of test content, and the overall test success rate which is an integrated test success rate.

[0139] Furthermore, Figure 5 shows the output screen 40 of the simulation results, which includes the condition values ​​for each of the multiple items included in the test conditions that maximize or near-maximize the test success rate, as the optimal conditions. Specifically, Figure 5 shows the condition values ​​for each of the following items as the optimal conditions that maximize the test success rate: test time period, reference value method, bias value, and available quantity.

[0140] The output control unit 20C should output the optimal conditions to the display unit 16 by outputting test condition information such as the test time period, reference value method, and available supply amount used in the simulation of the test day with the highest occupancy rate.

[0141] The output control unit 20C outputs the simulation results, making it easy to provide the user with the simulation results from the simulation unit 20B.

[0142] Furthermore, customers or representatives of aggregators who select customers can easily check the simulation results regarding the entry test into the supply and demand adjustment market by viewing the output screen 40 of the simulation results.

[0143] Next, an example of the information processing flow executed by the information processing device 10 of this embodiment will be described.

[0144] Figure 6 is a flowchart showing an example of the information processing flow performed by the information processing device 10 of this embodiment.

[0145] The reception unit 20A receives past power reception data from the customer (step S100). The reception unit 20A also receives test condition information (step S102).

[0146] Next, the reception unit 20A identifies excluded dates from the test dates represented by the test date information included in the test condition information that are not to be included in the simulation (step S104).

[0147] Then, the simulation unit 20B repeats the processing in steps S106 to S114 for each type of test content included in the test condition information received in step S102. In addition, the simulation unit 20B repeats the processing in steps S106 to S112 for each of the multiple test dates, excluding the specified exclusion date, from among the multiple test dates indicated by the test date information included in the test condition information received in step S102.

[0148] In detail, the simulation unit 20B uses the reference value method included in the test condition information received in step S102 to calculate the reference power b(t) for each time t included in the unit time of the test period on the test day to be processed (step S106).

[0149] Next, the simulation unit 20B uses the test condition information received in step S102 and the reference power value b(t) for each time t calculated in step S106 to calculate the target power received amount target(t) for each time t included in the unit time of the test period on the test day to be processed (step S108).

[0150] Then, the simulation unit 20B executes a simulation to adjust the power reduction resources so that the power received value d(t) for each time t included in the unit time (slot) of the test time period on the test day to be processed, which is included in the power received data received in step S100, becomes the target power received amount target(t) calculated in step S108 (step S110).

[0151] The simulation unit 20B calculates the occupancy rate for the test day to be processed by the processing in step S110 (step S112). The simulation unit 20B determines whether the above formula (10) is satisfied, and for each slot, it determines whether the predicted power received value of each slot is within ±10% of the target power received amount. The simulation unit 20B then calculates the occupancy rate, which is the percentage of each of the multiple slots included in the test day to be processed that satisfies the above formula (10).

[0152] The simulation unit 20B calculates the stay rate for each of the multiple test days indicated by the test date information included in the test condition information received in step S102, by repeating the processing in steps S106 to S112.

[0153] Then, the simulation unit 20B calculates the percentage of test days with a 100% stay rate among multiple test days as the success rate of the test content for the type of test being processed (step S114).

[0154] Furthermore, the simulation unit 20B calculates the success rate for each type of test content by repeating the process from steps S106 to S114 for each type of test content included in the test condition information.

[0155] Next, the simulation unit 20B calculates an overall test success rate by integrating the test success rates calculated for each of the multiple test contents (step S116). For example, the simulation unit 20B calculates the overall test success rate by multiplying the test success rates calculated for each type of test contents.

[0156] Next, the output control unit 20C outputs the simulation results, including the test success rate calculated in step S114 and the overall test success rate calculated in step S116, to the display unit 16 (step S118). Then, this routine ends.

[0157] Next, an example of an embodiment of the information processing device 10 of this embodiment will be described.

[0158] In this embodiment, we will explain assuming that the available supply capacity is 2000 kW. Figure 7 is a schematic diagram showing an example of the simulation results of an entry test for a certain test day. Figure 7 shows an example of the calculation results for each value for each slot starting from time 2:00.

[0159] In Figure 7, 'time' represents the time of day, specifically the start time of each slot, which is in 5-minute increments. 'b(s)' represents the average reference power value for each slot. 'A' represents the available power for each slot. 'R(s)' represents the commanded power value for each slot.

[0160] `target(s)` represents the target power received for each slot. `target(s)` is calculated using the formula `b(s)-A`.

[0161] l(s) represents the lower limit of the predicted power received for each slot. u(s) represents the upper limit of the predicted power received for each slot. l(s) is calculated as target(s)-0.1A. u(s) is calculated as target(s)+0.1A.

[0162] d(s) represents the average power received per slot. gen(s) represents the amount of power generation requested from power reduction resources for each slot. gen(s) can be calculated using values ​​such as d(s). In practice, gen(s) is determined by the processing at each time step t. Figure 7 shows the average value over a 5-minute period, which is the unit time for a slot.

[0163] m(s) represents the predicted power received for each slot. m(s) is calculated by d(s) - gen(s).

[0164] Error(s) represents the difference between the power received value d(s) for each slot when the customer complies with the output request and the target power received amount target(s).

[0165] res(s) represents the success / failure result for each slot. res(s) shows "0" if the predicted power received value m(s) for each slot, assuming the customer complies with the output request, is between l(s) and u(s), indicating success. res(s) shows "x" if the predicted power received value m(s) for each slot, assuming the customer complies with the output request, is outside the range of l(s) and u(s), indicating failure.

[0166] Note that in Figure 7, the unit for items other than time is kW. In Figure 7, the percentage of slots where res(s) is "0" during the 4-hour period from 2:00 to 6:00 represents the occupancy rate for this test day. The simulation unit 20B then calculates the test success rate as the percentage of test days with a 100% occupancy rate among the multiple test days within the test period represented by the test day information.

[0167] If the simulation results shown in Figure 7 are obtained, the output control unit 20C outputs the simulation results to the display unit 16.

[0168] For example, the output control unit 20C may output a simulation result screen 42 representing the dwell time for each test day for each type of test content to the display unit 16, as shown in Figures 8A to 8C. Output screen 42 is an example of output screen 40.

[0169] Figure 8A is a schematic diagram of an example of output screen 42A showing the simulation results of the stay rate for each test day for test a. Figure 8B is a schematic diagram of an example of output screen 42B showing the simulation results of the stay rate for each test day for test b. Figure 8C is a schematic diagram of an example of output screen 42C showing the simulation results of the stay rate for each test day for test c. Output screens 42A, 42B, and 42C are examples of output screen 42.

[0170] The output control unit 20C may also output a list of information on the display unit 16, which shows the calculation results of the dwell time for each test day for each type of test content.

[0171] Figure 9 is a schematic diagram of an example of the output screen 44. The output screen 44 is an example of the output screen 40. In Figure 9, date indicates the test date. max indicates the stay rate for test a. change370 represents the stay rate for test b. zeros represents the stay rate for test c. As shown in Figure 9, the output control unit 20C may output an output screen 44 to the display unit 16, which is a list of information showing the calculation results of the stay rate for each test day for each type of test content.

[0172] Furthermore, the simulation unit 20B or the output control unit 20C may further calculate the success rate for each type of test content by calculating the percentage of test days with a 100% stay rate among multiple test days for each type of test content shown in Figure 9. The output control unit 20C may then output the calculated success rate to the display unit 16. The output control unit 20C may also output to the display unit 16 an overall success rate, which is the sum of the success rates of multiple types of test content, and an average success rate, which is the average of the success rates of multiple types of test content.

[0173] Figure 10 is a schematic diagram of an example of an output screen 46. Output screen 46 is an example of output screen 40. As shown in Figure 10, the output control unit 20C may output an output screen 46 to the display unit 16 that includes the test success rate and average stay rate for each of the multiple types of test contents, and an overall test success rate and average stay rate or average success rate which is an integrated result of the test success rates of the multiple types of test contents.

[0174] Furthermore, as shown in Figure 10, the output control unit 20C may output an output screen 46, which further includes the test conditions, to the display unit 16.

[0175] As described above, the information processing device 10 of this embodiment includes a simulation unit 20B. The simulation unit 20B performs a simulation of an entry test based on test conditions represented by test condition information, which represents the test conditions for market entry testing, based on the actual data of customers, and calculates simulation results including the test success rate.

[0176] In trials to enter the supply and demand adjustment market, tests are conducted under various test conditions. However, conventional technology has not offered any proposals for providing simulation results tailored to the test conditions.

[0177] On the other hand, the information processing device 10 of this embodiment performs a simulation of an entry test based on test conditions represented by test condition information, which represents the test conditions for market entry testing, based on the customer's actual data, and calculates simulation results including the test success rate.

[0178] Therefore, the information processing device 10 of this embodiment can provide simulation results according to the test conditions of the entry examination.

[0179] Furthermore, in the information processing device 10 of this embodiment, the output control unit 20C outputs simulation results including the test success rate.

[0180] Therefore, users of the information processing device 10 can easily check the success rate of the test.

[0181] Users of the information processing device 10 include, for example, consumers who wish to enter the supply and demand adjustment market, and aggregators who wish to select consumers to participate in the supply and demand adjustment market.

[0182] If the user is a customer, the information processing device 10 of this embodiment allows the customer to check the success rate of the test in advance. Furthermore, by checking the dwell time for each test day included in the simulation results, the customer can determine in advance which test day is the optimal test day.

[0183] If the user is an aggregator, the information processing device 10 of this embodiment allows the aggregator to check in advance the success rate of the tests of the target customer for simulation. Furthermore, by checking the dwell time for each test day included in the simulation results, the aggregator can determine in advance which test day is the optimal test day.

[0184] Furthermore, in the information processing device 10 of this embodiment, the simulation unit 20B calculates the dwell rate for each of the multiple types of test contents, which is the percentage of the multiple test days within the test period in which the predicted power received value is within ±10% of the target power received value. For each of the multiple types of test contents, the simulation unit 20B calculates the percentage of test days within the multiple test days within the test period in which the dwell rate is 100% as the test success rate.

[0185] Therefore, the information processing device 10 of this embodiment can calculate the test success rate with high accuracy.

[0186] Furthermore, the information processing device 10 of this embodiment calculates a lower test success rate for customers whose predicted power received values ​​deviate from a predetermined upper and lower limit range. Therefore, the information processing device 10 of this embodiment can easily provide a lower test success rate for customers with large fluctuations in demand (power received values).

[0187] (Second embodiment) In the above embodiment, a configuration was described as one in which test condition information in which one type of condition value is defined for each of the multiple items included in the test conditions is received and a simulation is performed. In this embodiment, a configuration is described in which multiple types of condition values ​​are input for each of the multiple items included in the test conditions, and a simulation is performed for each of the multiple pieces of test condition information with different combinations of condition values.

[0188] Note that the same reference numerals may be used for functional components identical to those in the above embodiment, and detailed descriptions may be omitted.

[0189] Figure 1 shows an example of the functional configuration of the information processing device 10B in this embodiment. The information processing device 10B includes a control unit 22 instead of the control unit 20 of the information processing device 10 in the above embodiment. The control unit 22 includes a receiving unit 22A, a simulation unit 22B, and an output control unit 22C. In other words, in this embodiment, the control unit 22 includes a receiving unit 22A, a simulation unit 22B, and an output control unit 22C, respectively, instead of the receiving unit 20A, simulation unit 20B, and output control unit 20C of the above embodiment.

[0190] The reception unit 22A receives past power reception data and test condition information from the customer, similar to the reception unit 20A in the above embodiment. In this embodiment, the reception unit 22A further receives input of multiple types of condition values ​​for each of the multiple items included in the test conditions.

[0191] For example, the output control unit 22C displays an input screen 30 for test condition information on the display unit 16, which allows setting and inputting multiple types of condition values ​​for each item included in the test conditions. Items included in the test conditions include, for example, the test time period, excluded days, available power supply amount, reference value method, bias width of the reference power calculated by the reference value method, amount of reduction of available power supply, and each item included in the power reduction resource.

[0192] In detail, for example, the output control unit 22C displays one or more of several time periods as selectable condition values ​​for the test time period. Specifically, for example, the output control unit 22C displays one or more of four condition values ​​for time periods such as 9:00-12:00, 12:00-15:00, 15:00-18:00, and 18:00-21:00.

[0193] Furthermore, for example, the output control unit 22C displays one or more of the multiple types of exclusion dates as selectable condition values ​​for exclusion dates. Specifically, for example, the output control unit 20C displays one or more of the multiple types of exclusion date condition values, such as "excluding days with a negative baseline value" and "weekdays only."

[0194] Furthermore, for example, the output control unit 22C displays one or more of the multiple types of reference value methods as selectable condition values ​​for the reference value method. Specifically, for example, the output control unit 20C displays one or more of the four types of condition values ​​for the reference value method, such as High4 or 5 (with adjustment on the day), High4 or 5 (without adjustment on the day), equivalent day adoption method, and pre- and post-method.

[0195] Furthermore, for example, the output control unit 22C displays one or more of several types of bias widths as multiple condition values ​​for the bias width of the reference power value. Specifically, for example, the output control unit 20C displays one or more of four types of bias width condition values, such as 0%, 5%, 10%, and 15%, as selectable options.

[0196] Furthermore, for example, the output control unit 22C displays one or more selectable condition values ​​from among several types of suppression amounts for the amount of supplyable. Specifically, for example, the output control unit 20C displays one or more selectable condition values ​​from among five types of suppression amounts, such as 80%, 85%, 90%, 95%, and 100%.

[0197] The reception unit 22A then accepts one or more types of conditional values ​​for each of the multiple items, selected by the user's operational instructions for the input unit 14.

[0198] The simulation unit 22B generates multiple test condition information sets, each with a different combination of condition values ​​for each of the multiple items received. In other words, the simulation unit 22B generates multiple test condition information sets, each with a different combination of condition values ​​for each of the multiple items included in the test conditions.

[0199] For example, consider a scenario where the reception unit 22A receives input of four different condition values ​​for different time periods, as multiple types of condition values ​​for the test time period. Also, consider a scenario where the reception unit 22A receives input of four different condition values ​​for different reference value methods, as multiple types of condition values ​​for the reference value method. Furthermore, consider a scenario where the reception unit 22A receives input of four different bias widths, as multiple types of condition values ​​for the bias width of the reference power. Finally, consider a scenario where the reception unit 22A receives input of five different suppression amounts, as multiple types of condition values ​​for the suppression amount of the available supply. In this case, the simulation unit 22B generates 320 different test condition information results, which are obtained by calculating 4 × 4 × 4 × 5.

[0200] The simulation unit 22B then performs a simulation for each of the multiple test condition information, similar to the simulation unit 20B in the above embodiment. Through the execution of the simulation, the simulation unit 22B calculates the stay rate, test success rate, overall test success rate, and average test success rate for each of the multiple test condition information. The average test success rate represents the average value of the test success rates for each of the multiple types of test content.

[0201] In this embodiment, the simulation unit 22B further identifies test condition information for combinations of condition values ​​that maximize or near-maximize the test success rate or overall test success rate. Alternatively, the simulation unit 22B may identify test condition information that maximizes or near-maximizes the test success rate or overall test success rate using heuristic methods such as a genetic algorithm, simulated annealing, or Bayesian optimization, without searching for all test condition information with different combinations of condition values.

[0202] The simulation unit 22B may also identify test condition information for a combination of condition values ​​that maximizes or near-maximizes at least one of the following: stay rate, test success rate, overall test success rate, and average test success rate.

[0203] Furthermore, the simulation unit 22B may identify a predetermined number of test condition information in descending order of at least one of the following: stay rate, test success rate, overall test success rate, and average test success rate. The predetermined number is, for example, an integer of 1, 2, or 3 or more. This number may be changed as appropriate by user instructions for operation of the input unit 14.

[0204] The simulation unit 22B then calculates a simulation result that further includes the identified test condition information and at least one of the following: the stay rate, the test success rate, the overall test success rate, and the average test success rate, calculated by the simulation using the identified test condition information.

[0205] The output control unit 22C is the same as the output control unit 20C, except that it outputs the simulation results calculated by the simulation unit 22B instead of the simulation unit 20B.

[0206] Next, an example of the information processing flow executed by the information processing device 10B of this embodiment will be described.

[0207] Figure 11 is a flowchart showing an example of the information processing flow performed by the information processing device 10B of this embodiment.

[0208] The reception unit 22A receives past power reception data from the customer (step S200). The reception unit 22A also receives test condition information, which includes multiple types of condition values ​​for each item (step S202).

[0209] The simulation unit 22B generates multiple test condition information sets, each with a different combination of condition values ​​for each of the multiple items received in step S202 (step S204). In other words, the simulation unit 22B generates multiple test condition information sets, each with a different combination of condition values ​​for each of the multiple items included in the test conditions.

[0210] Next, the reception unit 22A identifies, for each test condition information generated in step S204, the excluded dates from the test dates represented by the test date information included in the test condition information that are to be excluded from the simulation (step S206).

[0211] Then, the simulation unit 22B executes the processes of steps S208 to S218 for each of the multiple test condition information generated in step S204. The simulation unit 22B also repeats the processes of steps S208 to S216 for each type of test content included in the test condition information to be processed. Furthermore, the simulation unit 22B repeats the processes of steps S208 to S214 for each of the multiple test dates, excluding the specified exclusion date, from among the multiple test dates indicated by the test date information included in the test condition information to be processed.

[0212] Steps S208 to S214, S216, and S218 are the same as steps S106 to S112, S114, and S116, respectively (see Figure 6).

[0213] Then, the simulation unit 22B identifies test condition information for a combination of condition values ​​that maximizes the success rate of the test (step S220).

[0214] Next, the output control unit 22C outputs the simulation results to the display unit 16 (step S222), which include the test success rate calculated in step S216, the overall test success rate calculated in step S218, and test condition information for the combination of condition values ​​that maximizes the test success rate identified in step S220. Then, this routine ends.

[0215] As described above, in the information processing device 10B of this embodiment, the reception unit 22A further receives multiple types of condition values ​​for each of the multiple items included in the test conditions. The simulation unit 22B performs a simulation for each of the multiple test condition information sets, each of which has a different combination of condition values ​​for each of the multiple items.

[0216] Therefore, the information processing device 10B of this embodiment can calculate simulation results, including the success rate of the test, for each of the multiple test condition information sets, which have different combinations of condition values ​​for each of the multiple items included in the test conditions.

[0217] Therefore, in addition to the effects of the above embodiment, the information processing device 10B of this embodiment can provide simulation results according to various test conditions.

[0218] Furthermore, the simulation unit 22B of the information processing device 10B in this embodiment identifies test condition information for a combination of condition values ​​that maximizes the test success rate, and calculates a simulation result that further includes the identified test condition information and the test success rate calculated by simulation using the identified test condition information. The output control unit 22C then outputs the simulation result.

[0219] Therefore, the information processing device 10B of this embodiment can provide test condition information that represents the optimal combination of condition values ​​that yields a high success rate among the condition values ​​for each of the multiple items included in the test conditions.

[0220] Furthermore, the items included in the test conditions are, for example, the test time period, excluded days, available supply amount, reference value method, bias width of the reference value power calculated by the reference value method, amount of reduction in available supply amount, and each item included in the power reduction resources.

[0221] The available supply quantity is the value that defines the upper limit of the bid quantity in the supply and demand adjustment market. Therefore, increasing the available supply quantity leads to increased incentives for consumers and aggregators to acquire power. Furthermore, increasing the available supply quantity leads to an expansion of the upper and lower limits for determining the success rate of the test, thus contributing to an increase in the success rate of the test. On the other hand, if the available supply quantity is set too high, there is a risk that the target amount of electricity received cannot be achieved even if power reduction adjustment resources are utilized to the fullest extent in the aforementioned test a, where the baseline power is low. Therefore, setting an appropriate available supply quantity is important for increasing the success rate of the test.

[0222] In this embodiment, the information processing device 10B provides test condition information that represents the optimal condition value for the supplyable quantity, which is an example of an item included in the test conditions, from among multiple types of condition values ​​for the supplyable quantity, with a high test success rate. Therefore, the information processing device 10B of this embodiment can provide the optimal supplyable quantity with a high test success rate. In other words, the information processing device 10B of this embodiment can provide information that can improve the test success rate of the actual entry test.

[0223] Here, selecting an appropriate baseline method and, if necessary, biasing the baseline power in the positive or negative direction is a crucial factor in improving the test success rate. Specifically, if a baseline method that easily derives a low baseline power is used, the risk of failure in test a increases. Furthermore, consider the case where a resource that only reduces the consumer's received power value d(t), such as a generator, is used as the power reduction resource. In this case, if a baseline method that easily derives a high baseline power is used, the target received power value in test c will be too high, reducing the test success rate. Therefore, selecting an appropriate baseline method and, if necessary, biasing the baseline power in the positive or negative direction is a crucial factor in increasing the test success rate.

[0224] In this embodiment, the information processing device 10B provides test condition information that represents the optimal condition value for a high test success rate from among multiple types of condition values ​​for each of the reference value method and the bias width of the reference value power, which are examples of items included in the test conditions. Therefore, the information processing device 10B of this embodiment can provide the optimal reference value method and bias width for a high test success rate. In other words, the information processing device 10B of this embodiment can provide information that can improve the test success rate of the actual entry test.

[0225] (Third embodiment) In the above embodiment, a configuration in which simulations are performed for each individual customer was described as an example. In this embodiment, a configuration in which simulations are performed for each of several groups of customers, each consisting of a different combination of customers, will be described.

[0226] Note that the same reference numerals may be used for functional components identical to those in the above embodiment, and detailed descriptions may be omitted.

[0227] Figure 1 shows an example of the functional configuration of the information processing device 10C in this embodiment. The information processing device 10C includes a control unit 24 in place of the control unit 20 of the information processing device 10 in the above embodiment. The control unit 24 includes a reception unit 24A, a simulation unit 24B, and an output control unit 24C. In other words, in this embodiment, the control unit 24 includes a reception unit 24A, a simulation unit 24B, and an output control unit 24C in place of the reception unit 20A, simulation unit 20B, and output control unit 20C of the above embodiment.

[0228] The reception unit 24A receives past power reception data and test condition information from customers, similar to the reception unit 20A in the above embodiment. In this embodiment, the reception unit 24A receives power reception data and test condition information for each of multiple customers.

[0229] Furthermore, the reception unit 24A may accept common condition values ​​among multiple customers for some of the items included in the test condition information.

[0230] Figure 12 is a schematic diagram of an example of the input screen 33 for test condition information. For example, the output control unit 24C displays the input screen 32 on the display unit 16. The user inputs test condition information for each of multiple customers by operating the input unit 14 while viewing the input screen 32.

[0231] The input field for the test period included in input screen 32 is the same as that of input screen 30 in Figure 3. The input field for the test period included in input screen 32 is used to enter condition values ​​common to multiple customers.

[0232] Furthermore, the input screen 32 shows three examples of customers: Factory A, Factory B, and Business Office C. As shown in Figure 12, the input screen 32 provides input or selection fields for condition values ​​for each item, such as test date, test time period, standard value method, and energy reduction resources, for each customer. The user inputs test condition information for each of the multiple customers by operating the input unit 14 while viewing the input screen 32.

[0233] Furthermore, the input screen 32 is provided with checkboxes for selecting customers that must be included in the customer group combination. By operating the input unit 14 and checking these checkboxes, the user can select customers that must be included in the customer group combination. Figure 12 shows an example where Factory A and Business Office C have been selected as customers that must be included in the customer group combination.

[0234] As shown in Figure 12, the input field for test details may be an input field for entering common condition values ​​among multiple consumers. For the available supply amount, the reception unit 24A or the user should specify a value obtained by multiplying the sum of the output values ​​of each consumer's power reduction resources by the supply rate. Note that depending on the rules of the power supply and demand market, a minimum available supply amount such as 1 MW may be set. In this case, the reception unit 24A or the user should specify the predetermined minimum available supply amount as the available supply amount.

[0235] Furthermore, when the control unit 24 performs the process of identifying test condition information for a combination of condition values ​​that has a high test success rate as described in the second embodiment above, the reception unit 24A may specify the available supply quantity included in the test condition information with the highest test success rate. In addition, a minimum bid quantity such as 1MW may be predetermined for a group of consumers formed by a combination of multiple consumers. In this case, the reception unit 24A or the user may specify a value equal to or greater than the minimum bid quantity as the available supply quantity. The reception unit 24A then accepts the specified available supply quantity as the available supply quantity to be used in the simulation.

[0236] The reference power value will now be explained. In this embodiment, the simulation unit 24B may use the sum of the generator outputs of each of the multiple consumers constituting the consumer group as the reference power value for the consumer group. The reference value method included in the test condition information input for each consumer may be the same or different among consumers. Furthermore, when biasing the overall reference power value for multiple consumer groups in the positive or negative direction, the simulation unit 24B may perform the bias by multiplying the reference power value for the consumer group by a certain ratio, or by increasing or decreasing it by a certain ratio of the total available capacity of all consumers belonging to the consumer group.

[0237] The test time period will now be explained. In this embodiment, it is necessary to define the same test time period among multiple consumers belonging to a consumer group. For this reason, the simulation unit 24B only needs to define the common test date and test time period received by the reception unit 24A for each of the multiple consumers constituting the consumer group, for each consumer consisting of multiple consumers with different combinations. Furthermore, for consumers among the multiple consumers constituting the consumer group for whom a different test date and test time period have been defined from the other consumers, the simulation unit 24B may perform the simulation as a consumer for which power reduction resources cannot be adjusted.

[0238] The simulation unit 24B generates multiple customer groups, each consisting of a group of customers with different combinations.

[0239] The simulation unit 24B then performs a simulation for each of the multiple customer groups, similar to the simulation unit 20B in the above embodiment. Through the simulation, the simulation unit 24B obtains the occupancy rate, test success rate, overall test success rate, and average test success rate for each of the multiple customer groups. The simulation unit 24B identifies the customer group that maximizes the test success rate and calculates simulation results that further include the identified customer group.

[0240] Furthermore, when finding the optimal group of consumers, if we consider all possible combinations of consumers, for N consumers, 2 N For each of the customer groups in the given combination, it is necessary to calculate simulation results including the test success rate. Therefore, the larger the value of N, the greater the processing load on the simulation unit 24B. For example, the simulation unit 24B calculates the overall test success rate for each of the multiple customers in the same manner as in the above embodiment. The simulation unit 24B may then generate multiple customer groups with different combinations for Q customers in descending order of overall test success rate. Q is an integer of 2 or more and can be predetermined. Through these processes, the simulation unit 24B can reduce the number of customer groups to be simulated and reduce the processing load.

[0241] Furthermore, the simulation unit 24B may selectively search for only a subset of the multiple customer groups using heuristic methods such as simulated annealing, genetic algorithms, or Bayesian optimization.

[0242] Furthermore, if a minimum bid amount is given as a constraint, the simulation unit 24B may exclude groups of consumers whose total output of power reduction resources falls below the minimum inflow / outflow amount from the simulation.

[0243] The simulation unit 24B may also identify a group of customers whose combination maximizes or near-maximizes at least one of the following: dwell time, test success rate, overall test success rate, and average test success rate.

[0244] Furthermore, the simulation unit 24B may identify a predetermined number of customer groups in descending order of the highest occupancy rate, test success rate, overall test success rate, and average test success rate. The predetermined number is, for example, an integer of 1, 2, or 3 or more. This number may be changed as appropriate by user instructions for operation of the input unit 14.

[0245] The simulation unit 24B then calculates simulation results that further include the identified customer group and at least one of the following: the dwell time, the test success rate, the overall test success rate, and the average test success rate, which are calculated for the identified customer group through simulation.

[0246] The output control unit 24C is the same as the output control unit 20C, except that it outputs the simulation results calculated by the simulation unit 24B instead of the simulation unit 20B.

[0247] Figure 13 is a schematic diagram of an example of the output screen 48. For example, the output control unit 24C displays the output screen 48 of the simulation results shown in Figure 13 on the display unit 16. The output screen 48 is an example of the output screen 40.

[0248] In this embodiment, the simulation unit 24B uses a different calculation method than that used in the above embodiment to calculate the output request value y(t) at time t for each of the multiple consumers included in the consumer group.

[0249] The simulation unit 24B of this embodiment calculates, for example, the output request value y(t,k) for each time t of each customer k included in the customer group by the following process.

[0250] First, the simulation unit 24B calculates the maximum output M0[k] and minimum output m0[k] of the power reduction resource at time t for customer k, based on the output, output change rate, and received power value d(t-1) at time t-1.

[0251] Furthermore, the simulation unit 24B calculates the total minimum output B using the following formula (11).

[0252]

number

[0253] Then, if the following equation (12) is satisfied with respect to the reduction target value Y, the simulation unit 24B calculates the output request value y(t,k) at time t for the customer k that constitutes the customer group using equation (13).

[0254]

number

[0255] Furthermore, the simulation unit 24B executes equations (14) and (15) below in ascending order of m[k] / (rated output of the generator at k).

[0256]

number

[0257] By having the simulation unit 24B perform these processes, it is possible to calculate an output request value y(t,k) for customer k at time t that has the following three properties.

[0258] The relationship between the output at time t-1 and time t for each consumer will always be within the range of the output change rate. ·Σ k The goal is to bring y(t,k) as close as possible to the reduction target value Y. • Do not set the output of each customer at time t to 0 or maximum output.

[0259] By satisfying the third property described above, "the output of each consumer at time t is not set to 0 or maximum output," the simulation unit 24B can adjust the output of the power reduction resources in either the upward or downward direction at the next time. Therefore, the simulation unit 24B can increase the degree of freedom of the total output at the next time.

[0260] Here, we have described methods expressed by equations (11) to (15), but other methods may be used to calculate the output requirement value having the three properties described above. For example, one could define indicators such as the degree of deviation of the difference in output rate of change of each consumer's output from the range, the proximity to the reduction target amount Y, and the distance of each consumer's output from 0 or the maximum output, and use an exact optimization method or heuristic solution that minimizes the sum of these weights.

[0261] Figure 14 is a schematic diagram of an example of the output screen 50. The output screen 50 is an example of the output screen 40. For example, the output control unit 24C may display the simulation result output screen 50 shown in Figure 14 on the display unit 16. As shown in Figure 14, the output screen 50 may be an output screen that shows the calculation results of each value for each time period by the simulation, similar to the output screen 44 shown in Figure 9.

[0262] Next, an example of the information processing flow executed by the information processing device 10C of this embodiment will be described.

[0263] Figure 15 is a flowchart showing an example of the information processing flow performed by the information processing device 10C of this embodiment.

[0264] The reception unit 24A receives past power reception data for each of the multiple customers (step S300). The reception unit 24A also receives test condition information for each of the multiple customers (step S302).

[0265] The simulation unit 24B generates multiple customer groups consisting of multiple customers with different combinations for the multiple customers for which test condition information was received in step S302 (step S304).

[0266] Next, the reception unit 24A identifies excluded dates from the test dates represented by the test date information included in the test condition information that are not to be included in the simulation (step S306).

[0267] Then, for each of the plurality of customer groups generated in step S304, the simulation unit 24B executes the processes of steps S308 to S318. Also, the simulation unit 24B repeats the processes of steps S308 to S316 for each type of test content included in the test condition information for the processing target. Also, the simulation unit 24B repeats the processes of steps S308 to S314 for each of the plurality of test days other than the specified exclusion days among the plurality of test days indicated by the test day information included in the test condition information for the processing target.

[0268] Steps S308 to S314, step S316, and step S318 are the same as each of steps S106 to S112, step S114, and step S116 (see FIG. 6).

[0269] Then, the simulation unit 24B specifies a customer group of a combination of customers that maximizes the test success rate (step S320).

[0270] Next, the output control unit 24C outputs the simulation results including the test success rate calculated in step S316, the overall test success rate calculated in step S318, and the customer group of the combination of customers that maximizes the test success rate specified in step S320 to the display unit 16 (step S322). Then, this routine ends.

[0271] As described above, in the information processing apparatus 10C of the present embodiment, the reception unit 24A receives test condition information and power reception power data for each of the plurality of customers. The simulation unit 24B executes simulations for each of the plurality of customer groups composed of groups of a plurality of customers with different combinations, specifies a customer group that maximizes the test success rate, and calculates simulation results further including the specified customer group.

[0272] Therefore, the information processing apparatus 10C of the present embodiment can calculate simulation results including the test success rate for each of the plurality of customer groups with different combinations of customers.

[0273] Therefore, in addition to the effects of the above embodiment, the information processing device 10C of this embodiment can provide simulation results that further include information representing customer groups with a high success rate in testing.

[0274] Next, an example of the hardware configuration of the information processing device 10, information processing device 10B, and information processing device 10C of the above embodiment will be described.

[0275] Figure 16 is a hardware configuration diagram of an example of the information processing device 10, information processing device 10B, and information processing device 10C of the above embodiment.

[0276] The information processing devices 10, 10B, and 10C of the above embodiment have a CPU (Central Processing Unit) 81, ROM (Read Only Memory) 82, RAM (Random Access Memory) 83, and communication I / F 84, etc., interconnected by a bus 85, and have a hardware configuration that utilizes a normal computer.

[0277] The CPU 81 is an arithmetic unit that controls the information processing devices 10, 10B, and 10C of the above embodiment. The ROM 82 stores programs and the like that realize various processes performed by the CPU 81. Although a CPU is used in this explanation, a GPU (Graphics Processing Unit) may also be used as the arithmetic unit that controls the information processing devices 10, 10B, and 10C. The RAM 83 stores data necessary for various processes performed by the CPU 81. The communication I / F 84 is an interface for sending and receiving data.

[0278] In the information processing devices 10, 10B, and 10C of the above embodiment, the CPU 81 reads a program from ROM 82 onto RAM 83 and executes it, thereby realizing each of the above functions on the computer.

[0279] Furthermore, the programs for executing the above-described processes performed by the information processing device 10, information processing device 10B, and information processing device 10C in the above embodiment may be stored in an HDD (hard disk drive). Alternatively, the programs for executing the above-described processes performed by the information processing device 10, information processing device 10B, and information processing device 10C in the above embodiment may be pre-installed and provided in ROM 82.

[0280] Furthermore, the programs for executing the above-described processes performed by the information processing devices 10, 10B, and 10C of the above-described embodiment may be stored in an installable or executable file format on a computer-readable storage medium such as a CD-ROM, CD-R, memory card, DVD (Digital Versatile Disk), or flexible disk (FD), and provided as a computer program product. Alternatively, the programs for executing the above-described processes performed by the information processing devices 10, 10B, and 10C of the above-described embodiment may be stored on a computer connected to a network such as the Internet and provided by allowing download via the network. Alternatively, the programs for executing the above-described processes performed by the information processing devices 10, 10B, and 10C of the above-described embodiment may be provided or distributed via a network such as the Internet.

[0281] Although embodiments of the present invention have been described above, these embodiments are presented as examples only and are not intended to limit the scope of the invention. This novel embodiment can be implemented in various other forms, and various omissions, substitutions, and modifications can be made without departing from the spirit of the invention. This embodiment and its variations are included in the scope and spirit of the invention, as well as in the claims of the invention and its equivalents.

[0282] Furthermore, this technology can also be configured as follows. (1) A simulation unit performs a simulation of market entry testing based on test condition information representing test conditions related to market entry testing, using customer performance data, and calculates simulation results including the test success rate. An information processing device equipped with the following features. (2) The aforementioned performance data is the past power consumption data of the aforementioned customer. (1) The information processing device described above. (3) The aforementioned test condition information is, The system includes test date information representing the test date, test time, test content, and the reference value method used to calculate the reference value power, and resource information relating to the power reduction resources provided to the customer, The aforementioned simulation unit, Using the aforementioned reference value method, the reference value power for each unit time during the test period on the test day is calculated, Using the above test details and the above reference power values, the target amount of power received per unit time included in the test period is calculated. The success rate of the test is calculated by running the simulation, which adjusts the power reduction resources so that the power received per unit time during the test period on the test day included in the power received data becomes the target power received amount. (2) The information processing device described above. (4) The aforementioned simulation unit, For each of the aforementioned test days, a dwell rate is calculated, which is the percentage of the time during which the predicted power received value, adjusted by the power reduction resources, is within ±10% of the target power received value. The information processing device according to (3), which calculates the success rate of the test as the percentage of test days out of a plurality of test days for which the stay rate is 100%. (5) The aforementioned simulation unit, Execute the simulation in accordance with each of the plurality of types of test contents, and calculate the test success rate. The information processing apparatus according to (3) or (4). (6) Comprising a reception unit that receives the performance data and the test condition information. The simulation unit Executes the simulation according to the received performance data and the test condition information. The information processing apparatus according to any one of (1) to (5). (7) The test condition information Includes exclusion date information representing an exclusion date to be excluded from the test target. The simulation unit Calculates the test success rate for the test days other than the exclusion days represented by the exclusion date information within the test days represented by the test date information. The information processing apparatus according to (6). (8) The reception unit Among the test days represented by the test date information, holidays and test days in which the received power value indicated by the received power data is less than or equal to a first threshold or higher than a second threshold Value Are received as the exclusion days that are not the test targets. The information processing apparatus according to (7). (9) The resource information Includes information representing at least one of the output change rate, capacity, measurement delay time, and control delay time of the power reduction resource. The information processing apparatus according to any one of (3) to (8). (10) Comprises an output control unit that outputs the simulation result. The information processing apparatus according to any one of (1) to (9). (11) The output control unit From among the stay rates calculated for each of the multiple aforementioned test days, the test days corresponding to each of a predetermined number of stay rates, starting with the highest stay rate, are identified as the optimal test implementation dates. Output the simulation results, further including the optimal test date. (10) The information processing device described above. (12) The aforementioned reception unit is For each of the multiple items included in the aforementioned test conditions, multiple types of condition values ​​are further accepted. The aforementioned simulation unit, The simulation is performed for each of the multiple sets of test condition information, each of which has a different combination of the condition values ​​for each of the multiple items. The information processing device described in (6) or (7). (13) The aforementioned simulation unit, Identify the test condition information for the combination of condition values ​​that maximizes the success rate of the test, The simulation results are calculated, further including the identified test condition information and the test success rate calculated by the simulation using the identified test condition information. (12) The information processing device described above. (14) The aforementioned simulation unit, A predetermined number of the aforementioned test condition information is identified in order of the highest success rate of the aforementioned test, The simulation results are calculated, further including the identified test condition information and the test success rate calculated by the simulation using the identified test condition information. (12) The information processing device described above. (15) The aforementioned reception unit is For each of the multiple consumers, The test condition information and the power received data are received, The aforementioned simulation unit, The simulation is performed for each of the multiple customer groups, each consisting of a different combination of the aforementioned customers, to identify the customer group that maximizes the success rate of the test, and to calculate the simulation results that further include the identified customer group. (7) The information processing device described above. (16) The aforementioned market is a supply and demand adjustment market. (1) The information processing device described above. (17) The control unit, A step of running a simulation of an entry test based on test conditions represented by test condition information that shows the test conditions for market entry testing based on customer performance data, and calculating the simulation results including the test success rate. Information processing methods including (18) A step of running a simulation of an entry test based on test conditions represented by test condition information that shows the test conditions for market entry testing based on customer performance data, and calculating the simulation results including the test success rate. An information processing program that causes a computer to execute something. [Explanation of Symbols]

[0283] 10, 10B, 10C Information Processing Devices 20A, 22A, 24A Reception Desk 20B, 22B, 24B Simulation Unit 20C, 22C, 24C Output Control Unit

Claims

1. A simulation unit performs a simulation using actual data on the power received by consumers and test condition information representing the test conditions for market entry testing, and calculates simulation results including the test success rate. Equipped with, The aforementioned test condition information is, The system includes test date information representing the test date, test time, test content, and the reference value method used to calculate the reference value power, and resource information relating to the power reduction resources of the consumer, The aforementioned simulation unit, Using the aforementioned performance data, the aforementioned reference value method is used to calculate the reference value power for each unit time during the test period on the test day, the target amount of power received for each unit time included in the test period is calculated using the test content and the reference value power, and the power reduction resources are adjusted so that the power received for each unit time during the test period on the test day included in the power received data becomes the target amount of power received, and a simulation is performed. Based on the above simulation, the dwell time, which is the percentage of the time during which the received power value is within ±10% of the target received power amount, is calculated for each test day. The success rate of the test is calculated as the percentage of test days out of the multiple test days on which the attendance rate is 100%. Information processing device.

2. The aforementioned performance data is the past power consumption data of the aforementioned customer. The information processing apparatus according to claim 1.

3. The aforementioned simulation unit, For each of the multiple types of the aforementioned test contents, the simulation is performed in accordance with the aforementioned test contents, and the success rate of the test is calculated. The information processing apparatus according to claim 1.

4. The system includes a reception unit that receives the aforementioned performance data and the aforementioned test condition information, The aforementioned simulation unit, The simulation is executed according to the received performance data and test condition information. The information processing apparatus according to claim 1.

5. The aforementioned test condition information is, Includes exclusion date information indicating excluded dates that are not included in the test, The aforementioned simulation unit, For the test dates represented by the aforementioned test date information, excluding the excluded dates represented by the aforementioned excluded date information, the success rate of the test is calculated. The information processing apparatus according to claim 4.

6. The aforementioned reception unit is Among the test dates represented by the aforementioned test date information, holidays and test dates in which the power received value indicated by the power received data is below the first threshold or above the second threshold (higher than the first threshold) are accepted as excluded days that are not subject to testing. The information processing apparatus according to claim 5.

7. The aforementioned resource information is, The information includes at least one of the output change rate, capacity, measurement delay time, and control delay time of the power reduction resource, The information processing apparatus according to claim 1.

8. The system includes an output control unit that outputs the aforementioned simulation results, The information processing apparatus according to claim 1.

9. The output control unit, From among the stay rates calculated for each of the multiple aforementioned test days, the test days corresponding to each of a predetermined number of stay rates, starting with the highest stay rate, are identified as the optimal test implementation dates. Output the simulation results, further including the optimal test date. The information processing apparatus according to claim 8.

10. The aforementioned reception unit is For each of the multiple items included in the aforementioned test conditions, multiple types of condition values ​​are further accepted. The aforementioned simulation unit, The simulation is performed for each of the multiple sets of test condition information, each of which has a different combination of the condition values ​​for each of the multiple items. The information processing apparatus according to claim 5.

11. The aforementioned simulation unit, Identify the test condition information for the combination of condition values ​​that maximizes the success rate of the test, The simulation results are calculated, further including the identified test condition information and the test success rate calculated by the simulation using the identified test condition information. The information processing apparatus according to claim 10.

12. The aforementioned simulation unit, A predetermined number of the aforementioned test condition information is identified in order of the highest success rate of the aforementioned test, The simulation results are calculated, further including the identified test condition information and the test success rate calculated by the simulation using the identified test condition information. The information processing apparatus according to claim 10.

13. The aforementioned reception unit is For each of the multiple consumers, The test condition information and the power received data are received, The aforementioned simulation unit, The simulation is performed for each of the multiple customer groups, each consisting of a different combination of the aforementioned customers, to identify the customer group that maximizes the success rate of the test, and to calculate the simulation results that further include the identified customer group. The information processing apparatus according to claim 5.

14. The aforementioned market is a supply and demand adjustment market. The information processing apparatus according to claim 1.

15. The control unit, The simulation is performed using actual data on the power received by consumers and test condition information representing the test conditions for market entry testing, and the simulation results, including the test success rate, are calculated. The aforementioned test condition information is, The system includes test date information representing the test date, test time, test content, and the reference value method used to calculate the reference value power, and resource information relating to the power reduction resources of the consumer, Using the aforementioned performance data, the aforementioned reference value method is used to calculate the reference value power for each unit time during the test period on the test day, the target amount of power received for each unit time included in the test period is calculated using the test content and the reference value power, and the power reduction resources are adjusted so that the power received for each unit time during the test period on the test day included in the power received data becomes the target amount of power received, and a simulation is performed. Based on the above simulation, the dwell time, which is the percentage of the time during which the received power value is within ±10% of the target received power amount, is calculated for each test day. The success rate of the test is calculated as the percentage of test days out of the multiple test days on which the attendance rate is 100%. Information processing methods.

16. An information processing program for execution by a computer, The simulation is performed using actual data on the power received by consumers and test condition information representing the test conditions for market entry testing, and the simulation results, including the test success rate, are calculated. The aforementioned test condition information is, The system includes test date information representing the test date, test time, test content, and the reference value method used to calculate the reference value power, and resource information relating to the power reduction resources of the consumer, Using the aforementioned performance data, the aforementioned reference value method is used to calculate the reference value power for each unit time during the test period on the test day, the target amount of power received for each unit time included in the test period is calculated using the test content and the reference value power, and the power reduction resources are adjusted so that the power received for each unit time during the test period on the test day included in the power received data becomes the target amount of power received, and a simulation is performed. Based on the above simulation, the dwell time, which is the percentage of the time during which the received power value is within ±10% of the target received power amount, is calculated for each test day. The success rate of the test is calculated as the percentage of test days out of the multiple test days on which the attendance rate is 100%. Information processing program.

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