Method, device, and system for processing degaussing of ship capable of processing degaussing even during sailing of ship

Abstract

Disclosed are a method, a device, and a system for processing a degaussing of a ship capable of processing the degaussing even during sailing of the ship. A method for processing a degaussing of a ship disclosed herein, according to one embodiment, comprises the steps of: performing degaussing processing before sailing of a ship in a magnetic processing station; calculating a first compensation current for compensating for a magnetic field generated during sailing of the ship on the basis of ship sailing-related information of the ship; and calculating a second compensation current for compensating for a magnetic field generated during sailing according to occurrence of a preset event during sailing of the ship.

Description

Method, device and system for handling elements of a ship capable of handling elements even while the ship is in operation

[0001] An embodiment of the present invention relates to a technique for processing degaussing of a trap.

[0002] When a vessel constructed of ferromagnetic materials is exposed to the Earth's magnetic field, an induced magnetic field is generated, and the thermal and mechanical stresses applied to the ferromagnetic hull further generate a permanent magnetic field. While this magnetic field poses no significant problem for conventional vessels, it poses a significant risk for military vessels such as submarines and surface ships, as they are easily detected by magnetically sensitive weapon systems.

[0003] Accordingly, technologies have been developed to minimize the magnetic fields formed on ships. Representative technologies for reducing the magnetic field of ships include deperming and degaussing, which are technologies that attenuate the permanent and induced magnetic fields formed on the ship. Deperming is a method of reducing the permanent magnetic field component magnetized on a ferromagnetic material hull by applying a strong magnetic field from outside the ship and then gradually reducing it. Degaussing is a method of reducing the magnetic field of a ship by placing degaussing coils in each axis direction inside the ship and generating a magnetic field opposite to the ship's magnetic field.

[0004] Typically, the process for reducing a ship's magnetic field involves first reducing the ship's permanent magnetic field component through demagnetization, and then attenuating the remaining permanent and induced magnetic field components using demagnetization coils installed within the ship. The induced magnetic field, however, is generated by the hull's induced magnetization due to the Earth's magnetic field and cannot be reduced through demagnetization alone; it can only be compensated for through demagnetization equipment installed within the ship.

[0005] An embodiment of the present invention provides a method and device and system for processing elements of a warship, which can process elements even during warship operation.

[0006] A method for processing elements of a ship according to one embodiment of the present disclosure is a method performed in a computing device having one or more processors and a memory storing one or more programs executed by the one or more processors, the method comprising: performing element processing before ship operation in a magnetic processing unit; calculating a first compensation current for compensating for a magnetic field generated during operation of the ship based on ship operation-related information of the ship; and calculating a second compensation current for compensating for a magnetic field generated during operation according to an occurrence of a preset event during operation of the ship.

[0007] The step of performing the element processing before the ship's operation may include: a step of measuring the underwater magnetic field of the ship through an off-board sensor installed at a preset depth; a step of separating the measured underwater magnetic field into permanent magnetic field, induced magnetic field, and eddy current magnetic field components according to their causes; a step of calculating a reference element current for element processing and a correction factor for correcting the reference element current for each of the separated magnetic field components; and a step of calculating an element current for element processing before the ship's operation based on the reference element current and the correction factors for each of the magnetic field components.

[0008] The reference element current may include a first reference element current for canceling the permanent magnetic field component, a second reference element current for canceling the induced magnetic field component, and a third reference element current for canceling the eddy current magnetic field component, and the correction factor may include a first correction factor for canceling the first reference element current, a second correction factor for canceling the second reference element current, and a third correction factor for canceling the third reference element current.

[0009] The step of calculating the first compensation current may include: obtaining an on-board sensor-related signal; updating the first correction factor to the third correction factor based on the on-board sensor-related signal and the ship operation-related information; and calculating the first compensation current based on the reference element current for each magnetic field component, the updated first correction factor, the updated second correction factor, and the updated third correction factor.

[0010] The above first compensation current can be calculated by the following mathematical formula.

[0011] (mathematical formula)

[0012]

[0013] : The first compensation current of the kth element coil

[0014] : The first reference element current of the kth element coil

[0015] : The second reference element current of the kth element coil

[0016] : The third reference element current of the kth element coil

[0017] : Updated first correction factor

[0018] : Updated second correction factor

[0019] : Updated third correction factor

[0020] The above event occurs when the element state of the trap is not a normal element state, and the step of calculating the second compensation current includes the steps of: obtaining an on-board sensor reference signal and an on-board sensor measurement signal, respectively; and determining whether the element state of the trap is a normal element state based on an on-board sensor signal change corresponding to a difference between the on-board sensor reference signal and the on-board sensor measurement signal, wherein the on-board sensor reference signal may be a magnetic field signal measured by an on-board sensor installed on the trap when the trap is in a normal element state after element processing before the trap is operated, and the on-board sensor measurement signal may be a magnetic field signal measured by the on-board sensor while the trap is operated.

[0021] The step of checking whether the above-mentioned normal element state is the step of determining that the element state of the trap is a normal element state if the difference between the on-board sensor reference signal and the on-board sensor measurement signal is within a preset allowable range, and determining that the element state of the trap is not a normal element state if the difference is outside the allowable range.

[0022] The above first compensation current can be continuously calculated when the element state of the trap is a normal element state.

[0023] The step of calculating the second compensation current may further include a step of calculating an on-board sensor assumption signal value that is expected to be measured by the on-board sensor when it is assumed that an arbitrary magnetic force is applied to the element coil of the trap when the element state of the trap is not a normal element state.

[0024] The above on-board sensor assumption signal value can be calculated based on a coil effect sensor signal, which is a magnetic field signal measured by the on-board sensor when a preset reference magnetomotive force is applied to the element coil, and a ratio between the reference magnetomotive force and an arbitrary magnetomotive force.

[0025] The step of calculating the second compensation current may further include the step of calculating a diagnostic magnetomotive force, which is an arbitrary magnetomotive force that minimizes the difference between the on-board sensor signal change and the on-board sensor assumption signal value, in a state where there is no preset magnetomotive force constraint condition; and the step of setting the current according to the calculated diagnostic magnetomotive force as the second compensation current when the sum of the calculated diagnostic magnetomotive force and the magnetomotive force due to the first compensation current satisfies the magnetomotive force constraint condition.

[0026] The method for processing the above trap elements may further include a step of calculating an arbitrary magnetomotive force that minimizes the difference between the on-board sensor signal change and the on-board sensor assumption signal value in a state where a preset magnetomotive force constraint condition exists when the sum of the calculated diagnostic magnetomotive force and the magnetomotive force due to the first compensation current does not satisfy the magnetomotive force constraint condition; and a step of setting the current according to the calculated magnetomotive force as the second compensation current.

[0027] The step of calculating the second compensation current may further include the step of calculating an arbitrary magnetomotive force that minimizes the difference between the on-board sensor reference signal and the on-board sensor assumed signal value under a preset magnetomotive force constraint condition; and the step of setting the current according to the calculated magnetomotive force as the second compensation current for restoring the element state of the trap to a normal element state.

[0028] The method for processing the elements of the above-mentioned vessel further includes the steps of: obtaining an on-board sensor reference signal and an on-board sensor measurement signal, respectively; and determining the element status of the vessel based on the on-board sensor reference signal and the on-board sensor measurement signal, wherein the on-board sensor reference signal may be a magnetic field signal measured by an on-board sensor installed on the vessel when the vessel is in a normal element status after element processing prior to vessel operation, and the on-board sensor measurement signal may be a magnetic field signal measured by the on-board sensor during vessel operation.

[0029] The step of determining the state of the components of the trap may include the step of dividing the on-board sensor reference signal and the on-board sensor measurement signal into a DC component and an AC component, respectively; and the step of comparing the DC component and the AC component of the on-board sensor reference signal with the DC component and the AC component of the on-board sensor measurement signal, respectively, to determine the state of the components of the trap.

[0030] The step of determining the element status of the trap may include: a step of checking whether a difference between a DC component of the on-board sensor measurement signal and a DC component of the on-board sensor reference signal is within a first allowable range; a step of checking whether the difference of the DC components is within a second allowable range when the difference of the DC components is outside the first allowable range; and a step of determining the element status of the trap as a first imperfect element state that requires compensation for a permanent magnetic field when the difference of the DC components is within the second allowable range.

[0031] The step of determining the element state of the trap may further include a step of determining, if the difference in the DC component is outside the second allowable range, that the element state of the trap is a second imperfect element state that requires compensation for the induced magnetic field.

[0032] The step of determining the element status of the trap may further include a step of determining whether the difference between the AC component of the on-board sensor measurement signal and the AC component of the on-board sensor reference signal is within a third predetermined tolerance range when the difference in the DC component is within a first predetermined tolerance range; and a step of determining the element status of the trap as a third imperfect element status that requires compensation for an eddy current magnetic field when the difference in the AC component is outside the third predetermined tolerance range.

[0033] The first compensation current is constantly calculated when the device state of the trap is a normal device state, and the event occurs when the device state of the trap is not a normal device state. The device processing method of the trap may further include a step of calculating a mixed compensation current by adding the first compensation current and the second compensation current; and a step of applying the mixed compensation current to the device coil.

[0034] The method for degaussing the above-mentioned vessel may further include a step of measuring a magnetic field distributed at a specific depth before performing degaussing at the magnetic treatment station; a step of measuring a magnetic field distributed at a specific depth during operation of the vessel after performing degaussing at the magnetic treatment station; and a step of evaluating degaussing performance according to the operation time of the vessel based on a ratio between the magnetic field distributed at a specific depth before the degaussing and the magnetic field distributed at a specific depth after the degaussing.

[0035] The method for processing the device of the trap may further include a step of measuring the device performance of the trap from the time when the device processing is performed in the magnetic processing center to a preset reference time; and a step of predicting the device performance of the trap until a specific time in the future after the reference time based on data on the device performance of the trap measured from the time when the device processing is performed to the reference time.

[0036] The method for processing the elements of the trap may further include a step of predicting at least one of the remaining lifespan and the self-processing time of the element performance of the trap from the reference time based on the element performance of the trap predicted up to the specific time in the future.

[0037] According to one embodiment of the invention, a device for processing elements of a warship includes a first device control device for performing control related to element processing before operation of the warship in a magnetic processing station, and a second device control device for performing control related to element processing during operation of the warship, wherein the first device control device measures an underwater magnetic field of the warship through an offboard sensor installed at a preset depth in the magnetic processing station, calculates an element current for canceling out the measured underwater magnetic field, and applies the calculated element current to a device coil installed in the warship to perform element processing before operation of the warship, and the second device control device calculates a first compensation current for compensating for a magnetic field generated during operation of the warship based on information related to the operation of the warship, and calculates a second compensation current for compensating for a magnetic field generated during operation according to the occurrence of a preset event during operation of the warship.

[0038] According to one embodiment of the invention, a device processing system of a warship includes: a device coil installed on a warship; an onboard sensor installed on the warship and measuring a magnetic field; an offboard sensor installed at a preset depth in a magnetic processing station and measuring a magnetic field; a first device control device that measures an underwater magnetic field of the warship through the offboard sensor in the magnetic processing station, calculates a device current for offsetting the measured underwater magnetic field, and applies the calculated device current to the device coil to perform device processing before operation of the warship; and a second device control device that calculates a first compensation current for compensating for a magnetic field generated during operation of the warship based on warship operation-related information of the warship, and calculates a second compensation current for compensating for a magnetic field generated during operation according to the occurrence of a preset event during operation of the warship, thereby performing device processing during operation of the warship.

[0039] According to the disclosed embodiment, by compensating for an abnormal magnetic field generated during operation of a ship after element processing of the ship in a magnetic processing center (e.g., a magnetic field generated by thermal and mechanical stress applied to the hull or a magnetic change of equipment mounted on the ship, or a magnetic field generated by changes in the course angle, rolling, and pitching of the ship, etc.) and a magnetic field due to an imperfect element state caused by a malfunction of equipment such as a geomagnetic sensor, a magnetic needle, and a gyroscope installed on the ship, through the calculation of a compensation current, the element performance of the ship can be maintained in a normal element state even during operation of the ship.

[0040] In addition, the DC component and AC component of the on-board sensor reference signal and the on-board sensor measurement signal can be compared to classify the element status of the ship, and if the ship is in an incomplete element status, the element status can be processed to return to normal.

[0041] Figure 1 is a schematic drawing showing a component coil placed in a trap in one embodiment of the present invention.

[0042] FIG. 2 is a block diagram illustrating a computing environment including a computing device suitable for use in exemplary embodiments.

[0043] Figure 3 is a flowchart for explaining a method for controlling pre-operation element processing of a trap according to one embodiment of the present invention.

[0044] Figure 4 is a flowchart for explaining a method for controlling element processing during operation of a trap according to one embodiment of the present invention.

[0045] Figure 5 is a flowchart for explaining a method for controlling element processing during operation of a trap according to another embodiment of the present invention.

[0046] FIG. 6 is a flowchart illustrating a method for classifying the state of a trap's elements through analysis of on-board sensor signals according to one embodiment of the present invention.

[0047] FIG. 7 is a diagram showing the state of a trap's elements according to an on-board sensor signal in one embodiment of the present invention.

[0048] Figure 8 is a graph comparing the element performance of a trap by an element processing method according to one embodiment of the present invention and the element performance of a trap by an existing element processing method.

[0049] Figure 9 is a block diagram showing the configuration of a trap element processing system according to one embodiment of the present invention.

[0050] Hereinafter, specific embodiments of the present invention will be described with reference to the drawings. The following detailed description is provided to facilitate a comprehensive understanding of the methods, devices, and / or systems described herein. However, these are merely examples and the present invention is not limited thereto.

[0051] In describing embodiments of the present invention, if a detailed description of a known technology related to the present invention is judged to unnecessarily obscure the gist of the present invention, the detailed description will be omitted. In addition, the terms described below are terms defined in consideration of their functions in the present invention, and this may vary depending on the intention or custom of the user or operator. Therefore, the definitions should be made based on the contents throughout this specification. The terminology used in the detailed description is only for the purpose of describing embodiments of the present invention and should not be limited in any way. Unless clearly used otherwise, the singular form includes the plural form. In this description, expressions such as "comprises" or "having" are intended to indicate certain features, numbers, steps, operations, elements, parts or combinations thereof, and should not be construed to exclude the presence or possibility of one or more other features, numbers, steps, operations, elements, parts or combinations thereof other than those described.

[0052] Meanwhile, directional terms such as upper, lower, one side, and the other side are used in reference to the orientation of the disclosed drawings. Since components of embodiments of the present invention can be positioned in various orientations, directional terms are used for illustrative purposes and are not intended to be limiting.

[0053] Additionally, while terms such as "first" and "second" may be used to describe various components, these components should not be limited by these terms. These terms may be used to distinguish one component from another. For example, without departing from the scope of the present invention, a first component may be referred to as a "second component," and similarly, a second component may also be referred to as a "first component."

[0054] In this specification, the term "vessel" includes not only all means of transportation that floats on water but also means of transportation that operates underwater (e.g., submarines).

[0055] In order to degauss the magnetic field formed in the trap, degaussing coils are arranged on the trap. The degaussing coils can be installed in each of the three directions on the trap. Fig. 1 is a schematic diagram of a degaussing coil arranged on the trap in one embodiment of the present invention. Referring to Fig. 1, the degaussing coils can include one or more vertical coils (V-coils), one or more longitudinal coils (L-coils), and one or more transverse coils (A-coils).

[0056] The vertical coil (V-coil) is for generating a magnetism in a direction perpendicular to the deck surface of the ship. A plurality of vertical coils can be arranged parallel to the deck surface of the ship and spaced apart from each other. The longitudinal coil (L-coil) is for generating a magnetism in a direction in a longitudinal direction that runs across the length of the ship. A plurality of longitudinal coils can be arranged at regular intervals inside the ship in a direction perpendicular to the length of the ship. The transverse coil (A-coil) is for generating a magnetism in the width direction of the ship. The transverse coil is for generating a magnetism in a direction perpendicular to the direction of the side of the ship, that is, the magnetism generated by the vertical coil and the longitudinal coil. A plurality of transverse coils can be arranged spaced apart from each other along both side walls or the center of the ship.

[0057] Here, the vertical magnetic field reduction is handled by the vertical coil, the longitudinal magnetic field reduction is handled by the longitudinal coil, and the transverse magnetic field reduction is handled by the transverse coil. The magnetic field reduction is achieved by applying an appropriate current to each element coil so as to generate a magnetic field opposite to the magnetic field generated in the trap.

[0058] FIG. 2 is a block diagram illustrating a computing environment (10) including a computing device suitable for use in exemplary embodiments. In the illustrated embodiment, each component may have different functions and capabilities other than those described below, and may include additional components other than those described below.

[0059] The illustrated computing environment (10) includes a computing device (12). In one embodiment, the computing device (12) may be a device for controlling degaussing-related processing of the vessel. The computing device (12) may be electrically connected to a degaussing coil and an on-board sensor installed on the vessel. In addition, the computing device (12) may be communicatively connected to an off-board sensor installed underwater in a magnetic processing unit. The computing device (12) may control the degaussing coil, the on-board sensor, and the off-board sensor, respectively. The computing device (12) may be installed inside or outside the vessel. Here, the on-board sensor and the off-board sensor may each be a sensor for measuring a magnetic field at the installed location.

[0060] A computing device (12) includes at least one processor (14), a computer-readable storage medium (16), and a communication bus (18). The processor (14) may cause the computing device (12) to operate according to the exemplary embodiments mentioned above. For example, the processor (14) may execute one or more programs stored in the computer-readable storage medium (16). The one or more programs may include one or more computer-executable instructions, which, when executed by the processor (14), may be configured to cause the computing device (12) to perform operations according to the exemplary embodiments.

[0061] A computer-readable storage medium (16) is configured to store computer-executable instructions or program code, program data, and / or other suitable forms of information. A program (20) stored in the computer-readable storage medium (16) includes a set of instructions executable by the processor (14). In one embodiment, the computer-readable storage medium (16) may be a memory (volatile memory such as random access memory, non-volatile memory, or a suitable combination thereof), one or more magnetic disk storage devices, optical disk storage devices, flash memory devices, any other form of storage medium that can be accessed by the computing device (12) and store desired information, or a suitable combination thereof.

[0062] A communication bus (18) interconnects various other components of the computing device (12), including the processor (14) and computer-readable storage media (16).

[0063] The computing device (12) may also include one or more input / output interfaces (22) that provide interfaces for one or more input / output devices (24) and one or more network communication interfaces (26). The input / output interfaces (22) and the network communication interfaces (26) are connected to the communication bus (18). The input / output devices (24) may be connected to other components of the computing device (12) via the input / output interfaces (22). Exemplary input / output devices (24) may include input devices such as pointing devices (such as a mouse or a trackpad), a keyboard, a touch input device (such as a touchpad or a touchscreen), a voice or sound input device, various types of sensor devices and / or photographing devices, and / or output devices such as display devices, printers, speakers and / or network cards. The exemplary input / output devices (24) may be included within the computing device (12) as a component constituting the computing device (12), or may be connected to the computing device (12) as a separate device distinct from the computing device (12).

[0064] Figure 3 is a flowchart illustrating a method for controlling pre-operational element processing of a vessel according to one embodiment of the present invention. While the illustrated flowchart depicts the method as divided into multiple steps, at least some of the steps may be performed in reverse order, combined with other steps and performed together, omitted, divided into sub-steps, or performed with one or more additional steps not illustrated.

[0065] Referring to FIG. 3, the computing device (12) can measure the underwater magnetic field caused by the vessel through one or more off-board sensors installed at a preset depth in a magnetic treatment facility (MTF) (S 101).

[0066] Offboard sensors are sensors designed to measure the underwater magnetic field of a vessel. They can be installed in a fixed array at a preset depth in the magnetic processing station. The underwater magnetic field generated by a vessel can encompass not only the vessel's hull but also any underwater magnetic fields generated by cargo or equipment onboard the vessel.

[0067] Next, the computing device (12) can separate the measured underwater magnetic field into permanent magnetic field, induced magnetic field, and eddy current magnetic field components according to their causes (S 103).

[0068] Here, the permanent magnetic field component may be a magnetic field component resulting from permanent magnetization within the vessel. The induced magnetic field component may be a magnetic field component resulting from temporary induced magnetization due to the geomagnetic field. The eddy current magnetic field component may be a magnetic field component generated by the vessel's fluctuations. Since the technology for separating magnetic fields into components based on their source is already well-known, a detailed description thereof will be omitted.

[0069] Next, the computing device (12) can calculate the reference element current and correction factor for each magnetic field component degaussing process (S 105).

[0070] Here, the reference element current may refer to a reference element current to be applied to each element coil (horizontal coil, longitudinal coil, and vertical coil) installed on the ship to remove the corresponding magnetic field component. In addition, the correction factor may be a factor for correcting the reference element current according to the position of the ship, the course direction of the ship (course angle), and the attitude of the ship (e.g., the roll angle and pitch angle of the ship) in the magnetic processing station.

[0071] The reference element current may include a first reference element current for canceling a permanent magnetic field component of the trap, a second reference element current for canceling an induced magnetic field component of the trap, and a third reference element current for canceling an eddy current magnetic field component of the trap. The correction factor may include a first correction factor for canceling the first reference element current, a second correction factor for canceling the second reference element current, and a third correction factor for canceling the third reference element current.

[0072] Here, the computing device (12) can calculate the element current for compensating for the residual permanent magnetic field component remaining after the demagnetization process to reduce the permanent magnetic field of the ship as the first reference element current. When the element is processed before the ship is operated (i.e., when the element is processed in a magnetic processing center), a fixed value may be used as the first correction factor. At this time, the first correction factor may be a value set according to the material of the ship's hull, the size of the hull, the operation period of the ship, and the equipment mounted on the ship.

[0073] In addition, the computing device (12) can divide the induced magnetic field components into transverse components, longitudinal components, and vertical components, and then calculate the element currents for canceling out the induced magnetic fields of the transverse components, longitudinal components, and vertical components, as the second reference element currents. The computing device (12) can calculate the second correction factor for correcting the second reference element current according to the position of the ship in the magnetic processing center and the course angle of the ship.

[0074] In addition, the computing device (12) can divide the eddy current magnetic field component into a transverse component, a longitudinal component, and a vertical component, and then calculate the element current for canceling the eddy current magnetic field of the transverse component, the longitudinal component, and the vertical component as a third reference element current. When processing the element before the ship is operated (i.e., when processing the element in a magnetic processing center), a fixed value can be used as the third correction factor. At this time, the third correction factor can be a value set according to the attitude of the ship.

[0075] Next, the computing device (12) calculates the degaussing current for pre-ship operation degaussing based on the reference degaussing current and correction factors for degaussing by magnetic field component, and applies the calculated degaussing current to each degaussing coil of the ship to perform pre-ship operation degaussing (S 107).

[0076] The computing device (12) can calculate the element current for element processing before ship operation (i.e., element processing in the magnetic processing unit (MTF)) using the following mathematical expression 1.

[0077] (Equation 1)

[0078]

[0079] : Element current in the magnetic processing unit of the kth element coil

[0080] : The first reference element current of the kth element coil

[0081] : The second reference element current of the kth element coil

[0082] : The third reference element current of the kth element coil

[0083] : First correction factor

[0084] : Second correction factor

[0085] : Third correction factor

[0086] In this way, if the magnetic processing is performed before ship operation in the magnetic processing center, the ship will be in a normal magnetic state (i.e., a state in which the ship's magnetic field is minimized through the magnetic processing).

[0087] Next, the computing device (12) can measure the magnetic field signal of the trap using the on-board sensor installed in the trap and store the measured magnetic field signal as the on-board sensor reference signal (S 109).

[0088] That is, the onboard sensor reference signal may refer to the ship's magnetic field signal measured by the onboard sensor when the ship is in a normal element state. The onboard sensor placement location and number may be determined based on the magnetization density of the ship's hull.

[0089] Next, the computing device (12) can generate and store a coil effect sensor signal for use in element processing during operation of the ship (S 111). The coil effect sensor signal is information on the magnetic field effect that appears at a specific location when a preset reference magnetic force is applied to the element coil installed on the ship, and may be data used for element processing during operation of the ship. The coil effect sensor signal can be generated at any time before operation of the ship. The coil effect sensor signal ( ) is the reference magnetic force set for the kth element coil ( ) may be a magnetic field signal in the i direction measured by the jth onboard sensor installed on the trap.

[0090] Specifically, the computing device (12) can turn off the power of all the element coils installed in the trap, and then apply a preset reference magnetic force to one element coil (the k-th element coil) in a preset order. The computing device (12) can measure the magnetic field generated when the reference magnetic force is applied to the k-th element coil at each on-board sensor installed in the trap and generate a coil effect sensor signal ( ) can be saved.

[0091] Figure 4 is a flowchart illustrating a method for controlling element processing during operation of a trap according to one embodiment of the present invention. While the illustrated flowchart depicts the method as divided into multiple steps, at least some of the steps may be performed in reverse order, combined with other steps and performed together, omitted, divided into substeps, or performed with one or more additional steps not illustrated.

[0092] Referring to FIG. 4, the computing device (12) can obtain onboard sensor measurement signals and ship operation-related information during ship operation (S 201).

[0093] Here, the ship operation-related information may include the ship's location (e.g., the ship's latitude and longitude or the ship's GPS information, etc.), the ship's heading (course angle), the ship's geomagnetic information, the ship's attitude information (e.g., the ship's pitch and roll information, etc.). The computing device (12) may obtain ship operation-related information through a GPS sensor, a geomagnetic sensor, a gyro sensor, etc. installed on the ship. The on-board sensor measurement signal may be a magnetic field signal currently measured through an on-board sensor while the ship is operating.

[0094] Next, the computing device (12) can update the correction factor for each magnetic field component based on the acquired onboard sensor measurement signal and ship operation-related information (S 203).

[0095] That is, the reference element current is a current used to compensate for the magnetic field of the ship before the ship is operated in the magnetic processing center. In order to compensate for the magnetic field generated during the ship's operation, it is necessary to update the correction factor and apply the updated correction factor to the reference element current to calculate the compensation current.

[0096] In one embodiment, the computing device (12) can calculate the difference (i.e., permanent magnetic field change) in the permanent magnetic field component between the on-board sensor measurement signal and the previously stored on-board sensor reference signal. The computing device (12) can update the first correction factor based on the permanent magnetic field change (the change due to the difference between the permanent magnetic field in the normal element state and the permanent magnetic field during ship operation). The on-board sensor reference signal and the on-board sensor measurement signal may be referred to as on-board sensor related signals. Meanwhile, although the first correction factor is described herein as being updated, it is not limited thereto, and the value of the first correction factor set in the magnetic processing unit may be used as is.

[0097] The computing device (12) can calculate the position and course angle of the vessel based on vessel operation-related information. The computing device (12) can update the second correction factor based on the difference between the current position and course angle of the vessel and the position and course angle of the vessel before the vessel operation.

[0098] The computing device (12) can calculate the rolling and pitching degrees of the vessel based on information related to vessel operation. The computing device (12) can update the third correction factor based on the difference between the current rolling and pitching degrees of the vessel and the rolling and pitching degrees of the vessel before operation.

[0099] Next, the computing device (12) can calculate the first compensation current for element processing during ship operation based on the reference element current and updated correction factors for each magnetic field component (S 205). The computing device (12) can calculate the first compensation current through the following mathematical expression 2. The computing device (12) can perform element processing during ship operation by applying the first compensation current to each element coil of the ship.

[0100] (Equation 2)

[0101]

[0102] : The first compensation current of the kth element coil

[0103] : The first reference element current of the kth element coil

[0104] : The second reference element current of the kth element coil

[0105] : The third reference element current of the kth element coil

[0106] : Updated first correction factor

[0107] : Updated second correction factor

[0108] : Updated third correction factor

[0109] Here, the computing device (12) can perform steps S 201 to S 205 in real time or periodically to calculate the first compensation current and perform element processing during ship operation. In this case, after demagnetization and element processing in the magnetic processing station, the magnetic field generated due to the change in magnetization of the hull due to thermal and / or mechanical stress applied to the hull over time during ship operation can be compensated for in real time or periodically.

[0110] Figure 5 is a flowchart illustrating a method for controlling element processing during operation of a trap according to another embodiment of the present invention. While the illustrated flowchart depicts the method as divided into multiple steps, at least some of the steps may be performed in reverse order, combined with other steps and performed together, omitted, divided into substeps, or performed with one or more additional steps not illustrated.

[0111] Referring to FIG. 5, the computing device (12) can obtain an on-board sensor reference signal and an on-board sensor measurement signal, respectively (S 301). The on-board sensor reference signal is a magnetic field signal measured by the on-board sensor when the vessel is in a normal device state and is already stored. The on-board sensor measurement signal may be a magnetic field signal currently measured by the on-board sensor while the vessel is operating.

[0112] Next, the computing device (12) can determine whether the element status of the trap is a normal element status based on the on-board sensor reference signal and the on-board sensor measurement signal (S 303).

[0113] In one embodiment, the computing device (12) can determine whether the device state of the trap is a normal device state based on the difference between the on-board sensor reference signal and the on-board sensor measurement signal. That is, the computing device (12) can determine that the device state of the trap is a normal device state if the difference between the on-board sensor reference signal and the on-board sensor measurement signal is within a preset tolerance range, and can determine that the device state of the trap is not a normal device state if the difference is outside the preset tolerance range.

[0114] As a result of the verification of S 303, if the element status of the trap is not a normal element status, the computing device (12) can calculate a sensor signal value expected to be measured by the on-board sensor when assuming that an arbitrary magnetic force is applied to each element coil of the trap (hereinafter, referred to as “on-board sensor assumed signal value”) (S 305).

[0115] Here, the random magnetic force is not actually applied to each element coil, but rather, it is used to produce a sensor signal value (i.e., a magnetic field signal value) to be measured by the on-board sensor assuming that the random magnetic force is applied to each element coil.

[0116] The computing device (12) can calculate the on-board sensor assumption signal value using the coil effect sensor signal (i.e., the magnetic field signal measured by the on-board sensor when a preset reference magnetomotive force is applied to the element coil) and the ratio between the reference magnetomotive force and an arbitrary magnetomotive force. The computing device (12) can calculate the on-board sensor assumption signal value according to an arbitrary magnetomotive force through mathematical expression 3.

[0117] (Equation 3)

[0118]

[0119] : On-board sensor assumption signal value of i-direction magnetic field appearing from j-th on-board sensor

[0120] nq: total number of element coils installed in the trap

[0121] : Reference magnetic force on the kth element coil ( ) is authorized, the magnetic field signal in the i direction measured by the jth on-board sensor installed on the trap (coil effect sensor signal)

[0122] : Any magnetic force to be applied to the kth element coil

[0123] Next, the computing device (12) can calculate a diagnostic magnetic field, which is an arbitrary magnetic field that minimizes the difference between the on-board sensor signal change and the on-board sensor assumed signal value in a state where there is no magnetic field constraint condition (S 307).

[0124] Here, the magnetomotive force constraint condition may mean that the magnetomotive force applied to the element coil installed on the trap must be less than the maximum magnetomotive force allowed by the power supply of the element coil. Furthermore, the change in the on-board sensor signal may mean the difference between the on-board sensor reference signal and the on-board sensor measurement signal.

[0125] In one embodiment, the computing device (12) can calculate a diagnostic power to minimize the difference between the on-board sensor signal change and the on-board sensor assumption signal value by determining whether the value of the objective function based on the difference between the on-board sensor signal change and the on-board sensor assumption signal value converges to a preset value. Here, the objective function (F) can be expressed by the following mathematical expression 4.

[0126] (Equation 4)

[0127]

[0128] : Change in magnetic field signal in i direction of jth onboard sensor (change in onboard sensor signal)

[0129] : On-board sensor assumption signal value of i-direction magnetic field appearing from j-th on-board sensor

[0130] ns: The total number of onboard sensors installed on the ship.

[0131] Here, the direction of the magnetic field can be in three directions: transverse direction, longitudinal direction, and vertical direction.

[0132] In one embodiment, when the value of the objective function (F) does not converge to a preset value, the computing device (12) can calculate a minute change amount (F') of the objective function according to a minute change in the magnetomotive force value of the element coil. For example, the minute change amount (F') of the objective function can be calculated using a finite difference method or a magnetomotive force sensitivity technique of the element coil, and since these contents are known techniques, a detailed description thereof will be omitted.

[0133] The computing device (12) can update the next arbitrary magnetic force to be applied to each element coil based on the objective function (F) and the minute change amount (F') of the objective function. The computing device (12) can update the arbitrary magnetic force through the following mathematical expression 5. The computing device (12) can repeat this until the value of the objective function converges to a preset value.

[0134] (Equation 5)

[0135]

[0136] : Updated random magnetomotive force to be applied to the kth element coil

[0137] : Current arbitrary magnetomotive force to be applied to the kth element coil

[0138] : Pre-set relaxation factor

[0139] Here, is a relaxation coefficient that is applied as the process of making the value of the objective function (F) converge to a preset value is repeated.

[0140] Next, the computing device (12) can check whether the sum of the calculated diagnostic magnetic force and the magnetic force due to the first compensation current satisfies the magnetic force constraint condition (S 309). That is, the computing device (12) can check whether the sum of the calculated diagnostic magnetic force and the magnetic force due to the first compensation current is less than the maximum magnetic force allowed by the element coil.

[0141] As a result of the verification of S 309, if the sum of the generated diagnostic magnetic force and the magnetic force due to the first compensation current satisfies the magnetic force constraint condition, the computing device (12) can set the diagnostic current according to the generated diagnostic magnetic force as the second compensation current for compensating the magnetic field corresponding to the on-board sensor signal change (S 311).

[0142] Next, the computing device (12) can calculate a mixed compensation current by combining the first compensation current and the second compensation current to restore the element state of the trap to a normal element state (S 313). The computing device (12) can apply the mixed compensation current to each element coil.

[0143] That is, in the disclosed embodiment, when the element status of the ship is within the normal range, the magnetic field caused by the change in magnetization of the hull during ship operation is compensated by calculating the first compensation current in real time or periodically, and when the element status of the ship is outside the normal range, the second compensation current is calculated, and the calculated second compensation current is combined with the first compensation current to calculate a mixed compensation current, thereby restoring the element status of the ship to the normal element state.

[0144] As a result of the verification of S 309, if the sum of the generated diagnostic magnetic force and the magnetic force due to the first compensation current does not satisfy the magnetic force constraint condition, the computing device (12) can calculate an arbitrary magnetic force that minimizes the difference between the on-board sensor signal change and the on-board sensor assumed signal value in a state where the magnetic force constraint condition exists, and set the current according to the calculated magnetic force as the second compensation current (S 315).

[0145] The computing device (12) can calculate the magnetic force when the objective function of mathematical expression 4 converges to a preset value under a magnetic force constraint condition, and set the calculated magnetic force as the second compensation current. The computing device (12) can calculate a mixed compensation current by adding the calculated second compensation current and the first compensation current.

[0146] Here, it is explained that a mixed compensation current that is the sum of the first compensation current and the second compensation current is calculated and applied to the element coil of the trap, but it is not limited thereto, and when calculating the first compensation current and the second compensation current, the first compensation current and the second compensation current may be applied to the element coil of the trap, respectively.

[0147] According to the disclosed embodiment, an abnormal magnetic field generated during operation of a ship after element processing of the ship in a magnetic processing station (e.g., a magnetic field generated by thermal and mechanical stress applied to the hull or a magnetic change of equipment mounted on the ship, or a magnetic field generated by changes in the course angle, rolling, and pitching of the ship) is compensated for by calculating a first compensation current, and a magnetic field caused by an imperfect element state due to a malfunction of equipment such as a geomagnetic sensor, a magnetic compass, and a gyroscope installed on the ship is compensated for by calculating a second compensation current, thereby maintaining the element performance of the ship in a normal element state even during operation of the ship. Meanwhile, compensation of the magnetic field through calculation of the second compensation current is not limited thereto. For example, even after compensation through the first compensation current, a small portion (residual magnetic field) can be compensated for through the second compensation current.

[0148] The calculation of the first compensation current can be performed continuously (i.e., in real time or periodically) during the operation of the ship, and the calculation of the second compensation current can be performed when an event occurs that causes the ship to deviate from its normal element state.

[0149] Meanwhile, the second compensation current can also be calculated for each magnetic field component to be compensated (permanent magnetic field, induced magnetic field, and eddy current magnetic field). In this case, the computing device (12) calculates the on-board sensor signal change and the on-board sensor assumption signal value for each magnetic field component, and then calculates the diagnostic magnetomotive force by Equation 4 in the absence of a magnetomotive force constraint condition for each magnetic field component or calculates the magnetomotive force by Equation 4 in the presence of a magnetomotive force constraint condition, thereby calculating the second compensation current for each magnetic field component. The computing device (12) adds up the second compensation currents for each magnetic field component to obtain the total second compensation current ( ) can be produced. This can be expressed by mathematical expression 6.

[0150] (Equation 6)

[0151]

[0152] : A second compensation current to compensate for the on-board sensor signal variation of the permanent magnetic field component.

[0153] : A second compensation current to compensate for the on-board sensor signal variation of the induced magnetic field component.

[0154] : A third compensation current to compensate for the on-board sensor signal variation of the eddy current magnetic field component.

[0155] Meanwhile, the computing device (12) can also directly calculate a second compensation current to restore the element state of the trap to a normal element state based on the difference between the on-board sensor reference signal and the on-board sensor assumption signal value under a pressurized condition.

[0156] Specifically, the computing device (12) can calculate an arbitrary magnetic force that minimizes the difference between the on-board sensor reference signal and the on-board sensor assumed signal value under a magnetic force constraint condition, and set a current corresponding to the calculated arbitrary magnetic force as a second compensation current to restore the element state of the trap to a normal element state.

[0157] The computing device (12) can calculate an arbitrary magnetic force that minimizes the difference between the on-board sensor reference signal and the on-board sensor assumption signal value by checking whether the value of the objective function based on the difference between the on-board sensor reference signal and the on-board sensor assumption signal value converges to a preset value under a magnetic force constraint condition. Here, the objective function (F) can be expressed by the following mathematical expression 7.

[0158] (Equation 7)

[0159]

[0160] : Magnetic field signal in the i direction measured by the i-th on-board sensor when the trap is in a normal element state (on-board sensor reference signal)

[0161] Here, since the on-board sensor reference signal is a magnetic field signal measured by the on-board sensor when the trap is in a normal element state, the current corresponding to any magnetomotive force satisfying mathematical expression 7 corresponds to the second compensation current for restoring the trap to the normal element state. Here, the second compensation current corresponds to a type of mixed compensation current and also includes a value of the current corresponding to the first compensation current. At this time, the computing device (12) may apply the second compensation current as it is to the element coil without combining the second compensation current with the first compensation current.

[0162] In one embodiment, when the value of the objective function (F) does not converge to a preset value, the computing device (12) can calculate a micro-change amount (F') of the objective function according to a micro-change in the magnetomotive force value of the element coil, and update the next arbitrary magnetomotive force to be applied to each element coil based on the objective function (F) and the micro-change amount (F') of the objective function.

[0163] Meanwhile, the computing device (12) can classify the component status of the vessel in more detail through analysis of on-board sensor signals. FIG. 6 is a flowchart illustrating a method for classifying the component status of a vessel through analysis of on-board sensor signals according to one embodiment of the present invention, and FIG. 7 is a diagram illustrating the component status of a vessel according to on-board sensor signals according to one embodiment of the present invention.

[0164] Referring to FIG. 6, the computing device (12) can obtain an on-board sensor reference signal and an on-board sensor measurement signal, respectively (S 401). In one embodiment, the computing device (12) can obtain the on-board sensor reference signal and the on-board sensor measurement signal, respectively, at preset time intervals.

[0165] Next, the computing device (12) can distinguish the on-board sensor reference signal and the on-board sensor measurement signal into a direct current component and an alternating current component, respectively (S 403). In one embodiment, the computing device (12) can distinguish the on-board sensor reference signal and the on-board sensor measurement signal into a direct current component and an alternating current component by performing a low-frequency band FFT (Fast Fourier Transform).

[0166] Next, the computing device (12) can determine whether the difference (DC component difference) between the DC component of the on-board sensor measurement signal and the DC component of the on-board sensor reference signal is within a preset first tolerance range (S 405). In one embodiment, the first tolerance range can be set based on the on-board sensor reference signal, which is a signal when the device is in a normal state.

[0167] As a result of the verification at S 405, if the DC component difference is outside the preset first allowable range, the computing device (12) can verify whether the DC component difference is within the preset second allowable range (S 407). The second allowable range may be set based on the first allowable range. In one embodiment, the second allowable range may be set to a range smaller than the range value of the first allowable range set based on the on-board sensor reference signal. As a result of the verification at S 407, if the DC component difference is within the preset second allowable range, the computing device (12) can determine the element state of the trap as the first incomplete element state (S 409).

[0168] Referring to Fig. 7, the first imperfect element state is a change in the hull magnetization distribution caused by thermal and mechanical stress applied to the hull over the passage of time of the ship's operation or changes in equipment mounted on the ship, resulting in a signal size in the form of a constant offset compared to the normal element state. The first imperfect element state can be classified as requiring additional compensation of the permanent magnetic field.

[0169] As a result of the verification of S 407, if the DC component difference is outside the preset second allowable range, the computing device (12) can determine the element status of the trap as the second incomplete element status (S 411).

[0170] The second imperfect element state, as shown in Fig. 7, is a state in which compensation is not properly performed for the induced magnetic field component caused by changes in the geomagnetic field conditions due to changes in the ship's course angle, for example, and thus an additional offset-type signal size appears compared to the first imperfect element state. The second imperfect element state can be classified as one in which additional compensation for the induced magnetic field is required.

[0171] As a result of the verification of S 405, if the DC component difference is within the preset first allowable range, the computing device (12) can check whether the difference (AC component difference) between the AC component of the on-board sensor measurement signal and the AC component of the on-board sensor reference signal is within the preset third allowable range (S 413).

[0172] As a result of the verification of S 413, if the AC component difference is outside the preset third allowable range, the computing device (12) can determine the element status of the trap as the third incomplete element status (S 415).

[0173] The third imperfect element state, as shown in Fig. 7, is a state in which compensation is not properly performed for eddy current magnetic field components generated, for example, by the rolling or pitching of a trap, and the signal size of the AC component exceeds the allowable range in the normal element state. The third imperfect element state can be classified as one in which additional compensation for the eddy current magnetic field is required.

[0174] In addition, the computing device (12) can analyze the cause of the eddy current magnetic field by analyzing the frequency band corresponding to the AC component signal. For example, the computing device (12) can confirm that a signal of 0.3 to 1 Hz is a magnetic field generated by the rolling or pitching of the ship, a signal of 3 to 30 Hz is a magnetic field generated by a rotating body of the ship such as a propeller, and a signal of 50 Hz or more is a magnetic field generated by the ship's power equipment and cable wiring.

[0175] Meanwhile, even if the element state of the trap is determined to be the first imperfect element state or the second imperfect element state, a process of additionally determining whether the element state of the trap is the third imperfect element state may be performed.

[0176] As a result of the verification of S 413, if the AC component difference is within the preset third allowable range, the computing device (12) can determine the element status of the ship as a normal element state (S 417). That is, if both the DC component difference and the AC component difference are within the preset allowable range, the computing device (12) can determine the element status of the ship as a normal element state. This is the case when the on-board sensor signal (on-board sensor measurement signal) measured in real time according to the change in the operating time is maintained without deviating from the on-board sensor reference signal.

[0177] According to the disclosed embodiment, the DC component and AC component of the on-board sensor reference signal and the on-board sensor measurement signal can be compared to classify the element status of the ship, and if the ship is in an incomplete element status, the element status can be processed to become normal.

[0178] Meanwhile, the computing device (12) can evaluate the degaussing performance of the vessel over time by using the ratio between the maximum value of the magnetic field distributed underwater before the degaussing of the vessel and the maximum value of the magnetic field over the passage of time after the degaussing. At this time, the computing device (12) can evaluate the degaussing performance at a preset depth based on the ship's beam. The computing device (12) can calculate the degaussing performance (P(t)) of the vessel over time by using mathematical expression 8.

[0179] (Equation 8)

[0180]

[0181] : The maximum value of the magnetic field distributed at the depth set by the trap's electrical components

[0182] : The maximum value of the magnetic field distributed at the preset depth after the trap is decomposed

[0183] Figure 8 is a graph comparing the device performance of a vessel using a device processing method according to one embodiment of the present invention with the device performance of a vessel using a conventional device processing method. The device processing method according to an embodiment of the present invention is a method that additionally compensates for the magnetic field generated during the vessel's operation after normal device processing through a compensation current. The conventional device processing method means a method that does not provide separate additional compensation for the magnetic field generated additionally after normal device processing.

[0184] Referring to FIG. 8, the computing device (12) uses a statistical machine learning technique such as the Bayesian technique based on the measured device performance data of the trap from the time (t=0) when the normal device was performed on the trap in the magnetic processing center to the current time (t0) after a preset reference time has elapsed, to generate a trend line (solid line in the graph) of the device performance of the trap that will deteriorate in the future at a specific time in the future (t). l ) can be estimated up to a specific time in the future (t) from the trend line of the trap's element performance. l ) The performance of the device takes the form of a probability density distribution function due to the uncertainty contained in the measurement data. At this time, the prediction accuracy improves as the measured device performance data accumulates.

[0185] At the initial stage (t=0) when normal operation of the trap is performed, there is no significant difference between the performance of the device according to the embodiment of the present invention and the performance of the device according to the existing method. However, as the operation time of the trap passes the reference time and reaches the current time (t0), it can be confirmed that the difference between the performance of the devices of the two methods gradually increases.

[0186] In Fig. 8, the threshold of the performance of the vessel's components is indicated by a dotted line. When the performance of the vessel's components deteriorates over time and reaches the threshold, self-processing is essential for stable operation of the vessel. Here, the computing device (12) can predict the remaining life of the vessel's component performance based on the trend line of the vessel's component performance. The computing device (12) can predict the remaining life of the vessel's component performance through mathematical expression 9.

[0187] (Equation 9)

[0188]

[0189] RUL: Remaining Useful Life of the trap's components

[0190] : Current time after the preset reference time has elapsed

[0191] : The time at which the trap's component performance is expected to reach a preset threshold.

[0192] The computing device (12) is predicted to reach a preset threshold value at a time when the performance of the trap's elements is expected to reach a preset threshold value based on the trend line of the trap's element performance. ) can be known. According to this, it can be seen that the remaining life (RUL) of the element performance of the ship is much longer when using the method according to the embodiment of the present invention than when using the existing method. This is possible because the method according to the embodiment of the present invention monitors the element performance of the ship in real time and compensates for the increase in the magnetic field due to the increase in hull magnetization by a continuous compensation current, thereby continuously maintaining the element performance of the ship.

[0193] Additionally, the computing device (12) can determine the timing of self-treatment of the trap based on the remaining useful life (RUL) of the trap's component performance and perform predictive maintenance.

[0194] Figure 9 is a block diagram showing the configuration of a trap element processing system according to one embodiment of the present invention.

[0195] Referring to FIG. 9, the element processing system (100) of the trap may include an element coil (102), an on-board sensor (104), an off-board sensor (106), a first element control device (108), and a second element control device (110).

[0196] The element coils (102) can be installed in each of the three directions in the trap. The element coils (102) can include one or more vertical coils (V-coil), one or more longitudinal coils (L-coil), and one or more transverse coils (A-coil).

[0197] A plurality of onboard sensors (104) may be installed on the vessel to measure magnetic fields. The locations and number of onboard sensors (104) may be determined based on the magnetization density of the vessel. The onboard sensors (104) may transmit measured magnetic field signals to the first element control device (108) or the second element control device (110). At this time, the magnetic field signals may include identification information of the onboard sensors (104).

[0198] Offboard sensors (106) are installed in multiple locations at preset depths in the magnetic processing station to measure underwater magnetic fields generated by the vessel. The offboard sensors (106) can transmit measured underwater magnetic field information to the first element control device (108). At this time, the underwater magnetic field information may include identification information of the offboard sensors (106).

[0199] The first element control device (108) can perform control related to element processing before operation of the ship in the magnetic processing center. The first element control device (108) is electrically or communicatively connected to the element coil (102), the on-board sensor (104), and the off-board sensor (106), respectively, and can perform element processing control before operation of the ship using these. The first element control device (108) can include a magnetic field separation module (111), an element current calculation module (113), and a reference data generation module (115).

[0200] The magnetic field separation module (111) can separate the underwater magnetic field measured by the offboard sensor (106) into permanent magnetic field, induced magnetic field, and eddy current magnetic field components depending on the cause of generation.

[0201] The element current calculation module (113) can calculate the reference element current and correction factors for element processing according to the magnetic field component, and can calculate the element current for element processing before the ship's operation based on the reference element current and correction factors according to the magnetic field component. The element current calculation module (113) can apply the calculated element current to each element coil (102) of the ship.

[0202] The reference data generation module (115) can generate and store an on-board sensor reference signal and a coil effect sensor signal. The reference data generation module (115) can generate an on-board sensor reference signal by measuring the magnetic field signal of the ship through the on-board sensor (104) when the ship is in a normal element state after the element processing at the magnetic processing center before the ship is operated. The reference data generation module (115) can store a coil effect sensor signal by measuring the magnetic field generated when a preset reference magnetomotive force is applied to the element coil (102) through the on-board sensor (104).

[0203] The second element control device (110) can perform control related to element processing during operation of the ship. The second element control device (110) can include an operation information acquisition module (121), a first compensation current calculation module (123), a second compensation current calculation module (125), an element status judgment module (127), and an element control module (129).

[0204] The navigation information acquisition module (121) can acquire navigation-related information during navigation of a vessel. The navigation-related information may include the vessel's location, course angle, geomagnetic information, and attitude information.

[0205] The first compensation current calculation module (123) can calculate the first compensation current to compensate for the magnetic field generated due to the magnetization change of the hull during operation of the ship. The first compensation current calculation module (123) can update the correction factor for each magnetic field component based on on-board sensor-related signals (on-board sensor measurement signals and on-board sensor reference signals) and ship operation-related information, and calculate the first compensation current based on the reference element current for each magnetic field component and the updated correction factors.

[0206] The second compensation current calculation module (125) can calculate a second compensation current to compensate for a magnetic field corresponding to an on-board sensor signal change when the on-board sensor signal change during operation of the vessel is outside a preset allowable range. In addition, the second compensation current calculation module (125) can calculate a second compensation current to restore the element state of the vessel to a normal element state when the element state of the vessel is not a normal element state during operation of the vessel.

[0207] The element status judgment module (127) can judge the element status of the trap. The element status judgment module (127) can judge the element status of the trap as an incomplete element status (first incomplete element status to third incomplete element status) or a normal element status based on each of the DC component and AC component of the on-board sensor reference signal and the on-board sensor measurement signal.

[0208] The decomposition control module (129) can perform decomposition processing during operation of the ship by using at least one of the first compensation current and the second compensation current. The decomposition control module (129) can perform decomposition processing during operation of the ship by applying the first compensation current to the decomposition coil (102) of the ship. The decomposition control module (129) can perform decomposition processing during operation of the ship by applying the second compensation current to the decomposition coil (102) of the ship. The decomposition control module (129) can perform decomposition processing during operation of the ship by applying a mixed compensation current that combines the first compensation current and the second compensation current to the decomposition coil (102) of the ship.

[0209] The device performance prediction module (131) can predict device performance over time after performing degaussing on a ship. The device performance prediction module (131) can predict device performance over time based on device performance data measured from the time of performing degaussing on the ship to a preset reference time. The device performance prediction module (131) can predict the remaining lifespan until the device performance of the ship reaches a preset threshold from the reference time.

[0210] As used herein, the term "module" may refer to a functional and structural combination of hardware for implementing the technical concepts of the present invention and software for operating the hardware. For example, the term "module" may refer to a logical unit of a given code and the hardware resources required to execute the given code, and does not necessarily refer to physically connected code or a single type of hardware.

[0211] While representative embodiments of the present invention have been described in detail above, those skilled in the art will appreciate that various modifications to the above-described embodiments are possible without departing from the scope of the present invention. Therefore, the scope of the present invention should not be limited to the described embodiments, but should be defined not only by the claims set forth below but also by equivalents thereof.

Claims

1. One or more processors, and A method performed on a computing device having a memory storing one or more programs executed by one or more processors, A step for performing pre-ship operation element processing in a self-processing facility; A step of calculating a first compensation current for compensating for a magnetic field generated during operation of the vessel based on vessel operation-related information of the vessel; and A method for processing elements of a vessel, comprising a step of generating a second compensation current for compensating for a magnetic field generated during operation according to an occurrence of a preset event during operation of the vessel.

2. In claim 1, The step of performing the above trap operation pre-processing is as follows: A step of measuring the underwater magnetic field of the vessel through an offboard sensor installed at a preset depth; A step of dividing the measured underwater magnetic field into permanent magnetic field, induced magnetic field, and eddy current magnetic field components according to their causes; A step of calculating a reference element current for element processing and a correction factor for correcting the reference element current for each of the separated magnetic field components; and A method for processing elements of a warship, comprising a step of calculating element current for element processing prior to warship operation based on reference element current and correction factors for each magnetic field component.

3. In claim 2, The above reference element current is, It comprises a first reference element current for canceling the permanent magnetic field component, a second reference element current for canceling the induced magnetic field component, and a third reference element current for canceling the eddy current magnetic field component. The above correction factor is, A method for processing elements of a trap, comprising a first correction factor for correcting the first reference element current, a second correction factor for correcting the second reference element current, and a third correction factor for correcting the third reference element current.

4. In claim 3, The step of calculating the first compensation current is: Step of acquiring onboard sensor related signals; A step of updating the first correction factor to the third correction factor based on the onboard sensor related signal and the ship operation related information; and A method for processing elements of a trap, comprising the step of calculating the first compensation current based on the reference element current for each magnetic field component, the updated first correction factor, the updated second correction factor, and the updated third correction factor.

5. In claim 4, A method for processing elements of a trap, wherein the first compensation current is calculated by the following mathematical formula. (mathematical formula) : First compensation current of the kth element coil : The first reference element current of the kth element coil : The second reference element current of the kth element coil : The third reference element current of the kth element coil : Updated first correction factor : Updated second correction factor : Updated 3rd correction factor 6. In claim 1, The above event occurs when the element status of the above trap is not a normal element status. The step of calculating the second compensation current is: A step of respectively acquiring an on-board sensor reference signal and an on-board sensor measurement signal; and A step of determining whether the state of the trap's components is a normal state based on a change in the on-board sensor signal corresponding to a difference between the on-board sensor reference signal and the on-board sensor measurement signal is included. The above on-board sensor reference signal is a magnetic field signal measured by an on-board sensor installed on the vessel when the vessel is in a normal element state after element processing prior to vessel operation. A method for processing elements of a vessel, wherein the on-board sensor measurement signal is a magnetic field signal measured by the on-board sensor during operation of the vessel.

7. In claim 6, The step of checking whether the above normal component status is as follows: A method for processing elements of a vessel, wherein if the difference between the on-board sensor reference signal and the on-board sensor measurement signal is within a preset allowable range, the element state of the vessel is determined to be a normal element state, and if the difference is outside the allowable range, the element state of the vessel is determined to be not a normal element state.

8. In claim 7, The above first compensation current is, A method for processing elements of a trap, which is constantly produced when the element status of the above trap is a normal element status.

9. In claim 6, The step of calculating the second compensation current is: A method for processing elements of a trap, further comprising the step of calculating an on-board sensor assumption signal value predicted to be measured by the on-board sensor when assuming that an arbitrary magnetic force is applied to the element coil of the trap if the element state of the trap is not a normal element state.

10. In claim 9, The above on-board sensor assumption signal values ​​are: A method for processing elements of a trap, wherein the coil effect sensor signal, which is a magnetic field signal measured by the on-board sensor when a preset reference magnetic force is applied to the element coil, is calculated based on the ratio between the reference magnetic force and an arbitrary magnetic force.

11. In claim 10, The step of calculating the second compensation current is: A step of calculating a diagnostic magnetic force, which is an arbitrary magnetic force that minimizes the difference between the on-board sensor signal change and the on-board sensor assumed signal value, in a state where there is no preset magnetic force constraint condition; and A method for processing elements of a trap, further comprising the step of setting the current according to the calculated diagnostic magnetic force as the second compensation current when the sum of the calculated diagnostic magnetic force and the magnetic force due to the first compensation current satisfies the magnetic force constraint condition.

12. In claim 11, The method of processing the above trap elements is as follows: In a case where the sum of the above-described diagnostic magnetic force and the magnetic force due to the first compensation current does not satisfy the magnetic force constraint condition, a step of calculating an arbitrary magnetic force that minimizes the difference between the on-board sensor signal change and the on-board sensor assumed signal value under a state where a preset magnetic force constraint condition exists; and A method for processing elements of a trap, further comprising the step of setting the current according to the above-described magnetic force as a second compensation current.

13. In claim 10, The step of calculating the second compensation current is: A step of calculating an arbitrary magnetic force such that the difference between the on-board sensor reference signal and the on-board sensor assumed signal value is minimized under a condition where a preset magnetic force constraint condition exists; and A method for processing elements of a trap, further comprising the step of setting the current according to the above-described magnetic force as a second compensation current to restore the element state of the trap to a normal element state.

14. In claim 1, The method of processing the above trap elements is as follows: A step of respectively acquiring an on-board sensor reference signal and an on-board sensor measurement signal; and Further comprising a step of determining the status of the elements of the trap based on the on-board sensor reference signal and the on-board sensor measurement signal; The above on-board sensor reference signal is a magnetic field signal measured by an on-board sensor installed on the vessel when the vessel is in a normal element state after element processing prior to vessel operation. A method for processing elements of a vessel, wherein the on-board sensor measurement signal is a magnetic field signal measured by the on-board sensor during operation of the vessel.

15. In claim 14, The step of judging the status of the above trap elements is: A step of dividing the on-board sensor reference signal and the on-board sensor measurement signal into a direct current component and an alternating current component, respectively; and A method for processing elements of a vessel, comprising the step of comparing the DC component and AC component of the on-board sensor reference signal with the DC component and AC component of the on-board sensor measurement signal, respectively, to determine the element status of the vessel.

16. In claim 15, The step of judging the status of the above trap elements is: A step of checking whether the difference between the DC component of the on-board sensor measurement signal and the DC component of the on-board sensor reference signal is within a preset first allowable range; If the difference in the DC component is outside the first allowable range, a step of checking whether the difference in the DC component is within a preset second allowable range; and A method for processing elements of a trap, comprising a step of determining that the element state of the trap is a first imperfect element state that requires compensation for a permanent magnetic field when the difference in the DC component is within the second allowable range.

17. In claim 16, The step of judging the status of the above trap elements is: A method for processing elements of a trap, further comprising the step of determining that the element state of the trap is a second imperfect element state that requires compensation for the induced magnetic field when the difference of the DC component is outside the second allowable range.

18. In claim 17, The step of judging the status of the above trap elements is: If the difference of the DC component is within a preset first tolerance range, a step of checking whether the difference between the AC component of the on-board sensor measurement signal and the AC component of the on-board sensor reference signal is within a preset third tolerance range; and A method for processing elements of a trap, further comprising the step of determining that the element state of the trap is a third imperfect element state that requires compensation for an eddy current magnetic field when the difference of the above-mentioned AC components is outside a preset third tolerance range.

19. In claim 1, The above first compensation current is constantly calculated when the element state of the trap is in a normal element state, The above event occurs when the state of the trap's elements is not a normal state. The method of processing the above trap elements is as follows: A step of calculating a mixed compensation current by adding the first compensation current and the second compensation current; and A method for processing elements of a trap, further comprising the step of applying the above-mentioned mixed compensation current to the element coil.

20. In claim 1, The method of processing the above trap elements is as follows: A step of measuring a magnetic field distributed at a specific depth prior to element processing in the above magnetic processing plant; A step of measuring a magnetic field distributed at a specific depth during the operation of the ship after the element is processed in the magnetic processing plant; and A method for degaussing a vessel, further comprising a step of evaluating degaussing performance according to the operating time of the vessel based on a ratio between a magnetic field distributed at a specific depth before the degaussing and a magnetic field distributed at a specific depth after the degaussing.

21. In claim 20, The method of processing the above trap elements is as follows: A step of measuring the performance of the elements of the trap from the time when the element processing is performed in the magnetic processing station to the preset reference time; and A method for processing a device of a trap, further comprising a step of predicting the performance of the device of the trap until a specific time in the future after the reference time based on data on the performance of the device of the trap measured from the time at which the device processing is performed to the reference time.

22. In claim 21, The method of processing the above trap elements is as follows: A method for processing elements of a trap, further comprising the step of predicting at least one of the remaining lifespan of element performance of the trap and the self-processing time from the reference time based on the element performance of the trap predicted up to the specific time in the future.

23. A device for processing elements of a ship, including a first device control device for performing control related to element processing before operation of the ship in a magnetic processing station, and a second device control device for performing control related to element processing during operation of the ship. The above first element control device, The underwater magnetic field of the ship is measured through an offboard sensor installed at a preset depth in a magnetic processing station, a demagnetization current is calculated to offset the measured underwater magnetic field, and the calculated demagnetization current is applied to a demagnetization coil installed on the ship to perform demagnetization processing before the ship's operation. The second element control device, A device for processing elements of a vessel, which calculates a first compensation current for compensating for a magnetic field generated during operation of the vessel based on vessel operation-related information of the vessel, and calculates a second compensation current for compensating for a magnetic field generated during operation according to the occurrence of a preset event during operation of the vessel.

24. Element coil installed in the trap; An onboard sensor installed in the above trap to measure the magnetic field; Offboard sensors installed at preset depths in the magnetic processing plant to measure magnetic fields; A first element control device that measures the underwater magnetic field of the ship through the offboard sensor in the magnetic processing station, calculates an element current to offset the measured underwater magnetic field, and applies the calculated element current to the element coil to perform element processing before ship operation; and A vessel element processing system, comprising a second element control device that calculates a first compensation current for compensating for a magnetic field generated during operation of the vessel based on vessel operation-related information of the vessel, and calculates a second compensation current for compensating for a magnetic field generated during operation according to the occurrence of a preset event during operation of the vessel, thereby performing element processing during vessel operation.

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