Method for testing storage device, and electronic device and storage medium

Abstract

The present application relates to the field of testing. Provided are a method for testing a storage device, and an electronic device and a storage medium. The method comprises: performing a preset number of erase tests on a storage device or a first risky physical block, and identifying a second risky physical block and first abnormal physical blocks from the storage device or the first risky physical block; performing a wear test on the second risky physical block, and identifying second abnormal physical blocks from the second risky physical block; and determining a test result of the storage device on the basis of the number of first abnormal physical blocks and the number of second abnormal physical blocks. The method can improve the efficiency of testing storage devices while ensuring the outgoing quality of the storage devices.

Description

Storage device testing method, electronic device, and storage medium

[0001] This application claims priority to the Chinese patent application filed with the China Patent Office on January 10, 2024, with application number 202410040076.0, and invention name “Storage Device Testing Method, Electronic Device and Storage Medium”, all contents of which are incorporated by reference into this application. Technical Field

[0002] The present application relates to the field of testing technology, and in particular to a storage device testing method, electronic equipment, and storage medium. Background Art

[0003] Storage devices (such as NAND flash memory) may have defects that may cause functional failures due to process fluctuations and other issues. To ensure the factory quality of storage devices, storage devices are usually tested before leaving the factory.

[0004] Currently, a full disk wear method is usually used to perform factory testing on storage devices. However, since this method requires the storage device to be erased and written multiple times and each erase and write takes a long time, the test efficiency is low.

[0005] Summary of the Invention

[0006] In view of the above, it is necessary to provide a storage device testing method, electronic device and storage medium, which can solve the technical problem of how to improve the testing efficiency of storage devices while ensuring the factory quality of storage devices.

[0007] A first aspect of the present application provides a storage device testing method, which is applied to an electronic device, wherein the electronic device includes a storage device, and the storage device testing method includes: performing a preset number of erase and write tests on the storage device or a first risk physical block in the storage device that meets a first preset condition, identifying a first abnormal physical block and a second risk physical block that meets a second preset condition from the storage device or the first risk physical block, the erase and write test including a Flash Write operation; performing a wear test on the second risk physical block, identifying a second abnormal physical block from the second risk physical block; and determining the test result of the storage device based on the number of the first abnormal physical blocks and the second abnormal physical blocks.

[0008] The second aspect of the present application provides an electronic device, which includes a processor and a storage device, and the processor is used to execute computer-readable instructions stored in the storage device to implement the following steps: performing a preset number of erase and write tests on the storage device or a first risk physical block in the storage device that meets a first preset condition, identifying a first abnormal physical block and a second risk physical block that meets a second preset condition from the storage device or the first risk physical block, the erase and write test including a Flash Write operation; performing a wear test on the second risk physical block, identifying a second abnormal physical block from the second risk physical block; and determining the test result of the storage device based on the number of the first abnormal physical blocks and the second abnormal physical blocks.

[0009] The third aspect of the present application provides a computer-readable storage medium, on which at least one computer-readable instruction is stored, and the at least one computer-readable instruction is executed by a processor to implement the following steps: performing a preset number of erase and write tests on the storage device or a first risk physical block in the storage device that meets a first preset condition, identifying a first abnormal physical block and a second risk physical block that meets a second preset condition from the storage device or the first risk physical block, the erase and write test including a Flash Write operation; performing a wear test on the second risk physical block, identifying a second abnormal physical block from the second risk physical block; and determining the test result of the storage device based on the number of the first abnormal physical blocks and the second abnormal physical blocks.

[0010] The fourth aspect of the present application provides a storage device testing device, which runs on an electronic device, wherein the electronic device includes a storage device, and the storage device testing device includes: a testing unit, which is used to perform a preset number of erase and write tests on the storage device or a first risk physical block in the storage device that meets a first preset condition, and identify a first abnormal physical block and a second risk physical block that meets a second preset condition from the storage device or the first risk physical block, and the erase and write test includes a Flash Write operation; the testing unit is also used to perform a wear test on the second risk physical block and identify a second abnormal physical block from the second risk physical block; and a determination unit is used to determine the test result of the storage device based on the number of the first abnormal physical blocks and the second abnormal physical blocks.

[0011] As can be seen from the above technical solutions, the embodiments of the present application perform an erase and write test on the storage device or the first risk physical block. Since the Flash Write operation is a write operation performed on all word lines of the entire physical block in the storage device, it is possible to improve the erase and write efficiency of the storage device, thereby improving the testing efficiency of the storage device. In addition, by further performing a wear test on the second risk physical block, the second abnormal physical block can be accurately identified, thereby improving the accuracy of the test results and ensuring the product quality of the storage device. Therefore, the embodiments of the present application achieve the goal of improving the testing efficiency of the storage device while ensuring the product quality of the storage device. BRIEF DESCRIPTION OF THE DRAWINGS

[0012] FIG1 is a schematic structural diagram of an electronic device for implementing a storage device testing method provided in an embodiment of the present application.

[0013] FIG2 is a flowchart of a storage device testing method provided in an embodiment of the present application.

[0014] FIG3 is a schematic diagram of a first curve and a second curve provided in an embodiment of the present application.

[0015] FIG4 is a voltage diagram of an erase test and a wear test provided in an embodiment of the present application.

[0016] FIG5 is a flowchart of a storage device testing method provided by another embodiment of the present application.

[0017] FIG6 is a functional module diagram of a storage device testing apparatus provided in an embodiment of the present application. DETAILED DESCRIPTION

[0018] In order to make the objectives, technical solutions and advantages of this application clearer, this application is described in detail below with reference to the accompanying drawings and specific embodiments.

[0019] It should be noted that in this application, "at least one" means one or more, and "more than one" means two or more than two. "And / or" describes the association relationship of associated objects, indicating that three relationships may exist. For example, A and / or B can mean: A exists alone, A and B exist at the same time, and B exists alone, where A and B can be singular or plural. The terms "first", "second", "third", "fourth", etc. (if any) in the specification, claims and drawings of this application are used to distinguish similar objects, rather than to describe a specific order or sequence.

[0020] In the embodiments of the present application, words such as "exemplary" or "for example" are used to indicate examples, illustrations, or descriptions. Any embodiment or design described as "exemplary" or "for example" in the embodiments of the present application should not be interpreted as being more preferred or more advantageous than other embodiments or designs. Specifically, the use of words such as "exemplary" or "for example" is intended to present related concepts in a concrete manner. The following embodiments and features in the embodiments may be combined with each other unless there is a conflict.

[0021] As shown in FIG1 , it is a schematic diagram of the structure of an electronic device for implementing a storage device testing method provided in an embodiment of the present application.

[0022] In an embodiment of the present application, a storage device testing method is applied to one or more electronic devices 1. The electronic device 1 is a device that can automatically perform numerical calculations and / or information processing according to pre-set or stored computer-readable instructions. Its hardware includes but is not limited to a microprocessor, an application-specific integrated circuit (ASIC), a field-programmable gate array (FPGA), a digital signal processor (DSP), an embedded device, etc.

[0023] The electronic device 1 can be any electronic product that can interact with a user, such as a personal computer, a tablet computer, a smart phone, a personal digital assistant (PDA), a game console, an interactive network television (IPTV), a smart wearable device, etc.

[0024] The electronic device 1 may include a network device and / or a user device, wherein the network device includes, but is not limited to, a single network electronic device, a group of electronic devices consisting of multiple network electronic devices, or a cloud based on cloud computing consisting of a large number of hosts or network electronic devices.

[0025] The network where the electronic device 1 is located includes, but is not limited to: the Internet, a wide area network, a metropolitan area network, a local area network, a virtual private network (VPN), etc.

[0026] In the embodiment of the present application, the electronic device 1 includes, but is not limited to, a storage device 12, a processor 13, and computer-readable instructions stored in the storage device 12 and executable on the processor 13, such as a storage device test program.

[0027] Those skilled in the art will understand that the schematic diagram is merely an example of the electronic device 1 and does not constitute a limitation on the electronic device 1. The electronic device 1 may include more or fewer components than shown in the figure, or a combination of certain components, or different components. For example, the electronic device 1 may also include input and output devices, network access devices, buses, etc.

[0028] The processor 13 may be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. A general-purpose processor may be a microprocessor, a processor, or any conventional processor. The processor 13 is the computing core and control center of the electronic device 1, connecting various parts of the entire electronic device 1 using various interfaces and lines, and executing the operating system of the electronic device 1 as well as various installed applications and program codes.

[0029] The storage device 12 may be an external storage device and / or an internal storage device of the electronic device 1. Furthermore, the storage device 12 may be a physical storage device, such as a memory stick, a TF card (Trans-flash Card), and the like.

[0030] 2 , the storage device 12 in the electronic device 1 stores computer-readable instructions, and the processor 13 can execute the computer-readable instructions stored in the storage device 12 to implement the storage device testing method shown in FIG. 2 .

[0031] FIG2 is a flowchart of a storage device testing method according to an embodiment of the present application. The storage device testing method is applied to an electronic device (e.g., electronic device 1 in FIG1 ) that runs a storage device. The order of the steps in the flowchart may be changed, and some steps may be omitted, depending on different requirements.

[0032] 201 : Perform a preset number of erase and write tests on a storage device, and identify a first abnormal physical block and a second risk physical block that meets a second preset condition from the storage device.

[0033] In at least one embodiment of the present application, the storage device may be a NAND flash memory (Solid State Drive, SSD). NAND flash memory has a larger capacity than NOR flash memory. NAND flash memory may include multiple blocks, each of which may include multiple word lines (WL). For example, block 1 includes WL0, WL1, WL2, ..., WLn.

[0034] In at least one embodiment of the present application, the preset number of times is typically less than a certain number, for example, less than 100 times. By limiting the value of the preset number of times, the lifespan of the storage device can be ensured. Factors determining the preset number of times include: the expected test duration, the efficiency of performing erase and write tests on the storage device, and the ratio factor between erase and write tests and wear tests.

[0035] The proportional factor indicates the ratio of the effect of the erase test to the wear test. The electronic device determines the first configuration times from the first curve according to the target error-correctable parameter value, and determines the second configuration times from the second curve according to the target error-correctable parameter value. Further, the electronic device determines the proportional factor of the erase test to the wear test according to the ratio of the first configuration times to the second configuration times. Among them, the target error-correctable parameter value can be set according to the user's test requirements for the storage device. For example, the target error-correctable parameter value can be set to 40. The determination of the proportional factor is illustrated in conjunction with Figure 3. If the target error-correctable parameter value is 40, the first configuration times determined from the first curve are 225, and the second configuration times determined from the second curve are 180. After determination, the proportional factor is 1.25, that is, the effect of 1.25 erase tests is equivalent to the effect of 1 full disk wear. The first curve and the second curve constructed in this application can quickly determine the first configuration times and the second configuration times, thereby improving the efficiency of determining the proportional factor.

[0036] Specifically, the electronic device performs multiple rounds of erase / write tests on a first storage device and multiple rounds of wear tests on a second storage device. The device types of the first and second storage devices are the same as the storage device. Furthermore, the electronic device bakes the first storage device after each round of erase / write tests and reads the first error-correctable parameters of the first storage device after each bake-out. Simultaneously, the electronic device bakes the second storage device after each round of wear tests and reads the second error-correctable parameters of the second storage device after each bake-out. Furthermore, the electronic device generates a first erase / write test curve based on the multiple first error-correctable parameters and the number of erase / write cycles on the first storage device, and generates a second wear test curve based on the multiple second error-correctable parameters and the number of wear cycles on the second storage device. The electronic device can control a bake-out device to bake the first storage device after the erase / write test and the second storage device after the wear test. The electronic device can control the bake-out device to bake the first storage device after the erase / write test and the second storage device after the wear test. The electronic device can control the bake-out device to bake the first storage device after the erase / write test and the second storage device after the wear test. The electronic device can control the bake-out device to bake at a temperature of 125°C and for a baking time of 3 hours. The first and second curves are illustrated with reference to FIG3 . The abscissa of the first and second curves represents the number of tests, and the ordinate represents the error-correctable parameters.

[0037] The present application controls the device types of the first storage device and the second storage device to be the same as the device types of the storage devices, thereby avoiding the problem of unreasonable preset times due to different device types. By baking the first storage device after each round of erase and write test and the second storage device after the wear test, the first error-correctable parameter and the second error-correctable parameter can be expanded at the same time, thereby avoiding the inability to accurately generate the first curve and the second curve due to reading errors of the first error-correctable parameter and the second error-correctable parameter, thereby improving the generation accuracy of the first curve and the second curve.

[0038] In at least one embodiment of the present application, the erase test includes a Flash Write operation and an erase operation, wherein the erase operation indicates the execution of a character erase operation on the storage device, and the Flash Write operation indicates the execution of a character write operation on the storage device. The Flash Write operation can ensure that the storage device is not damaged when writing virtual data to the storage device. The second preset condition can be set to a physical block that passes the erase test, the second risk physical block is a physical block that can successfully execute the erase operation and the Flash Write operation, and the first abnormal physical block is a physical block that cannot successfully execute the erase operation or the Flash Write operation.

[0039] In another embodiment, the proportional factor can also be determined based on the ratio of the number of times the erase test and the wear test are performed at the same voltage value. A voltage diagram for the erase test and the wear test is described with reference to FIG4 . FIG4 illustrates the voltage conditions after programming and erasing in a full-disk SLC wear test on a storage device. FIG4 also illustrates the voltage conditions after a Flash Write operation on the storage device, wherein the voltage after the Flash Write operation is between the erase state and the programmed state in the full-disk SLC wear test.

[0040] 202 : Perform a wear test on the second risk physical block and identify a second abnormal physical block from the second risk physical block.

[0041] In at least one embodiment of the present application, the wear test includes an erase operation, a write operation, and a read operation. The wear test includes a single-chip wear test and a multi-chip wear test. According to the actual production situation, the second risk physical block is subjected to a full-disk SLC wear test, or the second risk physical block is subjected to a full-disk TLC wear test. The number of wear tests can be set according to the expected test duration of the storage device. For example, the number of wear tests can usually be set to 1 or 2 times. The second abnormal physical block is a physical block that cannot successfully perform an erase operation, a write operation, or a read operation. By further performing a wear test on the second risk physical block, the present application can avoid the omission of the second abnormal physical block due to the inability of the erase and write test to fully identify the bad block, thereby improving the comprehensiveness of the identification of bad blocks in the storage device.

[0042] Specifically, the electronic device performs a wear test on the second risk physical block, and identifies the second abnormal physical block from the second risk physical block, including: the electronic device performs a character erasure operation on the second risk physical block, and if the character erasure operation on the second risk physical block is successful, writes a preset character to the second risk physical block; if the preset character is successfully written to the second risk physical block, reads the character from the second risk physical block; if the character is successfully read from the second risk physical block, compares the read character with the preset character, and if the read character is the same as the preset character, determines that the second risk physical block is a normal physical block; if the read character is different from the preset character, counts the number of characters that do not match the preset character, and if the number is greater than or equal to the ECC threshold, determines that the second risk physical block is a second abnormal physical block.

[0043] In one embodiment, the electronic device performs a full wear test on the second risk physical block and identifies the second abnormal physical block from the second risk physical block. By performing a full wear test on the second risk physical block, the present application can improve the accuracy of identifying the second abnormal physical block.

[0044] In another embodiment, the electronic device performs a full disk wear test on the second risk physical block.

[0045] 203 : Determine a test result of the storage device according to the number of the first abnormal physical blocks and the second abnormal physical blocks.

[0046] In at least one embodiment of the present application, the test result includes: the storage device is an abnormal device, and the storage device is a normal device.

[0047] In at least one embodiment of the present application, the electronic device determines the test result of the storage device based on the number of the first abnormal physical blocks and the second abnormal physical blocks, including: the electronic device counts the number of the first abnormal physical blocks and the second abnormal physical blocks as the total number of abnormalities, and if the total number of abnormalities is greater than or equal to a preset number, the electronic device determines that the storage device is an abnormal device. If the total number of abnormalities is less than the preset number, the electronic device determines that the storage device is a normal device. The preset number can be set according to actual needs, for example, the preset number is 20.

[0048] As can be seen from the above technical solutions, the embodiments of the present application perform erase and write tests on the storage device. Since the Flash Write operation performs write operations on all word lines of an entire physical block in the storage device, it is possible to improve the erase and write efficiency of the storage device, thereby improving the testing efficiency of the storage device. In addition, by further performing a wear test on the second risk physical block, the second abnormal physical block can be accurately identified, thereby improving the accuracy of the test results and ensuring the product quality of the storage device. Therefore, the embodiments of the present application achieve the goal of improving the testing efficiency of the storage device while ensuring the product quality of the storage device.

[0049] FIG5 is a flowchart of a storage device testing method according to another embodiment of the present application. The storage device testing method is applied to an electronic device (e.g., electronic device 1 in FIG1 ) that runs a storage device. The order of the steps in the flowchart may be changed, and some steps may be omitted, depending on different requirements.

[0050] 501 , performing a wear test on a storage device, and identifying a physical block in the storage device that meets a first preset condition as a first risk physical block.

[0051] In at least one embodiment of the present application, the first preset condition may be set to a physical block that has passed a wear test, and the first risk physical block is a physical block that has passed a wear test in the storage device.

[0052] In at least one embodiment of the present application, before performing a wear test on a storage device and identifying a physical block from the storage device that meets a first preset condition as a first risk physical block, the electronic device obtains a test requirement, the test requirement including an expected test duration. If the test requirement includes packaging testing of the storage device, the electronic device performs a wear test on the storage device and identifies a physical block from the storage device that meets the first preset condition as a first risk physical block. If the test requirement does not include packaging testing, the electronic device compares the expected test duration with a preset duration. If the expected test duration is less than the preset duration, the electronic device performs a wear test on the storage device and identifies a physical block from the storage device that meets the first preset condition as a first risk physical block. If the expected test duration is greater than or equal to the preset duration, the electronic device does not perform a wear test on the storage device. The expected test duration is an estimated duration for testing the storage device. The expected test duration can be determined based on the duration of previous actual erase and write tests on the storage device. The preset duration is set by the user based on actual needs. For example, the expected test duration can be set to 100s, and the preset duration can be set to 120s. When the test requirements include packaging testing of storage devices, this application can identify physical blocks with packaging problems from the storage device by performing a wear test on the storage device. When the test requirements do not include packaging testing, by comparing the expected test duration with a preset duration, and then performing a wear test on the storage device when the expected test duration is less than the preset duration, it can identify more abnormal physical blocks from the storage device when there is ample testing time, thereby improving the accuracy of the test results.

[0053] In at least one embodiment of the present application, the electronic device performs a wear test on the storage device, and identifying a physical block that meets a first preset condition as a first risk physical block from the storage device includes:

[0054] The electronic device performs a wear test on all physical blocks in the storage device and determines the physical blocks that pass the wear test as first risk physical blocks that meet the first preset condition. Specifically, the manner in which the electronic device performs a wear test on each physical block in the storage device can be referred to as the manner in which the electronic device performs a wear test on the second risk physical block in FIG. 2 above, and will not be repeated here.

[0055] 502 , performing a preset number of erase and write tests on the first risk physical block, and identifying a first abnormal physical block and a second risk physical block meeting a second preset condition from the first risk physical block.

[0056] 503 , perform a wear test on the second risk physical block, and identify a second abnormal physical block from the second risk physical block.

[0057] 504 : Determine a test result of the storage device according to the number of the first abnormal physical blocks and the second abnormal physical blocks.

[0058] The details of steps 502-504 can be found in the detailed description of steps 201-203 in FIG. 2 above, and will not be repeated here.

[0059] By performing a wear test on the storage device, the embodiment of the present application can identify more abnormal physical blocks from the storage device when there is sufficient test time or there is a need for packaging testing of the storage device, thereby improving the accuracy of the test results.

[0060] Figure 6 shows a functional block diagram of a storage device testing apparatus provided in an embodiment of the present application. The storage device testing apparatus 11 operates on an electronic device that includes a storage device. The storage device testing apparatus 11 includes a testing unit 110, a determining unit 111, an acquiring unit 112, a comparing unit 113, a reading unit 114, and a generating unit 115. A module / unit as referred to herein refers to a series of computer-readable instruction segments that can be acquired by the processor 13 and that can perform a fixed function, and is stored in the storage device 12.

[0061] The test unit 110 is used to perform a preset number of erase and write tests on the storage device or a first risk physical block in the storage device that meets the first preset condition, and identify a first abnormal physical block and a second risk physical block that meets the second preset condition from the storage device or the first risk physical block. The erase and write test includes a Flash Write operation. The test unit 110 is also used to perform a wear test on the second risk physical block and identify a second abnormal physical block from the second risk physical block. The determination unit 111 is used to determine the test result of the storage device based on the number of the first abnormal physical blocks and the second abnormal physical blocks.

[0062] The testing unit 110 is further configured to perform a wear test on the storage device, and identify physical blocks that meet a first preset condition from the storage device as first risk physical blocks.

[0063] The acquisition unit 112 is used to obtain the test requirements, which include the expected test duration; the comparison unit 113 is used to compare the expected test duration with the preset duration if the test requirements do not include a packaging test on the storage device; the test unit 110 is also used to perform a wear test on the storage device if the expected test duration is less than the preset duration or if the test requirements include a packaging test, and identify a physical block that meets the first preset condition from the storage device as a first risk physical block; or the test unit 110 is also used to not perform a wear test on the storage device if the expected test duration is greater than or equal to the preset duration.

[0064] The testing unit 110 is further configured to perform multiple rounds of erase and write tests on the first storage device, and multiple rounds of wear tests on the second storage device, wherein the device types of the first storage device and the second storage device are respectively the same as the device types of the storage devices; the reading unit 114 is configured to perform baking treatment on the first storage device after each round of erase and write tests, and read the first error-correctable parameters of the first storage device after each baking treatment; the reading unit 114 is further configured to perform baking treatment on the second storage device after each round of wear tests, and read the second error-correctable parameters of the second storage device after each baking treatment; the generating unit 115 is configured to generate a first curve of the erase and write test based on a plurality of first error-correctable parameters and the number of erase and write times of the first storage device, and to generate a second curve of the wear test based on a plurality of second error-correctable parameters and the number of wear times of the second storage device.

[0065] The acquisition unit 111 is used to determine the first configuration times from the first curve according to the target error-correctable parameter value, and to determine the second configuration times from the second curve according to the target error-correctable parameter value; the determination unit 111 is also used to determine the proportional factor of the erase test and the wear test according to the ratio of the first configuration times to the second configuration times.

[0066] If the modules / units integrated in the electronic device 1 are implemented in the form of software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the present application implements all or part of the processes in the above-mentioned embodiment method, and can also instruct the relevant hardware to complete them through computer-readable instructions. The computer-readable instructions can be stored in a computer-readable storage medium. When the computer-readable instructions are executed by the processor, the steps of the above-mentioned method embodiments can be implemented.

[0067] Computer-readable instructions include computer-readable instruction codes, which may be in source code form, object code form, executable files, or some intermediate form. Computer-readable media may include any entity or device capable of carrying computer-readable instruction codes, recording media, USB flash drives, mobile hard drives, magnetic disks, optical disks, computer memory, read-only memory (ROM), and random access memory (RAM).

[0068] The storage device 12 can be used to store computer-readable instructions and / or modules. The processor 13 implements various functions of the electronic device 1 by running or executing the computer-readable instructions and / or modules stored in the storage device 12, and by accessing data stored in the storage device 12. The storage device 12 may primarily include a program storage area and a data storage area. The program storage area may store an operating system, at least one application required for a function (such as a sound playback function, an image playback function, etc.), and the data storage area may store data created based on the use of the electronic device. The storage device 12 may include non-volatile and volatile storage devices, such as a hard disk, memory, a plug-in hard disk, a Smart Media Card (SMC), a Secure Digital (SD) card, a flash card, at least one disk storage device, a flash memory device, or other storage devices.

[0069] Exemplarily, the computer-readable instructions may be divided into one or more modules / units, one or more of which are stored in the storage device 12 and executed by the processor 13 to complete the present application. One or more modules / units may be a series of computer-readable instruction segments capable of completing a specific function, and the computer-readable instruction segments are used to describe the execution process of the computer-readable instructions in the electronic device 1. For example, the computer-readable instructions may be divided into a testing unit 110, a determining unit 111, an acquiring unit 112, a comparing unit 113, a reading unit 114, and a generating unit 115.

[0070] For details about the functions of each module / unit, please refer to the detailed description of Figures 2-6 above, which will not be repeated here.

[0071] In the embodiments of the present application, by performing an erase and write test on the storage device or the first risk physical block, since the Flash Write operation performs a write operation on all word lines of the entire physical block in the storage device, the erase and write efficiency of the storage device can be improved, thereby improving the efficiency of the storage device test. Furthermore, by further performing a wear test on the second risk physical block, the second abnormal physical block can be accurately identified, thereby improving the accuracy of the test results and ensuring the product quality of the storage device. Therefore, the embodiments of the present application achieve both ensuring the product quality of the storage device and improving the testing efficiency of the storage device.

[0072] In the several embodiments provided in this application, it should be understood that the disclosed systems, devices, and methods can be implemented in other ways. For example, the device embodiments described above are merely illustrative. For example, the division of modules is merely a logical function division, and other division methods may be used in actual implementation.

[0073] Modules described as separate components may or may not be physically separate, and components shown as modules may or may not be physical units, that is, they may be located in one place or distributed across multiple network elements. Some or all of these modules may be selected to achieve the purpose of this embodiment based on actual needs.

[0074] In addition, the functional modules in the various embodiments of the present application may be integrated into a single processing unit, or each unit may exist physically separately, or two or more units may be integrated into a single unit. The aforementioned integrated units may be implemented in the form of hardware or in the form of hardware plus software functional modules.

[0075] Therefore, the embodiments should be considered in all respects as illustrative and non-restrictive, and the scope of the present application is defined by the appended claims rather than the foregoing description, and all changes that come within the meaning and range of equivalents of the claims are intended to be embraced therein. Any reference to a figure in a claim should not be construed as limiting the claim to which it relates.

[0076] Furthermore, it is clear that the word "comprising" does not exclude other units or steps, and the singular does not exclude the plural. Multiple units or devices may also be implemented by a single unit or device through software or hardware. Terms such as first and second are used to indicate names and do not imply any particular order.

[0077] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present application and are not intended to limit the present application. Although the present application has been described in detail with reference to the preferred embodiments, those skilled in the art should understand that the technical solutions of the present application may be modified or replaced by equivalents without departing from the spirit and scope of the technical solutions of the present application.

Claims

1. A storage device testing method, applied to an electronic device, wherein, The electronic device includes a storage device, and the method for testing the storage device includes: Performing a preset number of erase-write tests on the storage device or a first risky physical block in the storage device that meets a first preset condition, and identifying a first abnormal physical block and a second risky physical block that meets a second preset condition from the storage device or the first risky physical block. The erase-write test includes a Flash Write operation; Performing a wear test on the second risky physical block, and identifying a second abnormal physical block from the second risky physical block; Determining the test result of the storage device according to the quantities of the first abnormal physical block and the second abnormal physical block.

2. The storage device testing method according to claim 1, wherein, Before performing the preset number of erase-write tests on the first risky physical block in the storage device that meets the first preset condition, the method further includes: Performing a wear test on the storage device, and identifying a physical block that meets the first preset condition in the storage device as the first risky physical block.

3. The storage device testing method according to claim 2, wherein, Before performing the wear test on the storage device and identifying a physical block that meets the first preset condition in the storage device as the first risky physical block, the method further includes: Obtaining a test requirement, where the test requirement includes an expected test duration; If the test requirement does not include a package test for the storage device, comparing the expected test duration with a preset duration; If the expected test duration is less than the preset duration or if the test requirement includes the package test, performing a wear test on the storage device and identifying a physical block that meets the first preset condition in the storage device as the first risky physical block; or If the expected test duration is greater than or equal to the preset duration, not performing a wear test on the storage device.

4. The storage device testing method according to claim 2, wherein, The performing a wear test on the storage device and identifying a physical block that meets the first preset condition in the storage device as the first risky physical block includes: Performing the wear test on each physical block in the storage device; Determining a physical block that passes the wear test as the first risky physical block that meets the first preset condition.

5. The storage device testing method according to claim 1, wherein, The method further includes: Performing multiple rounds of erase-write tests on a first storage device and performing multiple rounds of wear tests on a second storage device, where the device types of the first storage device and the second storage device are the same as the device type of the storage device; Performing a baking process on the first storage device after each round of erase-write tests, and reading a first correctable error parameter of the first storage device after each baking process; Performing a baking process on the second storage device after each round of wear tests, and reading a second correctable error parameter of the second storage device after each baking process; Generating a first curve of the erase-write test according to multiple first correctable error parameters and the number of erase-write times of the first storage device, and generating a second curve of the wear test according to multiple second correctable error parameters and the number of wear times of the second storage device.

6. The storage device testing method according to claim 5, wherein, The method further includes: Determine a first configuration time from the first curve according to the target correctable parameter value, and determine a second configuration time from the second curve according to the target correctable parameter value; Determine a scale factor of the erase test and the wear test according to a ratio of the first configuration time to the second configuration time.

7. The storage device testing method according to claim 6, wherein, Determining factors of the preset number of times include the scale factor.

8. The storage device testing method according to claim 1, wherein, The determining the test result of the storage device according to the number of the first abnormal physical blocks and the second abnormal physical blocks includes: Count the number of the first abnormal physical blocks and the second abnormal physical blocks as the total number of abnormalities; If the total number of abnormalities is greater than or equal to the preset number, determine that the storage device is an abnormal device; or If the total number of abnormalities is less than the preset number, determine that the storage device is a normal device.

9. An electronic device, wherein, The electronic device includes a processor and a storage device, and the processor is configured to execute at least one computer-readable instruction stored in the storage device to implement the following steps: Perform an erase test for a preset number of times on the storage device or a first risky physical block in the storage device that meets a first preset condition, and identify a first abnormal physical block and a second risky physical block that meets a second preset condition from the storage device or the first risky physical block, where the erase test includes a Flash Write operation; Perform a wear test on the second risky physical block, and identify a second abnormal physical block from the second risky physical block; Determine the test result of the storage device according to the number of the first abnormal physical blocks and the second abnormal physical blocks.

10. The electronic device according to claim 9, wherein, Before performing an erase test for a preset number of times on a first risky physical block in the storage device that meets a first preset condition, the processor executes the at least one computer-readable instruction to implement the following steps: Perform a wear test on the storage device, and identify a physical block that meets the first preset condition from the storage device as the first risky physical block.

11. The electronic device according to claim 10, wherein, Before performing a wear test on the storage device and identifying a physical block that meets the first preset condition from the storage device as the first risky physical block, the processor executes the at least one computer-readable instruction to implement the following steps: Obtain a test requirement, where the test requirement includes an expected test duration; If the test requirement does not include a package test of the storage device, compare the expected test duration with a preset duration; If the expected test duration is less than the preset duration or if the test requirement includes the package test, perform a wear test on the storage device, and identify a physical block that meets the first preset condition from the storage device as the first risky physical block; Or If the expected test duration is greater than or equal to the preset duration, do not perform a wear test on the storage device.

12. The electronic device according to claim 10, wherein, When performing a wear test on the storage device and identifying a physical block that meets the first preset condition from the storage device as the first risky physical block, the processor executes the at least one computer-readable instruction to implement the following steps: Perform the wear test on each physical block in the storage device; Determine the physical blocks that have passed the wear test as first-risk physical blocks that meet the first preset condition.

13. The electronic device according to claim 9, wherein, The processor executing the at least one computer-readable instruction is further configured to implement the following steps: Perform multiple rounds of write-erase tests on a first storage device and multiple rounds of wear tests on a second storage device, where the device types of the first storage device and the second storage device are the same as the device type of the storage device; Perform a baking process on the first storage device after each round of write-erase test, and read the first error-correctable parameter of the first storage device after each baking process; Perform a baking process on the second storage device after each round of wear test, and read the second error-correctable parameter of the second storage device after each baking process; Generate a first curve of the write-erase test based on multiple first error-correctable parameters and the number of write-erase operations on the first storage device, and generate a second curve of the wear test based on multiple second error-correctable parameters and the number of wear operations on the second storage device.

14. The electronic device according to claim 13, wherein, The processor executes the at least one computer-readable instruction to implement the following steps: Determine a first configuration time from the first curve according to the target error-correctable parameter value, and determine a second configuration time from the second curve according to the target error-correctable parameter value; Determine the scale factor between the write-erase test and the wear test according to the ratio of the first configuration time to the second configuration time.

15. A computer-readable storage medium, wherein, The computer-readable storage medium stores at least one computer-readable instruction, and when the at least one computer-readable instruction is executed by a processor, the following steps are implemented: Perform a preset number of write-erase tests on the storage device or the first-risk physical blocks in the storage device that meet the first preset condition, identify first abnormal physical blocks and second-risk physical blocks that meet the second preset condition from the storage device or the first-risk physical blocks, where the write-erase test includes Flash Write operations; Perform a wear test on the second-risk physical blocks, and identify second abnormal physical blocks from the second-risk physical blocks; Determine the test result of the storage device according to the number of the first abnormal physical blocks and the second abnormal physical blocks.

16. The storage medium according to claim 15, wherein, Before performing a preset number of write-erase tests on the first-risk physical blocks in the storage device that meet the first preset condition, the at least one computer-readable instruction is executed by a processor to implement the following steps: Perform a wear test on the storage device, and identify the physical blocks that meet the first preset condition from the storage device as the first-risk physical blocks.

17. The storage medium according to claim 16, wherein, Before performing a wear test on the storage device and identifying the physical blocks that meet the first preset condition from the storage device as the first-risk physical blocks, the at least one computer-readable instruction is executed by a processor to implement the following steps: Obtain test requirements, where the test requirements include the expected test duration; If the test requirements do not include a package test on the storage device, compare the expected test duration with a preset duration. If the expected test duration is less than the preset duration or if the test requirements include the encapsulation test, perform a wear test on the storage device, and identify physical blocks that meet the first preset condition from the storage device as the first risk physical blocks; Or If the expected test duration is greater than or equal to the preset duration, do not perform a wear test on the storage device.

18. The storage medium according to claim 16, wherein, When performing the wear test on the storage device and identifying physical blocks that meet the first preset condition from the storage device as the first risk physical blocks, the at least one computer-readable instruction is executed by a processor to implement the following steps: Perform the wear test on each physical block in the storage device; Determine the physical blocks that pass the wear test as the first risk physical blocks that meet the first preset condition.

19. The storage medium according to claim 15, wherein, When the at least one computer-readable instruction is executed by a processor, it is used to implement the following steps: Perform multiple rounds of write-erase tests on a first storage device and multiple rounds of wear tests on a second storage device, where the device types of the first storage device and the second storage device are the same as the device type of the storage device; Perform a baking process on the first storage device after each round of write-erase tests, and read the first error-correcting parameter of the first storage device after each baking process; Perform a baking process on the second storage device after each round of wear tests, and read the second error-correcting parameter of the second storage device after each baking process; Generate a first curve of the write-erase test based on multiple of the first error-correcting parameters and the number of write-erase times of the first storage device, and generate a second curve of the wear test based on multiple of the second error-correcting parameters and the number of wear times of the second storage device.

20. The storage medium according to claim 19, wherein, When the at least one computer-readable instruction is executed by a processor, it is further used to implement the following steps: Determine a first configuration time from the first curve according to the target error-correcting parameter value, and determine a second configuration time from the second curve according to the target error-correcting parameter value; Determine the scaling factor of the write-erase test and the wear test according to the ratio of the first configuration time to the second configuration time.

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