Imaging method and imaging system

The imaging method and system use directional short-wave infrared light and controlled positioning to suppress reflected light and enhance scattered light capture, enabling non-destructive observation of surfaces under painted layers.

WO2025249126A1PCT designated stage Publication Date: 2025-12-04FUJIFILM CORP
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Patent Information

Application Number
PCT/JP2025/017098
Authority / Receiving Office
WO · WO
Patent Type
Applications
Current Assignee / Owner
Priority Date
2024-05-31
Filing Date
2025-05-09
Publication Date
2025-12-04

AI Technical Summary

Technical Problem

Existing imaging technologies struggle to non-destructively observe the surface of an imaging target covered with a painted portion, as reflected and scattered light from the painted surface interferes with the capture of underlying details, making it difficult to detect conditions like rust without damaging the painted layer.

Method used

An imaging method and system that utilize directional short-wave infrared light emission, controlled positioning of illumination and camera relative to the target, and optical filters to suppress reflected light and enhance scattered light capture, allowing for clear imaging of the underlying surface through a painted layer.

Benefits of technology

Enables non-destructive observation of the underlying surface by effectively suppressing reflected light and enhancing scattered light reception, thereby allowing detection of conditions like rust without damaging the painted layer.

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    Figure JP2025017098_04122025_PF_FP_ABST
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Abstract

Provided are an imaging method and an imaging system that make it possible to observe, in a non-destructive manner, the surface of an imaging target covered with a paint section.　An image of a base metal (80) covered with a paint film (81) is captured by using a light (13) that emits light including short-wave infrared light and a camera (2) that receives at least the short-wave infrared light and performs imaging. Emission light (90) including short-wave infrared light is emitted from the light (13) to the base metal (80) covered with the paint film (81), imaging target-scattered light, which is scattered at an interface (84) between the paint film (81) and the base metal (80), is made incident to the camera (2), and the camera (2) is caused to capture an image of the base metal (80) by receiving the imaging target-scattered light (94).
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Citation Information

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