Correction method and apparatus for electron collision reaction rate, and device and medium

Abstract

Disclosed in the present invention are a correction method and apparatus for an electron collision reaction rate, and a device and a medium. The method comprises: performing calculation on the basis of a Boltzmann equation corresponding to the electron distribution in a six-dimensional phase space, so as to obtain the electron energy distribution in the six-dimensional phase space, and then performing calculation on the basis of the electron energy distribution, so as to obtain electron collision reaction coefficients; on the basis of a preset Poisson equation and a preset particle transport equation, performing calculation to obtain the electric-field distribution and electron density in the six-dimensional phase space; on the basis of the electric-field distribution and the electron density, obtaining a corresponding electron energy transport equation, obtaining, on the basis of the electron energy transport equation, an electron energy loss balance in an inelastic collision process, and then obtaining a correction coefficient for an electron collision reaction rate; and on the basis of the correction coefficient for the electron collision reaction rate and the electron collision reaction coefficients, obtaining a corrected electron collision reaction rate. By means of the present invention, an electron collision reaction rate can be corrected.

Description

Method, device, equipment and medium for correcting electron collision reaction rate TECHNICAL FIELD

[0001] The present application relates to the technical field of multi-physical field simulation, and in particular to a method, device, equipment and medium for correcting electron collision reaction rate. BACKGROUND

[0002] The power grid structure in China is becoming increasingly complex, AC-DC interaction, power grid capacity continues to rise, short-circuit current exceeds the standard and large-area power failure risk seriously threaten the safe and stable operation of the system. The short-circuit current tolerance of the existing 500kV main grid has not been able to meet the needs of power grid development, and it is urgent to develop large-capacity, high-reliability, and large-capacity switch devices that take into account the old station reconstruction and new construction.

[0003] In the entire breaking process of the circuit breaker, the re-breakdown characteristics of the post-arc stage have an important influence on the breaking capacity of the circuit breaker, which further affects the smooth operation of the entire power system. In the study of re-breakdown characteristics, the streamer discharge theory is the mainstream theory of circuit breaker re-breakdown, and the local field approximation method is used to describe the electron energy in most simulation models. However, in the region close to the electrode surface, it is a sheath region, which belongs to a high-field low-electron-density region. The movement of electrons in the direction of the electric field caused by diffusion will lose energy, and the field approximation assumption cannot describe this process, ultimately causing the abnormal increase of electron density in the sheath region. Therefore, it is necessary to analyze the electron energy transport equation and correct the electron collision reaction rate near the medium, so that the loss of electron energy can be correctly expressed, and the correct streamer discharge process can be obtained, and then the post-arc re-breakdown characteristics can be analyzed. SUMMARY

[0004] The present application provides a method, device, equipment and medium for correcting the electron collision reaction rate to solve the technical problem that in the region close to the electrode surface, it is a sheath region, which belongs to a high-field low-electron-density region. The movement of electrons in the direction of the electric field caused by diffusion will lose energy, and the field approximation assumption cannot describe this process, ultimately causing the abnormal increase of electron density in the sheath region.

[0005] To solve the above technical problems, the present application provides a method for correcting the electron collision reaction rate, comprising:

[0006] According to the Boltzmann equation corresponding to the electron distribution in the six-dimensional phase space, the electron energy distribution in the six-dimensional phase space is calculated, and then the electron collision reaction coefficient is calculated according to the electron energy distribution; wherein the electron collision reaction coefficient includes ionization reaction coefficient and adsorption reaction coefficient;

[0007] According to the preset Poisson equation and particle transport equation, the electric field distribution and electron density in the six-dimensional phase space are calculated.

[0008] According to the electric field distribution and the electron density, a corresponding electron energy transport equation is obtained, according to the electron energy transport equation, an electron energy loss balance in a non-elastic collision process is obtained, and then a correction coefficient of an electron collision reaction rate is obtained;

[0009] According to the correction coefficient of the electron collision reaction rate and the electron collision reaction coefficient, a corrected electron collision reaction rate is obtained.

[0010] As a preferred solution, the Boltzmann equation corresponding to the electron distribution in the six-dimensional phase space is:

[0011] Wherein, v is the electron velocity, e is the electron charge, m e is the electron mass, E is the electric field, ▽v is the velocity gradient operator, and C is the collision term related to f.

[0012] As a preferred solution, the electron collision reaction coefficient is:

[0013] Wherein, α is the ionization reaction coefficient, η is the adsorption reaction coefficient, γ = (2e / m e ) 1 / 2 , the electron energy ε = (v / γ) 2 , f(ε) is the electron energy distribution function; σ α (ε) is the ionization cross section, and σ η (ε) is the adsorption cross section.

[0014] As a preferred solution, the particle transport equation is:

[0015] Wherein, n e is the electron density, t is the time, ρ is the fluid density, R e is the electron density source term, μ e is the electron mobility, D e is the electron diffusion rate, and u is the neutral fluid velocity vector.

[0016] The Poisson equation is:

[0017] Wherein, Φ is the electric potential, ρ is the space charge density, and ε is the relative dielectric constant.

[0018] As a preferred solution, the electron energy transport equation is:

[0019] Wherein, η is the energy loss caused by all non-elastic collision processes, n e W elrepresents the total electron energy sink associated with quasi-elastic collisions, k i is a correction factor for the electron collision reaction rate, the second term on the left side of the equation represents the average electron energy change caused by the drift and diffusion in space, and the third term on the left side of the equation represents the increase of the average electron energy caused by the electron subjected to the electric force in the electric field.

[0020] As a preferred solution, the electron energy loss balance in the inelastic collision process is: eμ e n e E 2 =ηk0n e N.

[0021] As a preferred solution, the correction factor for the electron collision reaction rate is:

[0022] On the basis of the above-mentioned embodiments, another embodiment of the present application provides a correction device for the electron collision reaction rate, comprising: an electron collision reaction coefficient calculation module, an electric field distribution and electron density calculation module, a correction factor calculation module, and an electron collision reaction rate correction module.

[0023] The electron collision reaction coefficient calculation module is configured to calculate the electron energy distribution in the six-dimensional phase space according to the Boltzmann equation corresponding to the electron distribution in the six-dimensional phase space, and then calculate the electron collision reaction coefficient according to the electron energy distribution; wherein the electron collision reaction coefficient includes: an ionization reaction coefficient and an adsorption reaction coefficient.

[0024] The electric field distribution and electron density calculation module is configured to calculate the electric field distribution and electron density in the six-dimensional phase space according to the preset Poisson equation and particle transport equation.

[0025] The correction factor calculation module is configured to obtain the corresponding electron energy transport equation according to the electric field distribution and electron density, obtain the electron energy loss balance in the inelastic collision process according to the electron energy transport equation, and then obtain the correction factor for the electron collision reaction rate.

[0026] The electron collision reaction rate correction module is configured to obtain the corrected electron collision reaction rate according to the correction factor for the electron collision reaction rate and the electron collision reaction coefficient.

[0027] On the basis of the above-mentioned embodiments, still another embodiment of the present application provides an electronic device, which comprises a processor, a memory, and a computer program stored in the memory and configured to be executed by the processor, and the processor implements the correction method for the electron collision reaction rate as described in the above-mentioned embodiments of the present application when executing the computer program.

[0028] On the basis of the above-mentioned embodiments, a further embodiment of the application provides a storage medium comprising a stored computer program, wherein the computer program, when executed, controls a device in which the storage medium is located to perform the method for correcting the electron collision reaction rate described in the above-mentioned embodiments of the application.

[0029] Compared with the prior art, the embodiments of the application have the following beneficial effects:

[0030] The application provides a method for correcting an electron collision reaction rate, according to a Boltzmann equation corresponding to an electron distribution in a six-dimensional phase space, an electron energy distribution in the six-dimensional phase space is calculated, and then according to the electron energy distribution, an electron collision reaction coefficient is calculated; wherein the electron collision reaction coefficient includes an ionization reaction coefficient and an adsorption reaction coefficient; according to a preset Poisson equation and a particle transport equation, an electric field distribution and an electron density in the six-dimensional phase space are calculated; according to the electric field distribution and the electron density, a corresponding electron energy transport equation is obtained, according to the electron energy transport equation, an electron energy loss balance in an inelastic collision process is obtained, and then a correction coefficient of the electron collision reaction rate is obtained; according to the correction coefficient of the electron collision reaction rate and the electron collision reaction coefficient, a corrected electron collision reaction rate is obtained.

[0031] The application obtains the electric field distribution and the electron density in the six-dimensional phase space through the Poisson equation and the particle transport equation, then analyzes the electron energy transport equation, obtains the correction coefficient of the electron collision reaction rate near the surface of the medium, and then the corrected electron collision reaction rate can be obtained. According to the corrected electron collision reaction rate, a corrected and correct numerical calculation model of the streamer discharge process can be further obtained, which provides important technical support for further analyzing the post-arc reignition breakdown process. BRIEF DESCRIPTION OF DRAWINGS

[0032] Fig. 1 is a flowchart of a method for correcting an electron collision reaction rate according to an embodiment of the application;

[0033] Fig. 2 is a structural schematic diagram of a device for correcting an electron collision reaction rate according to an embodiment of the application. DETAILED DESCRIPTION

[0034] To make the objectives, technical solutions and advantages of the present application clearer, the technical solutions in the present application will be described clearly and completely below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only some of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without any creative work fall within the scope of protection of the present application.

[0035] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs; the terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of this application; the use of the terms "including," "comprising," "having" and "with" in the specification and claims hereof, along with their variants, are intended to be equivalent to the term "consisting of." The use of the term "about" in relation to a geographic location, is intended to be synonymous with the term "approximately."

[0036] In the description of the embodiments of the present application, the technical terms "first", "second", etc. are only used to distinguish different objects, and cannot be understood as indicating or implying relative importance or implicitly indicating the number, specific order or primary and secondary relationship of the technical features indicated. In the description of the embodiments of the present application, the meaning of "a plurality of" is two or more, unless otherwise explicitly specified.

[0037] Reference herein to "an embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment can be included in at least one embodiment of the application. The appearance of the phrase in various places in the specification is not necessarily all referring to the same embodiment, or to a particular embodiment, or to a particular set of embodiments. It will be explicitly understood by those of ordinary skill in the art that the embodiments described herein can be combined with other embodiments.

[0038] In the description of the embodiments of the present application, the term "and / or" is only a description of the association relationship of the associated objects, which means that there can be three relationships, for example, A and / or B, which can represent the three cases of A alone, A and B together, and B alone. In addition, the character " / " in this paper generally represents that the front and rear associated objects are a "or" relationship.

[0039] In the description of the embodiments of the present application, the term "a plurality of" refers to two or more (including two), and similarly, "a plurality of groups" refers to two or more groups (including two groups), and "a plurality of pieces" refers to two or more pieces (including two pieces).

[0040] In the description of the embodiments of the present application, unless otherwise explicitly specified and limited, the technical terms "mounting", "connecting", "connecting", "fixing" and the like should be understood in a broad sense, for example, it can be fixedly connected, or it can be detachably connected, or it can be integrated; it can be mechanical connection, or it can be electrical connection; it can be directly connected, or it can be indirectly connected through an intermediate medium; it can be the internal communication of two elements or the interaction relationship between two elements. For those of ordinary skill in the art, the specific meaning of the above terms in the embodiments of the present application can be understood according to the specific circumstances.

[0041] Embodiment one

[0042] Please refer to Figure 1, a flow chart of a method for correcting the electron collision reaction rate according to an embodiment of the present application, comprising the following specific steps:

[0043] S1, according to the Boltzmann equation corresponding to the electron distribution in the six-dimensional phase space, the electron energy distribution in the six-dimensional phase space is calculated, and then according to the electron energy distribution, the electron collision reaction coefficient is calculated; wherein the electron collision reaction coefficient includes: ionization reaction coefficient and adsorption reaction coefficient;

[0044] Preferably, the Boltzmann equation corresponding to the electron distribution in the six-dimensional phase space is:

[0045] Wherein, v is the electron velocity, e is the electron charge, m e is the electron mass, E is the electric field, ▽v is the operator of the velocity gradient, C is the collision term related to f.

[0046] Preferably, the electron collision reaction coefficient is:

[0047] Wherein, α is the ionization reaction coefficient, η is the adsorption reaction coefficient, γ=(2e / m e ) 1 / 2 , the electron energy ε=(v / γ) 2 , f(ε) is the electron energy distribution function; σ α (ε) is the ionization cross section, σ η (ε) is the adsorption cross section.

[0048] The method for correcting the electron collision reaction rate according to the present application is used in the existing numerical model for calculating the gas discharge, using the parameters such as electric field, electron density, electron reaction coefficient, to obtain the correction coefficient of the electron collision reaction rate near the medium boundary, according to the correction coefficient to correct the electron collision reaction rate, and using the corrected electron collision reaction coefficient for subsequent iterative calculation, to obtain the corrected correct numerical calculation model of the streamer discharge process, which provides important technical support for further analyzing the post-arc reignition process.

[0049] In a preferred embodiment, the method for correcting the electron collision reaction rate according to the present application specifically comprises the following four steps:

[0050] (1), according to the kinetic theory of plasma, it is known that the electron distribution function in the six-dimensional phase space satisfies the Boltzmann equation:

[0051] Wherein: v is the electron velocity, e is the electron charge, m eis the electronic mass; E is the electric field, ∇v is the operator of velocity gradient, and C is the collision term related to f.

[0052] According to the Boltzmann equation corresponding to the electron distribution in the six-dimensional phase space, the electron energy distribution in the six-dimensional phase space can be obtained, and then the electron collision reaction coefficient (including: ionization reaction coefficient and adsorption reaction coefficient) is obtained according to the electron energy distribution in the six-dimensional phase space. The ionization reaction coefficient and the adsorption reaction coefficient can be obtained by solving the following integral:

[0053] wherein γ = (2e / m e ) 1 / 2 , the electron energy ε = (v / γ) 2 , f(ε) is the electron energy distribution function, α and η are the ionization reaction coefficient and the adsorption reaction coefficient respectively, σ α (ε) and σ η (ε) are the ionization cross section and the adsorption cross section respectively. The ionization reaction coefficient and the adsorption reaction coefficient are both electron collision reaction coefficients.

[0054] S2, the electric field distribution and the electron density in the six-dimensional phase space are calculated according to the preset Poisson equation and the particle transport equation;

[0055] Preferably, the particle transport equation is:

[0056] wherein n e is the electron density, t is the time, ρ is the fluid density, R e is the electron density source term, μ e is the electron mobility, D e is the electron diffusion rate, and u is the neutral fluid velocity vector.

[0057] The Poisson equation is:

[0058] wherein Φ is the electric potential, ρ is the space charge density, and ε is the relative dielectric constant.

[0059] (2) Then, the electric field distribution E and the electron density n e in the six-dimensional phase space are obtained by the preset Poisson equation and the particle transport equation in the numerical calculation software. The formula of the particle transport equation is as follows:

[0060] wherein n e is the electron density, t is the time, ρ is the fluid density, R e is the electron density source term, μ e is the electron mobility, De is the electron diffusivity, u is the neutral fluid velocity vector (usually negligible).

[0061] The Poisson equation is given as follows:

[0062] where Φ is the electric potential, ρ is the space charge density, and ε is the relative permittivity.

[0063] S3, according to the electric field distribution and electron density, the corresponding electron energy transport equation is obtained, according to the electron energy transport equation, the electron energy loss balance in the inelastic collision process is obtained, and then the correction coefficient of the electron collision reaction rate is obtained;

[0064] Preferably, the electron energy transport equation is:

[0065] where η is the energy loss caused by all inelastic collision processes, n e W el represents the total electron energy sink related to quasi-elastic collision, k i is the correction coefficient of the electron collision reaction rate, the second term on the left side of the equation represents the average electron energy change caused by the drift and diffusion in space, and the third term on the left side of the equation represents the increase of the average electron energy caused by the electron in the electric field receiving the electric field force.

[0066] Preferably, the electron energy loss balance in the inelastic collision process is: e n e E 2 = ηk0n e N.

[0067] Preferably, the correction coefficient of the electron collision reaction rate is:

[0068] (3), then according to the electric field distribution and electron density, the corresponding electron energy transport equation is obtained, and the electron energy transport equation is analyzed. Wherein, the electron energy transport equation is expressed as:

[0069] where η is the energy loss caused by all inelastic collision processes, n e W el represents the total electron energy sink related to quasi-elastic collision, k iis a new reaction rate constant, i.e. the correction coefficient of the electron collision reaction rate, the second term on the left side of the equation represents the average electron energy change caused by the drift and diffusion in space, and the third term on the left side represents the increase of the average electron energy caused by the electron subjected to the electric field force in the electric field. If it is assumed that the increase of the average electron energy caused by the electron subjected to the electric field force in the electric field is mainly balanced by the electron energy loss caused by the inelastic collision process, the following formula can be obtained:

[0070] When the reaction rate is obtained by using the solution of the homogeneous Boltzmann kinetic equation, the energy loss balance is expressed as: eμ e n e E 2 =ηk0n e N;

[0071] where k0 represents the old reaction rate constant, and thus a new local reaction rate constant k i , i.e. the correction coefficient of the electron collision reaction rate, can be obtained.

[0072] S4, according to the correction coefficient of the electron collision reaction rate and the electron collision reaction coefficient, a corrected electron collision reaction rate is obtained.

[0073] The last step is to obtain the corrected electron collision reaction rate by using the correction coefficient k i of the electron collision reaction rate and the electron collision reaction coefficient, and the corrected electron collision reaction rate is added to the numerical calculation for subsequent calculation process, so as to correct the electron energy change near the boundary.

[0074] Therefore, the present application provides a correction method of the electron collision reaction rate, according to the Boltzmann equation corresponding to the electron distribution in the six-dimensional phase space, the electron energy distribution in the six-dimensional phase space is calculated, and then according to the electron energy distribution, the electron collision reaction coefficient is calculated; wherein the electron collision reaction coefficient includes: ionization reaction coefficient and adsorption reaction coefficient; according to the preset Poisson equation and particle transport equation, the electric field distribution and electron density in the six-dimensional phase space are calculated; according to the electric field distribution and electron density, the corresponding electron energy transport equation is obtained, according to the electron energy transport equation, the electron energy loss balance in the inelastic collision process is obtained, and then the correction coefficient of the electron collision reaction rate is obtained; according to the correction coefficient of the electron collision reaction rate and the electron collision reaction coefficient, a corrected electron collision reaction rate is obtained.

[0075] The application obtains the electric field distribution and electron density in the six-dimensional phase space by Poisson equation and particle transport equation, and then analyzes the electron energy transport equation to obtain the correction coefficient of the electron collision reaction rate near the surface of the medium, and then the corrected electron collision reaction rate can be obtained.

[0076] Embodiment two

[0077] Please refer to Fig. 2, which is a structural schematic diagram of an electron collision reaction rate correction device provided by an embodiment of the application. The device comprises an electron collision reaction coefficient calculation module, an electric field distribution and electron density calculation module, a correction coefficient calculation module, and an electron collision reaction rate correction module.

[0078] The electron collision reaction coefficient calculation module is configured to calculate the electron energy distribution in the six-dimensional phase space according to the Boltzmann equation corresponding to the electron distribution in the six-dimensional phase space, and then calculate the electron collision reaction coefficient according to the electron energy distribution. The electron collision reaction coefficient comprises an ionization reaction coefficient and an adsorption reaction coefficient.

[0079] The electric field distribution and electron density calculation module is configured to calculate the electric field distribution and electron density in the six-dimensional phase space according to a preset Poisson equation and particle transport equation.

[0080] The correction coefficient calculation module is configured to obtain the corresponding electron energy transport equation according to the electric field distribution and electron density, obtain the electron energy loss balance in the inelastic collision process according to the electron energy transport equation, and then obtain the correction coefficient of the electron collision reaction rate.

[0081] The electron collision reaction rate correction module is configured to obtain the corrected electron collision reaction rate according to the correction coefficient of the electron collision reaction rate and the electron collision reaction coefficient.

[0082] Preferably, the Boltzmann equation corresponding to the electron distribution in the six-dimensional phase space is as follows:

[0083] Wherein, v is the electron velocity, e is the electron charge, m is the electron mass, E is the electric field, and ∇v is the operator of the velocity gradient. e C is the collision term related to f.

[0084] Preferably, the electron collision reaction coefficient is as follows:

[0085] wherein, a is ionization reaction coefficient, η is adsorption reaction coefficient, γ = (2e / m e ) 1 / 2 , electron energy ε = (v / γ) 2 , f(ε) is electron energy distribution function; σ α (ε) is ionization cross section, σ η (ε) is adsorption cross section.

[0086] Preferably, the particle transport equation is:

[0087] wherein, n e is electron density, t is time, ρ is fluid density, R e is electron density source term, μ e is electron mobility, D e is electron diffusivity, u is neutral fluid velocity vector;

[0088] The Poisson equation is:

[0089] wherein, Φ is electric potential, ρ is space charge density, ε is relative dielectric constant.

[0090] Preferably, the electron energy transport equation is:

[0091] wherein, η is energy loss caused by all inelastic collision processes, n e W el represents total electron energy sink related to quasi-elastic collision, k i is correction coefficient of electron collision reaction rate, the second term on the left side of the equation represents average electron energy change caused by drift and diffusion in space, the third term on the left side of the equation represents increase of average electron energy caused by electron electric field force in electric field.

[0092] Preferably, the electron energy loss balance in the inelastic collision process is: eμ e n e E 2 = ηk0n e N.

[0093] Preferably, the correction coefficient of electron collision reaction rate is:

[0094] It should be noted that the apparatus embodiments described above are only illustrative, and the units described as separate components can or can not be physically separated, and the components shown as units can or can not be physical units, i.e., they can be located in one place or distributed on multiple network units. Part or all of the modules can be selected to achieve the purpose of the embodiment according to actual needs. In addition, the connection between the modules in the apparatus embodiment provided by the present application indicates that there is a communication connection between them, which can be implemented as one or more communication buses or signal lines. Those skilled in the art can understand and implement it without creative labor.

[0095] Those skilled in the art can clearly understand that, for the convenience and brevity, the specific working process of the apparatus described above can refer to the corresponding process in the foregoing method embodiments, which will not be described here.

[0096] Embodiment three

[0097] Correspondingly, the embodiment of the present application provides an electronic device, the device includes a processor, a memory and a computer program stored in the memory and configured to be executed by the processor, when the processor executes the computer program, the method for correcting the electronic collision reaction rate is realized.

[0098] The electronic device can be a desktop computer, a notebook computer, a palm computer, a cloud server and the like. The device can include but is not limited to a processor and a memory.

[0099] The processor can be a central processing unit (CPU), and can also be other general-purpose processors, digital signal processors (DSP), application specific integrated circuits (ASIC), field programmable gate arrays (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The general-purpose processor can be a microprocessor or any conventional processor, etc. The processor is the control center of the device, and connects various parts of the device through various interfaces and lines.

[0100] Embodiment four

[0101] Correspondingly, the embodiment of the present application provides a storage medium, which comprises a stored computer program, wherein the computer program controls a device where the storage medium is located to perform the correction method of the electronic collision reaction rate when the computer program is running.

[0102] The memory can be configured to store the computer program, and the processor realizes various functions of the device by running or executing the computer program stored in the memory and calling data stored in the memory. The memory can mainly include a program storage area and a data storage area, wherein the program storage area can store an operating system, at least one application required by a function, and the like; and the data storage area can store data created according to use of the mobile phone and the like. In addition, the memory can include a high-speed random access memory, and can also include a nonvolatile memory, for example, a hard disk, a memory, a plug-in hard disk, a smart media card (SMC), a secure digital (SD) card, a flash card, at least one disk storage device, a flash memory device, or other volatile solid-state memory devices.

[0103] The storage medium is a computer readable storage medium, and the computer program is stored in the computer readable storage medium. The computer program can realize the steps of each method embodiment when executed by the processor. The computer program includes computer program code, which can be in the form of source code, object code, executable files or some intermediate forms, etc. The computer readable medium can include any entity or device capable of carrying the computer program code, recording medium, U disk, mobile hard disk, magnetic disk, optical disk, computer memory, read-only memory (ROM), random access memory (RAM), electrical carrier signal, telecommunication signal and software distribution medium, etc. It should be noted that the content included in the computer readable medium can be appropriately increased or decreased according to the requirements of legislation and patent practice in the jurisdiction, for example, in some jurisdictions, according to legislation and patent practice, the computer readable medium does not include electrical carrier signals and telecommunication signals.

[0104] In summary, the application provides a correction method and device for electron collision reaction rate, equipment and medium, the electric field distribution and electron density in six-dimensional phase space can be obtained by Poisson equation and particle transport equation, then the electron energy transport equation analysis is carried out, the correction coefficient of electron collision reaction rate near the surface of medium is obtained, and then the corrected electron collision reaction rate can be obtained. According to the corrected electron collision reaction rate, the numerical calculation model of the corrected correct streamer discharge process can be further obtained, which provides important technical support for further analyzing the arc afterbreakdown process.

[0105] The above is the preferred embodiment of the application. It should be pointed out that for ordinary skilled in the art, without departing from the principles of the application, a number of improvements and refinements can be made, which are also considered within the scope of protection of the application.

Claims

1. A method for correcting electron collision reaction rates, characterized in that, include: The electron energy distribution in the six-dimensional phase space is calculated based on the Boltzmann equation corresponding to the electron distribution in the six-dimensional phase space. Then, the electron collision reaction coefficient is calculated based on the electron energy distribution. The electron collision reaction coefficient includes the ionization reaction coefficient and the adsorption reaction coefficient. Based on the pre-defined Poisson equation and particle transport equation, the electric field distribution and electron density in the six-dimensional phase space are calculated. Based on the electric field distribution and electron density, the corresponding electron energy transport equation is obtained. Based on the electron energy transport equation, the electron energy loss balance in the inelastic collision process is obtained, and then the correction coefficient of the electron collision reaction rate is obtained. The corrected electron collision reaction rate is obtained based on the correction coefficient of the electron collision reaction rate and the electron collision reaction coefficient.

2. The method for correcting the electron collision reaction rate as described in claim 1, characterized in that, The Boltzmann equation corresponding to the electron distribution in the six-dimensional phase space is: Where v is the electron velocity, e is the electron charge, and m e Let f be the electron mass, E be the electric field, ▽v be the velocity gradient operator, and C be the collision term related to f.

3. The method for correcting the electron collision reaction rate as described in claim 2, characterized in that, The electron collision reaction coefficient is: Where α is the ionization reaction coefficient, η is the adsorption reaction coefficient, and γ = (2e / m e ) 1 / 2 Electron energy ε=(v / γ) 2 f(ε) is the electron energy distribution function; σ α (ε) is the ionization cross section, σ η (ε) represents the adsorption cross section.

4. The method for correcting the electron collision reaction rate as described in claim 3, characterized in that, The particle transport equation is: Where, n e Let R be the electron density, t be time, ρ be the fluid density, and R be the fluid density. e For the electron density source term, μ e For electron mobility, D e Where is the electron diffusivity, and u is the neutral fluid velocity vector; The Poisson equation is: Where Φ is the electric potential, ρ is the space charge density, and ε is the relative permittivity.

5. The method for correcting the electron collision reaction rate as described in claim 4, characterized in that, The electron energy transport equation is as follows: Where η is the energy loss caused by all inelastic collision processes, n e W el k represents the total electron energy sink associated with quasi-elastic collisions. i The coefficient is a correction factor for the electron collision reaction rate. The second term on the left side of the equation represents the change in average electron energy caused by drift and diffusion in space, and the third term on the left side of the equation represents the increase in average electron energy caused by the electric field force acting on the electron in the electric field.

6. The method for correcting the electron collision reaction rate as described in claim 5, characterized in that, The balance of electron energy loss during the inelastic collision process is: eμ e n e E 2 =ηk0n e N.

7. The method for correcting the electron collision reaction rate as described in claim 6, characterized in that, The correction factor for the electron collision reaction rate is:

8. A device for correcting electron collision response rates, characterized in that, include: The module includes modules for calculating electron collision reaction coefficients, electric field distribution and electron density, correction coefficients, and electron collision reaction rate correction. The electron collision reaction coefficient calculation module is used to calculate the electron energy distribution in the six-dimensional phase space according to the Boltzmann equation corresponding to the electron distribution in the six-dimensional phase space, and then calculate the electron collision reaction coefficient according to the electron energy distribution; wherein, the electron collision reaction coefficient includes: ionization reaction coefficient and adsorption reaction coefficient; The electric field distribution and electron density calculation module is used to calculate the electric field distribution and electron density in the six-dimensional phase space based on the preset Poisson equation and particle transport equation. The correction coefficient calculation module is used to obtain the corresponding electron energy transport equation based on the electric field distribution and electron density, obtain the electron energy loss balance in the inelastic collision process based on the electron energy transport equation, and then obtain the correction coefficient of the electron collision reaction rate. The electron collision reaction rate correction module is used to obtain the corrected electron collision reaction rate based on the correction coefficient of the electron collision reaction rate and the electron collision reaction coefficient.

9. An electronic device, characterized in that, It includes a processor, a memory, and a computer program stored in the memory and configured to be executed by the processor, wherein the processor, when executing the computer program, implements the method for correcting the electron collision response rate as described in any one of claims 1 to 7.

10. A storage medium, characterized in that, The storage medium includes a stored computer program, wherein, when the computer program is executed, it controls the device containing the storage medium to perform the method for correcting the electron collision response rate as described in any one of claims 1 to 7.

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