Drilling impedance modification structure for an RFID circuit
The tunable electromagnetic device with an impedance modification structure addresses impedance matching challenges in RFID devices by allowing post-manufacturing adjustments, enhancing performance and reducing costs through adaptive impedance tuning.
Patent Information
- Application Number
- PCT/IB2025/056572
- Authority / Receiving Office
- WO · WO
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2024-06-28
- Filing Date
- 2025-06-27
- Publication Date
- 2026-01-02
AI Technical Summary
Conventional methods for impedance matching in RFID devices face challenges due to manufacturing variations and operational changes, leading to suboptimal performance and increased costs from redesigning antennas to achieve conjugate matches.
A tunable electromagnetic device with an impedance modification structure featuring alterable regions that can adjust conductor impedance relative to a circuit element, allowing for post-manufacturing optimization and adaptive impedance matching.
Enables flexible impedance matching, reducing inventory costs and manufacturing complexity while maintaining optimal performance across diverse applications, and adapting to environmental conditions and operational requirements.
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Figure IB2025056572_02012026_PF_FP_ABST
Abstract
Description
DRILLING IMPEDANCE MODIFICATION STRUCTURE FOR AN RFID CIRCUITTECHNICAL FIELD
[0001] The present subject matter generally relates to electromagnetic devices and methods for tuning electromagnetic devices. In particular, the present subject matter relates to a tunable electromagnetic device including an impedance modification structure. The impedance modification structure includes one or more alterable regions adapted to change electromagnetic characteristics of the conductor to adjust an impedance of the conductor relative to the circuit element. Furthermore, the present subject matter also relates to a method for tuning an electromagnetic device BACKGROUND
[0002] Wireless communication devices have become ubiquitous in modern technology, enabling seamless data transmission through radio wave propagation across various frequencies and protocols. These devices rely on sophisticated antenna systems to effectively transmit and receive electromagnetic signals, facilitating communication between different components and external networks. The performance of these wireless systems depends heavily on the precise matching of impedances between various circuit elements, particularly between antennas and their associated integrated circuits.
[0003] In wireless communication systems, achieving optimal energy transfer between components requires careful consideration of impedance characteristics. When impedances are properly matched, maximum power transfer occurs, resulting in enhanced system performance and efficiency. However, maintaining this impedance matching across different operating conditions and manufacturing variations presents ongoing challenges in the design and production of wireless devices.
[0004] Radio frequency identification (RFID) technology represents a significant application within this field, where precise antenna design and impedance matching are particularly relevant for optimal performance. RFID systems operate across various frequency bands and require careful coordination between antenna structures and integrated circuit components to achieve reliable communication with external readers.
[0005] Conventional methods require the antenna design to match the impedance of the RFID chip. However, there are challenges and limitations with the conventional methods of antenna manufacturing to achieve a desired impedance matchbetween the RFID antenna and the RFID chip. Such challenges and limitations may include tolerance fits due to manufacturing errors or defects in antenna design that lead to a lowering of the conjugate match between the antenna and the RFID chip. In another scenario, there may be a change in the specified impedance of a given RFID chip, which possesses a different impedance corresponding to a given RFID antenna. In the aforementioned situations, the RFID antenna would need to be redesigned or restructured to achieve the conjugate match between the RFID antenna and the RFID chip. In such a situation, redesigning the RFID antenna is a time-intensive process that also increases manufacturing costs.
[0006] Manufacturing processes for wireless communication devices often involve multiple steps and various materials, each of which can introduce variations that affect the final impedance characteristics of the system. These variations can result from factors such as material properties, dimensional tolerances, environmental conditions during manufacturing, and component placement accuracy. Such variations can lead to performance degradation and reduced efficiency in wireless communication systems.
[0007] The complexity of modern wireless communication systems has increased the demand for more flexible and adaptable impedance matching solutions. Traditional approaches to impedance matching often involve fixed circuit elements or antenna geometries that cannot be easily modified after manufacturing. This can result in suboptimal performance when operating conditions change or when manufacturing variations exceed acceptable tolerances. It is desirable for there to be a conjugate match between the RFID chip of the RFID device and the antenna of the RFID device. In such a conjugate match, such as pairs of resistances and reactance of the RFID chip and the RFID antenna, the RFID chip and the RFID antenna have equal resistance and opposite reactance. This conjugate match is usually achieved by selecting an antenna configuration that modifies the impedance of the RFID chip and / or by selecting the chip to provide a desired impedance. It may be appreciated that it would be advantageous to have RFID devices with improved performance, features, and versatility.
[0008] Therefore, in light of the foregoing, there is a need to overcome the limitations and challenges related to conventional methods and technology involved in RFID manufacturing.SUMMARY
[0009] The present subject matter relates to an electromagnetic device having an impedance modification structure to match the impedance of a circuit element (such as for example an RFID chip) to a conductor (such as for example and RFID antenna of an RFID device). In some embodiments, the present subject matter includes an impedance modification structure for use with, for example, a Radio Frequency circuit, an RFID device, an RFID label, or an RFID tag. In some embodiments, the impedance modification structure facilitates matching the impedance of the RFID antenna to that of the RFID chip.
[0010] In one aspect, the present subject matter provides an electromagnetic device that includes a conductor and a circuit element. In some embodiments, the electromagnetic device includes a conductor formed out of the electrically conductive material. In some embodiments, the electromagnetic device includes an impedance modification structure formed out of the electrically conductive material. In some embodiments, an impedance modification structure electromagnetically coupled to the conductor. The impedance modification structure includes one or more alterable regions configured to change electromagnetic characteristics of the conductor to adjust an impedance of the conductor relative to the circuit element.
[0011] According to some embodiments of the present subject matter, a method for tuning an electromagnetic device is provided. The method includes providing a circuit element coupled to a conductor, integrating an impedance modification structure within the conductor, the impedance modification structure comprising one or more alterable regions, detecting an electrical characteristic indicative of an impedance relationship between the circuit element and the conductor, and selectively modifying one or more of the alterable regions to alter the electrical characteristic of the conductor, thereby adjusting an impedance of the conductor relative to the circuit element.
[0012] According to another aspect of the present subject matter, an impedance modification structure is provided. The impedance modification structure includes one or more alterable regions configured to change electromagnetic characteristics of the conductor to adjust an impedance of the conductor relative to the circuit element.
[0013] These and other features, aspects, embodiments, and advantages of the present subject matter will be better understood with reference to the following description and appended claims. This summary is provided to introduce a selection of concepts in a simplified form. This summary is not intended to identify key features or essential features ofthe claimed or disclosed subject matter, nor is it intended to be used to limit the scope of the claimed subject matter.BRIEF DESCRIPTION OF DRAWINGS
[0014] The summary above, as well as the following detailed description of illustrative embodiments, is better understood when read in conjunction with the appended drawings. For the purpose of illustrating the present subject matter, exemplary constructions of the subject matter are shown in the drawings. However, the present subject matter is not limited to specific methods and instrumentalities disclosed herein. Moreover, those in the art will understand that the drawings are not to scale. Wherever possible, like elements have been indicated by identical numbers.
[0015] Embodiments of the present subject matter will now be described, by way of example only, with reference to the following diagrams wherein:FIG. 1 is an illustration of an electromagnetic device, in accordance with an embodiment;FIG. 2 is an illustration of the electromagnetic device with one perforation electrically shunted, in accordance with an embodiment;FIG. 3A is an illustration of the electromagnetic device including one or more circular perforations, in accordance with an embodiment;FIG. 3B is an illustration of the electromagnetic device including one or more slotted perforations, in accordance with an embodiment;FIG. 3C is an illustration of the electromagnetic device including one or more rectangular perforations 308C, in accordance with an embodiment;FIG. 3D is an illustration of the electromagnetic device including one or more triangular perforations, in accordance with an embodiment;FIG. 3E is an illustration of the electromagnetic device including one or more circular perforations, one or more slotted perforations, one or more rectangular perforations and one or more triangular perforations, in accordance with an embodiment;FIG. 4A is an illustration of the electromagnetic device without any perforation, in accordance with an embodiment;FIG. 4B is an illustration of a graph depicting the electromagnetic behavior of the electromagnetic device without any perforation, in accordance with an embodiment;FIG. 4C is an illustration of a Smith chart depicting the electromagnetic behavior of the electromagnetic device without any perforation, in accordance with an embodiment;FIG. 5A is an illustration of the electromagnetic device including at least one perforation, in accordance with an embodiment;FIG. 5B is an illustration of a Smith chart depicting the electromagnetic behavior of the electromagnetic device including at least one perforation, in accordance with an embodiment;FIG. 5C is an illustration of the electromagnetic device including three perforations, in accordance with an embodiment;FIG. 5D is an illustration of a Smith chart depicting the electromagnetic behavior of the RFID device including the three perforations, in accordance with an embodiment;FIG. 5E is an illustration of the electromagnetic device including six perforations 508C, in accordance with an embodiment;FIG. 5F is an illustration of a Smith chart depicting the electromagnetic behavior of the RFID device including the six perforations, in accordance with an embodiment;FIG. 5G is an illustration of the electromagnetic device including twelve perforations, in accordance with an embodiment;FIG. 5H is an illustration of a Smith chart depicting the electromagnetic behavior of the RFID device including the twelve perforations, in accordance with an embodiment;FIG. 51 is an illustration of the electromagnetic device including twenty-four perforations, in accordance with an embodiment;FIG. 5J is an illustration of a Smith chart depicting the electromagnetic behavior of the RFID device including the twenty-four perforations, in accordance with an embodiment;FIG. 6A is an illustration of the electromagnetic device with an initial configuration, in accordance with an embodiment;FIG. 6B is an illustration of the electromagnetic device with the impedance modification structure, in accordance with an embodiment;FIG. 6C is an illustration of the electromagnetic device with the impedance modification structure electrically shunted using soldering, in accordance with an embodiment;FIG. 6D is an illustration of the electromagnetic device with the impedance modification structure with one hole including de-soldering, in accordance with an embodiment; andFIG. 7 is a flow chart of a method for tuning an electromagnetic device, in accordance with an embodiment.
[0016] In the accompanying drawings, an underlined number is employed to represent an item over which the underlined number is positioned or an item to which the underlined number is adjacent. A non-underlined number relates to an item identified by a line linking the non-underlined number to the item. When a number is non-underlined and accompanied by an associated arrow, the non-underlined number is used to identify a general item at which the arrow is pointing.DETAILED DESCRIPTION
[0017] The following detailed description illustrates various embodiments of the present subject matter and ways in which they can be implemented. Although some modes of carrying out the present subject matter have been disclosed, those skilled in the art would recognize that other embodiments for carrying out or practicing the present subject matter are also possible. Some embodiments disclosed herein include one or more methods and / or devices for matching the impedance of an RFID antenna to an RFID chip.Definitions:
[0018] "Tunable electromagnetic device" refers to a wireless communication apparatus configured to be altered or adjust electromagnetic properties, particularly impedance characteristics, to optimize performance with different circuit elements or under varying operating conditions. In some embodiments, the tunable electromagnetic device may include RFID tags, antenna systems, or other RF circuits that require impedance matching flexibility.
[0019] "Conductor" refers to an electrically conductive element that carries electrical current and generates electromagnetic fields for wireless communication. In some embodiments, the conductor may include antenna tracks, dipole elements, loop structures, or other radiating elements formed from materials such as aluminum, copper, or conductive inks.
[0020] "Circuit" element coupled to the conductor refers to an electronic component that is electrically connected to the conductor and possesses specific impedancecharacteristics requiring optimization for maximum power transfer. In some embodiments, the circuit element may include an RFID chip, integrated circuit, or other semiconductor device with defined resistance and reactance values.
[0021] "Impedance modification structure" refers to elements, components and / or features of an electrically conductive material or a conductive structure such as, but not limited to, an RFID antenna. In some embodiments, the impedance modification structure as mentioned herein facilitates in alteration of the impedance of the RFID antenna to match the desired impedance of the RFID chip.
[0022] "Impedance modification structure electromagnetically coupled to the conductor" refers to a specialized tuning mechanism that influences the conductor's impedance characteristics through electromagnetic field interactions. In some embodiments, the impedance modification structure may be positioned adjacent to or integrated within the conductor to enable electromagnetic coupling. Impedance modification structure relates to a standalone tuning system comprising conductive elements, circuit components, and alterable regions specifically designed for impedance adjustment applications. In some embodiments, the impedance modification structure may function as a discrete component or be integrated into larger electromagnetic systems.
[0023] "One or more alterable regions" refers to configurable areas within the impedance modification structure that may be selectively modified through electrical, mechanical, or chemical means to change the electromagnetic characteristics of the conductor. In some embodiments, the alterable regions may include perforations, gaps, switchable elements, or material regions with variable properties. One or more alterable regions are configured to change electromagnetic characteristics, specifically designed and positioned areas that enable controlled modification of electromagnetic properties when altered. In some embodiments, these regions may be strategically located to maximize tuning effectiveness while minimizing impact on overall device performance.
[0024] Desired impedance relationship refers to target impedance matching conditions that the tuning process aims to achieve for optimal power transfer and device performance. In some embodiments, the desired relationship may include conjugate matching, specific impedance values, or performance criteria such as minimum return loss or maximum gain.
[0025] These and other features, aspects, embodiments, and advantages of the present subject matter will be better understood with reference to the below stated description and appended claims. These definitions are provided to introduce a selection of concepts in a simplified form. These definitions are not intended to identify key features or essential features or keywords of the claimed or disclosed subject matter, nor are they intended to be used to limit the scope of the claimed subject matter.
[0026] The tunable electromagnetic device disclosed in this document is described in detail by way of examples and with reference to the figures. Unless otherwise specified, like numbers in the figures indicate references to the same, similar, or corresponding elements throughout the figures. It will be appreciated that modifications to disclosed and described examples, arrangements, configurations, components, elements, apparatuses, methods, materials, etc., may be made and may be desired for a specific application.
[0027] In the present subject matter, any identification of specific shapes, materials, techniques, arrangements, etc. is either related to a specific example presented or is merely a general description of such a shape, material, technique, arrangement, etc. Identifications of specific details or examples are not intended to be, and should not be, construed as mandatory or limiting unless specifically designated as such. Selected examples of apparatuses and methods are hereinafter disclosed and described in detail with reference made to the Figures.
[0028] Throughout the present subject matter, the term "tunable electromagnetic device" refers to wireless communication devices such as UHF RFID tags, smart tags, and the like, Super High-Frequency tags, and High-Frequency tags. In various embodiments, the wireless communication devices enable or otherwise support an efficient, cost-effective, and time-saving item identification and indication to locate, identify, and track a desired item. Furthermore, the wireless communication devices in some embodiments as used herein enable the determination of the location of an item, information about the availability or presence of the item, and enable a responsive signal of the selected item or desired item.
[0029] As discussed herein in detail, the present subject matter enables postmanufacturing impedance optimization through a tunable electromagnetic device including a conductor, a circuit element coupled to the conductor, and an impedance modification structure electromagnetically coupled to the conductor. The impedance modification structure includes one or more alterable regions configured to change electromagneticcharacteristics of the conductor to adjust an impedance of the conductor relative to the circuit element. This configuration allows manufacturers to use a single antenna design with multiple RFID chips with different impedance characteristics, thereby reducing inventory costs and manufacturing complexity while maintaining optimal performance across diverse applications.
[0030] In some embodiments, the selective modification capabilities of the alterable regions provide unprecedented flexibility in impedance matching. The alterable regions may be modified through electrical connectivity changes, material property changes, or geometric changes. In some embodiments, the alterable regions include perforations adapted to be electrically shunted. Manufacturers may fine-tune impedance characteristics by selectively soldering specific perforations to match the impedance of the conductor relative to the circuit element. This iterative tuning process enables compensation for manufacturing tolerances, material variations, and component placement errors that traditionally require costly antenna redesign or component replacement.
[0031] In some embodiments, the tunable electromagnetic device may incorporate Micro-Electro-Mechanical Systems switches, phase-change materials, or transparent conductive materials to provide dynamic tuning capabilities that extend beyond traditional static impedance matching. These alterable regions may include materials configured to be selectively activated to alter electrical properties, enabling real-time adaptation to changing environmental conditions or operational requirements. The control system configured to detect impedance mismatch and selectively alter alterable regions provides automated optimization that may iteratively adjust the impedance relationship until predetermined matching criteria are met, significantly reducing manual tuning time and improving consistency.
[0032] Embodiments of the present subject matter span numerous industries where wireless communication technology is deployed, particularly in supply chain management, inventory tracking, and asset identification systems. When the conductor includes an RFID antenna and the circuit element includes an RFID chip, the tunable electromagnetic device enables reliable operation across diverse mounting surfaces and environmental conditions that traditionally cause impedance shifts. The impedance modification structure integrated within the conductor eliminates the need for externalmatching networks while providing the flexibility to accommodate different RFID chips from various manufacturers, enabling cost-effective mass customization of RFID solutions.
[0033] In some embodiments, the wireless device manufacturing may include streamlined production processes where a single antenna substrate design may be adapted for multiple applications through selective modification of alterable regions during or after assembly. The method for tuning an electromagnetic device includes providing a circuit element coupled to a conductor, integrating an impedance modification structure within the conductor, detecting electrical characteristics indicative of impedance relationships, and selectively modifying alterable regions. The method also enables quality control processes that ensure consistent performance across production batches. This approach significantly reduces waste from impedance-mismatched devices while enabling rapid adaptation to new RFID chip specifications or application requirements without extensive redesign cycles.
[0034] FIG. 1 is an illustration of a tunable electromagnetic device 100, in accordance with an embodiment. In some embodiments herein, the tunable electromagnetic device 100 includes a conductor 102 and a circuit element 104 coupled to the conductor 102. In some embodiments, the tunable electromagnetic device 100 includes an impedance modification structure 106. In some embodiments, the impedance modification structure 106 includes one or more alterable regions 108.
[0035] In some embodiments, the conductor 102 is a metal sheet including a thickness and dimensions such as length and width. In some embodiments, the electrically conductive material may be aluminum or an aluminum sheet. In other embodiments, the electrically conductive material may be copper or copper sheet. As used herein, the electrical conductor 102 may be manufactured using die cutting, etching, or conductive ink printing. In some embodiments, the conductor 102 may include an RFID antenna structure within the dimensions of the conductor 102. In some embodiments, the conductor 102 may include a loop antenna. In some embodiments, the conductor 102 may include a dipole antenna. In other embodiments, the conductor 102 may include a capacitor. In some embodiments, one or more perforations are drilled out of, or otherwise formed in, the impedance modification structure 106 to facilitate matching the impedance of the conductor 102 to the circuit element 104.
[0036] In some embodiments, the circuit element 104 is coupled to the conductor 102 and is configured to store and process data. Furthermore, the circuit element 104 maybe electrically connected to the conductor 102 via contact pads. In some embodiments, the circuit element 104 exhibits a specific impedance comprising resistive and reactive components. In some embodiments, the circuit element 104 may be an RFID chip. For example, the coupling between the circuit element 104 and the conductor 102 enables transmission of electrical signals between the two components; the impedance of the circuit element 104 is a key factor in determining the overall impedance characteristics of the tunable electromagnetic device 100. In some embodiments, the circuit element 104 is positioned to interact electromagnetically with the conductor 102 and the impedance modification structure 106. Furthermore, the performance of the tunable electromagnetic device 100 depends on achieving a desired impedance relationship between the circuit element 104 and the conductor 102.
[0037] In some embodiments, the impedance modification structure 106 may be an integral part of the conductor 102. In some embodiments, the impedance modification structure 106 may be electrically coupled to the conductor 102. In some embodiments, the impedance modification structure 106 may include one or more alterable regions 108 configured to change electromagnetic characteristics of the conductor 102 to adjust an impedance of the conductor 102 relative to the circuit element 104. In some examples, the alterable regions are configured to adjust an impedance of the conductor 102, being modified through at least one of electrical connectivity changes, material property changes, or geometric changes. In some embodiments, the electromagnetic device 100 may include a substrate attached to a base of the electrically conductive material 104. In other embodiments, the substrate is drilled corresponding to one or more alterable regions 108 to match the impedance of the circuit element 104. In such an embodiment, the drilled substrate facilitates tuning the impedance of the conductor 102 to match the impedance of the circuit element 104.
[0038] In some embodiments, the impedance modification structure 106 may be electromagnetically coupled to the conductor 102. In some embodiments, the electromagnetic coupling allows for interaction between the impedance modification structure 106 and the conductor, enabling impedance tuning through electromagnetic connection. The electromagnetic coupling may be achieved through proximity, where the impedance modification structure 106 is positioned close enough to the conductor 102 to influence the electromagnetic field. This arrangement may provide advantages in terms ofdesign flexibility and manufacturing simplicity, as it does not require precise electrical connections between components.
[0039] In some embodiments, the impedance modification structure 106 may be electrically coupled to the conductor 102. This direct electrical connection provides a more robust and potentially more precise method of impedance modification. The electrical coupling may be achieved through conductive paths, such as traces on a printed circuit board or wire connections. This arrangement allows for direct manipulation of current flow and charge distribution within the conductor 102, enabling more significant changes to the impedance characteristics. The electrical coupling may be designed to be permanent or switchable, potentially incorporating elements like MEMS switches or other controllable connection mechanisms to allow dynamic impedance adjustment during operation of the electromagnetic device 100.
[0040] In some embodiments, the electromagnetic device 100 may include a substrate attached to a base of the electrically conductive material 104. This substrate provides mechanical support and may also influence the electromagnetic properties of the device. In some embodiments, the substrate is drilled corresponding to one or more alterable regions 108 to match the impedance of the circuit element 104. These drilled regions in the substrate may act as additional tuning elements, affecting the capacitance and inductance of the overall structure. By selectively drilling or modifying these substrate regions, the impedance of the conductor 102 may be fine-tuned to match the impedance of the circuit element 104. This approach combines structural modifications with the electromagnetic properties of the device, offering a unique method of impedance matching that integrates mechanical alterations with electrical tuning capabilities.
[0041] In some embodiments, the electromagnetic device 100 may incorporate or be connected to external systems or devices to assess the impedance of the conductor 102 relative to the circuit element 104. In some embodiments, the electromagnetic device 100 may include a control system configured to detect an impedance mismatch between the conductor 102 and the circuit element 104, and selectively alter one or more of the alterable regions 108 to reduce the detected impedance mismatch. The electromagnetic device 100 may be equipped with, or interfaced to, external systems or devices that enable precise assessment of the impedance relationship between the conductor 102 and the circuit element 104. These external systems may include vector network analyzers, impedanceanalyzers, or custom-designed measurement equipment tailored specifically for impedance characterization. Such systems can provide real-time, high-precision measurements of complex impedance values, allowing for detailed analysis of the impedance matching state of the electromagnetic device 100. This control system may include a microcontroller or specialized integrated circuit designed to continuously monitor the impedance characteristics of the electromagnetic device 100.
[0042] The control system may utilize learning techniques to analyze impedance data and detect subtle mismatches between the conductor 102 and the circuit element 104. Upon detecting an impedance mismatch, the control system can initiate an automated tuning process. This process involves selectively altering one or more of the alterable regions 108 within the impedance modification structure. The control system may employ an iterative approach, making small adjustments to the alterable regions 108 and immediately reassessing the impedance match. This feedback loop allows for precise, incremental improvements in impedance matching. The control system may also be stored with predefined patterns or sequences of alterations based on empirical data or electromagnetic simulations, allowing for rapid convergence to desired impedance states.
[0043] In some embodiments, the control system may adapt to changing environmental conditions or varying operational modes of the electromagnetic device 100. For example, the control system may compensate for temperature-induced impedance shifts or adjust matching characteristics based on the proximity of objects in the device's near field. This adaptive capability ensures consistent performance across a wide range of operating conditions, enhancing the reliability and efficiency of the electromagnetic device 100 in diverse applications.
[0044] FIG. 2 is an illustration of the electromagnetic device 100 with one or more alterable regions 108 electrically shunted in accordance with an embodiment. As depicted herein, one or more alterable regions 108 are electrically shunted by soldering 210, using a soldering material, at least one perforation 108. In an embodiment, the soldering material may be the same as the electrically conductive material 104. In another embodiment, the soldering material may be different from the electrically conductive material 104. In some examples, the one or more alterable regions 108 may include one or more perforations. The electrical shunting is achieved through the application of soldering material 210 to at least one perforation 108 within the alterable regions. This process creates a conductive bridgeacross the perforation, effectively modifying the current path and altering the impedance characteristics of the device.
[0045] In some embodiments, the soldering material 210 used for electrically shunting the alterable regions 108 may be selected based on various factors to optimize performance and manufacturability. In one embodiment, the soldering material 210 may be identical to the electrically conductive material 104 used in the primary conductor structure. This approach may offer advantages in terms of material compatibility and consistent electrical properties throughout the device. In examples, the soldering material 210 may differ from the electrically conductive material 104. This variation allows for the selection of soldering materials with specific properties that may enhance the tuning capabilities or provide other benefits such as improved durability or ease of application.
[0046] In some embodiments, the alterable regions 108 may include one or more perforations, which serve as primary sites for impedance modification through electrical shunting. These perforations may be strategically placed within the device structure to maximize the impact on impedance characteristics while minimizing any potential negative effects on overall device performance. The ability to selectively shunt individual perforations or groups of perforations provides a high degree of control over the impedance tuning process. This flexibility allows for fine adjustments to match the impedance of the conductor to that of the coupled circuit element 104, enabling optimal energy transfer and device performance across a range of operating conditions or with different circuit elements. In some embodiments, the alterable regions 108 may include one or more Micro-Electro- Mechanical Systems switches to open or close the alterable regions and micro inductors or capacitors, to adjust the impedance of the conductor relative to the circuit element. In some embodiments, the alterable regions 108 may include a phase-change material configured to be selectively activated to alter electrical properties. Furthermore, the alterable regions 108 may include a transparent conductive material configured to be altered using light exposure. In some embodiments, the alterable regions 108 may include a thermal material with varying thermal expansion coefficients configured to be altered under variable temperatures.
[0047] FIG. 3A is an illustration of the electromagnetic device 100, including one or more circular perforations 308A, in accordance with an embodiment. FIG. 3B is an illustration of the electromagnetic device 100, including one or more slotted perforations 308B, in accordance with an embodiment. FIG. 3C is an illustration of the electromagneticdevice 100, including one or more rectangular perforations 308C, in accordance with an embodiment. FIG. 3D is an illustration of the electromagnetic device 100, including one or more triangular perforations 308D, in accordance with an embodiment. FIG. 3E is an illustration of the electromagnetic device 100, including one or more circular perforations 308A, one or more slotted perforations 308B, one or more rectangular perforations 308C, and one or more triangular perforations 308D, in accordance with an embodiment.
[0048] FIG. 3A-3E illustrate various configurations of the electromagnetic device 100, showcasing different perforation geometries within the impedance modification structure 106. These figures demonstrate the versatility of the one or more alterable regions 108, which may be tailored to achieve specific impedance matching characteristics for optimal coupling between the circuit element 104 and the conductor 102. The diverse perforation shapes— circular, slotted, rectangular, and triangular— offer a range of options for fine-tuning the device's electromagnetic properties.
[0049] In FIG. 3A, the electromagnetic device 100 features an array of circular perforations 308A. These circular perforations may provide uniform alteration of the current flow in all directions, potentially offering consistent impedance modification regardless of current orientation. The circular shape may also be advantageous for manufacturing processes, as it can be easily created using standard drilling techniques. When electrically shunted, these circular perforations may create well-defined conductive paths that can be precisely controlled to achieve the desired impedance matching between the circuit element 104 and the conductor 102.
[0050] FIG. 3B presents the electromagnetic device 100 with slotted perforations 308B. These elongated openings may allow for greater directional control of impedance modification, potentially enabling more significant alterations along specific axes of the device. Slotted perforations could be particularly useful in applications where the coupling between the circuit element 104 and the conductor 102 requires asymmetric impedance adjustments. The orientation of these slots relative to the current flow in the conductor may provide an additional parameter for optimizing the impedance matching process.
[0051] Rectangular perforations 308C are illustrated in FIG. 3C, offering yet another geometry for the alterable regions of the electromagnetic device 100. These sharpcornered openings may introduce more abrupt changes in current flow compared to circular perforations, potentially allowing for more dramatic impedance modifications within asmaller area. The rectangular shape may also facilitate closer spacing between perforations, enabling a higher density of alterable regions and thus finer control over impedance matching between the circuit element and the conductor.
[0052] FIG. 3D illustrates triangular perforations 308D in the electromagnetic device 100. This unique geometry may introduce complex current flow patterns that could be leveraged for specialized impedance matching requirements. The pointed corners of triangular perforations may concentrate electromagnetic fields, potentially offering enhanced sensitivity for impedance adjustments.
[0053] FIG. 3E illustrates an array of perforations drilled equidistantly in a patterned shape (such as, for example, a selection of holes, triangles, and rectangular slots). As mentioned herein above, in the impedance modification structure 106, a square-shaped pattern of drillings with each having a circular cross-section is assumed, but depending on the size, shape, and technical feasibilities, the array of perforations may be formed with any desired cross-sections (triangular, rectangular, etc.) with any desired pattern (i.e., circular, hexagonal, etc.), and with any distance between the perforations.
[0054] FIG. 4A is an illustration of the electromagnetic device 100 without any perforations, in accordance with an embodiment. FIG. 4B is an illustration of a graph 400 depicting the electromagnetic behavior of the electromagnetic device 100 without any perforations, in accordance with an embodiment. As shown in FIG. 4B, the graph 400 shows the scattering parameters (magnitude) including the return loss of the electromagnetic device 100. FIG. 4C is an illustration of a Smith chart 402 depicting the electromagnetic behavior of the electromagnetic device 100 without any perforations, in accordance with an embodiment. As shown in FIG. 4C, the Smith chart 402 depicts the scattering parameters (impedance view), including the desired operational frequency of f = 5.9 GHz (marker 1) that the antenna is designed for, and the relevant impedance view. As shown, the operational frequency deviates from the resonant frequency of f = 6.16 GHz (marker 2) by an amount of around -12 dB.
[0055] FIG. 4A illustrates the electromagnetic device 100 in a baseline configuration, without any perforations or alterations to the structure. This representation serves as a reference point for understanding the impact of subsequent modifications on the device's electromagnetic behavior. The unmodified electromagnetic device 100 typically consists of the conductor 104, the circuit element 102, and potentially other structuralelements that contribute to the overall impedance characteristics. This configuration represents the starting point from which impedance matching improvements can be made through the introduction of alterable regions 108.
[0056] FIG. 4B presents a graph 400 that visually depicts the electromagnetic behavior of the unmodified electromagnetic device 100. The graph 400 specifically focuses on scattering parameters, with particular emphasis on the return loss. Return loss is a critical metric in electromagnetic systems, indicating the amount of power reflected back from the device due to impedance mismatches. In this baseline configuration, the graph 400 may reveal suboptimal performance, with significant power reflection at certain frequencies. This data provides valuable insights into the frequencies at which impedance matching improvements are most needed, guiding the strategic placement and design of alterable regions 108 in subsequent iterations of the device.
[0057] FIG. 4C introduces a Smith chart 402, offering a comprehensive view of the electromagnetic device's 100 impedance characteristics across a range of frequencies. The Smith chart 402 facilitates visualizing complex impedance relationships, allowing for intuitive interpretation of the device's behavior. As shown in FIG. 4C, there are two key frequency markers on the Smith chart 402. Marker 1 indicates the desired operational frequency of 5.9 GHz, representing the intended design frequency for optimal performance. Marker 2, however, shows the actual resonant frequency of the unmodified device at 6.16 GHz. The discrepancy between these two frequencies, coupled with a significant return loss of approximately -12 dB, clearly illustrates the need for impedance matching improvements.
[0058] FIG. 5A is an illustration of the electromagnetic device 100, including at least one perforation 508A, in accordance with an embodiment. In some embodiments, at least one perforation 508A includes a hole with a radius of r = 0.15 mm drilled in the impedance modification structure 106. FIG. 5B is an illustration of a Smith chart 502A depicting the electromagnetic behavior of the electromagnetic device 100, including at least one perforation 508A, in accordance with an embodiment. In comparison to FIG. 4C, the impedance view of the Smith chart 502A, as shown in FIG. 5B, the hole with a radius of r = 0.15 mm has a small effect on the variation of the impedance of the conductor 102 at f = 5.9 GHz (i.e. the impedance has increased to 2.15 + jl910). However, as depicted, the impedance is a bit increased. In such a manner, the deviation shows that drilling a single hole may inductively affect the impedance. In fact, this impedance increment is due to disturbing theresonance frequency of the conductor 102 and, consequently, altering the surface current to cause an inductive effect on the impedance.
[0059] As depicted in FIG. 5A the perforation represents the first step in implementing the tunable impedance matching capabilities of the device. In some embodiments, the perforation 508A is precisely positioned in the middle of the electromagnetic device 100, with a carefully controlled radius of 0.15 mm. The strategic placement and size of this perforation are crucial factors in its ability to influence the device's electromagnetic characteristics. This single alteration to the structure marks the beginning of transformation of the electromagnetic device 100 from a static antenna to a dynamically tunable electromagnetic system.
[0060] The impact of this single perforation 508A on the electromagnetic behavior of the electromagnetic device 100 is visually represented in FIG. 5B through a Smith chart 502A. This chart provides a comprehensive view of the impedance characteristics of the electromagnetic device 100 across a range of frequencies, with particular focus on the operational frequency of 5.9 GHz. When compared to the baseline Smith chart 402 shown in FIG. 4C, subtle but significant changes in the impedance characteristics become apparent. The introduction of the 0.15 mm radius hole has resulted in a measurable increase in the impedance of the electromagnetic device 100 at the target frequency of 5.9 GHz, shifting it to a value of 2.15 + j 191 O.
[0061] This observed impedance increase, while relatively small, demonstrates the potential for even minor structural modifications to influence the electromagnetic properties of the electromagnetic device 100. The change in impedance is primarily inductive in nature, as evidenced by the positive imaginary component of the new impedance value. This inductive effect is a direct result of the perforation's influence on the surface current distribution within the electromagnetic device 100. By introducing a discontinuity in the conductive surface, the perforation 508A forces the current to take alternative paths, effectively increasing the overall inductance of the system.
[0062] In some embodiments, the perforation 508A not only affects the impedance at the target frequency but also disturbs the resonance frequency of the electromagnetic device 100. This disturbance in resonance is the underlying mechanism by which the perforation 508A achieves the impedance-altering effect. By slightly shifting the resonant frequency, the perforation modifies the antenna's response across the entireoperational bandwidth. This demonstrates the interconnected nature of an antenna's various electromagnetic characteristics and highlights the potential for targeted modifications to achieve desired impedance matching goals.
[0063] FIG. 5C is an illustration of the electromagnetic device 100, including three perforations 508B, in accordance with an embodiment. FIG. 5C presents an advanced configuration of the electromagnetic device 100, featuring an array of three perforations 508B. This arrangement represents a significant evolution from the single perforation design, offering enhanced control over the device's impedance characteristics. The three perforations 508B are strategically positioned in the middle of the impedance modification structure 106, forming a carefully designed array. This configuration allows for more complex manipulation of the conductor 102 surface currents, potentially enabling finer tuning of the electromagnetic device's impedance. The presence of multiple perforations may create intricate interactions between electromagnetic fields, leading to more pronounced and controllable changes in the antenna's behavior. FIG. 5D complements this physical representation with a Smith chart 502B, providing a comprehensive visualization of the electromagnetic device's 100 impedance characteristics with the three perforations 508B in place. This Smith chart 502B may reveal more significant shifts in impedance compared to the single perforation design, potentially showing a wider range of achievable impedance values or improved matching at the target frequency. The interaction between multiple perforations may lead to non-linear effects, offering the possibility of achieving impedance characteristics that were not possible with a single perforation. This configuration demonstrates the scalability and flexibility of the perforation-based impedance matching approach, suggesting that more complex arrays of perforations may provide even greater control over the electromagnetic device's 100 performance.
[0064] FIG. 5E is an illustration of the electromagnetic device 100, including six perforations 508C, in accordance with an embodiment. FIG. 5E showcases the electromagnetic device 100 incorporating an array of six perforations 508C. This configuration represents a significant increase in the complexity and potential tunability of the device compared to previous iterations. The six perforations 508C are precisely arranged in the central region of the impedance modification structure 106, forming a carefully designed pattern that maximizes their impact on the device's electromagnetic characteristics. This increased number of perforations allows for even more intricate manipulation of surfacecurrents and electromagnetic fields within the antenna structure. The interaction between these multiple perforations may create complex resonance patterns and current distributions, potentially offering a wider range of impedance tuning capabilities. FIG. 5F complements this physical representation with a Smith chart 502C, providing a comprehensive visualization of the electromagnetic behavior resulting from the six- perforation configuration. This Smith chart 502C may reveal more dramatic shifts in impedance characteristics compared to configurations with fewer perforations, potentially demonstrating improved matching capabilities across a broader frequency range or more precise tuning at specific frequencies. The increased number of perforations may also introduce new possibilities for creating multiple resonance points or broadband matching characteristics, expanding the versatility of the electromagnetic device 100.
[0065] FIG. 5G is an illustration of the electromagnetic device 100, including twelve perforations 508D, in accordance with an embodiment. FIG. 5G showcases a highly sophisticated iteration of the electromagnetic device 100, featuring an intricate array of twelve perforations 508D. This advanced configuration represents a significant leap in the complexity and potential tunability of the electromagnetic device 100, pushing the boundaries of perforation-based impedance matching techniques. The twelve perforations 508D are strategically positioned within the central region of the impedance modification structure 106, forming a precisely engineered pattern that maximizes their collective impact on the device's electromagnetic characteristics. This increased number of perforations enables exceptionally fine-grained control over surface currents and electromagnetic field distributions within the antenna structure. The interactions among these multiple perforations may generate complex resonance patterns and current distributions, potentially offering an unprecedented range of impedance tuning capabilities. FIG. 5H complements this physical representation with a Smith chart 502D, providing a comprehensive visualization of the electromagnetic behavior resulting from the twelve-perforation configuration. This Smith chart 502D may reveal dramatic and nuanced shifts in impedance characteristics, potentially demonstrating highly precise matching capabilities across a wide frequency range or extremely accurate tuning at specific frequencies. The increased number of perforations may introduce new possibilities for creating multiple, closely-spaced resonance points or achieving complex broadband matching characteristics, significantly expanding the versatility and applicability of the electromagnetic device 100.
[0066] FIG. 51 is an illustration of the electromagnetic device 100, including twenty-four perforations 508E, in accordance with an embodiment. FIG. 51 represents a more complex configuration of the electromagnetic device 100, featuring an extensive array of twenty-four perforations 508E. In some embodiments, the twenty-four perforations 508E are arranged within the central region of the impedance modification structure 106, forming an intricate and precisely engineered pattern that maximizes their collective impact on the device's electromagnetic characteristics. This substantial increase in the number of perforations allows for an unprecedented level of control over surface currents and electromagnetic field distributions within the conductor 102. The complex interactions among these numerous perforations may generate highly intricate resonance patterns and current distributions, potentially offering an extremely wide range of impedance tuning capabilities. FIG. 5J complements this physical representation with a Smith chart 502E, providing a comprehensive visualization of the electromagnetic behavior resulting from the twenty-four-perforation configuration. This Smith chart 502E may reveal extremely nuanced and precise shifts in impedance characteristics, potentially demonstrating exceptionally accurate matching capabilities across a broad frequency spectrum or allowing for ultra-fine tuning at specific frequencies. In some embodiments, the increased number of perforations may enable the creation of multiple, closely-spaced resonance points or the achievement of highly complex broadband matching characteristics, greatly expanding the versatility and potential applications of the electromagnetic device 100. This configuration pushes the boundaries of the perforation-based approach to impedance matching, suggesting that even more complex arrays could be developed to meet extremely demanding applications.
[0067] As shown in FIG. 5C-5J, drilling more holes, the number of added holes increases the inductive reactance to the equivalent circuit of the impedance modification structure to cancel out the capacitive part of the RFID chip impedance. It may be appreciated that the higher number of holes enables higher impedance in the circuit of the electromagnetic device 100.
[0068] FIG. 6A-6D are illustrations of steps for matching the impedance of the conductor 102 to the circuit element 104 of the electromagnetic device 100 in accordance with an embodiment.
[0069] FIG. 6A is an illustration of the electromagnetic device 100 with an initial configuration in accordance with an embodiment. In some embodiments, an initialimpedance of the conductor 102 is calculated and compared with the impedance of the circuit element 104. It may be collected from the above experimental data that the initial impedance of the conductor 102 does not match the impedance of the circuit element 104. This configuration represents the starting point of the impedance matching process, where the inherent mismatch between the conductor 102 and the circuit element 104 is first identified and quantified. In this initial state, the conductor 102 may be a simple antenna structure without any alterable regions or perforations. The circuit element 104, which may be an RFID chip or other integrated circuit, is coupled to the conductor 102 in its standard configuration.
[0070] In some embodiments, the initial impedance of the conductor 102 is carefully calculated using established electromagnetic analysis techniques. This calculation considers various factors such as the conductor's geometry, material properties, and operating frequency. Simultaneously, the impedance of the circuit element 104 is determined, either through direct measurement or based on manufacturer specifications. These two impedance values are then compared to assess the degree of mismatch between them. We assume that an analysis of the experimental data collected from this initial configuration reveals a significant impedance mismatch between the conductor 102 and the circuit element 104. This mismatch is a common challenge in RFID and other wireless communication systems, and may lead to reduced power transfer efficiency, decreased read range, and overall suboptimal performance of the electromagnetic device 100.
[0071] In some embodiments, the identification of this mismatch serves as the primary motivation for implementing the impedance modification structure 106 and its associated alterable regions in subsequent iterations of the device. The quantification of this initial impedance mismatch provides a valuable reference point for evaluating the effectiveness of future modifications to the electromagnetic device 100. It allows for a direct comparison between the unmodified and modified states, enabling precise measurement of improvements in impedance matching achieved through the introduction of perforations or other alterations to the conductor 102. This baseline data is essential for guiding the design and optimization of the impedance modification structure 106, ensuring that subsequent modifications are targeted and effective in addressing the specific impedance matching requirements of the electromagnetic device 100.
[0072] FIG. 6B is an illustration of the electromagnetic device 100 with the impedance modification structure 106, in accordance with an embodiment. As shown, theimpedance modification structure 106 includes an array of ten circular holes 608 to increase the impedance of the conductor 102 and match the impedance of the circuit element 104. The impedance modification structure 106 is strategically integrated into the conductor 102, featuring an array of ten circular holes 608 that are precisely positioned to manipulate the electromagnetic characteristics of the device. The array of ten circular holes 608 is carefully designed to increase the impedance of the conductor 102 in a controlled manner. Each hole acts as a localized discontinuity in the conductive surface, forcing surface currents to take alternative paths and effectively increasing the overall inductance of the system. The circular shape of the holes may offer advantages in terms of manufacturing precision and uniformity of effect across different orientations of current flow. The number, size, and arrangement of the holes 608 are crucial factors in achieving the desired impedance modification. Ten holes represent a balance between providing sufficient tuning capability and maintaining the structural integrity of the conductor 102, although it will be appreciated from the preceding discussion that many other numbers and configurations of holes 608 are consistent with an embodiment. This particular configuration allows for fine-grained control over the impedance characteristics while avoiding excessive disruption to the antenna's radiating properties.
[0073] In some embodiments, by increasing the impedance of the conductor 102, the impedance modification structure 106 aims to create a better match with the impedance of the circuit element 104. This improved matching can lead to enhanced power transfer efficiency between the conductor 102 and the circuit element 104, potentially resulting in increased read range, improved sensitivity, and overall better performance of the electromagnetic device 100. The implementation of the impedance modification structure 106 transforms the electromagnetic device 100 from a static antenna into a tunable system. This tunability may allowfor adaptation to various environmental conditions or compensation for manufacturing variations, enhancing the versatility and reliability of the device in real- world applications.
[0074] FIG. 6C is an illustration of the electromagnetic device 100 with the impedance modification structure 106 electrically shunted using soldering 612, in accordance with an embodiment. As shown, the impedance modification structure 106 was electrically shunted using soldering 612 to tune the impedance of the conductor 102 and conjugately match the impedance of the circuit element 104. In some embodiments, the implementation of electrical shunting within the impedance modification structure 106. This advancedconfiguration introduces soldering 612 as a means to precisely tune the impedance characteristics of the device. The soldering 612 is strategically applied to specific locations within the array of perforations in the impedance modification structure 106, creating conductive bridges that alter the current flow patterns within the conductor 102.
[0075] In some embodiments, the process of electrical shunting using soldering 612 provides a highly controllable method for fine-tuning the impedance of the conductor 102. By selectively connecting certain perforations, the effective length and geometry of the current paths within the conductor 102 can be modified precisely. This allows for incremental adjustments to the conductor's impedance, enabling a more exact match to the impedance of the circuit element 104. This shunting process aims to achieve a conjugate impedance match between the conductor 102 and the circuit element 104. In a conjugate match, the real parts of the impedances are equal, while the imaginary parts are equal in magnitude but opposite in sign. This condition maximizes power transfer between the two components, significantly enhancing the overall efficiency and performance of the electromagnetic device 100.
[0076] In some embodiments, the use of soldering 612 for impedance tuning offers several advantages. It allows for post-manufacturing adjustments, enabling compensation for variations in component tolerances or environmental factors. The soldering process may be reversible, potentially allowing for re-tuning of the device if needed. Additionally, this method of impedance matching may be more cost-effective and spaceefficient compared to adding discrete tuning components. The precise pattern and extent of soldering 612 applied to the impedance modification structure 106 may be determined through a combination of electromagnetic simulation and empirical testing. This ensures that the final configuration of the electromagnetic device 100 achieves optimal impedance matching for its intended application
[0077] FIG. 6D is an illustration of the electromagnetic device 100 with the impedance modification structure 106 with one hole, including de-soldering 614, in accordance with an embodiment. As shown, the impedance modification structure 106 with removed soldering using de-soldering 612 to decrease the impedance of the conductor 102 in case any excess electrically conductive material conjugately matches the impedance of the circuit element 104. FIG. 6D depicts a crucial aspect of the impedance tuning process, i.e., the ability to reverse and fine-tune previous modifications. This configuration showcases theimpedance modification structure 106 with a specific focus on a single hole that has undergone desoldering 614. This process of removing previously applied solder demonstrates the adaptability and precision of the impedance matching technique employed in the electromagnetic device 100.
[0078] The de-soldering 614 process involves carefully removing conductive material from a previously shunted perforation within the impedance modification structure 106. This action effectively reopens a current path that had been closed by the earlier soldering process, allowing for more nuanced control over the conductor's 102 impedance characteristics. By selectively removing solder, the impedance of the conductor 102 can be decreased in a controlled manner, providing a means to correct for any over-compensation that may have occurred during the initial tuning process.
[0079] Beneficially, this capability to decrease impedance through de-soldering is particularly valuable in scenarios where the initial soldering process may have resulted in an impedance that exceeds the optimal match with the circuit element 104. The ability to make such fine adjustments allows for achieving a more precise conjugate match between the conductor 102 and the circuit element 104, improving power transfer and overall device performance. The process of de-soldering 614 requires great precision and control, as it involves manipulating small amounts of conductive material in specific locations within the impedance modification structure 106. This level of precision may be achieved through the use of specialized desoldering tools and techniques, potentially including laser-based methods for extremely fine control. The implementation of both soldering and desoldering processes in the impedance modification structure 106 transforms the electromagnetic device 100 into a highly tunable system. This tunability extends beyond initial manufacturing, allowing for adjustments throughout the lifecycle of the electromagnetic device 100 to compensate for environmental factors, aging effects, or changes in operations.
[0080] FIG. 7 is an illustration of a flow chart of a method 700 for tuning an electromagnetic device in accordance with an embodiment.
[0081] At step 702, a circuit element 104 is coupled to a conductor 102. In some embodiments, the conductor 102 is selected for impedance modification to adjust the impedance according to the circuit element 104 and may be, for example, aluminum or an aluminum sheet. In other embodiments, the electrically conductive material may be copper or a copper sheet. As used herein, the conductor 102 may be manufactured using die cutting,etching, or conductive ink printing. In some embodiments, the conductor 102 may include an RFID antenna structure from the electrically conductive material.
[0082] At step 704, an impedance modification structure 106 is integrated within the conductor 102, the impedance modification structure 106 including one or more alterable regions 108. This step establishes the foundation, thereby creating the basic structure that will be subsequently modified for impedance matching purposes. Step 704 introduces a critical element of the tuning process, the formation of an impedance modification structure 106 out of the electrically conductive material. In some embodiments, the impedance modification structure 106 is integrally connected to the conductor 102 formed in step 702 and is specifically designed to allow for impedance adjustments. The impedance modification structure 106 may take various forms, strategically positioned to influence the electrical characteristics of the conductor 102 without significantly altering its radiation pattern.
[0083] At step 706, an electrical characteristic is detected indicative of an impedance relationship between the circuit element 104 and the conductor 102. In some embodiments, a control system is configured to detect an impedance mismatch between the conductor and the circuit element and selectively alter one or more of the alterable regions to reduce the detected impedance mismatch. Furthermore, the control system is configured to iteratively alter the alterable regions and reassess the impedance mismatch until a predetermined impedance matching criterion is met. In some embodiments, the method also involves drilling one or more perforations into the impedance modification structure 106. These perforations serve as alterable regions that can be manipulated to fine-tune the impedance of the conductor 102. The number, size, shape, and positioning of these perforations are carefully calculated based on electromagnetic simulations and theoretical models to achieve the desired impedance modification range. This step transforms the static antenna structure into a dynamically tunable system, capable of adapting to various impedance matching requirements.
[0084] At step 708, one or more of the alterable regions are selectively modified to alter the electrical characteristic of the conductor, thereby adjusting the impedance of the conductor relative to the circuit element. In some embodiments, the method also involves electrically shunting at least one perforation of the impedance modification structure 106. This shunting process, which may involve techniques such as soldering or conductive bridging, allows for precise control over the conductor 102 impedance characteristics. By selectivelyconnecting or disconnecting specific perforations, the effective electrical length and current distribution within the conductor 102 can be altered, enabling fine-tuning of the impedance to match that of the circuit element 104.
[0085] The steps 702 to 708 are only illustrative, and other alternatives can also be provided where one or more steps are added, one or more steps are removed, or one or more steps are provided in a different sequence without departing from the scope of the claims herein.
[0086] For example, in some embodiments, the method 700 also includes removing the soldering material upon exceeding the impedance required to match the impedance of the electrically conductive material to the impedance of the RFID chip.
[0087] In some embodiments, the method 700 also includes modifying the alterable regions, including at least one of changing electrical connections, altering material properties, or modifying the physical geometry of the conductor. In some embodiments, the method also includes iteratively modifying the alterable regions and reassessing the electrical characteristics until a desired impedance relationship is achieved.
[0088] In some embodiments, the method also includes storing a record of modifications made to the alterable regions and corresponding electrical characteristic measurements. In some embodiments, recording or storage systems may involve digital databases, embedded memory systems, or physical marking techniques for tracking modification states to store the modifications made to the alterable regions and corresponding electrical characteristic measurements. In some embodiments, the method also includes drilling one or more perforations in the alterable regions of the impedance modification structure. In some embodiments, the method also includes shunting electrically using soldering one or more perforations of the alterable regions of the impedance modification structure to adjust an impedance of the conductor relative to the circuit element. In some embodiments, the method also includes removing the soldering material on exceeding a required impedance to match the impedance of the conductor to the impedance of the circuit element.
[0089] Modifications to embodiments of the present subject matter described in the foregoing are possible without departing from the scope of the present subject matter as defined by the accompanying claims. Expressions such as "including", "comprising", "incorporating", "have", and "is" used to describe and claim the present subject matter areintended to be construed in a non-exclusive manner, namely allowing for items, components or elements not explicitly described also to be present. Reference to the singular is also to be construed to relate to the plural.
Claims
CLAIMSWhat is claimed is:
1. A tunable electromagnetic device, comprising: a conductor; a circuit element coupled to the conductor; and an impedance modification structure electromagnetically coupled to the conductor, the impedance modification structure comprising one or more alterable regions configured to change electromagnetic characteristics of the conductor to adjust an impedance of the conductor relative to the circuit element.
2. The device of claim 1, wherein the impedance modification structure forms an integral part of the conductor.
3. The device of claim 1, wherein the alterable regions are configured to adjust an impedance of the conductor, being modified through at least one of: electrical connectivity changes, material property changes, or geometric changes.
4. The device of claim 1, further comprising a control system configured to: detect an impedance mismatch between the conductor and the circuit element; and selectively alter one or more of the alterable regions to reduce the detected impedance mismatch.
5. The device of claim 4, wherein the control system is further configured to iteratively alter the one or more alterable regions and reassess the impedance mismatch until a predetermined impedance matching criterion is met.
6. The device of claim 1, wherein the alterable regions includes one or more perforations adapted to be electrically shunted to match an impedance of the conductor relative to the circuit element.
7. The device of claim 6, wherein the one or more perforations are electrically shunted by soldering at least one perforation.
8. The device of claim 1, wherein the alterable regions are arranged in a pattern that enables a wide range of impedance adjustments.
9. The device of claim 1, wherein the alterable regions comprising one or more Micro- Electro-Mechanical Systems switch switches to open or close the alterable regions andmicro inductors or capacitors, to adjust an impedance of the conductor relative to the circuit element.
10. The device of claim 1, wherein the alterable regions are provided with materials comprising at least one of: a phase-change material configured to be selectively activated to alter electrical properties; a transparent conductive material configured to be altered using light exposure; and a thermal material with varying thermal expansion coefficients configured to be altered under variable temperatures.
11. The device of claim 1, wherein the conductor includes an RFID antenna and the circuit element include an RFID chip.
12. A method for tuning an electromagnetic device, comprising: providing a circuit element coupled to a conductor; integrating an impedance modification structure within the conductor, the impedance modification structure comprising one or more alterable regions; detecting an electrical characteristic indicative of an impedance relationship between the circuit element and the conductor; and selectively modifying one or more of the alterable regions to alter the electrical characteristic of the conductor, thereby adjusting an impedance of the conductor relative to the circuit element.
13. The method of claim 12, wherein modifying the alterable regions includes at least one of: changing electrical connections, altering material properties, or modifying physical geometry of the conductor.
14. The method of claim 12, further comprising iteratively modifying the alterable regions and reassessing the electrical characteristic until a desired impedance relationship is achieved.
15. The method of claim 12, further comprising storing a record of modifications made to the alterable regions and corresponding electrical characteristic measurements.
16. The method of claim 12, further comprising drilling one or more perforations to the alterable regions of the impedance modification structure.
17. The method of claim 16, further comprising shunting electrically using soldering one or more perforations of the alterable regions of the impedance modification structure to adjust an impedance of the conductor relative to the circuit element.
18. The method of claim 17, further comprising removing the soldering material on exceeding a required impedance to match the impedance of the conductor to the impedance of the circuit element.
19. An impedance modification structure for an electromagnetic device, the electromagnetic device including a conductor and a circuit element, the impedance modification structure, comprising: one or more alterable regions configured to change electromagnetic characteristics of the conductor to adjust an impedance of the conductor relative to the circuit element.
20. The impedance modification structure of claim 19, wherein the one or more alterable regions are capable of being modified through at least one of: electrical, chemical, or mechanical changes.
21. The impedance modification structure of claim 19, further comprising a control system configured to: detect an impedance mismatch between the conductor and the circuit element; and selectively alter one or more of the alterable regions to reduce the detected impedance mismatch.
22. The impedance modification structure of claim 19, wherein the alterable regions includes one or more perforations adapted to be electrically shunted to match an impedance of the conductor relative to the circuit element.
23. The impedance modification structure of claim 19, wherein the alterable regions comprising one or more Micro-Electro-Mechanical Systems switch switches to open or close the alterable regions and micro inductors or capacitors, to adjust an impedance of the conductor relative to the circuit element.
24. The impedance modification structure of claim 19, wherein the alterable regions are provided with materials comprising at least one of: a phase-change material configured to be selectively activated to alter electrical properties; a transparent conductive material configured to be altered using light exposure; and a thermal material with varying thermal expansion coefficients configured to be altered under variable temperatures.
25. The impedance modification structure of claim 19, wherein the conductor includes an RFID antenna and the circuit element include an RFID chip.
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