A Method of Constructing Multi-thin Layer Objective Function Based on Converted Wave Seismic Data

Abstract

The present invention provides a method for constructing a multiple-thin layer objective function based on converted wave seismic data. The method includes the following steps that: converted wave seismic data are acquired; preprocessing and prestack migration are carried out on the converted wave seismic data, so that a converted wave migration profile can be obtained; and a sparse constraint and wave impedance constraint multiple-thin layer objective function is built on the migration profile. With the method adopted, a more reasonable multiple-thin layer objective function can be constructed based on the converted wave seismic data, and therefore, the improvement of the solution accuracy and noise immunity of the objective function can be benefitted, and the obtaining of a high-precision reflection coefficient can be benefitted, and a solid foundation can be laid for subsequent high-resolution profile reconstruction.

Description

technical field [0001] The invention belongs to the technical field of converted wave seismic data processing, and specifically relates to a method for constructing a multi-thin layer objective function based on converted wave seismic data. Background technique [0002] At present, the fracture characterization of coherent volume is an important means to explore fractured reservoirs, and the acquisition of high-resolution data volumes and fracture parameters required for fracture prediction has always been a key research issue in the exploration of fractured reservoirs. Due to the characteristics of low signal-to-noise ratio and resolution of the wave, its resolution needs to be improved to facilitate the thin-layer resolution of subsequent interpretations. However, the conventional high-resolution processing method based on the assumption of minimum phase and white noise has a limited ability to improve the resolution of converted waves under the limitation of the main freq...

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Problems solved by technology

However, the conventional high-resolution processing method based on the assumption of minimum phase and white noise has a limited ability to improve the resolution of converted waves under the limitation of the main frequency band, and cannot meet the requirements of subsequent fracture prediction and resolution of the minimum thickness of multi-thin layers. It is necessary to adopt a new high-resolution processing idea, namely: a new idea of ​​calculating the high-precision reflection coefficient of the converted wave and high-resolution reconstruction of the high-frequency wavelet. The requirement of the minimum thickness of the layer can be obtained to obtain a high-quality profile with satisfactory crack prediction

[0003] Usually, the calculation of the reflection coefficient requires the construction of a multi-thin-layer objective function. However, due to the fact that the objective function constructed by the conventional method has many unreasonable features, there are differences in the extreme value, position and size of the reflection coefficient during the calculation process. errors, which lead to false images in subsequent high-resolution profiles

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