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Index fluctuation analysis method and device

An analysis method and technology of an analysis device, applied in data processing applications, instruments, calculations, etc., can solve problems such as low accuracy, reduce the efficiency of locating the cause of abnormal data fluctuations, and take a long time to detect abnormal data fluctuations, and improve efficiency. Effect

Inactive Publication Date: 2018-07-31
ADVANCED NEW TECH CO LTD
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  • Abstract
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Problems solved by technology

[0003] At present, the detection of abnormal fluctuations in data is usually performed by data analysts relying on experience to judge whether various indicators in the data fluctuate abnormally and analyze the causes of abnormal fluctuations, resulting in a long time for detecting abnormal fluctuations in data, low accuracy, and In the case of new abnormal data fluctuations, it is difficult for data analysts to quickly locate the causes of abnormal data fluctuations based on experience, which also reduces the efficiency of locating the causes of abnormal data fluctuations

Method used

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  • Index fluctuation analysis method and device
  • Index fluctuation analysis method and device

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Embodiment Construction

[0025] Reference will now be made in detail to the exemplary embodiments, examples of which are illustrated in the accompanying drawings. When the following description refers to the accompanying drawings, the same numerals in different drawings refer to the same or similar elements unless otherwise indicated. The implementations described in the following exemplary embodiments do not represent all implementations consistent with this application. Rather, they are merely examples of apparatuses and methods consistent with aspects of the present application as recited in the appended claims.

[0026] The terminology used in this application is for the purpose of describing particular embodiments only, and is not intended to limit the application. As used in this application and the appended claims, the singular forms "a", "the", and "the" are intended to include the plural forms as well, unless the context clearly dictates otherwise. It should also be understood that the term...

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Abstract

The embodiment of the invention provides an index fluctuation analysis method and device. The method comprises the following steps: obtaining data to be detected, wherein the data to be detected comprises at least one piece of index data; according to a preset rule, determining an abnormal fluctuation index data in the at least one piece of index data; splitting the abnormal fluctuation index dataaccording to a plurality of dimensions, and determining the contribution degree of each dimension combination, wherein each dimension combination comprises at least one preset dimension; according toone or a plurality of contribution degrees in each dimension combination, generating an abnormal fluctuation analysis result. Therefore, the reason of abnormal fluctuation of the index data is more accurately determined, and the analysis efficiency of the abnormal fluctuation reason of the data is improved.

Description

technical field [0001] The present application relates to the technical field of electronic payment, in particular to an index fluctuation analysis method and device. Background technique [0002] With the development of information technology, all walks of life will generate a large amount of data every day in the process of operation, such as some report data, which is of great research value for detecting whether these data have abnormal fluctuations and analyzing the reasons for abnormal fluctuations direction. Especially in the Internet financial business, in daily business, the payment success rate often fluctuates suddenly and abnormally. In order to understand the reasons for fluctuations, it plays a vital role in improving service capabilities. [0003] At present, the detection of abnormal fluctuations in data is usually performed by data analysts relying on experience to judge whether various indicators in the data fluctuate abnormally and analyze the causes of ...

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Application Information

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IPC IPC(8): G06Q10/06
CPCG06Q10/06393
Inventor 郑江雨傅文林欧航刘晓辉肖裕洪畅若寒金成秦德超张盈张泰维
Owner ADVANCED NEW TECH CO LTD
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