Method for rapid life testing of resistance wire
By converting the temperature control of the resistance wire into current control and using the preset characteristic relationship to determine the target current, the problems of high cost and poor reliability of the resistance wire rapid life test are solved, and the test process is simplified and the cost is reduced.
Patent Information
- Application Number
- CN202211740314.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2022-12-30
- Publication Date
- 2025-10-14
- Estimated Expiration
- 2042-12-30
AI Technical Summary
Existing resistance wire rapid life test methods are costly, have poor reliability, and require cumbersome temperature adjustment and are difficult to accurately control.
The temperature control of the resistance wire is equivalently converted into current control, the target current is determined by the preset characteristic relationship, the test process is simplified, and the current is directly adjusted to achieve temperature control.
Reduce test costs, improve test reliability, simplify test processes, avoid human interference, and ensure the stability of test current and temperature.
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Figure CN116298593B_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The present application relates to the technical field of life test of electrothermal material, and particularly to a resistance wire rapid life test method. BACKGROUND
[0002] In the prior art, the rapid life test of resistance wire is performed according to the national standard, and a standard resistance wire with a standard diameter (for example, 0.8 mm) is tested. In the test, a filament hidden-out light optical pyrometer measuring instrument is used to measure the temperature, so that the test cost is high. In addition, the temperature of the resistance wire needs to be adjusted by manual calibration in the test, and the temperature adjustment has a large time delay, so that the test temperature is difficult to accurately control, and the reliability of the rapid life test is difficult to guarantee. In summary, the prior art controls the temperature of the resistance wire to perform the rapid life test of the resistance wire, and the test method is complicated, the test cost is high, and the reliability is poor. SUMMARY
[0003] The present application provides a resistance wire rapid life test method, which converts the temperature control of the resistance wire into current control, so as to simplify the test process, reduce the test cost, and improve the test reliability.
[0004] According to an aspect of the present application, a resistance wire rapid life test method is provided, which includes the following steps:
[0005] determining a target test temperature of a to-be-tested resistance wire;
[0006] determining a target current of the to-be-tested resistance wire corresponding to the target test temperature;
[0007] determining a rapid life of the to-be-tested resistance wire according to a melting time of the to-be-tested resistance wire under the target current.
[0008] Optionally, the determination of the target current of the to-be-tested resistance wire corresponding to the target test temperature includes:
[0009] obtaining characteristic parameters of the to-be-tested resistance wire; wherein the characteristic parameters include a diameter and a resistivity of the to-be-tested resistance wire;
[0010] determining the target current of the to-be-tested resistance wire corresponding to the target test temperature according to a preset characteristic relationship and the characteristic parameters of the to-be-tested resistance wire; wherein the preset characteristic relationship is a corresponding relationship among the current of the resistance wire, the temperature of the resistance wire, and the characteristic parameters of the resistance wire.
[0011] Optionally, the determination of the target current of the to-be-tested resistance wire corresponding to the target test temperature according to the preset characteristic relationship and the characteristic parameters of the to-be-tested resistance wire includes:
[0012] determine a corresponding relationship between the current and the temperature of the to-be-tested resistance wire according to the preset characteristic relationship and the characteristic parameter of the to-be-tested resistance wire;
[0013] determine the target current corresponding to the target test temperature of the to-be-tested resistance wire according to the corresponding relationship between the current and the temperature.
[0014] Optionally, the preset characteristic relationship is obtained in the following manner:
[0015] obtain a first corresponding relationship between the surface load of the resistance wire and the temperature of the resistance wire;
[0016] obtain a second corresponding relationship; wherein the second corresponding relationship is a corresponding relationship among the surface load of the resistance wire, the current of the resistance wire and the characteristic parameter of the resistance wire;
[0017] determine the preset characteristic relationship according to the first corresponding relationship and the second corresponding relationship.
[0018] Optionally, the first corresponding relationship is that the surface load of the resistance wire is equal to the sum of the heat radiation amount of the resistance wire and the convection heat transfer amount of the resistance wire.
[0019] Optionally, the heat radiation amount of the resistance wire is k1(T1 4 -T2 4 ); wherein k1 is the Stefan-Boltzmann constant, T1 is the temperature of the resistance wire, and T2 is the room temperature.
[0020] The convection heat transfer amount of the resistance wire is k2(T1-T2); wherein k2 is the surface convection heat transfer coefficient.
[0021] Optionally, the second corresponding relationship is obtained in the following manner:
[0022] calculate the electric power of the resistance wire according to the surface load of the resistance wire and the surface area of the resistance wire;
[0023] obtain the second corresponding relationship according to a corresponding relationship between the electric power of the resistance wire and the current of the resistance wire, and a corresponding relationship between the characteristic parameter of the resistance wire and the impedance of the resistance wire.
[0024] Optionally, the second corresponding relationship is: wherein I is the current of the resistance wire, d is the diameter of the resistance wire, p is the resistivity, and W is the surface load of the resistance wire.
[0025] Optionally, the rapid life of the to-be-tested resistance wire is determined according to the melting time of the to-be-tested resistance wire under the target current, comprising:
[0026] The target current is applied to the to-be-tested resistance wire according to a preset frequency, so as to provide a cold-heat cycle environment for the to-be-tested resistance wire until the to-be-tested resistance wire is fused, and a cumulative time of the to-be-tested resistance wire subjected to the cold-heat cycle environment is recorded as a fast life of the to-be-tested resistance wire.
[0027] Optionally, the target current is applied to the to-be-tested resistance wire according to a preset frequency, comprising:
[0028] The following operations are cyclically executed:
[0029] After the target current is continuously applied to the to-be-tested resistance wire for a first time length, the to-be-tested resistance wire is controlled to be powered off for a second time length.
[0030] In the resistance wire fast life test method provided by the embodiment of the present application, the target current passing through the to-be-tested resistance wire is determined through the correspondence between the target test temperature and the current and temperature of the resistance wire, the temperature control in the resistance wire fast life test is converted into the current control on the to-be-tested resistance wire, the variable in the test process can be more directly controlled, the current can be timely adjusted when the test current changes, manual correction of the test temperature according to the temperature detection result is not needed, the test process is simplified, and the interference of human factors can be avoided. The test temperature is stabilized by stabilizing the test current, the reliability of the test process can be effectively improved, and an expensive temperature measuring instrument is not needed, so that the test cost can be effectively reduced. Therefore, compared with the prior art, the embodiment of the present application can simplify the test process, reduce the test cost, and improve the test reliability.
[0031] It should be understood that the content described in this part is not intended to identify key or important features of the embodiments of the present application, nor is it used to limit the scope of the present application. Other features of the present application will become apparent from the following description. BRIEF DESCRIPTION OF DRAWINGS
[0032] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed in the embodiment description will be briefly introduced below. Obviously, the drawings in the following description are only some embodiments of the present application, and other drawings can be obtained by those skilled in the art without creative labor.
[0033] Figure 1 is a flowchart of a resistance wire fast life test method provided by the embodiment of the present application;
[0034] Figure 2 is a flowchart of a target current determination method of a to-be-tested resistance wire provided by the embodiment of the present application;
[0035] Figure 3is a flow chart of another target current determination method of a to-be-tested resistance wire provided by the embodiment of the present application;
[0036] Figure 4 is a flow chart of a method for obtaining a preset characteristic relationship by the embodiment of the present application;
[0037] Figure 5 is a corresponding relationship curve of a test temperature and a surface load provided by the embodiment of the present application;
[0038] Figure 6 is a flow chart of a second corresponding relationship obtaining process provided by the embodiment of the present application;
[0039] Figure 7 is a flow chart of another resistance wire rapid life test method provided by the embodiment of the present application. DETAILED DESCRIPTION
[0040] In order to enable persons skilled in the art to better understand the present application, the technical solutions in the embodiments of the present application will be described clearly and completely below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, but not all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by persons skilled in the art without creative labor should fall within the protection scope of the present application.
[0041] It should be noted that the terms "first", "second", and the like in the specification and claims of the present application and the above-mentioned drawings are used to distinguish similar objects, and do not necessarily indicate a specific order or a chronological sequence. It should be understood that the data thus used can be interchanged under appropriate circumstances, so that the embodiments of the present application described herein can be implemented in an order other than that illustrated or described herein. In addition, the terms "include" and "have" and any variations thereof are intended to cover non-exclusive inclusion, for example, a process, method, system, product or device including a series of steps or units does not necessarily have to be limited to those steps or units clearly listed, but can include other steps or units not clearly listed or inherent to the process, method, product or device.
[0042] The embodiment of the present application provides a resistance wire rapid life test method, which can be suitable for the rapid life test requirement of the resistance wire with any diameter. Figure 1 is a flow chart of a resistance wire rapid life test method provided by the embodiment of the present application. Referring to Figure 1 The method comprises the following steps:
[0043] S110, determining a target test temperature of the to-be-tested resistance wire.
[0044] It is understandable that the manufacturing material of the resistance wire has multiple choices, and the test temperature of the resistance wire manufactured by different manufacturing materials is different during the rapid life test. In actual test, the test temperature can be selected according to the material of the resistance wire.
[0045] S120, determining a target current corresponding to the target test temperature of the resistance wire to be tested.
[0046] Specifically, since the resistance wire has a certain impedance, when the current flows through the resistance wire, the resistance wire will heat up. Generally, for the same resistance wire, the greater the current flowing through the resistance wire, the more heat the resistance wire generates, and the higher the temperature of the resistance wire. Therefore, it is not difficult to conclude that there is a monotonic corresponding relationship between the current and the temperature of the same resistance wire. That is, under the premise of knowing the target test temperature, the current size required to make the resistance wire reach the target test temperature can be obtained through the corresponding relationship between the current and the temperature of the resistance wire, so as to convert the temperature control difficult to control in the test into the current control easy to realize.
[0047] S130, determining the rapid life of the resistance wire to be tested according to the melting time of the resistance wire to be tested under the target current.
[0048] Specifically, the target current is applied to the resistance wire to be tested and timing is performed, and the melting time of the resistance wire to be tested under the target current is observed, so as to convert the cumbersome temperature control process in the rapid life test of the resistance wire into the maintaining process of the target current. Compared with the temperature adjustment process, the real-time performance, controllability and accuracy of the test current adjustment process are higher, and since the target current is obtained based on the corresponding relationship between the current and the temperature, it can be determined that the resistance wire to be tested is at the target test temperature when the resistance wire to be tested flows through the target current, without the need to use an expensive temperature measuring instrument to detect the temperature.
[0049] In the rapid life test method of the resistance wire provided by the embodiment of the present application, the target current passing through the resistance wire to be tested is determined through the target test temperature and the corresponding relationship between the current and the temperature of the resistance wire, the temperature control in the rapid life test of the resistance wire is converted into the current control of the resistance wire to be tested, the variable in the test process can be more directly controlled, the current can be adjusted in time when the test current changes, manual correction of the test temperature according to the temperature detection result is not needed, the test process is simplified, and the interference of human factors can be avoided. The test temperature is stabilized by stabilizing the test current, which can effectively improve the reliability of the test process, and an expensive temperature measuring instrument is not needed, which can effectively reduce the test cost. Therefore, compared with the prior art, the embodiment of the present application can simplify the test process, reduce the test cost, and improve the test reliability.
[0050] Figure 2is a flow chart of a target current determination method of a to-be-tested resistance wire provided by an embodiment of the present application. Optionally, on the basis of the above-mentioned embodiment, with reference to Figure 2 , the target current corresponding to the to-be-tested resistance wire at the target test temperature is determined, comprising:
[0051] S121, acquiring a characteristic parameter of the to-be-tested resistance wire; wherein the characteristic parameter comprises a diameter and a resistivity of the to-be-tested resistance wire.
[0052] Specifically, the characteristic parameter of the to-be-tested resistance wire can be acquired by direct measurement or can be acquired from a manual instruction provided by a manufacturer of the to-be-tested resistance wire, and the embodiment does not limit this. In addition, when the characteristic parameter of the to-be-tested resistance wire is measured, the length of the to-be-tested resistance wire and the temperature of an environment in which the to-be-tested resistance wire is located can also be measured.
[0053] S122, determining the target current corresponding to the to-be-tested resistance wire at the target test temperature according to a preset characteristic relationship and the characteristic parameter of the to-be-tested resistance wire; wherein the preset characteristic relationship is a corresponding relationship among a current of the resistance wire, a temperature of the resistance wire and the characteristic parameter of the resistance wire.
[0054] Specifically, the preset characteristic relationship is a relationship among the current, the temperature and the characteristic parameter of the resistance wire which is established in advance, and the preset characteristic relationship can be, for example, a group of current-temperature relationship curves corresponding to various characteristic parameters of the resistance wire which are obtained by experiments or the like, or can be a specific function relationship among the current, the temperature, the resistivity and the diameter of the resistance wire. The preset characteristic relationship can be pre-stored in the resistance wire rapid life test system. Through the preset characteristic relationship, the current flowing through the resistance wire at the temperature can be obtained according to the temperature of the resistance wire and the characteristic parameter of the resistance wire. Specifically, when the to-be-tested resistance wire is determined, the characteristic parameters, i.e., the resistivity and the diameter of the resistance wire, are also determined. Further, when the target test temperature is also determined (for example, according to a national standard), only the current is unknown in the preset characteristic relationship, and the above-determined parameters are brought into the preset characteristic relationship, so that the current capable of making the to-be-tested resistance wire reach the target test temperature can be obtained, thereby equivalently converting the temperature control in the test process into the current control. Exemplarily, the control of the test current can be realized based on an existing any current adjusting device, thereby realizing real-time acquisition and adjustment of the test current and guaranteeing the reliability of the test. It should be understood that the target test temperature is a temperature required when the resistance wire is tested. It should be noted that the target test temperature in the embodiment can be a test temperature marked in a resistance wire rapid life test standard.
[0055] The embodiment provides a target current determination method of a to-be-tested resistance wire, and the method comprises the steps of:
[0056] Figure 3 is a flowchart of another target current determination method of a to-be-tested resistance wire provided by the embodiment of the application. Figure 3 According to the preset characteristic relationship and the characteristic parameter of the to-be-tested resistance wire, a target current corresponding to the to-be-tested resistance wire at a target test temperature is determined, and the method comprises the steps of:
[0057] S140, according to the preset characteristic relationship and the characteristic parameter of the to-be-tested resistance wire, a current-temperature corresponding relationship of the to-be-tested resistance wire is determined.
[0058] Specifically, the step can be that the characteristic parameter of the to-be-tested resistance wire is brought into a function relationship formula of the preset characteristic relationship, so that a function relationship formula of the current-temperature corresponding relationship of the to-be-tested resistance wire is obtained. Alternatively, the characteristic parameter of the to-be-tested resistance wire is used to look up a table or a curve, so that a current-temperature corresponding relationship table or curve of the to-be-tested resistance wire is obtained.
[0059] S150, according to the current-temperature corresponding relationship, a target current capable of causing the to-be-tested resistance wire to generate the target test temperature is determined.
[0060] It can be understood that the target test temperature is substituted into the current-temperature corresponding relationship, so that the target current capable of causing the to-be-tested resistance wire to generate the target test temperature is obtained.
[0061] The embodiment provides a specific acquisition method of the target current through S140-S150.
[0062] Figure 4 is a flowchart of a method for acquiring a preset characteristic relationship provided by the embodiment of the application. Figure 4 The acquisition method of the preset characteristic relationship comprises the following steps:
[0063] S210, a first corresponding relationship between a surface load of a resistance wire and a temperature of the resistance wire is acquired.
[0064] Specifically, the surface load of the resistance wire refers to a load power on a unit surface area of the resistance wire, and it is a key index affecting the service life of the resistance wire. The first corresponding relationship is established by the temperature of the resistance wire.
[0065] S220, acquire a second corresponding relationship; wherein the second corresponding relationship is a corresponding relationship among the surface load of the resistance wire, the current of the resistance wire and the characteristic parameter of the resistance wire.
[0066] Specifically, the surface load of the resistance wire in the first corresponding relationship refers to the load power per unit area of the resistance wire, which is essentially the electric power of the resistance wire divided by the surface area of the resistance wire. It is not difficult to understand that the current of the resistance wire can be obtained by the power calculation formula and the characteristic parameter of the resistance wire on the basis of the surface load of the resistance wire, and then the second corresponding relationship is established.
[0067] S230, determine the preset characteristic relationship according to the first corresponding relationship and the second corresponding relationship.
[0068] It is not difficult to understand that the corresponding relationship among the current of the resistance wire, the temperature of the resistance wire and the characteristic parameter of the resistance wire can be determined in combination with the first corresponding relationship and the second corresponding relationship.
[0069] The embodiment provides a specific acquisition manner of the preset characteristic relationship provided by S210-S230.
[0070] The above embodiments exemplarily provide the establishment process of the preset characteristic relationship, and the specific acquisition processes of the first corresponding relationship and the second corresponding relationship are described below.
[0071] In an embodiment, optionally, the first corresponding relationship is that the surface load of the resistance wire is equal to the sum of the heat radiation amount of the resistance wire and the convective heat transfer amount of the resistance wire.
[0072] The heat radiation amount of the resistance wire can be obtained by the Stefan-Boltzmann law, and the heat radiation amount of the resistance wire can be obtained by substituting the temperature of the resistance wire into the Stefan-Boltzmann law; the convective heat transfer amount of the resistance wire can be obtained by the Newton cooling law, and the convective heat transfer amount of the resistance wire can be obtained by substituting the temperature of the resistance wire into the Newton cooling law.
[0073] Specifically, the heat radiation amount of the resistance wire is k1(T1-T2); wherein k1 is the Stefan-Boltzmann constant, T1 is the temperature of the resistance wire, and T2 is the room temperature; it should be noted that the value of k1 is about 5.67x10 4 -T2 4 ; the constant unit is W·m -8 ·K -2 ·K -4 .
[0074] The convective heat transfer amount of the resistance wire is k2(T1-T2); wherein k2 is the surface convective heat transfer coefficient. It should be noted that the approximate order of magnitude of the convective heat transfer coefficient in air natural convection is between 5 and 25.
[0075] Therefore, the first corresponding relationship is W=k1(T1 4 -T2 4 )+k2(T1-T2), where W is the surface load of the resistance wire. Exemplarily, the units of the parameters in the first corresponding relationship can be converted on the basis of international standard units, for example, when 1 cm 2 is taken as the unit area, the values of k1 and k2 can be divided by 1000 correspondingly.
[0076] Figure 5 is a test temperature and surface load corresponding relationship curve diagram through an embodiment of the present application. After trial calculation, the commonly used test temperature and corresponding surface load table in the national standard is shown in Table 1, and the corresponding temperature and surface load relationship curve is shown in Figure 5 , and in actual application, the table lookup, curve lookup or formula substitution method can be used.
[0077] Table 1
[0078] Test temperature (°C) Surface load (W / cm 2 ) 1100 20.8324 1150 23.9578 1200 27.4277 1250 31.2669 1300 35.5008 1350 40.1557
[0079] Figure 6 is a flow chart of the second corresponding relationship acquisition process provided by an embodiment of the present application. In an embodiment, with reference to Figure 6 , the second corresponding relationship acquisition process includes:
[0080] S310, calculating the electric power of the resistance wire according to the surface load of the resistance wire and the surface area of the resistance wire.
[0081] Specifically, the surface load of the resistance wire in the first corresponding relationship refers to the load power per unit area of the resistance wire, which is essentially the electric power of the resistance wire divided by the surface area of the resistance wire. It is not difficult to understand that the electric power of the resistance wire can be obtained by multiplying the surface area of the resistance wire by the surface load of the resistance wire. It should be noted that the surface area of the resistance wire referred to above refers to the area of the resistance wire in contact with the air, that is, the surface area referred to herein does not include the cross-sectional area of the resistance wire at both ends. For example, when the resistance wire is cylindrical, the lateral area of the cylinder can be taken as the surface area of the resistance wire.
[0082] S320, acquiring the second corresponding relationship according to the corresponding relationship between the electric power of the resistance wire and the current of the resistance wire, and the corresponding relationship between the characteristic parameter of the resistance wire and the impedance of the resistance wire.
[0083] Specifically, the corresponding relationship between the electric power of the resistance wire and the current of the resistance wire can be: P=I 2R, wherein P is the electric power of the resistance wire, I is the current of the resistance wire, and R is the impedance of the resistance wire. The correspondence between the characteristic parameter of the resistance wire and the impedance of the resistance wire can be R = p * l / S, wherein p is the resistance wire rate, l is the length of the resistance wire, and S is the cross-sectional area of the resistance wire, which can be calculated according to the diameter of the resistance wire. The above two expressions can be combined to obtain a second correspondence, that is, the correspondence between the surface load of the resistance wire, the current of the resistance wire and the characteristic parameter of the resistance wire.
[0084] The second correspondence is: wherein I is the current of the resistance wire, d is the diameter of the resistance wire, p is the resistance wire rate, and W is the surface load of the resistance wire.
[0085] At this time, the first correspondence is substituted into the second correspondence to obtain the correspondence between the current of the resistance wire, the temperature of the resistance wire and the characteristic parameter of the resistance wire, that is, the preset characteristic relationship, that is,
[0086] Figure 7 is the flowchart of another resistance wire rapid life test method provided by the embodiment of the application.
[0087] Referring to Figure 7 In an embodiment, the test method optionally comprises the following steps:
[0088] S410, determining a target test temperature of the resistance wire to be tested.
[0089] In actual testing, the test temperature can be selected according to the material of the resistance wire. For example, referring to Table 2, the resistance wire rapid life test temperature can be selected according to the national standard requirements.
[0090] S420, obtaining a characteristic parameter of the resistance wire to be tested; wherein the characteristic parameter comprises the diameter and the resistance wire rate of the resistance wire to be tested.
[0091] S430, determining a current-temperature correspondence of the resistance wire to be tested according to the preset characteristic relationship and the characteristic parameter of the resistance wire to be tested.
[0092] S440, determining a target current capable of causing the resistance wire to be tested to generate the target test temperature according to the current-temperature correspondence.
[0093] S450, applying the target current to the resistance wire to be tested at a preset frequency to provide a cold and hot cycle environment to the resistance wire to be tested until the resistance wire to be tested is fused, and recording the cumulative time of the resistance wire to be tested under the cold and hot cycle environment as the rapid life of the resistance wire to be tested.
[0094] This step can be used as Figure 1The specific implementation of S130 is shown in the following. The preset frequency is the frequency of the on and off of the target current before the test. The target current is applied to the resistance wire to be tested and turned on and off at a preset frequency, so that the resistance wire to be tested continuously performs the cold and hot cycle of power on and power off according to the specified condition until the resistance wire is burned out. The cumulative hours of the resistance wire subjected to the cold and hot cycle is the fast life of the resistance wire.
[0095] Further, the target current is applied to the resistance wire to be tested at a preset frequency, including: cyclically performing the following operation: after continuously applying the target current to the resistance wire to be tested for a first time length, controlling the resistance wire to be tested to be powered off for a second time length.
[0096] Exemplarily, the first time length and the second time length are equal. In the fast life test of the resistance wire, the first time length and the second time length can be selected as 2 minutes according to the test standard, or other time lengths can be selected according to the actual needs at the time of the test, and the embodiment does not limit this.
[0097] The embodiment realizes the fast life test of the resistance wire through S410-S450. Exemplarily, the resistance wire to be tested can be a furnace wire. The embodiment can be used to evaluate different brands, different models, and different types of furnace wires. Even if the diameter is not a standard wire, the preset characteristic relationship can also be used to perform equivalent conversion between the temperature and the current of the furnace wire, and the life comparison and analysis of the furnace wire can also be performed to make a good preliminary prediction of the life of the furnace wire.
[0098] Exemplarily, according to the national standard GB / T 13300-91 and the like, the alloy grade, the test temperature, and the fast life requirement of the commonly used material can be obtained. For details, refer to Table 2. The corresponding table load calculated according to the embodiment of the application is listed in the last column of Table 2. For example, taking the test temperature of 1350℃ as an example, the inventors have also calculated the corresponding relationship between the wire diameter and the current of the resistance wire composed of Shougang 0Cr 25 AL6RE (abbreviated as HRE) material. Exemplarily, the resistivity of the material is 1.45Ω·μm, and the fast life requirement at 1350℃ is greater than 60 hours. For details, refer to Table 3.
[0099] Table 2
[0100]
[0101] Table 3
[0102]
[0103]
[0104] It should be understood that the various forms of flow shown above can be used to reorder, add, or remove steps. For example, the steps recited in the present application can be performed in parallel, in series, or in a different order, as long as the desired results of the technical solutions of the present application can be achieved, which are not limited herein.
[0105] The above detailed description does not constitute a limitation on the protection scope of the present application. Those skilled in the art should understand that various modifications, combinations, sub-combinations, and substitutions can be made according to design requirements and other factors. Any modifications, equivalent replacements, and improvements made within the spirit and principles of the present application shall be included in the protection scope of the present application.
Claims
1. A method for quickly testing the life of a resistance wire, characterized in that: The steps include: Determine the target test temperature of the resistance wire to be tested; Determining a target current corresponding to the resistance wire to be tested at a target test temperature; determining the rapid life of the resistance wire to be measured according to the fusing time of the resistance wire to be measured at the target current; Determining the target current corresponding to the resistance wire to be tested at the target test temperature includes: Obtaining characteristic parameters of the resistance wire to be measured; wherein the characteristic parameters include the diameter and resistivity of the resistance wire to be measured; Determining a target current corresponding to the resistance wire to be tested at a target test temperature based on a preset characteristic relationship and characteristic parameters of the resistance wire to be tested; wherein the preset characteristic relationship is a correspondence between the current of the resistance wire, the temperature of the resistance wire, and the characteristic parameters of the resistance wire; The method for obtaining the preset feature relationship includes: Obtaining a first corresponding relationship between the surface load of the resistance wire and the temperature of the resistance wire; Obtaining a second corresponding relationship; wherein the second corresponding relationship is a corresponding relationship between the surface load of the resistance wire, the current of the resistance wire, and the characteristic parameters of the resistance wire; Determining the preset characteristic relationship according to the first corresponding relationship and the second corresponding relationship; The first corresponding relationship is: the surface load of the resistance wire is equal to the sum of the heat radiation of the resistance wire and the convection heat transfer of the resistance wire; The process of acquiring the second corresponding relationship includes: Calculate the electric power of the resistance wire based on the surface load of the resistance wire and the surface area of the resistance wire; The second corresponding relationship is acquired according to the corresponding relationship between the electric power of the resistance wire and the current of the resistance wire, and the corresponding relationship between the characteristic parameter of the resistance wire and the impedance of the resistance wire.
2. The resistance wire rapid life test method according to claim 1, characterized in that: Determining a target current corresponding to the resistance wire to be tested at a target test temperature based on a preset characteristic relationship and characteristic parameters of the resistance wire to be tested includes: Determining a corresponding relationship between the current and the temperature of the resistance wire to be measured according to the preset characteristic relationship and the characteristic parameters of the resistance wire to be measured; According to the correspondence between the current and the temperature, the target current corresponding to the target test temperature generated by the resistance wire to be tested is determined.
3. The resistance wire rapid life test method according to claim 1, characterized in that: The heat radiation of the resistance wire is: k1 (T1 4 -T2 4 ); where k1 is the Stefan-Boltzmann constant, T1 is the temperature of the resistance wire, and T2 is the room temperature; The convective heat transfer of the resistance wire is: k2(T1-T2); wherein k2 is the surface convective heat transfer coefficient.
4. The resistance wire rapid life test method according to claim 1, characterized in that: The second corresponding relationship is: ; Where I is the current of the resistance wire, d is the diameter of the resistance wire, ρ is the resistivity, and W is the surface load of the resistance wire.
5. The resistance wire rapid life test method according to claim 1, characterized in that: The determining the rapid life of the resistance wire to be measured according to the fusing time of the resistance wire to be measured at the target current includes: The target current is applied to the resistance wire to be tested at a preset frequency to provide a hot and cold cycle environment to the resistance wire to be tested until the resistance wire to be tested blows, and the cumulative time that the resistance wire to be tested withstands the hot and cold cycle environment is recorded as the quick life of the resistance wire to be tested.
6. The resistance wire rapid life test method according to claim 5, characterized in that: The applying the target current to the resistance wire to be measured according to a preset frequency includes: The loop does the following: After the target current is continuously applied to the resistance wire to be measured for a first time period, the resistance wire to be measured is controlled to be powered off for a second time period.
Citation Information
Patent Citations
Resistance wire service life testing device and system
CN219179516U