Nanorelay array voltage regulation method and apparatus, computer device

Abstract

The application relates to a nanometer relay array voltage regulation method and device and a computer device. The method comprises the following steps: sampling an actual working current of the nanometer relay array according to a preset sampling rule, the preset sampling rule is that the preset sampling frequency is sampled for a preset number of times, but the working current is not correctly sampled, the preset sampling frequency is adjusted and sampling is performed at the adjusted preset sampling frequency until the working current of the nanometer relay array is correctly sampled; determining an operation working voltage of the nanometer relay array according to the actual working current, the operation working voltage is used for representing the actual working voltage size of the nanometer relay array; determining a voltage deviation value of the operation working voltage and a rated voltage of the nanometer relay array; when the voltage deviation value is greater than a preset voltage deviation value, adjusting the working voltage of the nanometer relay array according to the voltage deviation value. The method can accurately regulate the working voltage, and ensures the working stability and reliability.

Description

TECHNICAL FIELD

[0001] The application relates to the technical field of nanometer relay array control, and in particular to a nanometer relay array voltage adjustment method and device and computer equipment. BACKGROUND

[0002] With the development of digital technology, nanometer relay arrays, as the main hardware for data processing, play a key role in processing data generated by various devices or terminals. Voltage, as an important indicator of the normal operation of a nanometer relay array, will have a serious impact on the normal operation of the nanometer relay array if it is too low or too high. Therefore, a reasonable control method is needed to adjust the working voltage of the nanometer relay array in a timely manner to ensure the stable operation of the nanometer relay array. Based on this, how to correctly adjust the voltage of the nanometer relay array is very important. SUMMARY

[0003] Based on this, it is necessary to provide a nanometer relay array voltage adjustment method, device and computer equipment capable of correctly adjusting the voltage of the nanometer relay array.

[0004] In a first aspect, a nanometer relay array voltage adjustment method is provided, which comprises:

[0005] According to a preset sampling rule, the actual working current of the nanometer relay array is sampled, wherein the preset sampling rule is to sample a preset number of times at a preset sampling frequency, but if the working current is still not correctly sampled, the preset sampling frequency is adjusted and sampling is performed at the adjusted preset sampling frequency until the working current of the nanometer relay array is correctly sampled;

[0006] According to the actual working current, the operating working voltage of the nanometer relay array is determined, and the operating working voltage is used to represent the actual working voltage of the nanometer relay array;

[0007] The voltage deviation value of the operating working voltage and the rated voltage of the nanometer relay array is determined;

[0008] When the voltage deviation value is greater than a preset voltage deviation value, the working voltage of the nanometer relay array is adjusted according to the voltage deviation value.

[0009] In one embodiment, according to the actual working current, the operating working voltage of the nanometer relay array is determined, which comprises:

[0010] The current deviation value of the actual working current and the reference current is determined, and the reference current is the current supporting the normal operation of the nanometer relay array;

[0011] When the current deviation value is less than or equal to a preset current deviation value, the operating working voltage of the nanometer relay array is determined according to the actual working current.

[0012] In one embodiment, when the current deviation value is less than or equal to the preset current deviation value, the operating working voltage of the nano relay array is determined according to the actual working current, comprising:

[0013] When the current deviation value is less than or equal to the preset current deviation value, the actual working current is processed by mean value to obtain a current sampling mean value;

[0014] The operating working voltage of the nano relay array is determined according to the current sampling mean value.

[0015] In one embodiment, the operating working voltage of the nano relay array is determined according to the actual working current, further comprising:

[0016] When the current deviation value is greater than the preset current deviation value, the step of sampling the actual working current of the nano relay array according to the preset sampling rule is entered.

[0017] In one embodiment, the nano relay array voltage regulation method further comprises:

[0018] Obtaining the temperature of the nano relay array;

[0019] When the temperature of the nano relay array is greater than or equal to a preset temperature threshold, the working voltage of the nano relay array is reduced.

[0020] In one embodiment, the nano relay array voltage regulation method further comprises:

[0021] When the temperature of the nano relay array is less than a preset temperature threshold, the working voltage of the nano relay array is increased.

[0022] In one embodiment, the nano relay array voltage regulation method further comprises:

[0023] Obtaining the working state of the nano relay array, the working state including a running state and an idle state;

[0024] When the nano relay array is in the idle state, the working voltage of the nano relay array is reduced.

[0025] Secondly, a nano relay array voltage regulation device is provided, which comprises:

[0026] The sampling module is configured to sample the actual working current of the nano relay array according to a preset sampling rule, wherein the preset sampling rule is to sample a preset number of times at a preset sampling frequency, but when the working current is not correctly sampled, the preset sampling frequency is adjusted and sampling is performed at the adjusted preset sampling frequency until the working current of the nano relay array is correctly sampled;

[0027] a voltage operation module configured to determine an operation working voltage of the nano-relay array according to the actual working current, the operation working voltage being used to represent a size of the actual working voltage of the nano-relay array;

[0028] a voltage deviation value determination module configured to determine a voltage deviation value between the operation working voltage and a rated voltage of the nano-relay array;

[0029] a voltage adjustment module configured to adjust the working voltage of the nano-relay array according to the voltage deviation value when the voltage deviation value is greater than a preset voltage deviation value.

[0030] In a third aspect, a computer device is provided, including a memory and a processor, the memory storing a computer program, and the processor implementing the steps of the method of the above embodiments when executing the computer program.

[0031] In a fourth aspect, a computer readable storage medium is provided, storing a computer program, and the computer program implementing the steps of the method of the above embodiments when executed by a processor.

[0032] The nano-relay array voltage adjustment method, device, and computer device have at least the following beneficial effects:

[0033] The actual working current of the nano-relay array is sampled for a preset number of times at a preset sampling frequency, and when the working current is not correctly sampled, the preset sampling frequency is adjusted and sampling is performed at the adjusted preset sampling frequency until the working current of the nano-relay array is correctly sampled, thereby ensuring the accuracy of the original sampling data by adjusting the preset sampling frequency. Based on the sampled actual working current, an operation working voltage representing the size of the actual working voltage of the nano-relay array is determined, and then a voltage deviation value between the operation working voltage and a rated voltage of the nano-relay array is determined. When the voltage deviation value is greater than a preset voltage deviation value, the working voltage of the nano-relay array is adjusted according to the voltage deviation value. By adjusting the voltage, the deviation is controlled, thereby providing a strong guarantee for the stable and reliable operation of the nano-relay array. BRIEF DESCRIPTION OF DRAWINGS

[0034] Figure 1 An application environment diagram of the nano-relay array voltage adjustment method in one embodiment;

[0035] Figure 2 A flowchart of the nano-relay array voltage adjustment method in one embodiment;

[0036] Figure 3 A flowchart of the nano-relay array voltage adjustment method in another embodiment;

[0037] Figure 4This is a flowchart illustrating the voltage regulation method for a nano-relay array in yet another embodiment;

[0038] Figure 5 Here is a flowchart illustrating the voltage regulation method for a nano-relay array in one embodiment;

[0039] Figure 6 This is a flowchart illustrating the voltage regulation method for a nano-relay array in another embodiment;

[0040] Figure 7 This is a structural block diagram of a nano-relay array voltage regulation device in one embodiment;

[0041] Figure 8 This is an internal structural diagram of a computer device in one embodiment. Detailed Implementation

[0042] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0043] The nano-relay array voltage regulation method provided in this application embodiment can be applied to, for example... Figure 1 In the application environment shown, the control module 102 samples the actual operating current of the nano-relay array 104 (as shown by the solid line) according to a preset sampling rule. The preset sampling rule involves sampling a preset number of times at a preset sampling frequency. If the operating current is not correctly sampled, the preset sampling frequency is adjusted, and sampling continues at the adjusted preset sampling frequency until the operating current of the nano-relay array 104 is correctly sampled. Based on the actual operating current, the operational operating voltage of the nano-relay array 104 is determined. This operational operating voltage characterizes the magnitude of the actual operating voltage of the nano-relay array 104. The voltage deviation between the operational operating voltage and the rated voltage of the nano-relay array 104 is determined. If the voltage deviation is greater than a preset voltage deviation value, the operating voltage of the nano-relay array 104 is adjusted according to the voltage deviation value. The control module 102 can adjust the operating voltage of the nano-relay array 104 by adjusting the supply voltage provided to the nano-relay array 104 by the power supply module 106. There is a positive correlation between the adjustment of the operating voltage of the nano-relay array 104 and the actual operating voltage of the nano-relay array 104. In other words, if the operating voltage of the nano-relay array 104 is to be increased, it can be achieved by increasing the supply voltage from the power supply module 106 to the nano-relay array 104; conversely, if the operating voltage of the nano-relay array 104 is to be decreased, it can be achieved by decreasing the supply voltage from the power supply module 106 to the nano-relay array 104.

[0044] In one embodiment, as shown in Figure 2 A nanorelay array voltage regulation method is provided, which is applied to the control module in Figure 1 for example, and includes the following steps:

[0045] In one embodiment, as shown in Figure 2 A nanorelay array voltage regulation method is provided, which includes:

[0046] S202, according to the preset sampling rule, sampling the actual working current of the nanorelay array, wherein the preset sampling rule is to sample a preset number of times at a preset sampling frequency, but the working current is not correctly sampled, the preset sampling frequency is adjusted and sampling is performed at the adjusted preset sampling frequency until the working current of the nanorelay array is correctly sampled.

[0047] The actual working current refers to the actual working current of the nanorelay array after the pin is connected to the corresponding electronic element. The specific selection of the preset sampling frequency and the preset number of times can be adaptively set according to different types of nanorelay arrays and different application scenarios of nanorelay arrays. For example, as an example, for nanorelay arrays used in devices such as transformers in application scenarios such as power grids, the preset sampling frequency can be set to 50Hz, and the preset sampling number is 3. The determination method of whether the working current is correctly sampled includes determining whether the current is sampled, or comparing the sampled current with the historical working current data of the nanorelay array to determine whether the values of the two exceed the expected threshold. For example, as an example, the expected threshold can be set to 5%, and when the error of the two is less than 5%, it means that the sampled working current is correctly sampled. It should be noted that in addition to sampling through the preset sampling frequency, the actual working current of the nanorelay array can be further sampled by combining parameters such as sampling period and sampling time interval, and when the working current is not correctly sampled, in addition to adjusting the preset sampling frequency to achieve correct sampling, the sampling period and the sampling time interval can be adjusted. The multi-dimensional adjustment method can be used to adjust the sampling method, which can be suitable for fast sampling of working current in multiple scenarios.

[0048] Specifically, in one specific implementation, the number of sampling times can be counted by deploying a counter, and the number of sampling failures can be recorded by the deployed counter. For example, when the first sampling failure is determined, the counter is counted once; if the second consecutive sampling failure is determined, the counter is counted again; but if the third sampling is successful, the previously recorded value in the counter is reset, that is, the counter is reset, and the previously recorded data is cleared. It should be noted that when it is determined that the sampling fails for a plurality of consecutive times, the preset sampling frequency is reset, that is, the sampling time sequence is switched from a previous frequency to another frequency. In one specific embodiment, the reset of the preset sampling frequency can mean increasing the sampling frequency.

[0049] S204, determining the operation working voltage of the nano relay array according to the actual working current, the operation working voltage being used to represent the actual working voltage of the nano relay array.

[0050] Specifically, after the sampling of the above steps, the operation working voltage of the nano relay array can be calculated based on the relationship between the current and the voltage, for example, the operation working voltage of the nano relay array can be determined by Ohm's law, or the voltage can be determined by looking up the table after determining the current based on the pre-set current-voltage mapping table. Compared with directly sampling the actual working voltage of the nano relay array, calculating the actual working voltage of the nano relay array based on the sampled current can effectively avoid inaccurate voltage data caused by sampling loss in the sampling circuit.

[0051] S206, determining the voltage deviation value of the operation working voltage and the rated voltage of the nano relay array.

[0052] The rated voltage of the nano relay array represents the theoretical working voltage of the nano relay array, and the voltage deviation value is obtained by comparing the calculated operation working voltage with the theoretical working voltage.

[0053] S208, when the voltage deviation value is greater than the preset voltage deviation value, adjusting the working voltage of the nano relay array according to the voltage deviation value.

[0054] The preset voltage deviation value is used to represent the deviation between the operation working voltage and the rated voltage, and its specific setting can be adaptively set by a person skilled in the art according to the actual application scene, which is not limited here.

[0055] Specifically, when the voltage deviation value is greater than the preset voltage deviation value, it indicates that the actual working voltage of the nano relay array is greater than the theoretical working voltage of the nano relay array, and at this time the working voltage of the nano relay array needs to be reduced. In one embodiment, the method of adjusting the working voltage of the nano relay array can be to reduce the working voltage input to the nano relay array by the power supply module of the nano relay array, or to adjust the working voltage by the power management system inside the nano relay array in combination with the power conversion module.

[0056] In the above embodiment, the actual working current of the nano relay array is sampled for a preset number of times at a preset sampling frequency, when the working current is not correctly sampled, the preset sampling frequency is adjusted and sampling is performed at the adjusted preset sampling frequency until the working current of the nano relay array is correctly sampled, and the accuracy of the original sampling data is ensured by adjusting the preset sampling frequency; and based on the sampled actual working current, an operating working voltage representing the actual working voltage of the nano relay array is determined, and then a voltage deviation value of the operating working voltage and the rated voltage of the nano relay array is determined; and when the voltage deviation value is greater than the preset voltage deviation value, the working voltage of the nano relay array is adjusted according to the voltage deviation value. By adjusting the voltage, the control deviation is provided to ensure the stable and reliable working of the nano relay array. By using the nano relay array voltage adjustment method provided in the embodiment, especially for integrated circuits such as nano relay arrays which require high precision in power consumption, the working voltage can be precisely controlled, and strong guarantee is provided for the stable working of the nano relay array.

[0057] In one embodiment, when the preset number of samplings is performed at the preset sampling frequency, but the working current is still not correctly sampled, a sampling failure information is sent to the user terminal to inform the user of the sampling failure.

[0058] Specifically, at least one of the following methods can be used to feed back the sampling failure information to the user terminal to prompt the user that there is currently a sampling anomaly and further troubleshooting is needed: sending a short message, using a warning device, sending an email, and displaying the sampling failure information in an information prompt box through a preset interface for displaying information.

[0059] In one embodiment, as shown in Figure 3 determining the operating working voltage of the nano relay array according to the actual working current, comprises:

[0060] S302, determining a current deviation value of the actual working current and a reference current, the reference current being a current supporting normal working of the nano relay array.

[0061] Wherein, the reference current is the theoretical working current of the nano relay array. Specifically, after learning the actual working current of the nano relay array, it is compared with the reference current, for example, the two data are subtracted to obtain the current deviation value.

[0062] S304, when the current deviation value is less than or equal to the preset current deviation value, the operating working voltage of the nano relay array is determined according to the actual working current.

[0063] Wherein, the selection of the preset current deviation value is similar to the setting of the preset voltage deviation value in the above embodiment, which will not be repeated here, and can be specifically referred to the above embodiment.

[0064] Specifically, when the deviation value is less than or equal to the preset current deviation value, it means that the working current data collected at this time meets the subsequent data support requirements for voltage adjustment, and at this time the operating working voltage of the nano relay array can be determined according to the actual working current.

[0065] In one embodiment, as shown in Figure 3 determining the operating working voltage of the nano relay array according to the actual working current further includes:

[0066] S306, when the current deviation value is greater than the preset current deviation value, entering the step of sampling the actual working current of the nano relay array according to the preset sampling rule.

[0067] Specifically, when the current deviation value is greater than the preset current deviation value, it means that the working current data collected at this time does not meet the subsequent voltage calculation requirements, and at this time the actual working current needs to be resampled. It should be noted that when resampling, the above-mentioned preset sampling rule is still followed.

[0068] In one embodiment, after obtaining the actual working current, the actual working current and the reference current can be input into the comparator to compare the size relationship between the two, so as to obtain the comparison result, so as to determine whether the sampled actual working current meets the actual sampling requirement. In the above embodiment, the setting of the comparator can further reduce the engineering development difficulty, improve the debugging efficiency and sampling stability.

[0069] In one embodiment, when the current deviation value is less than or equal to the preset current deviation value, the operating working voltage of the nano relay array is determined according to the actual working current, including:

[0070] S402, when the current deviation value is less than or equal to the preset current deviation value, the actual working current is processed by mean value to obtain the current sampling mean value.

[0071] S404, according to the current sampling mean value, the operating working voltage of the nano relay array is determined.

[0072] Specifically, after determining that the collected actual working current data meets the actual demand, the actual working current data is subjected to mean processing, for example, the mean processing can be that the plurality of sampled actual working current data is summed and then averaged. After the sampled actual working current is subjected to mean processing, accurate data support is provided for subsequent operation of determining the working voltage and voltage regulation, thereby avoiding the problem of low voltage control accuracy caused by sampling error.

[0073] In one embodiment, as shown in Figure 5 The nanorelay array voltage regulation method further includes:

[0074] S502, acquiring the temperature of the nanorelay array.

[0075] Specifically, the temperature of the nanorelay array can be acquired by an internally integrated temperature sensor or the like.

[0076] S504, when the temperature of the nanorelay array is greater than or equal to a preset temperature threshold, reducing the working voltage of the nanorelay array.

[0077] When the temperature of the nanorelay array is too high, the components in the nanorelay array will be squeezed against each other, causing cracks in the nanorelay array and affecting the stable operation of the system. For example, for a nanorelay array of a mobile phone, long-term operation in a high-performance mode (i.e., in a high-frequency mode) can cause the temperature of the nanorelay array to be too high, and thus the clock frequency of the nanorelay array needs to be reduced. Therefore, in order to prevent the temperature of the nanorelay array from being too high for a long time, the preset temperature threshold can be the temperature that causes the nanorelay array to operate abnormally. It should be noted that the preset temperature threshold can be adaptively set according to different types of nanorelay arrays, as well as different materials and processes used in the nanorelay array, and the like, which are not limited herein.

[0078] Specifically, by monitoring the temperature of the nanorelay array, when the temperature of the nanorelay array is greater than or equal to the preset temperature threshold, it indicates that the nanorelay array can be in an overload condition, and thus the working voltage of the nanorelay array is reduced to reduce the temperature of the nanorelay array, thereby avoiding the problem of poor system operation stability caused by long-term operation of the nanorelay array at a temperature that is too high.

[0079] In one embodiment, as shown in Figure 5 The nanorelay array voltage regulation method further includes:

[0080] S506, when the temperature of the nanorelay array is less than the preset temperature threshold, increasing the working voltage of the nanorelay array.

[0081] Specifically, when the temperature of the nanometer relay array is less than the preset temperature threshold, in order to ensure the normal operation of the system, the working voltage of the nanometer relay array needs to be increased to adjust the working state of the nanometer relay array. For example, in one specific embodiment, taking a mobile phone nanometer relay array as an example, after the mobile phone nanometer relay array is switched from a high-performance mode to a low-performance mode to reduce the temperature, in order to avoid the mobile phone being in the low-performance mode for a long time and affecting the operation of the system, the working voltage of the nanometer relay array needs to be increased to ensure the normal operation of the nanometer relay array, specifically, the power supply voltage input to the nanometer relay array can be increased.

[0082] In one embodiment, as shown in Figure 6 The nanometer relay array voltage adjustment method further includes:

[0083] S602, obtaining the working state of the nanometer relay array, the working state including a running state and an idle state;

[0084] S604, when the nanometer relay array is in the idle state, the working voltage of the nanometer relay array is reduced.

[0085] The running state of the nanometer relay array can mean that the nanometer relay array has a running task at this time, and the idle state can mean that the nanometer relay array has no running task.

[0086] Specifically, when the nanometer relay array is in the idle state, the working voltage of the nanometer relay array can be reduced, for example, the power supply voltage input to the nanometer relay array can be reduced, thereby reducing the power consumption of the nanometer relay array, thereby achieving the purpose of reducing energy consumption.

[0087] It should be understood that although each step in the flowchart involved in each of the above embodiments is displayed in sequence according to the arrow, these steps are not necessarily executed in sequence according to the arrow. Unless otherwise stated herein, the execution of these steps is not strictly limited in sequence, and these steps can be executed in other sequences. Moreover, at least part of the steps in the flowchart involved in each of the above embodiments can include multiple steps or stages, which are not necessarily executed at the same time, but can be executed at different times, and the execution sequence of these steps or stages is not necessarily sequential, but can be executed alternately or alternately with at least part of other steps or steps or stages in other steps.

[0088] Based on the same inventive concept, the application further provides a nanometer relay array voltage regulation device for implementing the above-mentioned nanometer relay array voltage regulation method. The implementation scheme for solving the problem provided by the device is similar to the implementation scheme described in the above-mentioned method, and therefore the specific limitations in one or more nanometer relay array voltage regulation device embodiments provided below can refer to the limitations of the nanometer relay array voltage regulation method described above, which will not be described here again.

[0089] In one embodiment, as shown in Figure 7 a nanometer relay array voltage regulation device is provided, comprising:

[0090] The sampling module 720 is configured to sample the actual working current of the nanometer relay array according to a preset sampling rule. The preset sampling rule is to perform sampling for a preset number of times at a preset sampling frequency, but if the working current is still not correctly sampled, the preset sampling frequency is adjusted and sampling is performed at the adjusted preset sampling frequency until the working current of the nanometer relay array is correctly sampled.

[0091] The voltage calculation module 740 is configured to determine the calculation working voltage of the nanometer relay array according to the actual working current. The calculation working voltage is used to represent the actual working voltage of the nanometer relay array.

[0092] The voltage deviation value determination module 760 is configured to determine the voltage deviation value between the calculation working voltage and the rated voltage of the nanometer relay array.

[0093] The voltage regulation module 780 is configured to adjust the working voltage of the nanometer relay array according to the voltage deviation value when the voltage deviation value is greater than a preset voltage deviation value.

[0094] In one embodiment, the above-mentioned voltage calculation module 740 comprises:

[0095] The current deviation value determination unit is configured to determine the current deviation value between the actual working current and a reference current. The reference current is a current that supports the normal working of the nanometer relay array.

[0096] The voltage calculation unit is configured to determine the calculation working voltage of the nanometer relay array according to the actual working current when the current deviation value is less than or equal to a preset current deviation value.

[0097] In one embodiment, the above-mentioned voltage calculation module 740 further comprises:

[0098] The step switching unit is configured to enter the step of sampling the actual working current of the nanometer relay array according to the preset sampling rule when the current deviation value is greater than the preset current deviation value.

[0099] In one embodiment, the voltage operation unit described above comprises:

[0100] The mean processing unit is configured to perform mean processing on the actual working current to obtain a current sampling mean when the current deviation value is less than or equal to a preset current deviation value.

[0101] The voltage determination unit is configured to determine an operation working voltage of the nano-relay array according to the current sampling mean.

[0102] In one embodiment, the nano-relay array voltage adjustment device described above further comprises:

[0103] The temperature acquisition module is configured to acquire a temperature of the nano-relay array.

[0104] The first voltage reduction module is configured to reduce the working voltage of the nano-relay array when the temperature of the nano-relay array is greater than or equal to a preset temperature threshold.

[0105] In one embodiment, the nano-relay array voltage adjustment device described above further comprises:

[0106] The voltage increase module is configured to increase the working voltage of the nano-relay array when the temperature of the nano-relay array is less than the preset temperature threshold.

[0107] In one embodiment, the nano-relay array voltage adjustment device described above further comprises:

[0108] The working state acquisition module is configured to acquire a working state of the nano-relay array, and the working state comprises a running state and an idle state.

[0109] The second voltage reduction module is configured to reduce the working voltage of the nano-relay array when the nano-relay array is in the idle state.

[0110] Each module in the nano-relay array voltage adjustment device described above can be realized by software, hardware, and a combination thereof, in whole or in part. The modules described above can be embedded in or independent of a processor in a computer device in hardware form, or can be stored in a memory in the computer device in software form, so as to be called and executed by a processor to perform the operations corresponding to each module.

[0111] In one embodiment, a computer device is provided, which can be a server, and an internal structure diagram of the computer device can be as shown in Figure 8As shown in the figure. The computer device includes a processor, a memory, an input / output interface (Input / Output, referred to as I / O) and a communication interface. Among them, the processor, the memory and the input / output interface are connected through the system bus, and the communication interface is connected to the system bus through the input / output interface. Among them, the processor of the computer device is used to provide computing and control capability. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program and a database. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The database of the computer device is used to store voltage and current data. The input / output interface of the computer device is used to exchange information between the processor and the external device. The communication interface of the computer device is used to communicate with the terminal outside through the network connection. The computer program is executed by the processor to realize a kind of nanometer relay array voltage regulating method.

[0112] Those skilled in the art can understand that, Figure 8 The structure shown in the figure is only a block diagram of part of the structure related to the scheme of the present application, and does not constitute a limitation on the computer device to which the scheme of the present application is applied. The specific computer device can include more or fewer components than those shown in the figure, or combine certain components, or have a different component arrangement.

[0113] In one embodiment, a computer device is provided, including a memory and a processor, the memory stores a computer program, and the processor executes the computer program to realize the steps in each method embodiment described above.

[0114] In one embodiment, a computer readable storage medium is provided, which stores a computer program, and the computer program is executed by the processor to realize the steps in each method embodiment described above.

[0115] In one embodiment, a computer program product is provided, including a computer program, and the computer program is executed by the processor to realize the steps in each method embodiment described above.

[0116] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program. The computer program can be stored in a non-volatile computer readable storage medium, and when the computer program is executed, the processes of the above-mentioned embodiments of the methods can be included. Any reference to memory, database or other medium used in the embodiments provided in the present application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (Read-Only Memory, ROM), magnetic tape, floppy disk, flash memory, optical storage, high-density embedded non-volatile memory, resistive memory (ReRAM), magnetoresistive random access memory (Magnetoresistive Random Access Memory, MRAM), ferroelectric memory (Ferroelectric Random Access Memory, FRAM), phase change memory (Phase Change Memory, PCM), graphene memory, etc. Volatile memory can include random access memory (Random Access Memory, RAM) or external cache memory, etc. As an illustration but not limitation, RAM can be in various forms, such as static random access memory (Static Random Access Memory, SRAM) or dynamic random access memory (Dynamic Random Access Memory, DRAM), etc. The database involved in the embodiments provided in the present application can include at least one of a relational database and a non-relational database. The non-relational database can include a distributed database based on a block chain, etc., without being limited thereto. The processor involved in the embodiments provided in the present application can be a general-purpose processor, a central processing unit, a graphics processing unit, a digital signal processor, a programmable logic device, a data processing logic device based on quantum computing, etc., without being limited thereto.

[0117] Any combination of the technical features of the above embodiments can be made. In order to make the description simple, all possible combinations of the technical features in the above embodiments are not described, however, as long as the combination of the technical features does not exist contradictory, it should be considered as the scope of the present application.

[0118] The above embodiments only express several implementation manners of the present application, and the description is more specific and detailed, but it should not be understood as a limitation on the scope of the patent of the present application. It should be pointed out that for ordinary skilled in the art, without departing from the concept of the present application, a number of modifications and improvements can be made, which are within the scope of protection of the present application. Therefore, the protection scope of the present application should be subject to the appended claims.

Claims

1. A method for voltage regulation of a nanorelay array, comprising: The method comprises the following steps: According to the preset sampling rule, the actual working current of the nano relay array is sampled, wherein the preset sampling rule is to sample a preset number of times at a preset sampling frequency, but the working current is not correctly sampled, the preset sampling frequency is adjusted and sampling is performed at the adjusted preset sampling frequency until the working current of the nano relay array is correctly sampled; According to the actual working current, the operating working voltage of the nano relay array is determined, which is used to represent the actual working voltage of the nano relay array; The voltage deviation value of the operating working voltage and the rated voltage of the nano relay array is determined; When the voltage deviation value is greater than the preset voltage deviation value, the working voltage of the nano relay array is adjusted according to the voltage deviation value; According to the actual working current, the operating working voltage of the nano relay array is determined, which comprises: Determine the current deviation value of the actual working current and the reference current, the reference current is the current supporting the normal working of the nano relay array; When the current deviation value is less than or equal to the preset current deviation value, the operating working voltage of the nano relay array is determined according to the actual working current; When the current deviation value is greater than the preset current deviation value, the step of sampling the actual working current of the nano relay array according to the preset sampling rule is entered.

2. The method of claim 1, wherein, When the current deviation value is less than or equal to the preset current deviation value, the actual working current is processed to obtain the current sampling mean value; According to the current sampling mean value, the operating working voltage of the nano relay array is determined. The method further comprises:

3. The method of claim 1, wherein, Obtain the temperature of the nano relay array; When the temperature of the nano relay array is greater than or equal to the preset temperature threshold, the working voltage of the nano relay array is reduced. The method further comprises:

4. The method of claim 3, wherein, When the temperature of the nano relay array is less than the preset temperature threshold, the working voltage of the nano relay array is increased. The method further comprises:

5. The method of claim 1, wherein, Obtain the working state of the nano relay array, the working state comprises the running state and the idle state; When the nano relay array is in the idle state, the working voltage of the nano relay array is reduced. The device comprises:

6. A nanorelay array voltage regulating device, comprising: A sampling module is configured to sample the actual working current of the nano relay array according to a preset sampling rule, wherein the preset sampling rule is to sample a preset number of times at a preset sampling frequency, but the working current is not correctly sampled, the preset sampling frequency is adjusted and sampling is performed at the adjusted preset sampling frequency until the working current of the nano relay array is correctly sampled; A voltage operation module is configured to determine the operating working voltage of the nano relay array according to the actual working current, which is used to represent the actual working voltage of the nano relay array; ​ The voltage deviation value determination module is configured to determine a voltage deviation value of the operating voltage and a rated voltage of the nano-relay array. The voltage adjustment module is configured to adjust the operating voltage of the nano-relay array according to the voltage deviation value when the voltage deviation value is greater than a preset voltage deviation value. The voltage operation module comprises: The current deviation value determination unit is configured to determine a current deviation value of the actual operating current and a reference current, the reference current being a current supporting normal operation of the nano-relay array. The voltage operation unit is configured to determine the operating voltage of the nano-relay array according to the actual operating current when the current deviation value is less than or equal to a preset current deviation value. The step switching unit is configured to enter a step of sampling the actual operating current of the nano-relay array according to a preset sampling rule when the current deviation value is greater than the preset current deviation value. 7.A computer device, comprising a memory and a processor, wherein the memory stores a computer program, and the computer device is configured to perform the method according to any one of claims 1-6 when the computer program is executed by the processor. The computer program is executed by the processor to implement the steps of the method of any one of claims 1 to 5.

8. A computer-readable storage medium having stored thereon a computer program, characterized in that, The computer program is executed by the processor to implement the steps of the method of any one of claims 1 to 5.

Images